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TPS22918TDBVRQ1

TPS22918TDBVRQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOT-23-6

  • 描述:

    电源开关/驱动器 1:1 N 通道 2A SOT-23-6

  • 数据手册
  • 价格&库存
TPS22918TDBVRQ1 数据手册
Order Now Product Folder Support & Community Tools & Software Technical Documents TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 TPS22918-Q1, 5.5-V, 2-A, 52-mΩ On-Resistance Load Switch 1 Features 2 Applications • • • • • • • 1 • • • • • • • • • • AEC-Q100 Qualified Integrated single-channel load switch Qualified for automotive applications: – Device Temperature Grade 2: –40°C to +105°C ambient operating temperature range Functional safety capable – Documentation available to aid functional safety system design Input voltage range: 1 V to 5.5 V Low On-Resistance (RON) – RON = 52 mΩ (typical) at VIN = 5 V – RON = 53 mΩ (typical) at VIN = 3.3 V 2-A Maximum continuous switch current Low quiescent current – 8.3 µA (typical) at VIN = 3.3 V Low-control input-threshold enables use of 1 V or higher GPIO Configurable Quick-Output Discharge (QOD) Configurable rise time with CT pin Small SOT23-6 package (DBV) – 2.9 mm × 2.8 mm, 0.95-mm Pitch, 1.45-mm height (with leads) ESD Performance tested per AEC Q100 – ±2-kV HBM and ±750-V CDM Automotive electronics Infotainment Cluster ADAS (Advanced Driver Assistance Systems) 3 Description The TPS22918-Q1 is a single-channel load switch with both configurable rise time and configurable quick-output discharge. The device contains an Nchannel MOSFET that can operate over an input voltage range of 1 V to 5.5 V and can support a maximum continuous current of 2 A. The switch is controlled by an on and off input, which is capable of interfacing directly with lowvoltage control signals. The configurable rise time of the device reduces inrush current caused by large bulk load capacitances, thereby reducing or eliminating power supply droop. The TPS22918-Q1 features a configurable quick output discharge (QOD) pin, which controls the fall time of the device to allow design flexibility for power down and sequencing. The TPS22918-Q1 is available in a small, leaded SOT-23 package (DBV) which allows to visually inspect solder joints. The device is characterized for operation over the free-air temperature range of –40°C to +105°C. Device Information(1) PART NUMBER TPS22918-Q1 PACKAGE SOT-23 (6) BODY SIZE (NOM) 2.90 mm × 1.60 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic 100 VOUT VIN Power Supply On-Resistance vs Input Voltage Typical Values -40qC 25qC 85qC 105qC QOD GND CL RL C IN ON ON CT TPS22918-Q1 OFF GND Copyright © 2016, Texas Instruments Incorporated On-Resistance (m:) 90 80 70 60 50 40 30 1 1.5 2 2.5 3 3.5 4 Input Voltage (V) 4.5 5 5.5 D001 IOUT = –200 mA 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 4 4 4 4 5 6 7 9 Absolute Maximum Ratings ...................................... ESD Ratings ............................................................ Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Switching Characteristics .......................................... Typical DC Characteristics........................................ Typical AC Characteristics........................................ Parameter Measurement Information ................ 12 Detailed Description ............................................ 13 8.1 Overview ................................................................. 13 8.2 Functional Block Diagram ....................................... 13 8.3 Feature Description................................................. 13 8.4 Device Functional Modes........................................ 15 9 Application and Implementation ........................ 16 9.1 Application Information............................................ 16 9.2 Typical Application ................................................. 16 10 Power Supply Recommendations ..................... 20 11 Layout................................................................... 20 11.1 Layout Guidelines ................................................. 20 11.2 Layout Example .................................................... 20 11.3 Thermal Considerations ........................................ 20 12 Device and Documentation Support ................. 22 12.1 12.2 12.3 12.4 12.5 12.6 12.7 Device Support...................................................... Documentation Support ........................................ Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 22 22 22 22 22 22 22 13 Mechanical, Packaging, and Orderable Information ........................................................... 22 4 Revision History Changes from Revision A (July 2016) to Revision B • Added Functional safety capable link in the Features section ............................................................................................... 1 Changes from Original (July 2016) to Revision A • 2 Page Page Changed device status from Product Preview to Production Data ........................................................................................ 1 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 5 Pin Configuration and Functions DBV Package 6-Pin SOT-23 Top View VIN 1 6 VOUT GND 2 5 QOD ON 3 4 CT Pin Functions PIN NO. NAME TYPE DESCRIPTION Switch input. Place ceramic bypass capacitor(s) between this pin and GND. See the Detailed Description section for more information 1 VIN I 2 GND — 3 ON I Active high switch control input. Do not leave floating 4 CT O Switch slew rate control. Can be left floating. See the Feature Description section for more information Device ground 5 QOD O Quick Output Discharge pin. This functionality can be enabled in one of three ways • Placing an external resistor between VOUT and QOD • Tying QOD directly to VOUT and using the internal resistor value (RPD) • Disabling QOD by leaving pin disconnected See the Quick Output Discharge (QOD) section for more information 6 VOUT O Switch output Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 3 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings Over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT VIN Input voltage –0.3 6 V VOUT Output voltage –0.3 6 V VON ON voltage –0.3 6 V IMAX Maximum continuous switch current, TA = 70°C (3) 2 A IMAX Maximum continuous switch current, TA = 85°C (3) 1.5 A IPLS Maximum pulsed switch current, pulse < 300 µs, 2% duty cycle 2.5 A TJ Maximum junction temperature 150 °C Tstg Storage temperature 150 °C (1) (2) (3) –65 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to network ground terminal. Assumes 12-K power-on hours at 100% duty cycle. This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms and conditions for TI's semiconductor products. 6.2 ESD Ratings VALUE V(ESD) (1) Electrostatic discharge Human-body model (HBM), per AEC Q100-002 (1) ±2000 Charged-device model (CDM), per AEC Q100-011 ±750 UNIT V AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions Over operating free-air temperature range (unless otherwise noted) MIN MAX VIN Input voltage 1 5.5 V VON ON voltage 0 5.5 V VOUT Output voltage VIN V VIH, ON High-level input voltage, ON VIN = 1 V to 5.5 V 1 5.5 V ON Low-level input voltage, ON VIN = 1 V to 5.5 V 0 0.5 V –40 105 °C VIL, TA Operating free-air temperature CIN Input Capacitor (1) (2) (1) 1 UNIT (2) µF In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be derated. Maximum ambient temperature [TA(max)] is dependent on the maximum operating junction temperature [TJ(MAX)], the maximum power dissipation of the device in the application [PD(MAX)], and the junction-to-ambient thermal resistance of the part-package in the application (θJA), as given by the following equation: TA(MAX) = TJ(MAX) – (θJA × PD(MAX)). See the Application and Implementation section. 6.4 Thermal Information TPS22918-Q1 THERMAL METRIC (1) DBV (SOT-23) UNIT 6 PINS RθJA Junction-to-ambient thermal resistance 183.2 °C/W RθJC(top) Junction-to-case (top) thermal resistance 151.6 °C/W RθJB Junction-to-board thermal resistance 34.1 °C/W ψJT Junction-to-top characterization parameter 37.2 °C/W ψJB Junction-to-board characterization parameter 33.6 °C/W (1) 4 For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 6.5 Electrical Characteristics Unless otherwise noted, the specification in the following table applies over the following operating ambient temperature –40°C ≤ TA ≤ +105°C (full). Typical values are for TA = 25°C. PARAMETER IQ, VIN Quiescent current TEST CONDITIONS VON = 5 V, IOUT =0A TYP MAX VIN = 5.5 V 9.2 16 VIN = 5 V 8.7 16 VIN = 3.3 V 8.3 15 10.2 17 9.3 16 8.9 15 VIN = 1.8 V TA –40°C to +105°C VIN = 1.2 V VIN = 1 V ISD, VIN ION Shutdown current ON pin input leakage current VIN = 5.5 V –40°C to +105°C 0.5 5 VIN = 5 V –40°C to +105°C 0.5 4.5 VON = 0 V, VOUT VIN = 3.3 V =0V VIN = 1.8 V –40°C to +105°C 0.5 3.5 –40°C to +105°C 0.5 2.5 VIN = 1.2 V –40°C to +105°C 0.4 2 VIN = 1 V –40°C to +105°C 0.4 2 VIN = 5.5 V, IOUT = 0 A VIN = 5.5 V, IOUT = –200 mA VIN = 5 V, IOUT = –200 mA VIN = 4.2 V, IOUT = –200 mA VIN = 3.3 V, IOUT = –200 mA RON On-Resistance VIN = 2.5 V, IOUT = –200 mA VIN = 1.8 V, IOUT = –200 mA VIN = 1.2 V, IOUT = –200 mA VIN = 1 V, IOUT = –200 mA VHYS ON pin hysteresis VIN = 1 V to 5.5 V VIN = 5 V, VON = 0 V RPD Output pull down resistance MIN VIN = 3.3 V, VON = 0 V –40°C to +105°C 25°C 0.1 51 –40°C to +105°C 25°C 52 71 –40°C to +105°C 107 25°C 24 –40°C to +105°C 25°C –40°C to +105°C 61 65 77 85 mV 30 25 35 Product Folder Links: TPS22918-Q1 Ω 45 60 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated mΩ 116 –40°C to +105°C VIN = 1.8 V, VON = 0 V 59 104 –40°C to +105°C 25°C 59 88 64 –40°C to +105°C 25°C 59 80 55 –40°C to +105°C 25°C 59 80 53 –40°C to +105°C 25°C µA 79 53 –40°C to +105°C 25°C µA 79 –40°C to +105°C 25°C µA 78 52 –40°C to +105°C 25°C UNIT 5 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 6.6 Switching Characteristics See timing test circuit in Figure 21 (unless otherwise noted) for references to external components used for the test condition in the switching characteristics table. Switching characteristics shown below are only valid for the power-up sequence where VIN is already in steady state condition before the ON pin is asserted high. Test Conditions: VON = 5 V, TA = 25°C. PARAMETER TEST CONDITION MIN TYP MAX UNIT VIN = 5 V tON Turnon time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 1950 µs tOFF Turnoff time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tR VOUT rise time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2540 µs tF VOUT fall time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tD Delay time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 690 µs VIN = 3.3 V tON Turnon time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 1430 µs tOFF Turnoff time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tR VOUT rise time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 1680 µs tF VOUT fall time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tD Delay time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 590 µs VIN = 1.8 V tON Turnon time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 965 µs tOFF Turnoff time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tR VOUT rise time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 960 µs tF VOUT fall time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tD Delay time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 480 µs 725 µs VIN = 1 V tON Turnon time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF tOFF Turnoff time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 3 µs tR VOUT rise time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 560 µs tF VOUT fall time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 2 µs tD Delay time RL = 10 Ω, CIN = 1 µF, COUT = 0.1 µF, CT = 1000 pF 430 µs 6 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 6.7 Typical DC Characteristics 3 11 -40qC 25qC 85qC 105qC 10.5 2.5 Shutdown Current (PA) Quiescent Current (PA) 10 9.5 9 8.5 8 7.5 -40qC 25qC 85qC 105qC 7 6.5 2 1.5 1 0.5 6 0 1 1.5 2 2.5 3 3.5 4 Input Voltage (V) VON = 5 V 4.5 5 5.5 1 IOUT = 0 A 90 90 80 70 60 50 40 20 -40 3 3.5 4 Input Voltage (V) VIN = 1.8 V VIN = 2.5 V VIN = 3.3 V 4.5 5 5.5 D003 IOUT = 0 A VIN = 4.2 V VIN = 5 V VIN = 5.5 V -40qC 25qC 85qC 105qC 80 70 60 50 40 30 -20 0 VON = 5 V 20 40 Temperature (qC) 60 80 100 1 1.5 2 2.5 D004 IOUT = –200 mA VON = 5 V Figure 3. On-Resistance vs Temperature 3 3.5 4 Input Voltage (V) 4.5 5 5.5 D001 IOUT = –200 mA Figure 4. On-Resistance vs Input Voltage 100 140 90 120 Hysteresis Voltage (mV) 80 On-Resistance (m:) 2.5 Figure 2. Shutdown Current vs Input Voltage 100 On-Resistance (m:) On-Resistance (m:) Figure 1. Quiescent Current vs Input Voltage VIN= 1 V VIN = 1.05 V VIN = 1.2 V 2 VON = 0 V 100 30 1.5 D002 70 60 50 40 30 20 VIN= 1 V VIN = 1.2 V VIN = 1.5 V 10 0 0.2 0.4 0.6 VON = 5 V VIN = 1.8 V VIN = 2.5 V VIN = 3.3 V 0.8 1 1.2 1.4 Output Current (A) VIN = 4.2 V VIN = 5 V VIN = 5.5 V 1.6 1.8 100 80 60 40 -40qC 25qC 85qC 105qC 20 0 2 1 1.5 2 D005 TA = 25°C 2.5 3 3.5 4 Input Voltage (V) 4.5 5 5.5 D008 IOUT = 0 A Figure 5. On-Resistance vs Output Current Figure 6. Hysteresis Voltage vs Input Voltage Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 7 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com Typical DC Characteristics (continued) Output Pull-Down Resistance (:) 275 -40qC 25qC 85qC 105qC 250 225 200 175 150 125 100 75 50 25 0 1 VIN = VOUT 1.5 2 2.5 3 3.5 4 Input Voltage (V) 4.5 5 5.5 D009 VON = 0 V Figure 7. Output Pull-Down Resistance vs Input Voltage 8 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 3000 800 2500 700 Delay Time (Ps) Rise Time (Ps) 6.8 Typical AC Characteristics 2000 1500 -40qC 25qC 85qC 105qC 1000 600 500 -40qC 25qC 85qC 105qC 400 500 300 1 1.5 2 2.5 3 3.5 4 Input Voltage (V) CIN = 1 µF CT = 1000 pF 4.5 5 5.5 1 1.5 RL = 10 Ω CL = 0.1 µF 2.5 CIN = 1 µF Figure 8. Rise Time vs Input Voltage 3 3.5 4 Input Voltage (V) 4.5 5 5.5 D011 RL = 10 Ω CL = 0.1 µF Figure 9. Delay Time vs Input Voltage 5 5 -40qC 25qC 85qC 105qC -40qC 25qC 85qC 105qC 4 Turnoff Time (Ps) 4 Fall Time (Ps) 2 D010 3 2 3 2 1 1 0 0 1 1.5 2 2.5 CIN = 1 µF 3 3.5 4 Input Voltage (V) RL = 10 Ω 4.5 5 5.5 1 1.5 2 D012 CL = 0.1 µF QOD = Open Figure 10. Fall Time vs Input Voltage CIN = 1 µF 2.5 3 3.5 4 Input Voltage (V) RL = 10 Ω 4.5 5 5.5 D013 CL = 0.1 µF Figure 11. Turnoff Time vs Input Voltage 2150 Turnon Time (Ps) 1850 1550 1250 -40qC 25qC 85qC 105qC 950 650 1 CIN = 1 µF 1.5 2 2.5 3 3.5 4 Input Voltage (V) RL = 10 Ω CL = 0.1 µF 4.5 5 5.5 D014 CT =1000 pF VIN = 5 V RL = 10 Ω Figure 12. Turnon Time vs Input Voltage CIN = 1 µF CT = 1000 pF CL = 0.1 µF Figure 13. Rise Time (tR) at VIN = 5 V Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 9 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com Typical AC Characteristics (continued) VIN = 5 V RL = 10 Ω CIN = 1 µF QOD = Open CL = 0.1 µF Figure 14. Fall Time (tF) at VIN = 5 V VIN = 3.3 V RL = 10 Ω CIN = 1 µF QOD = Open CIN = 1 µF QOD = Open CL = 0.1 µF CL = 0.1 µF VIN = 1.8 V RL = 10 Ω CL = 0.1 µF CIN = 1 µF CT = 1000 pF CL = 0.1 µF Figure 17. Rise Time (tR) at VIN = 1.8 V VIN = 1.0 V RL = 10 Ω Figure 18. Fall Time (tF) at VIN = 1.8 V 10 CIN = 1 µF CT = 1000 pF Figure 15. Rise Time (tR) at VIN = 3.3 V Figure 16. Fall Time (tF) at VIN = 3.3 V VIN = 1.8 V RL = 10 Ω VIN = 3.3 V RL = 10 Ω Submit Documentation Feedback CIN = 1 µF CT = 1000 pF CL = 0.1 µF Figure 19. Rise Time (tR) at VIN = 1 V Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 Typical AC Characteristics (continued) VIN = 1.0 V RL = 10 Ω CIN = 1 µF QOD = Open CL = 0.1 µF Figure 20. Fall Time (tF) at VIN = 1 V Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 11 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 7 Parameter Measurement Information (1) Rise and fall times of the control signal is 100 ns. (2) Turnoff times and fall times are dependent on the time constant at the load. For TPS22918-Q1, the internal pull-down resistance RPD is enabled when the switch is disabled. The time constant is (RQOD || RL) × CL where RQOD equals RPD + REXT. Figure 21. Test Circuit VON 50% 50% tOFF tON VOUT 50% 50% tF tR 90% VOUT 10% 10% 90% 10% tD Figure 22. Timing Waveforms 12 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 8 Detailed Description 8.1 Overview The TPS22918-Q1 is a 5.5-V, 2-A load switch in a 6-pin SOT-23 package. To reduce voltage drop for low voltage and high current rails, the device implements a low resistance N-channel MOSFET which reduces the drop out voltage through the device. The device has a configurable slew rate which helps reduce or eliminate power supply droop because of large inrush currents. Furthermore, the device features a QOD pin, which allows to configure the discharge rate of VOUT once the switch is disabled. During shutdown, the device has very low leakage currents, thereby reducing unnecessary leakages for downstream modules during standby. Integrated control logic, driver, charge pump, and output discharge FET eliminates the need for any external components, which reduces solution size and bill of materials (BOM) count. 8.2 Functional Block Diagram VIN Charge Pump ON Control Logic CT VOUT QOD GND 8.3 Feature Description 8.3.1 On and Off Control The ON pin controls the state of the switch. ON is active high and has a low threshold, making it capable of interfacing with low-voltage signals. The ON pin is compatible with standard GPIO logic threshold. It can be used with any microcontroller with 1 V or higher GPIO voltage. This pin cannot be left floating and must be driven either high or low for proper functionality. 8.3.2 Quick Output Discharge (QOD) The TPS22918-Q1 includes a QOD feature. The QOD pin can be configured in one of three valid ways: • QOD pin shorted to VOUT pin. Using this method, the discharge rate after the switch becomes disabled is controlled with the value of the internal resistance RPD. The value of this resistance is listed in the Electrical Characteristics table. • QOD pin connected to VOUT pin using an external resistor REXT. After the switch becomes disabled, the discharge rate is controlled by the value of the total resistance of the QOD. To adjust the total QOD resistance, Equation 1 can be used. Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 13 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) RQOD = RPD + REXT Where: • • • • RQOD is the total output discharge resistance RPD is the internal pulldown resistance REXT is the external resistance placed between the VOUT and QOD pin. (1) QOD pin is unused and left floating. Using this method, there is no quick output discharge functionality, and the output remains floating after the switch is disabled. The fall times of the device depend on many factors including the total resistance of the QOD, VIN, and the output capacitance. When QOD is shorted to VOUT, the fall time changes over VIN as the internal RPD varies over VIN. To calculate the approximate fall time of VOUT for a given RQOD, use Equation 2 and Table 1. VCAP = VIN × e-t/τ Where: • • • VCAP is the voltage across the capacitor (V) t is the time since power supply removal (s) τ is the time constant equal to RQOD × CL (2) The fall times' dependency on VIN becomes minimal as the QOD value increases with additional external resistance. See Table 1 for QOD fall times. Table 1. QOD Fall Times FALL TIME (μs) 90% - 10%, CIN = 1 μF, IOUT = 0 A , VON = 0 V (1) VIN (V) (1) TA = 25°C TA = 85°C CL = 1 μF CL = 10 μF CL = 100 μF CL = 1 μF CL = 10 μF CL = 100 μF 5.5 42 190 1880 40 210 2150 5 43 200 1905 45 220 2200 3.3 47 230 2150 50 260 2515 2.5 58 300 2790 60 345 3290 1.8 75 430 4165 80 490 4950 1.2 135 955 9910 135 1035 10980 1 230 1830 19625 210 1800 19270 Typical values with QOD shorted to VOUT 8.3.2.1 QOD when System Power is Removed The adjustable QOD can be used to control the power down sequencing of a system even when the system power supply is removed. When the power is removed, the input capacitor discharges at VIN. Past a certain VIN level, the strength of the RPD is reduced. If there is still remaining charge on the output capacitor, this results in longer fall times. For further information regarding this condition, see the Shutdown Sequencing During Unexpected System Power Loss section. 8.3.2.2 Internal QOD Considerations Special considerations must be taken when using the internal RPD by shorting the QOD pin to the VOUT pin. The internal RPD is a pulldown resistance designed to quickly discharge a load after the switch has been disabled. Care must be used to ensure that excessive current does not flow through RPD during discharge so that the maximum TJ of 150°C is not exceeded. When using only the internal RPD to discharge a load, the total capacitive load must not exceed 200 µF. Otherwise, an external resistor, REXT, must be used to ensure the amount of current flowing through RPD is properly limited and the maximum TJ is not exceeded. To ensure the device is not damaged, the remaining charge from CL must decay naturally through the internal QOD resistance and must not be driven. 14 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 8.3.3 Adjustable Rise Time (CT) A capacitor to GND on the CT pin sets the slew rate for each channel. The capacitor to GND on the CT pin must be rated for 25 V and above. An approximate formula for the relationship between CT and slew rate is shown in Equation 3. SR = 0.55 × CT + 30 where • • • SR is the slew rate (in µs/V) CT is the capacitance value on the CT pin (in pF) The units for the constant 30 are µs/V. The units for the constant 0.55 are µs/(V × pF) (3) Equation 3 accounts for 10% to 90% measurement on VOUT and does not apply for CT less than 100 pF. Use Table 2 to determine rise times for when CT is greater or equal to 100 pF. Rise time can be calculated by multiplying the input voltage by the slew rate. Table 2 contains rise time values measured on a typical device. Table 2. Rise Time Table RISE TIME (µs) 10% - 90%, CL = 0.1 µF, CIN = 1 µF, RL = 10 Ω Typical values at 25°C with a 25-V X7R 10% ceramic capacitor on CT CTx (pF) VIN = 5 V VIN = 3.3 V VIN = 2.5 V VIN = 1.8 V VIN = 1.5 V VIN = 1.2V VIN = 1.0 V 0 135 95 75 60 50 45 40 220 650 455 350 260 220 185 160 300 470 1260 850 655 480 415 340 1000 2540 1680 1300 960 810 660 560 2200 5435 3580 2760 2020 1715 1390 1220 4700 12050 7980 6135 4485 3790 3120 2735 10000 26550 17505 13460 9790 8320 6815 5950 As the voltage across the capacitor approaches the capacitor rated voltage, the effective capacitance reduces. Depending on the dielectric material used, the voltage coefficient changes. See Table 3 for the recommended minimum voltage rating for the CT capacitor. Table 3. Recommended CT Capacitor Voltage Rating (1) VIN (V) RECOMMENDED CT CAPACITOR VOLTAGE RATING (V) (1) 1 V to 1.2 V 10 1.2 V to 4 V 16 4 V to 5.5 V 20 If using VIN = 1.2 V or 4 V, it is recommended to use the higher voltage rating. 8.4 Device Functional Modes Table 4 describes the connection of the VOUT pin depending on the state of the ON pin. Table 4. VOUT Connection ON QOD Configuration TPS22918-Q1 L QOD pin connected to VOUT with REXT GND (via REXT + RPD) L QOD pin tied to VOUT directly GND (via RPD) L QOD pin left open Open H Any valid QOD configuration VIN Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 15 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information This section highlights some of the design considerations when implementing this device in various applications. A PSPICE model for this device is also available in the product page of this device on www.ti.com (See the Device Support section for more information). 9.2 Typical Application This typical application demonstrates how the TPS22918-Q1 can be used to power downstream modules. VOUT VIN Power Supply QOD GND CL RL C IN ON ON CT TPS22918-Q1 GND OFF Copyright © 2016, Texas Instruments Incorporated Figure 23. Typical Application Schematic 9.2.1 Design Requirements For this design example, use the input parameters listed in Table 5. Table 5. Design Parameter 16 DESIGN PARAMETER EXAMPLE VALUE VIN 5V Load current 2A CL 22 uF tF 4 ms Maximum acceptable inrush current 400 mA Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 9.2.2 Detailed Design Procedure 9.2.2.1 Input Capacitor (CIN) To limit the voltage drop on the input supply caused by transient in-rush currents when the switch turns on into a discharged load capacitor or short-circuit, a capacitor must be placed between VIN and GND. A 1 µF ceramic capacitor, CIN, placed close to the pins, is usually sufficient. Higher values of CIN can be used to further reduce the voltage drop during high-current application. When switching heavy loads, it is recommended to have an input capacitor about 10 times higher than the output capacitor to avoid excessive voltage drop. 9.2.2.2 Output Capacitor (CL) (Optional) Becuase of the integrated body diode in the MOSFET, a CIN greater than CL is highly recommended. A CL greater than CIN can cause VOUT to exceed VIN when the system supply is removed. This could result in current flow through the body diode from VOUT to VIN. A CIN to CL ratio of 10 to 1 is recommended for minimizing VIN dip caused by inrush currents during startup. 9.2.2.3 Shutdown Sequencing During Unexpected System Power Loss Microcontrollers and processors often have a specific shutdown sequence in which power must be removed. Using the adjustable Quick Output Discharge function of the TPS22918-Q1, adding a load switch to each power rail can be used to manage the power down sequencing in the event of an unexpected system power loss (battery removal). To determine the QOD values for each load switch, first confirm the power down order of the device this is wished to power sequence. Be sure to check if there are voltage or timing margins that must be maintained during power down. Next, refer to Table 1 in the Quick Output Discharge (QOD) section to determine appropriate COUT and RQOD values for each power rail's load switch so that the load switches' fall times correspond to the order in which they need to be powered down. In the above example, make sure this power rail's fall time to be 4 ms. Using Equation 2, to determine the appropriate RQOD to achieve our desired fall time. Because fall times are measured from 90% of VOUT to 10% of VOUT, Equation 2 becomes Equation 4. .5 V = 4.5 V × e-(4 ms) / (R × (22 µF)) RQOD = 83.333 Ω (4) (5) Refer to Figure 7, RPD at VIN = 5 V is approximately 25 Ω. Using Equation 1, the required external QOD resistance can be calculated as shown in Equation 6. 83.333 Ω = 25 Ω + REXT REXT = 58.333 Ω (6) (7) Figure 24 through Figure 29 are scope shots demonstrating an example of the QOD functionality when power is removed from the device (both ON and VIN are disconnected simultaneously). The input voltage is decaying in all scope shots below. • Initial VIN = 3.3 V • QOD = Open, 500 Ω, or shorted to VOUT • CL = 1 μF, 10 μF • VOUT is left floating NOTE: VIN may appear constant in some figures. This is because the time scale of the scope shot is too small to show the decay of CIN. Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 17 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 VIN = 3.3 V www.ti.com CIN = 1 µF QOD = Open CL = 1 µF VIN = 3.3 V Figure 24. Fall Time (tF) at VIN = 3.3 V VIN = 3.3 V CIN = 1 µF QOD = VOUT CIN = 1 µF QOD = 500 Ω CL = 1 µF Figure 25. Fall Time (tF) at VIN = 3.3 V CL = 1 µF VIN = 3.3 V Figure 26. Fall Time (tF) at VIN = 3.3 V VIN = 3.3 V CIN = 1 µF QOD = 500 Ω CL = 10 µF CIN = 1 µF QOD = Open CL = 10 µF Figure 27. Fall Time (tF) at VIN = 3.3 V VIN = 3.3 V Figure 28. Fall Time (tF) at VIN = 3.3 V CIN = 1 µF QOD = VOUT CL = 10 µF Figure 29. Fall Time (tF) at VIN = 3.3 V 9.2.2.4 VIN to VOUT Voltage Drop The VIN to VOUT voltage drop in the device is determined by the RON of the device and the load current. The RON of the device depends upon the VIN conditions of the device. Refer to the RON specification of the device in the Electrical Characteristics table. When the RON of the device is determined based upon the VIN conditions, use Equation 8 to calculate the VIN to VOUT voltage drop. 18 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 ∆V is the ILOAD × RON where • • • ΔV is the voltage drop from VIN to VOUT ILOAD is the load current RON is the On-resistance of the device for a specific VIN An appropriate ILOAD must be chosen such that the IMAX specification of the device is not violated. (8) 9.2.2.5 Inrush Current Use Equation 9 to determine how much inrush current is caused by the CL capacitor. dV IINRUSH = CL ´ OUT dt where • • • • IINRUSH is the amount of inrush caused by CL CL is the capacitance on VOUT dt is the output voltage rise time during the ramp up of VOUT when the device is enabled dVOUT is the change in VOUT during the ramp up of VOUT when the device is enabled (9) The appropriate rise time can be calculated using the design requirements and the inrush current equation. As the rise time (measured from 10% to 90% of VOUT) is calculated, this is accounted in the dVOUT parameter (80% of VOUT = 4 V) as shown in Equation 10. 400 mA = 22 μF × 4 V/dt dt = 220 μs (10) (11) To ensure an inrush current of less than 400 mA, choose a CT value that yields a rise time of more than 220 μs. Refering to the Table 2 at VIN = 5 V, CT = 220 μF provides a typical rise time of 650 μs. Adding this rise time and voltage into Equation 9, yields Equation 12. IInrush = 22 μF × 4 V / 650 μs IInrush = 135 mA (12) (13) This inrush current can be seen in the Application Curves section. An appropriate CL value must be placed on VOUT such that the IMAX and IPLS specifications of the device are not violated. 9.2.3 Application Curves VIN = 5 V CL = 22 µF CT = 0 µF Figure 30. TPS22918-Q1 Inrush Current VIN = 5 V CL = 22 µF CT = 220 µF Figure 31. TPS22918-Q1 Inrush Current Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 19 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 10 Power Supply Recommendations The TPS22918-Q1 is designed to operate from a VIN range of 1 V to 5.5 V. This supply must be well regulated and placed as close to the device terminal as possible with the recommended 1-µF bypass capacitor. If the supply is located more than a few inches from the device terminals, additional bulk capacitance may be required in addition to the ceramic bypass capacitors. If additional bulk capacitance is required, an electrolytic, tantalum, or ceramic capacitor of 1 µF may be sufficient. 11 Layout 11.1 Layout Guidelines • • • VIN and VOUT traces must be as short and wide as possible to accommodate for high current. The VIN pin must be bypassed to ground with low ESR ceramic bypass capacitors. The typical recommended bypass capacitance is 1 μF ceramic with X5R or X7R dielectric. This capacitor must be placed as close to the device pins as possible. The VOUT pin must be bypassed to ground with low ESR ceramic bypass capacitors. The typical recommended bypass capacitance is one-tenth of the VIN bypass capacitor of X5R or X7R dielectric rating. This capacitor must be placed as close to the device pins as possible. 11.2 Layout Example 1 VIN VOUT 6 2 GND QOD 5 3 ON CT 4 VIA to Power Ground Plane Figure 32. Recommended Board Layout 11.3 Thermal Considerations For best performance, all traces must be as short as possible. To be most effective, the input and output capacitors must be placed close to the device to minimize the effects that parasitic trace inductances may have on normal and short-circuit operation. Using wide traces for VIN, VOUT, and GND helps minimize the parasitic electrical effects along with minimizing the case to ambient thermal impedance. 20 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 TPS22918-Q1 www.ti.com SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 Thermal Considerations (continued) The maximum IC junction temperature must be restricted to 150°C under normal operating conditions. To calculate the maximum allowable dissipation, PD(max) for a given output current and ambient temperature, use Equation 14. TJ(MAX) - TA PD(MAX) = qJA (14) Where: PD(MAX) is the maximum allowable power dissipation TJ(MAX) is the maximum allowable junction temperature (150°C for the TPS22918-Q1) TA is the ambient temperature of the device θJA is the junction to air thermal impedance. See the Thermal Information table. This parameter is highly dependent upon board layout. Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 21 TPS22918-Q1 SLVSCZ8B – JULY 2016 – REVISED DECEMBER 2019 www.ti.com 12 Device and Documentation Support 12.1 Device Support 12.1.1 Developmental Support For the TPS22918 PSpice Transient Model, see SLVMBI6. 12.2 Documentation Support 12.2.1 Related Documentation For related documentation see the following: • TPS22918 5.5-V, 2-A, 50-mΩ On-Resistance Load Switch Evaluation Module, SLVUAP0 • Quiescent Current vs Shutdown Current for Load Switch Power Consumption, SLVA757 • Fundamentals of On-Resistance in Load Switches, SLVA771 12.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.4 Community Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 12.5 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 22 Submit Documentation Feedback Copyright © 2016–2019, Texas Instruments Incorporated Product Folder Links: TPS22918-Q1 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) TPS22918TDBVRQ1 ACTIVE SOT-23 DBV 6 3000 RoHS & Green SN Level-3-260C-168 HR -40 to 105 13NW TPS22918TDBVTQ1 ACTIVE SOT-23 DBV 6 250 RoHS & Green SN Level-3-260C-168 HR -40 to 105 13NW (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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TPS22918TDBVRQ1
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TPS22918TDBVRQ1
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