CY62146ESL-45ZSXI

CY62146ESL MoBL 4-Mbit (256K x 16) Static RAM Features ■ ■ ■ Very high speed: 45 ns Wide voltage range: 2.2 V to 3.6 V and 4.5 V to 5.5 V Ultra low standby power ❐ Typical Standby current: 1 A ❐ Maximum Standby current: 7 A Ultra low active power ❐ Typical active current: 2 mA at f = 1 MHz Easy memory expansion with CE and OE features Automatic power down when deselected Complementary metal oxide semiconductor (CMOS) for optimum speed and power Available in Pb-free 44-pin thin small outline package (TSOP) II package applications such as cellular telephones. The device also has an automatic power down feature that reduces power consumption when addresses are not toggling. Placing the device into standby mode reduces power consumption by more than 99% when deselected (CE HIGH). The input and output pins (I/O0 through I/O15) are placed in a high impedance state when the device is deselected (CE HIGH), the outputs are disabled (OE HIGH), both Byte High Enable and Byte Low Enable are disabled (BHE, BLE HIGH) or during a write operation (CE LOW and WE LOW). To write to the device, take Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data from I/O pins (I/O0 through I/O7) is written into the location specified on the address pins (A0 through A17). If Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8 through I/O15) is written into the location specified on the address pins (A0 through A17). To read from the device, take Chip Enable (CE) and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data from the memory location specified by the address pins appears on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then data from memory appears on I/O8 to I/O15. See the “Truth Table” on page 11 for a complete description of read and write modes. ■ ■ ■ ■ ■ Functional Description The CY62146ESL is a high performance CMOS static RAM organized as 256K words by 16 bits. This device features advanced circuit design to provide ultra low active current. This is ideal for providing More Battery Life (MoBL) in portable Logic Block Diagram DATA IN DRIVERS A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 ROW DECODER 256K x 16 RAM Array SENSE AMPS I/O0–I/O7 I/O8–I/O15 COLUMN DECODER BHE WE CE OE BLE A11 A12 A13 A15 A14 A16 A17 Cypress Semiconductor Corporation Document #: 001-43142 Rev. *C • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised June 29, 2011 CY62146ESL MoBL Contents Pin Configuration ............................................................. 3 Product Portfolio .............................................................. 3 Maximum Ratings ............................................................. 4 Operating Range ............................................................... 4 Electrical Characteristics ................................................. 4 Capacitance ...................................................................... 5 Thermal Resistance .......................................................... 5 Data Retention Characteristics ....................................... 6 Switching Characteristics ................................................ 7 Switching Waveforms ...................................................... 8 Truth Table ...................................................................... 11 Package Diagram ............................................................ 12 Ordering Information ...................................................... 12 Acronyms ........................................................................ 13 Document Conventions ................................................. 13 Units of Measure ....................................................... 13 Document History Page ................................................. 14 Sales, Solutions, and Legal Information ...................... 15 Worldwide Sales and Design Support ....................... 15 Products .................................................................... 15 PSoC Solutions ......................................................... 15 Document #: 001-43142 Rev. *C Page 2 of 15 CY62146ESL MoBL Pin Configuration Figure 1. 44-Pin TSOP II (Top View) [1] A4 A3 A2 A1 A0 CE I/O0 I/O1 I/O2 I/O3 VCC VSS I/O4 I/O5 I/O6 I/O7 WE A17 A16 A15 A14 A13 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE BHE BLE I/O15 I/O14 I/O13 I/O12 VSS VCC I/O11 I/O10 I/O9 I/O8 NC A8 A9 A10 A11 A12 Product Portfolio Power Dissipation Product Range VCC Range (V)[2] Speed (ns) Operating ICC, (mA) f = 1MHz Typ[3] CY62146ESL Industrial 2.2 V–3.6 V and 4.5 V–5.5 V 45 2 Max 2.5 f = fmax Typ[3] 15 Max 20 Standby, ISB2 (A) Typ [3] 1 Max 7 Notes 1. NC pins are not connected on the die. 2. Datasheet specifications are not guaranteed for VCC in the range of 3.6 V to 4.5 V 3. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = 3 V, and VCC = 5 V, TA = 25 °C. Document #: 001-43142 Rev. *C Page 3 of 15 CY62146ESL MoBL Maximum Ratings Exceeding the maximum ratings may impair the useful life of the device. These user guidelines are not tested. Storage temperature................................. –65 °C to +150 °C Ambient temperature with power applied ........................................... –55 °C to +125 °C Supply voltage to ground potential .................–0.5 V to 6.0 V DC voltage applied to outputs in High-Z State[4, 5] .........................................–0.5 V to 6.0 V DC input voltage[4, 5] .......................................–0.5 V to 6.0 V Output current into outputs (LOW) .............................. 20 mA Static discharge voltage............................................. >2001V (MIL-STD-883, Method 3015) Latch up current....................................................... >200 mA Operating Range Device CY62146ESL Range Ambient Temperature VCC[6] Industrial –40 °C to +85 °C 2.2 V–3.6 V, and 4.5 V–5.5 V Electrical Characteristics Over the Operating Range 45 ns Parameter VOH Description Output high voltage 2.2 < VCC < 2.7 2.7 < VCC < 3.6 4.5 < VCC < 5.5 VOL Output low voltage 2.2 < VCC < 2.7 2.7 < VCC < 3.6 4.5 < VCC < 5.5 VIH Input high voltage 2.2 < VCC < 2.7 2.7 < VCC < 3.6 4.5 < VCC < 5.5 VIL Input low voltage 2.2 < VCC < 2.7 2.7 < VCC < 3.6 4.5 < VCC < 5.5 IIX IOZ ICC ISB1[8] Input Leakage Current VCC Operating Supply Current GND < VI < VCC f = fmax = 1/tRC f = 1 MHz VCC = VCCmax IOUT = 0 mA, CMOS levels Output Leakage Current GND < VO < VCC, Output Disabled Test Conditions IOH = –0.1 mA IOH = –1.0 mA IOH = –1.0 mA IOL = 0.1 mA IOL = 2.1mA IOL = 2.1mA 1.8 2.2 2.2 –0.3 –0.3 –0.5 –1 –1 15 2 1 Min 2.0 2.4 2.4 0.4 0.4 0.4 VCC + 0.3 VCC + 0.3 VCC + 0.5 0.6 0.8 0.8 +1 +1 20 2.5 7 A A A mA V V V Typ [7] Max Unit V ISB2[8] Automatic CE Power CE > VCC 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V, down Current — CMOS f = fmax (Address and Data Only), I/O Inputs f = 0 (OE, BHE, BLE and WE), VCC = VCC(max) Automatic CE Power CE > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V, down Current — CMOS f = 0, VCC = VCC(max) Inputs 1 7 A Notes 4. VIL(min) = –2.0V for pulse durations less than 20 ns. 5. VIH(max) = VCC + 0.75 V for pulse durations less than 20 ns. 6. Full Device AC operation assumes a 100 s ramp time from 0 to VCC (min) and 200 s wait time after VCC stabilization. 7. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = 3 V, and VCC = 5 V, TA = 25 °C. 8. Chip enable (CE) must be HIGH at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating. Document #: 001-43142 Rev. *C Page 4 of 15 CY62146ESL MoBL Capacitance Parameter[9] CIN COUT Description Input capacitance Output capacitance Test Conditions TA = 25 °C, f = 1 MHz, VCC = VCC(typ) Max 10 10 Unit pF pF Thermal Resistance Parameter[9] JA JC Description Thermal resistance (Junction to ambient) Thermal resistance (Junction to case) Figure 2. AC Test Loads and Waveforms R1 VCC Output 30 pF Including JIG and Scope VCC GND R2 Rise Time = 1 V/ns 10% All Input Pulses 90% 90% 10% Fall Time = 1 V/ns Thé venin Equivalent RTH OUTPUT V TH 5.0 V 1800 990 639 1.77 Unit    V Test Conditions Still Air, soldered on a 3 × 4.5 inch, two-layer printed circuit board TSOP II 77 13 Unit C/W C/W Equivalent to: Parameters R1 R2 RTH VTH 2.5 V 16667 15385 8000 1.20 3.0 V 1103 1554 645 1.75 Note 9. Tested initially and after any design or process changes that may affect these parameters. Document #: 001-43142 Rev. *C Page 5 of 15 CY62146ESL MoBL Data Retention Characteristics Over the Operating Range Parameter VDR ICCDR[11] tCDR [12] tR [13] Description VCC for data retention Data retention current Chip deselect to data retention time Operation recovery time CE > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V VCC = 1.5 V 0 45 Conditions Min 1.5 1 7 Typ[10] Max Unit V A ns ns Figure 3. Data Retention Waveform DATA RETENTION MODE VCC CE VCC(min) tCDR VDR > 1.5 V VCC(min) tR Notes 10. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = 3 V, and VCC = 5 V, TA = 25 °C. 11. Chip enable (CE) must be HIGH at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating. 12. Tested initially and after any design or process changes that may affect these parameters. 13. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) > 100 s. Document #: 001-43142 Rev. *C Page 6 of 15 CY62146ESL MoBL Switching Characteristics Over the Operating Range Parameter[14] Read Cycle tRC tAA tOHA tACE tDOE tLZOE tHZOE tLZCE tHZCE tPU tPD tDBE tLZBE tHZBE Write Cycle[17] tWC tSCE tAW tHA tSA tPWE tBW tSD tHD tHZWE tLZWE Write cycle time CE LOW to write end Address setup to write end Address hold from write end Address setup to Write Start WE pulse width BLE/BHE LOW to write end Data Setup to write end Data Hold from write end WE LOW to WE HIGH to High-Z[15, 16] Low-Z[15] 10 45 35 35 0 0 35 35 25 0 18 ns ns ns ns ns ns ns ns ns ns ns Read cycle time Address to data valid Data hold from address change CE LOW to data valid OE LOW to data valid OE LOW to LOW-Z[15] 5 18 10 18 0 45 22 5 18 OE HIGH to High-Z[15, 16] CE LOW to Low-Z[15] CE HIGH to High-Z[15, 16] CE LOW to power up CE HIGH to power down BLE/BHE LOW to data valid BLE/BHE LOW to BLE/BHE HIGH to Low-Z[15] HIGH-Z[15, 16] 10 45 22 45 45 ns ns ns ns ns ns ns ns ns ns ns ns ns ns Description 45 ns Min Max Unit Notes 14. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3 V, and output loading of the specified IOL/IOH as shown in the AC Test Loads and Waveforms on page 5. 15. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device. 16. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high-impedance state. 17. The internal write time of the memory is defined by the overlap of WE, CE = VIL, BHE, BLE or both = VIL. All signals must be active to initiate a write and any of these signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write. Document #: 001-43142 Rev. *C Page 7 of 15 CY62146ESL MoBL Switching Waveforms Figure 4. Read Cycle No.1: Address Transition Controlled. [18, 19] tRC RC ADDRESS tAA tOHA DATA OUT PREVIOUS DATA VALID DATA VALID Figure 5. Read Cycle No. 2: OE Controlled [19, 20] ADDRESS tRC CE tACE OE tDOE BHE/BLE tLZOE tHZBE tDBE tLZBE DATA OUT HIGHIMPEDANCE tLZCE tPU VCC SUPPLY CURRENT 50% 50% ISB ICC DATA VALID HIGH IMPEDANCE tHZOE tPD tHZCE Notes 18. The device is continuously selected. OE, CE = VIL, BHE, BLE, or both = VIL. 19. WE is HIGH for read cycle. 20. Address valid before or similar to CE, BHE, BLE transition LOW. Document #: 001-43142 Rev. *C Page 8 of 15 CY62146ESL MoBL Switching Waveforms (continued) Figure 6. Write Cycle No 1: WE Controlled [21, 22, 23] tWC ADDRESS tSCE CE tAW tSA WE tPWE tHA BHE/BLE tBW OE NOTE 24 tHZOE tSD DATAIN tHD DATA I/O Figure 7. Write Cycle 2: CE Controlled [21, 22, 23] tWC ADDRESS tSCE CE tSA WE tAW tPWE tHA BHE/BLE tBW OE tSD DATA I/O NOTE 24 tHZOE DATAIN tHD Notes 21. The internal write time of the memory is defined by the overlap of WE, CE = VIL, BHE, BLE or both = VIL. All signals must be active to initiate a write and any of these signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write. 22. Data I/O is high impedance if OE = VIH. 23. If CE goes HIGH simultaneously with WE = VIH, the output remains in a high impedance state. 24. During this period, the I/Os are in output state. Do not apply input signals. Document #: 001-43142 Rev. *C Page 9 of 15 CY62146ESL MoBL Switching Waveforms (continued) Figure 8. Write Cycle 3: WE controlled, OE LOW [25] tWC ADDRESS tSCE CE BHE/BLE tAW tSA WE tBW tHA tPWE tSD DATA I/O NOTE 26 tHZWE DATAIN tHD tLZWE Figure 9. Write Cycle 4: BHE/BLE Controlled, OE LOW [25] tWC ADDRESS CE tSCE tAW tHA tBW tSA BHE/BLE WE tHZWE tPWE tSD DATAIN tLZWE tHD DATA I/O NOTE 26 Notes 25. If CE goes HIGH simultaneously with WE = VIH, the output remains in a high impedance state. 26. During this period, the I/Os are in output state. Do not apply input signals. Document #: 001-43142 Rev. *C Page 10 of 15 CY62146ESL MoBL Truth Table CE[27] H L L L L L L L L L L WE X X H H H H H H L L L OE X X L L L H H H X X X BHE X H L H L L H L L H L BLE X H L L H L L H L L H Inputs/Outputs High-Z High-Z Data Out (I/O0–I/O15) Data Out (I/O0–I/O7); I/O8–I/O15 in High-Z Data Out (I/O8–I/O15); I/O0–I/O7 in High-Z High-Z High-Z High-Z Data In (I/O0–I/O15) Data In (I/O0–I/O7); I/O8–I/O15 in High-Z Data In (I/O8–I/O15); I/O0–I/O7 in High-Z Mode Deselect/Power down Output disabled Read Read Read Output disabled Output disabled Output disabled Write Write Write Power Standby (ISB) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Active (ICC) Note 27. Chip enable must be at CMOS levels (not floating). Intermediate voltage levels on this pin is not permitted. Document #: 001-43142 Rev. *C Page 11 of 15 CY62146ESL MoBL Ordering Information Speed (ns) 45 Ordering Code CY62146ESL-45ZSXI Package Diagram Package Type Operating Range Industrial 51-85087 44-pin TSOP Type II (Pb-free) Ordering Code Definitions CY 621 4 6 E SL xx xxx I Temperature Range: x = I = Industrial ZSX = 44-pin TSOP II (Pb-free) xx = Speed Grade Separator SL = Voltage range (3 V typical; 5 V typical) E = Process Technology 90 nm Buswidth = × 16 Density = 4-Mbit Family Code: MoBL SRAM family Company ID: CY = Cypress Package Diagram Figure 10. 44-Pin TSOP II, 51-85087 22 1 PIN 1 I.D. 11.938 (0.470) 11.735 (0.462) 10.262 (0.404) 10.058 (0.396) ZZZ ZXZ AA 23 44 TOP VIEW BOTTOM VIEW EJECTOR MARK (OPTIONAL) CAN BE LOCATED ANYWHERE IN THE BOTTOM PKG 0.800 BSC (0.0315) 0.400(0.016) 0.300 (0.012) BASE PLANE 10.262 (0.404) 10.058 (0.396) 0.10 (.004) 18.517 (0.729) 18.313 (0.721) 0°-5° 0.210 (0.0083) 0.120 (0.0047) 0.150 (0.0059) 0.050 (0.0020) 1.194 (0.047) 0.991 (0.039) SEATING PLANE 0.597 (0.0235) 0.406 (0.0160) DIMENSION IN MM (INCH) MAX MIN. 51-85087 *C Document #: 001-43142 Rev. *C Page 12 of 15 CY62146ESL MoBL Acronyms Acronym BHE BLE CE CMOS I/O OE SRAM TSOP VFBGA WE Description byte high enable byte low enable chip enable complementary metal oxide semiconductor input/output output enable static random access memory thin small outline package very fine ball gird array write enable Document Conventions Units of Measure Symbol °C A mA MHz ns pF V  W Unit of Measure degrees Celsius microamperes milliamperes megahertz nanoseconds picofarads volts ohms watts Document #: 001-43142 Rev. *C Page 13 of 15 CY62146ESL MoBL Document History Page Document Title: CY62146ESL MoBL 4-Mbit (256K x 16) Static RAM Document Number: 001-43142 REV. ** *A ECN NO. 1875228 2944332 Issue Date See ECN 06/04/2010 Orig. of Change VKN Description of Change Added Contents Added footnote for ISB2 parameter in Electrical Characteristics Added footnote related to chip enable in Truth Table Updated Package Diagram Added Sales, Solutions, and Legal Information Changed Table Footnotes to Footnotes. Added Ordering Code Definitions. Removed reference to AN1064 SRAM system guidelines. Added footnote 9 to parameter sections of Capacitance and Thermal Resistance. Added ISB1 to footnote 8. Added footnote 11. Changed tRC value as 45 in Data Retention Characteristics table. Footnote 14 moved to parameter section in Switching Characteristics Added Units of Measure. VKN/AESA New Data Sheet *B *C 3109186 3296704 12/13/2010 06/29/2011 PRAS RAME Document #: 001-43142 Rev. *C Page 14 of 15 CY62146ESL MoBL Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products Automotive Clocks & Buffers Interface Lighting & Power Control Memory Optical & Image Sensing PSoC Touch Sensing USB Controllers cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB Wireless/RF cypress.com/go/wireless PSoC Solutions psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 5 © Cypress Semiconductor Corporation, 2008–2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document #: 001-43142 Rev. *C Revised June 29, 2011 Page 15 of 15 MoBL is a registered trademark and More Battery Life is a trademark of Cypress Semiconductor. All product and company names mentioned in this document are the trademarks of their respective holders.