BSL802SNL6327HTSA1

BSL802SN OptiMOS™2 Small-Signal-Transistor Product Summary Features VDS • N-channel RDS(on),max • Enhancement mode • Ultra Logic level (1.8V rated) 20 V VGS=2.5 V 22 mW VGS=1.8 V 31 ID 7.5 A • Avalanche rated • Qualified according to AEC Q101 PG-TSOP6 • 100% lead-free; RoHS compliant 6 • Halogen free according to IEC61249-2-21 5 4 1 2 3 Type Package Tape and Reel Information Marking Lead Free Packing BSL802SN PG-TSOP6 H6327: 3000 pcs/ reel sPP Yes Non dry Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value T A=25 °C 7.5 T A=70 °C 6.0 Unit A Pulsed drain current I D,pulse T A=25 °C 30 Avalanche energy, single pulse E AS I D=7.5 A, R GS=25 W 30 mJ Reverse diode dv /dt dv /dt I D=7.5 A, V DS=16 V, di /dt =200 A/µs, T j,max=150 °C 6 kV/µs Gate source voltage V GS ±8 V Power dissipation 1) P tot 2 W Operating and storage temperature T j, T stg -55 ... 150 °C ESD Class T A=25 °C JESD22-A114 -HBM Soldering Temperature 260 °C IEC climatic category; DIN IEC 68-1 Rev 2.3 0 (2|I D|R DS(on)max, I D=6 A S 1) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (single layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. (t < 5 sec.) Rev 2.3 page 2 2013-11-07 BSL802SN Parameter Values Symbol Conditions Unit min. typ. max. - 1013 1347 - 290 385 Dynamic characteristics Input capacitance C iss Output capacitance C oss Reverse transfer capacitance Crss - 51 77 Turn-on delay time t d(on) - 10 - Rise time tr - 30 - Turn-off delay time t d(off) - 20 - Fall time tf - 5.5 - Gate to source charge Q gs - 1.6 - Gate to drain charge Q gd - 1.6 - Gate charge total Qg - 4.7 - Gate plateau voltage V plateau - 1.5 - V - - 1.8 A - - 30 - 0.86 1.1 V - 15 - ns - 5.1 - nC V GS=0 V, V DS=10 V, f =1 MHz V DD=10 V, V GS=2.5 V, I D=3.7 A, R G,ext=6 W pF ns Gate Charge Characteristics V DD=10 V, I D=7.5 A, V GS=0 to 2.5 V nC Reverse Diode Diode continous forward current IS Diode pulse current I S,pulse Diode forward voltage V SD Reverse recovery time t rr Reverse recovery charge Q rr Rev 2.3 T A=25 °C V GS=0 V, I F=7.5 A, T j=25 °C V R=10 V, I F=7.5 A, di F/dt =100 A/µs page 3 2013-11-07 BSL802SN 1 Power dissipation 2 Drain current P tot=f(T A) I D=f(T A); V GS≥2.5 V 8 2 7 6 1.6 1.2 ID [A] Ptot [W] 5 4 3 0.8 2 0.4 1 0 0 0 40 80 120 160 0 40 80 TA [°C] 120 160 TA [°C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T A=25 °C; D =0 Z thJA=f(t p) parameter: t p parameter: D =t p/T 102 102 limited by on-state resistance 10 µs 0.5 100 µs 101 1 ms 0.2 101 0.1 10 ms ZthJA [K/W] ID [A] 100 5s 10-1 0.05 0.02 100 0.01 10-2 single pulse 10-3 10-1 10-2 10-1 100 101 102 VDS [V] Rev 2.3 10-5 10-4 10-3 10-2 10-1 100 101 tp [s] page 4 2013-11-07 BSL802SN 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 °C R DS(on)=f(I D); T j=25 °C parameter: V GS parameter: V GS 80 8 1.2 V 1.8 V 2.5 V 70 1.6 V 1.3 V 6 1.4 V 60 1.5 V 1.5 V RDS(on) [mW] ID [A] 50 4 1.4 V 40 1.6 V 30 1.8 V 1.3 V 2 20 1.2 V 2.5 V 10 1.1 V 0 0 0 0 0.2 0.4 0.6 0.8 0 1 2 4 VDS [V] 6 8 ID [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 °C 8 30 7 25 6 20 gfs [S] ID [A] 5 4 3 150 °C 15 25 °C 10 2 5 1 0 0 0 1 2 VGS [V] Rev 2.3 0 1 2 3 4 5 6 7 8 ID [A] page 5 2013-11-07 BSL802SN 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=7.5 A; V GS=2.5 V V GS(th)=f(T j); V DS=VGS; I D=30 µA parameter: I D 40 1.2 30 0.8 98 % VGS(th) [V] RDS(on) [mW] 98 % 20 typ 10 typ 0.4 2% 0 0 -0.4 -60 -20 20 60 100 140 180 -60 -20 20 Tj [°C] 60 100 140 180 Tj [°C] 11 Typ. capacitances 12 Forward characteristics of reverse diode C =f(V DS); V GS=0 V; f =1 MHz; Tj=25°C I F=f(V SD) parameter: T j 104 101 25 °C 100 Ciss 103 IF [A] C [pF] 150 °C, 98% Coss 10-1 150 °C 102 25 °C, 98% Crss 10-2 101 10-3 0 5 10 15 20 VDS [V] Rev 2.3 0 0.2 0.4 0.6 0.8 1 1.2 VSD [V] page 6 2013-11-07 BSL802SN 13 Avalanche characteristics 14 Typ. gate charge I AS=f(t AV); R GS=25 W V GS=f(Q gate); I D=7.5 A pulsed parameter: T j(start) parameter: V DD 101 5 4.5 25 °C 100 °C 4 125 °C 3.5 10 V VGS [V] IAV [A] 3 100 16 V 2.5 4V 2 1.5 1 0.5 10-1 0 100 101 102 0 103 1 2 tAV [µs] 3 4 5 6 7 8 9 10 Qgate [nC] 15 Drain-source breakdown voltage 16 Gate charge waveforms V BR(DSS)=f(T j); I D=250 µA 25 V GS 24 Qg 23 VBR(DSS) [V] 22 21 20 V gs(th) 19 18 Q g(th) 17 Q sw Q gs 16 -60 -20 20 60 100 Q gate Q gd 140 Tj [°C] Rev 2.3 page 7 2013-11-07 BSL802SN TSOP6 Package Outline: Footprint: Packaging: Dimensions in mm Rev 2.3 page 8 2013-11-07 BSL802SN Published by Infineon Technologies AG 81726 Munich, Germany © 2008 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev 2.3 page 9 2013-11-07