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LPC11E14FBD64/401,

LPC11E14FBD64/401,

  • 厂商:

    NXP(恩智浦)

  • 封装:

    LQFP-64

  • 描述:

    IC MCU 32BIT 32KB FLASH 64LQFP

  • 数据手册
  • 价格&库存
LPC11E14FBD64/401, 数据手册
LPC11E1x 32-bit ARM Cortex-M0 microcontroller; up to 32 kB flash; up to 10 kB SRAM and 4 kB EEPROM; USART Rev. 1.1 — 24 September 2013 Product data sheet 1. General description The LPC11E1x are an ARM Cortex-M0 based, low-cost 32-bit MCU family, designed for 8/16-bit microcontroller applications, offering performance, low power, simple instruction set and memory addressing together with reduced code size compared to existing 8/16-bit architectures. The LPC11E1x operate at CPU frequencies of up to 50 MHz. The peripheral complement of the LPC11E1x includes up to 32 kB of flash memory, up to 10 kB of SRAM data memory and 4 kB EEPROM, one Fast-mode Plus I2C-bus interface, one RS-485/EIA-485 USART with support for synchronous mode and smart card interface, two SSP interfaces, four general-purpose counter/timers, a 10-bit ADC, and up to 54 general-purpose I/O pins. 2. Features and benefits  System:  ARM Cortex-M0 processor, running at frequencies of up to 50 MHz.  ARM Cortex-M0 built-in Nested Vectored Interrupt Controller (NVIC).  Non-Maskable Interrupt (NMI) input selectable from several input sources.  System tick timer.  Memory:  Up to 32 kB on-chip flash program memory.  Up to 4 kB on-chip EEPROM data memory; byte erasable and byte programmable.  Up to 10 kB SRAM data memory.  16 kB boot ROM including 32-bit integer divide routines and power profiles.  In-System Programming (ISP) and In-Application Programming (IAP) for flash and EEPROM via on-chip bootloader software.  Debug options:  Standard JTAG test interface for BSDL.  Serial Wire Debug. LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller  Digital peripherals:  Up to 54 General-Purpose I/O (GPIO) pins with configurable pull-up/pull-down resistors, repeater mode, and open-drain mode.  Up to 8 GPIO pins can be selected as edge and level sensitive interrupt sources.  Two GPIO grouped interrupt modules enable an interrupt based on a programmable pattern of input states of a group of GPIO pins.  High-current source output driver (20 mA) on one pin.  High-current sink driver (20 mA) on true open-drain pins.  Four general-purpose counter/timers with a total of up to 8 capture inputs and 13 match outputs.  Programmable Windowed WatchDog Timer (WWDT) with a dedicated, internal low-power WatchDog Oscillator (WDO).  Analog peripherals:  10-bit ADC with input multiplexing among eight pins.  Serial interfaces:  USART with fractional baud rate generation, internal FIFO, a full modem control handshake interface, and support for RS-485/9-bit mode and synchronous mode. USART supports an asynchronous smart card interface (ISO 7816-3).  Two SSP controllers with FIFO and multi-protocol capabilities.  I2C-bus interface supporting the full I2C-bus specification and Fast-mode Plus with a data rate of up to 1 Mbit/s with multiple address recognition and monitor mode.  Clock generation:  Crystal Oscillator with an operating range of 1 MHz to 25 MHz (system oscillator).  12 MHz high-frequency Internal RC oscillator (IRC) that can optionally be used as a system clock.  Internal low-power, low-frequency WatchDog Oscillator (WDO) with programmable frequency output.  PLL allows CPU operation up to the maximum CPU rate with the system oscillator or the IRC as clock sources.  Clock output function with divider that can reflect the crystal oscillator, the main clock, the IRC, or the watchdog oscillator.  Power control:  Integrated PMU (Power Management Unit) to minimize power consumption during Sleep, Deep-sleep, Power-down, and Deep power-down modes.  Power profiles residing in boot ROM allow optimized performance and minimized power consumption for any given application through one simple function call.  Four reduced power modes: Sleep, Deep-sleep, Power-down, and Deep power-down.  Processor wake-up from Deep-sleep and Power-down modes via reset, selectable GPIO pins, or a watchdog interrupt.  Processor wake-up from Deep power-down mode using one special function pin.  Power-On Reset (POR).  Brownout detect with four separate thresholds for interrupt and forced reset. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 2 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller     Unique device serial number for identification. Single 3.3 V power supply (1.8 V to 3.6 V). Temperature range 40 C to +85 C. Available as LQFP64, LQFP48, and HVQFN33 package. 3. Applications  Consumer peripherals  Medical  Handheld scanners  Industrial control 4. Ordering information Table 1. Ordering information Type number Package Name Description Version LPC11E11FHN33/101 HVQFN33 plastic thermal enhanced very thin quad flat package; no leads; 33 terminals; body 7  7  0.85 mm n/a LPC11E12FBD48/201 LQFP48 plastic low profile quad flat package; 48 leads; body 7  7  1.4 mm SOT313-2 LPC11E13FBD48/301 LQFP48 plastic low profile quad flat package; 48 leads; body 7  7  1.4 mm SOT313-2 LPC11E14FHN33/401 HVQFN33 plastic thermal enhanced very thin quad flat package; no leads; 33 terminals; body 7  7  0.85 mm n/a LPC11E14FBD48/401 LQFP48 plastic low profile quad flat package; 48 leads; body 7  7  1.4 mm SOT313-2 LPC11E14FBD64/401 LQFP64 plastic low profile quad flat package; 64 leads; body 10  10  1.4 mm SOT314-2 4.1 Ordering options Table 2. LPC11E1X Product data sheet Part ordering options Part Number Flash EEPROM SRAM I2C-bus USART FM+ SSP ADC GPIO channels LPC11E11FHN33/101 8 kB 512 B 4 kB 1 1 2 8 28 LPC11E12FBD48/201 16 kB 1 kB 6 kB 1 1 2 8 40 LPC11E13FBD48/301 24 kB 2 kB 8 kB 1 1 2 8 40 LPC11E14FHN33/401 32 kB 4 kB 10 kB 1 1 2 8 28 LPC11E14FBD48/401 32 kB 4 kB 10 kB 1 1 2 8 40 LPC11E14FBD64/401 32 kB 4 kB 10 kB 1 1 2 8 54 All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 3 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 5. Block diagram SWD, JTAG XTALIN XTALOUT LPC11E1x SYSTEM OSCILLATOR TEST/DEBUG INTERFACE BOD GPIO ports 0/1 CLKOUT POR EEPROM 512 B 1/2/4 kB FLASH 8/16/24/32 kB slave HIGH-SPEED GPIO CLOCK GENERATION, POWER CONTROL, SYSTEM FUNCTIONS IRC, WDO ARM CORTEX-M0 system bus RESET PLL0 ROM 16 kB SRAM 4/6/8/10 kB slave slave slave AHB-LITE BUS slave RXD TXD DCD, DSR(1), RI(1) CTS, RTS, DTR SCLK CT16B0_MAT[2:0] CT16B0_CAP[1:0](2) CT16B1_MAT[1:0] CT16B1_CAP[1:0](2) CT32B0_MAT[3:0] CT32B0_CAP[1:0](2) CT32B1_MAT[3:0] CT32B1_CAP[1:0](2) AHB TO APB BRIDGE USART/ SMARTCARD INTERFACE AD[7:0] 10-bit ADC SCL, SDA I2C-BUS 16-bit COUNTER/TIMER 0 SSP0 SCK0, SSEL0, MISO0, MOSI0 SSP1 SCK1, SSEL1, MISO1, MOSI1 16-bit COUNTER/TIMER 1 32-bit COUNTER/TIMER 0 IOCON 32-bit COUNTER/TIMER 1 SYSTEM CONTROL WINDOWED WATCHDOG TIMER GPIO pins GPIO INTERRUPTS GPIO pins GPIO GROUP0 INTERRUPTS GPIO pins GPIO GROUP1 INTERRUPTS PMU 002aag683 (1) Not available on HVQFN33 packages. (2) CT16B0/1_CAP1, CT32B1_CAP1 available on the LQFP64 package only. CT32B0_CAP1 available on the LQFP64 and LQFP48 packages only. Fig 1. Block diagram LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 4 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 6. Pinning information PIO0_19/TXD/CT32B0_MAT1 PIO0_18/RXD/CT32B0_MAT0 PIO0_17/RTS/CT32B0_CAP0/SCLK VDD PIO1_15/DCD/CT16B0_MAT2/SCK1 PIO0_23/AD7 PIO0_16/AD5/CT32B1_MAT3/WAKEUP SWDIO/PIO0_15/AD4/CT32B1_MAT2 31 30 29 28 27 26 25 terminal 1 index area 32 6.1 Pinning PIO1_19/DTR/SSEL1 1 24 TRST/PIO0_14/AD3/CT32B1_MAT1 RESET/PIO0_0 2 23 TDO/PIO0_13/AD2/CT32B1_MAT0 PIO0_1/CLKOUT/CT32B0_MAT2 3 22 TMS/PIO0_12/AD1/CT32B1_CAP0 XTALIN 4 21 TDI/PIO0_11/AD0/CT32B0_MAT3 XTALOUT 5 20 PIO0_22/AD6/CT16B1_MAT1/MISO1 VDD 6 PIO0_20/CT16B1_CAP0 7 PIO0_2/SSEL0/CT16B0_CAP0 8 LPC11E11 LPC11E14 9 10 11 12 13 14 15 16 PIO0_3 PIO0_4/SCL PIO0_5/SDA PIO0_21/CT16B1_MAT0/MOSI1 PIO1_23/CT16B1_MAT1/SSEL1 PIO1_24/CT32B0_MAT0 PIO0_6/SCK0 PIO0_7/CTS 33 VSS 19 SWCLK/PIO0_10/SCK0/CT16B0_MAT2 18 PIO0_9/MOSI0/CT16B0_MAT1 17 PIO0_8/MISO0/CT16B0_MAT0 002aag684 Transparent top view Fig 2. Pin configuration (HVQFN33) LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 5 of 62 LPC11E1x NXP Semiconductors 37 PIO1_14/DSR/CT16B0_MAT1/RXD 38 PIO1_22/RI/MOSI1 39 SWDIO/PIO0_15/AD4/CT32B1_MAT2 40 PIO0_16/AD5/CT32B1_MAT3/WAKEUP 41 VSS 42 PIO0_23/AD7 43 PIO1_15/DCD/CT16B0_MAT2/SCK1 44 VDD 45 PIO0_17/RTS/CT32B0_CAP0/SCLK 46 PIO0_18/RXD/CT32B0_MAT0 PIO1_25/CT32B0_MAT1 1 36 PIO1_13/DTR/CT16B0_MAT0/TXD PIO1_19/DTR/SSEL1 2 35 TRST/PIO0_14/AD3/CT32B1_MAT1 RESET/PIO0_0 3 34 TDO/PIO0_13/AD2/CT32B1_MAT0 PIO0_1/CLKOUT/CT32B0_MAT2 4 33 TMS/PIO0_12/AD1/CT32B1_CAP0 VSS 5 XTALIN 6 XTALOUT 7 VDD 8 PIO0_20/CT16B1_CAP0 9 28 PIO0_9/MOSI0/CT16B0_MAT1 PIO0_2/SSEL0/CT16B0_CAP0 10 27 PIO0_8/MISO0/CT16B0_MAT0 32 TDI/PIO0_11/AD0/CT32B0_MAT3 LPC11E12FBD48/201 LPC11E13FBD48/301 LPC11E14FBD48/401 31 PIO1_29/SCK0/CT32B0_CAP1 30 PIO0_22/AD6/CT16B1_MAT1/MISO1 29 SWCLK/PIO0_10/SCK0/CT16B0_MAT2 PIO1_28/CT32B0_CAP0/SCLK 24 PIO0_7/CTS 23 PIO0_6/SCK0 22 PIO1_24/CT32B0_MAT0 21 n.c. 20 n.c. 19 PIO1_23/CT16B1_MAT1/SSEL1 18 PIO0_21/CT16B1_MAT0/MOSI1 17 PIO0_5/SDA 16 25 PIO1_31 PIO0_4/SCL 15 26 PIO1_21/DCD/MISO1 PIO1_27/CT32B0_MAT3/TXD 12 PIO0_3 14 PIO1_26/CT32B0_MAT2/RXD 11 PIO1_20/DSR/SCK1 13 Fig 3. 47 PIO0_19/TXD/CT32B0_MAT1 48 PIO1_16/RI/CT16B0_CAP0 32-bit ARM Cortex-M0 microcontroller 002aag685 Pin configuration (LQFP48) LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 6 of 62 LPC11E1x NXP Semiconductors 49 PIO1_14 50 PIO1_3 51 PIO1_22 52 SWDIO/PIO0_15 53 PIO0_16 54 VSS 55 PIO1_9 56 PIO0_23 58 VDD 57 PIO1_15 59 PIO1_12 60 PIO0_17 61 PIO0_18 62 PIO0_19 63 PIO1_16 64 PIO1_6 32-bit ARM Cortex-M0 microcontroller PIO1_0 1 48 VDD PIO1_25 2 47 PIO1_13 PIO1_19 3 46 TRST/PIO0_14 RESET/PIO0_0 4 45 TDO/PIO0_13 PIO0_1 5 44 TMS/PIO0_12 PIO1_7 6 43 PIO1_11 VSS 7 42 TDI/PIO0_11 XTALIN 8 XTALOUT 9 41 PIO1_29 LPC11E14FBD64/401 40 PIO0_22 VDD 10 39 PIO1_8 PIO0_20 11 38 SWCLK/PIO0_10 PIO1_10 12 37 PIO0_9 PIO0_2 13 36 PIO0_8 PIO1_26 14 35 PIO1_21 PIO1_27 15 34 PIO1_2 PIO1_4 16 PIO1_5 32 PIO1_28 31 PIO0_7 30 PIO0_6 29 PIO1_18 28 PIO1_24 27 n.c. 26 n.c. 25 PIO1_23 24 PIO1_17 23 PIO0_21 22 PIO0_5 21 PIO0_4 20 PIO0_3 19 PIO1_1 17 PIO1_20 18 33 VDD 002aag686 See Table 3 for the full pin name. Fig 4. Pin configuration (LQFP64) LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 7 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 6.2 Pin description Table 3 shows all pins and their assigned digital or analog functions in order of the GPIO port number. The default function after reset is listed first. All port pins have internal pull-up resistors enabled after reset except for the true open-drain pins PIO0_4 and PIO0_5. Every port pin has a corresponding IOCON register for programming the digital or analog function, the pull-up/pull-down configuration, the repeater, and the open-drain modes. The USART, counter/timer, and SSP functions are available on more than one port pin. RESET/PIO0_0 PIO0_1/CLKOUT/ CT32B0_MAT2 PIO0_2/SSEL0/ CT16B0_CAP0 PIO0_3 PIO0_4/SCL PIO0_5/SDA PIO0_6/SCK0 PIO0_7/CTS LPC11E1X Product data sheet LQFP64 Symbol LQFP48 Pin description HVQFN33 Table 3. 2 3 4 3 8 9 10 11 15 16 4 10 14 15 16 22 23 Reset state Description I; PU I RESET — External reset input with 20 ns glitch filter. A LOW-going pulse as short as 50 ns on this pin resets the device, causing I/O ports and peripherals to take on their default states, and processor execution to begin at address 0. This pin also serves as the debug select input. LOW level selects the JTAG boundary scan. HIGH level selects the ARM SWD debug mode. - I/O PIO0_0 — General purpose digital input/output pin. I; PU I/O PIO0_1 — General purpose digital input/output pin. A LOW level on this pin during reset starts the ISP command handler. - O CLKOUT — Clockout pin. - O CT32B0_MAT2 — Match output 2 for 32-bit timer 0. I; PU I/O PIO0_2 — General purpose digital input/output pin. - I/O SSEL0 — Slave select for SSP0. [1] [2] 5 [3] 13 Type [3] - I CT16B0_CAP0 — Capture input 0 for 16-bit timer 0. 19 [3] I; PU I/O PIO0_3 — General purpose digital input/output pin. 20 [4] I; IA I/O PIO0_4 — General purpose digital input/output pin (open-drain). - I/O SCL — I2C-bus clock input/output (open-drain). High-current sink only if I2C Fast-mode Plus is selected in the I/O configuration register. I; IA I/O PIO0_5 — General purpose digital input/output pin (open-drain). - I/O SDA — I2C-bus data input/output (open-drain). High-current sink only if I2C Fast-mode Plus is selected in the I/O configuration register. I; PU I/O PIO0_6 — General purpose digital input/output pin. - I/O SCK0 — Serial clock for SSP0. I; PU I/O PIO0_7 — General purpose digital input/output pin (high-current output driver). - I CTS — Clear To Send input for USART. 21 [4] 29 [3] 30 [5] All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 8 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller PIO0_8/MISO0/ CT16B0_MAT0 PIO0_9/MOSI0/ CT16B0_MAT1 SWCLK/PIO0_10/SCK0/ CT16B0_MAT2 TDI/PIO0_11/AD0/ CT32B0_MAT3 TMS/PIO0_12/AD1/ CT32B1_CAP0 TDO/PIO0_13/AD2/ CT32B1_MAT0 TRST/PIO0_14/AD3/ CT32B1_MAT1 SWDIO/PIO0_15/AD4/ CT32B1_MAT2 PIO0_16/AD5/ CT32B1_MAT3/WAKEUP LPC11E1X Product data sheet LQFP64 Symbol LQFP48 Pin description HVQFN33 Table 3. 17 27 36 18 19 21 22 23 24 25 26 28 29 32 33 34 35 39 40 37 38 42 44 45 46 52 53 Reset state Type Description I; PU I/O PIO0_8 — General purpose digital input/output pin. - I/O MISO0 — Master In Slave Out for SSP0. - O CT16B0_MAT0 — Match output 0 for 16-bit timer 0. I; PU I/O PIO0_9 — General purpose digital input/output pin. - I/O MOSI0 — Master Out Slave In for SSP0. - O CT16B0_MAT1 — Match output 1 for 16-bit timer 0. I; PU I SWCLK — Serial wire clock and test clock TCK for JTAG interface. - I/O PIO0_10 — General purpose digital input/output pin. - O SCK0 — Serial clock for SSP0. - O CT16B0_MAT2 — Match output 2 for 16-bit timer 0. I; PU I TDI — Test Data In for JTAG interface. - I/O PIO0_11 — General purpose digital input/output pin. - I AD0 — A/D converter, input 0. - O CT32B0_MAT3 — Match output 3 for 32-bit timer 0. I; PU I TMS — Test Mode Select for JTAG interface. - I/O PIO_12 — General purpose digital input/output pin. - I AD1 — A/D converter, input 1. - I CT32B1_CAP0 — Capture input 0 for 32-bit timer 1. I; PU O TDO — Test Data Out for JTAG interface. - I/O PIO0_13 — General purpose digital input/output pin. - I AD2 — A/D converter, input 2. - O CT32B1_MAT0 — Match output 0 for 32-bit timer 1. I; PU I TRST — Test Reset for JTAG interface. - I/O PIO0_14 — General purpose digital input/output pin. - I AD3 — A/D converter, input 3. - O CT32B1_MAT1 — Match output 1 for 32-bit timer 1. I; PU I/O SWDIO — Serial wire debug input/output. - I/O PIO0_15 — General purpose digital input/output pin. - I AD4 — A/D converter, input 4. - O CT32B1_MAT2 — Match output 2 for 32-bit timer 1. I; PU I/O PIO0_16 — General purpose digital input/output pin. - I AD5 — A/D converter, input 5. - O CT32B1_MAT3 — Match output 3 for 32-bit timer 1. - I WAKEUP — Deep power-down mode wake-up pin with 20 ns glitch filter. Pull this pin HIGH externally to enter Deep power-down mode. Pull this pin LOW to exit Deep power-down mode. A LOW-going pulse as short as 50 ns wakes up the part. [1] [3] [3] [3] [6] [6] [6] [6] [6] [6] All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 9 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller PIO0_17/RTS/ CT32B0_CAP0/SCLK LQFP64 Symbol LQFP48 Pin description HVQFN33 Table 3. 30 45 60 PIO0_18/RXD/ CT32B0_MAT0 31 PIO0_19/TXD/ CT32B0_MAT1 32 PIO0_20/CT16B1_CAP0 7 PIO0_21/CT16B1_MAT0/ MOSI1 PIO0_22/AD6/ CT16B1_MAT1/MISO1 PIO0_23/AD7 PIO1_0/CT32B1_MAT0 PIO1_1/CT32B1_MAT1 PIO1_2/CT32B1_MAT2 PIO1_3/CT32B1_MAT3 PIO1_4/CT32B1_CAP0 PIO1_5/CT32B1_CAP1 12 20 27 - 46 47 9 17 30 42 - 61 62 Reset state Description I; PU I/O PIO0_17 — General purpose digital input/output pin. - O RTS — Request To Send output for USART. - I CT32B0_CAP0 — Capture input 0 for 32-bit timer 0. - I/O SCLK — Serial clock input/output for USART in synchronous mode. I; PU I/O PIO0_18 — General purpose digital input/output pin. - I RXD — Receiver input for USART. Used in UART ISP mode. [1] [3] [3] [3] 11 [3] 22 [3] 40 Type [6] 56 [6] 1 [3] 17 [3] 34 [3] 50 [3] 16 [3] - O CT32B0_MAT0 — Match output 0 for 32-bit timer 0. I; PU I/O PIO0_19 — General purpose digital input/output pin. - O TXD — Transmitter output for USART. Used in UART ISP mode. - O CT32B0_MAT1 — Match output 1 for 32-bit timer 0. I; PU I/O PIO0_20 — General purpose digital input/output pin. - I CT16B1_CAP0 — Capture input 0 for 16-bit timer 1. I; PU I/O PIO0_21 — General purpose digital input/output pin. - O CT16B1_MAT0 — Match output 0 for 16-bit timer 1. - I/O MOSI1 — Master Out Slave In for SSP1. I; PU I/O PIO0_22 — General purpose digital input/output pin. - I AD6 — A/D converter, input 6. - O CT16B1_MAT1 — Match output 1 for 16-bit timer 1. - I/O MISO1 — Master In Slave Out for SSP1. I; PU I/O PIO0_23 — General purpose digital input/output pin. - I AD7 — A/D converter, input 7. I; PU I/O PIO1_0 — General purpose digital input/output pin. - O CT32B1_MAT0 — Match output 0 for 32-bit timer 1. I; PU I/O PIO1_1 — General purpose digital input/output pin. - O CT32B1_MAT1 — Match output 1 for 32-bit timer 1. I; PU I/O PIO1_2 — General purpose digital input/output pin. - O CT32B1_MAT2 — Match output 2 for 32-bit timer 1. I; PU I/O PIO1_3 — General purpose digital input/output pin. - O CT32B1_MAT3 — Match output 3 for 32-bit timer 1. I; PU I/O PIO1_4 — General purpose digital input/output pin. - I CT32B1_CAP0 — Capture input 0 for 32-bit timer 1. I; PU I/O PIO1_5 — General purpose digital input/output pin. 32 [3] - I CT32B1_CAP1 — Capture input 1 for 32-bit timer 1. PIO1_6 - - 64 [3] I; PU I/O PIO1_6 — General purpose digital input/output pin. PIO1_7 - - 6 [3] I; PU I/O PIO1_7 — General purpose digital input/output pin. 39 [3] I; PU I/O PIO1_8 — General purpose digital input/output pin. PIO1_8 LPC11E1X Product data sheet - - All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 10 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Table 3. Pin description Description LQFP64 Type LQFP48 Reset state HVQFN33 Symbol PIO1_9 - - 55 [3] I; PU I/O PIO1_9 — General purpose digital input/output pin. PIO1_10 - - 12 [3] I; PU I/O PIO1_10 — General purpose digital input/output pin. 43 [3] I; PU I/O PIO1_11 — General purpose digital input/output pin. 59 [3] I; PU I/O PIO1_12 — General purpose digital input/output pin. 47 [3] I; PU I/O PIO1_13 — General purpose digital input/output pin. - O DTR — Data Terminal Ready output for USART. - O CT16B0_MAT0 — Match output 0 for 16-bit timer 0. - O TXD — Transmitter output for USART. I; PU I/O PIO1_14 — General purpose digital input/output pin. - I DSR — Data Set Ready input for USART. - O CT16B0_MAT1 — Match output 1 for 16-bit timer 0. - I RXD — Receiver input for USART. PIO1_11 PIO1_12 PIO1_13/DTR/ CT16B0_MAT0/TXD PIO1_14/DSR/ CT16B0_MAT1/RXD PIO1_15/DCD/ CT16B0_MAT2/SCK1 PIO1_16/RI/ CT16B0_CAP0 PIO1_17/CT16B0_CAP1/ RXD - - 28 - - PIO1_18/CT16B1_CAP1/ TXD - PIO1_19/DTR/SSEL1 1 PIO1_20/DSR/SCK1 PIO1_21/DCD/MISO1 PIO1_22/RI/MOSI1 LPC11E1X Product data sheet - - - 36 37 43 48 - - 2 13 26 38 49 57 63 23 28 3 18 35 51 [1] [3] [3] [3] [3] [3] [3] [3] [3] [3] I; PU I/O PIO1_15 — General purpose digital input/output pin. I DCD — Data Carrier Detect input for USART. - O CT16B0_MAT2 — Match output 2 for 16-bit timer 0. - I/O SCK1 — Serial clock for SSP1. I; PU I/O PIO1_16 — General purpose digital input/output pin. - I RI — Ring Indicator input for USART. - I CT16B0_CAP0 — Capture input 0 for 16-bit timer 0. I; PU I/O PIO1_17 — General purpose digital input/output pin. - I CT16B0_CAP1 — Capture input 1 for 16-bit timer 0. - I RXD — Receiver input for USART. I; PU I/O PIO1_18 — General purpose digital input/output pin. - I CT16B1_CAP1 — Capture input 1 for 16-bit timer 1. - O TXD — Transmitter output for USART. I; PU I/O PIO1_19 — General purpose digital input/output pin. - O DTR — Data Terminal Ready output for USART. - I/O SSEL1 — Slave select for SSP1. I; PU I/O PIO1_20 — General purpose digital input/output pin. - I DSR — Data Set Ready input for USART. - I/O SCK1 — Serial clock for SSP1. I; PU I/O PIO1_21 — General purpose digital input/output pin. - I DCD — Data Carrier Detect input for USART. - I/O MISO1 — Master In Slave Out for SSP1. I; PU I/O PIO1_22 — General purpose digital input/output pin. - I RI — Ring Indicator input for USART. - I/O MOSI1 — Master Out Slave In for SSP1. All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 11 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller PIO1_23/CT16B1_MAT1/ SSEL1 LQFP64 Symbol LQFP48 Pin description HVQFN33 Table 3. 13 18 24 Reset state [3] PIO1_24/CT32B0_MAT0 14 21 27 PIO1_25/CT32B0_MAT1 - 1 2 [3] 14 [3] - PIO1_27/CT32B0_MAT3/ TXD - PIO1_28/CT32B0_CAP0/ SCLK - PIO1_29/SCK0/ CT32B0_CAP1 - 11 12 24 31 15 31 41 PIO1_31 - 25 - n.c. - 19 25 n.c. - 20 26 Description I; PU I/O PIO1_23 — General purpose digital input/output pin. - O CT16B1_MAT1 — Match output 1 for 16-bit timer 1. [1] [3] PIO1_26/CT32B0_MAT2/ RXD Type [3] [3] [3] [3] - I/O SSEL1 — Slave select for SSP1. I; PU I/O PIO1_24 — General purpose digital input/output pin. - O CT32B0_MAT0 — Match output 0 for 32-bit timer 0. I; PU I/O PIO1_25 — General purpose digital input/output pin. - O CT32B0_MAT1 — Match output 1 for 32-bit timer 0. I; PU I/O PIO1_26 — General purpose digital input/output pin. - O CT32B0_MAT2 — Match output 2 for 32-bit timer 0. - I RXD — Receiver input for USART. I; PU I/O PIO1_27 — General purpose digital input/output pin. - O CT32B0_MAT3 — Match output 3 for 32-bit timer 0. - O TXD — Transmitter output for USART. I; PU I/O PIO1_28 — General purpose digital input/output pin. - I CT32B0_CAP0 — Capture input 0 for 32-bit timer 0. - I/O SCLK — Serial clock input/output for USART in synchronous mode. I; PU I/O PIO1_29 — General purpose digital input/output pin. - I/O SCK0 — Serial clock for SSP0. - I CT32B0_CAP1 — Capture input 1 for 32-bit timer 0. I; PU I/O PIO1_31 — General purpose digital input/output pin. F - Not connected. F - Not connected. - - Input to the oscillator circuit and internal clock generator circuits. Input voltage must not exceed 1.8 V. - - Output from the oscillator amplifier. XTALIN 4 6 8 [7] XTALOUT 5 7 9 [7] VDD 6; 29 8; 44 10; 33; 48; 58 - - Supply voltage to the internal regulator, the external rail, and the ADC. Also used as the ADC reference voltage. VSS 33 5; 41 7; 54 - - Ground. [1] Pin state at reset for default function: I = Input; O = Output; PU = internal pull-up enabled; IA = inactive, no pull-up/down enabled; F = floating; If the pins are not used, tie floating pins to ground or power to minimize power consumption. [2] 5 V tolerant pad. RESET functionality is not available in Deep power-down mode. Use the WAKEUP pin to reset the chip and wake up from Deep power-down mode. An external pull-up resistor is required on this pin for the Deep power-down mode. See Figure 28 for the reset pad configuration. [3] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis (see Figure 27). [4] I2C-bus pins compliant with the I2C-bus specification for I2C standard mode, I2C Fast-mode, and I2C Fast-mode Plus. [5] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis (see Figure 27); includes high-current output driver. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 12 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller [6] 5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors, configurable hysteresis, and analog input. When configured as a ADC input, digital section of the pad is disabled and the pin is not 5 V tolerant (see Figure 27); includes digital input glitch filter. [7] When the system oscillator is not used, connect XTALIN and XTALOUT as follows: XTALIN can be left floating or can be grounded (grounding is preferred to reduce susceptibility to noise). Leave XTALOUT floating. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 13 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 7. Functional description 7.1 On-chip flash programming memory The LPC11E1x contain 24 kB or 32 kB on-chip flash program memory. The flash can be programmed using In-System Programming (ISP) or In-Application Programming (IAP) via the on-chip boot loader software. 7.2 EEPROM The LPC11E1x contain 500 Byte, 1 kB, 2 kB, or 4 kB of on-chip byte-erasable and byte-programmable EEPROM data memory. The EEPROM can be programmed using In-Application Programming (IAP) via the on-chip boot loader software. 7.3 SRAM The LPC11E1x contain a total of 4 kB, 6 kB, 8 kB, or 10 kB on-chip static RAM memory. 7.4 On-chip ROM The on-chip ROM contains the boot loader and the following Application Programming Interfaces (APIs): • • • • In-System Programming (ISP) and In-Application Programming (IAP) support for flash IAP support for EEPROM Power profiles for configuring power consumption and PLL settings 32-bit integer division routines 7.5 Memory map The LPC11E1x incorporates several distinct memory regions, shown in the following figures. Figure 5 shows the overall map of the entire address space from the user program viewpoint following reset. The interrupt vector area supports address remapping. The AHB peripheral area is 2 MB in size and is divided to allow for up to 128 peripherals. The APB peripheral area is 512 kB in size and is divided to allow for up to 32 peripherals. Each peripheral of either type is allocated 16 kB of space. This addressing scheme allows simplifying the address decoding for each peripheral. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 14 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller LPC11E1x 4 GB 0xFFFF FFFF reserved 0xE010 0000 private peripheral bus 0xE000 0000 reserved APB peripherals 0x5000 4000 GPIO 25 - 31 reserved 0x5000 0000 reserved 24 GPIO GROUP1 INT 23 GPIO GROUP0 INT 22 SSP1 0x4008 0000 APB peripherals 1 GB 20 - 21 reserved 0x4000 0000 reserved 0x2000 0800 2 kB SRAM (LPC11E14/401) 0.5 GB 0x2000 0000 19 GPIO interrupts 18 system control 17 IOCON 16 15 SSP0 flash/EEPROM controller 14 PMU reserved 0x4006 4000 0x4006 0000 0x4005 C000 0x4005 8000 0x4004 C000 0x4004 C000 0x4004 8000 0x4004 4000 0x4004 0000 0x4003 C000 0x4003 8000 10 - 13 reserved 0x1FFF 4000 16 kB boot ROM 0x4002 8000 0x1FFF 0000 reserved 0x1000 2000 9 reserved 8 reserved 0x4002 0000 7 ADC 0x4001 C000 0x4002 4000 8 kB SRAM (LPC11E13/301 LPC11E14/401) 0x1000 1800 6 32-bit counter/timer 1 0x4001 8000 6 kB SRAM (LPC11E12/201) 0x1000 1000 5 32-bit counter/timer 0 0x4001 4000 0x1000 0000 4 16-bit counter/timer 1 0x4001 0000 3 16-bit counter/timer 0 0x4000 C000 2 USART/SMART CARD 0x4000 8000 1 0 WWDT 0x4000 4000 I2C-bus 0x4000 0000 4 kB SRAM (LPC11E11/101) reserved 0x0000 8000 32 kB on-chip flash (LPC11E14) 24 kB on-chip flash (LPC11E13) 0 GB 0x4008 0000 0x0000 6000 0x0000 4000 16 kB on-chip flash (LPC11E12) 0x0000 2000 8 kB on-chip flash (LPC11E11) 0x0000 0000 0x0000 00C0 active interrupt vectors 0x0000 0000 002aag688 Fig 5. LPC11E1x memory map 7.6 Nested Vectored Interrupt Controller (NVIC) The Nested Vectored Interrupt Controller (NVIC) is part of the Cortex-M0. The tight coupling to the CPU allows for low interrupt latency and efficient processing of late arriving interrupts. 7.6.1 Features • Controls system exceptions and peripheral interrupts. • In the LPC11E1x, the NVIC supports 24 vectored interrupts. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 15 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller • Four programmable interrupt priority levels, with hardware priority level masking. • Software interrupt generation. 7.6.2 Interrupt sources Each peripheral device has one interrupt line connected to the NVIC but can have several interrupt flags. Individual interrupt flags can also represent more than one interrupt source. 7.7 IOCON block The IOCON block allows selected pins of the microcontroller to have more than one function. Configuration registers control the multiplexers to allow connection between the pin and the on-chip peripherals. Connect peripherals to the appropriate pins before activating the peripheral and before enabling any related interrupt. . Activity of any enabled peripheral function that is not mapped to a related pin is treated as undefined. 7.7.1 Features • Programmable pull-up, pull-down, or repeater mode. • All GPIO pins (except PIO0_4 and PIO0_5) are pulled up to 3.3 V (VDD = 3.3 V) if their pull-up resistor is enabled. • Programmable pseudo open-drain mode. • Programmable 10 ns glitch filter on pins PIO0_22, PIO0_23, and PIO0_11 to PIO0_16. The glitch filter is turned on by default. • Programmable hysteresis. • Programmable input inverter. 7.8 General-Purpose Input/Output GPIO The GPIO registers control device pin functions that are not connected to a specific peripheral function. Pins can be dynamically configured as inputs or outputs. Multiple outputs can be set or cleared in one write operation. LPC11E1x use accelerated GPIO functions: • GPIO registers are a dedicated AHB peripheral so that the fastest possible I/O timing can be achieved. • Entire port value can be written in one instruction. Any GPIO pin providing a digital function can be programmed to generate an interrupt on a level, a rising or falling edge, or both. The GPIO block consists of three parts: 1. The GPIO ports. 2. The GPIO pin interrupt block to control eight GPIO pins selected as pin interrupts. 3. Two GPIO group interrupt blocks to control two combined interrupts from all GPIO pins. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 16 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 7.8.1 Features • • • • GPIO pins can be configured as input or output by software. All GPIO pins default to inputs with interrupt disabled at reset. Pin registers allow pins to be sensed and set individually. Up to eight GPIO pins can be selected from all GPIO pins to create an edge- or level-sensitive GPIO interrupt request. • Any pin or pins in each port can trigger a port interrupt. 7.9 USART The LPC11E1x contain one USART. The USART includes full modem control, support for synchronous mode, and a smart card interface. The RS-485/9-bit mode allows both software address detection and automatic address detection using 9-bit mode. The USART uses a fractional baud rate generator. Standard baud rates such as 115200 Bd can be achieved with any crystal frequency above 2 MHz. 7.9.1 Features • • • • • Maximum USART data bit rate of 3.125 Mbit/s. 16 byte receive and transmit FIFOs. Register locations conform to 16C550 industry standard. Receiver FIFO trigger points at 1 B, 4 B, 8 B, and 14 B. Built-in fractional baud rate generator covering wide range of baud rates without a need for external crystals of particular values. • Fractional divider for baud rate control, auto baud capabilities and FIFO control mechanism that enables software flow control implementation. • • • • Support for RS-485/9-bit mode. Support for modem control. Support for synchronous mode. Includes smart card interface. 7.10 SSP serial I/O controller The SSP controllers operate on a SSP, 4-wire SSI, or Microwire bus. It can interact with multiple masters and slaves on the bus. Only a single master and a single slave can communicate on the bus during a given data transfer. The SSP supports full duplex transfers, with frames of 4 bit to 16 bit of data flowing from the master to the slave and from the slave to the master. In practice, often only one of these data flows carries meaningful data. 7.10.1 Features • Maximum SSP speed of 25 Mbit/s (master) or 4.17 Mbit/s (slave) (in SSP mode) • Compatible with Motorola SPI, 4-wire Texas Instruments SSI, and National Semiconductor Microwire buses LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 17 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller • • • • Synchronous serial communication Master or slave operation 8-frame FIFOs for both transmit and receive 4-bit to 16-bit frame 7.11 I2C-bus serial I/O controller The LPC11E1x contain one I2C-bus controller. The I2C-bus is bidirectional for inter-IC control using only two wires: a Serial Clock line (SCL) and a Serial Data line (SDA). Each device is recognized by a unique address and can operate as either a receiver-only device (e.g., an LCD driver) or a transmitter with the capability to both receive and send information (such as memory). Transmitters and/or receivers can operate in either master or slave mode, depending on whether the chip has to initiate a data transfer or is only addressed. The I2C-bus is a multi-master bus, and more than one bus master connected to the interface can be controlled the bus. 7.11.1 Features • The I2C-interface is an I2C-bus compliant interface with open-drain pins. The I2C-bus interface supports Fast-mode Plus with bit rates up to 1 Mbit/s. • • • • • Easy to configure as master, slave, or master/slave. Programmable clocks allow versatile rate control. Bidirectional data transfer between masters and slaves. Multi-master bus (no central master). Arbitration between simultaneously transmitting masters without corruption of serial data on the bus. • Serial clock synchronization allows devices with different bit rates to communicate via one serial bus. • Serial clock synchronization can be used as a handshake mechanism to suspend and resume serial transfer. • The I2C-bus can be used for test and diagnostic purposes. • The I2C-bus controller supports multiple address recognition and a bus monitor mode. 7.12 10-bit ADC The LPC11E1x contains one ADC. It is a single 10-bit successive approximation ADC with eight channels. 7.12.1 Features • • • • • • LPC11E1X Product data sheet 10-bit successive approximation ADC. Input multiplexing among 8 pins. Power-down mode. Measurement range 0 V to VDD. 10-bit conversion time  2.44 s (up to 400 kSamples/s). Burst conversion mode for single or multiple inputs. All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 18 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller • Optional conversion on transition of input pin or timer match signal. • Individual result registers for each ADC channel to reduce interrupt overhead. 7.13 General purpose external event counter/timers The LPC11E1x include two 32-bit counter/timers and two 16-bit counter/timers. The counter/timer is designed to count cycles of the system derived clock. It can optionally generate interrupts or perform other actions at specified timer values, based on four match registers. Each counter/timer also includes one capture input to trap the timer value when an input signal transitions, optionally generating an interrupt. 7.13.1 Features • A 32-bit/16-bit timer/counter with a programmable 32-bit/16-bit prescaler. • Counter or timer operation. • Up to two capture channels per timer, that can take a snapshot of the timer value when an input signal transitions. A capture event can also generate an interrupt. • Four match registers per timer that allow: – Continuous operation with optional interrupt generation on match. – Stop timer on match with optional interrupt generation. – Reset timer on match with optional interrupt generation. • Up to four external outputs corresponding to match registers, with the following capabilities: – Set LOW on match. – Set HIGH on match. – Toggle on match. – Do nothing on match. • The timer and prescaler can be configured to be cleared on a designated capture event. This feature permits easy pulse-width measurement by clearing the timer on the leading edge of an input pulse and capturing the timer value on the trailing edge. 7.14 System tick timer The ARM Cortex-M0 includes a system tick timer (SYSTICK) that is intended to generate a dedicated SYSTICK exception at a fixed time interval (typically 10 ms). 7.15 Windowed WatchDog Timer (WWDT) The purpose of the WWDT is to prevent an unresponsive system state. If software fails to update the watchdog within a programmable time window, the watchdog resets the microcontroller 7.15.1 Features • Internally resets chip if not periodically reloaded during the programmable time-out period. • Optional windowed operation requires reload to occur between a minimum and maximum time period, both programmable. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 19 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller • Optional warning interrupt can be generated at a programmable time before watchdog time-out. • Software enables the WWDT, but a hardware reset or a watchdog reset/interrupt is required to disable the WWDT. • • • • Incorrect feed sequence causes reset or interrupt, if enabled. Flag to indicate watchdog reset. Programmable 24-bit timer with internal prescaler. Selectable time period from (Tcy(WDCLK)  256  4) to (Tcy(WDCLK)  224  4) in multiples of Tcy(WDCLK)  4. • The Watchdog Clock (WDCLK) source can be selected from the IRC or the dedicated watchdog oscillator (WDO). The clock source selection provides a wide range of potential timing choices of watchdog operation under different power conditions. 7.16 Clocking and power control 7.16.1 Integrated oscillators The LPC11E1x include three independent oscillators: the system oscillator, the Internal RC oscillator (IRC), and the watchdog oscillator. Each oscillator can be used for more than one purpose as required in a particular application. Following reset, the LPC11E1x operates from the internal RC oscillator until software switches to a different clock source. The IRC allows the system to operate without any external crystal and the bootloader code to operate at a known frequency. See Figure 6 for an overview of the LPC11E1x clock generation. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 20 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller SYSTEM CLOCK DIVIDER CPU, system control, PMU system clock n memories, peripheral clocks SYSAHBCLKCTRLn (AHB clock enable) IRC oscillator main clock SSP0 PERIPHERAL CLOCK DIVIDER SSP0 USART PERIPHERAL CLOCK DIVIDER UART SSP1 PERIPHERAL CLOCK DIVIDER SSP1 watchdog oscillator MAINCLKSEL (main clock select) IRC oscillator IRC oscillator system oscillator watchdog oscillator SYSTEM PLL system oscillator SYSPLLCLKSEL (system PLL clock select) CLKOUT PIN CLOCK DIVIDER CLKOUT pin CLKOUTUEN (CLKOUT update enable) IRC oscillator WDT watchdog oscillator WDCLKSEL (WDT clock select) 002aag687 Fig 6. LPC11E1x clocking generation block diagram 7.16.1.1 Internal RC oscillator The IRC can be used as the clock source for the WDT, and/or as the clock that drives the system PLL and then the CPU. The nominal IRC frequency is 12 MHz. Upon power-up, any chip reset, or wake-up from Deep power-down mode, the LPC11E1x use the IRC as the clock source. Software can later switch to one of the other available clock sources. 7.16.1.2 System oscillator The system oscillator can be used as the clock source for the CPU, with or without using the PLL. The system oscillator operates at frequencies of 1 MHz to 25 MHz. This frequency can be boosted to a higher frequency, up to the maximum CPU operating frequency, by the system PLL. 7.16.1.3 Watchdog oscillator The watchdog oscillator can be used as a clock source that directly drives the CPU, the watchdog timer, or the CLKOUT pin. The watchdog oscillator nominal frequency is programmable between 7.8 kHz and 1.7 MHz. The frequency spread over processing and temperature is 40 % (see also Table 13). LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 21 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 7.16.2 System PLL The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input frequency is multiplied up to a high frequency with a Current Controlled Oscillator (CCO). The multiplier can be an integer value from 1 to 32. The CCO operates in the range of 156 MHz to 320 MHz. To support this frequency range, an additional divider keeps the CCO within its frequency range while the PLL is providing the desired output frequency. The output divider can be set to divide by 2, 4, 8, or 16 to produce the output clock. The PLL output frequency must be lower than 100 MHz. Since the minimum output divider value is 2, it is insured that the PLL output has a 50 % duty cycle. The PLL is turned off and bypassed following a chip reset. Software can enable the PLL later. The program must configure and activate the PLL, wait for the PLL to lock, and then connect to the PLL as a clock source. The PLL settling time is 100 s. 7.16.3 Clock output The LPC11E1x feature a clock output function that routes the IRC oscillator, the system oscillator, the watchdog oscillator, or the main clock to an output pin. 7.16.4 Wake-up process The LPC11E1x begin operation by using the 12 MHz IRC oscillator as the clock source at power-up and when awakened from Deep power-down mode . This mechanism allows chip operation to resume quickly. If the application uses the main oscillator or the PLL, software must enable these components and wait for them to stabilize. Only then can the system use the PLL and main oscillator as a clock source. 7.16.5 Power control The LPC11E1x support various power control features. There are four special modes of processor power reduction: Sleep mode, Deep-sleep mode, Power-down mode, and Deep power-down mode. The CPU clock rate can also be controlled as needed by changing clock sources, reconfiguring PLL values, and/or altering the CPU clock divider value. This power control mechanism allows a trade-off of power versus processing speed based on application requirements. In addition, a register is provided for shutting down the clocks to individual on-chip peripherals. This register allows fine-tuning of power consumption by eliminating all dynamic power use in any peripherals that are not required for the application. Selected peripherals have their own clock divider which provides even better power control. 7.16.5.1 Power profiles The power consumption in Active and Sleep modes can be optimized for the application through simple calls to the power profile. The power configuration routine configures the LPC11E1x for one of the following power modes: • Default mode corresponding to power configuration after reset. • CPU performance mode corresponding to optimized processing capability. • Efficiency mode corresponding to optimized balance of current consumption and CPU performance. • Low-current mode corresponding to lowest power consumption. In addition, the power profile includes routines to select the optimal PLL settings for a given system clock and PLL input clock. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 22 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 7.16.5.2 Sleep mode When Sleep mode is entered, the clock to the core is stopped. Resumption from the Sleep mode does not need any special sequence but re-enabling the clock to the ARM core. In Sleep mode, execution of instructions is suspended until either a reset or interrupt occurs. Peripheral functions continue operation during Sleep mode and can generate interrupts to cause the processor to resume execution. Sleep mode eliminates dynamic power used by the processor itself, by memory systems and related controllers, and by internal buses. 7.16.5.3 Deep-sleep mode In Deep-sleep mode, the LPC11E1x is in Sleep-mode and all peripheral clocks and all clock sources are off except for the IRC. The IRC output is disabled unless the IRC is selected as input to the watchdog timer. In addition all analog blocks are shut down and the flash is in stand-by mode. In Deep-sleep mode, the application can keep the watchdog oscillator and the BOD circuit running for self-timed wake-up and BOD protection. The LPC11E1x can wake up from Deep-sleep mode via reset, selected GPIO pins, or a watchdog timer interrupt. Deep-sleep mode saves power and allows for short wake-up times. 7.16.5.4 Power-down mode In Power-down mode, the LPC11E1x is in Sleep-mode and all peripheral clocks and all clock sources are off except for watchdog oscillator if selected. In addition all analog blocks and the flash are shut down. In Power-down mode, the application can keep the BOD circuit running for BOD protection. The LPC11E1x can wake up from Power-down mode via reset, selected GPIO pins, or a watchdog timer interrupt. Power-down mode reduces power consumption compared to Deep-sleep mode at the expense of longer wake-up times. 7.16.5.5 Deep power-down mode In Deep power-down mode, power is shut off to the entire chip except for the WAKEUP pin. The LPC11E1x can wake up from Deep power-down mode via the WAKEUP pin. The LPC11E1x can be prevented from entering Deep power-down mode by setting a lock bit in the PMU block. Locking out Deep power-down mode enables the application to keep the watchdog timer or the BOD running at all times. When entering Deep power-down mode, an external pull-up resistor is required on the WAKEUP pin to hold it HIGH. Pull the RESET pin HIGH to prevent it from floating while in Deep power-down mode. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 23 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 7.16.6 System control 7.16.6.1 Reset Reset has four sources on the LPC11E1x: the RESET pin, the Watchdog reset, power-on reset (POR), and the BrownOut Detection (BOD) circuit. The RESET pin is a Schmitt trigger input pin. Assertion of chip reset by any source, once the operating voltage attains a usable level, starts the IRC and initializes the flash controller. A LOW-going pulse as short as 50 ns resets the part. When the internal Reset is removed, the processor begins executing at address 0, which is initially the Reset vector mapped from the boot block. At that point, all of the processor and peripheral registers have been initialized to predetermined values. In Deep power-down mode, an external pull-up resistor is required on the RESET pin. 7.16.6.2 Brownout detection The LPC11E1x includes four levels for monitoring the voltage on the VDD pin. If this voltage falls below one of the four selected levels, the BOD asserts an interrupt signal to the NVIC. This signal can be enabled for interrupt in the Interrupt Enable Register in the NVIC to cause a CPU interrupt. Alternatively, software can monitor the signal by reading a dedicated status register. Four additional threshold levels can be selected to cause a forced reset of the chip. 7.16.6.3 Code security (Code Read Protection - CRP) CRP provides different levels of security in the system so that access to the on-chip flash and use of the Serial Wire Debugger (SWD) and In-System Programming (ISP) can be restricted. Programming a specific pattern into a dedicated flash location invokes CRP. IAP commands are not affected by the CRP. In addition, ISP entry via the PIO0_1 pin can be disabled without enabling CRP. For details, see the LPC11Exx user manual. There are three levels of Code Read Protection: 1. CRP1 disables access to the chip via the SWD and allows partial flash update (excluding flash sector 0) using a limited set of the ISP commands. This mode is useful when CRP is required and flash field updates are needed but all sectors cannot be erased. 2. CRP2 disables access to the chip via the SWD and only allows full flash erase and update using a reduced set of the ISP commands. 3. Running an application with level CRP3 selected, fully disables any access to the chip via the SWD pins and the ISP. This mode effectively disables ISP override using PIO0_1 pin as well. If necessary, the application must provide a flash update mechanism using IAP calls or using a call to the reinvoke ISP command to enable a flash update via the USART. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 24 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller CAUTION If level three Code Read Protection (CRP3) is selected, no future factory testing can be performed on the device. In addition to the three CRP levels, sampling of pin PIO0_1 for valid user code can be disabled. For details, see the LPC11Exx user manual. 7.16.6.4 APB interface The APB peripherals are located on one APB bus. 7.16.6.5 AHBLite The AHBLite connects the CPU bus of the ARM Cortex-M0 to the flash memory, the main static RAM, and the ROM. 7.16.6.6 External interrupt inputs All GPIO pins can be level or edge sensitive interrupt inputs. 7.17 Emulation and debugging Debug functions are integrated into the ARM Cortex-M0. Serial wire debug functions are supported in addition to a standard JTAG boundary scan. The ARM Cortex-M0 is configured to support up to four breakpoints and two watch points. The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the ARM SWD debug (RESET = HIGH). The ARM SWD debug port is disabled while the LPC11E1x is in reset. To perform boundary scan testing, follow these steps: 1. Erase any user code residing in flash. 2. Power up the part with the RESET pin pulled HIGH externally. 3. Wait for at least 250 s. 4. Pull the RESET pin LOW externally. 5. Perform boundary scan operations. 6. Once the boundary scan operations are completed, assert the TRST pin to enable the SWD debug mode, and release the RESET pin (pull HIGH). Remark: The JTAG interface cannot be used for debug purposes. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 25 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 8. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134).[1] Symbol Parameter Conditions Min Max Unit [2] 0.5 +4.6 V [5][2] 0.5 +5.5 V V supply voltage (core and external rail) VDD input voltage VI 5 V tolerant digital I/O pins; VDD  1.8 V 0.5 +3.6 [2][4] 0.5 +5.5 [2] 0.5 4.6 V VDD = 0 V 5 V tolerant open-drain pins PIO0_4 and PIO0_5 VIA analog input voltage pin configured as analog input [3] IDD supply current per supply pin - 100 mA ISS ground current per ground pin - 100 mA Ilatch I/O latch-up current (0.5VDD) < VI < (1.5VDD); - 100 mA Tj < 125 C Tstg storage temperature Tj(max) maximum junction temperature Ptot(pack) total power dissipation (per package) based on package heat transfer, not device power consumption VESD electrostatic discharge voltage human body model; all pins [1] non-operating [6] [7] 65 +150 C - 150 C - 1.5 W - +6500 V The following applies to the limiting values: a) This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated maximum. b) Parameters are valid over operating temperature range unless otherwise specified. All voltages are with respect to VSS unless otherwise noted. c) The limiting values are stress ratings only. Operating the part at these values is not recommended, and proper operation is not guaranteed. The conditions for functional operation are specified in Table 5. [2] Maximum/minimum voltage above the maximum operating voltage (see Table 5) and below ground that can be applied for a short time (< 10 ms) to a device without leading to irrecoverable failure. Failure includes the loss of reliability and shorter lifetime of the device. [3] See Table 6 for maximum operating voltage. [4] VDD present or not present. Compliant with the I2C-bus standard. 5.5 V can be applied to this pin when VDD is powered down. [5] Including voltage on outputs in 3-state mode. [6] The maximum non-operating storage temperature is different than the temperature for required shelf life which should be determined based on required shelf lifetime. Please refer to the JEDEC spec (J-STD-033B.1) for further details. [7] Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 k series resistor. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 26 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 9. Static characteristics Table 5. Static characteristics Tamb = 40 C to +85 C, unless otherwise specified. Symbol Parameter VDD supply voltage (core and external rail) IDD supply current Conditions Min Typ[1] Max Unit 1.8 3.3 3.6 V - 2 - mA - 7 - mA - 1 - mA - 360 - A - 2 - A - 220 - nA Active mode; VDD = 3.3 V; Tamb = 25 C; code while(1){} executed from flash; system clock = 12 MHz [2][3][4] [5][6] system clock = 50 MHz [3][4][5] [6][7] Sleep mode; VDD = 3.3 V; Tamb = 25 C; [2][3][4] [5][6] system clock = 12 MHz Deep-sleep mode; VDD = 3.3 V; Tamb = 25 C [3] Power-down mode; VDD = 3.3 V; Tamb = 25 C Deep power-down mode; VDD = 3.3 V; Tamb = 25 C [8] Standard port pins, RESET IIL LOW-level input current VI = 0 V; on-chip pull-up resistor disabled - 0.5 10 nA IIH HIGH-level input current VI = VDD; on-chip pull-down resistor disabled - 0.5 10 nA IOZ OFF-state output current VO = 0 V; VO = VDD; on-chip pull-up/down resistors disabled - 0.5 10 nA VI input voltage pin configured to provide a digital function 0 - 5.0 V 0 - VDD V - - V [9][10] [11] VO output voltage VIH HIGH-level input voltage 0.7VDD VIL LOW-level input voltage - - 0.3VDD V Vhys hysteresis voltage - 0.4 - V VOH HIGH-level output voltage 2.0 V  VDD  3.6 V; IOH = 4 mA VDD  0.4 - - V 1.8 V  VDD < 2.0 V; IOH = 3 mA VDD  0.4 - - V LOW-level output voltage 2.0 V  VDD  3.6 V; IOL = 4 mA - - 0.4 V 1.8 V  VDD < 2.0 V; IOL = 3 mA - - 0.4 V HIGH-level output current VOH = VDD  0.4 V; 4 - - mA 3 - - mA VOL IOH output active 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 27 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Table 5. Static characteristics …continued Tamb = 40 C to +85 C, unless otherwise specified. Symbol Parameter Conditions Min Typ[1] Max Unit IOL VOL = 0.4 V 4 - - mA LOW-level output current 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V 3 - - mA - - 45 mA - - 50 mA IOHS HIGH-level short-circuit VOH = 0 V output current [12] IOLS LOW-level short-circuit output current VOL = VDD [12] Ipd pull-down current VI = 5 V 10 50 150 A Ipu pull-up current VI = 0 V; 15 50 85 A 10 50 85 A 0 0 0 A 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V VDD < VI < 5 V High-drive output pin (PIO0_7) IIL LOW-level input current VI = 0 V; on-chip pull-up resistor disabled - 0.5 10 nA IIH HIGH-level input current VI = VDD; on-chip pull-down resistor disabled - 0.5 10 nA IOZ OFF-state output current VO = 0 V; VO = VDD; on-chip pull-up/down resistors disabled - 0.5 10 nA VI input voltage pin configured to provide a digital function 0 - 5.0 V 0 - VDD V - - V [9][10] [11] VO output voltage VIH HIGH-level input voltage 0.7VDD VIL LOW-level input voltage - - 0.3VDD V Vhys hysteresis voltage 0.4 - - V VOH HIGH-level output voltage 2.5 V  VDD  3.6 V; IOH = 20 mA VDD  0.4 - - V 1.8 V  VDD < 2.5 V; IOH = 12 mA VDD  0.4 - - V LOW-level output voltage 2.0 V  VDD  3.6 V; IOL = 4 mA - - 0.4 V 1.8 V  VDD < 2.0 V; IOL = 3 mA - - 0.4 V IOH HIGH-level output current VOH = VDD  0.4 V; 2.5 V  VDD  3.6 V 20 - - mA 1.8 V  VDD < 2.5 V 12 - - mA IOL LOW-level output current VOL = 0.4 V 4 - - mA 3 - - mA IOLS LOW-level short-circuit output current VOL = VDD - - 50 mA Ipd pull-down current VI = 5 V 10 50 150 A Ipu pull-up current VI = 0 V 15 50 85 A 10 50 85 A 0 0 0 A VOL output active 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V [12] 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V VDD < VI < 5 V LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 28 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Table 5. Static characteristics …continued Tamb = 40 C to +85 C, unless otherwise specified. Symbol Parameter I2C-bus Conditions Min Typ[1] Max Unit pins (PIO0_4 and PIO0_5) VIH HIGH-level input voltage 0.7VDD - - V VIL LOW-level input voltage - - 0.3VDD V Vhys hysteresis voltage - 0.05VDD - V 3.5 - - mA 3 - - 20 - - 16 - - - 2 4 A - 10 22 A LOW-level output current IOL I2C-bus VOL = 0.4 V; pins configured as standard mode pins 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V LOW-level output current IOL I2C-bus VOL = 0.4 V; pins configured as Fast-mode Plus pins mA 2.0 V  VDD  3.6 V 1.8 V  VDD < 2.0 V input leakage current ILI [13] VI = VDD VI = 5 V Oscillator pins Vi(xtal) crystal input voltage 0.5 1.8 1.95 V Vo(xtal) crystal output voltage 0.5 1.8 1.95 V - - 7.1 pF Pin capacitance Cio input/output capacitance pins configured for analog function I2C-bus pins (PIO0_4 and PIO0_5) pins configured as GPIO [1] - - 2.5 pF - - 2.8 pF Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages. [2] IRC enabled; system oscillator disabled; system PLL disabled. [3] IDD measurements were performed with all pins configured as GPIO outputs driven LOW and pull-up resistors disabled. [4] BOD disabled. [5] All peripherals disabled in the AHBCLKCTRL register. Peripheral clocks to USART, SSP0/1 disabled in the SYSCON block. [6] Low-current mode PWR_LOW_CURRENT selected when running the set_power routine in the power profiles. [7] IRC disabled; system oscillator enabled; system PLL enabled. [8] WAKEUP pin pulled HIGH externally. An external pull-up resistor is required on the RESET pin for the Deep power-down mode. [9] Including voltage on outputs in 3-state mode. [10] VDD supply voltage must be present. [11] 3-state outputs go into 3-state mode in Deep power-down mode. [12] Allowed as long as the current limit does not exceed the maximum current allowed by the device. [13] To VSS. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 29 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Table 6. ADC static characteristics Tamb = 40 C to +85 C unless otherwise specified; ADC frequency 4.5 MHz, VDD = 2.5 V to 3.6 V. Symbol Parameter VIA analog input voltage 0 - VDD V Cia analog input capacitance - - 1 pF ED differential linearity error [1][2] - - 1 LSB integral non-linearity [3] - - 1.5 LSB EO offset error [4] - - 3.5 LSB EG gain error [5] - - 0.6 % ET absolute error [6] - - 4 LSB Rvsi voltage source interface resistance - - 40 k Ri input resistance - - 2.5 M EL(adj) Conditions Min [7][8] Typ Max Unit [1] The ADC is monotonic, there are no missing codes. [2] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 7. [3] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate adjustment of gain and offset errors. See Figure 7. [4] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. See Figure 7. [5] The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset error, and the straight line which fits the ideal transfer curve. See Figure 7. [6] The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated ADC and the ideal transfer curve. See Figure 7. [7] Tamb = 25 C; maximum sampling frequency fs = 400kSamples/s and analog input capacitance Cia = 1 pF. [8] Input resistance Ri depends on the sampling frequency fs: Ri = 1 / (fs  Cia). LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 30 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller offset error EO gain error EG 1023 1022 1021 1020 1019 1018 (2) 7 code out (1) 6 5 (5) 4 (4) 3 (3) 2 1 LSB (ideal) 1 0 1 2 3 4 5 6 7 1018 1019 1020 1021 1022 1023 1024 VIA (LSBideal) offset error EO 1 LSB = VDD − VSS 1024 002aaf426 (1) Example of an actual transfer curve. (2) The ideal transfer curve. (3) Differential linearity error (ED). (4) Integral non-linearity (EL(adj)). (5) Center of a step of the actual transfer curve. Fig 7. ADC characteristics LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 31 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 9.1 BOD static characteristics Table 7. BOD static characteristics[1] Tamb = 25 C. Symbol Parameter Conditions Vth threshold voltage interrupt level 1 Min Typ Max Unit assertion - 2.22 - V de-assertion - 2.35 - V assertion - 2.52 - V de-assertion - 2.66 - V assertion - 2.80 - V de-assertion - 2.90 - V assertion - 1.46 - V de-assertion - 1.63 - V interrupt level 2 interrupt level 3 reset level 0 reset level 1 assertion - 2.06 - V de-assertion - 2.15 - V assertion - 2.35 - V de-assertion - 2.43 - V assertion - 2.63 - V de-assertion - 2.71 - V reset level 2 reset level 3 [1] Interrupt levels are selected by writing the level value to the BOD control register BODCTRL, see the LPC11Exx user manual. 9.2 Power consumption Power measurements in Active, Sleep, and Deep-sleep modes were performed under the following conditions (see the LPC11Exx user manual): • Configure all pins as GPIO with pull-up resistor disabled in the IOCON block. • Configure GPIO pins as outputs using the GPIOnDIR registers. • Write 0 to all GPIOnDATA registers to drive the outputs LOW. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 32 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 002aag749 9 48 MHz(2) IDD (mA) 6 36 MHz(2) 24 MHz(2) 3 12 MHz(1) 0 1.8 2.4 3.0 3.6 VDD (V) Conditions: VDD = 3.3 V; Active mode entered executing code while(1){} from flash; internal pull-up resistors disabled; BOD disabled; all peripherals disabled in the SYSAHBCLKCTRL register; all peripheral clocks disabled; low-current mode. (1) System oscillator and system PLL disabled; IRC enabled. (2) System oscillator and system PLL enabled; IRC disabled. Fig 8. Typical supply current versus regulator supply voltage VDD in active mode 002aag750 9 48 MHz(2) IDD (mA) 6 36 MHz(2) 24 MHz(2) 3 12 MHz(1) 0 -40 -15 10 35 60 85 temperature (°C) Conditions: VDD = 3.3 V; Active mode entered executing code while(1){} from flash; internal pull-up resistors disabled; BOD disabled; all peripherals disabled in the SYSAHBCLKCTRL register; all peripheral clocks disabled; low-current mode. (1) System oscillator and system PLL disabled; IRC enabled. (2) System oscillator and system PLL enabled; IRC disabled. Fig 9. LPC11E1X Product data sheet Typical supply current versus temperature in Active mode All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 33 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 002aag751 4 IDD (mA) 3 48 MHz(2) 36 MHz(2) 2 24 MHz(2) 12 MHz(1) 1 0 -40 -15 10 35 60 85 temperature (°C) Conditions: VDD = 3.3 V; Sleep mode entered from flash; internal pull-up resistors disabled; BOD disabled; all peripherals disabled in the SYSAHBCLKCTRL register; all peripheral clocks disabled; low-current mode. (1) System oscillator and system PLL disabled; IRC enabled. (2) System oscillator and system PLL enabled; IRC disabled. Fig 10. Typical supply current versus temperature in Sleep mode 002aag745 385 IDD (µA) 375 VDD = 3.6 V VDD = 3.3 V 365 VDD = 2.0 V 355 VDD = 1.8 V 345 -40 -15 10 35 60 85 temperature (°C) Conditions: BOD disabled; all oscillators and analog blocks turned off in the PDSLEEPCFG register. Fig 11. Typical supply current versus temperature in Deep-sleep mode LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 34 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 002aag746 20 IDD (µA) VDD = 3.6 V, 3.3 V VDD = 2.0 V VDD = 1.8 V 15 10 5 0 -40 -15 10 35 60 85 temperature (°C) Conditions: BOD disabled; all oscillators and analog blocks turned off in the PDSLEEPCFG register. Fig 12. Typical supply current versus temperature in Power-down mode 002aag747 0.8 IDD (µA) VDD = 3.6 V VDD = 3.3 V VDD = 2.0 V VDD = 1.8 V 0.6 0.4 0.2 0 -40 -15 10 35 60 85 temperature (°C) Fig 13. Typical supply current versus temperature in Deep power-down mode 9.3 Peripheral power consumption The supply current per peripheral is measured as the difference in supply current between the peripheral block enabled and the peripheral block disabled in the SYSAHBCLKCFG and PDRUNCFG (for analog blocks) registers. All other blocks are disabled in both registers and no code is executed. Measured on a typical sample at Tamb = 25 C. Unless noted otherwise, the system oscillator and PLL are running in both measurements. The supply currents are shown for system clock frequencies of 12 MHz and 48 MHz. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 35 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Table 8. LPC11E1X Product data sheet Power consumption for individual analog and digital blocks Peripheral Typical supply current in mA Notes n/a 12 MHz 48 MHz IRC 0.27 - - System oscillator running; PLL off; independent of main clock frequency. System oscillator at 12 MHz 0.22 - - IRC running; PLL off; independent of main clock frequency. Watchdog oscillator at 500 kHz/2 0.004 - - System oscillator running; PLL off; independent of main clock frequency. BOD 0.051 - - Independent of main clock frequency. Main PLL - 0.21 - - ADC - 0.08 0.29 - CLKOUT - 0.12 0.47 Main clock divided by 4 in the CLKOUTDIV register. CT16B0 - 0.02 0.06 - CT16B1 - 0.02 0.06 - CT32B0 - 0.02 0.07 - CT32B1 - 0.02 0.06 - GPIO - 0.23 0.88 GPIO pins configured as outputs and set to LOW. Direction and pin state are maintained if the GPIO is disabled in the SYSAHBCLKCFG register. IOCONFIG - 0.03 0.10 - I2C - 0.04 0.13 - ROM - 0.04 0.15 - SPI0 - 0.12 0.45 - SPI1 - 0.12 0.45 - UART - 0.22 0.82 - WWDT - 0.02 0.06 Main clock selected as clock source for the WDT. All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 36 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 9.4 Electrical pin characteristics 002aae990 3.6 VOH (V) T = 85 °C 25 °C −40 °C 3.2 2.8 2.4 2 0 10 20 30 40 50 60 IOH (mA) Conditions: VDD = 3.3 V; on pin PIO0_7. Fig 14. High-drive output: Typical HIGH-level output voltage VOH versus HIGH-level output current IOH. 002aaf019 60 T = 85 °C 25 °C −40 °C IOL (mA) 40 20 0 0 0.2 0.4 0.6 VOL (V) Conditions: VDD = 3.3 V; on pins PIO0_4 and PIO0_5. Fig 15. I2C-bus pins (high current sink): Typical LOW-level output current IOL versus LOW-level output voltage VOL LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 37 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 002aae991 15 IOL (mA) T = 85 °C 25 °C −40 °C 10 5 0 0 0.2 0.4 0.6 VOL (V) Conditions: VDD = 3.3 V; standard port pins and PIO0_7. Fig 16. Typical LOW-level output current IOL versus LOW-level output voltage VOL 002aae992 3.6 VOH (V) T = 85 °C 25 °C −40 °C 3.2 2.8 2.4 2 0 8 16 24 IOH (mA) Conditions: VDD = 3.3 V; standard port pins. Fig 17. Typical HIGH-level output voltage VOH versus HIGH-level output source current IOH LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 38 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 002aae988 10 Ipu (μA) −10 −30 T = 85 °C 25 °C −40 °C −50 −70 0 1 2 3 4 5 VI (V) Conditions: VDD = 3.3 V; standard port pins. Fig 18. Typical pull-up current Ipu versus input voltage VI 002aae989 80 T = 85 °C 25 °C −40 °C Ipd (μA) 60 40 20 0 0 1 2 3 4 5 VI (V) Conditions: VDD = 3.3 V; standard port pins. Fig 19. Typical pull-down current Ipd versus input voltage VI LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 39 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 10. Dynamic characteristics 10.1 Flash memory Table 9. Flash characteristics Tamb = 40 C to +85 C, unless otherwise specified. Symbol Parameter Nendu endurance tret retention time ter erase time tprog programming time Conditions Min [1] Typ Max Unit 10000 100000 - cycles powered 10 - - years unpowered 20 - - years sector or multiple consecutive sectors 95 100 105 ms 0.95 1 1.05 ms [2] [1] Number of program/erase cycles. [2] Programming times are given for writing 256 bytes from RAM to the flash. Data must be written to the flash in blocks of 256 bytes. Table 10. EEPROM characteristics Tamb = 40 C to +85 C; VDD = 2.7 V to 3.6 V. Based on JEDEC NVM qualification. Failure rate < 10 ppm for parts as specified below. Symbol Parameter Nendu endurance tret retention time tprog programming time Conditions Min Typ Max Unit 100000 1000000 - cycles powered 100 200 - years unpowered 150 300 - years 64 bytes - 2.9 - ms 10.2 External clock Table 11. Dynamic characteristic: external clock Tamb = 40 C to +85 C; VDD over specified ranges.[1] LPC11E1X Product data sheet Min Typ[2] Max Unit oscillator frequency 1 - 25 MHz Tcy(clk) clock cycle time 40 - 1000 ns tCHCX clock HIGH time Tcy(clk)  0.4 - - ns tCLCX clock LOW time Tcy(clk)  0.4 - - ns tCLCH clock rise time - - 5 ns tCHCL clock fall time - - 5 ns Symbol Parameter fosc Conditions [1] Parameters are valid over operating temperature range unless otherwise specified. [2] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages. All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 40 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller tCHCL tCHCX tCLCH tCLCX Tcy(clk) 002aaa907 Fig 20. External clock timing (with an amplitude of at least Vi(RMS) = 200 mV) 10.3 Internal oscillators Table 12. Dynamic characteristics: IRC Tamb = 40 C to +85 C; 2.7 V  VDD  3.6 V[1]. Symbol Parameter Conditions Min Typ[2] Max Unit fosc(RC) internal RC oscillator frequency - 11.88 12 12.12 MHz [1] Parameters are valid over operating temperature range unless otherwise specified. [2] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply voltages. 002aaf403 12.15 f (MHz) 12.05 VDD = 3.6 V 3.3 V 3.0 V 2.7 V 2.4 V 2.0 V 11.95 11.85 −40 −15 10 35 60 85 temperature (°C) Conditions: Frequency values are typical values. 12 MHz  1 % accuracy is guaranteed for 2.7 V  VDD  3.6 V and Tamb = 40 C to +85 C. Variations between parts may cause the IRC to fall outside the 12 MHz  1 % accuracy specification for voltages below 2.7 V. Fig 21. Internal RC oscillator frequency versus temperature Table 13. Dynamic characteristics: Watchdog oscillator Symbol Parameter Conditions fosc(int) internal oscillator frequency DIVSEL = 0x1F, FREQSEL = 0x1 in the WDTOSCCTRL register; DIVSEL = 0x00, FREQSEL = 0xF in the WDTOSCCTRL register [1] LPC11E1X Product data sheet Min Typ[1] Max Unit [2][3] - 7.8 - kHz [2][3] - 1700 - kHz Typical ratings are not guaranteed. The values listed are at nominal supply voltages. All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 41 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller [2] The typical frequency spread over processing and temperature (Tamb = 40 C to +85 C) is 40 %. [3] See the LPC11Exx user manual. 10.4 I/O pins Table 14. Dynamic characteristics: I/O pins[1] Tamb = 40 C to +85 C; 3.0 V  VDD  3.6 V. Symbol Parameter tr tf [1] Conditions Min Typ Max Unit rise time pin configured as output 3.0 - 5.0 ns fall time pin configured as output 2.5 - 5.0 ns Applies to standard port pins and RESET pin. 10.5 I2C-bus Table 15. Dynamic characteristic: I2C-bus pins[1] Tamb = 40 C to +85 C.[2] Symbol Parameter Conditions Min Max Unit fSCL SCL clock frequency Standard-mode 0 100 kHz Fast-mode 0 400 kHz Fast-mode Plus 0 1 MHz of both SDA and SCL signals - 300 ns fall time tf [4][5][6][7] Standard-mode tLOW tHIGH tHD;DAT tSU;DAT LOW period of the SCL clock HIGH period of the SCL clock data hold time data set-up time [3][4][8] [9][10] Fast-mode 20 + 0.1  Cb 300 ns Fast-mode Plus - 120 ns Standard-mode 4.7 - s Fast-mode 1.3 - s Fast-mode Plus 0.5 - s Standard-mode 4.0 - s Fast-mode 0.6 - s Fast-mode Plus 0.26 - s Standard-mode 0 - s Fast-mode 0 - s Fast-mode Plus 0 - s Standard-mode 250 - ns Fast-mode 100 - ns Fast-mode Plus 50 - ns [1] See the I2C-bus specification UM10204 for details. [2] Parameters are valid over operating temperature range unless otherwise specified. [3] tHD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission and the acknowledge. [4] A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the VIH(min) of the SCL signal) to bridge the undefined region of the falling edge of SCL. [5] Cb = total capacitance of one bus line in pF. [6] The maximum tf for the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA output stage tf is specified at 250 ns. This allows series protection resistors to be connected in between the SDA and the SCL pins and the SDA/SCL bus lines without exceeding the maximum specified tf. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 42 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller [7] In Fast-mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors are used, designers should allow for this when considering bus timing. [8] The maximum tHD;DAT could be 3.45 s and 0.9 s for Standard-mode and Fast-mode but must be less than the maximum of tVD;DAT or tVD;ACK by a transition time (see UM10204). This maximum must only be met if the device does not stretch the LOW period (tLOW) of the SCL signal. If the clock stretches the SCL, the data must be valid by the set-up time before it releases the clock. [9] tSU;DAT is the data set-up time that is measured with respect to the rising edge of SCL; applies to data in transmission and the acknowledge. [10] A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system but the requirement tSU;DAT = 250 ns must then be met. This will automatically be the case if the device does not stretch the LOW period of the SCL signal. If such a device does stretch the LOW period of the SCL signal, it must output the next data bit to the SDA line tr(max) + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification) before the SCL line is released. Also the acknowledge timing must meet this set-up time. tf SDA tSU;DAT 70 % 30 % 70 % 30 % tHD;DAT tf 70 % 30 % SCL tVD;DAT tHIGH 70 % 30 % 70 % 30 % 70 % 30 % tLOW S 1 / fSCL 002aaf425 Fig 22. I2C-bus pins clock timing LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 43 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 10.6 SSP interface Table 16. Dynamic characteristics of SPI pins in SPI mode Symbol Parameter Conditions Min Typ Max Unit - - ns - - SPI master (in SPI mode) Tcy(clk) full-duplex mode [1] 50 when only transmitting [1] 40 in SPI mode [2] 15 2.0 V  VDD < 2.4 V [2] 20 1.8 V  VDD < 2.0 V [2] 24 - - ns in SPI mode [2] 0 - - ns data output valid time in SPI mode [2] - - 10 ns data output hold time in SPI mode [2] 0 - - ns clock cycle time data set-up time tDS ns ns 2.4 V  VDD  3.6 V data hold time tDH tv(Q) th(Q) ns SPI slave (in SPI mode) Tcy(PCLK) PCLK cycle time data set-up time tDS 20 - - ns in SPI mode [3][4] 0 - - ns tDH data hold time in SPI mode [3][4] 3  Tcy(PCLK) + 4 - - ns tv(Q) data output valid time in SPI mode [3][4] - - 3  Tcy(PCLK) + 11 ns th(Q) data output hold time in SPI mode [3][4] - - 2  Tcy(PCLK) + 5 ns [1] Tcy(clk) = (SSPCLKDIV  (1 + SCR)  CPSDVSR) / fmain. The clock cycle time derived from the SPI bit rate Tcy(clk) is a function of the main clock frequency fmain, the SPI peripheral clock divider (SSPCLKDIV), the SPI SCR parameter (specified in the SSP0CR0 register), and the SPI CPSDVSR parameter (specified in the SPI clock prescale register). [2] Tamb = 40 C to 85 C. [3] Tcy(clk) = 12  Tcy(PCLK). [4] Tamb = 25 C; for normal voltage supply range: VDD = 3.3 V. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 44 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Tcy(clk) SCK (CPOL = 0) SCK (CPOL = 1) tv(Q) th(Q) DATA VALID MOSI DATA VALID tDS DATA VALID MISO tDH DATA VALID tv(Q) MOSI th(Q) DATA VALID DATA VALID tDH tDS MISO CPHA = 1 DATA VALID CPHA = 0 DATA VALID 002aae829 Fig 23. SSP master timing in SPI mode LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 45 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller Tcy(clk) SCK (CPOL = 0) SCK (CPOL = 1) tDS MOSI DATA VALID tDH DATA VALID tv(Q) MISO th(Q) DATA VALID DATA VALID tDS MOSI DATA VALID tDH DATA VALID tv(Q) MISO DATA VALID CPHA = 1 th(Q) CPHA = 0 DATA VALID 002aae830 Fig 24. SSP slave timing in SPI mode LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 46 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 11. Application information 11.1 XTAL input The input voltage to the on-chip oscillators is limited to 1.8 V. If the oscillator is driven by a clock in slave mode, it is recommended that the input be coupled through a capacitor with Ci = 100 pF. To limit the input voltage to the specified range, choose an additional capacitor to ground Cg which attenuates the input voltage by a factor Ci/(Ci + Cg). In slave mode, a minimum of 200 mV(RMS) is needed. LPC1xxx XTALIN Ci 100 pF Cg 002aae788 Fig 25. Slave mode operation of the on-chip oscillator In slave mode, couple the input clock signal with a capacitor of 100 pF (Figure 25), with an amplitude between 200 mV(RMS) and 1000 mV(RMS). This signal corresponds to a square wave signal with a signal swing of between 280 mV and 1.4 V. The XTALOUT pin in this configuration can be left unconnected. External components and models used in oscillation mode are shown in Figure 26 and in Table 17 and Table 18. Since the feedback resistance is integrated on chip, only a crystal and the capacitances CX1 and CX2 need to be connected externally in case of fundamental mode oscillation (L, CL and RS represent the fundamental frequency). Capacitance CP in Figure 26 represents the parallel package capacitance and must not be larger than 7 pF. Parameters FOSC, CL, RS and CP are supplied by the crystal manufacturer. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 47 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller LPC1xxx L XTALIN XTALOUT = CL CP XTAL RS CX2 CX1 002aaf424 Fig 26. Oscillator modes and models: oscillation mode of operation and external crystal model used for CX1/CX2 evaluation Table 17. Recommended values for CX1/CX2 in oscillation mode (crystal and external components parameters) low frequency mode Fundamental oscillation frequency FOSC Crystal load capacitance CL Maximum crystal series resistance RS External load capacitors CX1, CX2 1 MHz to 5 MHz 10 pF < 300  18 pF, 18 pF 20 pF < 300  39 pF, 39 pF 5 MHz to 10 MHz 10 MHz to 15 MHz 15 MHz to 20 MHz Table 18. 30 pF < 300  57 pF, 57 pF 10 pF < 300  18 pF, 18 pF 20 pF < 200  39 pF, 39 pF 30 pF < 100  57 pF, 57 pF 10 pF < 160  18 pF, 18 pF 20 pF < 60  39 pF, 39 pF 10 pF < 80  18 pF, 18 pF Recommended values for CX1/CX2 in oscillation mode (crystal and external components parameters) high frequency mode Fundamental oscillation frequency FOSC Crystal load capacitance CL Maximum crystal series resistance RS External load capacitors CX1, CX2 15 MHz to 20 MHz 10 pF < 180  18 pF, 18 pF 20 pF < 100  39 pF, 39 pF 20 MHz to 25 MHz 10 pF < 160  18 pF, 18 pF 20 pF < 80  39 pF, 39 pF 11.2 XTAL Printed-Circuit Board (PCB) layout guidelines Follow these guidelines for PCB layout: • Connect the crystal on the PCB as close as possible to the oscillator input and output pins of the chip. • Take care that the load capacitors Cx1, Cx2, and Cx3 in case of third overtone crystal use have a common ground plane. LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 48 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller • Connect the external components to the ground plain. • To keep parasitics and the noise coupled in via the PCB as small as possible, keep loops as small as possible. • Choose smaller values of Cx1 and Cx2 if parasitics of the PCB layout increase. 11.3 Standard I/O pad configuration Figure 27 shows the possible pin modes for standard I/O pins with analog input function: • • • • • Digital output driver Digital input: Pull-up enabled/disabled Digital input: Pull-down enabled/disabled Digital input: Repeater mode enabled/disabled Analog input VDD VDD open-drain enable pin configured as digital output driver strong pull-up output enable ESD data output PIN strong pull-down ESD VSS VDD weak pull-up pull-up enable weak pull-down repeater mode enable pin configured as digital input pull-down enable data input 10 ns RC GLITCH FILTER select data inverter select glitch filter select analog input pin configured as analog input analog input 002aaf695 Fig 27. Standard I/O pad configuration LPC11E1X Product data sheet All information provided in this document is subject to legal disclaimers. Rev. 1.1 — 24 September 2013 © NXP B.V. 2013. All rights reserved. 49 of 62 LPC11E1x NXP Semiconductors 32-bit ARM Cortex-M0 microcontroller 11.4 Reset pad configuration VDD VDD VDD Rpu ESD 20 ns RC GLITCH FILTER reset PIN ESD VSS 002aaf274 Fig 28. Reset pad configuration 11.5 ADC effective input impedance A simplified diagram of the ADC input channels can be used to determine the effective input impedance seen from an external voltage source. See Figure 29. ADC Block Source ADC COMPARATOR Rmux Rsw
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