SiHS20N50C
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Power MOSFET
FEATURES
D
• Low figure-of-merit Ron x Qg
SUPER-247
• 100 % avalanche tested
• High peak current capability
G
• dv/dt ruggedness
S
• Improved trr/Qrr
D
G
• Improved gate charge
S
• High power dissipations capability
N-Channel MOSFET
• Material categorization: for definitions of compliance
please see www.vishay.com/doc?99912
PRODUCT SUMMARY
VDS (V) at TJ max.
RDS(on) ()
560
VGS = 10 V
Qg max. (nC)
0.270
76
Qgs (nC)
21
Qgd (nC)
34
Configuration
Single
ORDERING INFORMATION
Package
Super-247
Lead (Pb)-free
SiHS20N50C-E3
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
LIMIT
Drain-source voltage
VDS
500
Gate-source voltage
VGS
± 30
Continuous drain current (TJ = 150 °C) a
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed drain current b
UNIT
V
20
ID
11
A
IDM
80
1.8
W/°C
Single pulse avalanche energy c
EAS
361
mJ
Maximum power dissipation
PD
250
W
dv/dt
5
V/ns
TJ, Tstg
-55 to +150
Linear derating factor
Reverse diode dv/dt d
Operating junction and storage temperature range
Soldering recommendations (peak temperature) d
For 10 s
300
°C
Notes
a. Limited by maximum junction temperature
b. Repetitive rating; pulse width limited by maximum junction temperature
c. VDD = 50 V, starting TJ = 25 °C, L = 2.5 mH, Rg = 25 , IAS = 17 A
d. ISD 18 A, di/dt 380 A/μs, VDD VDS, TJ 150 °C
e. 1.6 mm from case
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum junction-to-ambient
RthJA
-
40
Maximum junction-to-case (drain)
RthJC
-
0.5
S17-1726-Rev. C, 20-Nov-17
UNIT
°C/W
Document Number: 91424
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SiHS20N50C
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SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-source breakdown voltage
VDS temperature coefficient
Gate-source threshold voltage (N)
VDS
VGS = 0 V, ID = 250 μA
500
-
-
V
VDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.7
-
V/°C
VGS(th)
VDS = VGS, ID = 250 μA
3.0
-
5.0
V
Gate-source leakage
IGSS
VGS = ± 30 V
-
-
± 100
nA
Zero gate voltage drain current
IDSS
VDS = 500 V, VGS = 0 V
-
-
25
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
250
μA
-
0.225
0.270
gfs
VDS = 50 V, ID = 10 A
-
6.4
-
S
Input capacitance
Ciss
2451
2942
Coss
-
300
360
Reverse transfer capacitance
Crss
VGS = 0 V,
VDS = 25 V,
f = 1 MHz
-
Output capacitance
-
26
32
Drain-source on-state resistance
Forward transconductance
RDS(on)
VGS = 10 V
ID = 10 A
Dynamic
Total gate charge
Qg
Gate-source charge
Qgs
Gate-drain charge
Turn-on delay time
Rise time
Turn-off delay time
pF
-
65
76
-
21
-
Qgd
-
29
-
td(on)
-
80
-
VDD = 250 V, ID = 18 A, Rg = 9.1
-
27
-
-
32
-
-
44
-
f = 1 MHz, open drain
-
1.1
-
-
-
20
S
-
-
80
TJ = 25 °C, IS = 18 A, VGS = 0 V
-
-
1.5
V
-
503
-
ns
-
6.7
-
μC
-
30
-
A
tr
td(off)
Fall time
tf
Gate input resistance
Rg
VGS = 10 V
ID = 18 A, VDS = 400 V
nC
ns
Drain-Source Body Diode Characteristics
Continuous source-drain diode current
IS
Pulsed diode forward current
ISM
Diode forward voltage
VSD
Reverse recovery time
trr
Reverse recovery charge
Qrr
Reverse recovery current
IRRM
S17-1726-Rev. C, 20-Nov-17
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
TJ = 25 °C, IF = IS,
di/dt = 100 A/μs, VR = 35 V
Document Number: 91424
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SiHS20N50C
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70
VGS
Top
15 V
14 V
13 V
12 V
11 V
10 V
9.0 V
8.0 V
7.0 V
6.0 V
Bottom 5.0 V
ID, Drain Current (A)
60
50
40
30
TJ = 25 °C
20
7.0 V
10
0
0
6
12
18
24
RDS(on), Drain-to-Source On Resistance
(Normalized)
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
30
3
ID = 17 A
2.5
2
1.5
VGS = 10 V
1
0.5
0
- 60 - 40 - 20
Fig. 1 - Typical Output Characteristics, TC = 25 °C
Fig. 4 - Normalized On-Resistance vs. Temperature
40
105
VGS
15 V
14 V
13 V
12 V
30
11 V
10 V
9.0 V
8.0 V
7.0 V
20
6.0 V
Bottom 5.0 V
VGS = 0 V, f = 1 MHz
Ciss = Cgs + Cgd, Cds Shorted
Crss = Cgd
Coss = Cds + Cgd
Capacitance (pF)
TJ = 150 °C
Top
ID, Drain Current (A)
20 40 60 80 100 120 140 160
TJ, Junction Temperature (°C)
VDS, Drain-to-Source Voltage (V)
7.0 V
10
0
104
Ciss
103
102
Coss
Crss
10
0
6
12
18
24
30
1
VDS, Drain-to-Source Voltage (V)
10
100
1000
VDS, Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics, TC = 150 °C
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
100
VGS, Gate-to-Source Voltage (V)
20
TJ = 150 °C
ID, Drain Current (A)
0
10
TJ = 25 °C
1
0.1
ID = 17 A
VDS = 400 V
VDS = 250 V
VDS = 100 V
16
12
8
4
0
0.01
5
6
7
8
9
VGS, Gate-to-Source Voltage (V)
Fig. 3 - Typical Transfer Characteristics
S17-1726-Rev. C, 20-Nov-17
10
0
30
60
90
120
QG, Total Gate Charge (nC)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
Document Number: 91424
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ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
SiHS20N50C
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1000
Operation in this area limited
by RDS(on)
TJ = 150 °C
10
ID, Drain Current (A)
ISD, Reverse Drain Current (A)
100
TJ = 25 °C
1
VGS = 0 V
0.1
0.2
0.5
0.8
1.1
100
10
100 µs
1 ms
1
TC = 25 °C
TJ = 150 °C
Single Pulse
10 ms
0.1
100
10
1.4
1000
10 000
VDS, Drain-to-Source Voltage (V)
VSD, Source-to-Drain Voltage (V)
Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 8 - Maximum Safe Operating Area
ID, Drain Current (A)
20
15
10
5
0
25
50
75
100
125
150
TC, Case Temperature (°C)
Fig. 9 - Maximum Drain Current vs. Case Temperature
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4
10-3
10-2
0.1
1
Pulse Time (s)
Fig. 10 - Normalized Thermal Transient Impedance, Junction-to-Case (Super-247)
S17-1726-Rev. C, 20-Nov-17
Document Number: 91424
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SiHS20N50C
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Vishay Siliconix
RD
VDS
QG
10 V
VGS
D.U.T.
QGS
RG
QGD
+
- VDD
VG
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
Charge
Fig. 15 - Basic Gate Charge Waveform
Fig. 11 - Switching Time Test Circuit
Current regulator
Same type as D.U.T.
VDS
90 %
50 kΩ
12 V
0.2 µF
0.3 µF
+
D.U.T.
10 %
VGS
td(on)
VDS
VGS
td(off) tf
tr
-
3 mA
Fig. 12 - Switching Time Waveforms
IG
ID
Current sampling resistors
L
Vary tp to obtain
required IAS
Fig. 16 - Gate Charge Test Circuit
VDS
D.U.T
RG
+
-
IAS
V DD
10 V
0.01 Ω
tp
Fig. 13 - Unclamped Inductive Test Circuit
VDS
tp
VDD
VDS
IAS
Fig. 14 - Unclamped Inductive Waveforms
S17-1726-Rev. C, 20-Nov-17
Document Number: 91424
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ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
SiHS20N50C
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Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
Rg
•
•
•
•
+
dV/dt controlled by Rg
Driver same type as D.U.T.
ISD controlled by duty factor “D”
D.U.T. - device under test
+
-
VDD
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = 10 Va
D.U.T. lSD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Inductor current
VDD
Body diode forward drop
Ripple ≤ 5 %
ISD
Note
a. VGS = 5 V for logic level devices
Fig. 17 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?91424.
S17-1726-Rev. C, 20-Nov-17
Document Number: 91424
6
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THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Package Information
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Vishay Siliconix
TO-274AA (High Voltage)
VERSION 1: FACILITY CODE = Y
B
A
E
E4
A
D2
E1
A1
R
D1
D
L1
L
Detail “A”
C
b
e
A2
0.10 (0.25) M B A M
10°
b4
b2
Lead Tip
5°
Detail “A”
Scale: 2:1
MILLIMETERS
INCHES
MILLIMETERS
INCHES
DIM.
MIN.
MAX.
MIN.
MAX.
DIM.
MIN.
MAX.
MIN.
A
4.70
5.30
0.185
0.209
D1
15.50
16.10
0.610
0.634
A1
1.50
2.50
0.059
0.098
D2
0.70
1.30
0.028
0.051
A2
2.25
2.65
0.089
0.104
E
15.10
16.10
0.594
0.634
13.30
13.90
0.524
0.547
b
1.30
1.60
0.051
0.063
E1
b2
1.80
2.20
0.071
0.087
e
5.45 BSC
MAX.
0.215 BSC
b4
3.00
3.25
0.118
0.128
L
13.70
14.70
0.539
0.579
c (1)
0.38
0.89
0.015
0.035
L1
1.00
1.60
0.039
0.063
D
19.80
20.80
0.780
0.819
R
2.00
3.00
0.079
0.118
Notes
• Dimensioning and tolerancing per ASME Y14.5M-1994
• Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005") per side. These dimensions are measured at
the outer extremes of the plastic body
• Outline conforms to JEDEC® outline to TO-274AA
(1) Dimension measured at tip of lead
Revision: 19-Oct-2020
Document Number: 91365
1
For technical questions, contact: hvm@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Package Information
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Vishay Siliconix
VERSION 2: FACILITY CODE = N
A
E
A
E3
B
D
D1
D2
E2
Q
A2
L1
F
F
H
H
C
G
L
G
A1
e
b
3x
0.25 M B A M
b1
C
b3
E4
E1
b’, b2, b4
C
C’
Base metal
b, b1, b3
Plating
SECTION "F-F", "G-G" AND "H-H"
SCALE: NONE
MILLIMETERS
MILLIMETERS
DIM.
MIN.
MAX.
DIM.
MIN.
MAX.
A
4.83
5.21
D1
16.25
17.65
A1
2.29
2.54
D2
0.50
0.80
A2
1.91
2.16
E
15.75
16.13
b’
1.07
1.28
E1
13.10
14.15
b
1.07
1.33
E2
3.68
5.10
b1
1.91
2.41
E3
1.00
1.90
b2
1.91
2.16
E4
12.38
13.43
b3
2.87
3.38
e
b4
2.87
3.13
N
c’
0.55
0.65
L
19.81
c
0.55
0.68
L1
3.70
4.00
D
20.80
21.10
Q
5.49
6.00
5.44 BSC
3
20.32
ECN: E20-0538-Rev. C, 19-Oct-2020
DWG: 5975
Notes
• Dimensioning and tolerancing per ASME Y14.5M-1994
• Outline conforms to JEDEC® outline to TO-274AD
• Dimensions are measured in mm, angles are in degree
• Metal surfaces are tin plated, except area of cut
Revision: 19-Oct-2020
Document Number: 91365
2
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ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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Revision: 01-Jan-2022
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Document Number: 91000