0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
AFE5401TRGCTQ1

AFE5401TRGCTQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    VQFN-64_9X9MM-EP

  • 描述:

    ICAFE12BIT4CHAUTORADAR64VQ

  • 数据手册
  • 价格&库存
AFE5401TRGCTQ1 数据手册
Order Now Product Folder Support & Community Tools & Software Technical Documents AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 AFE5401-Q1 Quad-Channel, Analog Front-End for Automotive Radar Baseband Receiver 1 Features 2 Applications • • • • • 1 • • • • • • • • • • • • • • Qualified for Automotive Applications AEC-Q100 Qualified With the Following Results: – Device Temperature Grade 1: –40°C to 125°C Ambient Operating Temperature Range – Device HBM ESD Classification Level 2 – Device CDM ESD Classification Level C4B Integrated Analog Front-End Includes: – Quad LNA, Equalizer, PGA, Antialiasing Filter, and ADC Input-Referred Noise with 30-dB PGA Gain: – 2.9-nV/√Hz for 15-dB LNA Gain – 2.0-nV/√Hz for 18-dB LNA Gain with HIGH_POW_LNA Mode Simultaneous Sampling Across Channels Programmable LNA Gain: 12 dB, 15 dB, 16.5 dB, and 18 dB Programmable Equalizer Modes Built-In Diagnostic Modes Temperature Sensor Programmable-Gain Amplifiers (PGAs): – 0 dB to 30 dB in 3-dB Steps Programmable, Third-Order, Antialiasing Filter: – 7 MHz, 8 MHz, 10.5 MHz, and 12 MHz Analog-to-Digital Converter (ADC): – Quad Channel, 12 Bits, 25 MSPS per Channel – No External Decoupling Required for References Parallel CMOS Outputs 64-mW Total Core Power per Channel at 25 MSPS per Channel Supplies: 1.8 V and 3.3 V Package: 9-mm × 9-mm VQFN-64 Automotive Radar Data Acquisition SONAR™ 3 Description The AFE5401-Q1 is an analog front-end (AFE), targeting applications where the level of integration is critical. The device includes four channels, with each channel comprising a low-noise amplifier (LNA), a programmable equalizer (EQ), a programmable gain amplifier (PGA), and an antialias filter followed by a high-speed, 12-bit, analog-to-digital converter (ADC) at 25 MSPS per channel. Each of the four differential input pairs are amplified by an LNA and are followed by a PGA with a programmable gain range from 0 dB to 30 dB. An antialias, low-pass filter (LPF) is also integrated between the PGA and ADC for each channel. Each LNA, PGA, and antialiasing filter output is differential (limited to 2 VPP). The antialiasing filter drives the on-chip, 12-bit, 25-MSPS ADC. The four ADC outputs are multiplexed on a 12-bit, parallel, CMOS output bus. The device is available in a 9-mm × 9-mm, VQFN-64 package and is specified over a temperature range of –40°C to +105°C. For more information, contact AFE5401_info@list.ti.com. Device Information(1) PART NUMBER AFE5401-Q1 PACKAGE VQFN (64) BODY SIZE (NOM) 9.00 mm × 9.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. SDOUT SDATA RESET DVDD18 SEN AVDD18 STBY DRVDD SCLK Simplified Schematic AVDD3 Serial Interface PGA LNA EQ Antialiasing Filter Channel 1 of 4 EQ ADC 1 BUF 4:1 MUX CMOS Output Driver INx INx_AUX D [11:0] D_GPO [1:0] 1x ADC_CLK CMOS, DIFF Support 4x DCLK AFE_CLK CLKINP CLKINM Clock + Timing Generator DSYNC1 Serialization Factor TRIG DSYNC2 AVSS DRVSS AVSS DVSS 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 6.10 7 1 1 1 2 3 5 Absolute Maximum Ratings ...................................... 5 ESD Ratings.............................................................. 5 Recommended Operating Conditions....................... 6 Thermal Information .................................................. 6 Electrical Characteristics........................................... 7 Digital Characteristics ............................................... 8 Timing Requirements: Output Interface .................... 9 Timing Requirements: RESET.................................. 9 Timing Requirements: Serial Interface Operation... 10 Typical Characteristics .......................................... 12 Parameter Measurement Information ................ 21 7.1 Timing Requirements: Across Output Serialization Modes ...................................................................... 21 8 Detailed Description ............................................ 23 8.1 Overview ................................................................. 23 8.2 Functional Block Diagram ....................................... 24 8.3 8.4 8.5 8.6 9 Feature Description................................................. Device Functional Modes........................................ Programming........................................................... Register Maps ......................................................... 25 32 41 44 Application and Implementation ........................ 64 9.1 Application Information............................................ 64 9.2 Typical Application .................................................. 64 10 Power Supply Recommendations ..................... 68 10.1 Power Supply Sequencing .................................... 68 10.2 Power Supply Decoupling ..................................... 68 11 Layout................................................................... 68 11.1 Layout Guidelines ................................................. 68 11.2 Layout Example .................................................... 69 12 Device and Documentation Support ................. 71 12.1 12.2 12.3 12.4 12.5 12.6 Documentation Support ........................................ Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 71 71 71 71 71 71 13 Mechanical, Packaging, and Orderable Information ........................................................... 71 4 Revision History Changes from Original (March 2014) to Revision A Page • Added automotive Features bullets ....................................................................................................................................... 1 • First public release ................................................................................................................................................................ 1 • Changed Device Information table to current standards ....................................................................................................... 1 • Changed order of Pin Functions table to be sorted by pin name instead of pin number....................................................... 4 • Changed ESD Rating table title and format, moved Storage temperature parameter to Absolute Maximum Ratings table . 5 • Added Receiving Notification of Documentation Updates and Community Resources sections ......................................... 71 2 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 5 Pin Configuration and Functions VCM AVSS AVDD18 AVSS NC STBY NC RESET SCLK SDATA SEN SDOUT DVSS DVDD18 DRVDD DRVSS 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 RGC Package VQFN-64 Top View IN1P_AUX 1 48 D_GPO[1] IN1M_AUX 2 47 D_GPO[0] IN1P 3 46 D[11] IN1M 4 45 D[10] IN2P_AUX 5 44 D[9] IN2M_AUX 6 43 D[8] IN2P 7 42 D[7] IN2M 8 41 D[6] Thermal Pad 32 DRVDD DRVDD 33 31 16 DRVSS IN4M 30 DCLK DVDD18 34 29 15 DVSS IN4P 28 D[0] DVDD18 35 27 14 DSYNC2 IN4M_AUX 26 D[1] DSYNC1 36 25 13 TRIG IN4P_AUX 24 D[2] AVDD18 37 23 12 AVSS IN3M 22 D[3] CLKINM 38 21 11 CLKINP IN3P 20 D[4] AVSS 39 19 10 AVDD18 IN3M_AUX 18 D[5] AVDD3 40 17 9 VCM IN3P_AUX Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 3 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Pin Functions PIN NAME DESCRIPTION NO D[11:0] 35-46 CMOS outputs for channels 1 to 4 D_GPO[1:0] 47, 48 General-purpose CMOS output AVDD3 18 3.3-V analog supply voltage AVDD18 19, 24, 62 1.8-V analog supply voltage AVSS 20, 23, 61, 63 Analog ground CLKINM 22 Negative differential clock input pin. A single-ended clock is also supported. CLKINP 21 Positive differential clock input pin. A single-ended clock is also supported. DCLK 34 CMOS output clock DRVDD 32, 33, 50 CMOS output driver supply DRVSS 31, 49 CMOS output driver ground DSYNC1 26 Data synchronization clock 1 DSYNC2 27 Data synchronization clock 2 DVDD18 28, 30, 51 1.8-V digital supply voltage DVSS 29, 52 IN1M 4 Negative differential analog input pin for channel 1 IN1P 3 Positive differential analog input pin for channel 1 IN1M_AUX 2 Negative differential auxiliary analog input pin for channel 1 IN1P_AUX 1 Positive differential auxiliary analog input pin for channel 1 IN2M 8 Negative differential analog input pin for channel 2 IN2P 7 Positive differential analog input pin for channel 2 IN2M_AUX 6 Negative differential auxiliary analog input pin for channel 2 IN2P_AUX 5 Positive differential auxiliary analog input pin for channel 2 IN3M 12 Negative differential analog input pin for channel 3 IN3P 11 Positive differential analog input pin for channel 3 IN3M_AUX 10 Negative differential auxiliary analog input pin for channel 3 IN3P_AUX 9 Positive differential auxiliary analog input pin for channel 3 IN4M 16 Negative differential analog input pin for channel 4 IN4P 15 Positive differential analog input pin for channel 4 IN4P_AUX 13 Positive differential auxiliary analog input pin for channel 4 14 Negative differential auxiliary analog input pin for channel 4 IN4M_AUX NC 58, 60 Digital ground Do not connect RESET 57 Hardware reset pin (active high). This pin has an internal 150-kΩ pull-down resistor. SCLK 56 Serial interface clock input. This pin has an internal 150-kΩ pull-down resistor. SDATA 55 Serial interface data input. This pin has an internal 150-kΩ pull-down resistor. SDOUT 53 Serial interface data readout SEN 54 Serial interface enable. This pin has an internal 150-kΩ pull-up resistor. STBY 59 Standby control input. This pin has an internal 150-kΩ pull-down resistor. TRIG 25 Trigger for DSYNC1 and DSYNC2. This pin has an internal 150-kΩ pull-down resistor. VCM 17, 64 Thermal pad 4 Pad Output pins for common-mode bias voltage of the auxiliary input signals Located on bottom of package, internally connected to AVSS. Connect to ground plane on the board. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX DRVDD to DRVSS –0.3 +3.8 AVDD3 to AVSS –0.3 +3.8 AVDD18 to AVSS –0.3 +2.2 DVDD18 to DVSS –0.3 +2.2 AVSS and DVSS –0.3 +0.3 AVSS and DRVSS –0.3 +0.3 DVSS and DRVSS –0.3 +0.3 Clock input pins (CLKINP and CLKINM) to AVSS –0.3 minimum (2.2, AVDD18 + 0.3) V Analog input pins (INIP, INIM, INIP_AUX, and INIM_AUX) to AVSS –0.3 minimum (2.2, AVDD18 + 0.3) V –0.3 +3.6 V +125 °C +150 °C Voltage range Voltage between Digital control pins to DVSS STBY, RESET, SCLK, SDATA, SEN, TRIG Maximum operating junction temperature, TJ max Storage temperature, Tstg (1) –60 UNIT V V Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6.2 ESD Ratings VALUE V(ESD) (1) Electrostatic discharge Human-body model (HBM), per AEC Q100-002 (1) Charged-device model (CDM), per AEC Q100-011 ±1000 ±500 UNIT V AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 5 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 6.3 Recommended Operating Conditions MIN NOM MAX UNIT +105 °C TEMPERATURE TA Ambient temperature range –40 DRVDD Output driver supply 1.7 AVDD3 3-V analog supply voltage AVDD18 DVDD18 SUPPLIES 3.6 V 3 3.3 3.6 V 1.8-V analog supply voltage 1.7 1.8 1.9 V 1.8-V digital supply voltage 1.7 1.8 1.9 V CLOCK INPUT Default mode (DIV_EN disabled) CLKIN Input clock frequency 12.5 25 With DIV_EN, DIV_FRC enabled and DIV_REG = 1 25 50 With DIV_EN, DIV_FRC enabled and DIV_REG = 2 37.5 75 With DIV_EN, DIV_FRC enabled and DIV_REG = 3 50 100 12.5 50 With decimate-by-2 or decimate-by-4 modes enabled (DIV_EN disabled) (1) VCLKINP – VCLKINM Input clock amplitude differential Sine wave, ac-coupled 0.2 1.5 LVPECL, ac-coupled 0.2 1.6 LVDS, ac-coupled 0.2 0.7 Single-ended CMOS clock on CLKINP with CLKINM connected to AVSS Input clock duty cycle VPP 1.8 40% MHz V 60% DIGITAL OUTPUT CLOAD (1) Tolerable external load capacitance from each output pin to DRVSS 5 pF In decimation mode, input clock frequency (CLKIN) can be scaled up to maximum of 200 MHz with the input divider. 6.4 Thermal Information AFE5401-Q1 THERMAL METRIC (1) RGC (VQFN) UNIT 64 PINS RθJA Junction-to-ambient thermal resistance 24.9 °C/W RθJC(top) Junction-to-case (top) thermal resistance 8.7 °C/W RθJB Junction-to-board thermal resistance 3.9 °C/W ψJT Junction-to-top characterization parameter 0.2 °C/W ψJB Junction-to-board characterization parameter 3.9 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 0.5 °C/W (1) 6 For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 6.5 Electrical Characteristics Minimum and maximum values are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, DVDD18 = 1.8 V, –1-dBFS analog input ac-coupled with a 0.1-µF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, and differential input clock with 50% duty cycle, unless otherwise noted. Typical values are at TNOM = +25°C. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT FULL-CHANNEL CHARACTERISTICS LNA gain = 12 dB Maximum differential input signal amplitude on INIP and INIM 0.5 LNA gain = 15 dB (default) 0.35 LNA gain = 16.5 dB LNA gain = 18 dB Input resistance, from each input to internal dc bias level Default CI Input capacitance Differential input capacitance VVCM VCM output voltage Voltage on VCM pins VCM output current capability For 50-mV drop in VCM voltage VPP 0.3 0.25 1 ± 20% TERM_INT_20K_LNA / TERM_INT_20K_AUX = 1 kΩ 10 ± 20% 5.5 pF 1.45 V 3 mA Gain matching Across channels and devices 0.15 1 EG Gain error PGA gain = 30 dB ± 0.6 ± 1.4 EO Offset error PGA gain = 30 dB, 1 sigma value ± 120 Input-referred noise voltage fIN = 3 MHz, idle channel, PGA gain = 30 dB (default) 2.9 fIN = 3 MHz, idle channel, PGA gain = 30 dB (HIGH_POW_LNA mode) 2.5 fIN = 3 MHz, main channel 65 SNR Signal-to-noise ratio SFDR Spurious-free dynamic range THD Total harmonic distortion fIN = 3 MHz, main channel IMD Intermodulation distortion fIN1 = 1.5 MHz, fIN2 = 2 MHz, AIN1 and AIN2 = –7 dBFS PSRR Power-supply rejection ratio For a 50-mVPP signal on AVDD18 up to 10 MHz, no input applied to analog inputs fIN = 3 MHz, AUX channel 57 fIN = 3 MHz, main channel (HPL_EN mode) 3.8 67.7 66 74 56 Number of bits in the ADC dB LSB 69.2 fIN = 3 MHz, main channel (default) dB nV/√Hz dBFS dBc 65 dBc 83 dBFS > 50 dB 12 Bits Crosstalk, main channel to main channel Aggressor channel: fIN = 2 MHz, 1 dB below ADC full-scale. Victim channel: fIN= 3 MHz, 1 dB below ADC full-scale. 70 dB Maximum channel gain LNA gain = 18 dB, PGA gain = 30 dB 48 dB Minimum channel gain LNA gain = 12 dB, PGA gain = 0 dB 12 dB 3 dB 30 dB 2 VPP PGA gain resolution PGA gain range Maximum PGA gain – minimum PGA gain Differential input voltage range for AUX channel ANTIALIAS FILTER (Third-Order Elliptic) FILTER_BW = 0 (default) fC 3-dB filter corner frequency 7 FILTER_BW = 2 10.5 FILTER_BW = 3 3-dB filter corner frequency tolerance ATT2FC ATTSTPBND RPPSBND Filter attenuation 8 FILTER_BW = 1 For all FILTER_BW settings 12 ±5% At 2 × fC 30 Stop-band attenuation (fIN > 2.25 × fC) 40 Ripple in pass band 1.5 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 MHz dBc dB 7 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Electrical Characteristics (continued) Minimum and maximum values are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, DVDD18 = 1.8 V, –1-dBFS analog input ac-coupled with a 0.1-µF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, and differential input clock with 50% duty cycle, unless otherwise noted. Typical values are at TNOM = +25°C. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT POWER Total core power, per channel IAVDD18 AVDD18 current consumption IAVDD3 AVDD3 current consumption IDVDD18 DVDD18 current consumption Idle channel, excluding DRVDD power 64 Default mode 131 With HIGH_POW_LNA mode enabled 153 With HPL_EN mode enabled 135 5-pF load, toggle data test pattern mode IDRVDD DRVDD current consumption 15-pF load, toggle data test pattern mode mW 145 mA 1.5 3.5 mA 8 12 mA DRVDD = 3.3 V 14 DRVDD = 1.8 V 8.5 DRVDD = 3.3 V 36 DRVDD = 1.8 V 20 mA Power-down 5 mW STBY power 15 mW 6.6 Digital Characteristics The dc specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic level 0 or 1. Minimum and maximum values are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, and DVDD18 = 1.8 V, unless otherwise noted. Typical values are at TNOM = +25°C. PARAMETER MIN TYP MAX UNIT DIGITAL INPUTS (STBY, RESET, SCLK, CLKIN, SDATA, SEN, TRIG) (1) VIH High-level input voltage VIL Low-level input voltage IIH High-level input current 10 µA IIL Low-level input current 10 µA CI Input capacitance VIL_CLKINP Input clock CMOS single-ended (VCLKINP), VCLKINM connected to AVSS VIH_CLKINP 1.4 V 0.4 4 V pF 0.25 × AVDD18 0.75 × AVDD18 V V DIGITAL OUTPUTS VOH High-level output voltage VOL Low-level output voltage (1) 8 DRVDD – 0.2 DRVDD 0 V 0.2 V The SEN pin has an internal 150-kΩ pull-up resistor. The STBY, RESET, SCLK, SDATA, and TRIG pins have an internal 150-kΩ pulldown resistor. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 6.7 Timing Requirements: Output Interface Minimum and maximum values are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, DVDD18 = 1.8 V, –1-dBFS analog input ac-coupled with 0.1 µF, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, and differential input clock with 50% duty cycle, unless otherwise noted. Typical values are at TNOM = +25°C. MIN tADLY Aperture delay between the rising edge of the input sampling clock and the actual time at which the sampling occurs Wake-up time tLAT Data setup time tHO Data hold time tR, tF CMOS output data and clock rise and fall time MAX UNIT 3 ns Time to valid data after coming out of STANDBY mode 500 µs Time to valid data after coming out of GLOBAL_PDN mode 2 ms Time to valid data after stopping and restarting the input clock 500 µs 10.5 tAFE_CLK cycles ADC latency (default, after reset) tSU NOM Data valid (1) to 50% of DCLK rising edge, DRVDD = 3.3 V, load = 5 pF, 4x serialization, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 0 4.1 ns Data valid (1) to 50% of DCLK rising edge, DRVDD =1.8 V, load = 5 pF, 4x serialization, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 5 3.7 ns 50% of DCLK rising edge to data becoming invalid (1), DRVDD = 3.3 V, load = 5 pF, 4x serialization, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 0 2.8 ns 50% of DCLK rising edge to data becoming invalid (1), DRVDD = 1.8 V, load = 5 pF, 4x serialization, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 5 2.7 ns DRVDD = 3.3 V, load = 5 pF, 10% to 90%, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 0 1.2 ns DRVDD = 1.8 V, load = 5 pF, 10% to 90%, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 5 1.1 ns tOUT Delay from CLKIN rising edge to DCLK rising edge, zero-crossing of input clock to 50% of DCLK rising edge, DRVDD = 3.3 V, load = 5 pF, 4x serialization, STR_CTRL_CLK and STR_CTRL_CLK_DATA = 0 tS_TRIG TRIG setup time, TRIG pulse duration ≥ tAFE_CLK 4 ns tH_TRIG TRIG hold time, TRIG pulse duration ≥ tAFE_CLK 3 ns (1) 6.7 9.5 ns Data valid refers to a logic high of 0.7 × DRVDD and a logic low of 0.3 × DRVDD. 6.8 Timing Requirements: RESET Typical values are at TA = +25°C. Minimum and maximum specifications are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, and DVDD18 = 1.8 V, unless otherwise noted. PARAMETER TEST CONDITIONS t1 Power-on to reset delay Delay from power-up of AVDD18 and DVDD18 to RESET pulse active t2 Reset pulse duration Pulse duration of active RESET signal t3 Register write delay Delay from RESET disable to SEN active MIN TYP MAX 1 Product Folder Links: AFE5401-Q1 ms 40 ns 100 ns Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated UNIT 9 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 6.9 Timing Requirements: Serial Interface Operation Minimum specifications are across the full temperature range of TMIN = –40°C to TMAX = +105°C, DRVDD = 3.3 V, AVDD3 = 3.3 V, AVDD18 = 1.8 V, and DVDD18 = 1.8 V, CLOAD on SDOUT = 5 pF, unless otherwise noted. PARAMETER MIN TYP MAX UNIT t1 SCLK period 50 ns t2 SCLK high time 20 ns t3 SCLK low time 20 ns t4 Data setup time 5 ns t5 Data hold time 5 ns t6 SEN falling to SCLK rising 8 ns t7 Time between last SCLK rising edge to SEN rising edge 8 t8 Delay from SCLK falling edge to SDOUT valid 7 ns 11 15 ns tLAT tADLY INIP, INIM N tCLK(1) N+1 N+3 N+4 N+5 N+6 N+7 CLKIN tOUT tHO DCLK tSU D[11:0] CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 (1) tCLK = 1 / fCLKIN Figure 1. Output Interface Timing Diagram A high pulse on the RESET pin is required for register initialization through the reset pin. Figure 2 shows the timing requirement for reset after power-up. Power Supply (AVDD18, DVDD18, AVDD3, DRVDD) t1 t2 RESET t3 SEN Figure 2. Reset Timing 10 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 SEN End Sequence t6 t1 SCLK t7 Data latched on rising edge of SCLK t2 t3 A[7] SDATA A[6] A[5] A[4] A[3] A[2] A[1] A[0] D[15] D[14] D[13] D[12] D[11] D[10] D[9] D[8] D[7] D[6] D[5] D[4] D[3] D[2] D[1] D[0] t4 t5 SDOUT Figure 3. Serial Interface Register Write Timing Diagram SEN End Sequence t6 t1 SCLK t7 t2 t3 A[7] SDATA A[6] A[5] A[4] A[3] A[2] A[1] A[0] X X t4 t5 t8 X X X X X X X X X X X X D[3] D[2] X X SDOUT to be latched externally on rising edge D[15] D[14] D[13] D[12] D[11] D[10] D[9] D[8] D[7] D[6] D[5] D[4] D[1] D[0] SDOUT Figure 4. Serial Interface Register Readout Timing Diagram Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 11 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 6.10 Typical Characteristics 0 ±10 ±20 ±30 ±40 ±50 ±60 ±70 ±80 ±90 ±100 ±110 ±120 ±130 ±140 0 ±10 ±20 ±30 ±40 ±50 ±60 ±70 ±80 ±90 ±100 ±110 ±120 ±130 ±140 Amplitude (dBFS) Amplitude (dBFS) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 0 2.5 5 7.5 10 Frequency (MHz) SNR = 67.7 dBFS 12.5 0 5 SFDR = 65.7 dBc THD = 65.2 dBc 7.5 10 12.5 Frequency (MHz) SNR = 53.3 dBFS Figure 5. FFT for 3-MHz, –1-dBFS Input Signal, 0-dB PGA Gain (Sample Rate = 25 MSPS) C002 SFDR = 63.7 dBc THD = 63.6 dBc Figure 6. FFT for 3-MHz, –1-dBFS Input Signal, 30-dB PGA Gain (Sample Rate = 25 MSPS) 0 ±10 ±20 ±30 ±40 ±50 ±60 ±70 ±80 ±90 ±100 ±110 ±120 ±130 ±140 85 PGA Gain = 0 dB PGA Gain = 30 dB 80 SFDR (dBc) Amplitude (dBFS) 2.5 C002 75 70 65 60 0 2.5 5 7.5 10 Frequency (MHz) fIN1 = 1.5 MHz fIN2 = 2 MHz 12.5 1 2 3 4 Input Signal Frequency (MHz) C001 5 C006 Each Tone at –7-dBFS Amplitude Two-Tone IMD = –83 dBFS Figure 7. FFT with Two-Tone Signal Figure 8. Spurious-Free Dynamic Range vs Input Signal Frequency 53.5 68.3 68.2 53.3 SNR (dBFS) SNR (dBFS) 68.1 68 67.9 67.8 67.7 53.1 52.9 52.7 67.6 52.5 67.5 1 2 3 Input Signal Frequency (MHz) 4 5 Figure 9. Signal-to-Noise Ratio vs Input Signal Frequency (PGA Gain = 0 dB) 12 1 2 3 Input Signal Frequency (MHz) C005 4 5 C050 Figure 10. Signal-To-Noise Ratio vs Input Signal Frequency (PGA Gain = 30 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 80 68 Default Mode 66 77 HPL_EN = 1 SFDR (dBc) SNR (dBFS) 64 62 60 58 74 71 68 56 65 54 52 62 3 6 9 12 15 18 21 24 27 0 30 PGA Gain (dB) 6 9 12 15 18 21 24 27 30 PGA Gain (dB) Figure 11. Signal-to-Noise Ratio vs PGA Gain C008 Figure 12. Spurious-Free Dynamic Range vs PGA Gain 90 54 90 68.7 80 53.8 80 68.4 70 53.6 60 53.4 70 68.1 60 SFDR (dBFS) 67.8 50 SFDR (dBc) 67.5 SFDR (dBFS, dBc) 69 SNR (dBFS) 100 SFDR (dBFS, dBc) 3 C007 53.2 50 SFDR (dBFS) 40 SNR (dBFS) 67.2 -45 -40 -35 -30 -25 -20 -15 -10 -5 52.6 20 0 Input Signal Amplitude (dBFS) -50 -45 -40 -35 -30 -25 -20 -15 -10 -5 0 Input Signal Amplitude (dBFS) C001 Figure 13. Signal-to-Noise Ratio, Spurious-Free Dynamic Range vs Input Signal Amplitude (PGA Gain = 0 dB) C001 Figure 14. Signal-to-Noise Ratio, Spurious-Free Dynamic Range vs Input Signal Amplitude (PGA Gain = 30 dB) 69 67 68.6 66.6 SFDR (dBc) SNR (dBFS) 52.8 SNR (dBFS) 40 -50 53 SFDR (dBc) 30 SNR (dBFS) 0 68.2 67.8 67.4 66.2 65.8 65.4 67 65 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 Input Clock Amplitude, Differential (VPP) 2 2.2 0.2 Figure 15. Signal-to-Noise Ratio vs Input Clock Amplitude (PGA Gain = 0 dB) 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 Input Clock Amplitude, Differential (VPP) C011 2.2 C012 Figure 16. Spurious-Free Dynamic Range vs Input Clock Amplitude (PGA Gain = 0 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 13 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Typical Characteristics (continued) 68 67 67.6 66.6 SFDR (dBc) SNR (dBFS) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 67.2 66.8 66.4 66.2 65.8 65.4 66 65 35 40 45 50 55 60 Input Clock Duty Cycle (%) 65 35 50 55 SNR (dBFS) 68.1 67.9 53 52.5 15 17.5 20 22.5 Sampling Frequency (MHz) 52 12.5 25 15 17.5 20 22.5 Sampling Frequency (MHz) C045 Figure 19. Signal-to-Noise Ratio vs Sampling Frequency (PGA Gain = 0 dB) 25 C046 Figure 20. Signal-to-Noise Ratio vs Sampling Frequency (PGA Gain = 30 dB) 78 78 Default Mode 76 Default Mode 76 HPL_EN = 1 HPL_EN = 1 74 SFDR (dBc) 74 SFDR (dBc) C014 53.5 67.7 72 70 68 72 70 68 66 66 64 15 17.5 20 Sampling Frequency (MHz) 22.5 25 62 12.5 15 17.5 20 Sampling Frequency (MHz) C047 Figure 21. Spurious-Free Dynamic Range vs Sampling Frequency (PGA Gain = 0 dB) 14 65 54 68.3 64 12.5 60 Figure 18. Spurious-Free Dynamic Range vs Input Clock Amplitude (PGA Gain = 0 dB) 68.5 SNR (dBFS) 45 Input Clock Duty Cycle (%) Figure 17. Signal-to-Noise Ratio vs Input Clock Duty Cycle (PGA Gain = 0 dB) 67.5 12.5 40 C013 22.5 25 C048 Figure 22. Spurious-Free Dynamic Range vs Sampling Frequency (PGA Gain = 30 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 53.8 68.5 AVDD18 = 1.7 V AVDD18 = 1.7 V 53.5 AVDD18 = 1.9 V 53.2 SNR (dBFS) SNR (dBFS) 68.2 AVDD18 = 1.8 V 67.9 67.6 67.3 AVDD18 = 1.8 V AVDD18 = 1.9 V 52.9 52.6 52.3 67 -40 -25.5 -11 3.5 18 32.5 47 61.5 76 90.5 52 -40.0 -25.5 -11.0 105 Temperature (ƒC) 3.5 18.0 32.5 47.0 61.5 76.0 90.5 105.0 Temperature (ƒC) C015 Figure 23. Signal-to-Noise Ratio vs AVDD18 and Temperature (PGA Gain = 0 dB) Figure 24. Signal-to-Noise Ratio vs AVDD18 and Temperature (PGA Gain = 30 dB) 72 70 AVDD18 = 1.7 V AVDD18 = 1.7 V AVDD18 = 1.8 V 70 AVDD18 = 1.8 V 68 AVDD18 = 1.9 V SFDR (dBc) SFDR (dBc) AVDD18 = 1.9 V 68 66 64 66 64 62 62 60 -40 -25.5 -11 3.5 18 32.5 47 61.5 76 90.5 105 Temperature (ƒC) -40 -25.5 -11 3.5 18 32.5 47 61.5 76 90.5 105 Temperature (ƒC) C017 Figure 25. Spurious-Free Dynamic Range vs AVDD18 and Temperature (PGA Gain = 0 dB, Default Mode) C018 Figure 26. Spurious-Free Dynamic Range vs AVDD18 and Temperature (PGA Gain = 30 dB, Default Mode) 78 78 AVDD18 = 1.7 V AVDD18 = 1.7 V AVDD18 = 1.8 V 76 AVDD18 = 1.8 V 76 AVDD18 = 1.9 V SFDR (dBc) SFDR (dBc) C016 74 72 AVDD18 = 1.9 V 74 72 70 70 -40 -25.5 -11 3.5 18 32.5 47 61.5 Temperature (ƒC) 76 90.5 105 -40 -25.5 Figure 27. Spurious-Free Dynamic Range vs AVDD18 and Temperature (PGA Gain = 0 dB, HPL_EN = 1) -11 3.5 18 32.5 47 61.5 76 90.5 Temperature (ƒC) C051 105 C052 Figure 28. Spurious-Free Dynamic Range vs AVDD18 and Temperature (PGA Gain = 30 dB, HPL_EN = 1) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 15 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 56 65 Default Mode 55 HIGH_POW_LNA = 1 64.5 SFDR (dBc) SNR (dBFS) Default Mode HIGH_POW_LNA = 1 54 53 64 63.5 52 51 63 12 13 14 15 16 17 18 LNA Gain (dB) 12 ,QSXW 5HIHUUHG 1RLVH +] Input-Referred Noise Q9 (nV\¥+] ,QSXW 5HIHUUHG 1RLVH Q9 +] Input-5HIHUUHG Q9 ¥+] Default Mode HIGH_POW_LNA = 1 3.5 3 2.5 2 14 15 16 17 17 18 C020 HIGH_POW_LNA = 1 0 3 6 9 12 15 18 21 24 27 PGA Gain (dB) 30 C022 Figure 32. Input-Referred Noise vs PGA Gain 500 15 14 13 12 11 10 9 8 7 6 5 4 3 2 Default Mode Temperature = -40°C Temperature = 25°C Temperature = 105°C 2XWSXW 5HIHUUHG 1RLVH 1RLVH Q9 +] Output-5HIHUUHG Q9 ¥+] ,QSXW 5HIHUUHG Noise 1RLVH (nV\¥+] Q9 +] Input-Referred 16 Default Mode C021 Figure 31. Input-Referred Noise vs LNA Gain (PGA Gain = 30 dB) 450 HIGH_POW_LNA = 1 400 350 300 250 200 150 100 50 0 3 6 9 12 15 18 21 24 PGA Gain (dB) 27 30 0 3 6 9 12 15 18 21 24 27 PGA Gain (dB) C023 Figure 33. Input-Referred Noise vs PGA Gain and Temperature 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 18 LNA Gain (dB) 15 Figure 30. Spurious-Free Dynamic Range vs LNA Gain (PGA Gain = 30 dB) 4 13 14 LNA Gain (dB) Figure 29. Signal-to-Noise Ratio vs LNA Gain (PGA Gain = 30 dB) 12 13 C019 30 C024 Figure 34. Output-Referred Noise vs PGA Gain Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 3000 500 2500 Temperature = 25°C 400 Temperature = 105°C 350 Occurrences 2XWSXW 5HIHUUHG 1RLVH Q9 +] Output-Referred Noise (nv\¥+] Temperature = -40°C 450 300 250 200 150 2000 1500 1000 500 100 0 50 0 3 6 9 12 15 18 21 24 27 30 -0.75 -0.65 -0.55 -0.45 -0.35 -0.25 -0.15 C056 C025 Figure 36. Gain Error Histogram for PGA Gain = 30 dB Figure 35. Output-Referred Noise vs PGA Gain and Temperature 150 450 Device = 1 400 100 Output Offset (LSB) 350 Occurrences -0.85 Gain Error (dB) PGA Gain (dB) 300 250 200 150 100 Device = 2 50 0 ±50 ±100 50 0 ±150 0 0.05 0.1 0.15 0.2 0.25 0.3 Gain Matching ( dB) 0.35 0 0.4 3 12 15 18 21 24 27 3000 20 2500 10 2000 1500 1000 500 30 C027 Figure 38. Channel Offset vs PGA Gain for Two Typical Devices Channel Gain (dB) Occurrences 9 PGA Gain (dB) Figure 37. Gain Matching Histogram (Maximum Gain Difference Among the Four Channels within a Device) 0 6 C057 0 ±10 ±20 FCF_7 MHz ±30 FCF_8 MHz ±40 FCF_10.5 MHz FCF_12 MHz -600 -500 -400 -300 -200 -100 0 100 200 300 400 500 600 Offset Error ( LSB) ±50 0.1 10 fIN (MHz) C058 Figure 39. Offset Error Histogram at PGA Gain = 30 dB C028 Figure 40. Antialias Filter Response vs FILTER_BW Settings (PGA Gain = 0 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 17 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Typical Characteristics (continued) 50 20 40 10 30 0 Channel Gain (dB) Channel Gain (dB) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 20 10 FCF_7 MHz 0 FCF_8 MHz FCF_10.5 MHz ±10 ±10 ±20 ±30 AVDD18 = 1.7 V AVDD18 = 1.8 V ±40 FCF_12 MHz AVDD18 = 1.9 V ±20 ±50 0.1 1 10 fIN (MHz) 0.1 10 20 0 Channel Gain (dB) Channel Gain (dB) 30 ±10 ±20 ±40 Temperature = 25ƒC 10 0 ±10 ±20 Default Mode (Eq_Dis) ±30 Eq_EN ±40 Temperature = 105ƒC Eq_EN_LOW_FC ±50 ±50 0.1 1 0.1 10 fIN (MHz) 20 Channel Gain (dB) Channel Gain (dB) 30 30 20 10 Default Mode (Eq_Dis) Eq_EN ±10 C001 Figure 44. Antialias Filter Response for Equalizer Modes (PGA Gain = 0 dB) 50 40 10 fIN (MHz) 60 0 1 C053 Figure 43. Antialias Filter Response vs Temperature (PGA Gain = 0 dB, FILTER_BW = 8 MHz) 10 0 ±10 Eq_EN, Temperature = -40ƒC ±20 Eq_EN, Temperature = 105ƒC ±30 Eq_EN_LOW_FC, Temperature = -40ƒC Eq_EN_LOW_FC Eq_EN_LOW_FC, Temperature = 105ƒC ±40 ±20 0.1 1 10 fIN (MHz) 0.1 1 10 fIN (MHz) C001 Figure 45. Antialias Filter Response for Equalizer Modes (PGA Gain = 30 dB) 18 C030 Figure 42. Antialias Filter Response vs AVDD18 (PGA Gain = 0 dB, FILTER_BW = 8 MHz) 20 Temperature = -40ƒC 10 fIN (MHz) Figure 41. Antialias Filter Response vs FILTER_BW Settings (PGA Gain = 30 dB) ±30 1 C002 C035 Figure 46. Antialias Filter Response for Equalizer Modes across Temperature (PGA Gain = 0 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 60 40 Amplitude (dBFS) Channel Gain (dB) 50 30 20 Eq_EN, Temperature = -40ƒC 10 Eq_EN, Temperature = 105ƒC 0 Eq_EN_LOW_FC, Temperature = -40ƒC ±10 0 ±10 ±20 ±30 ±40 ±50 ±60 ±70 ±80 ±90 ±100 ±110 ±120 ±130 ±140 0 Eq_EN_LOW_FC, Temperature = 105ƒC 3 ±20 0.1 1 5 8 10 Frequency (MHz) 10 SNR = 69.2 dBFS fIN (MHz) 13 C049 SFDR = 69.8 dBc THD = 69.7 dBc C036 Figure 48. FFT for AUX Channel (3-MHz, –1-dBFS Input Signal, Sample Rate = 25 MSPS) Figure 47. Antialias Filter Response for Equalizer Modes across Temperature (PGA Gain = 30 dB) 20 10 10 0 Channel Gain (dB) Channel Gain (dB) 0 ±10 ±20 ±30 ±40 ±50 ±60 Default Mode ±70 ±20 ±30 ±40 ±50 DECIMATE_4_EN = 1, Set 2 ±60 DECIMATE_2_EN = 1 DECIMATE_4_EN = 1, Set 1 ±80 ±70 0.1 1 10 0.1 fIN (MHz) 1 fIN (MHz) C037 Figure 49. Decimate-by-2 Filter Response (Sampling Frequency = 50 MHz) 120 131 105 130.5 90 130 75 129.5 60 45 30 15 C038 Figure 50. Decimate-by-4 Filter Response (Sampling Frequency = 12.5 MHz) Current (mA) Read Temperature (ƒC) ±10 Current_AVDD18 129 128.5 128 127.5 0 ±15 127 ±30 126.5 ±45 ±45 ±30 ±15 0 15 30 45 60 75 90 Set Temperature (ƒC) 105 126 12.5 Figure 51. Temperature Sensor Response 15 17.5 20 22.5 Sampling Frequency (MHz) C054 25 C039 Figure 52. AVDD18 Supply Current vs Sampling Frequency Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 19 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Typical Characteristics (continued) Typical values are at TA = +25°C, AVDD18 = DVDD18 = 1.8 V, AVDD3 = DRVDD = 3.3 V, –1-dBFS analog input ac-coupled with a 0.1-μF capacitor, AFE_CLK = 25 MHz, LNA gain = 15 dB, PGA gain = 0 dB, default mode, antialiasing filter corner frequency = 8 MHz, and differential input sine wave clock with 50% duty cycle, unless otherwise noted. 7 2 Current_DVDD18 Current_AVDD3 1.8 Current (mA) Current (mA) 6 5 4 3 12.5 1.6 1.4 1.2 15 17.5 20 22.5 Sampling Frequency (MHz) 1 12.5 25 15 Figure 53. DVDD18 Supply Current vs Sampling Frequency 17.5 20 22.5 Sampling Frequency (MHz) C040 25 C041 Figure 54. AVDD3 Supply Current vs Sampling Frequency 40 64 DRVDD = 3.3 V DRVDD = 1.8 V 63 30 Power (mW) Current (mA) 35 25 20 15 17.5 20 Sampling Frequency (MHz) 22.5 25 59 12.5 15 17.5 20 Sampling Frequency (MHz) C042 Figure 55. DRVDD Supply Current vs Sampling Frequency (15-pF Load with Toggle Test Mode) 20 61 60 15 10 12.5 62 22.5 25 C044 Figure 56. AFE Core Power, Channel Excluding DRVDD Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 7 Parameter Measurement Information 7.1 Timing Requirements: Across Output Serialization Modes Table 1 and Table 2 provide details for the 4x serialization timing requirements for DRVDD = 3.3 V and DRVDD = 1.8 V, respectively. Table 3 and Table 4 provide details for the 3x serialization timing requirements for DRVDD = 3.3 V and DRVDD = 1.8 V, respectively. Table 5 provides the details for the 2x and 1x serialization timing requirements for DRVDD = 1.8 V to 3.3 V. Table 1. Timing Requirements: 4x Serialization (DRVDD = 3.3 V) OUTPUT CLOCK (DCLK) FREQUENCY (MHz) TEST CONDITIONS 12.5 50 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 9.1 7.9 6.7 9.5 15 60 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 7.1 6.1 6.7 9.5 20 80 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 5.3 4.1 6.7 9.5 25 100 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 4.1 2.8 6.7 9.5 25 100 CLOAD = 15 pF, STR_CTRL_CLK, STR_CTRL_DATA = 6 3.5 2.6 6.4 9.0 INPUT CLOCK FREQUENCY (MHz) SETUP TIME (ns) tSU HOLD TIME (ns) tHO MIN MIN TYP MAX TYP MAX tOUT (ns) MIN TYP MAX Table 2. Timing Requirements: 4x Serialization (DRVDD = 1.8 V) INPUT CLOCK FREQUENCY (MHz) OUTPUT CLOCK (DCLK) FREQUENCY (MHz) TEST CONDITIONS SETUP TIME (ns) tSU HOLD TIME (ns) tHO MIN MIN 12.5 50 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 9.2 7.9 5.6 10.6 15 60 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 7.2 6.1 5.6 10.6 20 80 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 5.3 3.9 5.6 10.6 25 100 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 3.7 2.7 5.6 10.6 25 100 CLOAD = 15 pF, STR_CTRL_CLK and STR_CTRL_DATA = 14 2.6 2.7 5.3 10.0 TYP MAX TYP MAX tOUT (ns) MIN TYP MAX Table 3. Timing Requirements: 3x Serialization (DRVDD = 3.3 V) OUTPUT CLOCK (DCLK) FREQUENCY (MHz) TEST CONDITIONS 12.5 37.5 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 12.4 11.8 20.1 23.2 15 45 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 9.9 9.1 17.4 20.4 20 60 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 7.2 6.3 15.1 18.0 25 75 CLOAD = 5 pF, STR_CTRL_CLK, STR_CTRL_DATA = 0 5.7 4.1 13.4 16.0 25 75 CLOAD = 15 pF, STR_CTRL_CLK and STR_CTRL_DATA = 6 5.1 3.8 12.8 15.3 INPUT CLOCK FREQUENCY (MHz) SETUP TIME (ns) tSU HOLD TIME (ns) tHO MIN MIN TYP MAX TYP MAX tOUT (ns) MIN TYP Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 MAX 21 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Table 4. Timing Requirements: 3x Serialization (DRVDD = 1.8 V) INPUT CLOCK FREQUENCY (MHz) OUTPUT CLOCK (DCLK) FREQUENCY (MHz) TEST CONDITIONS SETUP TIME (ns) tSU HOLD TIME (ns) tHO MIN MIN 12.5 37.5 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 12.5 11.9 19.2 23.6 15 45 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 10.0 9.3 16.6 20.1 20 60 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 7.3 6.4 14.0 18.4 25 75 CLOAD = 5 pF, STR_CTRL_CLK and STR_CTRL_DATA = 5 5.7 4.7 12.4 16.7 25 75 CLOAD = 15 pF, STR_CTRL_CLK and STR_CTRL_DATA = 14 4.7 4 12.1 16.4 TYP MAX TYP MAX tOUT (ns) MIN TYP MAX Table 5. Timing Requirements: 2x and 1x Serialization (DRVDD = 1.8 V to 3.3 V) INPUT CLOCK FREQUENCY (MHz) 25 25 22 OUTPUT CLOCK (DCLK) FREQUENCY (MHz) TEST CONDITIONS SETUP TIME (ns) tSU HOLD TIME (ns) tHO MIN MIN 50 2x Serialization mode: CLOAD = 5 pF. For DRVDD = 1.8 V, STR_CTRL_CLK and STR_CTRL_DATA = 5. For DRVDD = 3.3 V, STR_CTRL_CLK and STR_CTRL_DATA = 0. 7.3 8.0 5.5 10.5 25 1x Serialization mode: CLOAD = 5 pF. For DRVDD = 1.8 V, STR_CTRL_CLK and STR_CTRL_DATA = 5. For DRVDD = 3.3 V, STR_CTRL_CLK and STR_CTRL_DATA = 0. 18.5 17.5 25.2 30.1 TYP Submit Documentation Feedback MAX TYP MAX tOUT (ns) MIN TYP MAX Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8 Detailed Description 8.1 Overview The AFE5401-Q1 is a very low-power, CMOS, monolithic, quad-channel, analog front-end (AFE). The signal path of each channel consists of a differential low-noise amplifier (LNA) followed by a differential programmable gain amplifier (PGA) in series with a differential antialias filter. The antialiasing filter output is sampled by a 12-bit, pipeline, analog-to-digital converter (ADC) based on a switched-capacitor architecture. Each ADC can also be differentially driven from INIP_AUX, INIM_AUX through an on-chip buffer (thus bypassing the LNA, PGA, and antialiasing filter). Each block in the channel operates with a maximum 2-VPP output swing. Each PGA has a programmable gain range from 0 dB to 30 dB, with a resolution of 3 dB. After the input signals are captured by the sampling circuit, the samples are sequentially converted by a series of low-resolution stages inside the pipeline ADC at the clock rising edge. The outputs of these stages are combined in a digital logic block to form the final 12-bit word with a latency of 10.5 tAFE_CLK clock cycles. The 12-bit words of all active channels are multiplexed and output as parallel CMOS levels. In addition to the data streams, a CMOS clock (DCLK) is also output. This clock must be used by the digital receiver [such as a digital signal processor (DSP)] to latch the AFE output parallel CMOS data. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 23 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com VCM SDOUT RESET SDATA SEN SCLK STBY DRVDD DVDD18 AVDD18 AVDD3 8.2 Functional Block Diagram Reference Serial Interface PGA LNA AAF EQ IN1 EQ ADC 1 IN1_AUX BUF EQ IN2 EQ BUF 4:1 MUX EQ IN3 EQ D [11:0] D_GPO [1:0] ADC 3 IN3_AUX CMOS Output Driver ADC 2 IN2_AUX BUF EQ IN4 EQ ADC 4 IN4_AUX BUF 1x ADC_CLK CMOS, Diff Support CLKINP fCLKIN 4x DSYNC1 CLKINM Serialization Factor Clock + Timing Generator DSYNC2 TRIG AVSS 24 DCLK Input Clock Divider AFE_CLK DVSS DRVSS Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.3 Feature Description 8.3.1 Low-Noise Amplifier (LNA) The analog input signal is buffered and amplified by an on-chip LNA. LNA gain is programmable with the LNA_GAIN register, as shown in Table 6. Table 6. LNA_GAIN Register LNA_GAIN DESCRIPTION (dB) LNA_GAIN_Linear 0 15 5.5 1 18 8 2 12 4 3 16.5 6.5 The LNA output is internally limited to 2 VPP. Thus, the maximum-supported input peak-to-peak swing is set by 2 V / LNA_GAIN_Linear. Input-referred noise in default mode is 2.9 nV/√Hz at 30-dB PGA gain and 15-dB LNA gain. Input-referred noise can be further improved to 2.5 nV/√Hz by enabling the HIGH_POW_LNA register bit. However, this noise reduction results in increased power dissipation. 8.3.2 Programmable Gain Amplifier (PGA) The PGA amplifies the analog input signal by a programmable gain. Gain can be programmed using the PGA_GAIN register, common to all channels, in 3-dB steps with a gain range of 30 dB. In default mode, PGA gain ranges from 0 dB to 30 dB. In equalizer mode, PGA gain ranges from 15 dB to 45 dB. PGA_GAIN register settings are listed in Table 7. Figure 57 shows the typical SNR values across PGA gain. Table 7. PGA_GAIN Register Settings PGA_GAIN Settings PGA GAIN IN DEFAULT MODE (dB) PGA GAIN IN EQUALIZER MODE (dB) 0 (0 dB) 0.0 15.0 1 (3 dB) 2.9 17.9 2 (6 dB) 6.0 21.0 3 (9 dB) 8.8 23.8 4 (12 dB) 11.9 26.9 5 (15 dB) 14.8 29.8 6 (18 dB) 17.9 32.9 7 (21 dB) 20.8 35.8 8 (24 dB) 23.9 38.9 9 (27 dB) 26.8 41.8 10 (30 dB) 29.9 44.9 68 66 SNR (dBFS) 64 62 60 58 56 54 52 0 3 6 9 12 15 18 21 24 PGA Gain (dB) 27 30 C007 Figure 57. SNR Across PGA Gain Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 25 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.3.3 Antialiasing Filter The device introduces a third-order, elliptic, active, antialias, low-pass filter (LPF) in the analog signal path. The filter –3-dB corner frequency can be configured using the FILTER_BW register, as shown in Table 8. The corresponding frequency response plots are shown in Figure 58 and Figure 59. FILTER_BW CORNER FREQUENCY (MHz) 0 8 1 7 2 10.5 3 12 20 50 10 40 0 30 Channel Gain (dB) Channel Gain (dB) Table 8. FILTER_BW Register ±10 ±20 FCF_7 MHz ±30 FCF_8 MHz ±40 FCF_10.5 MHz 20 10 FCF_7 MHz 0 FCF_8 MHz FCF_10.5 MHz ±10 FCF_12 MHz FCF_12 MHz ±20 ±50 0.1 0.1 10 fIN (MHz) 1 Figure 58. Filter Response Across Modes (PGA Gain = 0 dB) 10 fIN (MHz) C028 C002 Figure 59. Filter Response Across Modes (PGA Gain = 30 dB) 8.3.4 Analog-to-Digital Converter (ADC) The filtered analog input signal is sampled and converted into a digital equivalent code using a high-speed, lowpower, 12-bit, pipeline ADC. The digital output of the device has a latency of 10.5 tAFE_CLK cycles because of the pipeline nature of the ADC. The digitized output of the device is in binary twos complement (BTC) format. The output format can be changed to offset binary format with the OFF_BIN_DATA_FMT register bit. 8.3.5 Digital Gain The ADC output can be incremented digitally using a digital gain block. Digital gain is common for all channels and can be configured by enabling MULT_EN and applying the desired DIG_GAIN. Channel gain is given by Equation 1: where: • 26 (DIG_GAIN + 32) is the mod 128 number. Submit Documentation Feedback (1) Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Y Axis Figure 60 shows the typical digital gain curve for different DIG_GAIN values. (95, 127/32) Channel Gain 4 (127, 31/32) 1 0 DIG_GAIN 96 128 X Axis Figure 60. Digital Gain Graph 8.3.6 Input Clock Divider The device clock input is passed through a clock divider block that can divide the input clock by a factor of 1, 2, 3, or 4. This divided clock (AFE_CLK) is used for simultaneously sampling the four ADC inputs. In default mode, a division factor of 1 is used where the AFE_CLK frequency is the same as the input clock frequency. The clock divider block can be enabled using the DIV_EN register bit and, when enabling this bit, the AFE_CLK frequency is automatically determined by the serialization factor set by the CH_OUT_DIS register bits (Table 12). The division factor can also be manually specified by enabling the DIV_FRC and DIV_REG register bits. Care must be taken to ensure that the input clock frequency is within the recommended operating range specified in the Recommended Operating Conditions. After device reset, the divider is reset at the first pulse applied on the TRIG pin. This configuration is especially useful when using multiple devices in the system, where the sampling instants of all ADCs in the system must be synchronized. Figure 61 illustrates the TRIG timing diagram and the various divided-down AFE_CLK signals. Figure 62 provides the TRIG input setup and hold time with respect to the device clock input. Bit settings for the DIV_EN register, DIV_FRD register, and DIV_REG register are provided in Table 9, Table 10, and Table 11, respectively. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 27 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com TRIG CLKIN TRIG_INT AFE_CLK (÷ 2) AFE_CLK (÷ 3) AFE_CLK (÷ 4) Figure 61. Input Clock Divider CLKIN TRIG tS_TRIG tH_TRIG Figure 62. TRIG CLKIN Setup and Hold Table 9. DIV_EN Register DIV_EN DESCRIPTION 0 Divider disabled and bypassed 1 Divider enabled Table 10. DIV_FRC Register DIV_FRC (1) DESCRIPTION 0 Input divider ratio = serialization factor (1) (automatically set) 1 Input divider ratio = DIV_REG (manually set) The divider ratio is automatically calculated to the serialization factor value based on the CH_OUT_DIS[1:4] register bits; see Table 12. Table 11. DIV_REG Register DIV_REG 28 DESCRIPTION 0 Divider disabled and bypassed 1 Divide-by-2 2 Divide-by-3 3 Divide-by-4 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.3.7 Data Output Serialization The input signals are digitized by the dedicated channel ADCs. Digitized signals are multiplexed and output on D[11:0] as parallel data. The output data rate and the DCLK speed are automatically calculated based on the CH_OUT_DIS[1:4] bits. The number of zeroes in these four bits is equal to the serialization factor for the output data. When the register bit is set to 1, the output for the respective channel is disabled. The channels are arranged in ascending order, with the lowest active channel output first and the highest active channel output last. CH_OUT_DIS[1:4] controls only the output serialization and does not power-down individual channels. Table 12 lists the register values with the respective serialization factors and output sequence. Table 12. CH_OUT_DIS Register CH_OUT_DIS[1] CH_OUT_DIS[2] CH_OUT_DIS[3] CH_OUT_DIS[4] SERIALIZATION FACTOR 0 0 0 0 4 CH1 → CH2 → CH3 → CH4 1 0 0 0 3 CH2 → CH3 → CH4 0 1 0 0 3 CH1 → CH3 → CH4 1 1 0 0 2 CH3 → CH4 0 0 1 0 3 CH1 → CH2 → CH4 1 0 1 0 2 CH2 → CH4 0 1 1 0 2 CH1 → CH4 1 1 1 0 1 CH4 0 0 0 1 3 CH1 → CH2 → CH3 1 0 0 1 2 CH2 → CH3 0 1 0 1 2 CH1 → CH3 1 1 0 1 1 CH3 0 0 1 1 2 CH1 → CH2 1 0 1 1 1 CH2 0 1 1 1 1 CH1 1 1 1 1 1 Not supported OUTPUT Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 29 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.3.8 Setting the Input Common-Mode Voltage for the Analog Inputs 8.3.8.1 Main Channels The device analog input consists of a differential LNA. The common-mode for the LNA inputs is internally set using two internal, programmable, single-ended resistors, as shown in Figure 63. INIP RINTTERM_LNA 1k LNA RINTTERM_LNA 1k INIM Internal Voltage Reference CM_LNA Buffer Device Figure 63. Common-Mode Biasing of LNA Input Pins These resistors can be programmed to a higher value using the TERM_INT_20K_LNA register setting as described in Table 13. Table 13. Internal Termination Register Setting (LNA) TERM_INT_20K_LNA DESCRIPTION 0 RINTTERM_LNA = 1 kΩ 1 RINTTERM_LNA = 10 kΩ Hence, for proper operation, the input signal must be ac-coupled. Note that external input ac-coupling capacitors form a high-pass filter (HPF) with RINTTERM_LNA. Therefore, the capacitor values should allow the lowest frequency of interest to pass with minimum attenuation. For typical frequencies greater than 1 MHz, a value of 50 nF or greater is recommended. The maximum input swing is limited by the LNA gain setting. LNA output swing is limited to 2 VPP before the output becomes saturated or distorted. Single ended mode of operation is also possible by connecting non-driven input pin to ground through a capacitor of 100 nF. However, this will result in reduced linearity. 30 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.3.8.2 Auxiliary Channel The auxiliary analog inputs (INIP_AUX, INIM _AUX) can be enabled instead of the INIP, INIM inputs using the AUX_CHI_EN bits (Table 14). The auxiliary analog input signal path consists of an input unity-gain buffer followed by an ADC. The LNA, PGA, equalizer, and antialiasing filter are bypassed and powered down in this mode. Figure 64 shows the internal block diagram for auxiliary channel mode. When this mode is enabled, the maximum input swing is limited to 2 VPP before the input becomes saturated or distorted. Table 14. AUX_CHI_EN Register AUX_CHI_EN DESCRIPTION 0 INIP, INIM active, analog 1 INIP _AUX, INIM_AUX INIP_AUX RINTTERM_AUX 1k BUF RINTTERM_AUX 1k INIM_AUX Internal Voltage Reference VCM CM_AUX Buffer Device NOTE: Dashed area denotes one of four channels. Figure 64. Common-Mode Biasing of Auxiliary Channel Input Pins The dc common-mode on the INIP_AUX, INIM _AUX pins are internally biased to the optimum voltage (referred to as VCM). The dc common-mode biasing is set with two internal, programmable, single-ended resistors (RINTTERM_AUX). These resistors can be programmed to a higher value using the TERM_INT_20K_AUX register setting as described in Table 15. Table 15. Internal Termination Register Setting (AUX) TERM_INT_20K_AUX DESCRIPTION 0 RINTTERM_AUX = 1 kΩ 1 RINTTERM_AUX = 10 kΩ Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 31 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com The auxiliary inputs can also be ac-coupled as a result of the internal common-mode setting. The external input ac-coupling capacitors form a high-pass filter with RINTTERM_AUX. Therefore, the capacitor values should allow the lowest frequency of interest to pass with minimum attenuation. For typical frequencies greater than 1 MHz, a value of 50 nF or greater is recommended. For instances where the input signal cannot be ac-coupled because of system requirements, it is recommended to use the VCM output to set the dc common-mode of the input signal. The driving capability of VCM is limited. A 100-nF capacitor should be connected on each VCM input to AVSS. 8.4 Device Functional Modes 8.4.1 Equalizer Mode In some applications, the input signal power linearly decreases with signal frequency. Such types of input spectrum can be equalized using a first-order signal equalizer. The device can be configured in two different equalizer modes: EQ_EN and EQ_EN_LOW_FC. Table 16 lists the register settings for these modes. • EQ_EN mode: In this mode, a high-pass filter (HPF) is added to the analog signal path between the LNA output and PGA input. • EQ_EN_LOW_FC mode: In this mode, attenuation from the HPF is limited to unity in the pass-band frequency range. Table 16. EQ_EN and EQ_EN_LOW_FC Registers EQ_EN EQ_EN_LOW_FC 0 0 Default mode DESCRIPTION 0 1 Default mode 1 0 Equalizer enabled 1 1 Equalizer with low-corner frequency enabled 30 60 20 50 10 40 Channel Gain (dB) Channel Gain (dB) The HPF and LPF cutoff frequencies (of the antialiasing filter) are the same as per the FILTER_BW setting. In this mode, overall channel gain increases by an additional fixed gain of 15 dB from the HPF block. Typical frequency response plots showing different equalizer modes along with the default mode are shown in Figure 65 and Figure 66. 0 ±10 ±20 Default Mode (Eq_Dis) ±30 Eq_EN ±40 30 20 10 Default Mode (Eq_Dis) 0 Eq_EN ±10 Eq_EN_LOW_FC Eq_EN_LOW_FC ±50 ±20 0.1 1 10 fIN (MHz) Figure 65. Filter Response (PGA Gain = 0 dB) 32 0.1 1 10 fIN (MHz) C001 C001 Figure 66. Filter Response (PGA Gain = 30 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.4.2 Data Output Mode The functionality of DSYNC1, DSYNC2, DCLK, and D[11:0] are controlled by selecting the data output mode. The functionality of the DSYNC1, DSYNC2, DCLK, and D[11:0] output pins for 4x serialization modes are shown in Figure 67 and Figure 68. Any event on the TRIG pin triggers the DSYNC1 and DSYNC2 signals. The DSYNC1 period is determined by the COMP_DSYNC1 register value and the DSYNC2 period is determined by the SAMPLE_COUNT register value. When OUT_MODE_EN = 0, data output is continuous. When OUT_MODE_EN = 1, data is active only during the sample phase. Output pins are configured using the registers described in Table 17 through Table 21. CLKIN INPUT TRIG CYCLE RESET TRIG_INT Pixel = 0 INTERNAL Pixel = 1 Pixel = 2 tAFE_CLK Pixel = 3 AFE_CLK tOUT Pixel = 0 D[11:0] OUT_MODE_EN = 0 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 D[11:0] OUT_MODE_EN = 1 CH1 CH2 CH3 CH4 CH1 CH1 CH2 CH3 (0) (0) (0) CH4 (0) CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 Pixel = 1 CH1 CH2 CH3 (1) (1) (1) Pixel = 2 CH4 (1) Pixel = 3 CH1 CH2 CH3 CH4 (2) (2) (2) (2) CH1 CH2 CH3 CH4 (3) (3) (3) (3) CH1 CH2 CH3 CH4 (4) (4) (4) (4) CH1 CH2 CH3 CH4 (5) (5) (5) (5) CH1 CH2 CH3 CH4 (6) (6) (6) (6) CH1 CH2 CH1 CH2 CH1 CH2 CH3 (7) (7) (7) CH3 CH4 CH1 CH2 CH3 CH4 (7) CH1 CH2 (8) (8) CH3 CH4 (8) (8) CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH1 CH2 (8) (8) CH3 CH4 CH1 CH2 (8) (8) (9) (9) CH3 (9) DCLK COMP_DSYNC1 COMP_DSYNC1 DSYNC1_HIGH DSYNC1 OUTPUT DSYNC2_LOW SAMPLE PHASE DSYNC2 DELAY PHASE SAMPLE PHASE DELAY PHASE BLANKING PHASE SAMPLE COUNT = N TTRIG_DSYNC2_LAT SAMPLE COUNT = N tDSYNC2 = (N+1) * tAFE_CLK tDSYNC2 = (N+1) * tAFE_CLK Figure 67. Data Output Timing Diagram (4x Serialization) CLKIN Input TRIG TRIG_INT Internal Pixel = 0 Pixel = 1 Pixel = 2 tAFE_CLK Pixel = 3 AFE_CLK tOUT Pixel = 0 D[11:0] OUT_MODE_EN = 0 D[11:0] OUT_MODE_EN = 1 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 Pixel = 1 Pixel = 2 Pixel = 3 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH1 CH2 CH3 CH4 (0) (0) (0) (0) CH1 (1) CH2 CH3 (1) (1) CH4 (1) CH1 CH2 CH3 CH4 (2) (2) (2) (2) CH1 CH2 CH3 CH4 (3) (3) (3) (3) CH1 CH2 (4) (4) CH3 CH4 (4) (4) CH1 CH2 CH3 CH4 (5) (5) (5) (5) CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH1 CH2 CH3 CH4 (0) (0) (0) (0) CH1 (1) CH2 CH3 (1) (1) CH4 (1) CH1 CH2 CH3 CH4 (2) (2) (2) (2) CH1 CH2 CH3 CH4 (3) (3) (3) (3) CH1 CH2 (4) (4) CH3 CH4 (4) (4) CH1 CH2 CH3 CH4 (5) (5) (5) (5) CH1 CH2 CH3 CH4 (6) (6) (6) (6) CH1 CH2 CH3 (7) (7) (7) CH4 (7) CH1 CH2 (8) (8) CH3 CH4 (8) (8) DCLK Output DSYNC1 COMP_DSYNC1 = 2 DSYNC2 SAMPLE_COUNT = N tDSYNC2 = (N+1) x tAFE_CLK Figure 68. Data Output Timing Diagram (4x Serialization, Input Divider Enabled) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 33 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Table 17. Register Functions REGISTER DELAY_COUNT[23:0] FUNCTION From a TRIG event, the sample phase is delayed for a DELAY_COUNT number of tAFE_CLK cycles SAMPLE_COUNT[23:0] From the end of DELAY_PHASE, the sample phase duration is the SAMPLE_COUNT number of tAFE_CLK cycles COMP_DSYNC1[15:0] DSYNC1 period in number of tAFE_CLKcycles Table 18. DSYNC1_START_LOW Register DSYNC1_START_LOW DESCRIPTION 0 DSYNC1 is high at the sample phase start 1 DSYNC1 is low at the sample phase start Table 19. OUT_MODE_EN Register OUT_MODE_EN DESCRIPTION 0 Data always active 1 Data active in sample phase Table 20. DSYNC_EN Register DSYNC_EN DESCRIPTION 0 Disable DSYNC generation 1 Enable DSYNC generation Table 21. OUT_BLANK_HIZ Register OUT_BLANK_HIZ DESCRIPTION 0 D[11:0] is low during inactive phase 1 D[11:0] is high impedance during inactive phase NOTE The signal processing blocks in the device are always active and are not controlled by output mode configuration settings. 34 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 The functionality of the DSYNC1, DSYNC2, DCLK, and D[11:0] output pins with the input divider enabled for 3x serializations is shown in Figure 69. CLKIN INPUT TRIG TRIG_INT Pixel = 0 Pixel = 1 Pixel = 2 Pixel = 3 INTERNAL tAFE_CLK AFE_CLK D[11:0] OUT_MODE_EN = 0 Pixel = 0 Pixel = 1 Pixel = 2 Pixel = 3 CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 D[11:0] OUT_MODE_EN = 1 CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 (0) (0) (0) CH1 CH2 CH3 (1) (1) (1) CH1 CH2 (2) (2) CH3 (2) CH1 CH2 CH3 (3) (3) (3) CH1 CH2 CH3 (4) (4) (4) CH1 CH2 CH3 (5) (5) (5) CH1 CH2 CH3 (6) (6) (6) CH1 CH2 CH3 (7) (7) (7) CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 CH1 CH2 CH3 (0) (0) (0) CH1 CH2 CH3 (1) (1) (1) CH1 CH2 (2) (2) CH3 (2) CH1 CH2 CH3 (3) (3) (3) CH1 CH2 CH3 (4) (4) (4) CH1 CH2 CH3 (5) (5) (5) CH1 CH2 CH3 (6) (6) (6) CH1 CH2 CH3 (7) (7) (7) CH1 CH2 (8) (8) CH3 CH1 (8) (9) CH2 CH3 (9) (9) CH1 CH2 CH3 (10) (10) (10) CH1 CH2 CH3 (11) (11) (11) CH1 CH2 CH3 (12) (12) (12) CH1 (13) DCLK OUTPUT DSYNC1 COMP_DSYNC1=2 DSYNC2 SAMPLE COUNT = N tDSYNC2 = (N+1)* tAFE_CLK Figure 69. Data Output Timing (3x Serialization, Input Divider Enabled) The TRIG to DSYNC2 latency is given by Table 22. Table 22. TRIG to DSYNC2 Latency across Serialization Modes for AFE_CLK = 25 MHz (1) Serialization Modes TTRIG_DSYNC2_LAT (1) Units 4x 230 ns 3x 230 ns 2x 240 ns 1x 250 ns The TRIG_DSYNC2_LAT delay can vary by ± 8 ns. 8.4.2.1 Header Each channel has an associated 12-bit header register. These registers can be written by an SPI write. The content of this register can be read out on the CMOS data output (D[11:0]) by configuring the HEADER_MODE register, as shown in Table 23. Table 23. HEADER_MODE Register HEADER_MODE DESCRIPTION 0 ADC data at output 1 Header data at output 2 [Temperature data, diagnostic data, mean, noise, (-1), (-1), (-1), (-1)]. This data sequence is repeated. 3 Header data, temperature data, diagnostic data, mean, noise, ADC data Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 35 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com In HEADER_MODE = 3, the header mode data output is shown in Figure 70. In this mode, header data is transmitted with a latency with respect to the TRIG input. This latency is given by Equation 2: TRIG to Header Latency (TTRIG_HEADER_LAT) = tAFE_CLK + TTRIG_DSYNC2_LAT (2) TRIG CLKIN AFE_CLK TRIG_INT ADC CH4 ADC CH3 ADC CH1 ADC CH2 Noise CH3 Noise CH4 Noise CH1 Noise CH2 Mean CH4 Mean CH3 Mean CH2 Mean CH1 DIAG DIAG DIAG DIAG Temp Data Temp Data Temp Data Temp Data Header CH4 Header CH3 DATA Header CH2 Header CH1 DCLK TTRIG_DSYNC2_LAT DSYNC2 TTRIG_HEADER_LAT Figure 70. Header Mode Data Output (HEADER_MODE = 3) 8.4.2.2 Test Pattern Mode In order to check the interface between the AFE and the receiver system, a test pattern can be directly programmed on the CMOS output. As shown in Table 24, different test patterns can be selected by setting the TST_PAT_MODE register. Table 24. TST_PAT_MODE Register (1) TST_PAT_MODE (1) 36 DESCRIPTION 0 Normal ADC output data 1 SYNC pattern (D[11:0] = 111111000000) 2 Deskew pattern (D[11:0] = 010101010101) 3 Custom pattern as per CUSTOM_PATTERN[11:0] register bits 4 All 1s 5 Toggle data (output toggles between all 0s and all 1s) 6 All 0s 7 Full-scale ramp data In decimate-by-2 mode, alternate samples are dropped and thus output data D0 does not toggle for full-scale ramp data and output data D[11:0] does not toggle for toggle data. Similarly, in decimate-by-4 mode, three samples are dropped and thus output data D0 and D1 do not toggle for full-scale ramp data and output data D[11:0] does not toggle for toggle data. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.4.3 Parity Parity for each output sample of an active channel can be read on the D_GPO[1:0] pins by configuring these pins with the DGPO1_MODE, DGPO0_MODE register, as shown in Table 25. Parity generation can be enabled using the D_GPO_EN bit, as shown in Table 26. The type of parity generation can be configured to odd or even based on the PARITY_ODD bit, as shown in Table 27. Table 25. DGPO0_MODE, DGPO1_MODE Register DGPO0_MODE, DGPO1_MODE DESCRIPTION 0 Low 1 Parity 2 Overload 3 D[11] Table 26. D_GPO_EN Register D_GPO_EN DESCRIPTION 0 D_GPO[x] pins are disabled 1 D_GPO[x] pins are enabled Table 27. PARITY_ODD Register PARITY_ODD DESCRIPTION 0 Even 1 Odd 8.4.4 Standby, Power-Down Mode The device can be put into standby mode with the STDBY register bit. In this mode, all blocks except the ADC reference blocks are powered down. In GLOBAL_PDN mode, all blocks including the ADC reference blocks are powered down. However, in both modes, the serial interface is active. 8.4.5 Digital Filtering to Improve Stop-Band Attenuation The device introduces a standard 11-tap, symmetric finite impulse response (FIR) digital filter for additional stopband attenuation in decimate-by-2 and decimate-by-4 modes. In both modes, the FIR digital filter coefficients (C1 to C6) must be configured to obtain the desired filter characteristics. However, set 1 coefficients are loaded by default at device reset. In this mode, device power consumption increases and the DSYNC period scales according to the decimation mode (the DSYNC period increases by 2x in decimate-by-2 mode and 4x in decimate-by-4 mode when compared to normal mode). Maximum AFE_CLK frequency supported in the decimation modes is 50 MHz. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 37 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.4.5.1 Decimate-by-2 Mode In this mode, the DECIMATE_2_EN and FILT_EN register bits must be set, and the filter coefficients should be configured. Figure 71 shows typical filter response in decimate-by-2 mode for the filter coefficient of set 1 (default). Note that the output data rate is reduced by a factor of 2 as compared to default mode for the given clock input frequency. 20 10 Channel Gain (dB) 0 ±10 ±20 ±30 ±40 ±50 ±60 Default Mode ±70 DECIMATE_2_EN = 1 ±80 0.1 1 10 fIN (MHz) C037 Figure 71. Decimate-by-2 Filter Response (fS = 50 MHz) 8.4.5.2 Decimate-by-4 Mode In this mode, the DECIMATE_2_EN, DECIMATE_4_EN, and FILT_EN register bits must be set, and the filter coefficients should be configured. Figure 72 shows a typical filter response in decimate-by-4 mode for the filter coefficient of set 1 (default) and set 2. Note that the output data rate is reduced by a factor of 4 as compared to default mode for the given clock input frequency. 10 Channel Gain (dB) 0 ±10 ±20 ±30 ±40 ±50 DECIMATE_4_EN = 1, Set 2 ±60 DECIMATE_4_EN = 1, Set 1 ±70 0.1 1 fIN (MHz) C038 (1) Set 1: C1 = 5, C2 = 2, C3 = –13, C4 = –2, C5 = 38, and C6 = 66. Set 2: C1 = –5, C2 = –2, C3 = 7, C4 = 19, C5 = 30, and C6 = 34. Figure 72. Decimate-by-4 Filter Response (fS = 12.5 MHz) 8.4.6 Diagnostic Mode The device offers various diagnostic modes to check proper device operation at a system level. These modes can be enabled using the SPI and the outputs of these modes are stored in diagnostic read-only registers. 1. Internal reference status check: In this mode, the on-chip band-gap voltage, ADC reference, and clock generation are verified for functionality. Reading a 0 on these bits indicates that these blocks are functioning properly. The DIAG_MODE_EN register bit must be set to 1. The DIG_REG register bits for this mode are: – DIG_REG[0] for ADC references, – DIG_REG[1] for band gap, and – DIG_REG[2] for clock generation. 38 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 2. DC input force: In this mode, a dc voltage can be internally forced at the LNA input to test the entire signal chain. During this test, the device analog inputs should be left floating. This mode can be asserted by setting the DC_INP_EN bit to 1 and programming the DC_INP_PROG[0:2] bits. In this mode, the equalizer is disabled internally. 3. Variance (noise) and mean measurement: Variance and mean of the ADC output can be analyzed using the on-chip STAT module. The STAT_EN, STAT_CALC_CYCLE, and STAT_CH_SEL, STAT_CH_AUTO_SEL options should be set to compute the variance and mean. These values can be monitored using channelspecific, read-only registers. Alternatively, these values can also be read using HEADER_MODE. Output variance and mean calculation is determined by Equation 3. (3) STAT_CALC_CYCLE must be set to a large value to obtain better accuracy. Mean provides the average dc value of the ADC output (mid code). The STAT module integration time is defined by: tAFE_CLK × 2(STAT_CALC_CYCLE+1) when the STAT_CH_SEL option is selected. When STAT_CH_AUTO_SEL is enabled, the STAT module integration time is defined by: 4 × tAFE_CLK × 2(STAT_CALC_CYCLE+1). 4. Temperature sensor: The device junction temperature measurement can be enabled and monitored using TEMP_SENS_EN and TEMP_CONV_EN. The temperature output is saved in a diagnostic read-only register, TEMP_DATA. Alternatively, this data can also be read using HEADER_MODE. The TEMP_DATA value is a 9-bit, twos complement data in degrees Celsius. The temperature data is internally updated as per Equation 4: Temperature Data Update Cycle = 1024 × TAFE_CLK × 16 (4) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 39 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.4.7 Signal Chain Probe To enhance system-level debug capabilities, the device offers a mode where the output of each block in the signal chain can be connected to the ADC input. With this mode, internal signals can be easily monitored to ensure that each block output is not saturated. Figure 73 shows the device signal chain block diagram. Figure 74 and Figure 75 show typical frequency response plots at the output of each stage. LNA AMP 1 AMP 2 AMP 3 MUX PGA + Antialiasing Filter ADC VOUT_ON_ADC[1:0] 20 45 15 40 10 35 Channel Gain (dB) Channel Gain (dB) Figure 73. Signal Chain Block Diagram 5 0 ±5 ±10 AMP1_OUT_ADC ±15 20 15 10 AMP1_OUT_ADC AMP2_OUT_ADC 0 LNA_OUT_ADC ±25 LNA_OUT_ADC ±5 0.1 1 0.1 10 fIN (MHz) 1 10 fIN (MHz) C001 Figure 74. Frequency Response for VOUT_ON_ADC Settings (PGA Gain = 0 dB) 40 25 5 AMP2_OUT_ADC ±20 30 C001 Figure 75. Frequency Response for VOUT_ON_ADC Settings (PGA Gain = 30 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 8.5 Programming 8.5.1 Serial Interface Different modes can be programmed through the serial interface formed by the SEN (serial interface enable), SCLK (serial interface clock), SDATA (serial interface data) and RESET pins. SCLK and SDATA have a 150-kΩ pull-down resistor to ground and SEN has a 150-kΩ pull-up resistor to DVDD18. Serially shifting bits into the device is enabled when SEN is low. SDATA serial data bits are latched at every SCLK rising edge when SEN is active (low). Serial data bits are loaded into the register at every 24th SCLK rising edge when SEN is low. If the word length exceeds a multiple of 24 bits, the excess bits are ignored. Data bits can be loaded in multiples of 24bit words within a single active SEN pulse (an internal counter counts groups of 24 clocks after the SEN falling edge). The interface can function with SCLK frequencies from 20 MHz down to very low speeds and even with a non-50% duty-cycle SCLK. Data bits are divided into two main portions: a register address (8 bits, A[7:0]) and data (16 bits, D[15:0]). 8.5.2 Register Initialization After power up, the internal registers must be initialized to the default value (0). Initialization can be accomplished in one of two ways: • Either through a hardware reset, by applying a positive pulse to the RESET pin, or • Through a software reset with the serial interface, by setting the SW_RST bit high. Setting this bit initializes the internal registers to the respective default values (all 0s) and then self-resets the SW_RST bit low. In this case, the RESET pin can stay low (inactive). • • • NOTE No damage occurs to the part by applying voltage to the RESET pin while device power is off. For correct device operation, a positive pulse must be applied to the RESET pin. This pulse sets the internal control registers to 0. However, no power-supply sequencing is required. Reset only affects the digital registers and places the device in a default state. Reset does not function as a power-down and, therefore, all internal blocks are functional. During a register write through the SPI, the effects on data propagate through the pipe while the internal registers change values. At the same time, some glitches may be present on the output because of the transition of register values (for instance, if any output-controlling modes change). The signal on the RESET pin must be low in order to write to the internal registers because reset is level-sensitive and asynchronous with the input clock. Although only 40 ns are required after the RESET rising edge to change the registers, the output data may take up to 20 clock cycles (worst-case) to be considered stable. For more information on RESET, see the Timing Requirements: RESET. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 41 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Programming (continued) 8.5.2.1 Register Write Mode In register write mode, the REG_READ_EN bit must be set to 0. In this mode, the SDOUT signal outputs 0. Figure 76 shows this process. SEN End Sequence t6 t1 SCLK t7 Data latched on rising edge of SCLK t2 t3 A[7] SDATA A[6] A[5] A[4] A[3] A[2] A[1] A[0] D[15] D[14] D[13] D[12] D[11] D[10] D[9] D[8] D[7] D[6] D[5] D[4] D[3] D[2] D[1] D[0] t4 t5 SDOUT Figure 76. Serial Interface Register Write 8.5.2.2 Register Read Mode In register readout mode, the REG_READ_EN bit must be set to 1. Then, a serial interface cycle should be initiated, specifying the address of the register (A[7:0]) whose content must be read out of the device. The data bits are don’t care. The device outputs the contents (D[15:0]) of the selected register on the SDOUT pin. The external controller latches the data on SDOUT at the SCLK rising edge. Figure 77 shows this process. The timing specifications for the serial interface operation is listed in the Timing Requirements: Serial Interface Operation. SEN End Sequence t6 t1 t7 t2 SCLK t3 A[7] SDATA A[6] A[5] A[4] A[3] A[2] A[1] A[0] X X t4 t5 t8 X X X X X X X X X X X X D[3] D[2] X X SDOUT to be latched externally on rising edge D[15] D[14] D[13] D[12] D[11] D[10] D[9] D[8] D[7] D[6] D[5] D[4] D[1] D[0] SDOUT Figure 77. Serial Interface Register Readout Enable 42 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Programming (continued) 8.5.3 CMOS Output Interface The digital data from the four channels are multiplexed and output over a 12-bit parallel CMOS bus to reduce the device pin count. In addition to the data, a CMOS clock (DCLK) is also output, which can be used by the digital receiver to latch the AFE output data. The output data and clock buffers can typically drive a 5-pF load capacitance in default mode. To drive larger loads (10 pF to 15 pF), the strength of the CMOS output buffers can be increased using the STR_CTRL_CLK and STR_CTRL_DATA register bits. Note that the setup and hold time of the output data (with respect to DCLK) degrade with higher load capacitances. See Table 1, which provides timings for 5-pF and 15-pF load capacitances. 8.5.3.1 Synchronization and Triggering While the digital data from the four channels is multiplexed on the output bus, some mechanism is required to identify the data from the individual channels. Other than the output data and DCLK, the device also outputs DSYNCx signals that can be used for channel identification. The DSYNCx output signals function with the TRIG input signal. Every time that a trigger pulse is received on the TRIG pin, the device outputs the DSYNC1 and DSYNC2 signals. The DSYNCx signals can be configured in the following ways: • The delay between the arrival of the TRIG signal and the DSYNCx signal becoming active is programmable in a number of AFE_CLK cycles (using the DELAY_COUNT register bit). • The period of the DSYNC1 signal is programmable in terms of AFE_CLK clock cycles by using the COMP_DSYNC1 register bits. • The active time of the DSYNC2 signal is programmable using the SAMPLE_COUNT register bits. The rising edge of the DSYNC1 signal coincides with the channel 1 data, as shown in Figure 78. This occurrence can be used by the receiving device to identify individual channels. The sample phase period corresponds to the period when valid data is available from the device when OUT_MODE_EN = 1. CLKIN INPUT TRIG CYCLE RESET TRIG_INT Pixel = 0 INTERNAL Pixel = 1 Pixel = 2 tAFE_CLK Pixel = 3 AFE_CLK tOUT Pixel = 0 D[11:0] OUT_MODE_EN = 0 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 D[11:0] OUT_MODE_EN = 1 CH1 CH2 CH3 CH4 CH1 CH1 CH2 CH3 (0) (0) (0) CH4 (0) CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH3 CH4 Pixel = 1 CH1 CH2 CH3 (1) (1) (1) CH4 (1) Pixel = 2 CH1 CH2 CH3 CH4 (2) (2) (2) (2) Pixel = 3 CH1 CH2 CH3 CH4 (3) (3) (3) (3) CH1 CH2 CH3 CH4 (4) (4) (4) (4) CH1 CH2 CH3 CH4 (5) (5) (5) (5) CH1 CH2 CH3 CH4 (6) (6) (6) (6) CH1 CH2 CH1 CH2 CH1 CH2 CH3 (7) (7) (7) CH3 CH4 CH1 CH2 CH3 CH4 (7) CH1 CH2 (8) (8) CH3 CH4 (8) (8) CH4 CH1 CH2 CH3 CH4 CH1 CH2 CH1 CH2 (8) (8) CH3 CH4 CH1 CH2 (8) (8) (9) (9) CH3 (9) DCLK COMP_DSYNC1 COMP_DSYNC1 DSYNC1_HIGH DSYNC1 OUTPUT SAMPLE PHASE DSYNC2 DELAY PHASE DSYNC2_LOW BLANKING PHASE SAMPLE PHASE DELAY PHASE SAMPLE COUNT = N TTRIG_DSYNC2_LAT SAMPLE COUNT = N tDSYNC2 = (N+1) * tAFE_CLK tDSYNC2 = (N+1) * tAFE_CLK Figure 78. DSYNCx Timing Diagram Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 43 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.6 Register Maps 8.6.1 Functional Register Map Table 28 shows the register map for the AFE5401 registers. Table 28. Register Map REGISTER BIT 15 BIT 14 BIT 13 BIT 12 BIT 11 BIT 10 BIT 9 BIT 8 BIT 7 BIT 6 BIT 5 0 (00h) 0 0 0 0 0 0 0 0 0 1 (01h) 0 0 0 0 0 STDBY 0 0 DECIMATE _4_EN DIV_REG 0 0 0 DGPO0_MODE 2 (02h) 0 0 0 3 (03h) 0 TST_PAT_MODE 0 0 0 0 0 4 (04h) OUT_ BLANK_HIZ OUT_ MODE_EN DCLK_ INVERT TEMP_ CONV_EN TEMP_ SENS_EN 0 0 BIT 4 BIT 3 BIT 1 BIT 0 SW_RST 0 0 0 REG_ READ_EN DIV_FRC DECIMATE _2_EN DIV_EN SE_CLK_ MODE GLOBAL_ PDN 0 0 0 0 0 0 0 DGPO1_MODE TEMP_DATA 0 5 (05h) 0 0 0 0 0 OFF_BIN_ DATA_FMT 0 CUSTOM_PAT 6 (06h) 7 (07h) 0 0 D_GPO_EN PARITY_ ODD 0 0 STAT_ EN DCP_INP_ EN 0 0 0 DCP_INP_PROG 0 0 0 0 0 DIAG_ MODE_EN 0 0 0 0 DIAG_REG FILTER_BW 8 (08h) C2_FIR DIG_GAIN_C1_FIR 9 (09h) C4_FIR C3_FIR 10 (0Ah) C6_FIR 15 (0Fh) 0 0 19 (13h) 0 OB_ DISABLE 0 0 0 0 0 0 0 STR_CTRL_DATA 0 0 0 0 0 0 0 0 0 0 0 0 DELAY_COUNT[23:16] SAMPLE_COUNT[23:16] 22 (16h) DELAY_COUNT[15:0] 23 (17h) 24 (18h) HEADER_MODE C5_FIR FAST_ DGPO STR_CTRL_CLK 21 (15h) SAMPLE_COUNT[15:0] TRIG_FALL DSYNC1_ START_ LOW 25 (19h) 0 DSYNC_EN 0 COMP_DSYNC1[15:6] COMP_DSYNC1[5:0] 0 26 (1Ah) 0 0 DSYNC2_LOW[23:16] DSYNC2_LOW[15:0] 27 (1Bh) DSYNC1_HIGH 29 (1Dh) OFFSET_ DIS 0 STAT_CH_SEL 0 0 30 (1Eh) 0 0 0 0 0 0 32 (20h) 0 0 0 0 33 (21h) CH_OUT_ DIS1 AUX_CH1_ EN PDN_CH1 INVERT_ CH1 34 (22h) 0 0 MEAN_CH1 35 (23h) 0 0 NOISE_CH1 36 (24h) 0 0 44 BIT 2 0 STAT_CALC_CYCLE 0 MULT_EN FILT_EN 0 0 0 0 0 0 STAT_CH_ AUTO_SEL 0 0 0 0 0 HEADER_CH1 0 0 OFFSET_CH1 0 HEADER_CH2 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Register Maps (continued) Table 28. Register Map (continued) REGISTER BIT 15 BIT 14 BIT 13 BIT 12 BIT 11 BIT 10 37 (25h) CH_OUT_ DIS2 AUX_CH2_ EN PDN_CH2 INVERT_ CH2 0 0 BIT 9 BIT 8 BIT 7 BIT 6 38 (26h) 0 0 MEAN_CH2 39 (27h) 0 0 NOISE_CH2 0 0 0 0 41 (29h) CH_OUT_ DIS3 AUX_CH3_ EN PDN_CH3 INVERT_ CH3 42 (2A) 0 0 MEAN_CH3 43(2B) 0 0 NOISE_CH3 0 0 0 0 0 CH_OUT_ DIS4 AUX_CH4_ EN PDN_CH4 INVERT_ CH4 46(2Eh) 0 0 MEAN_CH4 47(2Fh) 0 0 NOISE_CH4 65 (41h) 0 0 69 (45h) TERM_INT_ 20K_LNA 70 (46h) 0 71(47h) 0 100(64h) 0 0 0 0 0 HF_AFE_CLK_EN BIT 0 OFFSET_CH4 TERM_INT_ 20K_AUX 0 0 0 PGA_GAIN 0 BIT 1 HEADER_CH4 0 LNA_GAIN 0 BIT 2 OFFSET_CH3 45 (2Dh) HPL_EN BIT 3 HEADER_CH3 0 44 (2Ch) 0 BIT 4 OFFSET_CH2 40 (28h) 0 BIT 5 0 0 0 0 0 0 0 0 0 0 0 0 EQ_EN 0 0 0 0 0 0 0 0 0 0 0 VOUT_ON_ADC EQ_ EN_LOW _FC 0 0 0 0 0 0 0 0 0 0 0 0 0 0 HIGH_ POW_LNA 0 0 0 0 0 0 0 0 0 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 45 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 8.6.2 Register Descriptions Figure 79. Register 0 (00h) 15 0 14 0 13 0 12 0 11 0 10 0 9 0 8 0 7 6 5 4 3 2 0 0 0 0 0 0 0 1 REG_READ_ EN Bits 15:2 Must write 0 Bit 1 REG_READ_EN: Register read mode SW_RST 0 = Write (default) 1 = Enable register read Bit 0 SW_RST: Software reset This bit is the software reset for the entire device. This bit is self-clearing. Figure 80. Register 1 (01h) 15 0 14 0 13 0 12 0 11 0 10 STDBY 9 0 8 0 7 DECIMATE_4_ EN 6 5 4 3 DECIMATE_2_ EN 2 1 SE_CLK_ MODE 0 DIV_REG DIV_FRC Bits 15:11 Must write 0 Bit 10 STDBY: Full device standby DIV_EN GLOBAL_PDN 0 = Normal (default) 1 = Standby Bits 9:8 Must write 0 Bit 7 DECIMATE_4_EN 0 = Decimate-by-4 mode not enabled 1 = Decimate-by-4 mode enabled The DECIMATE_2_EN and FILT_EN bits must be set. FIR filter coefficients (C1 to C6) must be written for proper operation. If the AFE_CLK frequency > 25 MHz, then HF_AFE_CLK_EN must be set. Bits 6:5 Bit 4 DIV_REG: Input clock divider ratio in DIV_FRC mode DIV_REG fAFE_CLK 0 CLKIN ÷ 1 1 CLKIN ÷ 2 2 CLKIN ÷ 3 3 CLKIN ÷ 4 Input divider disabled and bypassed DIV_FRC: Force input divider ratio 0 = Auto computed based on CH_OUT_DISx (default). For more details, refer to Table 12. 1 = AFE clock frequency is based on DIV_REG settings 46 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com Bit 3 SBAS619A – MARCH 2014 – REVISED JUNE 2017 DECIMATE_2_EN 0 = Normal mode 1 = Decimate-by-2 mode enabled The FILT_EN bit must be set for proper operation. FIR filter coefficients (C1 to C6) must be written for proper operation. If the AFE_CLK frequency > 25 MHz, then HF_AFE_CLK_EN must also be set. Bit 2 DIV_EN: Enable CLKIN divider 0 = Disabled and bypassed (default) 1 = Enabled Bit 1 SE_CLK_MODE: Single-ended input clock configuration 0 = Differential (default) 1 = Single-ended Bit 0 GLOBAL_PDN: Full device power-down 0 = Normal (default) 1 = Global PDN Figure 81. Register 2 (02h) 15 14 TST_PAT_MODE 13 12 0 11 0 10 0 9 0 8 0 7 0 6 5 4 3 2 0 1 0 0 0 Bits 15:13 DGPO0_MODE DGPO1_MODE TST_PAT_MODE: Test pattern for CMOS output 0 1 2 3 4 5 6 7 = = = = = = = = Normal (default) SYNC Deskew Custom register 5[15:0] All 1s Toggle All 0s Ramp Bits 12:7 Must write 0 Bits 6:5 DGPO0_MODE: DGPO0 mode configuration 0 1 2 3 Bits 4:3 Low (default) Parity Overload D[11] DGPO1_MODE: DGPO1 mode configuration 0 1 2 3 Bits 2:0 = = = = = = = = Low (default) Parity Overload D[11] Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 47 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 82. Register 3 (03h) 15 0 14 0 13 0 12 0 7 6 5 4 11 0 10 0 9 8 3 2 1 0 8 0 TEMP_DATA TEMP_DATA Bits 15:10 Ignore bits Bits 9:0 TEMP_DATA: Read-only temperature readout register Data is 9-bit, twos complement format in degrees Celsius. Figure 83. Register 4 (04h) 15 OUT_BLANK_ HIZ 14 OUT_MODE_ EN 7 6 0 0 Bit 15 13 12 TEMP_CONV_ EN 11 TEMP_SENS_ EN 10 9 0 0 5 4 2 1 0 0 3 OFF_BIN_ DATA_FMT 0 0 DCLK_INVERT 0 0 OUT_BLANK_HIZ: Output status during blanking phase 0 = D[11:0] and D_GPO[1:0] are low (default) if EN_OUT_MODE = 1 1 = D[11:0] and D_GPO[1:0] are Hi-Z if EN_OUT_MODE = 1 For more details, refer to Figure 67. Bit 14 OUT_MODE_EN: Enables output mode gating with DSYNC2 0 = CMOS data is always active (default) 1 = Output mode enabled. Data is transmitted only during sample phase. Bit 13 DCLK_INVERT: Invert DCLK 0 = DCLK rising edge at the center of data (default) 1 = DCLK falling edge at the center of data Bit 12 TEMP_CONV_EN: Enable Temperature Sensor output to digital conversion 0 = Hold conversion 1 = Convert Bit 11 TEMP_SENS_EN: Enable temperature sensor block 0 = Disable temperature sensor 1 = Enable temperature sensor Bits 10:4 Must write 0 Bit 3 OFF_BIN_DATA_FMT: Output data format 0 = Twos complement (default) 1 = Offset binary Bits 2:0 48 Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 84. Register 5 (05h) 15 14 13 12 11 CUSTOM_PAT 10 9 8 7 6 5 4 2 1 0 3 CUSTOM_PAT Bits 15:0 CUSTOM_PAT: Custom pattern data These bits set the custom data pattern. Figure 85. Register 6 (06h) 15 0 14 0 13 0 12 0 11 0 10 0 9 0 8 0 7 0 6 0 5 0 4 0 3 0 2 1 DIAG_REG[2:0] 0 10 DC_INP_PROG 9 8 DIAG_MODE_ EN Bits 15:3 Ignore bits Bits 2:0 DIAG_REG: Read only diagnostic readout register DIAG_REG[0] = 0: ADC references are correct DIAG_REG[1] = 0: Indicates band gap is correct DIAG_REG[2] = 0: Indicates clock generation is correct Figure 86. Register 7 (07h) 15 D_GPO_EN 14 PARITY_ODD 13 STAT_EN 12 DC_INP_EN 11 7 0 6 0 5 0 4 0 3 Bit 15 2 1 0 HEADER_MODE FILTER_BW D_GPO_EN: Enable D_GPO functionality 0 = D_GPO[x] pins are disabled (default) 1 = D_GPO[x] pins are enabled Bit 14 PARITY_ODD: Parity type 0 = Even (default) 1 = Odd Bit 13 STAT_EN: Enable noise and mean calculation of ADC output 0 = Default 1 = Enables noise and mean computation if STAT_CALC_CYCLE is set. Bit 12 DC_INP_EN: Enable dc analog voltage at LNA input. In this mode, equalizer is disabled automatically. 0 = Normal 1 = DC input force is controlled by DC_INP_PROG. Bits 11:9 DC_INP_PROG: DC Input programmability 0 1 2 3 = = = = 0 mV 0 mV 50 mV –50 mV 4 5 6 7 = = = = 100 mV –100 mV 100 mV –100 mV Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 49 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 Bit 8 www.ti.com DIAG_MODE_EN: Enable diagnostic mode 0 = Disable diagnostic circuit 1 = Enable diagnostic circuit Bits 7:4 Must write 0 Bits 3:2 FILTER_BW: Filter corner frequency 0 1 2 3 Bits 1:0 = = = = 8 MHz (default) 7 MHz 10.5 MHz 12 MHz HEADER_MODE: Header output mode 0 = ADC data at output (default) 1 = Header data at output 2 = [Temperature data, diagnostic data, mean, noise, (-1), (-1), (-1), (-1)]. This data sequence is repeated. 3 = Header data, temperature data, diagnostic data, mean, noise, ADC data. Refer to Figure 70 for more information. Figure 87. Register 8 (08h) 15 14 13 12 11 10 9 8 4 3 DIG_GAIN_C1_FIR 2 1 0 C2_FIR 7 Bits 15:8 6 5 C2_FIR: Coefficient C2 for FIR digital filter (1) 2 = Default value Bit 7:0 DIG_GAIN_C1_FIR: Digital Gain common for all channels, coefficient C1 for decimation filter where: • (DIG_GAIN + 32) is Mod (2) 128. (5) Refer to Figure 60 for more information. Mode C1 Functionality With MULT_EN DIG_GAIN With DECIMATE_X _EN Coefficient C1 for FIR digital filter 5 = Default value (1) (2) 50 C1 to C6 FIR filter coefficients are in twos complement form. Mod = Remainder of the division. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 88. Register 9 (09h) 15 14 13 12 11 10 9 8 3 2 1 0 11 10 9 8 3 2 1 0 C4_FIR 7 6 5 4 C3_FIR Bits 15:8 C4_FIR: Coefficient C4 for FIR digital filter (1) –2 = Default value Bit 7:0 C3_FIR: Coefficient C3 for FIR digital filter (1) –13 = Default value (1) C1 to C6 FIR filter coefficients are in twos complement form. Figure 89. Register 10 (0Ah) 15 14 13 12 C6_FIR 7 6 5 4 C5_FIR Bits 15:8 C6_FIR: Coefficient C6 for FIR digital filter (1) 66 = Default value Bit 7:0 C5_FIR: Coefficient C5 for FIR digital filter (1) 38 = Default value (1) C1 to C6 FIR filter coefficients are in twos complement form. Figure 90. Register 15 (0Fh) 15 0 14 0 13 0 12 0 11 0 10 FAST_DGPO 9 0 8 0 7 0 6 0 5 0 4 0 3 0 2 0 1 0 0 0 Bits 15:11, and Bits 9:0 Must write 0 Bit 10 FAST_DGPO: Fast DGPO output buffer 0 = Default strength (default) 1 = Higher drive strength on D_GPO[x] pins. Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 51 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 91. Register 19 (13h) 15 0 14 OB_DISABLE 7 6 STR_CTRL_DATA 13 12 11 STR_CTRL_CLK 10 9 8 STR_CTRL_DATA 5 0 4 0 2 0 1 0 3 0 0 0 Bits 15, Bits 5:0 Must write 0 Bit 14 OB_DISABLE: CMOS output buffers D[11:0], DCLK disabled 0 = Active CMOS output buffers 1 = Hi-Z CMOS output Buffers Bits 13:10 STR_CTRL_CLK: Controls strength of CMOS output DCLK buffer STR_CTRL_CLK Drive Strength DRVDD (V) 0 Default strength (CLOAD = 5 pF) 3.3 6 Maximum strength (CLOAD = 15 pF) 3.3 5 Default strength (CLOAD = 5 pF) 1.8 14 Maximum strength (CLOAD = 15 pF) 1.8 All other options are reserved. Bit 9:6 STR_CTRL_DATA: Controls strength of CMOS output DATA buffers STR_CTRL_DAT A Drive Strength DRVDD (V) 0 Default strength (CLOAD = 5 pF) 3.3 6 Maximum strength (CLOAD = 15 pF) 3.3 5 Default strength (CLOAD = 5 pF) 1.8 14 Maximum strength (CLOAD = 15 pF) 1.8 All other options are reserved. Figure 92. Register 21 (15h) 15 14 13 12 11 10 9 8 2 1 0 DELAY_COUNT[23:16] 7 Bits 15:8 6 5 4 3 SAMPLE_COUNT[23:16] DELAY_COUNT[23:16]: Delay counter, upper bits These bits determine the delay phase in terms of tAFE_CLK. DELAY_PHASE = (DELAY_COUNT + 1) × tAFE_CLK. The valid range for DELAY_COUNT is from 0 to (224 – 2). The maximum supported values of DELAY_COUNT + SAMPLE_COUNT is (224 – 2). Bits 7:0 SAMPLE_COUNT[23:16]: Sample counter, upper bits These bits determine the sample phase in terms of tAFE_CLK. Sample phase = (SAMPLE_COUNT + 1) × tAFE_CLK. The valid range for SAMPLE_COUNT is from 0 to (224 – 2). The maximum supported values of DELAY_COUNT + SAMPLE_COUNT is (224 – 2). 52 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 93. Register 22 (16h) 15 14 13 12 11 DELAY_COUNT[15:0] 10 9 8 7 6 5 4 3 DELAY_COUNT[15:0] 2 1 0 Bits 15:0 DELAY_COUNT[15:0]: Delay counter, lower bits These bits determine the delay phase in terms of tAFE_CLK. DELAY_PHASE = (DELAY_COUNT + 1) × tAFE_CLK. The valid range for DELAY_COUNT is from 0 to (224 – 2). The maximum supported values of DELAY_COUNT + SAMPLE_COUNT is (224 – 2). Figure 94. Register 23 (17h) 15 14 13 12 11 SAMPLE_COUNT[15:0] 10 9 8 7 6 5 4 3 SAMPLE_COUNT[15:0] 2 1 0 Bits 15:0 SAMPLE_COUNT[15:0]: Sample counter, lower bits These bits determine the sample phase in terms of tAFE_CLK. Sample phase = (SAMPLE_COUNT + 1) × tAFE_CLK. The valid range for SAMPLE_COUNT is from 0 to (224 – 2). The maximum supported values of DELAY_COUNT + SAMPLE_COUNT is (224 – 2). Figure 95. Register 24 (18h) 15 TRIG_FALL 7 Bit 15 14 DSYNC1_ START_LOW 13 12 11 0 DSYNC_EN 0 6 5 4 COMP_DSYNC1[15:6] 3 10 9 8 COMP_DSYNC1[15:6] 2 1 0 0 TRIG_FALL 0 = TRIG event on the TRIG rising edge 1 = TRIG event on the TRIG falling edge Bit 14 DSYNC1_START_LOW: Selects DSYNC1 start level 0 = DSYNC1 starts with logic high (default) 1 = DSYNC1 starts with logic low Bit 13 Must write 0 Bit 12 DSYNC_EN: Enable DSYNC1/2 generation 0 = Disable DSYNC1/2 signals (default - logic low) 1 = Enable DSYNC1/2 signals Bit 11 Must write 0 Bits 10:1 COMP_DSYNC1[15:6]: DSYNC1, upper bits These bits determine the DSYNC1 period in the number of tAFE_CLK cycles. For COMP_DSYNC1 = 0 or 1, DSYNC1 is static. Bit 0 Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 53 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 96. Register 25 (19h) 15 14 7 6 Bits 15:10 13 12 COMP_DSYNC1[5:0] 5 11 4 3 DSYNC2_LOW[23:16] 10 9 0 8 0 2 1 0 COMP_DSYNC1[5:0]: DSYNC1, lower bits These bits determine the DSYNC1 period in the number of tAFE_CLK cycles. For COMP_DSYNC1 = 0 or 1, DSYNC1 is static. Bits 9:8 Must write 0 Bits 7:0 DSYNC2_LOW[23:16]: DSYNC2, upper bits Low pulse duration of DSYNC2 in number of tAFE_CLK clocks. Figure 97. Register 26 (1Ah) 15 14 13 12 11 DSYNC2_LOW[15:0] 10 9 8 7 6 5 4 3 DSYNC2_LOW[15:0] 2 1 0 Bits 15:0 DSYNC2_LOW[15:0]: DSYNC2, lower bits Low pulse duration of DSYNC2 in number of tAFE_CLK clocks. Figure 98. Register 27 (1Bh) 15 14 13 12 11 DSYNC1_HIGH 10 9 8 7 6 5 4 2 1 0 3 DSYNC1_HIGH Bits 15:0 DSYNC1_HIGH: DSYNC1 High pulse duration of DSYNC1, in number of tAFE_CLK clocks. DSYNC1 high = high for [(DSYNC1_HI + COMP_DSYNC1 ÷ 2) Mod (1) 54 (1) COMP_DSYNC1] Mod = Remainder of the division Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 99. Register 29 (1Dh) 15 OFFSET_DIS 7 14 0 6 STAT_CALC_CYCLE Bit 15 13 12 STAT_CH_SEL 11 0 10 0 5 3 0 2 0 4 0 9 8 STAT_CALC_CYCLE 1 0 0 STAT_CH_AUT O_SEL OFFSET_DIS: Bypass OFFSET addition at channel output 0 = Default. The OFFSET_CHx register value is added to the channel output. 1 = Disable OFFSET. The OFFSET_CHx register value is not added to the channel output. Bit 14 Always write 0 Bits 13:12 STAT_CH_SEL: Manual channel selection for computation by STAT module 0 1 2 3 = = = = Channel Channel Channel Channel 1 2 3 4 Bits 11:10 Always write 0 Bits 9:5 STAT_CALC_CYCLE Number of ADC samples used for STAT computation = 2STAT_CALC_CYCLE+1, STAT_CALC_CYCLE range = 0 to 30 and Bits 4:1 Always write 0 Bit 0 STAT_CH_AUTO_SEL: Automatic channel selection for SNR Computation 0 = Static, computation is done based on the STAT_CH_SEL selection 1 = Auto, computation is sequentially done for all four channels Figure 100. Register 30 (1Eh) 15 0 14 0 13 0 12 0 11 0 10 0 9 0 8 MULT_EN 7 FILT_EN 6 0 5 0 4 0 3 0 2 0 1 0 0 0 Bits 15:9 Must write 0 Bit 8 MULT_EN: Channel multiplier enable 0 = Disable multiplier 1 = Enable multiplier. For digital gain, DIG_GAIN_C1_FIR must be written. Bit 7 FILT_EN: Digital decimation filter enable 0 = Disable filter 1 = Enable standard 11-tap, symmetric FIR digital filter. Bits 6:0 Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 55 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 101. Register 32 (20h) 15 0 14 0 13 0 12 0 7 6 5 4 11 10 9 8 2 1 0 HEADER_CH1 3 HEADER_CH1 Bits 15:12 Must write 0 Bits 11:0 HEADER_CH1: Header information for channel 1 These bits provide the header information for channel 1. Figure 102. Register 33 (21h) 15 CH_OUT_DIS1 14 AUX_CH1_EN 13 PDN_CH1 12 INVERT_ CH1 11 0 10 0 9 7 6 5 4 3 2 1 8 OFFSET_CH1 0 OFFSET_CH1 Bit 15 CH_OUT_DIS1: Channel 1 disable Channel 1 is not muxed out. 0 = Channel 1 is output (default) 1 = Channel 1 is not output Bit 14 AUX_CH1_EN: Enable auxiliary channel for channel 1 0 = Filter (default) 1 = Auxiliary Bit 13 PDN_CH1: Power-down channel 1 0 = Active (default) 1 = Power-down Bit 12 INVERT_CH1: Invert channel 1 output 0 = Normal ouput (default) 1 = Inverted output Bits 11:10 Must write 0 Bits 9:0 OFFSET_CH1: Output offset of channel 1 range Output offset value = OFFSET_CH1 ÷ 4, output offset value is added to channel output. 56 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 103. Register 34 (22h) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 MEAN_CH1 4 3 MEAN_CH1 Bits 15:14 Must write 0 Bits 13:0 MEAN_CH1: Mean for channel 1 (read-only register) These bits provide the mean information computed by STAT module for channel 1. Figure 104. Register 35 (23h) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 NOISE_CH1 4 3 NOISE_CH1 Bits 15:14 Must write 0 Bits 13:0 NOISE_CH1: Noise for channel 1 (read-only register) These bits provide the noise information computed by STAT module for channel 1. Figure 105. Register 36 (24h) 15 0 14 0 13 0 12 0 7 6 5 4 11 10 9 8 1 0 HEADER_CH2 3 2 HEADER_CH2 Bits 15:12 Must write 0 Bits 11:0 HEADER_CH2: Header information for channel 2 These bits provide the header information for channel 2. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 57 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 106. Register 37 (25h) 15 CH_OUT_DIS2 14 AUX_CH2_EN 13 PDN_CH2 12 INVERT_CH2 11 0 10 0 9 7 6 5 4 3 2 1 8 OFFSET_CH2 0 OFFSET_CH2 Bit 15 CH_OUT_DIS2: Channel 2 disable Channel 2 is not muxed out. 0 = Channel 2 is output (default) 1 = Channel 2 is not output Bit 14 AUX_CH2_EN: Enable auxiliary channel for channel 2 0 = Filter (default) 1 = Auxiliary Bit 13 PDN_CH2: Power-down channel 2 0 = Active (default) 1 = Power-down Bit 12 INVERT_CH2: Invert channel 2 output 0 = Normal (default) 1 = Inverted output Bits 11:10 Must write 0 Bits 9:0 OFFSET_CH2: Output offset of Channel 2 Output offset value = OFFSET_CH2 ÷ 4, output offset value is added to the channel output Figure 107. Register 38 (26h) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 MEAN_CH2 4 3 MEAN_CH2 Bits 15:14 Must write 0 Bits 13:0 MEAN_CH2: Mean for channel 2 (read-only register) These bits provide the mean information computed by the STAT module for channel 2. 58 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 108. Register 39 (27h) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 NOISE_CH2 4 3 NOISE_CH2 Bits 15:14 Must write 0 Bits 13:0 NOISE_CH2: Noise for channel 2 (read-only register) These bits provide the noise information computed by the STAT module for channel 2. Figure 109. Register 40 (28h) 15 0 14 0 13 0 12 0 7 6 5 4 11 10 9 8 2 1 0 HEADER_CH3 3 HEADER_CH3 Bits 15:12 Must write 0 Bits 11:0 HEADER_CH3: Header information for channel 3 These bits provide the header information for channel 3. Figure 110. Register 41 (29h) 15 CH_OUT_DIS3 14 AUX_CH3_EN 13 PDN_CH3 12 INVERT_CH3 11 0 10 0 9 7 6 5 4 3 2 1 8 OFFSET_CH3 0 OFFSET_CH3 Bit 15 CH_OUT_DIS3: Channel 3 disable Channel 3 is not muxed out. 0 = Channel 3 is output (default) 1 = Channel 3 is not output Bit 14 AUX_CH3_EN: Enable auxiliary channel for channel 3 0 = Filter (default) 1 = Auxiliary Bit 13 PDN_CH3: Power-down channel 3 0 = Active (default) 1 = Power-down Bit 12 INVERT_CH3: Invert channel 3 output 0 = Normal (default) 1 = Inverted output Bits 11:10 Must write 0 Bits 9:0 OFFSET_CH3: Output offset of Channel 3 Output offset value = OFFSET_CH3 ÷ 4, output offset value is added to the channel output Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 59 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 111. Register 42 (2Ah) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 MEAN_CH3 4 3 MEAN_CH3 Bits 15:14 Must write 0 Bits 13:0 MEAN_CH3: Mean for channel 3 (read-only register) These bits provide the mean information computed by the STAT module for channel 3. Figure 112. Register 43 (2Bh) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 NOISE_CH3 4 3 NOISE_CH3 Bits 15:14 Must write 0 Bits 13:0 NOISE_CH3: Noise for channel 3 (read-only register) These bits provide the noise information computed by the STAT module for channel 3. Figure 113. Register 44 (2Ch) 15 0 14 0 13 0 12 0 7 6 5 4 11 10 9 8 1 0 HEADER_CH4 3 2 HEADER_CH4 Bits 15:12 Must write 0 Bits 11:0 HEADER_CH4: Header information for channel 4 These bits provide the header information for channel 4. 60 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 114. Register 45 (2Dh) 15 CH_OUT_DIS4 14 AUX_CH4_EN 13 PDN_CH4 12 INVERT_CH4 11 0 10 0 9 7 6 5 4 3 2 1 8 OFFSET_CH4 0 OFFSET_CH4 Bit 15 CH_OUT_DIS1: Channel 4 disable Channel 4 is not muxed out. 0 = Channel 4 is output (default) 1 = Channel 4 is not output Bit 14 AUX_CH4_EN: Enable auxiliary channel for channel 4 0 = Filter (default) 1 = Auxiliary Bit 13 PDN_CH4: Power-down channel 4 0 = Active (default) 1 = Power-down Bit 12 INVERT_CH4: Invert channel 4 output 0 = Normal (default) 1 = Inverted output Bits 11:10 Must write 0 Bits 9:0 OFFSET_CH4: Output offset of channel 4 Output offset value = OFFSET_CH4 ÷ 4, output offset value is added to the channel output Figure 115. Register 46 (2Eh) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 MEAN_CH4 4 3 MEAN_CH4 Bits 15:14 Must write 0 Bits 13:0 MEAN_CH4: Mean for channel 4 (read-only register) These bits provide the mean information computed by the STAT module for channel 4. Figure 116. Register 47 (2Fh) 15 0 14 0 13 7 6 5 12 11 10 9 8 2 1 0 NOISE_CH4 4 3 NOISE_CH4 Bits 15:14 Must write 0 Bits 13:0 NOISE_CH4: Noise for channel 4 (read-only register) These bits provide the noise information computed by the STAT module for channel 4. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 61 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Figure 117. Register 65 (41h) 15 14 13 12 11 0 0 0 0 0 7 0 6 0 5 0 4 0 3 0 Bits 15:11 Must write 0 Bit 10 TERM_INT_20K_AUX: Auxiliary input termination 10 TERM_INT_ 20K_AUX 9 8 0 0 2 0 1 0 0 0 This bit is common for all channels. This bit provides an auxiliary input internal differential termination of 20 kΩ. 0 = 2-kΩ differential resistance (default) 1 = 20-kΩ differential resistance Bits 9:0 Must write 0 Figure 118. Register 69 (45h) 15 TERM_INT_ 20K_LNA 14 7 PGA_GAIN 6 EQ_EN Bit 15 13 12 11 10 LNA_GAIN 9 8 1 0 0 0 PGA_GAIN 5 0 4 0 3 0 2 0 TERM_INT_20K_LNA: LNA input termination This bit is common for all channels. This bit provides LNA input internal differential termination of 20 kΩ. 0 = 2-kΩ differential resistance (default) 1 = 20-kΩ differential resistance Bits 14:13 LNA_GAIN: LNA gain These bits are common for all channels. 0 1 2 3 Bits 12:7 = = = = 15 dB (default) 18 dB 12 dB 16.5 dB PGA_GAIN: PGA gain These bits are common for all channels. PGA gain = 0 dB, 3 dB, 6 dB, 9 dB, 12 dB, 15 dB, 18 dB, 21 dB, 24 dB, 27 dB, and 30 dB. 0 1 2 3 4 5 Bit 6 = = = = = = 0 dB 3 dB 6 dB 9 dB 12 dB 15 dB 6 = 18 dB 7 = 21 dB 8 = 24 dB 9 = 27 dB 10 = 30 dB EQ_EN: Equalizer enable These bits are common for all channels. 0 = Disabled (default) 1 = Enabled Bits 5:0 62 Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Figure 119. Register 70 (46h) 15 0 14 HPL_EN 13 0 12 0 11 0 10 0 9 0 7 0 6 0 5 0 4 0 3 0 2 0 1 0 VOUT_ON_ADC Bit 15 Must write 0 Bit 14 HPL_EN: High-performance linearity mode 8 0 0 = Default 1 = Improves linearity (HD3) with increased power dissipation Bits 13:2 Must write 0 Bits 1:0 VOUT_ON_ADC: Check analog block output on ADC input 0 1 2 3 = = = = LNA + antialiasing filter + ADC (default) LNA + ADC AMP1 + ADC AMP2 + ADC Figure 120. Register 71 (47h) 15 0 14 0 13 0 12 0 11 0 10 0 9 0 8 0 7 6 5 4 0 0 0 0 2 EQ_EN_LOW_ FC 1 0 3 HIGH_POW_ LNA 0 0 Bits 15:4 Must write 0 Bit 3 HIGH_POW_LNA 0 = Default mode 1 = High-power LNA improves channel input-referred noise at high LNA and PGA gains compared to default mode. This mode increases power dissipation. Bit 2 EQ_EN_LOW_FC: Enable Equalizer Low Frequency Corner Frequency 0 = Disable 1 = Enable; EQ_EN must also be enabled for this mode Bits 1:0 Must write 0 Figure 121. Register 100 (64h) 15 0 14 13 HF_AFE_CLK_EN 12 0 11 0 10 0 9 0 8 0 7 0 6 0 4 0 3 0 2 0 1 0 0 0 5 0 Bits 15 Must write 0 Bits 14:13 HF_AFE_CLK_EN 0 = Default 3 = For fAFE_CLK > 25 MHz ( in decimation modes) Bits 12:0 Must write 0 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 63 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The AFE5401-Q1 is a quad-channel, analog front-end (AFE), targeting applications where the level of integration is critical. Each channel comprises a complete base-band signal chain with: • A low-noise amplifier (LNA), • A programmable equalizer (EQ), • A programmable gain amplifier (PGA), and • An antialias filter (AAF) • A high-speed, 12-bit, analog-to-digital converter (ADC) that samples at 25 MSPS per channel. Having four integrated signal chain channels enables the device to be used in different end-use systems such as: • Automotive radar (where a down-converted base-band signal from an RF front-end can be applied to the inputs of the AFE) • Applications where up to 12-MHz voltage signal is available from a transducer 9.2 Typical Application As Figure 122 illustrates, the device also consists of four auxiliary channels, where the analog signal chain (LNA, PGA) is bypassed and the analog inputs can be directly digitized. This configuration is very useful in the system to digitize monitoring signals (such as battery voltages and temperature sensor outputs). As the Design Requirements section describes, the device can accept a variety of input clock signals (such as differential sine-wave, LVPECL, or LVDS). The can also functions seamlessly with a single-ended LVCMOS (1.8 V) clock input. The device is designed to have a simple CMOS output data interface. Used with the TRIG and DSYNCx signals, the device can be interfaced to standard video ports of DSPs and other field-programmable gate array (FPGA) and micro-controller based receivers. 64 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Application (continued) FPGA/DSP STBY SCLK SDATA SEN RESET SDOUT VCM AVDD3 AVSS DRVDD DRVSS AVDD18 AVSS DVDD18 DVSS Reference SERIAL INTERFACE PGA LNA System monitoring signals (Battery, Temperature, etc) Channel 1 of 4 INx EQ ADC 1 INx_AUX BUF 4:1 MUX CMOS/DIFF SUPPORT Clock Input: CMOS Signal / LVPECL / LVDS / Sine wave AAF EQ fCLKIN CLKINP Input Clock Divider 1x ADC_CLK 4x CMOS OUTPUT DRIVER Baseband signal from Front-End D [11:0] D_GPO [1:0] DCLK AFE_CLK CLKINM Serialization Factor Clock + Timing Generator TRIG DSYNC1 DSYNC2 Figure 122. Typical Application Diagram 9.2.1 Design Requirements The device can operate with either single-ended (CMOS) or differential input clocks (such as sine wave, LVPECL, and LVDS). Operating with a low-jitter differential clock is recommended for good SNR performance. In differential mode, the clock inputs are internally biased to the optimum common-mode voltage (approximately 0.95 V). While driving with an external LVPECL or LVDS driver, TI recommends ac-coupling the clock signals because the clock pins are internally biased to the common-mode voltage. 9.2.2 Detailed Design Procedure For the LVDS input clock, RTERM = 100 Ω is recommended. For the LVPECL clock input, RTERM must be determined based on the LVPECL driver recommendations. To operate using a single-ended clock, connect a CMOS clock source to CLKINP and tie CLKINM to GND. The device automatically detects the presence of a single-ended clock without requiring any configuration and disables internal biasing. Typical clock termination schemes are illustrated in Figure 125, Figure 126, Figure 127, and Figure 128. Typical characteristic plots across input clock amplitude and duty cycle are shown in Application Curves. Figure 123 and Figure 124 illustrate the equivalent circuits of the clock input pins for Differential and SingleEnded input clock respectively. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 65 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Typical Application (continued) Lpkg ~ 1 nH 20 CLKINP Ceq Cbond ~ 1 pF Resr ~ 100 6 pF 5k 0.95 V To Input Divider 6 pF 5k Lpkg ~ 1 nH Internal Differential Clock Buffer 20 CLKINM Ceq Cbond ~ 1 pF Resr ~ 100 Ceq ~ 1 to 3 pF, equivalent input capacitance of clock buffer Figure 123. Clock Input Equivalent Circuit (Differential Mode) Lpkg ~ 1 nH 20 CLKINP Ceq Cbond ~ 1 pF Resr ~ 100 To Input Divider Internal Single-Ended Clock Buffer Lpkg ~ 1 nH CLKINM Cbond ~ 1 pF Resr ~ 100 Ceq ~ 1 to 3 pF, equivalent input capacitance of clock buffer Figure 124. Clock Input Equivalent Circuit (Single-Ended Mode) 66 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 Typical Application (continued) 0.1µF 0.1µF CLKINP CLKINP Differential Sine-wave RTERM Differential LVPECL clock input clock input CLKINM CLKINM 0.1µF RTERM Figure 125. Differential Sine-Wave Clock Driving Circuit 0.1µF Figure 126. Differential LVPECL Clock Driving Circuit 0.1µF CMOS clock input CLKINP Differential LVDS clock input CLKINP RTERM CLKINM CLKINM 0.1µF Figure 127. Differential LVDS Clock Driving Circuit Figure 128. Single-Ended Clock Driving Circuit 69 68 68.6 67.6 SNR (dBFS) SNR (dBFS) 9.2.3 Application Curves 68.2 67.8 67.2 66.8 66.4 67.4 66 67 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 Input Clock Amplitude, Differential (VPP) 2 2.2 35 Figure 129. Signal-to-Noise Ratio vs Input Clock Amplitude (PGA Gain = 0 dB) 40 45 50 55 60 Input Clock Duty Cycle (%) C011 65 C013 Figure 130. Signal-to-Noise Ratio vs Input Clock Duty Cycle (PGA Gain = 0 dB) Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 67 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com 10 Power Supply Recommendations 10.1 Power Supply Sequencing During power-up, the AVDD18, DVDD18, and DRVDD supplies can appear in any sequence. All supplies are separated in the device. Externally, they can be driven from separate supplies with suitable filtering. No power supply sequencing is required. 10.2 Power Supply Decoupling Minimal external decoupling can be used without loss in performance because the device already includes internal decoupling. Note that decoupling capacitors can help filter external power-supply noise, so the optimum number of capacitors depends on the actual application. The decoupling capacitors should be placed as close as possible to the device supply pins. 11 Layout 11.1 Layout Guidelines All analog inputs must be differentially and symmetrically routed to the differential input pins of the device for best performance. CMOS outputs traces should be kept as short as possible to reduce the trace capacitance that loads the CMOS output buffers. Multiple ground vias can be added around the CMOS output data traces, especially when the traces are routed on more than one layer. TI recommends matching the lengths of the output data traces (D[11:0]) to reduce the skew across data bits. Switching noise (caused by CMOS output data transitions) can couple into the analog inputs and degrade SNR. This condition is particularly of concern because of the high gain present in the analog input channel. Digital outputs coupling back to analog inputs can be minimized by proper separation of analog and digital areas in the board layout. Figure 131 illustrates an example layout where the analog and digital portions are routed separately. This example also uses splits in the ground plane to minimize digital currents from looping into analog areas. At the same time, note that the analog and digital grounds are shorted below the device. A single ground plane is sufficient to give good performance, provided the analog, digital, and clock sections of the board are cleanly partitioned. The device package consists of an exposed pad. In addition to providing a path for heat dissipation, the pad is also internally connected to the analog ground. Therefore, the exposed pad must be soldered to the ground plane for best thermal and electrical performance. For detailed information, see application notes QFN Layout Guidelines and QFN/SON PCB Attachment. Figure 131 and Figure 132 illustrate the layout diagrams taken from the AFE5401-Q1 EVM User's Guide. 68 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 11.2 Layout Example Figure 131. Layout Diagram: Signal Routing Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 69 AFE5401-Q1 SBAS619A – MARCH 2014 – REVISED JUNE 2017 www.ti.com Layout Example (continued) Figure 132. Layout Diagram: Ground Split 70 Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 AFE5401-Q1 www.ti.com SBAS619A – MARCH 2014 – REVISED JUNE 2017 12 Device and Documentation Support 12.1 Documentation Support 12.1.1 Related Documentation For related documentation see the following: • QFN Layout Guidelines • QFN/SON PCB Attachment • AFE5401-Q1 EVM User's Guide 12.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.3 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.4 Trademarks E2E is a trademark of Texas Instruments. SONAR is a trademark of Cakewalk, Inc. All other trademarks are the property of their respective owners. 12.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Product Folder Links: AFE5401-Q1 71 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) AFE5401TRGCRQ1 ACTIVE VQFN RGC 64 2000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 AFE5401 AFE5401TRGCTQ1 ACTIVE VQFN RGC 64 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 AFE5401 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
AFE5401TRGCTQ1 价格&库存

很抱歉,暂时无法提供与“AFE5401TRGCTQ1”相匹配的价格&库存,您可以联系我们找货

免费人工找货