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74ABT823DB

74ABT823DB

  • 厂商:

    NXP(恩智浦)

  • 封装:

  • 描述:

    74ABT823DB - 9-bit D-type flip-flop with reset and enable; 3-state - NXP Semiconductors

  • 数据手册
  • 价格&库存
74ABT823DB 数据手册
74ABT823 9-bit D-type flip-flop with reset and enable; 3-state Rev. 03 — 23 March 2010 Product data sheet 1. General description The 74ABT823 high-performance BiCMOS device combines low static and dynamic power dissipation with high speed and high output drive. The 74ABT823 is a 9-bit wide buffered register with clock enable input (CE) and master reset input (MR) which are ideal for parity bus interfacing in systems using many microprocessors. The 74ABT823 is designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider data and address paths of buses carrying parity. The register is fully edge-triggered. The state of each D input, one set-up time before the LOW-to-HIGH clock transition, is transferred to the corresponding output Q of the flip-flop. 2. Features and benefits High-speed parallel registers with positive edge-triggered D-type flip-flops Ideal where high speed, light loading, or increased fan-in are required with MOS microprocessors Output capability: +64 mA and −32 mA Power-on 3-state Power-on reset Latch-up protection exceeds 500 mA per JESD78B class II level A ESD protection: HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V 3. Ordering information Table 1. Ordering information Package Temperature range Name 74ABT823D 74ABT823DB 74ABT823PW −40 °C to +85 °C −40 °C to +85 °C −40 °C to +85 °C SO24 SSOP24 TSSOP24 Description plastic small outline package; 24 leads; body width 7.5 mm plastic shrink small outline package; 24 leads; body width 5.3 mm plastic thin shrink small outline package; 24 leads; body width 4.4 mm Version SOT137-1 SOT340-1 SOT355-1 Type number NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 4. Functional diagram 1 11 2 3 4 5 6 7 8 9 10 MR D0 D1 D2 D3 D4 D5 D6 D7 D8 CP 13 1 OE Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 CE 14 001aaa847 EN R G1 1C2 23 22 21 20 19 18 17 16 15 001aaa848 11 14 23 22 21 20 19 18 17 16 15 7 8 9 10 3 4 5 6 2 13 2D Fig 1. Logic symbol Fig 2. IEC logic symbol 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 2 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state D0 D1 D2 D3 D4 MR R R R R R CE D Q D Q D Q D Q D Q CP FF0 CP FF1 CP FF2 CP FF3 CP FF4 CP OE Q0 D5 D6 Q1 D7 Q2 D8 Q3 Q4 D R Q D R Q D R Q D R Q CP FF5 CP FF6 CP FF7 CP FF8 Q5 Q6 Q7 Q8 001aac444 Fig 3. Logic diagram 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 3 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 5. Pinning information 5.1 Pinning 74ABT823 OE D0 D1 D2 D3 D4 D5 D6 D7 1 2 3 4 5 6 7 8 9 24 VCC 23 Q0 22 Q1 21 Q2 20 Q3 19 Q4 18 Q5 17 Q6 16 Q7 15 Q8 14 CE 13 CP 001aal300 D8 10 MR 11 GND 12 Fig 4. Pin configuration 5.2 Pin description Table 2. Symbol OE D0, D1, D2, D3, D4, D5, D6, D7, D8 MR GND CP CE VCC Pin description Pin 1 2, 3, 4, 5, 6, 7, 8, 9, 10 11 12 13 14 24 Description output enable input (active LOW) data input master reset input (active LOW) ground (0 V) clock pulse input (active rising edge) clock enable input (active LOW) data output positive supply voltage Q8, Q7, Q6, Q5, Q4, Q3, Q3, Q2, Q1, Q0 15, 16, 17, 18, 19, 20, 21, 22, 23 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 4 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 6. Functional description 6.1 Function table Table 3. Input OE L L L L H [1] Function table[1] Output MR L H H H X CE X L L H X CP X ↑ ↑ NC X Dn X h l X X Qn L H L NC Z hold high-impedance clear load and read data Operating mode H = HIGH voltage level; L = LOW voltage level; h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition; I = LOW voltage level one set-up time prior to the LOW-to-HIGH clock transition; ↑ = LOW-to-HIGH clock transition; NC = no change; X = don’t care; Z = high-impedance OFF-state. 7. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol VCC VI VO IIK IOK IO Tj Tstg [1] [2] Parameter supply voltage input voltage output voltage input clamping current output clamping current output current junction temperature storage temperature Conditions [1] Min −0.5 −1.2 −0.5 −18 −50 [2] Max +7.0 +7.0 +5.5 128 150 +150 Unit V V V mA mA mA °C °C output in OFF-state or HIGH-state VI < 0 V VO < 0 V output in LOW-state [1] −65 The input and output voltage ratings may be exceeded if the input and output current ratings are observed. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C. 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 5 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 8. Recommended operating conditions Table 5. Operating conditions Voltages are referenced to GND (ground = 0 V). Symbol VCC VI VIH VIL IOH IOL Δt/ΔV Tamb Parameter supply voltage input voltage HIGH-level input voltage LOW-level Input voltage HIGH-level output current LOW-level output current input transition rise and fall rate ambient temperature in free air Conditions Min 4.5 0 2.0 −32 0 −40 Typ Max 5.5 VCC 0.8 64 5 +85 Unit V V V V mA mA ns/V °C 9. Static characteristics Table 6. Symbol VIK VOH Static characteristics Parameter Conditions Min input clamping voltage VCC = 4.5 V; IIK = −18 mA HIGH-level output voltage VI = VIL or VIH VCC = 4.5 V; IOH = −3 mA VCC = 5.0 V; IOH = −3 mA VCC = 4.5 V; IOH = −32 mA VOL VOL(pu) II IOFF IO(pu/pd) IOZ LOW-level output voltage power-up LOW-level output voltage input leakage current power-off leakage current VCC = 4.5 V; IOL = 64 mA; VI = VIL or VIH VCC = 5.5 V; IO = 1 mA; VI = GND or VCC VCC = 5.5 V; VI = VCC or GND VCC = 0 V; VI or VO ≤ 4.5 V [2] [1] 25 °C Typ −0.9 2.9 3.4 2.4 0.42 0.13 Max 0.55 0.55 −1.2 2.5 3.0 2.0 - −40 °C to +85 °C Unit Min −1.2 2.5 3.0 2.0 Max 0.55 0.55 ±1.0 ±100 ±50 V V V V V V μA μA μA ±0.01 ±1.0 ±5.0 ±5.0 ±100 ±50 power-up/power-down VCC = 2.0 V; VO = 0.5 V; output current VI = GND or VCC; OE HIGH OFF-state output current VCC = 5.5 V; VI = VIL or VIH VO = 2.7 V VO = 0.5 V [3] 5.0 −5.0 5.0 −50 0.5 27 0.5 50 −50 50 −50 250 34 250 −180 - 50 −50 50 −50 250 34 250 μA μA μA mA μA mA μA ILO IO ICC output leakage current HIGH-state; VO = 5.5 V; VCC = 5.5 V; VI = GND or VCC output current supply current VCC = 5.5 V; VO = 2.5 V VCC = 5.5 V; VI = GND or VCC outputs HIGH-state outputs LOW-state outputs disabled −180 - 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 6 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state Table 6. Symbol ΔICC Static characteristics …continued Parameter additional supply current input capacitance output capacitance Conditions Min per input pin; VCC = 5.5 V; one input at 3.4 V; other inputs at VCC or GND VI = 0 V or VCC outputs disabled; VO = 0 V or VCC [4] 25 °C Typ 0.5 Max 1.5 - −40 °C to +85 °C Unit Min Max 1.5 mA CI CO [1] [2] [3] [4] - 4 7 - - - pF pF For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power. This parameter is valid for any VCC between 0 V and 2.1 V, with a transition time of up to 10 ms. From VCC = 2.1 V to VCC = 5 V ± 10 % a transition time of up to 100 μs is permitted. Not more than one output should be tested at a time, and the duration of the test should not exceed one second. This is the increase in supply current for each input at 3.4 V. 10. Dynamic characteristics Table 7. Dynamic characteristics GND = 0 V; for test circuit, see Figure 9. Symbol Parameter Conditions 25 °C; VCC = 5.0 V Min fmax tPLH tPHL tPZH tPZL tPHZ tPLZ tsu(H) tsu(L) th(H) th(L) tWH maximum frequency LOW to HIGH propagation delay HIGH to LOW propagation delay OFF-state to HIGH propagation delay OFF-state to LOW propagation delay HIGH to OFF-state propagation delay LOW to OFF-state propagation delay set-up time HIGH set-up time LOW hold time HIGH hold time LOW pulse width HIGH see Figure 5 CP to Qn, see Figure 5 CP to Qn, see Figure 5 MR to Qn, see Figure 6 OE to Qn; see Figure 8 OE to Qn; see Figure 8 OE to Qn; see Figure 8 OE to Qn; see Figure 8 Dn to CP; see Figure 7 CE to CP; see Figure 7 Dn to CP; see Figure 7 CE to CP; see Figure 7 CP to Dn; see Figure 7 CP to CE; see Figure 7 CP to Dn; see Figure 7 CP to CE; see Figure 7 CP; see Figure 5 125 2.1 2.2 2.0 1.0 2.2 2.7 2.5 2.1 +2.0 2.1 3.3 1.3 +1.0 +1.3 2.0 2.9 Typ 200 4.3 4.4 4.1 3.0 4.1 4.8 5.0 0.5 −0.5 0.2 1.5 0.0 −1.4 −0.3 0.7 1.9 Max 5.9 6.1 6.3 4.5 5.6 6.2 6.4 −40 °C to +85 °C; Unit VCC = 5.0 V ± 0.5 V Min 125 2.1 2.2 2.0 1.0 2.2 2.7 2.5 2.1 +2.0 2.1 3.3 1.3 +1.0 +1.3 2.0 2.9 Max 6.8 6.7 7.1 5.3 6.3 6.9 6.9 MHz ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 7 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state Table 7. Dynamic characteristics …continued GND = 0 V; for test circuit, see Figure 9. Symbol Parameter Conditions 25 °C; VCC = 5.0 V Min tWL trec pulse width LOW recovery time CP; see Figure 5 MR; see Figure 6 MR to CP; see Figure 6 3.8 5.5 2.5 Typ 2.8 4.0 0.6 Max −40 °C to +85 °C; Unit VCC = 5.0 V ± 0.5 V Min 3.8 5.5 2.5 Max ns ns ns 11. Waveforms 1 / fmax VI CP input GND tWH tPHL VOH Qn output VOL VM 001aac445 VM tWL tPLH VM = 1.5 V VOL and VOH are typical voltage output levels that occur with the output load. Fig 5. Propagation delay clock input (CP) to output (Qn), clock pulse (CP) width and maximum clock (CP) frequency VI MR input GND t WL VI CP input GND t PHL VOH Qn output VOL 001aac446 VM t rec VM VM VM = 1.5 V VOL and VOH are typical voltage output levels that occur with the output load. Fig 6. Master reset (MR) pulse width, propagation delay master reset (MR) to output (Qn) and recovery time master reset (MR) to clock (CP) 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 8 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state VI CP input GND t su(H) t h(H) VI Dn, CE input GND 001aac447 VM t su(L) t h(L) VM VM = 1.5 V The shaded areas indicate when the input is permitted to change for predictable output performance. Fig 7. Set-up and hold times data output (Dn) to clock (CP) and clock enable input (CE) to clock (CP) VI OE input GND tPZL 3.5 V Qn output VOL tPZH tPHZ VM tPLZ VM VOL + 0.3 V VOH Qn output GND 001aac448 VM VOH − 0.3 V VM = 1.5 V VOL and VOH are typical voltage output levels that occur with the output load Fig 8. 3-state output (Qn) enable and disable times 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 9 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state VI negative pulse 0V tW 90 % VM 10 % tf tr VM 10 % tr tf 90 % VM 10 % tW 001aai298 90 % VEXT VCC VI VO DUT RT CL RL RL G VI positive pulse 0V 90 % VM 10 % mna616 a. Input pulse definition Test data is given in Table 8. RL = Load resistance. CL = Load capacitance including jig and probe capacitance. b. Test circuit RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 9. Table 8. Input VI 3.0 V Load circuitry for switching times Test data Load fI 1 MHz tW 500 ns tr, tf ≤ 2.5 ns CL 50 pF RL 500 Ω VEXT tPHL, tPLH open tPZH, tPHZ open tPZL, tPLZ 7.0 V 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 10 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 12. Package outline SO24: plastic small outline package; 24 leads; body width 7.5 mm SOT137-1 D E A X c y HE vMA Z 24 13 Q A2 A1 pin 1 index Lp L 1 e bp 12 wM detail X (A 3) θ A 0 5 scale 10 mm DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. 2.65 0.1 A1 0.3 0.1 A2 2.45 2.25 A3 0.25 0.01 bp 0.49 0.36 c 0.32 0.23 D (1) 15.6 15.2 0.61 0.60 E (1) 7.6 7.4 0.30 0.29 e 1.27 0.05 HE 10.65 10.00 L 1.4 Lp 1.1 0.4 Q 1.1 1.0 0.043 0.039 v 0.25 0.01 w 0.25 0.01 y 0.1 Z (1) θ o 0.9 0.4 0.012 0.096 0.004 0.089 0.019 0.013 0.014 0.009 0.419 0.043 0.055 0.394 0.016 0.035 0.004 0.016 8 o 0 Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. OUTLINE VERSION SOT137-1 REFERENCES IEC 075E05 JEDEC MS-013 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 10. Package outline SOT137-1 (SO24) 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 11 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state SSOP24: plastic shrink small outline package; 24 leads; body width 5.3 mm SOT340-1 D E A X c y HE vMA Z 24 13 Q A2 pin 1 index A1 (A 3) θ Lp L A 1 12 detail X wM e bp 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm Note 1. Plastic or metal protrusions of 0.2 mm maximum per side are not included. OUTLINE VERSION SOT340-1 REFERENCES IEC JEDEC MO-150 JEITA EUROPEAN PROJECTION A max. 2 A1 0.21 0.05 A2 1.80 1.65 A3 0.25 bp 0.38 0.25 c 0.20 0.09 D (1) 8.4 8.0 E (1) 5.4 5.2 e 0.65 HE 7.9 7.6 L 1.25 Lp 1.03 0.63 Q 0.9 0.7 v 0.2 w 0.13 y 0.1 Z (1) 0.8 0.4 θ 8 o 0 o ISSUE DATE 99-12-27 03-02-19 Fig 11. Package outline SOT340-1 (SSOP24) 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 12 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state TSSOP24: plastic thin shrink small outline package; 24 leads; body width 4.4 mm SOT355-1 D E A X c y HE vMA Z 24 13 Q A2 pin 1 index A1 (A 3) A θ Lp L 1 e bp 12 wM detail X 0 2.5 scale 5 mm DIMENSIONS (mm are the original dimensions) UNIT mm A max. 1.1 A1 0.15 0.05 A2 0.95 0.80 A3 0.25 bp 0.30 0.19 c 0.2 0.1 D (1) 7.9 7.7 E (2) 4.5 4.3 e 0.65 HE 6.6 6.2 L 1 Lp 0.75 0.50 Q 0.4 0.3 v 0.2 w 0.13 y 0.1 Z (1) 0.5 0.2 θ 8o 0o Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. OUTLINE VERSION SOT355-1 REFERENCES IEC JEDEC MO-153 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-19 Fig 12. Package outline SOT355-1 (TSSOP24) 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 13 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 13. Abbreviations Table 9. Acronym BiCMOS DUT ESD HBM MM Abbreviations Description Bipolar Complementary Metal-Oxide Semiconductor Device Under Test ElectroStatic Discharge Human Body Model Machine Model 14. Revision history Table 10. Revision history Release date 20100323 Data sheet status Product data sheet Change notice Supersedes 74ABT823_2 Document ID 74ABT823_3 Modifications: • • • The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP Semiconductors. Legal texts have been adapted to the new company name where appropriate. DIP 24 (SOT222-1) package removed from Section 3 “Ordering information” and.Section 12 “Package outline” Product specification Product specification 74ABT823_1 74ABT823_2 74ABT823_1 20050207 19960314 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 14 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 15. Legal information 15.1 Data sheet status Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet [1] [2] [3] Product status[3] Development Qualification Production Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design. The term ‘short data sheet’ is explained in section “Definitions”. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 15.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on a weakness or default in the customer application/use or the application/use of customer’s third party customer(s) (hereinafter both referred to as “Application”). It is customer’s sole responsibility to check whether the NXP Semiconductors product is suitable and fit for the Application planned. Customer has to do all necessary testing for the Application in order to avoid a default of the Application and the product. NXP Semiconductors does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. 15.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use in automotive applications — This NXP Semiconductors product has been qualified for use in automotive applications. The product is not designed, authorized or warranted to be 74ABT823_3 15.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 15 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 16. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com 74ABT823_3 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 03 — 23 March 2010 16 of 17 NXP Semiconductors 74ABT823 9-bit D-type flip-flop with reset and enable; 3-state 17. Contents 1 2 3 4 5 5.1 5.2 6 6.1 7 8 9 10 11 12 13 14 15 15.1 15.2 15.3 15.4 16 17 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 1 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 Functional description . . . . . . . . . . . . . . . . . . . 5 Function table . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5 Recommended operating conditions. . . . . . . . 6 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 11 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 14 Legal information. . . . . . . . . . . . . . . . . . . . . . . 15 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 15 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Contact information. . . . . . . . . . . . . . . . . . . . . 16 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2010. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 23 March 2010 Document identifier: 74ABT823_3
74ABT823DB 价格&库存

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