May 1996
NDS8435
Single P-Channel Enhancement Mode Field Effect Transistor
General Description
Features
SO-8 P-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high
density process is especially tailored to minimize on-state
resistance and provide superior switching performance.
These devices are particularly suited for low voltage
applications such as notebook computer power
management and other battery powered circuits where
fast switching, low in-line power loss, and resistance to
transients are needed.
-7A, -30V. RDS(ON) = 0.028Ω @ VGS = -10V
RDS(ON) = 0.045Ω @ VGS = -4.5V.
High density cell design for extremely low RDS(ON).
High power and current handling capability in a widely used
surface mount package.
___________________________________________________________________________________________
Absolute Maximum Ratings
4
6
3
7
2
8
1
T A = 25°C unless otherwise noted
Symbol
Parameter
VDSS
VGSS
ID
Drain Current - Continuous
PD
Maximum Power Dissipation
NDS8435
Units
Drain-Source Voltage
-30
V
Gate-Source Voltage
-20
V
-7
A
(Note 1a)
- Pulsed
TJ,TSTG
5
-25
(Note 1a)
2.5
(Note 1b)
1.2
(Note 1c)
1
Operating and Storage Temperature Range
W
-55 to 150
°C
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
50
°C/W
RθJC
Thermal Resistance, Junction-to-Case
(Note 1)
25
°C/W
© 1997 Fairchild Semiconductor Corporation
NDS8435 Rev. B2
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
-30
Typ
Max
Units
-1
µA
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
IDSS
Zero Gate Voltage Drain Current
VDS = -24 V, VGS = 0 V
V
-10
µA
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
100
nA
IGSSR
Gate - Body Leakage, Reverse
VGS = -20 V, VDS= 0 V
-100
nA
V
TJ = 55°C
ON CHARACTERISTICS (Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
TJ = 125°C
RDS(ON)
Static Drain-Source On-Resistance
-1
-1.5
-3
-0.7
-1.1
-2.2
0.023
0.028
0.038
0.06
0.037
0.045
VGS = -10 V, ID = -7.0 A
TJ = 125°C
VGS = -4.5 V, ID = -5.8 A
ID(on)
On-State Drain Current
gFS
Forward Transconductance
VGS = -10 V, VDS = -5 V
-25
VGS = -4.5, VDS = -5 V
-10
Ω
A
VDS = -10 V, ID = -7.0 A
10
S
VDS = -15 V, VGS = 0 V,
f = 1.0 MHz
1500
pF
950
pF
370
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS (Note 2)
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
12
30
ns
18
30
ns
tD(off)
tf
Turn - Off Delay Time
65
120
ns
Turn - Off Fall Time
49
80
ns
Qg
Total Gate Charge
Qgs
Gate-Source Charge
47
60
nC
Qgd
Gate-Drain Charge
VDD = -10 V, ID = -1 A,
VGEN = -10 V, RGEN = 6 Ω
VDS = -15 V,
ID = -7.0 A, VGS = -10 V
5.5
nC
14
nC
NDS8435 Rev. B2
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
-2.1
A
-1.2
V
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -2.1 A
-0.8
(Note 2)
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
PD (t ) =
T J−TA
R θJ A(t )
=
T J−TA
R θJ C+RθCA(t )
= I 2D (t ) × RDS(ON )
TJ
Typical RθJA using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
a. 50oC/W when mounted on a 1 in2 pad of 2oz copper.
b. 105oC/W when mounted on a 0.04 in2 pad of 2oz copper.
c. 125oC/W when mounted on a 0.006 in2 pad of 2oz copper.
1a
1b
1c
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDS8435 Rev. B2
Typical Electrical Characteristics
3
-6.0 -5.0-4.5
-25
-4.0
-20
R DS(on), NORMALIZED
I D , DRAIN-SOURCE CURRENT (A)
VGS = -10V
-3.5
-15
-3.0
-10
-5
-2.5
DRAIN-SOURCE ON-RESISTANCE
-30
0
VGS = -3.0V
2.5
-3.5
2
-4.0
-4.5
1.5
-5.0
-6.0
-10
1
0.5
0
-0.5
-1
-1.5
-2
V DS , DRAIN-SOURCE VOLTAGE (V)
-2.5
0
-3
Figure 1. On-Region Characteristics.
I D =-7.0A
1.4
R DS(on) , NORMALIZED
V GS = -10V
1.2
1
0.8
DRAIN-SOURCE ON-RESISTANCE
R DS(ON), NORMALIZED
-25
-30
2
0.6
-50
V GS = -10V
T J = 125°C
1.5
25°C
1
-55°C
0.5
-25
0
25
50
75
100
125
150
0
-5
TJ , JUNCTION TEMPERATURE (°C)
-10
-15
-20
-25
-30
I D , DRAIN CURRENT (A)
Figure 4. On-Resistance Variation
with Drain Current and Temperature.
Figure 3. On-Resistance Variation
with Temperature.
1.2
V DS = -10V
T = -55°C
J
125°C
-16
V th , NORMALIZED
25°C
-12
-8
-4
0
-1
-2
-3
-4
-5
V GS , GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
-6
GATE-SOURCE THRESHOLD VOLTAGE
-20
ID , DRAIN CURRENT (A)
-10
-15
-20
I D , DRAIN CURRENT (A)
Figure 2. On-Resistance Variation
with Drain Current and Gate Voltage.
1.6
DRAIN-SOURCE ON-RESISTANCE
-5
VDS = VGS
1.1
I D = -250µA
1
0.9
0.8
0.7
0.6
-50
-25
0
25
50
75
100
TJ , JUNCTION TEMPERATURE (°C)
125
150
Figure 6. Gate Threshold Variation
with Temperature.
NDS8435 Rev. B2
Typical Electrical Characteristics (continued)
20
I D = -250µA
1.08
1.06
1.04
1.02
1
0.98
0.96
0.94
-50
-25
0
V GS = 0V
10
-I S , REVERSE DRAIN CURRENT (A)
BV DSS, NORMALIZED
DRAIN-SOURCE BREAKDOWN VOLTAGE
1.1
25
50
75
100
125
5
T = 125°C
J
1
0.01
0.4
T J , JUNCTION TEMPERATURE (°C)
0.6
0.8
1.2
Figure 8. Body Diode Forward Voltage Variation
with Source Current and
Temperature.
10
4000
V DS = -5.0V
-V GS , GATE-SOURCE VOLTAGE (V)
I D = -7.0A
2000
CAPACITANCE (pF)
1
-VSD , BODY DIODE FORWARD VOLTAGE (V)
Figure 7. Breakdown Voltage
Variation with Temperature.
C iss
C oss
1000
800
500
C rss
f = 1 MHz
V GS = 0V
300
200
0.1
-15V
8
-10V
6
4
2
0
0.2
0.5
1
2
5
10
30
0
10
-V DS , DRAIN TO SOURCE VOLTAGE (V)
30
40
50
Figure 10. Gate Charge Characteristics.
t on
-VDD
t d(on)
t off
tr
RL
V IN
20
Q g , GATE CHARGE (nC)
Figure 9. Capacitance Characteristics.
t d(off)
tf
90%
90%
V OUT
D
VGS
-55°C
0.1
0.001
0.2
150
25°C
0.5
VOUT
R GEN
10%
10%
DUT
G
90%
S
V IN
50%
50%
10%
PULSE W IDTH
Figure 11. Switching Test Circuit.
INVERTED
Figure 12. Switching Waveforms.
NDS8435 Rev. B2
Typical Electrical and Thermal Characteristics (continued)
25
2.5
STEADY-STATE POWER DISSIPATION (W)
TJ = -55°C
20
25°C
15
125°C
10
5
g
FS
, TRANSCONDUCTANCE (SIEMENS)
V DS = -10V
0
0
-5
-10
-15
-20
I D , DRAIN CURRENT (A)
-25
-30
1.5
1b
1c
1
4.5"x5" FR-4 Board
o
TA = 2 5 C
Still Air
0.5
0
Figure 13. Transconductance Variation with Drain
Current and Temperature.
0.2
0.4
0.6
0.8
2oz COPPER MOUNTING PAD AREA (in 2 )
50
30
10
-I D , DRAIN CURRENT (A)
1a
7
6
1b
1c
5
1
Figure 14. SO-8 Maximum Steady-State Power
Dissipation versus Copper Mounting Pad Area.
8
4.5"x5" FR-4 Board
IM
)L
10
IT
1m
10
10
1
0m
0u
s
s
ms
s
1s
10
0.3
V
0.1
0.03
Still Air
RD
N
S(O
3
TA = 2 5 o C
GS
DC
= -10V
s
SINGLE PULSE
RθJ A = See Note 1c
TA = 25°C
VG S = - 1 0 V
4
0
0.2
0.4
0.6
0.8
2oz COPPER MOUNTING PAD AREA (in 2 )
0.01
0.1
1
0.2
0.5
1
2
5
10
- V DS , DRAIN-SOURCE VOLTAGE (V)
30
50
Figure 16. Maximum Safe Operating Area.
Figure 15. Maximum Steady-State Drain
Current versus Copper Mounting Pad
Area.
TRANSIENT THERMAL RESISTANCE
1
r(t), NORMALIZED EFFECTIVE
-I D , STEADY-STATE DRAIN CURRENT (A)
1a
2
0 .5
D = 0.5
0 .2
0.2
0 .1
0 .0 5
R JA (t) = r(t) * R JA
θ
θ
R JA = See Note 1c
θ
0.1
0.05
P(pk)
0.02
0 .0 2
0.01
0 .0 1
t1
Single Pulse
0 .0 0 5
t2
TJ - T
= P * R JA (t)
θ
Duty Cycle, D = t 1 / t 2
A
0 .0 0 2
0 .0 0 1
0 .0001
0 .001
0 .0 1
0 .1
1
10
100
300
t 1 , TIME (sec)
Figure 17. Transient Thermal Response Curve.
Note:
Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change
depending on the circuit board design.
NDS8435 Rev. B2