CX2016DB48000C0WLLA1 数据手册
Specifications
Drawing No.
UKY1C-H1-14E53-00[37] 1/11
Issued Date.
Dec,26,2014
TO: KED USA
Note:Part Number will be revised in case of specification change.
Product Type
Quartz Crystal
Series
CX2016DB
Frequency
48000kHz
Customer Part Number
-
Customer Specification Number
-
KYOCERA Part Number
CX2016DB48000C0WLLA1
Remarks
Pb-Free、RoHS Compliant、MSL 1
Customer Approval
Approval Signature
Approved Date
Department
Person in charge
Seller
KYOCERA Crystal Device Corporation
Manufacturer
(Sales Division)
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto
612-8501 Japan
TEL. No. 075-604-3421
FAX. No. 075-604-3469
Crystal Units Division
5850, Higashine-Koh, Higashine-Shi, Yamagata
999-3701 Japan
TEL. No. 0237-43-5611
FAX. No. 0237-43-5615
Design Department
Quality Assurance
Approved by
Checked by
Issued by
KYOCERA Crystal Device Corporation
Crystal Units Engineering Section 1
Crystal Units Division
T. Noritake
K. Yamazaki
T. Nitoube
Y. Kikuchi
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 2/11
Revision History
Rev.No.
1
Description of revision
First Edition
Date
Approved by
Checked by
Issued by
Dec,26,2014
K. Yamazaki
T. Nitoube
Y. Kikuchi
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 3/11
1. APPLICATION
This specification sheet is applied to quartz crystal “CX2016DB48000C0WLLA1”
2. KYOCERA PART NUMBER
CX2016DB48000C0WLLA1
3. RATINGS
Items
SYMB.
Rating
Unit
Operating Temperature Range
Topr
-30 to +85
°C
Storage Temperature Range
Tstg
-40 to +85
°C
Remarks
4. CHARACTERISTICS
ELECTRICAL CHARACTERISTICS
Items
Electrical Specification
SYMB.
Min
Typ.
Max
Mode of Vibration
Fundamental
Test Condition
Nominal Frequency
F0
48
MHz
Nominal
Temperature
Load Capacitance
TNOM
+25
°C
CL
7.0
pF
Frequency
Tolerance
Frequency
Temperature
Characteristics
Frequency drift
after reflow
Frequency Ageing
Rate
Equivalent Series
Resistance
Spurious mode
series resistance
Drive Level
Insulation
Resistance
Shunt
Capacitance
Motional
Capacitance
Motional
Inductance
Remarks
Unit
+25±3°C
df/F
-30~+85°C
-20
+20
PPM
After 2times
5 years
at +25±3°C
ESR
22
1100
Ω
Ω
Pd
10
100
IR
500
C0
0.51
0.71
0.91
pF
C1
2.16
3.16
4.16
fF
L1
1.00
3.49
4.00
mH
±700kHz
μW
MΩ
100V(DC)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 4/11
5. Measurement Condition
5.1 Frequency measurement
Measuring instrument
:PI-Network Test Fixture
Load Capacitance
: 7.0pF
Drive Level
: 10μW
5.2 Equivalent series resistance (ESR) measurement
Measuring instrument
: PI-Network Test Fixture
Load Capacitance
: Series
Drive Level
: 10μW
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 5/11
6. APPEARANCES, DIMENSIONS
OUTLINE DIMENSION (not to scale)
1
(Top View)
(TOP VIEW)
(Connection)
#4 GND
#3 HOT
2.00±0.10
#4
#3
GND
(NC)
1.60±0.10
48000
K401 Y
GND
#2
4-R0.10
2
3
4
(Side View)
#1 HOT
#2 GND
PIN
NO.
#1
#2
#3
#4
0.15±0.025
0.40±0.05
#1
PIN Layout
HOT
GND
HOT
GND
4-0.10
4-0.57±0.10
#1
#2
4-0.49±0.10
4-0.08
(Bottom View)
C 0.20
UNIT: mm
#4
#3
MARKING
1.Nominal Frequency First 5digit of the frequency is indicated.
2.Identification
[K] is to indicate 1Pin direction.
3.Date Code
Last 1 Digit of YEAR and WEEK
(Ex) 2014,Jan,01 → 401
4. Manufacturing Location
Y…Japan (Yamagata )
Z…Japan (Shiga Yohkaichi )
T…Thailand
F…Philippines
※The font of marking is for reference only.
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 6/11
7. RECOMMENDED LAND PATTERN (not to scale)
0.5
0.9
0.8
1.1
0.3
0.8
0.9
UNIT: mm
1.4
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 7/11
8. TAPING&REEL
8-1.Dimensions
4.0±0.1
φ1.5± 0.1
0
Unreeling direction
1.75±0.1
2.0±0.05
2.35±0.10
2.30±0.05
3.5±0.05
1.95±0.1
4.0±0.1
0.7±0.05
1.90±0.1
0.2±0.05
8.0±0.2
φ1.05±0.05
8-2.Leader and Carrier tape
Empty compartment
Empty compartment
Component
END
Leader
START
100~200mm
160mm or more
400~560mm
8-3.Direction(Orientation shall be checked from the top cover tape side)
12345
K123 Y
12345
K123 Y
12345
K123 Y
12345
K123 Y
Unreeling direction
8-4.Specification
1. Material of the carrier tape is either polystyrene or A-PET (ESD).
2. Material of the cover tape is polyester (ESD).
3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape.
4. Tensile strength of carrier tape: 10N or more.
5. The R of the corner of each cavity is 0.2RMAX.
6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less.
7. The orientation shall be checked from the top cover tape side as shown in 8-3.
8. Peeling force of cover tape: 0.1 to 1.0N.
9. The component will fall out naturally when cover tape is removed and set upside down.
165°~180°
Cover tape
Carrier tape
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 8/11
8-5.Reel Specification
t
W
C
D
E
B
A
φ180 Reel (3,000 pcs )
Symbol
Dimension
Symbol
Dimension
A
B
C
D
φ180 +0/-3
φ60 +1/-0
φ13±0.2
φ21±0.8
E
W
t
2.0±0.5
9±1
2.0±0.5
(Unit : mm)
3000pcs taping Only
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 9/11
9.Enviromental requirements
After conducting the following tests, component needs to meet below conditions.
Frequency: Fluctuation within +/-10 x 10-6
CI: Fluctuation within +/-20% or 5Ω whichever is larger
9.1 Resistance to Shock
Test condition
3 times natural drop from 100cm onto hard wooden board.
9.2 Resistance to Vibration
9.3 Resistance to Heat
Test condition
frequency
: 10 - 55 - 10 Hz
Amplitude
: 1.5mm
Cycle time
: 15 minutes
Direction
: X,Y,Z (3direction),2h each.
Test condition
The quartz crystal unit shall be stored at a
temperature of +85±2°C for 500h and subjected to
room temperature for 1h before measurement.
9.4 Resistance to Cold
Test condition
The quartz crystal unit shall be stored at a
temperature of -40±2°C for 500h and subjected to
room temperature for 1h before measurement.
9.5 Thermal Shock
Test condition
The quartz crystal unit shall be subjected to 500 temperature
cycles shown in table below,Then it shall be subjected
to room temperature for 1h before mesurement.
Cycle
:-40±2°C(30min.)→ +25±2°C(5min.)
→ +85±2°C(30min.)→ +25±2°C(5min.)
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
9.6 Resistance to Moisture
9.7 Soldering condition
UKY1C-H1-14E53-00[37] 10/11
Test condition
The quartz crystal unit shall be stored at a
temperature of +60±2°C with relative humidity of
90% to 95% for 240 h. Then it shall be subjected
to room temperature for 1h before measurement.
1.) Type of solder
Material
… lead free solder paste
Melting point … +220±5°C
2.) Reflow temp.profile
Temp [°C]
Time[sec]
Preheating
+150 to +180
150 (typ.)
Peak
+260±5
10 (max.)
Total
―
300 (max.)
Frequency shift : ±2ppm
3.) Hand Soldering +350°C 3 sec max
4.) Reflow Times
2 times in below Reflow temp. profile
Reflow temp.profile
9.8 Bending Strength
Solder this product in center of the circuit board (40mm×100mm),
and add deflection of 3mm.
Test board : t=1.6mm
20
PUSH
1.6
board
10
R5
Product
45
45
R230
press jig
UNIT : mm
KYOCERA Crystal Device Corporation
KBS-5079G
Drawing No.
UKY1C-H1-14E53-00[37] 11/11
10. Cautions for use
(1)Soldering upon mounting
There is a possibility to influence product characteristics when Solder paste or conductive glue comes in
contact with product lid or surface.
(2)When using mounting machine
Please minimize the shock when using mounting machine to avoid any excess stress to the product.
(3)Conformity of a circuit
We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the
ESR (Equivalent Series Resistance) of crystal unit.
11. Storage conditions
Please store product in below conditions, and use within 6 months.
Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition.
12. Manufacturing location
Kyocera Crystal Device Corporation Plant
Kyocera Crystal Device Corporation Shiga Yohkaichi Plant
Kyocera Crystal Device (Thailand) Co., Ltd
Kyocera Crystal Device Philippines, Inc.
13. Quality Assurance
To be guaranteed by Kyocera Crystal Device Quality Assurance Division
14. Quality guarantee
In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery,
substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is
waivered.
15. Others
In case of any questions or opinions regarding the Specification, please have it in written manner
within 45 days after issued date.
KYOCERA Crystal Device Corporation
KBS-5079G
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