2SC4881(CANO,F,M)

2SC4881 TOSHIBA Transistor Silicon NPN Epitaxial Type 2SC4881 High-Current Switching Applications • Low saturation voltage: VCE (sat) = 0.4 V (max) • High-speed switching: tstg = 0.8 μs (typ.) Unit: mm Absolute Maximum Ratings (Tc = 25°C) Characteristics Symbol Rating Unit Collector-base voltage VCBO 60 V Collector-emitter voltage VCEO 50 V Emitter-base voltage VEBO 5 V DC IC 5 Pulse ICP 8 IB 1 Collector current Base current Collector power dissipation Ta = 25°C Tc = 25°C Junction temperature Storage temperature range PC 2.0 20 A A W Tj 150 °C Tstg −55 to 150 °C JEDEC ― JEITA ― TOSHIBA 2-10R1A Note: Using continuously under heavy loads (e.g. the application of high Weight: 1.7 g (typ.) temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 2006-11-10 2SC4881 Electrical Characteristics (Tc = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Collector cut-off current ICBO VCB = 50 V, IE = 0 ― ― 1 μA Emitter cut-off current IEBO VEB = 6 V, IC = 0 ― ― 1 μA V (BR) CEO IC = 10 mA, IB = 0 50 ― ― V hFE (1) VCE = 1 V, IC = 1 A 100 ― 320 hFE (2) VCE = 1 V, IC = 2.5 A 60 ― ― Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage VCE (sat) IC = 2.5 A, IB = 125 mA ― 0.25 0.4 V Base-emitter saturation voltage VBE (sat) IC = 2.5 A, IB = 125 mA ― 1.0 1.3 V VCB = 4 V, IC = 1 A ― 100 ― MHz VCB = 10 V, IE = 0, f = 1 MHz ― 45 ― pF ― 0.1 ― ― 0.8 ― ― 0.1 ― Switching time Storage time ton tstg 20 μs Input IB1 IB2 Output 12 Ω Turn-on time Cob IB2 Collector output capacitance fT IB1 Transition frequency μs VCC = 30 V Fall time tf IB1 = −IB2 = 125 mA, duty cycle ≤ 1% Marking C4881 Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. 2 2006-11-10 2SC4881 IC – VCE IC – VBE 10 8 80 90 Common emitter 100 70 VCE = 1 V (A) 8 50 40 6 6 Collector current IC Collector current IC (A) 60 30 20 4 IB = 10 mA 2 4 Tc = 100°C 2 25 Common emitter −25 Tc = 25°C 0 0 2 4 6 Collector-emitter voltage 8 0 0 10 0.4 VCE (V) 0.8 Base-emitter voltage hEF – IC 2.0 VBE (V) 3 Collector-emitter saturation voltage VCE (sat) (V) DC current gain hFE 1.6 VCE (sat) – IC 1000 500 1.2 Tc = 100°C 25 300 −25 100 50 30 Common emitter 10 0.03 0.05 IC/IB = 20 1 0.5 0.3 0.1 Tc = 100°C 0.05 25 0.03 −25 ) VCE = 1 V Common emitter 0.1 0.3 0.5 1 Collector current IC 3 5 0.01 0.01 10 (A) 0.03 0.1 0.3 1 Collector current IC 3 10 (A) Safe Operating Area VBE (sat) – IC 10 10 IC max (pulsed)* (A) IC/IB = 20 3 1 0.5 Collector current IC Base-emitter saturation voltage VBE (sat) (V) Common emitter 5 −25 Tc = 100°C 25 0.3 0.1 0.03 0.05 0.1 0.3 0.5 1 Collector current IC 3 5 10 (A) 5 100 μs* IC max (continuous) 1 ms* 3 10 ms* DC operation Tc = 25°C 1 0.5 0.3 *: Single nonrepetitive pulse Tc = 25°C Curves must be derated 0.1 linearly with increase in temperature. 0.05 0.1 0.3 0.5 1 3 VCEO max 5 Collector-emitter voltage 3 10 30 50 100 VCE (V) 2006-11-10 2SC4881 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 4 2006-11-10