APT38M50J
500V, 38A, 0.10Ω Max
N-Channel MOSFET
S
S
Power MOS 8™ is a high speed, high voltage N-channel switch-mode power MOSFET.
A proprietary planar stripe design yields excellent reliability and manufacturability. Low
switching loss is achieved with low input capacitance and ultra low Crss "Miller" capacitance. The intrinsic gate resistance and capacitance of the poly-silicon gate structure
help control slew rates during switching, resulting in low EMI and reliable paralleling,
even when switching at very high frequency. Reliability in flyback, boost, forward, and
other circuits is enhanced by the high avalanche energy capability.
D
G
SO
2
T-
27
"UL Recognized"
file # E145592
ISOTOP ®
D
APT38M50J
Single die MOSFET
G
S
TYPICAL APPLICATIONS
FEATURES
• Fast switching with low EMI/RFI
• PFC and other boost converter
• Low RDS(on)
• Buck converter
• Ultra low Crss for improved noise immunity
• Two switch forward (asymmetrical bridge)
• Low gate charge
• Single switch forward
• Avalanche energy rated
• Flyback
• RoHS compliant
• Inverters
Absolute Maximum Ratings
Symbol
ID
Parameter
Unit
Ratings
Continuous Drain Current @ TC = 25°C
38
Continuous Drain Current @ TC = 100°C
24
A
IDM
Pulsed Drain Current
VGS
Gate-Source Voltage
±30
V
EAS
Single Pulse Avalanche Energy 2
1200
mJ
IAR
Avalanche Current, Repetitive or Non-Repetitive
28
A
1
175
Thermal and Mechanical Characteristics
Typ
Max
Unit
W
PD
Total Power Dissipation @ TC = 25°C
357
RθJC
Junction to Case Thermal Resistance
0.35
RθCS
Case to Sink Thermal Resistance, Flat, Greased Surface
Operating and Storage Junction Temperature Range
VIsolation
RMS Voltage (50-60hHz Sinusoidal Waveform from Terminals to Mounting Base for 1 Min.)
WT
Torque
Package Weight
Terminals and Mounting Screws.
Microsemi Website - http://www.microsemi.com
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-55
150
°C/W
°C
V
2500
1.03
oz
29.2
g
10
in·lbf
1.1
N·m
2-2007
TJ,TSTG
0.15
Rev A
Min
Characteristic
050-8075
Symbol
Static Characteristics
TJ = 25°C unless otherwise specified
Symbol
Parameter
Test Conditions
Min
VBR(DSS)
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250µA
500
∆VBR(DSS)/∆TJ
Breakdown Voltage Temperature Coefficient
RDS(on)
Drain-Source On Resistance
VGS(th)
Gate-Source Threshold Voltage
∆VGS(th)/∆TJ
Zero Gate Voltage Drain Current
IGSS
Gate-Source Leakage Current
Dynamic Characteristics
Symbol
Forward Transconductance
Ciss
Input Capacitance
Crss
Reverse Transfer Capacitance
Coss
Output Capacitance
TJ = 125°C
0.60
0.085
4
-10
0.10
5
100
500
±100
Min
f = 1MHz
Co(er)
5
Effective Output Capacitance, Energy Related
Typ
Max
42
8800
120
945
VGS = 0V, VDS = 25V
Effective Output Capacitance, Charge Related
Unit
V
V/°C
Ω
V
mV/°C
µA
nA
Unit
S
pF
550
VGS = 0V, VDS = 0V to 333V
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
td(on)
Turn-On Delay Time
tf
VGS = 0V
Test Conditions
VDS = 50V, ID = 28A
4
td(off)
TJ = 25°C
Max
TJ = 25°C unless otherwise specified
Co(cr)
tr
VDS = 500V
Typ
VGS = ±30V
Parameter
gfs
3
VGS = VDS, ID = 2.5mA
Threshold Voltage Temperature Coefficient
IDSS
Reference to 25°C, ID = 250µA
VGS = 10V, ID = 28A
3
APT38M50J
Current Rise Time
Turn-Off Delay Time
275
220
50
100
38
45
100
33
VGS = 0 to 10V, ID = 28A,
VDS = 250V
Resistive Switching
VDD = 333V, ID = 28A
RG = 4.7Ω 6 , VGG = 15V
Current Fall Time
nC
ns
Source-Drain Diode Characteristics
Symbol
IS
ISM
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode) 1
Test Conditions
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
Diode Forward Voltage
ISD = 28A, TJ = 25°C, VGS = 0V
trr
Reverse Recovery Time
ISD = 28A 3
Qrr
Reverse Recovery Charge
Peak Recovery dv/dt
Typ
Max
Unit
38
A
G
VSD
dv/dt
Min
D
175
S
diSD/dt = 100A/µs, TJ = 25°C
ISD ≤ 28A, di/dt ≤1000A/µs, VDD = 333V,
TJ = 125°C
1
660
13.2
V
ns
µC
8
V/ns
1 Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
2 Starting at TJ = 25°C, L = 3.06mH, RG = 4.7Ω, IAS = 28A.
4 Co(cr) is defined as a fixed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
5 Co(er) is defined as a fixed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(cr) for any value of
VDS less than V(BR)DSS, use this equation: Co(er) = -2.04E-7/VDS^2 + 4.76E-8/VDS + 1.36E-10.
6 RG is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
050-8075
Rev A
2-2007
3 Pulse test: Pulse Width < 380µs, duty cycle < 2%.
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200
V
GS
= 10V
TJ = -55°C
J
V
120
TJ = 25°C
80
40
TJ = 150°C
TJ = 125°C
6V
70
60
50
40
30
20
5V
10
4.5V
0
25
20
15
10
5
0
VDS(ON), DRAIN-TO-SOURCE VOLTAGE (V)
0
NORMALIZED TO
VGS = 10V @ 28A
2.0
1.0
0.5
250µSEC. PULSE TEST
@ ID(ON) x RDS(ON) MAX.
150
ID, DRAIN CURRENT (A)
RDS(ON), DRAIN-TO-SOURCE ON RESISTANCE
175
1.5
30
25
20
15
10
5
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 2, Output Characteristics
Figure 1, Output Characteristics
2.5
= 7,8 & 10V
GS
80
ID, DRIAN CURRENT (A)
ID, DRAIN CURRENT (A)
T = 125°C
90
160
0
APT38M50J
100
APT38M50J
250
250
100
100
I
I
DM
ID, DRAIN CURRENT (A)
10
13µs
100µs
1ms
Rds(on)
10ms
1
100ms
0.1
1
10
13µs
TJ = 150°C
TC = 25°C
1
0.1
10
100
600
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 9, Forward Safe Operating Area
100µs
1ms
10ms
Rds(on)
100ms
Scaling for Different Case & Junction
Temperatures:
ID = ID(T = 25 C)*(TJ - TC)/125
DC line
°
DC line
TJ = 125°C
TC = 75°C
C
10
100
600
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 10, Maximum Forward Safe Operating Area
TJ (°C)
1
TC (°C)
0.105
0.244
ZEXT
ID, DRAIN CURRENT (A)
DM
Dissipated Power
(Watts)
0.0185
0.360
ZEXT are the external thermal
impedances: Case to sink,
sink to ambient, etc. Set to
zero when modeling only
the case to junction.
Figure 11, Transient Thermal Impedance Model
0.35
D = 0.9
0.30
0.7
0.25
0.20
0.5
Note:
0.15
0.3
0.10
t1
t2
t1 = Pulse Duration
0.05
0
PDM
ZθJC, THERMAL IMPEDANCE (°C/W)
0.40
t
0.1
0.05
10-5
Duty Factor D = 1/t2
Peak TJ = PDM x ZθJC + TC
SINGLE PULSE
10-4
10-3
10-2
10-1
RECTANGULAR PULSE DURATION (seconds)
Figure 12. Maximum Effective Transient Thermal Impedance Junction-to-Case vs Pulse Duration
1.0
SOT-227 (ISOTOP®) Package Outline
11.8 (.463)
12.2 (.480)
31.5 (1.240)
31.7 (1.248)
7.8 (.307)
8.2 (.322)
r = 4.0 (.157)
(2 places)
W=4.1 (.161)
W=4.3 (.169)
H=4.8 (.187)
H=4.9 (.193)
(4 places)
25.2 (0.992)
0.75 (.030) 12.6 (.496) 25.4 (1.000)
0.85 (.033) 12.8 (.504)
4.0 (.157)
4.2 (.165)
(2 places)
2-2007
14.9 (.587)
15.1 (.594)
Rev A
3.3 (.129)
3.6 (.143)
38.0 (1.496)
38.2 (1.504)
050-8075
8.9 (.350)
9.6 (.378)
Hex Nut M4
(4 places)
1.95 (.077)
2.14 (.084)
* Source
30.1 (1.185)
30.3 (1.193)
Drain
* Emitter terminals are shorted
internally. Current handling
capability is equal for either
Source terminal.
* Source
Gate
Dimensions in Millimeters and (Inches)
ISOTOP® is a registered trademark of ST Microelectronics NV. Microsemi's products are covered by one or more of U.S.patents 4,895,810 5,045,903 5,089,434 5,182,234
5,019,522 5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 and foreign patents. US and Foreign patents pending. All Rights Reserved.
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