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INA250EVM

INA250EVM

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    -

  • 描述:

    EVAL BOARD FOR INA250

  • 数据手册
  • 价格&库存
INA250EVM 数据手册
User's Guide SBOU153A – May 2015 – Revised November 2015 INA250AxEVM User's Guide This user’s guide describes the characteristics, operation, and use of the INA250AxEVM evaluation module. It discusses how to set up and configure the hardware and reviews various aspects of the hardware operation. Throughout this document, the terms evaluation board, evaluation module, and EVM are synonymous with the INA250AxEVM. This document also includes an electrical schematic, printed circuit board (PCB) layout drawings, and a parts list for the EVM. NOTE: This user guide is for the new revision of the EVM board. For users of the original-version EVM board, see the previous EVM user's guide, SBOU153. All trademarks are the property of their respective owners. SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated INA250AxEVM User's Guide 1 www.ti.com 1 2 3 Contents Overview ..................................................................................................................... 3 1.1 INA250EVM Kit Contents .......................................................................................... 3 1.2 Related Documentation from Texas Instruments ............................................................... 3 Hardware...................................................................................................................... 4 2.1 Theory of Operation ................................................................................................ 4 2.2 Features .............................................................................................................. 5 2.3 Quick-Start Setup and Use ........................................................................................ 5 2.4 Current Input ........................................................................................................ 5 Schematic, PCB Layout, and Bill of Materials ........................................................................... 6 3.1 Schematic ............................................................................................................ 6 3.2 PCB Layout .......................................................................................................... 7 3.3 Bill of Materials .................................................................................................... 10 List of Figures 1 INA250Ax Test Board Block Diagram ..................................................................................... 4 2 INA250Ax Test Board Schematic .......................................................................................... 6 3 PCB Component Placement 4 PCB Top Layer ............................................................................................................... 8 5 PCB Bottom Layer ........................................................................................................... 9 ............................................................................................... 7 List of Tables 2 1 INA250AxEVM Kit Contents ................................................................................................ 3 2 Related Documentation ..................................................................................................... 3 3 INA250Ax Test Board BOM INA250AxEVM User's Guide .............................................................................................. 10 SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Overview www.ti.com 1 Overview The INA250 is a family of voltage-output current-shunt monitors that integrate an internal shunt resistor to enable high-accuracy current measurements. The INA250 family of devices consists of the INA250A1, INA250A2, INA250A3, and INA250A4 (all referred to as INA250Ax). The INA250AxEVM consists of one PCB with an option to cut out four individual PCBs. Each of the PCB cutouts consists of the INA250Ax device (where Ax is A1, A2, A3 and A4, for boards 1 through 4, respectively), banana-jack terminals, screw terminals, and test points for external hardware connections. 1.1 INA250EVM Kit Contents Table 1 summarizes the contents of the INA250EVM kit. Contact the Texas Instruments Product Information Center nearest you if any component is missing. It is highly recommended that you also check the INA250 device product folder on the TI web site at www.ti.com for any further information regarding this product. Table 1. INA250AxEVM Kit Contents 1.2 Item Quantity INA250 test board 1 Related Documentation from Texas Instruments The following document provides information regarding Texas Instruments' integrated circuits used in the assembly of the INA250AxEVM. This user's guide is available from the TI web site under literature number SBOU153. Any letter appended to the literature number corresponds to the document revision that is current at the time of the writing of this document. Newer revisions are be available from www.ti.com, or call the Texas Instruments' Literature Response Center at (800) 477-8924 or the Product Information Center at (972) 644-5580. When ordering, identify the document by both title and literature number. Table 2. Related Documentation Document Literature Number INA250 product data sheet SBOS511 SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated INA250AxEVM User's Guide 3 Hardware 2 www.ti.com Hardware Each of the PCBs on the INA250AxEVM requires a 2.7-V to 36-V power supply connected between the VS and GND screw terminals. Alternately, the power supply can also be connected between test points TPx08 (VS) and TPx03 (GND) or TPx09 (GND). The INA250Ax family of devices have an integrated shunt of value 2 mΩ between the SH+ and SH– pins. Connect a –0.1-V to +36-V supply in series with banana plugs Jx01 (IN+) and Jx02 (IN–), or test points TPx01 (IN+) and TPx02 (IN–), to provide a path for current flowing through the integrated shunt resistor. Use a voltmeter on the OUT screw terminal or test point TPx07 to measure the voltage output of the INA250Ax. For the following components, x = 1 to 4. Cx01 and Cx02 are supply bypass capacitors for the INA250Ax. Rx01 is a 0-Ω resistor that ties SH+ to VIN+. Rx02 is a 0-Ω resistor that ties SH– to VIN–. Components Rx01, Rx02, Cx03, Cx04, and Cx05 can be added or replaced to provide optional filtering of the voltages out of the SH+ and SH– pins, and into the VIN+ and VIN– pins of the INA250Ax. 2.1 Theory of Operation A block diagram of the INA250Ax test board hardware is shown in Figure 1.The INA250Ax test board contains a four-port, screw terminal block to connect to the supply (VS), ground (GND), reference (REF) and output (OUT) pins of the INA250Ax. There are ten test points located on each of the four PCB boards that access the IN+ (TPx01), IN– (TPx02), VIN+ (TPx04), VIN– (TPx05), REF (TPx06), OUT (TPx07), VS (TPx08), and GND (TPx03 and TPx09) pins of the device. Minimal support circuitry is included on the PCB, and can be removed or bypassed as needed. 2.7 V to 36 V INA250 Supply (±0.1 V to +36 V) CBYPASS 0.1 F VS IN+ IN± SH+ SH± VIN+ VIN± ± + LOAD REF OUT GND NOTE: One block diagram shown for all four EVM boards. Block diagram is functionally equivalent for all four EVM boards. Figure 1. INA250Ax Test Board Block Diagram 4 INA250AxEVM User's Guide SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Hardware www.ti.com 2.2 Features The INA250AxEVM provides basic functional evaluation of this device family. The fixture layout is not intended for electromagnetic compatibility (EMC) testing. The INA250AxEVM PCB provides the following features: • Ease of access to device pins with test points • Multiple signal connection options • Board layout and construction that supports 15-A current through the device across the full –40°C to +125°C temperature range (see Section 3.2) • Unpopulated component pads for optional input filtering with differential filter capacitor option included Refer to the INA250 product data sheet, SBOS511, for comprehensive information about this family of current sense amplifiers. 2.3 Quick-Start Setup and Use Follow these procedures to setup and use the INA250EVM: 1. Connect an external dc supply voltage between 2.7 V and 36 V to the VS screw terminal or test point TPx08, and connect the ground reference of that supply to the GND screw terminal or test point TPx03 or TPx09. 2. Connect an external dc supply voltage between 0 V and 18 V (referenced to the ground of the INA250Ax) to the REF screw terminal or test point TPx06. 3. Connect a current source across the Jx01 and Jx02 banana jacks, or across the IN+ (TPx01) and IN– (TPx02) test points, to provide current flowing through the integrated 2-mΩ shunt resistor. The common-mode voltage on the IN+ and IN– pins must be between –0.1 V and +36 V (referenced to the GND pin). 2.4 Current Input The current flowing across the IN+ and IN– pins develops a differential voltage across the 2-mΩ shunt and is amplified by the current shunt amplifier. The current flowing across this integrated shunt is multiplied by the current gain of the INA250A1 (200 mV/A), INA250A2 (500 mV/A), INA250A3 (800 mV/A) or INA250A4 (2 V/A). Do not use this integrated shunt resistor as a stand-alone component. See the Integrated Shunt Resistor section of the INA250 data sheet (SBOS511) for more information. SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated INA250AxEVM User's Guide 5 Schematic, PCB Layout, and Bill of Materials www.ti.com 3 Schematic, PCB Layout, and Bill of Materials 3.1 Schematic Figure 2 shows the complete schematic of the INA250Ax test board. Components Rx01, Rx02, Cx03, Cx04, and Cx05 can be optionally added and replaced for an input filter. Keep the filter resistors to under 10 Ω to avoid excessive additional gain error. Banana jack terminals Jx01 and Jx02 give access to the IN+ and IN– pins, respectively. The VS, GND, REF, and OUT pins are accessed through screw terminal block Tx01, or through test points TPx08, TPx03 or TPx09, TPx06 and TPx07, respectively. All pins except for the shunt resistor Kelvin-connection pins (SH+ and SH–) are accessible using test points. The SH+ and SH– pins are initially shorted to VIN+ and VIN– using 0-Ω resistors Rx01 and Rx02, respectively. J101 108-0740-001 C103 TP101 J102 J201 J202 108-0740-001 108-0740-001 TP102 108-0740-001 C203 TP201 DNP TP104 16 15 14 DNP 12 R101 GND1 VS1 0 T101 REF1 1 2 3 4 TP106 DNP U101 C104 13 7 10 IN+ IN+ IN+ INININ- VIN+ VIN- GND1 TP105 1 2 3 DNP 5 R102 SH- REF OUT 9 VS GND GND GND 6 8 11 SH+ TP204 C105 4 REF1 OUT1 ED555/4DS GND1 16 15 14 DNP 12 R201 GND2 0 T201 OUT1 REF2 1 2 3 4 TP107 TP206 13 7 10 IN+ IN+ IN+ INININ- VIN+ VIN- ED555/4DS GND2 TP205 1 2 3 C205 DNP 5 R202 SH- 4 REF OUT 9 VS GND GND GND 6 8 11 SH+ REF2 OUT2 OUT2 TP207 TP208 TP203 C202 TP109 TP209 0.1µF C101 VS1 0.1µF C201 VS2 1µF 1µF GND1 GND2 J301 108-0740-001 C303 TP301 J302 J401 J402 108-0740-001 108-0740-001 TP302 108-0740-001 C403 TP401 DNP TP304 16 15 14 DNP 12 R301 GND3 VS3 0 T301 1 2 3 4 ED555/4DS REF3 TP306 13 7 10 IN+ IN+ IN+ INININ- VIN+ VIN- SH+ SH- REF OUT VS GND GND GND REF3 OUT3 TP305 1 2 3 TP308 TP404 C305 DNP 5 R302 4 OUT3 6 8 11 GND3 16 15 14 DNP 12 R401 GND4 TP307 0 T401 1 2 3 4 ED555/4DS REF4 TP406 13 7 10 IN+ IN+ IN+ INININ- VIN+ VIN- SH+ SH- REF OUT VS GND GND GND REF4 OUT4 TP405 1 2 3 C405 DNP 5 R402 4 OUT4 6 8 11 TP408 TP407 TP403 C402 TP309 VS3 GND4 0 9 INA250A4PWR GND4 TP303 C302 U401 C404 VS4 0 9 INA250A3PWR GND3 TP402 DNP U301 C304 GND2 0 INA250A2PWR TP103 C102 U201 C204 VS2 0 INA250A1PWR TP108 TP202 TP409 0.1µF C301 VS4 1µF 0.1µF C401 1µF GND3 GND4 Figure 2. INA250Ax Test Board Schematic 6 INA250AxEVM User's Guide SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Schematic, PCB Layout, and Bill of Materials www.ti.com 3.2 PCB Layout Figure 3 shows the component placement on the top layer of the test board. The two-layer EVM PCB measures 3.2-in × 5.5-in and is fabricated with a 1-oz copper pour. The bottom layer has no components but contains a solid copper ground plane that provides a low-impedance path for return currents. The top layer of the PCB consists of power planes tied to the IN+ and IN– pins. These power planes are approximately 1.472-in × 0.553-in each. The INA250 is rated to support a 10-A continuous current over temperature. Enhance the current handling capability by using proper layout techniques that facilitate heat dissipation. Combine the large power planes at the IN+ and IN– pins. Use a 2-oz copper pour to improve the heat-dissipation capabilities, and thus increase the continuous-load current capacity. Using the INA250AxEVM board with this robust layout and airflow, the INA250 device safely accommodates up to 15 A of current over the entire –40°C to +125°C temperature range. Figure 4 and Figure 5 show the top and bottom layers, respectively, of the test board. Figure 3. PCB Component Placement SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated INA250AxEVM User's Guide 7 Schematic, PCB Layout, and Bill of Materials www.ti.com Figure 4. PCB Top Layer 8 INA250AxEVM User's Guide SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Schematic, PCB Layout, and Bill of Materials www.ti.com Figure 5. PCB Bottom Layer SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated INA250AxEVM User's Guide 9 Schematic, PCB Layout, and Bill of Materials 3.3 www.ti.com Bill of Materials Table 3 lists the bill of materials (BOM) for the INA250 test board. Table 3. INA250Ax Test Board BOM Quantity RefDes 4 C101, C201, C301, C401 CAP, CERM, 1uF, 50V, +/-10%, X7R, 0805 CL21B105KBFNNNE Samsung ElectroMechanics America, Inc 4 C102, C202, C302, C402 CAP, CERM, 0.1uF, 50V, +/-10%, X7R, 0603 C1608X7R1H104K080AA TDK Corporation 4 C103, C203, C303, C403 CAP, CERM, 0.1uF, 25V, +/-10%, X5R, 0603 06033D104KAT2A AVX 8 C104, C105, C204, C205, C304, C305, C404, C405 CAP, CERM, 0.1uF, 25 V, +/-10%, X7R, 0805 08053C104KAT2A AVX 24 TP104, TP105, TP106, TP107, TP108, TP109, TP204, TP205, TP206, TP207, TP208, TP209, TP304, TP305, TP306, TP307, TP308, TP309, TP404, TP405, TP406, TP407, TP408, TP409 Test Point, Multipurpose, White, TH 5012 Keystone 8 J101, J102, J201, J202, J301, J302, J401, J402 Standard Banana Jack, Uninsulated, 15A 108-0740-001 Emerson Network Power 8 R101, R102, R201, R202, R301, R302, R401, R402 RES, 0 ohm, 0603 ERJ-3GEY0R00V Panasonic Electronic Components 4 T101, T201, T301, T401 Terminal Block, 6A, 3.5mm Pitch, 4-Pos, TH ED555/4DS On-Shore Technology 12 TP101, TP102, TP103, TP201, TP202, TP203, TP301, TP302, TP303, TP401, TP402, TP403 Test Point, Compact, SMT 5016 Keystone 1 U101 36-V, Low- or High-Side, Bidirectional, Zero-Drift Current-Shunt Monitor with Precision Integrated Shunt Resistor, PW0016A INA250A1PW Texas Instruments 1 U201 36-V, Low- or High-Side, Bidirectional, Zero-Drift Current-Shunt Monitor with Precision Integrated Shunt Resistor, PW0016A INA250A2PW Texas Instruments 1 U301 36-V, Low- or High-Side, Bidirectional, Zero-Drift Current-Shunt Monitor with Precision Integrated Shunt Resistor, PW0016A INA250A3PW Texas Instruments 1 U401 36-V, Low- or High-Side, Bidirectional, Zero-Drift Current-Shunt Monitor with Precision Integrated Shunt Resistor, PW0016A INA250A4PW Texas Instruments 10 Description INA250AxEVM User's Guide Part Number Manufacturer SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Revision History www.ti.com Revision History Changes from Original (May 2015) to A Revision ........................................................................................................... Page • Changed user guide to include three additional devices (INA250A1, INA250A3, and INA250A4) to the existing INA250A2. .................................................................................................................................. 1 NOTE: Page numbers for previous revisions may differ from page numbers in the current version. SBOU153A – May 2015 – Revised November 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Revision History 11 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. 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