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AFT18S260W31GSR3

AFT18S260W31GSR3

  • 厂商:

    NXP(恩智浦)

  • 封装:

    NI-780GS-2L2LA

  • 描述:

    IC TRANS RF LDMOS

  • 数据手册
  • 价格&库存
AFT18S260W31GSR3 数据手册
Freescale Semiconductor Technical Data Document Number: AFT18S260W31S Rev. 0, 4/2015 RF Power LDMOS Transistors N--Channel Enhancement--Mode Lateral MOSFETs These 50 W RF power LDMOS transistors are designed for cellular base station applications requiring very wide instantaneous bandwidth capability covering the frequency range of 1805 to 1995 MHz. AFT18S260W31SR3 AFT18S260W31GSR3 1800 MHz  Typical Single--Carrier W--CDMA Performance: VDD = 28 Vdc, IDQ = 1800 mA, Pout = 50 W Avg., Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) D (%) 1805 MHz 18.4 27.2 1840 MHz 19.3 1880 MHz 19.6 Output PAR (dB) ACPR (dBc) IRL (dB) 7.1 –35.2 –11 28.0 7.1 –35.0 –24 29.3 7.0 –34.0 –14 1900 MHz  Typical Single--Carrier W--CDMA Performance: VDD = 28 Vdc, IDQ = 1800 mA, Pout = 50 W Avg., Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) D (%) 1930 MHz 19.0 25.1 1960 MHz 19.3 1995 MHz 19.6 Output PAR (dB) ACPR (dBc) IRL (dB) 6.8 –34.2 –20 25.6 6.9 –34.5 –18 26.6 6.8 –33.9 –12 1805–1995 MHz, 50 W AVG., 28 V AIRFAST RF POWER LDMOS TRANSISTORS NI--780S--2L2LA AFT18S260W31SR3 NI--780GS--2L2LA AFT18S260W31GSR3 Features  Designed for Wide Instantaneous Bandwidth Applications  Greater Negative Gate--Source Voltage Range for Improved Class C Operation  Able to Withstand Extremely High Output VSWR and Broadband Operating Conditions  Optimized for Doherty Applications 4 VBW (1) RFin/VGS 1 3 RFout/VDS 2 VBW (1) (Top View) Figure 1. Pin Connections 1. Device can operate with the VDD current supplied through pin 2 or pin 4 alone.  Freescale Semiconductor, Inc., 2015. All rights reserved. RF Device Data Freescale Semiconductor, Inc. AFT18S260W31SR3 AFT18S260W31GSR3 1 Table 1. Maximum Ratings Symbol Value Unit Drain--Source Voltage Rating VDSS –0.5, +65 Vdc Gate--Source Voltage VGS –6.0, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg –65 to +150 C TC –40 to +125 C Case Operating Temperature Range Operating Junction Temperature Range (1,2) CW Operation @ TC = 25C Derate above 25C TJ –40 to +225 C CW 168 1.1 W W/C Symbol Value (2,3) Unit RJC 0.32 C/W Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 91C, 50 W CW, 28 Vdc, IDQ = 1800 mA, 1840 MHz Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2 Machine Model (per EIA/JESD22--A115) B Charge Device Model (per JESD22--C101) IV Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS = 32 Vdc, VGS = 0 Vdc) IDSS — — 5 Adc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 Adc Gate Threshold Voltage (VDS = 10 Vdc, ID = 360 Adc) VGS(th) 0.8 1.2 1.6 Vdc Gate Quiescent Voltage (VDD = 28 Vdc, ID = 1800 mAdc, Measured in Functional Test) VGS(Q) 1.4 1.8 2.2 Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 3.6 Adc) VDS(on) 0.1 0.15 0.3 Vdc Characteristic Off Characteristics On Characteristics Functional Tests (4,5) (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1800 mA, Pout = 50 W Avg., f = 1880 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Power Gain Gps 18.5 19.6 21.0 dB Drain Efficiency D 26.0 29.3 — % Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Input Return Loss 1. 2. 3. 4. 5. PAR 6.3 7.0 — dB ACPR — –34.0 –30.0 dBc IRL — –14 –6 dB Continuous use at maximum temperature will affect MTTF. MTTF calculator available at http://www.freescale.com/rf/calculators. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf and search for AN1955. Part internally matched both on input and output. Measurements made with device in straight lead configuration, before any lead forming operation is applied. Lead forming is used for gull wing (GS) parts. (continued) AFT18S260W31SR3 AFT18S260W31GSR3 2 RF Device Data Freescale Semiconductor, Inc. Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Load Mismatch (In Freescale Test Fixture, 50 ohm system) IDQ = 1800 mA, f = 1840 MHz VSWR 10:1 at 32 Vdc, 269 W CW (1) Output Power (3 dB Input Overdrive from 229 W CW (1) Rated Power) No Device Degradation Typical Performance (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1800 mA, 1805–1880 MHz Bandwidth P1dB — 229 (1) — W  — –13 —  VBWres — 85 — MHz Gain Flatness in 75 MHz Bandwidth @ Pout = 50 W Avg. GF — 1.2 — dB Gain Variation over Temperature (–30C to +85C) G — 0.001 — dB/C P1dB — 0.011 — dB/C Pout @ 1 dB Compression Point, CW AM/PM (Maximum value measured at the P3dB compression point across the 1805–1880 MHz frequency range.) VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) Output Power Variation over Temperature (–30C to +85C) (1) Table 5. Ordering Information Device AFT18S260W31SR3 AFT18S260W31GSR3 Tape and Reel Information Package R3 Suffix = 250 Units, 44 mm Tape Width, 13--inch Reel NI--780S--2L2LA NI--780GS--2L2LA 1. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table. AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 3 C14 C4 VDD VGG C5 C6* C7* C8* C9* VGG C12 C13 C20* C22* C26* C21* C23* C17* C25 R2 C10 C24 C16* CUT OUT AREA C2* C3* C1* C15 R1 C18 C11 VDD D61216 AFT18S260W31S Rev. 5 C19 *C1, C2, C3, C6, C7, C8, C9, C16, C17, C20, C21, C22, C23, and C26 are mounted vertically. Figure 2. AFT18S260W31SR3 Test Circuit Component Layout Table 6. AFT18S260W31SR3 Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C6, C7, C9, C10, C17, C18, C19, C20, C26 8.2 pF Chip Capacitors ATC100B8R2CT500XT ATC C2 1.0 pF Chip Capacitor ATC100B1R0BT500XT ATC C3 0.3 pF Chip Capacitor ATC100B0R3BT500XT ATC C4, C5, C11, C12, C13, C14, 10 F Chip Capacitors C15, C16, C21, C22 GRM32ER61H106KA12L Murata C8 0.5 pF Chip Capacitor ATC100B0R5BT500XT ATC C23 2.0 pF Chip Capacitor ATC100B2R0BT500XT ATC C24, C25 470 F, 63 V Electrolytic Capacitors MCGPR63V477M13X26-RH Multicomp R1, R2 2.37 , 1/4 W Chip Resistors CRCW12062R37FNEA Vishay PCB Rogers RO4350B, 0.020, r = 3.66 D61216 MTL AFT18S260W31SR3 AFT18S260W31GSR3 4 RF Device Data Freescale Semiconductor, Inc. TYPICAL CHARACTERISTICS — 1805–1880 MHz 19.5 29 Gps 28 27 PARC 18 17.5 –31 –5 –32 –10 ACPR (dBc) 19 18.5 –33 17 –34 ACPR 16.5 16 1760 –35 IRL 1780 1800 1820 1840 1860 f, FREQUENCY (MHz) 1880 –15 –20 –25 –36 1920 1900 –30 –2.6 –2.8 –3 –3.2 –3.4 PARC (dB) 20 30 D IRL, INPUT RETURN LOSS (dB) 20.5 Gps, POWER GAIN (dB) 31 VDD = 28 Vdc, Pout = 50 W (Avg.) IDQ = 1800 mA, Single--Carrier W--CDMA 3.84 MHz Channel Bandwidth Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF D, DRAIN EFFICIENCY (%) 21 –3.6 IMD, INTERMODULATION DISTORTION (dBc) Figure 3. Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 50 Watts Avg. –5 VDD = 28 Vdc, Pout = 72 W (PEP), IDQ = 1800 mA Two--Tone Measurements, (f1 + f2)/2 = Center –20 Frequency of 1840 MHz IM3--U IM3--L –35 IM5--L IM5--U –50 IM7--L –65 –80 1 IM7--U 10 300 100 TWO--TONE SPACING (MHz) Figure 4. Intermodulation Distortion Products versus Two--Tone Spacing 19.2 19 18.8 18.6 VDD = 28 Vdc, IDQ = 1800 mA, f = 1840 MHz Single--Carrier W--CDMA 0 35 –25 30 –30 D ACPR –1 25 –1 dB = 27 W –2 20 –3 dB = 52.8 W Gps –2 dB = 39 W –3 15 PARC 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF –4 –5 5 20 35 50 Pout, OUTPUT POWER (WATTS) 10 5 80 65 –35 –40 ACPR (dBc) 19.4 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) 19.6 1 D DRAIN EFFICIENCY (%) 19.8 –45 –50 –55 Figure 5. Output Peak--to--Average Ratio Compression (PARC) versus Output Power AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 5 TYPICAL CHARACTERISTICS — 1805–1880 MHz Gps, POWER GAIN (dB) 20 18 1840 MHz 1805 MHz 16 1880 MHz 1840 MHz 1805 MHz 1840 MHz 50 –20 30 20 10 12 Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF D 10 Gps 1805 MHz 1880 MHz ACPR –10 40 1880 MHz 14 60 1 10 100 Pout, OUTPUT POWER (WATTS) AVG. 0 300 –30 –40 –50 ACPR (dBc) VDD = 28 Vdc, IDQ = 1800 mA, Single--Carrier W--CDMA 3.84 MHz Channel Bandwidth D, DRAIN EFFICIENCY (%) 22 –60 –70 Figure 6. Single--Carrier W--CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 6 27 VDD = 28 Vdc Pin = 0 dBm IDQ = 1800 mA 24 0 –6 –12 18 Gain 15 –18 12 9 1500 IRL (dB) GAIN (dB) 21 –24 IRL 1600 1700 1800 1900 2000 f, FREQUENCY (MHz) 2100 2200 –30 2300 Figure 7. Broadband Frequency Response AFT18S260W31SR3 AFT18S260W31GSR3 6 RF Device Data Freescale Semiconductor, Inc. Table 7. Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, IDQ = 2110 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () 1805 0.90 – j2.84 0.93 + j2.68 1840 0.88 – j2.79 1.07 + j2.71 1880 1.12 – j2.86 1.35 + j2.80 Zload () (1) Gain (dB) (dBm) (W) D (%) AM/PM () 1.10 – j3.64 18.1 55.0 313 52.8 –10 1.06 – j3.72 18.1 54.9 307 51.2 –10 1.06 – j3.80 18.2 54.5 284 50.8 –10 Max Output Power P3dB f (MHz) Zsource () Zin () Zload (2) () Gain (dB) (dBm) (W) D (%) AM/PM () 1805 0.90 – j2.84 0.90 + j2.82 1.10 – j3.82 15.9 55.7 373 53.1 –15 1840 0.88 – j2.79 1.06 + j2.85 1.11 – j3.88 16.0 55.6 366 52.5 –16 1880 1.12 – j2.86 1.37 + j2.97 1.06 – j3.92 16.0 55.4 344 51.6 –15 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Table 8. Load Pull Performance — Maximum Drain Efficiency Tuning VDD = 28 Vdc, IDQ = 2110 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 1805 0.90 – j2.84 0.87 + j2.65 1.70 – j2.31 20.9 52.9 195 63.1 –17 1840 0.88 – j2.79 1.02 + j2.70 1.59 – j2.46 20.9 53.0 200 62.1 –17 1880 1.12 – j2.86 1.32 + j2.81 1.48 – j2.63 20.8 52.8 190 60.3 –16 Max Drain Efficiency P3dB Gain (dB) (dBm) (W) D (%) AM/PM () 1.55 – j2.50 18.5 54.0 251 64.1 –25 1.02 + j2.84 1.50 – j2.56 18.7 53.9 245 63.2 –25 1.34 + j2.97 1.47 – j2.79 18.6 53.8 240 61.0 –24 f (MHz) Zsource () Zin () 1805 0.90 – j2.84 0.85 + j2.75 1840 0.88 – j2.79 1880 1.12 – j2.86 Zload () (2) (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 7 P1dB – TYPICAL LOAD PULL CONTOURS — 1840 MHz –1 –1 –1.5 –1.5 52 E –2.5 52.5 –3 53 53.5 –3.5 P 54 54.5 –4 53 2 REAL () 1.5 1 60 –3 58 –3.5 –5 3 2.5 56 54 P 52 50 48 46 2 REAL () 1.5 1 2.5 3 Figure 9. P1dB Load Pull Efficiency Contours (%) –1 –1 22 –1.5 21.5 IMAGINARY () 20.5 –3 20 –3.5 P 19.5 –4 1 1.5 2 REAL () 3 2.5 Figure 10. P1dB Load Pull Gain Contours (dB) NOTE: –2.5 E –3 –16 –14 –12 –3.5 P –10 –4.5 18.5 18 –18 –20 –4 19 –4.5 –22 –2 21 E –2.5 –24 –1.5 –2 IMAGINARY () 54 62 –4.5 Figure 8. P1dB Load Pull Output Power Contours (dBm) –5 E –2.5 –4 –4.5 –5 52 –2 IMAGINARY () IMAGINARY () 51 51.5 –2 48 50 –5 –8 1.5 1 2 REAL () 2.5 3 Figure 11. P1dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT18S260W31SR3 AFT18S260W31GSR3 8 RF Device Data Freescale Semiconductor, Inc. P3dB – TYPICAL LOAD PULL CONTOURS — 1840 MHz –2 51.5 62 53 52.5 –2.5 E 52 –3 54 54.5 55 –3.5 55.5 P –4 E 53.5 IMAGINARY () IMAGINARY () –2.5 –2 60 58 –3 56 –3.5 54 P –4 52 53 –4.5 –5 0 54 0.5 1 1.5 REAL () 2.5 2 –5 3 Figure 12. P3dB Load Pull Output Power Contours (dBm) 0.5 0 1 1.5 REAL () 2.5 2 3 –2 19 –2.5 E 18.5 –3 18 –3.5 15.5 –4.5 17.5 17 P –4 0.5 1 1.5 REAL () –22 –24 E –20 –3 –18 –3.5 P –4 –16 –12 16.5 –14 –4.5 16 0 –26 –28 –2.5 IMAGINARY () IMAGINARY () 48 Figure 13. P3dB Load Pull Efficiency Contours (%) –2 –5 50 –4.5 52.5 52 –12 2 2.5 3 Figure 14. P3dB Load Pull Gain Contours (dB) NOTE: –5 0 0.5 1 1.5 REAL () 2 2.5 3 Figure 15. P3dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 9 C14 C4 VDD VGG R1 C7* C2* C3* C1* C8* C24 C16* C12 C20* C22* C13 C21* R2 C26* C23* C17* C9* C10 VGG C15 CUT OUT AREA C5 C6* C25 C18 C11 VDD AFT18S260W Rev. 5 D61216 C19 *C1, C2, C3, C6, C7, C8, C9, C16, C17, C20, C21, C22, C23, and C26 are mounted vertically. Figure 16. AFT18S260W31SR3 Test Circuit Component Layout — 1930–1995 MHz Table 9. AFT18S260W31SR3 Test Circuit Component Designations and Values — 1930–1995 MHz Part Description Part Number Manufacturer C1, C26 10 pF Chip Capacitors ATC100B100JT500XT ATC C2, C3 1.2 pF Chip Capacitors ATC100B1R2BT500XT ATC C4, C5, C10, C11, C12, C13, 10 F, Chip Capacitors C14, C15, C18, C19 GRM32ER61H106KA12L Murata C6, C7, C8, C9 7.5 pF Chip Capacitors ATC100B7R5CT500XT ATC C16, C17 8.2 pF Chip Capacitors ATC100B8R2CT500XT ATC C20, C23 0.5 pF Chip Capacitors ATC100B0R5BT500XT ATC C21 2.2 pF Chip Capacitor ATC100B2R2JT500XT ATC C22 0.3 pF Chip Capacitor ATC100B0R3BT500XT ATC C24, C25 470 F, 63 V Electrolytic Capacitors MCGPR63V477M13X26-RH Multicomp R1, R2 2.37 , 1/4 W Chip Resistors CRCW12062R37FNEA Vishay PCB Rogers RO4350B, 0.020, r = 3.66 D61216 MTL AFT18S260W31SR3 AFT18S260W31GSR3 10 RF Device Data Freescale Semiconductor, Inc. TYPICAL CHARACTERISTICS — 1930–1995 MHz 19.5 19 26 Gps 24 22 Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 18.5 18 PARC 17.5 17 –12 –34 ACPR 1920 –31 –33 IRL 1900 –9 –32 16.5 16 1880 –30 1940 1960 1980 f, FREQUENCY (MHz) 2000 –35 2040 2020 –15 –18 –21 –24 –2.6 –2.8 –3 –3.2 –3.4 PARC (dB) Gps, POWER GAIN (dB) 20 28 IRL, INPUT RETURN LOSS (dB) 20.5 30 D D, DRAIN EFFICIENCY (%) VDD = 28 Vdc, Pout = 50 W (Avg.), IDQ = 1800 mA Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth ACPR (dBc) 21 –3.6 Figure 17. Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 50 Watts Avg. –10 ACPR 50 –20 19 40 1995 MHz 1930 MHz D 1995 MHz 1960 MHz 1960 MHz 1930 MHz 18 Gps 17 16 15 1995 MHz 1 1960 MHz 30 20 10 1930 MHz 10 Pout, OUTPUT POWER (WATTS) AVG. 100 0 200 –30 –40 –50 ACPR (dBc) Gps, POWER GAIN (dB) VDD = 28 Vdc, IDQ = 1800 mA, Single--Carrier W--CDMA 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB 20 @ 0.01% Probability on CCDF D, DRAIN EFFICIENCY (%) 60 21 –60 –70 Figure 18. Single--Carrier W--CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 24 6 22 0 20 –6 18 –12 16 –18 VDD = 28 Vdc Pin = 0 dBm IDQ = 1800 mA 14 12 1460 1580 1700 1820 IRL (dB) GAIN (dB) Gain –24 IRL 1940 2060 2180 2300 –30 2420 f, FREQUENCY (MHz) Figure 19. Broadband Frequency Response AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 11 Table 10. Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, IDQ = 2107 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB Zload () (1) Gain (dB) (dBm) (W) D (%) AM/PM () 1.11 – j4.04 18.6 54.5 284 50.7 –10 1.12 – j4.30 18.5 54.5 282 49.5 –11 18.5 54.3 270 47.1 –10 f (MHz) Zsource () Zin () 1930 1.49 – j3.03 1.79 + j2.85 1960 1.62 – j3.06 2.11 + j2.78 1995 1.98 – j2.99 2.53 + j2.49 1.21 – j4.65 Max Output Power P3dB f (MHz) Zsource () Zin () Zload (2) () Gain (dB) (dBm) (W) D (%) AM/PM () 1930 1.49 – j3.03 1.88 + j3.04 1.11 – j4.22 16.2 55.3 342 50.4 –16 1960 1.62 – j3.06 2.26 + j2.97 1.16 – j4.40 16.4 55.3 340 50.9 –16 1995 1.98 – j2.99 2.76 + j2.61 1.26 – j4.71 16.5 55.2 329 49.2 –16 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Table 11. Load Pull Performance — Maximum Drain Efficiency Tuning VDD = 28 Vdc, IDQ = 2107 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 1930 1.49 – j3.03 1.73 + j2.80 1.33 – j2.89 21.2 52.8 193 60.7 –18 1960 1.62 – j3.06 2.00 + j2.70 1.39 – j3.00 21.3 52.7 186 59.9 –17 1995 1.98 – j2.99 2.36 + j2.41 1.43 – j3.39 21.1 52.8 189 56.7 –15 Max Drain Efficiency P3dB Gain (dB) (dBm) (W) D (%) AM/PM () 1.33 – j3.00 19.1 53.7 237 61.6 –26 2.20 + j2.87 1.39 – j3.09 19.1 53.6 230 61.1 –25 2.64 + j2.48 1.38 – j3.43 19.1 53.7 235 58.5 –22 f (MHz) Zsource () Zin () 1930 1.49 – j3.03 1.84 + j3.00 1960 1.62 – j3.06 1995 1.98 – j2.99 Zload () (2) (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload AFT18S260W31SR3 AFT18S260W31GSR3 12 RF Device Data Freescale Semiconductor, Inc. –1 –1 –1.5 –1.5 –2 –2 50.5 51 –2.5 –3 51.5 52 E 52.5 –3.5 –5 53 53.5 –4 3 2.5 50 E 58 –3.5 56 54 52 50 P 46 44 2 REAL () 1.5 1 46 48 44 2.5 3 Figure 21. P1dB Load Pull Efficiency Contours (%) –1 –1 –1.5 –8 –1.5 22 –2 21.5 –2.5 21 –3 E 20.5 –3.5 20 –4 18 1 18.5 1.5 2 REAL () –18 –2.5 –20 –16 –3 E –14 –3.5 –12 –4 19.5 P –4.5 –10 –2 IMAGINARY () IMAGINARY () –3 –5 Figure 20. P1dB Load Pull Output Power Contours (dBm) –5 48 –2.5 –4.5 2 REAL () 1.5 1 44 –4 54 P –4.5 IMAGINARY () IMAGINARY () P1dB – TYPICAL LOAD PULL CONTOURS — 1960 MHz P –4.5 19 3 2.5 Figure 22. P1dB Load Pull Gain Contours (dB) NOTE: –5 –10 1.5 1 2 REAL () 2.5 3 Figure 23. P1dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 13 P3dB – TYPICAL LOAD PULL CONTOURS — 1960 MHz –1 –1 –1.5 –1.5 51.5 52 –2.5 52.5 53 –3 E 53.5 –3.5 54 –4 P –4.5 –5 55 2 REAL () 1.5 3 2.5 –1 –1.5 –1.5 19 –3 E 18.5 –3.5 18 –4 –5 1 1.5 2 REAL () 3 2.5 Figure 26. P3dB Load Pull Gain Contours (dB) NOTE: 54 50 48 2 REAL () 1.5 1 46 3 2.5 –16 –26 –2.5 –28 –3 –24 E –5 –22 –20 –3.5 –18 –16 P –4.5 17 16.5 16 56 52 –4 17.5 P –4.5 58 P –2 19.5 IMAGINARY () IMAGINARY () –2.5 60 Figure 25. P3dB Load Pull Efficiency Contours (%) –1 20 E –3.5 –5 Figure 24. P3dB Load Pull Output Power Contours (dBm) –2 52 –3 –4.5 55 1 50 –2.5 –4 54.5 46 48 –2 IMAGINARY () IMAGINARY () –2 –14 1.5 1 2 REAL () 2.5 3 Figure 27. P3dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT18S260W31SR3 AFT18S260W31GSR3 14 RF Device Data Freescale Semiconductor, Inc. PACKAGE DIMENSIONS AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 15 AFT18S260W31SR3 AFT18S260W31GSR3 16 RF Device Data Freescale Semiconductor, Inc. AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 17 AFT18S260W31SR3 AFT18S260W31GSR3 18 RF Device Data Freescale Semiconductor, Inc. PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS Refer to the following resources to aid your design process. Application Notes  AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins  EB212: Using Data Sheet Impedances for RF LDMOS Devices Software  Electromigration MTTF Calculator  RF High Power Model  .s2p File Development Tools  Printed Circuit Boards To Download Resources Specific to a Given Part Number: 1. 2. 3. 4. Go to http://www.freescale.com/rf Search by part number Click part number link Choose the desired resource from the drop down menu REVISION HISTORY The following table summarizes revisions to this document. Revision Date 0 Apr. 2015 Description  Initial Release of Data Sheet AFT18S260W31SR3 AFT18S260W31GSR3 RF Device Data Freescale Semiconductor, Inc. 19 How to Reach Us: Home Page: freescale.com Web Support: freescale.com/support Information in this document is provided solely to enable system and software implementers to use Freescale products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document. Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others. Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/SalesTermsandConditions. Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. Airfast is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. E 2015 Freescale Semiconductor, Inc. AFT18S260W31SR3 AFT18S260W31GSR3 Document Number: AFT18S260W31S Rev. 0, 4/2015 20 RF Device Data Freescale Semiconductor, Inc.
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