CY7C1041BN
256K × 16 Static RAM
256K × 16 Static RAM
Features
Functional Description
■
Temperature range:
❐ Commercial: 0 °C to 70 °C
❐ Automotive-A: –40 °C to 85 °C
The CY7C1041BN is a high-performance CMOS static RAM
organized as 262,144 words by 16 bits.
■
High speed
❐ tAA = 15 ns
■
Low active power
■
Low CMOS standby power
❐ 2.75 mW (max.)
■
2.0 V data retention (400 W at 2.0 V retention)
■
Automatic power-down when deselected
■
TTL-compatible inputs and outputs
■
Easy memory expansion with CE and OE features
■
Available in Pb-free and non Pb-free 44-pin TSOP II and
molded 44-pin (400-Mil) SOJ packages
Writing to the device is accomplished by taking Chip Enable (CE)
and Write Enable (WE) inputs LOW. If Byte Low Enable (BLE) is
LOW, then data from I/O pins (I/O0 through I/O7), is written into
the location specified on the address pins (A0 through A17). If
Byte High Enable (BHE) is LOW, then data from I/O pins (I/O8
through I/O15) is written into the location specified on the address
pins (A0 through A17).
Reading from the device is accomplished by taking Chip Enable
(CE) and Output Enable (OE) LOW while forcing the Write
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then data
from the memory location specified by the address pins will
appear on I/O0 to I/O7. If Byte High Enable (BHE) is LOW, then
data from memory will appear on I/O8 to I/O15. See the truth table
at the back of this data sheet for a complete description of read
and write modes.
The input/output pins (I/O0 through I/O15) are placed in a
high-impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW,
and WE LOW).
The CY7C1041BN is available in a standard 44-pin 400-mil-wide
body width SOJ and 44-pin TSOP II package with center power
and ground (revolutionary) pinout.
For a complete list of related documentation, click here.
Logic Block Diagram
Buffer
256K x 16
Array
I/O0–I/O7
Sense Amps
A0
A1
A2
A3
A4
A5
A6
A7
A8
Row Decoder
Input
I/O8–I/O15
A9
A10
A 11
A 12
A 13
A14
A15
A16
A17
Column
Decoder
Cypress Semiconductor Corporation
Document Number: 001-06496 Rev. *L
•
198 Champion Court
BHE
WE
CE
OE
BLE
•
San Jose, CA 95134-1709
•
408-943-2600
Revised April 15, 2019
CY7C1041BN
Contents
Selection Guide ................................................................ 3
Pin Configurations ........................................................... 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 5
AC Test Loads and Waveforms ....................................... 5
Data Retention Characteristics ....................................... 5
Data Retention Waveform ................................................ 5
Switching Characteristics ................................................ 6
Switching Waveforms ...................................................... 7
Truth Table ...................................................................... 10
Ordering Information ...................................................... 11
Ordering Code Definitions ......................................... 11
Document Number: 001-06496 Rev. *L
Package Diagram ............................................................ 12
Acronyms ........................................................................ 13
Document Conventions ................................................. 13
Units of Measure ....................................................... 13
Document History Page ................................................. 14
Sales, Solutions, and Legal Information ...................... 16
Worldwide Sales and Design Support ....................... 16
Products .................................................................... 16
PSoC® Solutions ...................................................... 16
Cypress Developer Community ................................. 16
Technical Support ..................................................... 16
Page 2 of 16
CY7C1041BN
Selection Guide
Description
-15
Maximum access time
Maximum operating current
Commercial
Automotive-A
Maximum CMOS standby current
Commercial
Automotive-A
-20
Unit
15
20
ns
190
170
mA
–
190
–
0.5
0.5
mA
–
6
Pin Configurations
Figure 1. 44-pin TSOP II / SOJ pinout (Top View)
SOJ
TSOP II
Top View
A0
A1
A2
A3
A4
CE
I/O0
I/O1
I/O2
I/O3
VCC
VSS
I/O4
I/O5
I/O6
I/O7
WE
A5
A6
A7
A8
A9
Document Number: 001-06496 Rev. *L
1
44
2
3
43
42
4
41
40
39
38
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A17
A16
A15
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
NC
A14
A13
A12
A11
A10
Page 3 of 16
CY7C1041BN
Maximum Ratings
DC voltage applied to outputs
in High Z State [1] ................................ –0.5 V to VCC + 0.5 V
Exceeding maximum ratings may shorten the useful life of the
device. These user guidelines are not tested.
DC input voltage [1] ............................. –0.5 V to VCC + 0.5 V
Storage temperature ................................ –65 °C to +150 °C
Current into outputs (LOW) ........................................ 20 mA
Ambient temperature
with power applied ................................... –55 °C to +125 °C
Operating Range
Supply voltage
on VCC to relative GND[1] ............................–0.5 V to +7.0 V
Range
Ambient Temperature [2]
VCC
0 °C to +70 °C
5 V ± 0.5
Commercial
Automotive-A
–40 °C to +85 °C
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
VOH
Output HIGH voltage
Min VCC, IOH = –4.0 mA
-15
-20
Unit
Min
Max
Min
Max
2.4
–
2.4
–
V
VOL
Output LOW voltage
Min VCC, IOL = 8.0 mA
–
0.4
–
0.4
V
VIH[1]
Input HIGH voltage
–
2.2
VCC + 0.5
2.2
VCC + 0.5
V
VIL[1]
Input LOW voltage
–
–0.5
0.8
–0.5
0.8
V
IIX
Input load current
GND < VIN < VCC
–1
+1
–1
+1
µA
IOZ
Output leakage current
GND < VOUT < VCC, Output
Disabled
–1
+1
–1
+1
µA
ICC
VCC operating supply current
Max VCC,
f = fMAX = 1/tRC
–
190
–
170
mA
ISB1
Automatic CE power-down
current – TTL inputs
Max VCC, CE > VIH,
VIN > VIH or VIN < VIL, f = fMAX
ISB2
Automatic CE power-down
current – CMOS inputs
Max VCC,
Commercial
CE > VCC – 0.3 V,
Automotive-A
VIN > VCC – 0.3 V,
or VIN < 0.3 V, f = 0
Commercial
Automotive-A
–
–
–
190
mA
–
40
–
40
mA
–
0.5
–
0.5
mA
–
–
–
6
mA
Notes
1. VIL (min.) = –2.0 V for pulse durations of less than 20 ns.
2. TA is the case temperature.
Document Number: 001-06496 Rev. *L
Page 4 of 16
CY7C1041BN
Capacitance
Parameter [3]
Description
CIN
Input capacitance
COUT
I/O capacitance
Test Conditions
TA = 25 °C, f = 1 MHz, VCC = 5.0 V
Max
Unit
8
pF
8
pF
AC Test Loads and Waveforms
Figure 2. AC Test Loads and Waveforms
R1 481
5V
Output
R1 481
5V
3.0 V
Output
R2
255
30 pF
Including
JIG and
Scope
Equivalent to:
Output
Including
JIG and
Scope
(a)
R2
255
5 pF
GND
All Input Pulses
90%
90%
10%
10%
3 ns
3 ns
(b)
Thé venin Equivalent
167
1.73 V
Data Retention Characteristics
Over the Operating Range (Commercial only)
Parameter
VDR
ICCDR
tCDR
[5]
Conditions[4]
Description
VCC for data retention
–
Data retention current
VCC = VDR = 2.0 V,
CE > VCC – 0.3 V,
VIN > VCC – 0.3 V or VIN < 0.3 V
Chip deselect to data retention
time
tR[6]
Operation recovery time
Min
Max
Unit
2.0
–
V
–
200
A
0
–
ns
tRC
–
ns
Data Retention Waveform
Figure 3. Data Retention Waveform
Data Retention Mode
VCC
3.0 V
VDR > 2 V
tCDR
3.0 V
tR
CE
Notes
3. Tested initially and after any design or process changes that may affect these parameters.
4. No input may exceed VCC + 0.5 V.
5. Tested initially and after any design or process changes that may affect these parameters.
6. tr < 3 ns for the –15 speed. tr < 5 ns for the -20 and slower speeds.
Document Number: 001-06496 Rev. *L
Page 5 of 16
CY7C1041BN
Switching Characteristics
Over the Operating Range
Parameter [7]
Description
-15
-20
Min
Max
Min
Max
Unit
Read Cycle
tpower
VCC(typical) to the first access [8]
1
–
1
–
s
tRC
Read cycle time
15
–
20
–
ns
tAA
Address to data valid
–
15
–
20
ns
tOHA
Data hold from address change
3
–
3
–
ns
tACE
CE LOW to data valid
–
15
–
20
ns
tDOE
OE LOW to data valid
–
7
–
8
ns
tLZOE
OE LOW to low Z
0
–
0
–
ns
–
7
–
8
ns
3
–
3
–
ns
–
7
–
8
ns
0
–
0
–
ns
[9, 10]
tHZOE
OE HIGH to high Z
tLZCE
CE LOW to low Z [10]
[9, 10]
tHZCE
CE HIGH to high Z
tPU
CE LOW to power-up
tPD
CE HIGH to power-down
–
15
–
20
ns
tDBE
Byte enable to data valid
–
7
–
8
ns
tLZBE
Byte enable to low Z
0
–
0
–
ns
Byte disable to high Z
–
7
–
8
ns
tHZBE
Write Cycle
[11, 12]
tWC
Write cycle time
15
–
20
–
ns
tSCE
CE LOW to write end
12
–
13
–
ns
tAW
Address setup to write end
12
–
13
–
ns
tHA
Address hold from write end
0
–
0
–
ns
tSA
Address setup to write start
0
–
0
–
ns
tPWE
WE pulse width
12
–
13
–
ns
tSD
Data setup to write end
8
–
9
–
ns
tHD
Data hold from write end
0
–
0
–
ns
tLZWE
WE HIGH to low Z [13]
3
–
3
–
ns
–
7
–
8
ns
12
–
13
–
ns
[13, 14]
tHZWE
WE LOW to high Z
tBW
Byte enable to end of write
Notes
7. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified IOL/IOH
and 30-pF load capacitance.
8. This part has a voltage regulator which steps down the voltage from 5 V to 3.3 V internally. tpower time has to be provided initially before a read/write operation is started.
9. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of Figure 2 on page 5. Transition is measured ±500 mV from steady-state voltage.
10. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
11. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
12. The minimum write cycle time for Write Cycle No. 3 (WE Controlled, OE LOW) is the sum of tHZWE and tSD.
13. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
14. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of Figure 2 on page 5. Transition is measured ±500 mV from steady-state voltage.
Document Number: 001-06496 Rev. *L
Page 6 of 16
CY7C1041BN
Switching Waveforms
Figure 4. Read Cycle No. 1 [15, 16]
tRC
Address
tOHA
Data I/O
tAA
Previous Data Valid
Data Out Valid
Figure 5. Read Cycle No. 2 (OE Controlled) [16, 17]
Address
tRC
CE
tACE
OE
tHZOE
tDOE
BHE, BLE
tLZOE
tHZCE
tDBE
tLZBE
Data I/O
High Impedance
Data Out Valid
tLZCE
VCC
Supply
Current
tHZBE
High
Impedance
tPD
tPU
50%
ICC
50%
ISB
Notes
15. Device is continuously selected. OE, CE, BHE, and/or BHE = VIL.
16. WE is HIGH for read cycle.
17. Address valid prior to or coincident with CE transition LOW.
Document Number: 001-06496 Rev. *L
Page 7 of 16
CY7C1041BN
Switching Waveforms (continued)
Figure 6. Write Cycle No. 1 (CE Controlled) [18, 19]
tWC
Address
CE
tSA
tSCE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
Data In Valid
Data I/O
Figure 7. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
Address
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
Data I/O
tHD
Data In Valid
Notes
18. Data I/O is high impedance if OE or BHE and/or BLE= VIH.
19. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
Document Number: 001-06496 Rev. *L
Page 8 of 16
CY7C1041BN
Switching Waveforms (continued)
Figure 8. Write Cycle No. 3 (WE Controlled, OE LOW) [20]
tWC
Address
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
Data I/O
tSD
tHD
Data In Valid
tLZWE
Note
20. The minimum write cycle pulse width should be equal to the sum of tSD and tHZWE.
Document Number: 001-06496 Rev. *L
Page 9 of 16
CY7C1041BN
Truth Table
CE
OE
WE BLE BHE
I/O0–I/O7
H
X
X
X
X
High Z
High Z
Power-down
Standby (ISB)
L
L
H
L
L
Data out
Data out
Read all bits
Active (ICC)
L
L
H
L
H
Data out
High Z
Read lower bits only
Active (ICC)
L
L
H
H
L
High Z
Data out
Read upper bits only
Active (ICC)
L
X
L
L
L
Data in
Data in
Write all bits
Active (ICC)
L
X
L
L
H
Data in
High Z
Write lower bits only
Active (ICC)
L
X
L
H
L
High Z
Data in
Write upper bits only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, Outputs disabled
Active (ICC)
L
X
X
H
H
High Z
High Z
Selected, Outputs disabled
Active (ICC)
Document Number: 001-06496 Rev. *L
I/O8–I/O15
Mode
Power
Page 10 of 16
CY7C1041BN
Ordering Information
Cypress offers other versions of this type of product in many different configurations and features. The following table contains only
the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at http://www.cypress.com
and refer to the product summary page at http://www.cypress.com/products or contact your local sales representative.
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.
Speed
(ns)
20
Ordering Code
CY7C1041BN-20ZSXA
Package
Name
51-85087
Package Type
44-pin TSOP Type II
Operating
Range
Automotive-A
Ordering Code Definitions
CY 7 C 1 04 1
BN X - XX XX X X
Temperature Range:
A = Automotive-A
Pb-free
Package Type:
ZS = 44-pin TSOP Type II
Speed: XX = 20 ns
Power: X = blank
blank = High Power
Process Technology: BN = 180 nm Technology
Bus Width: 1 = × 16 bits
Density: 04 = 4-Mbit density
Family Code: 1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 001-06496 Rev. *L
Page 11 of 16
CY7C1041BN
Package Diagram
Figure 9. 44-pin TSOP II Package Outline, 51-85087
51-85087 *E
Document Number: 001-06496 Rev. *L
Page 12 of 16
CY7C1041BN
Acronyms
Acronym
Document Conventions
Description
Units of Measure
BHE
Byte High Enable
BLE
Byte Low Enable
°C
degree Celsius
CE
Chip Enable
MHz
megahertz
CMOS
Complementary Metal Oxide Semiconductor
µA
microampere
I/O
Input/Output
mA
milliampere
OE
Output Enable
mV
millivolt
SRAM
Static Random Access Memory
mW
milliwatt
TSOP
Thin Small Outline Package
ns
nanosecond
WE
Write Enable
pF
picofarad
V
volt
W
watt
Document Number: 001-06496 Rev. *L
Symbol
Unit of Measure
Page 13 of 16
CY7C1041BN
Document History Page
Document Title: CY7C1041BN, 256K × 16 Static RAM
Document Number: 001-06496
Revision
ECN
Orig. of
Change
Submission
Date
**
424111
NXR
02/02/2006
New data sheet.
*A
498575
NXR
08/31/2006
Added Automotive-A Temperature Range related information in all instances
across the document.
Updated Ordering Information:
Updated part numbers.
*B
2897061
AJU
03/22/2010
Updated Ordering Information:
Updated part numbers.
Updated Package Diagram:
spec 51-85082 – Changed revision from *B to *C.
spec 51-85087 – Changed revision from *A to *C.
*C
2906679
NXR
04/07/2010
Updated Ordering Information:
Updated part numbers.
*D
3086674
PRAS
11/15/2010
Updated Ordering Information:
Updated part numbers.
Added Ordering Code Definitions.
Updated Package Diagram:
Removed spec 51-85082 *C.
Added Acronyms.
Updated to new template.
*E
3232637
PRAS
04/20/2011
Updated Electrical Characteristics:
Changed unit for IIX and IOZ parameters from mA to µA.
Added Units of Measure.
Updated to new template.
*F
3383869
TAVA
09/26/2011
Removed Industrial Temperature Range related information in all instances
across the document.
Replaced “Commercial-L” with “Commercial” in all instances across the
document.
Rearranged sections for better clarity.
Updated Switching Waveforms:
Modified the notes in figures under Read cycle and Write cycle sections.
Updated Package Diagram:
spec 51-85087 – Changed revision from *C to *D.
Completing Sunset Review.
*G
4113666
VINI
09/04/2013
Updated Package Diagram:
spec 51-85087 – Changed revision from *D to *E.
Updated to new template.
Completing Sunset Review.
*H
4545523
VINI
10/20/2014
Updated Features:
Removed “1540 mW (max.)” under “Low active power”.
Updated Truth Table:
Added a row in the last (to show what happens when both BLE and BHE are
high).
Completing Sunset Review.
*I
4576406
VINI
01/16/2015
Updated Functional Description:
Added “For a complete list of related documentation, click here.” at the end.
Updated Switching Waveforms:
Added Note 20 and referred the same note in Figure 8.
Document Number: 001-06496 Rev. *L
Description of Change
Page 14 of 16
CY7C1041BN
Document History Page (continued)
Document Title: CY7C1041BN, 256K × 16 Static RAM
Document Number: 001-06496
Revision
ECN
Orig. of
Change
Submission
Date
*J
5508709
VINI
11/03/2016
*K
5977242
AESATMP8
11/27/2017
Updated Cypress Logo and Copyright.
*L
6544621
VINI
04/15/2019
Updated to new template.
Document Number: 001-06496 Rev. *L
Description of Change
Updated Ordering Information:
Updated part numbers.
Updated to new template.
Completing Sunset Review.
Page 15 of 16
CY7C1041BN
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
PSoC® Solutions
Products
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cypress.com/arm
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cypress.com/clocks
cypress.com/interface
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cypress.com/iot
cypress.com/memory
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cypress.com/mcu
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Cypress Developer Community
Community | Projects | Video | Blogs | Training | Components
Technical Support
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circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is the
responsibility of the user of this document to properly design, program, and test the functionality and safety of any application made of this information and any resulting product. “High-Risk Device”
means any device or system whose failure could cause personal injury, death, or property damage. Examples of High-Risk Devices are weapons, nuclear installations, surgical implants, and other
medical devices. “Critical Component” means any component of a High-Risk Device whose failure to perform can be reasonably expected to cause, directly or indirectly, the failure of the High-Risk
Device, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim, damage, or other liability arising from any use of
a Cypress product as a Critical Component in a High-Risk Device. You shall indemnify and hold Cypress, its directors, officers, employees, agents, affiliates, distributors, and assigns harmless from
and against all claims, costs, damages, and expenses, arising out of any claim, including claims for product liability, personal injury or death, or property damage arising from any use of a Cypress
product as a Critical Component in a High-Risk Device. Cypress products are not intended or authorized for use as a Critical Component in any High-Risk Device except to the limited extent that (i)
Cypress’s published data sheet for the product explicitly states Cypress has qualified the product for use in a specific High-Risk Device, or (ii) Cypress has given you advance written authorization to
use the product as a Critical Component in the specific High-Risk Device and you have signed a separate indemnification agreement.
Cypress, the Cypress logo, Spansion, the Spansion logo, and combinations thereof, WICED, PSoC, CapSense, EZ-USB, F-RAM, and Traveo are trademarks or registered trademarks of Cypress in
the United States and other countries. For a more complete list of Cypress trademarks, visit cypress.com. Other names and brands may be claimed as property of their respective owners.
Document Number: 001-06496 Rev. *L
Revised April 15, 2019
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