IAUC70N08S5N074ATMA1 数据手册
IAUC70N08S5N074
OptiMOS™-5 Power-Transistor
Product Summary
VDS
80
V
RDS(on)
7.4
mW
ID
70
A
Features
• N-channel - Enhancement mode
PG-TDSON-8
• AEC Q101 qualified
• MSL1 up to 260°C peak reflow
• 175°C operating temperature
• Green product (RoHS compliant)
1
• 100% Avalanche tested
1
Type
Package
Marking
IAUC70N08S5N074
PG-TDSON-8
5N08074
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter
Symbol
Continuous drain current
ID
Conditions
T C=25°C, V GS=10V
T C=100 °C,
Value
70
V GS=10 V1)
47
Unit
A
Pulsed drain current1)
I D,pulse
T C=25 °C
280
Avalanche energy, single pulse1)
E AS
I D=35 A
57
mJ
Avalanche current, single pulse
I AS
-
70
A
Gate source voltage
V GS
-
±20
V
Power dissipation
P tot
T C=25 °C
83
W
Operating and storage temperature
T j, T stg
-
-55 ... +175
°C
IEC climatic category; DIN IEC 68-1
-
-
55/175/56
Rev. 1.0
page 1
2018-07-24
IAUC70N08S5N074
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
-
-
1.8
Thermal characteristics1)
Thermal resistance, junction - case
R thJC
-
K/W
Electrical characteristics, at T j=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage
V (BR)DSS
V GS=0 V,
I D=1 mA
80
-
-
Gate threshold voltage
V GS(th)
V DS=V GS, I D=36 µA
2.2
3
3.8
Zero gate voltage drain current
I DSS
V DS=80 V, V GS=0 V,
T j=25 °C
-
0.1
1
T j=85 °C1)
-
1
20
V DS=80 V, V GS=0 V,
V
µA
Gate-source leakage current
I GSS
V GS=20 V, V DS=0 V
-
-
100
nA
Drain-source on-state resistance
R DS(on)
V GS=6 V, I D=18 A
-
9.1
10.6
mΩ
V GS=10 V, I D=35 A
-
6.6
7.4
-
1.2
-
Gate resistance1)
RG
W
IAUC70N08S5N074
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
-
1600
2080
-
274
356
Dynamic characteristics1)
Input capacitance
C iss
Output capacitance
C oss
Reverse transfer capacitance
Crss
-
14
22
Turn-on delay time
t d(on)
-
4.7
-
Rise time
tr
-
1.2
-
Turn-off delay time
t d(off)
-
7
-
Fall time
tf
-
5.8
-
Gate to source charge
Q gs
-
8.0
10.0
Gate to drain charge
Q gd
-
5.2
8.0
Gate charge total
Qg
-
23.0
30.0
Gate plateau voltage
V plateau
-
4.9
-
V
-
-
70
A
-
-
280
-
0.9
1.2
V
-
40
-
ns
-
60
-
nC
V GS=0 V, V DS=40 V,
f =1 MHz
V DD=40 V, V GS=10 V,
I D=70 A, R G=3.5 W
pF
ns
Gate Charge Characteristics1)
V DD=40 V, I D=35 A,
V GS=0 to 10 V
nC
Reverse Diode
Diode continous forward current1)
IS
Diode pulse current1)
I S,pulse
Diode forward voltage
V SD
Reverse recovery time1)
t rr
Reverse recovery charge1)
Q rr
1)
T C=25 °C
V GS=0 V, I F=35 A,
T j=25 °C
V R=40 V, I F=50 A,
di F/dt =100 A/µs
Defined by design. Not subject to production test.
Rev. 1.0
page 3
2018-07-24
IAUC70N08S5N074
1 Power dissipation
2 Drain current
P tot = f(T C); V GS ≥ 6 V
I D = f(T C); V GS ≥ 6 V
100
80
80
60
ID [A]
Ptot [W]
60
40
40
20
20
0
0
0
50
100
150
200
0
50
TC [°C]
100
TC [°C]
3 Safe operating area
4 Max. transient thermal impedance
I D = f(V DS); T C = 25 °C; D = 0
Z thJC = f(t p)
parameter: t p
parameter: D =t p/T
1000
101
1 µs
10 µs
100
100
0.5
ZthJC [K/W]
100 µs
ID [A]
150 µs
0.1
0.05
10
10-1
0.01
single pulse
1
10-2
0.1
1
10
VDS [V]
100
tp [s]
150
200
IAUC70N08S5N074
5 Typ. output characteristics
6 Typ. drain-source on-state resistance
I D = f(V DS); T j = 25 °C
R DS(on) = (I D); T j = 25 °C
parameter: V GS
parameter: V GS
24
280
4.5 V
5V
5.5 V
22
245
20
210
18
10 V
RDS(on) [mW]
175
ID [A]
6.5 V
140
16
14
6V
105
12
70
5.5 V
35
5V
6V
10
6.5 V
8
4.5 V
10 V
6
0
0
1
2
3
4
5
6
0
7
20
40
60
ID [A]
VDS [V]
7 Typ. transfer characteristics
8 Typ. drain-source on-state resistance
I D = f(V GS); V DS = 6V
R DS(on) = f(T j)
parameter: T j
parameter: V GS; I D
280
18
25 °C
16
-55 °C
210
14
RDS(on) [mW]
ID [A]
175 °C
140
12
VGS=6 V,
ID=18 A
10
VGS=10 V,
ID=35 A
8
70
6
4
0
2
4
6
8
-20
20
60
100
140
180
Tj [°C]
VGS [V]
Rev. 1.0
-60
page 5
2018-07-24
IAUC70N08S5N074
9 Typ. gate threshold voltage
10 Typ. capacitances
V GS(th) = f(T j); V GS = V DS
C = f(V DS); V GS = 0 V; f = 1 MHz
parameter: I D
104
4
3.5
Ciss
360 µA
103
C [pF]
VGS(th) [V]
3
36 µA
2.5
Coss
102
2
1.5
Crss
101
1
-60
-20
20
60
100
140
0
180
20
40
60
80
VDS [V]
Tj [°C]
11 Typical forward diode characteristicis
12 Typ. avalanche characteristics
IF = f(VSD)
I AS = f(t AV)
parameter: T j
parameter: Tj(start)
100
103
25 °C
102
IF [A]
IAV [A]
100 °C
150 °C
10
175 °C 25 °C
101
1
100
0
0.2
0.4
0.6
0.8
VSD [V]
1
1.2
1.4
1
10
100
tAV [µs]
1000
IAUC70N08S5N074
13 Typical avalanche energy
14 Drain-source breakdown voltage
E AS = f(T j)
V BR(DSS) = f(T j); I D_typ = 1 mA
parameter: I D
87
120
86
100
85
18 A
84
83
VBR(DSS) [V]
EAS [mJ]
80
60
82
81
80
35 A
40
79
70 A
78
20
77
76
0
25
75
125
-60
175
-20
20
Tj [°C]
60
100
140
180
Tj [°C]
15 Typ. gate charge
16 Gate charge waveforms
V GS = f(Q gate); I D = 35 A pulsed
parameter: V DD
10
16 V
9
V GS
40 V
8
Qg
64 V
7
VGS [V]
6
5
4
3
2
Q gate
1
Q gs
Q gd
0
0
5
10
15
20
25
Qgate [nC]
Rev. 1.0
page 7
2018-07-24
IAUC70N08S5N074
Published by
Infineon Technologies AG
81726 Munich, Germany
© Infineon Technologies AG 2018
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions
or characteristics. With respect to any examples or hints given herein, any typical values stated
herein and/or any information regarding the application of the device, Infineon Technologies hereby
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties
of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact
the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances.
For information on the types in question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the
express written approval of Infineon Technologies, if a failure of such components can reasonably be
expected to cause the failure of that life-support device or system or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted
in the human body or to support and/or maintain and sustain and/or protect human life.
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
IAUC70N08S5N074
Revision History
Version
Date
Changes
Version 1.0
24.07.2018
Final Data Sheet
Rev. 1.0
page 9
2018-07-24
IAUC70N08S5N074ATMA1 价格&库存
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