STP10NK50Z
N-channel 500 V, 0.55 Ω, 9 A Zener-protected SuperMESH™
Power MOSFETs in TO-220 package
Datasheet — obsolete product
Features
Order code
VDSS
RDS(on) max
ID
PTOT
STP10NK50Z
500 V
< 0.7 Ω
9A
125 W
■
Extremely high dv/dt capability
■
100% avalanche tested
■
Gate charge minimized
■
Very low intrinsic capacitances
■
Very good manufacturing repeatability
TAB
du
3
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1
2
TO-220
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Applications
■
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Switching application
)
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Description
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Figure 1.
These devices are N-channel Zener-protected
Power MOSFETs developed using
STMicroelectronics’ SuperMESH™ technology,
achieved through optimization of ST’s well
established strip-based PowerMESH™ layout. In
addition to a significant reduction in onresistance, this device is designed to ensure a
high level of dv/dt capability for the most
demanding applications.
Internal schematic diagram
D(2)
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G(1)
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S(3)
AM01476v1
Table 1.
Device summary
Order code
Marking
Package
Packaging
STP10NK50Z
P10NK50Z
TO-220
Tube
March 2012
This is information on a discontinued product.
Doc ID 11466 Rev 3
1/12
www.st.com
12
Contents
STP10NK50Z
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1
Electrical characteristics (curves)
............................. 6
3
Test circuit
................................................ 8
4
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
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Doc ID 11466 Rev 3
STP10NK50Z
1
Electrical ratings
Electrical ratings
Table 2.
Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDSS
Drain-source voltage
500
V
VGS
Gate-source voltage
± 30
V
ID
Drain current (continuous) at TC = 25 °C
9
A
ID
A
Drain current (continuous) at TC=100 °C
5.7
IDM(1)
Drain current (pulsed)
36
PTOT
Total dissipation at TC = 25 °C
125
Derating factor
dv/dt(2)
TJ
du
ro
4000
P
e
Peak diode recovery voltage slope
let
Operating junction temperature
Storage temperature
Tstg
W
1
Vesd(G-S) G-S ESD (HBM C=100 pF, R=1.5 kΩ)
o
s
b
1. Pulse width limited by safe operating area.
)
s
(
ct
A
W/°C
V
4.5
V/ns
-55 to 150
°C
Value
Unit
1
°C/W
2. ISD ≤9 A, di/dt ≤200 A/µs,VDD ≤V(BR)DSS, Tj ≤TJMAX
Table 3.
s
(
t
c
Thermal data
Symbol
Rthj-case
Parameter
u
d
o
Thermal resistance junction-case max
Pr
Rthj-a
Thermal resistance junction-ambient max
62.5
°C/W
Tl
Maximum lead temperature for soldering
purpose
300
°C
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Table 4.
Avalanche characteristics
Symbol
Parameter
Value
Unit
IAS
Avalanche current, repetitive or not-repetitive
(pulse width limited by Tj max)
9
A
EAS
Single pulse avalanche energy
(starting Tj=25°C, ID=IAR, VDD=50 V)
230
mJ
Doc ID 11466 Rev 3
3/12
Electrical characteristics
2
STP10NK50Z
Electrical characteristics
(TCASE=25°C unless otherwise specified)
Table 5.
On/off states
Symbol
V(BR)DSS
Parameter
Drain-source breakdown
voltage
Gate body leakage current
(VDS = 0)
VGS = ±20 V
VGS(th)
Gate threshold voltage
VDS= VGS, ID = 100 µA
RDS(on)
Static drain-source on
resistance
VGS= 10 V, ID= 4.5 A
Ciss
Coss
Crss
Input capacitance
Output capacitance
Reverse transfer
capacitance
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Coss eq(1). Equivalent output
capacitance
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Qg
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Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain charge
Unit
V
3.75
s
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1
50
µA
µA
±10
µA
4.5
V
0.7
Ω
)
s
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ct
u
d
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3
r
P
e
Test conditions
)-
Max.
VDS = 500 V, TC = 125 °C
t
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Parameter
Typ.
VDS = 500 V
IGSS
Dynamic
Min.
500
Zero gate voltage drain
current (VGS = 0)
Symbol
4/12
ID = 1 mA, VGS= 0
IDSS
Table 6.
s
b
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Test conditions
0.55
Min.
Typ.
Max.
Unit
VDS =25 V, f=1 MHz, VGS=0
-
1219
159
40
-
pF
pF
pF
VGS=0, VDS =0 to 640 V
-
806
-
pF
-
39.2
7.42
20.7
-
nC
nC
nC
VDD=400 V, ID = 9 A
VGS =10 V
See Figure 15
1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
inceases from 0 to 80% VDSS
Doc ID 11466 Rev 3
STP10NK50Z
Electrical characteristics
Table 7.
Switching times
Symbol
td(on)
tr
td(off)
tf
Parameter
Turn-on delay time
Rise time
VDD=250 V, ID=4.5A,
Min.
Typ.
Max.
Unit
-
19
17
-
ns
ns
-
43
15
-
ns
ns
Min
Typ.
Max
RG=4.7Ω, VGS=10V
Turn-off delay Time
Fall time
Table 8.
See Figure 16
Source drain diode
Symbol
ISD
Test conditions
Parameter
Test conditions
Source-drain current
-
ISDM(1)
Source-drain current (pulsed)
-
VSD(2)
Forward on voltage
ISD=9 A, VGS=0
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD=9 A,
trr
Qrr
IRRM
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
)
(s
ete
uc
od
Pr
-
ol
-
268
1.83
13.7
di/dt = 100 A/µs,
VDD=35 V, Tj=150 °C
-
343
2.6
15.15
Min.
Typ.
di/dt = 100 A/µs,
VDD=35 V
s
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)
s
(
t
ISD=9 A,
Unit
9
A
36
A
1.6
V
ns
µC
A
ns
µC
A
t
c
u
1. Pulse width limited by safe operating area
2. Pulsed: pulse duration=300µs, duty cycle 1.5%
Table 9.
P
e
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r
Symbol
t
e
l
o
Gate-source zener diode
Parameter
Test conditions
BVGSO(1) Gate-source breakdown voltage Igs=±1 mA (open drain)
O
bs
30
Max.
Unit
-
V
1. The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
Doc ID 11466 Rev 3
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Electrical characteristics
STP10NK50Z
2.1
Electrical characteristics (curves)
Figure 2.
Safe operating area
Figure 3.
Thermal impedance
)
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Figure 4.
Output characterisics
Figure 5.
u
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P
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Transfer characteristics
t
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)
(s
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let
Figure 6.
o
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b
Normalized BVDSS vs temperature
Figure 7.
O
6/12
Doc ID 11466 Rev 3
Static drain-source on resistance
STP10NK50Z
Figure 8.
Electrical characteristics
Gate charge vs gate-source voltage Figure 9.
Figure 10. Normalized gate threshold voltage
vs temperature
Capacitance variations
)
s
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ct
u
d
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Figure 11. Normalized on resistance vs
temperature
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Figure 12. Source-drain diode forward
characteristics
t
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Figure 13. Maximum avalanche energy vs
temperature
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Test circuit
3
STP10NK50Z
Test circuit
Figure 14. Switching times test circuit for
resistive load
Figure 15. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
3.3
μF
2200
RL
μF
IG=CONST
VDD
VGS
100Ω
Vi=20V=VGMAX
VD
RG
2200
μF
D.U.T.
)
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(
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VG
2.7kΩ
c
u
d
PW
47kΩ
1kΩ
PW
D.U.T.
AM01468v1
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AM01469v1
Figure 16. Test circuit for inductive load
Figure 17. Unclamped inductive load test
switching and diode recovery times
circuit
A
A
D.U.T.
FAST
DIODE
B
B
A
D
G
S
s
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t
c
3.3
μF
B
25 Ω
D
1000
μF
RG
S
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P
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2200
μF
3.3
μF
VDD
ID
Vi
D.U.T.
Pw
let
AM01470v1
Figure 18. Unclamped inductive waveform
b
O
L
VD
VDD
u
d
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G
so
)-
L=100μH
s
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AM01471v1
Figure 19. Switching time waveform
ton
V(BR)DSS
tdon
VD
toff
tr
tdoff
tf
90%
90%
IDM
10%
ID
VDD
10%
0
VDD
VDS
90%
VGS
AM01472v1
8/12
0
Doc ID 11466 Rev 3
10%
AM01473v1
STP10NK50Z
4
Package mechanical data
Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com. ECOPACK
is an ST trademark.
Table 10.
TO-220 type A mechanical data
mm
Dim.
Min.
Typ.
4.40
4.60
b
0.61
0.88
b1
1.14
c
0.48
D
15.25
u
d
o
1.70
e
t
e
ol
1.27
E
10
e
2.40
e1
4.95
F
1.23
6.20
J1
u
d
o
L
Pr
L1
b
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)
s
(
ct
H1
so
)
s
(
ct
A
D1
-O
Pr
0.70
15.75
10.40
2.70
5.15
1.32
6.60
2.40
2.72
13
14
3.50
3.93
L20
16.40
L30
28.90
e
t
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Max.
∅P
3.75
3.85
Q
2.65
2.95
Doc ID 11466 Rev 3
9/12
Package mechanical data
STP10NK50Z
Figure 20. TO-220 type A drawing
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STP10NK50Z
5
Revision history
Revision history
Table 11.
Document revision history
Date
Revision
Changes
01-Jul-2005
1
First release.
08-Sep-2005
2
Inserted ecopack indication
15-Mar-2012
3
The part number STF10NK50Z has been moved to a separate
datasheet.
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Doc ID 11466 Rev 3
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STP10NK50Z
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Please Read Carefully:
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