IPC045N10L3X1SA1

MOSFET MetalOxideSemiconductorFieldEffectTransistor BareDie OptiMOS™3PowerMOSTransistorChip IPC045N10L3 DataSheet Rev.2.5 Final Industrial&Multimarket OptiMOS™3PowerMOSTransistorChip IPC045N10L3 1Description PowerMOSTransistorChip •N-channelenhancementmode •FordynamiccharacterizationrefertothedatasheetofBSZ150N10LS3G •AQL0.65forvisualinspectionaccordingtofailurecatalogue •ElectrostaticDischargeSensitiveDeviceaccordingtoMIL-STD883C •Diebond:solderedorglued •Backsidemetallization:NiVsystem •Frontsidemetallization:AlCusystem •Passivation:nitride(onlyonedgestructure) Table1KeyPerformanceParameters Parameter Value Unit V(BR)DSS 100 V RDS(on) 151) mΩ Die size 2.5 x 1.8 mm2 Thickness 220 µm Type/OrderingCode Package IPC045N10L3 Chip Drain Gate Source Marking RelatedLinks not defined - 2ElectricalCharacteristicsonWaferLevel atTj=25°C,unlessotherwisespecified Table2 Parameter Symbol Drain-source breakdown voltage Values Unit Note/TestCondition - V VGS=0V,ID=1mA 1.7 2.1 V VDS=VGS,ID=33µA - 0.01 1 µA VGS=0V,VDS=100V - 1 100 nA VGS=20V,VDS=0V 100 mΩ VGS=4.5V,ID=2.0A 1.2 V VGS=0V,IF=1A - mJ ID =20 A, RGS =25 Ω Min. Typ. Max. V(BR)DSS 100 - Gate threshold voltage VGS(th) 1.1 Zero gate voltage drain current IDSS Gate-source leakage current IGSS Drain-source on- resistance RDS(on) - 16 Reverse diode forward on-voltage VSD - 0.9 Avalanche energy, single pulse EAS 2) 4) - 80 3) 1) packaged in a PG-TDSON-8 (see ref. product). Maximum RDS(on) at VGS=10V typicalbaredieRDS(on);VGS=4.5V 3) limited by wafer test-equipment 4) Wafer tested. For general avalanche capability refer to the datasheet of BSZ150N10LS3 G 2) Final Data Sheet 2 Rev.2.5,2014-07-09 OptiMOS™3PowerMOSTransistorChip IPC045N10L3 3PackageOutlines Figure1OutlineChip,dimensionsinµm Final Data Sheet 3 Rev.2.5,2014-07-09 OptiMOS™3PowerMOSTransistorChip IPC045N10L3 RevisionHistory IPC045N10L3 Revision:2014-07-09,Rev.2.5 Previous Revision Revision Date Subjects (major changes since last revision) 2.5 2014-07-09 Release Final Version WeListentoYourComments Anyinformationwithinthisdocumentthatyoufeeliswrong,unclearormissingatall?Yourfeedbackwillhelpustocontinuously improvethequalityofthisdocument.Pleasesendyourproposal(includingareferencetothisdocument)to: erratum@infineon.com Publishedby InfineonTechnologiesAG 81726München,Germany ©2014InfineonTechnologiesAG AllRightsReserved. LegalDisclaimer Theinformationgiveninthisdocumentshallinnoeventberegardedasaguaranteeofconditionsorcharacteristics.With respecttoanyexamplesorhintsgivenherein,anytypicalvaluesstatedhereinand/oranyinformationregardingtheapplication ofthedevice,InfineonTechnologiesherebydisclaimsanyandallwarrantiesandliabilitiesofanykind,includingwithout limitation,warrantiesofnon-infringementofintellectualpropertyrightsofanythirdparty. Information Forfurtherinformationontechnology,deliverytermsandconditionsandpricespleasecontactyournearestInfineon TechnologiesOffice(www.infineon.com). Warnings Duetotechnicalrequirements,componentsmaycontaindangeroussubstances.Forinformationonthetypesinquestion, pleasecontactthenearestInfineonTechnologiesOffice. TheInfineonTechnologiescomponentdescribedinthisDataSheetmaybeusedinlife-supportdevicesorsystemsand/or automotive,aviationandaerospaceapplicationsorsystemsonlywiththeexpresswrittenapprovalofInfineonTechnologies,ifa failureofsuchcomponentscanreasonablybeexpectedtocausethefailureofthatlife-support,automotive,aviationand aerospacedeviceorsystemortoaffectthesafetyoreffectivenessofthatdeviceorsystem.Lifesupportdevicesorsystemsare intendedtobeimplantedinthehumanbodyortosupportand/ormaintainandsustainand/orprotecthumanlife.Iftheyfail,itis reasonabletoassumethatthehealthoftheuserorotherpersonsmaybeendangered. Final Data Sheet 4 Rev.2.5,2014-07-09