CY62168DV30LL-55BVXIT

CY62168DV30 MoBL® 16-Mbit (2M x 8) MoBL® Static RAM Features reduces power consumption. The device can be put into standby mode reducing power consumption by 90% when addresses are not toggling. The device can be put into standby mode reducing power consumption by more than 99% when deselected Chip Enable 1 (CE1) HIGH or Chip Enable 2 (CE2) LOW. The input/output pins (I/O0 through I/O7) are placed in a high-impedance state when: deselected Chip Enable 1 (CE1) HIGH or Chip Enable 2 (CE2) LOW, outputs are disabled (OE HIGH), or during a write operation (Chip Enable 1 (CE1) LOW and Chip Enable 2 (CE2) HIGH and WE LOW). • Very high speed — 55 ns • Wide voltage range — 2.2V – 3.6V • Ultra-low active power — Typical active current: 2 mA @ f = 1 MHz — Typical active current: 15 mA @ f = fMax (55 ns Speed) • Ultra-low standby power • Easy memory expansion with CE1, CE2 and OE features • Automatic power-down when deselected • CMOS for optimum speed/power • Available in Pb-free and non Pb-free 48-ball VFBGA package Functional Description[1] The CY62168DV30 is a high-performance CMOS static RAMs organized as 2048Kbit words by 8 bits. This device features advanced circuit design to provide ultra-low active current. This is ideal for providing More Battery Life™ (MoBL®) in portable applications such as cellular telephones. The device also has an automatic power-down feature that significantly Writing to the device is accomplished by taking Chip Enable 1 (CE1) LOW and Chip Enable 2 (CE2) HIGH and Write Enable (WE) input LOW. Data on the eight I/O pins (I/O0 through I/O7) is then written into the location specified on the address pins(A0 through A20). Reading from the device is accomplished by taking Chip Enable 1 (CE1) and Output Enable (OE) LOW and Chip Enable 2 (CE2) HIGH while forcing Write Enable (WE) HIGH. Under these conditions, the contents of the memory location specified by the address pins will appear on the I/O pins. The eight input/output pins (I/O0 through I/O7) are placed in a high-impedance state when the device is deselected (CE1 LOW and CE2 HIGH), the outputs are disabled (OE HIGH), or during a write operation (CE1 LOW and CE2 HIGH and WE LOW). See the truth table for a complete description of read and write modes. Logic Block Diagram I/O0 Data in Drivers I/O1 2048K x 8 ARRAY I/O2 SENSE AMPS ROW DECODER A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 I/O3 I/O4 I/O5 COLUMN DECODER CE1 CE2 I/O6 POWER DOWN I/O7 OE A17 A18 A19 A20 A16 A13 A14 A15 WE Note: 1. For best-practice recommendations, please refer to the Cypress application note entitled System Design Guidelines, available at http://www.cypress.com. Cypress Semiconductor Corporation Document #: 38-05329 Rev. *F • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised July 27, 2006 CY62168DV30 MoBL® Pin Configuration[2] 48-ball VFBGA Top View 1 2 3 4 5 6 DNU OE A0 A1 A2 CE2 A DNU DNU A3 A4 CE1 DNU B I/O0 DNU A5 A6 DNU I/O4 C VSS I/O1 A17 A7 I/O5 VCC D VCC I/O2 DNU A16 I/O6 VSS E I/O3 DNU A14 A15 DNU I/O7 F DNU A20 A12 A13 WE DNU G A18 A8 A9 A10 A11 A19 H Product Portfolio Power Dissipation Operating ICC (mA) VCC Range (V) f = 1 MHz Product Min. Typ.[3] Max. Speed (ns) CY62168DV30LL 2.2 3.0 3.6 55 Standby ISB2(µA) f = fMax Typ.[3] Max. Typ.[3] Max. Typ.[3] Max. 2 4 15 30 2.5 22 Notes: 2. DNU pins have to be left floating or tied to VSS to ensure proper operation. 3. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ.), TA = 25°C. Document #: 38-05329 Rev. *F Page 2 of 9 CY62168DV30 MoBL® DC Input Voltage[4, 5] ......................–0.3V to VCC(max) + 0.3V Maximum Ratings Output Current into Outputs (LOW)............................. 20 mA (Above which the useful life may be impaired. For user guidelines, not tested.) Static Discharge Voltage........................................... > 2001V (per MIL-STD-883, Method 3015) Storage Temperature .................................. –65°C to +150°C Latch-up Current..................................................... > 200 mA Ambient Temperature with Power Applied............................................. –55°C to +125°C Operating Range Supply Voltage to Ground Potential ........................................ –0.3V to VCC(max) + 0.3V DC Voltage Applied to Outputs in High-Z State[4, 5] ......................... –0.3V to VCC(max) + 0.3V Range Ambient Temperature (TA)[6] VCC[7] Industrial –40°C to +85°C 2.2V – 3.6V DC Electrical Characteristics (Over the Operating Range) CY62168DV30-55 Parameter VOH VOL VIH VIL Description Output HIGH Voltage Output LOW Voltage Input HIGH Voltage Input LOW Voltage Test Conditions Min. Typ.[3] Max. 2.2V < VCC < 2.7V IOH = −0.1 mA 2.0 2.7V < VCC < 3.6V IOH = −1.0 mA 2.4 2.2V < VCC < 2.7V IOL = 0.1 mA 0.4 2.7V < VCC < 3.6V IOL = 2.1 mA 0.4 Unit V V 2.2V < VCC < 2.7V 1.8 VCC + 0.3 2.7V < VCC < 3.6V 2.2 VCC + 0.3 2.2V < VCC < 2.7V –0.3 0.6 2.7V < VCC < 3.6V –0.3 0.8 V V IIX Input Leakage Current GND < VI < VCC –1 +1 µA IOZ Output Leakage Current GND < VO < VCC, Output disabled –1 +1 µA ICC VCC Operating Supply Current f = fMax = 1/tRC 15 30 mA 2 4 f = 1 MHz VCC = 3.6V, IOUT = 0 mA, CMOS level ISB1 Automatic CE Power-down Current — CMOS Inputs CE1 > VCC − 0.2V, CE2 < 0.2V, VIN > VCC − 0.2V, VIN < 0.2V, f = fMax (Address and Data Only), f = 0 (OE, WE) 2.5 22 µA ISB2 Automatic CE Power-down Current— CMOS Inputs CE1 > VCC − 0.2V, CE2 < 0.2V, VIN > VCC − 0.2V or VIN < 0.2V, f = 0, VCC = 3.6V 2.5 22 µA Capacitance[8] Parameter Description CIN Input Capacitance COUT Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VCC = VCC(typ.) Max. Unit 8 pF 10 pF Notes: 4. VIL(min) = –2.0V for pulse durations less than 20 ns. 5. VIH(max) = VCC + 0.75V for pulse durations less than 20 ns. 6. TA is the “Instant-On” case temperature. 7. Full device AC operation assumes a 100 µs ramp time from 0 to VCC(min) and 100 µs wait time after VCC stabilization. 8. Tested initially and after any design or process changes that may affect these parameters. Document #: 38-05329 Rev. *F Page 3 of 9 CY62168DV30 MoBL® Thermal Resistance[8] Parameter Description ΘJA Thermal Resistance (Junction to Ambient) ΘJC Thermal Resistance (Junction to Case) Test Conditions VFBGA Unit 55 °C/W 16 °C/W Still Air, soldered on a 3 x 4.5 inch, 2-layer printed circuit board AC Test Loads and Waveforms R1 VCC ALL INPUT PULSES VCC OUTPUT 10% 50 pF R2 90% 10% 90% GND Fall time: 1 V/ns Rise Time: 1 V/ns INCLUDING JIG AND SCOPE Equivalent to: THEVENIN EQUIVALENT RTH OUTPUT VTH Parameters 2.5V 3.0V Unit R1 16600 1103 Ω R2 15400 1554 Ω RTH 8000 645 Ω VTH 1.2 1.75 V Data Retention Characteristics (Over the Operating Range) Parameter Description Conditions VDR VCC for Data Retention ICCDR Data Retention Current Min. Typ.[3] 1.5 VCC = 1.5V Max. Unit 3.6 V 10 µA CE1 > VCC − 0.2V or CE2 VCC − 0.2V or VIN < 0.2V tCDR[8] Chip Deselect to Data Retention Time tR[9] Operation Recovery Time 0 ns tRC ns Data Retention Waveform DATA RETENTION MODE VCC VCC(min) VDR > 1.5 V tCDR VCC(min) tR CE1 or CE2 Note: 9. Full Device AC operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) > 100 µs. Document #: 38-05329 Rev. *F Page 4 of 9 CY62168DV30 MoBL® Switching Characteristics Over the Operating Range [10] 55 ns Parameter Description Min. Max. Unit Read Cycle tRC Read Cycle Time 55 ns tAA Address to Data Valid tOHA Data Hold from Address Change tACE CE1 LOW and CE2 HIGH to Data Valid 55 ns tDOE OE LOW to Data Valid 25 ns tLZOE OE LOW to Low Z[11] tHZOE OE HIGH to High Z[11, 12] tLZCE CE1 LOW and CE2 HIGH to Low Z[11] tHZCE CE1 HIGH or CE2 LOW to High Z[11, 12] tPU CE1 LOW and CE2 HIGH to Power-Up tPD CE1 HIGH or CE2 LOW to Power-Down 55 10 ns ns 5 ns 20 10 ns ns 20 0 ns ns 55 ns Write Cycle[13] tWC Write Cycle Time 55 ns tSCE CE1 LOW and CE2 HIGH to Write End 40 ns tAW Address Set-Up to Write End 40 ns tHA Address Hold from Write End 0 ns tSA Address Set-Up to Write Start 0 ns tPWE WE Pulse Width 40 ns tSD Data Set-Up to Write End 25 ns tHD Data Hold from Write End 0 ns tHZWE WE LOW to High Z[11, 12] tLZWE WE HIGH to Low Z[11] 20 10 ns ns Notes: 10. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3ns or less (1V/ns), timing reference levels of VCC(typ.)/2, input pulse levels of 0 to VCC(typ.), and output loading of the specified IOL/IOH as shown in the “AC Test Loads and Waveforms” section. 11. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device. 12. tHZOE, tHZCE, and tHZWE transitions are measured when the outputs enter a high impedance state. 13. The internal write time of the memory is defined by the overlap of WE, CE1 = VIL, and CE2 = VIH. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates the write. Document #: 38-05329 Rev. *F Page 5 of 9 CY62168DV30 MoBL® Switching Waveforms Read Cycle No. 1 (Address Transition Controlled)[14, 15] tRC ADDRESS tOHA DATA OUT tAA PREVIOUS DATA VALID DATA VALID Read Cycle No. 2 (OE Controlled)[15, 16] ADDRESS tRC CE1 CE2 tACE OE tHZOE tDOE tHZCE tLZOE HIGH IMPEDANCE DATA VALID DATA OUT tLZCE VCC SUPPLY CURRENT HIGH IMPEDANCE tPD tPU ICC 50% 50% ISB Write Cycle No. 1 (WE Controlled)[13, 17, 18] tWC ADDRESS tSCE CE1 CE2 tAW tSA tHA tPWE WE OE tSD DATA I/O See Note 19 tHD VALID DATA tHZOE Notes: 14. Device is continuously selected. OE, CE1 = VIL, CE2 = VIH. 15. WE is HIGH for read cycle. 16. Address valid prior to or coincident with CE1 transition LOW and CE2 transition HIGH. 17. Data I/O is high impedance if OE = VIH. 18. If CE1 goes HIGH or CE2 goes LOW simultaneously with WE HIGH, the output remains in high-impedance state. 19. During this period, the I/Os are in output state and input signals should not be applied. Document #: 38-05329 Rev. *F Page 6 of 9 CY62168DV30 MoBL® Switching Waveforms (continued) Write Cycle No. 2 (CE1 or CE2 Controlled)[13, 17, 18] tWC ADDRESS tSCE CE1 tSA CE2 tAW tHA tPWE WE OE tSD DATA I/O tHD VALID DATA Write Cycle No. 3 (WE Controlled, OE LOW)[19] tWC ADDRESS tSCE CE1 CE2 tAW tSA tHA tPWE WE tSD See Note 19 DATA I/O tHD VALID DATA tLZWE tHZWE Truth Table CE1 CE2 WE OE H X X X High Z Deselect/Power-down Standby (ISB) X L X X High Z Deselect/Power-down Standby (ISB) L H H L Data Out (I/O0-I/O7) Read Active (ICC) L H L X Data in (I/O0-I/O7) Write Active (ICC) L H H H High Z Output Disabled Active (ICC) Document #: 38-05329 Rev. *F Inputs/Outputs Mode Power Page 7 of 9 CY62168DV30 MoBL® Ordering Information Speed (ns) Ordering Code 55 CY62168DV30LL-55BVI Package Diagram Operating Range Package Type 51-85178 48-ball Fine Pitch BGA (8 x 9.5 x 1 mm) CY62168DV30LL-55BVXI Industrial 48-ball Fine Pitch BGA (8 x 9.5 x 1 mm) (Pb-free) Please contact your local Cypress sales representative for availability of these parts Package Diagram 48-ball VFBGA (8 x 9.5 x 1 mm) (51-85178) BOTTOM VIEW TOP VIEW A1 CORNER Ø0.05 M C Ø0.25 M C A B A1 CORNER Ø0.30±0.05(48X) 2 3 4 5 6 6 5 4 3 2 1 C C E F G D E 2.625 D 0.75 A B 5.25 A B 9.50±0.10 9.50±0.10 1 F G H H A 1.875 A B 0.75 8.00±0.10 0.55 MAX. B 0.10 C 0.21±0.05 0.25 C 3.75 8.00±0.10 0.15(4X) 1.00 MAX 0.26 MAX. SEATING PLANE C 51-85178-** MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All product and company names mentioned in this document are trademarks of their respective holders. Document #: 38-05329 Rev. *F Page 8 of 9 © Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. CY62168DV30 MoBL® Document History Page Document Title: CY62168DV30 MoBL®, 16-Mbit (2M x 8) MoBL® Static RAM Document Number: 38-05329 REV. ECN NO. Issue Date Orig. of Change Description of Change ** 118409 09/30/02 GUG New Data Sheet *A 123693 02/05/03 DPM Changed Advance Information to Preliminary Added package diagram *B 126556 04/24/03 DPM Minor change: Change sunset owner from DPM to HRT *C 132869 01/15/04 XRJ Changed Preliminary to Final *D 272589 See ECN PCI Updated Final data sheet and added Pb-free package. *E 335864 See ECN PCI Removed redundant packages from Ordering Information Table Added Address A20 to ball G2 in the Pin Configuration *F 492895 See ECN VKN Changed address of Cypress Semiconductor Corporation on Page# 1 from “3901 North First Street” to “198 Champion Court” Removed 70 ns speed bin Removed L power bin from product offering Updated Ordering Information Table Document #: 38-05329 Rev. *F Page 9 of 9