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TLP557_07

TLP557_07

  • 厂商:

    TOSHIBA(东芝)

  • 封装:

  • 描述:

    TLP557_07 - Inverter For Air Conditioner - Toshiba Semiconductor

  • 数据手册
  • 价格&库存
TLP557_07 数据手册
TLP557 TOSHIBA Photocoupler GaAℓAs Ired & Photo−IC TLP557 Transistor Inverter Inverter For Air Conditioner Power Transistor Base Drive The TOSHIBA TLP557 consists of a GaAℓAs light emitting diode and an integrated photodetector. This unit is 8−lead DIP package. TLP557 is suitable for base driving circuit of power transistor module up to 20A. External resistor needs to connect between pin 6 and pin 7. This is for constant current driving. Unit in mm • • • • • • • Input threshold current: IF=5mA(max.) Guaranteed performance temperature range: −30~70°C Supply voltage: 16V(max.) Output current: ±0.3A(max.) Switching time (tpLH / tpHL): 5μs(max.) Isolation voltage: 2500Vrms(min.) UL recognized: UL1577, file No. E67349 TOSHIBA Weight: 0.54g 11−10C4 Pin Configuration (top view) 1 8 Schematic ICC (Tr1) 8 IF 2+ VF 3– (Rex) 6 IO (Tr2) 5 VO2 7 VCC VO1 2 7 3 6 4 5 GND 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : GND 6 : VO2(Output) 7 : VO1(Rex Terminal) 8 : VCC Truth Table Tr1 Input LED On Off On Off Tr2 Off On 1 2007-10-01 TLP557 Absolute Maximum Ratings Characteristic Forward current LED Symbol IF (Note 1) IFPT VR (Tj) IO IOP VO VCC V1−2 V2−1 (Note 2) Po (Tj) (Note 3) POT Topr Tstg Tsol (Note 4) BVS Rating 25 1 5 125 +0.32 / −0.32 +2 / −0.5 16 16 1.5 5 0.5 125 0.55 −30~70 −55~125 Unit mA A V °C A A V V V V W °C W °C °C °C Vrms Peak transient forward current Reverse voltage Junction temperature Output current (f ≤ 5kHz, Duty ≤ 50%) Peak output current (PW ≤ 10μs, f ≤ 5kHz) Output voltage Detector Supply voltage O1 terminal to O2 terminal (pin 7−pin 6) voltage O2 terminal to O1 terminal (pin 6−pin 7) voltage Power dissipation Junction temperature Total package power dissipation Operating temperature range Storage temperature range Lead solder temperature (10 s) Isolation voltage (AC, 1 min., R.H.≤ 60%, Ta=25°C) 260 2500 Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) Pulse width PW ≤ 1μs, 300pps (Note 2) ΔPo / °C=−6.7mW / °C (Ta ≥ 50°C) (Note 3) ΔPOT / °C=−7.4mW / °C (Ta ≥ 50°C) (Note 4) Device considered a two terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. 2 2007-10-01 TLP557 Recommended Operating Condition Characteristic Input current on Input voltage off Supply voltage IB1 Drive current IB2 Drive current External resistance VCC−VO2 (pin 8−pin 6) ON voltage Operating temperature Symbol IF(ON) VF(OFF) VCC IO1 IO2 Rex V8−6 Topr Min. 7 0 5 ― ― 2.7 2.3 −30 Typ. 8 ― 6 0.15 ― 4.3 3 (IO1 = 0.15A) 25 Max. 20 0.8 13 0.25 0.5 ― 2.5 (IO1 = 0.25A) 70 Unit mA V V A A Ω V °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. (Rex is for constant current driving) 1 IF(ON) VCC 8 7 VCC Rex IO1 IO2 V8-6 2 VF(OFF) 3 4 VO2 GND 6 5 3 2007-10-01 TLP557 Electrical Characteristics (Ta = −30~70°C , unless otherwise specified) Characteristic Input forward voltage Temperature coefficient of forward voltage Input reverse current Input capacitance O1 Output leakage current O2 Output leakage current O1 Output current O2 High level output voltage Symbol VF ΔVF / ΔTa IR CT IO1L IO2L IO VOH Test Condition IF = 5mA , Ta = 25°C IF = 5mA VR = 5V, Ta = 25°C V = 0 , f = 1MHz , Ta = 25°C VCC = 16V, VO1 = 0, VF = 0.8V VCC = 16V, VO2 = 16V, IF = 5mA V8−6 = 2.3V Rex = 2.7Ω IF = 5mA, Ta = 25°C VCC = 6V, Rex = 2.7Ω IF = 5mA VF = 0.8V, Rex = 2.7Ω IO = 0.25A, Ta = 25°C VOL VF = 0.8V, Rex = 2.7Ω IO = 0.5A (*1) Ta = 25°C VCC = 6V, IF = 5mA Rex = 2.7Ω, Ta = 25°C High level supply current ICCH VCC = 6V, IF = 5mA, Rex = 2.7Ω VCC = 16V, IF = 5mA, Rex = 2.7Ω VCC = 6V, IF = 0mA Rex = 2.7Ω, Ta = 25°C Low level supply current ICCL VCC = 6V, IF = 0mA, Rex = 2.7Ω VCC = 16V, IF = 0mA, Rex = 2.7Ω “Output L→H” threshold input current “Output H→L” threshold input current Input current hysterisis Supply voltage Capacitance (input−output) Resistance (input−output) IFLH Rex = 2.7Ω IO = 0.25A VO2 > 3V Rex = 2.7Ω IO = 0.25A VO2 < 0.4V VCC = 6V VCC = 16V VCC = 6V VCC = 16V VCC = 6V VCC = 16V VCC = 6V VCC = 16V VCC = 6V VCC = 16V Min. ― ― ― ― ― ― 0.22 0.22 3.5 ― ― ― ― ― ― ― ― ― ― ― ― 0.8 0.8 ― 5 VS = 0, f = 1MHz, Ta = 25°C VS = 500V , Ta = 25℃, R.H.≤ 60% ― 5×10 10 Typ.* 1.55 −2.0 Max. 1.7 ― 10 250 200 200 0.32 0.32 ― 0.4 0.4 ― ― 10 13 17 17 22 25 5 5 ― ― ― 16 2.0 ― Unit V mV / °C μA pF μA μA A Test Cir− cuit ― ― 0.01 0.2 0.27 0.27 5.5 0.2 0.2 0.4 0.4 3.8 ― 5.2 11 ― 13 2.5 ― ― ― 0.05 ― 1.0 10 12 1 2 3 V V 4 O2 Low level output voltage 5 V mA mA mA VFHL IHYS VCC CS RS V mA V pF Ω VCC = 6V, Rex = 2.7Ω, Ta = 25°C * All typical values are at Ta = 25°C (*1): Duration of IO time ≤ 100μs 4 2007-10-01 TLP557 Switching Characteristics (Ta = −30~70°C unless otherwise specified) Characteristic Propagation delay time, L→H Propagation delay time, H→L Output rise time Output fall time Common mode transient immunity at high level output Common mode transient immunity at low level output Symbol tpLH tpHL tr tf CMH VCM = 600V, IF = 8mA VCC = 6V, Rex = 270Ω R = 1kΩ, Ta = 25°C VCM = 600V, IF = 0mA VCC = 6V, Rex = 270Ω R = 1kΩ, Ta = 25°C VCC = 6V, IF = 8mA Rex = 2.7Ω f = 5kHz, Duty = 10% Test Condition Min. ― ― ― ― −2000 Typ.* 1 1 0.05 0.05 ― Max. 5 5 ― ― ― Unit μs μs μs μs V / μs Test Cir− cuit 6 7 CML 2000 ― ― V / μs 7 * All typical values are at Ta = 25°C. Test Circuit 5: VOL 1 Test Circuit 1: IO1L 1 VF 4 8 VCC IO1L VF 4 8 Rex V VOL IO VCC A Test Circuit 6: tpLH, tpHL, tr, tf IF IF Rex VCC IO tr tf tpLH tpHL 90% 10% IO GND Test Circuit 2: IO2L 1 IF 4 8 100Ω A VCC IO2L IO 47μF Test Circuit 7: CMH, CML SW A Rex VCC A IO V8-6 4 R VCM B IF 1 8 Rex VO2 VCC Test Circuit 3: IO 1 IF 4 Test Circuit 4: VOH 1 IF 4 8 Rex V VOH VCC + VCM - 10% 90% tr tf 600V 480(V) tr (μs) 480(V) CMH = tf (μs) CML = 3.5V CMH CHL SW : A(IF=8mA) 0.8V VO2 SW : B(IF=0) CML (CMH) is the maximum rate of rise (fall) of the common mode voltage that can be sustained with the output voltage in the low (high) state. 5 2007-10-01 TLP557 1.0 PO – Ta f < 5kHz Duty < 50% -2.6 ⊿VF /⊿Ta – IF Forward voltage temperature coefficient ⊿VF /⊿Ta (mV / ℃) power dissipation PO (W) 0.8 -2.4 -2.2 0.6 -2.0 0.4 Allowable -1.8 0.2 -1.6 0 -40 -20 0 20 40 60 80 -1.4 0.1 0.3 0.5 1 3 5 10 Ambient temperature Ta (℃) Forward current IF (mA) IF – VF 100 Ta = 25℃ IF (mA) Forward current 10 1 0.1 0.01 1.0 1.2 1.4 1.6 1.8 2.0 Forward voltage VF (V) 6 2007-10-01 TLP557 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01
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