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HGTG5N120BND, HGTP5N120BND
Data Sheet
May 2003
21A, 1200V, NPT Series N-Channel IGBTs
with Anti-Parallel Hyperfast Diodes
The HGTG5N120BND and HGTP5N120BND are NonPunch Through (NPT) IGBT designs. They are new
members of the MOS gated high voltage switching IGBT
family. IGBTs combine the best features of MOSFETs and
bipolar transistors. This device has the high input impedance
of a MOSFET and the low on-state conduction loss of a
bipolar transistor. The IGBT used is the development type
TA49308. The Diode used is the development type TA49058
(Part number RHRD6120).
The IGBT is ideal for many high voltage switching
applications operating at moderate frequencies where low
conduction losses are essential, such as: AC and DC motor
controls, power supplies and drivers for solenoids, relays
and contactors.
Features
• 21A, 1200V, TC = 25oC
• 1200V Switching SOA Capability
• Typical Fall Time . . . . . . . . . . . . . . . . 175ns at TJ = 150oC
• Short Circuit Rating
• Low Conduction Loss
• Thermal Impedance SPICE Model
Temperature Compensating SABER™ Model
www.fairchildsemi.com
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Packaging
JEDEC STYLE TO-247
Formerly Developmental Type TA49306.
E
Ordering Information
PART NUMBER
C
COLLECTOR
(FLANGE)
PACKAGE
G
BRAND
HGTG5N120BND
TO-247
5N120BND
HGTP5N120BND
TO-220AB
5N120BND
NOTE: When ordering, use the entire part number. i.e.,
HGTG5N120BND.
JEDEC TO-220AB (ALTERNATE VERSION)
Symbol
C
COLLECTOR
(FLANGE)
E
G
G
C
E
FAIRCHILD SEMICONDUCTOR IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073
4,417,385
4,430,792
4,443,931
4,466,176
4,516,143
4,532,534
4,587,713
4,598,461
4,605,948
4,620,211
4,631,564
4,639,754
4,639,762
4,641,162
4,644,637
4,682,195
4,684,413
4,694,313
4,717,679
4,743,952
4,783,690
4,794,432
4,801,986
4,803,533
4,809,045
4,809,047
4,810,665
4,823,176
4,837,606
4,860,080
4,883,767
4,888,627
4,890,143
4,901,127
4,904,609
4,933,740
4,963,951
4,969,027
©2003 Fairchild Semiconductor Corporation
HGTG5N120BND, HGTP5N120BND, Rev. B1
HGTG5N120BND, HGTP5N120BND
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specified
HGTG5N120BND
HGTP5N120BND
UNITS
1200
V
At TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IC25
21
A
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IC110
10
A
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ICM
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGES
40
A
±20
V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGEM
±30
V
Switching Safe Operating Area at TJ = 150oC (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . SSOA
30A at 1200V
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .BVCES
Collector Current Continuous
Power Dissipation Total at TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD
167
W
Power Dissipation Derating TC > 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.33
W/oC
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG
-55 to 150
oC
300
oC
260
oC
Short Circuit Withstand Time (Note 2) at VGE = 15V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .tSC
8
µs
Short Circuit Withstand Time (Note 2) at VGE = 12V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .tSC
15
µs
Maximum Lead Temperature for Soldering
Leads at 0.063in (1.6mm) from case for 10s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
Package Body for 10s, see Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Tpkg
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. Pulse width limited by maximum junction temperature.
2. VCE(PK) = 840V, TJ = 125oC, RG = 25Ω.
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
PARAMETER
Collector to Emitter Breakdown Voltage
Collector to Emitter Leakage Current
Collector to Emitter Saturation Voltage
Gate to Emitter Threshold Voltage
Gate to Emitter Leakage Current
SYMBOL
BVCES
ICES
VCE(SAT)
VGE(TH)
IGES
TEST CONDITIONS
IC = 250µA, VGE = 0V
VCE = 1200V
IC = 5A,
VGE = 15V
-
V
-
-
250
µA
TC = 125oC
-
100
-
µA
TC = 150oC
-
-
1.5
mA
TC = 25oC
-
2.45
2.7
V
TC = 150oC
-
3.7
4.2
V
6.0
6.8
-
V
-
-
±250
nA
30
-
-
A
-
10.5
-
V
VGE = 15V
-
53
65
nC
VGE = 20V
-
60
72
nC
-
22
25
ns
-
15
20
ns
-
160
180
ns
-
130
160
ns
-
450
600
µJ
-
390
450
µJ
VGE = ±20V
SSOA
Gate to Emitter Plateau Voltage
VGEP
IC = 5A, VCE = 600V
Current Turn-On Delay Time
Current Rise Time
Current Turn-Off Delay Time
td(ON)I
trI
td(OFF)I
Current Fall Time
tfI
Turn-On Energy
EON
Turn-Off Energy (Note 3)
EOFF
©2003 Fairchild Semiconductor Corporation
UNITS
-
IC = 45µA, VCE = VGE
IC = 5A,
VCE = 600V
MAX
1200
Switching SOA
QG(ON)
TYP
TC = 25oC
TJ = 150oC, RG = 25Ω, VGE = 15V,
L = 5mH, VCE(PK) = 1200V
On-State Gate Charge
MIN
IGBT and Diode at TJ = 25oC,
ICE = 5A,
VCE = 960V,
VGE = 15V,
RG = 25Ω,
L = 5mH,
Test Circuit (Figure 20)
HGTG5N120BND, HGTP5N120BND, Rev. B1
HGTG5N120BND, HGTP5N120BND
Electrical Specifications
TC = 25oC, Unless Otherwise Specified (Continued)
PARAMETER
SYMBOL
Current Turn-On Delay Time
td(ON)I
Current Rise Time
trI
Current Turn-Off Delay Time
td(OFF)I
Current Fall Time
tfI
Turn-On Energy
EON
Turn-Off Energy (Note 3)
EOFF
Diode Forward Voltage
VEC
Diode Reverse Recovery Time
trr
Thermal Resistance Junction To Case
RθJC
TEST CONDITIONS
MIN
TYP
MAX
UNITS
-
20
25
ns
-
15
20
ns
-
182
280
ns
-
175
200
ns
-
1000
1300
µJ
-
560
800
µJ
IEC = 10A
-
2.70
3.50
V
IEC = 7A, dlEC/dt = 200A/µs
-
50
65
ns
IEC = 1A, dlEC/dt = 200A/µs
-
30
40
ns
IGBT
-
-
0.75
oC/W
Diode
-
-
1.75
oC/W
IGBT and Diode at TJ = 150oC,
ICE = 5A,
VCE = 960V,
VGE = 15V,
RG = 25Ω,
L = 5mH,
Test Circuit (Figure 20)
NOTE:
3. Turn-Off Energy Loss (EOFF) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and
ending at the point where the collector current equals zero (ICE = 0A). All devices were tested per JEDEC Standard No. 24-1 Method for
Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
Unless Otherwise Specified
ICE , DC COLLECTOR CURRENT (A)
25
VGE = 15V
20
15
10
5
0
25
50
75
100
125
TC , CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
©2003 Fairchild Semiconductor Corporation
150
ICE, COLLECTOR TO EMITTER CURRENT (A)
Typical Performance Curves
35
TJ = 150oC, RG = 25Ω, VGE = 15V, L = 5mH
30
25
20
15
10
5
0
0
200
400
600
800
1000
1200
1400
VCE , COLLECTOR TO EMITTER VOLTAGE (V)
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
HGTG5N120BND, HGTP5N120BND, Rev. B1
HGTG5N120BND, HGTP5N120BND
Unless Otherwise Specified (Continued)
TJ = 150oC, RG = 25Ω, L = 5mH, V CE = 960V
TC = 75oC, VGE = 15V TC VGE
IDEAL DIODE
75oC 15V
75oC 12V
200
100
50
fMAX1 = 0.05 / (td(OFF)I + td(ON)I)
fMAX2 = (PD - PC) / (EON + EOFF)
PC = CONDUCTION DISSIPATION
(DUTY FACTOR = 50%)
RØJC = 0.75oC/W, SEE NOTES
10
2
TC VGE
110oC 15V
110oC 12V
6
8
4
ICE , COLLECTOR TO EMITTER CURRENT (A)
80
40
VCE = 840V, RG = 25Ω, TJ = 125oC
35
70
ISC
30
60
25
50
20
40
tSC
15
10
10
30
10
DUTY CYCLE