AFE5809ZCF

Product Folder Sample & Buy Support & Community Tools & Software Technical Documents AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 AFE5809 Fully Integrated, 8-Channel Ultrasound Analog Front End With Passive CW Mixer, and Digital I/Q Demodulator, 0.75 nV/rtHz, 14, 12-Bit, 65 MSPS, 158 mW/CH 1 Features • 1 • • • • • • • • • • • • 8-Channel Complete Analog Front-End – LNA, VCAT, PGA, LPF, ADC, and CW Mixer Programmable Gain Low-Noise Amplifier (LNA) – 24-, 18-, 12-dB Gain – 0.25-, 0.5-, 1-VPP Linear Input Range – 0.63-, 0.7-, 0.9-nV/rtHz Input Referred Noise – Programmable Active Termination 40-dB Low-Noise Voltage Controlled Attenuator (VCAT) 24-/30-dB Programmable Gain Amplifier (PGA) Third-Order Linear Phase Low-Pass Filter (LPF) – 10, 15, 20, 30 MHz 14-Bit Analog-to-Digital Converter (ADC) – 77 dBFS SNR at 65 MSPS – LVDS Outputs Noise, Power Optimizations (Without Digital Demodulator) – 158 mW/CH at 0.75 nV/rtHz, 65 MSPS – 101 mW/CH at 1.1 nV/rtHz, 40 MSPS – 80 mW/CH at CW Mode Excellent Device-to-Device Gain Matching – ±0.5 dB (Typical) and ±1 dB (Maximum) Digital I/Q Demodulator after ADC – Wide Range Demodulation Frequency – 41XXXX, has below additional features which can be enabled by Register 61[15,14,13]. Existing analog performance remains the same. • 61[13] enables an additional voltage clamp at the V2I input of the PGA. This limits the amount of overload signal the PGA sees. • 61[14] enables a first-order 5-MHz LPF filter to suppress signals >5 MHz or high-order harmonics. • 61[15] enables a –6-dB PGA clamp setting. The actual PGA output is less than the ADC's full-scale amplitude, 2 Vpp. 6 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 6 Pin Configuration and Functions ZCF Package 135-Pin NFBGA Bottom View D7P D6P D5P FCLKP DVSS DCLKP D4P D3P D2P D7M D6M D5M FCLKM DVSS DCLKM D4M D3M D2M D8P D8M DVDD DVDD_ LDO1 DVSS DVDD D1M D1P SPI_DIG _EN DNC SDOUT PDN_ ADC SEN R P DVDD_ LDO2 N AVDD_ ADC AVDD_ VREF_IN ADC REFP DNC LDO_SETV CLKP_ ADC CLKM_ ADC AVDD_ ADC REFM DNC LDO_EN VCNTLM VHIGH AVSS M TX_SYNC_ IN L AVDD AVDD_5V VCNTLP DNC AVDD_ADC SDATA K CW_QP_ CW_QP_ AMPINP AMPINM AVSS AVSS AVSS AVDD_ADC CW_QP_ OUTM CW_QP_ OUTP AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVSS CW_IP_ OUTM CW_IP_ OUTP AVSS AVSS AVSS AVSS AVSS CLKP_16X CW_IP_ AMPINP CW_IP_ AMPINM AVSS AVSS AVSS AVSS AVSS AVDD AVDD AVSS AVSS AVSS AVSS AVSS AVSS AVSS AVDD AVDD AVSS INM8 INM7 INM6 INM5 INM4 INM3 INM2 INM1 CM_BYP ACT8 ACT7 ACT6 ACT5 ACT4 ACT3 ACT2 ACT1 AVDD INP8 INP7 INP6 INP5 INP4 INP3 INP2 INP1 1 2 3 4 8 9 AVDD_ ADC PDN_VCA SCLK Rows J PDN_ GLOBAL RESET H CLKP_1X CLKM_1X G CLKM_ 16X F E D C B A 5 6 7 Columns Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 7 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Pin Functions PIN NAME DESCRIPTION NO. ACT1 to ACT8 B9 to B2 Active termination input pins for CH1 to CH8 A1 D8 D9 AVDD E8 3.3-V analog supply for LNA, VCAT, PGA, LPF, and CWD blocks E9 K1 AVDD_5V K2 5-V analog supply for LNA, VCAT, PGA, LPF, and CWD blocks J6 J7 AVDD_ADC K8 L3 1.8-V analog power supply for ADC M1 M2 C1 D1 to D7 E3 to E7 F3 to F7 AVSS G1 to G7 Analog ground H3 to H7 J3 to J5 K6 CLKM_ADC L2 Negative input of differential ADC clock. In the single-end clock mode, it can be tied to GND directly or through a 0.1-µF capacitor. CLKP_ADC L1 Positive input of differential ADC clock. In the single-end clock mode, it can be tied to clock signal directly or through a 0.1-µF capacitor. CLKM_16X F9 Negative input of differential CW 16× clock. Tie to GND when the CMOS clock mode is enabled. In the 4× and 8× CW clock modes, this pin becomes the 4× or 8× CLKM input. In the 1× CW clock mode, this pin becomes the in-phase 1× CLKM for the CW mixer. Can be floated if CW mode is not used. See register 0x36[11:10]. CLKP_16X F8 Positive input of differential CW 16× clock. In 4× and 8× clock modes, this pin becomes the 4× and 8× CLKP input. In the 1× CW clock mode, this pin becomes the in-phase 1× CLKP for the CW mixer. Can be floated if CW mode is not used.See register 0x36[11:10]. CLKM_1X G9 Negative input of differential CW 1× clock. Tie to GND when the CMOS clock mode is enabled (refer to Figure 107 for details). In the 1× clock mode, this pin is the quadrature-phase 1× CLKM for the CW mixer. Can be floated if CW mode is not used. CLKP_1X G8 Positive input of differential CW 1× clock. In the 1× clock mode, this pin is the quadrature-phase 1× CLKP for the CW mixer. Can be floated if CW mode is not used. CM_BYP B1 Bias voltage and bypass to ground. TI recommends 1 µF. To suppress the ultra-low frequency noise, the designer can use 10 µF. E2 Negative differential input of the in-phase summing amplifier. External LPF capacitor must be connected between CW_IP_AMPINM and CW_IP_OUTP. This pin provides the current output for the CW mixer. This pin becomes the CH7 PGA negative output when PGA test mode is enabled. Can be floated if not used. CW_IP_AMPINP E1 Positive differential input of the in-phase summing amplifier. External LPF capacitor must be connected between CW_IP_AMPINP and CW_IP_OUTM. This pin provides the current output for the CW mixer. This pin becomes the CH7 PGA positive output when PGA test mode is enabled. Can be floated if not used. CW_IP_OUTM F1 Negative differential output for the in-phase summing amplifier. External LPF capacitor must be connected between CW_IP_AMPINP and CW_IP_OUTPM. Can be floated if not used. CW_IP_OUTP F2 Positive differential output for the in-phase summing amplifier. External LPF capacitor must be connected between CW_IP_AMPINM and CW_IP_OUTP. Can be floated if not used. CW_IP_AMPINM 8 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Pin Functions (continued) PIN NAME DESCRIPTION NO. CW_QP_AMPINM J2 Negative differential input of the quadrature-phase summing amplifier. External LPF capacitor must be connected between CW_QP_AMPINM and CW_QP_OUTP. This pin provides the current output for the CW mixer. This pin becomes CH8 PGA negative output when PGA test mode is enabled. Can be floated if not used. CW_QP_AMPINP J1 Positive differential input of the quadrature-phase summing amplifier. External LPF capacitor must be connected between CW_QP_AMPINP and CW_QP_OUTM. This pin provides the current output for the CW mixer. This pin becomes CH8 PGA positive output when PGA test mode is enabled. Can be floated if not used. CW_QP_OUTM H1 Negative differential output for the quadrature-phase summing amplifier. External LPF capacitor must be connected between CW_QP_AMPINP and CW_QP_OUTM. Can be floated if not used. CW_QP_OUTP H2 Positive differential output for the quadrature-phase summing amplifier. External LPF capacitor must be connected between CW_QP_AMPINM and CW_QP_OUTP. Can be floated if not used. N8 D1M to D8M P9 to P7 P3 to P1 ADC CH1 to CH8 LVDS negative outputs N2 N9 D1P to D8P R9 to R7 R3 to R1 ADC CH1 to 8 LVDS positive outputs N1 DCLKM P6 LVDS bit clock (7x) negative output DCLKP R6 LVDS bit clock (7x) positive output DVDD N3 N7 ADC digital and I/O power supply, 1.8 V N5 DVSS P5 ADC digital ground R5 N4 DVDD_LDO1, DVDD_LDO2 N6 When LDO_EN L4 = 1.8 V, demodulator digital power supply generated internally. These two pins should be separated on the PCB and decoupled respectively with 0.1-µF capacitors. When LDO_EN L4=DVSS, the internal LDOs are disabled. External higher performance 1.4-V supply can be applied to N4 and N6 for minimizing digital noise emission. FCLKM P4 LVDS frame clock (1×) negative output FCLKP R4 LVDS frame clock (1×) positive output INM1 to INM8 C9 to C2 CH1 to CH8 complementary analog inputs. Bypass to ground with ≥0.015-µF capacitors. The HPF response of the LNA depends on the capacitors. INP1 to INP8 A9 to A2 CH1 to CH8 analog inputs. AC couple to inputs with ≥0.1-µF capacitors. LDO_EN L6 Enable/Disable AFE's internal LDO regulators. When it is tied to 1.8-V DVDD or Logic "1", AFE's internal LDO is enabled. When it is tied to DVSS or Logic "0", AFE's internal LDO is disabled and external 1.4-V supply can be applied at N4 and N6 pins, that is, DVDD_LDO1, DVDD_LDO2. LDO_SETV M6 Sets the internal LDO votlage. Logic "1" or tie to 1.8-V DVDD sets the LDO output as 1.4V. It can be tied to DVSS when the internal LDO is disabled. PDN_ADC L8 ADC partial (fast) power-down control pin with an internal pulldown resistor of 100 kΩ. Active high. Either 1.8-V or 3.3-V logic level can be used. PDN_VCA J8 VCA partial (fast) power-down control pin with an internal pulldown resistor of 20 kΩ. Active high. 3.3-V logic level should be used. PDN_GLOBAL H8 Global (complete) power-down control pin for the entire chip with an internal pulldown resistor of 20 kΩ. Active high. 3.3-V logic level should be used. When the complete power-down mode is enabled, the digital demodulator may lose register settings. Therefore, it is required to reconfigure the demodulator registers, filter coefficient memory, and profile memory after existing the complete power-down mode. REFM L4 0.5-V reference output in the internal reference mode. Must leave floated in the internal reference mode. TI recommends adding a test point on the PCB for monitoring the reference output REFP M4 1.5-V reference output in the internal reference mode. Must leave floated in the internal reference mode. TI recommends adding a test point on the PCB for monitoring the reference output Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 9 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Pin Functions (continued) PIN DESCRIPTION NAME NO. RESET H9 Hardware reset pin with an internal pulldown resistor of 20 kΩ. Active high. The designer can use 3.3-V logic level. SCLK J9 Serial interface clock input with an internal pulldown resistor of 20 kΩ. This pin is connected to both ADC and VCA. The designer should use 3.3-V logic. SDATA K9 Serial interface data input with an internal pulldown resistor of 20 kΩ. This pin is connected to both ADC and VCA. The designer should use 3.3-V logic. SDOUT M9 Serial interface data readout. High impedance when readout is disabled. This pin is connected to ADC only. The designer can use 1.8-V logic. SEN L9 Serial interface enable with an internal pullup resistor of 20 kΩ. Active low. This pin is connected to both ADC and VCA. The designer should use 3.3-V logic. SPI_DIG_EN M7 Serial interface enable for the digital demodulator memory space. SPI_DIG_EN pin is required to be set to 0 during SPI transactions to demodulator registers. Each transaction starts by setting SEN as 0 and terminates by setting it back to 1 (similar to other register transactions). Pull up internally through a 20-kΩ resistor. This pin is connected to both ADC and VCA. The designer should use 3.3-V logic. TX_SYNC_IN L7 System trig signal input. It indicates the start of signal transmission. Either 3.3-V or 1.8-V logic level can be used. Note: TX_SYNC signal must be synchronized with ADC CLK. Typically, pulse repetition frequency (PRF) signal can be used for TX_SYNC_IN. VCNTLM K4 Negative differential attenuation control pin VCNTLP K3 Positive differential attenuation control pin VHIGH K5 Bias voltage; bypass to ground with ≥1 µF VREF_IN M3 ADC 1.4-V reference input in the external reference mode; bypass to ground with 0.1 µF. K7 L5 DNC M5 Do not connect. Must leave floated M8 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature (unless otherwise noted) (1) Supply voltage MIN MAX AVDD –0.3 3.9 AVDD_ADC –0.3 2.2 AVDD_5V –0.3 6 DVDD –0.3 2.2 DVDD_LDO –0.3 1.6 UNIT V Voltage between AVSS and LVSS –0.3 0.3 Voltage at analog inputs and digital inputs –0.3 min [3.6, AVDD + 0.3] V 260 °C Peak solder temperature (2) Maximum junction temperature (TJ), any condition Operating temperature Storage temperature, Tstg (1) (2) 10 V 105 °C 0 85 °C –55 150 °C Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied Exposure to absolute maximum rated conditions for extended periods may degrade device reliability. Device complies with JSTD-020D. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 7.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins (1) ±1000 Charged device model (CDM), per JEDEC specification JESD22-C101, all pins (2) ±250 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 Recommended Operating Conditions MIN MAX 3.15 3.6 V AVDD_ADC 1.7 1.9 V DVDD 1.7 1.9 V DVDD_LDO1/2 (internally generated) 1.2 1.4 V DVDD_LDO1/2 (external supplied) 1.4 1.5 V 4.75 5.5 V 0 85 °C AVDD AVDD_5V Ambient temperature, TA UNIT 7.4 Thermal Information AFE5809 THERMAL METRIC (1) BGA (NFBGA) UNIT 135 PINS RθJA Junction-to-ambient thermal resistance RθJC(top) Junction-to-case (top) thermal resistance 34.1 °C/W 5 RθJB °C/W Junction-to-board thermal resistance 11.5 °C/W ψJT Junction-to-top characterization parameter 0.2 °C/W ψJB Junction-to-board characterization parameter 10.8 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 11 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 7.5 Electrical Characteristics AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1 µF at INP and bypassed to ground with 15 nF at INM, No active termination, VCNTL = 0 V, ƒIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF Filter = 15 MHz, low-noise mode, VOUT = –1 dBFS, Single-ended VCNTL mode, VCNTLM = GND, ADC configured in internal reference mode, internal 500-Ω CW feedback resistor, CMOS CW clocks, at ambient temperature, TA = 25°C, Digital demodulator is disabled unless otherwise noted. Min and max values are specified across full-temperature range with AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TGC FULL SIGNAL CHANNEL (LNA + VCAT + LPF + ADC) en (RTI) en (RTI) NF Input voltage noise over LNA gain (lownoise mode) Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 24 dB 0.76, 0.83, 1.16 Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 30 dB 0.75, 0.86, 1.12 Input voltage noise over LNA gain (lowpower mode) Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 24 dB 1.1, 1.2, 1.45 Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 30 dB 1.1, 1.2, 1.45 Input voltage noise over LNA gain (medium-power mode) Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 24 dB 1, 1.05, 1.25 Rs = 0 Ω, ƒ = 2 MHz, LNA = 24, 18, 12 dB, PGA = 30 dB 0.95, 1, 1.2 Input voltage noise at low frequency ƒ = 100 kHz, INM capacitor = 1 µF, PGA integrator disabled Input referred current noise Low-noise mode/medium-power mode/low-power mode Noise figure nV/rtHz nV/rtHz nV/rtHz 0.9 nV/rtHz 2.7, 2.1, 2 pA/rtHz Rs = 200 Ω, 200-Ω active termination, PGA = 24 dB, LNA = 12, 18, 24 dB 3.85, 2.4, 1.8 dB Rs = 100 Ω, 100-Ω active termination, PGA = 24 dB, LNA = 12, 18, 24 dB 5.3, 3.1, 2.3 dB NF Noise figure Rs = 500 Ω, 1 kΩ, no termination, low-NF mode is enabled (Reg53[9] = 1) 0.94, 1.08 dB NF Noise figure Rs = 50 Ω / 200 Ω, no termination, low-noise mode (Reg53[9] = 0) 2.35, 1.05 dB VMAX Maximum linear input voltage LNA gain = 24, 18, 12 dB 250, 500, 1000 VCLAMP Clamp voltage Reg52[10:9] = 0, LNA = 24, 18, 12 dB 350, 600, 1150 mVpp Low-noise mode 24, 30 PGA gain dB Medium-power/low-power mode 24, 28.5 LNA = 24 dB, PGA = 30 dB, low-noise mode Total gain Ch-CH noise correlation factor without signal (1) 54 LNA = 24 dB, PGA = 30 dB, medium-power mode 52.5 LNA = 24 dB, PGA = 30 dB, low-power mode 52.5 Summing of 8 channels 0 Full band (VCNTL = 0, 0.8) Ch-CH noise correlation factor with signal (1) 0.15, 0.17 1-MHz band over carrier (VCNTL= 0, 0.8) 0.18, 0.75 VCNTL= 0.6 V (22-dB total channel gain) Signal-to-noise ratio (SNR) dB VCNTL= 0, LNA = 18 dB, PGA = 24 dB 68 70 59.3 63 VCNTL= 0, LNA = 24 dB, PGA = 24 dB dBFS 58 Narrow-band SNR SNR over 2-MHz band around carrier at VCNTL = 0.6 V (22-dB total gain) Input common-mode voltage At INP and INM pins 75 77 dBFS 2.4 V 8 kΩ Input resistance Preset active termination enabled Input capacitance Input control voltage VCNTLP – VCNTLM Common-mode voltage VCNTLP and VCNTLM pF 1.5 V 0.75 V –40 dB Gain slope VCNTL= 0.1 to 1.1 V 35 dB/V Input resistance Between VCNTLP and VCNTLM 200 kΩ Input capacitance Between VCNTLP and VCNTLM 1 pF TGC response time VCNTL= 0- to 1.5-V step function Third-order LPF 1.5 10, 15, 20, 30 Settling time for change in LNA gain Settling time for change in active termination setting µs MHz 14 µs 1 µs Noise correlation factor is defined as Nc / (Nu + Nc), where Nc is the correlated noise power in single channel; and Nu is the uncorrelated noise power in single channel. Its measurement follows the below equation, in which the SNR of single-channel signal and the SNR of summed eight-channel signal are measured. NC = 10 8CH_SNR 10 10 Nu + NC 12 Ω 20 0 Gain range (1) 50,100,200,400 1CH_SNR 1 x 1 - 56 7 10 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Electrical Characteristics (continued) AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1 µF at INP and bypassed to ground with 15 nF at INM, No active termination, VCNTL = 0 V, ƒIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF Filter = 15 MHz, low-noise mode, VOUT = –1 dBFS, Single-ended VCNTL mode, VCNTLM = GND, ADC configured in internal reference mode, internal 500-Ω CW feedback resistor, CMOS CW clocks, at ambient temperature, TA = 25°C, Digital demodulator is disabled unless otherwise noted. Min and max values are specified across full-temperature range with AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT AC ACCURACY LPF bandwidth tolerance ±5% CH-CH group delay variation 2 to 15 MHz CH-CH phase variation 15-MHz signal 0 V < VCNTL< 0.1 V (Dev-to-Dev) Gain matching 0.1 V < VCNTL< 1.1 V(Dev-to-Dev), TA = 25°C 0.1 V < VCNTL< 1.1 V (Dev-to-Dev), TA = 0°C and 85°C Channel-to-channel Output offset VCNTL= 0, PGA = 30 dB, LNA = 24 dB ns ° ±0.5 –1 ±0.5 1 dB 1.1 V < VCNTL< 1.5 V (Dev-to-Dev) Gain matching 2 11 ±0.5 –1.1 1.1 ±0.25 –75 dB 75 LSB AC PERFORMANCE HD2 HD3 THD Second-harmonic distortion Third-harmonic distortion Total harmonic distortion FIN = 2 MHz; VOUT = –1 dBFS –60 FIN = 5 MHz; VOUT = –1 dBFS –60 FIN = 5 MHz; VIN= 500 mVPP, VOUT = –1 dBFS, LNA = 18 dB, VCNTL= 0.88 V –55 FIN = 5 MHz; VIN = 250 mVPP, VOUT = –1 dBFS, LNA = 24 dB, VCNTL= 0.88 V –55 FIN = 2 MHz; VOUT = –1 dBFS –55 FIN = 5 MHz; VOUT = –1 dBFS –55 FIN = 5 MHz; VIN = 500 mVPP, VOUT = –1 dBFS, LNA = 18 dB, VCNTL = 0.88 V –55 FIN = 5 MHz; VIN = 250 mVPP, VOUT = –1dBFS, LNA = 2 4dB, VCNTL= 0.88 V –55 FIN = 2 MHz; VOUT = –1 dBFS –55 FIN = 5 MHz; VOUT = – 1dBFS –55 –60 IMD3 Intermodulation distortion ƒ1 = 5 MHz at –1 dBFS, ƒ2 = 5.01 MHz at –27 dBFS XTALK Cross-talk FIN = 5 MHz; VOUT= –1 dBFS Phase noise kHz off 5 MHz (VCNTL= 0 V) Input referred voltage noise Rs = 0 Ω, ƒ = 2 MHz, Rin = High Z, Gain = 24, 18, 12 dB dBc dBc dBc dBc –65 dB –132 dBc/Hz 0.63, 0.70, 0.9 nV/rtHz 50, 100, 150, 200 kHz 4 Vpp LNA High-pass filter (HPF) –3 dB cut-off frequency LNA linear output VCAT+ PGA VCAT input noise 0-dB, –40-dB attenuation PGA input noise 24 dB, 30 dB –3 dB HPF cut-off frequency 2, 10.5 nV/rtHz 1.75 nV/rtHz 80 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 kHz 13 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Electrical Characteristics (continued) AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1 µF at INP and bypassed to ground with 15 nF at INM, No active termination, VCNTL = 0 V, ƒIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF Filter = 15 MHz, low-noise mode, VOUT = –1 dBFS, Single-ended VCNTL mode, VCNTLM = GND, ADC configured in internal reference mode, internal 500-Ω CW feedback resistor, CMOS CW clocks, at ambient temperature, TA = 25°C, Digital demodulator is disabled unless otherwise noted. Min and max values are specified across full-temperature range with AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CW DOPPLER en (RTI) en (RTO) en (RTI) en (RTO) 1-channel mixer, LNA = 24 dB, 500-Ω feedback resistor 0.8 8-channel mixer, LNA = 24 dB, 62.5-Ω feedback resistor 0.33 1-channel mixer, LNA = 24 dB, 500-Ω feedback resistor 12 8-channel mixer, LNA = 24 dB, 62.5-Ω feedback resistor 5 1-channel mixer, LNA = 18 dB, 500-Ω feedback resistor 1.1 8-channel mixer, LNA = 18 dB, 62.5-Ω feedback resistor 0.5 1-channel mixer, LNA = 18 dB, 500-Ω feedback resistor 8.1 8-channel mixer, LNA = 18 dB, 62.5-Ω feedback resistor 4 Input voltage noise (CW) nV/rtHz Output voltage noise (CW) nV/rtHz Input voltage noise (CW) nV/rtHz Output voltage noise (CW) NF Noise figure fCW CW operation range nV/rtHz Rs = 100 Ω, RIN = High Z, FIN = 2 MHz (LNA, I/Q mixer and summing amplifier/filter) (2) 1.8 CW signal carrier frequency 8 1× CLK (16× mode) CW clock frequency dB MHz 8 16× CLK(16× mode) 128 4× CLK(4× mode) AC coupled LVDS clock amplitude 0.7 CLKM_16X-CLKP_16X; CLKM_1X-CLKP_1X Vpp AC coupled LVPECL clock amplitude VCMOS 1.6 CLK duty cycle 1× and 16× CLKs Common-mode voltage Internal provided 35% CMOS input clock amplitude 4 CW mixer phase noise 1 kHz off 2-MHz carrier Input dynamic range FIN = 2 MHz, LNA = 24/18/12 dB IMD3 Intermodulation distortion V 5 4 DR 14 65% 2.5 CW mixer conversion loss (2) MHz 32 156 160, 164, 165 V dB dBc/Hz dBFS/Hz ƒ1 = 5 MHz, ƒ2 = 5.01 MHz, both tones at –8.5-dBm amplitude, 8 channels summed up in-phase, CW feedback resistor = 87 Ω –50 dBc ƒ1 = 5 MHz, ƒ2= 5.01 MHz, both tones at –8.5-dBm amplitude, singlechannel case, CW feedback resistor = 500 Ω –60 dBc dB I/Q channel gain matching 16× mode ±0.04 I/Q channel phase matching 16× mode ±0.1 ° I/Q channel gain matching 4× mode ±0.04 dB I/Q channel phase matching 4× mode ±0.1 ° Image rejection ratio FIN = 2.01 MHz, 300-mV input amplitude, CW clock frequency = 2 MHz –50 dBc In the 16× operation mode, the CW operation range is limited to 8 MHz due to the 16× CLK. The maximum clock frequency for the 16× CLK is 128 MHz. In the 8×, 4×, and 1× modes, higher CW signal frequencies up to 15 MHz can be supported with small degradation in performance, see CW Clock Selection. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Electrical Characteristics (continued) AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1 µF at INP and bypassed to ground with 15 nF at INM, No active termination, VCNTL = 0 V, ƒIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF Filter = 15 MHz, low-noise mode, VOUT = –1 dBFS, Single-ended VCNTL mode, VCNTLM = GND, ADC configured in internal reference mode, internal 500-Ω CW feedback resistor, CMOS CW clocks, at ambient temperature, TA = 25°C, Digital demodulator is disabled unless otherwise noted. Min and max values are specified across full-temperature range with AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CW SUMMING AMPLIFIER VCMO Common-mode voltage Summing amplifier inputs and outputs 1.5 Summing amplifier output 100 Hz V 4 Vpp 2 nV/rtHz 1.2 nV/rtHz 1 nV/rtHz Input referred current noise 2.5 pA/rtHz Unit gain bandwidth 200 MHz 20 mApp Input referred voltage noise 1 kHz 2 kHz to 100 MHz Max output current Linear operation range ADC SPECIFICATIONS Sample rate SNR Signal-to-noise ratio 10 65 MSPS Idle channel SNR of ADC 14b 77 dBFS REFP 1.5 V REFM 0.5 V VREF_IN voltage 1.4 V VREF_IN current 50 µA 65 MSPS at 14 bit 910 Internal reference mode External reference mode ADC input full-scale range LVDS rate 2 Vpp Mbps POWER DISSIPATION AVDD voltage 3.15 3.3 3.6 V 1.7 1.8 1.9 V 4.75 5 5.5 V 1.7 1.8 1.9 V TGC low-noise mode, 65 MSPS 158 190 TGC low-noise mode, 40 MSPS 145 TGC medium-power mode, 40 MSPS 114 AVDD_ADC voltage AVDD_5V voltage DVDD voltage Total power dissipation per channel mW/CH TGC low-power mode, 40 MSPS 101.5 TGC low-noise mode, no signal 202 TGC medium-power mode, no signal 126 TGC low-power mode, no signal 240 99 CW-mode, no signal 147 TGC low-noise mode, 500 mVPP Input,1% duty cycle 210 TGC medium-power mode, 500 mVPP Input, 1% duty cycle 133 TGC low power, 500 mVPP Input, 1% duty cycle 105 170 AVDD (3.3-V) current mA CW-mode, 500 mVPP Input 375 TGC mode no signal 25.5 CW mode no signal, 16× clock = 32 MHz 32 TGC mode, 500-mVpp Input,1% duty cycle 26 35 AVDD_5V current mA CW-mode, 500-mVpp input 42.5 TGC low-noise mode, no signal 99 TGC medium-power mode, no signal 68 TGC low-power mode, no signal 121 55.5 VCA power dissipation mW/CH TGC low-noise mode, 500-mVPP input,1% duty cycle TGC medium-power mode, 500-mVPP Input, 1% duty cycle TGC low-power mode, 500-mVpp input,1% duty cycle No signal, ADC shutdown CW mode no signal, 16× clock = 32 MHz 102.5 71 59.5 80 CW power dissipation mW/CH 500-mVPP input, ADC shutdown , 16× clock = 32 MHz 173 AVDD_ADC (1.8-V) current 65MSPS 187 205 mA DVDD (1.8-V) current 65 MSPS 77 110 mA Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 15 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Electrical Characteristics (continued) AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1 µF at INP and bypassed to ground with 15 nF at INM, No active termination, VCNTL = 0 V, ƒIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF Filter = 15 MHz, low-noise mode, VOUT = –1 dBFS, Single-ended VCNTL mode, VCNTLM = GND, ADC configured in internal reference mode, internal 500-Ω CW feedback resistor, CMOS CW clocks, at ambient temperature, TA = 25°C, Digital demodulator is disabled unless otherwise noted. Min and max values are specified across full-temperature range with AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. PARAMETER TYP MAX 65 MSPS TEST CONDITIONS MIN 59 69 50 MSPS 51 40 MSPS 46 20 MSPS 35 ADC power dissipation/CH mW/CH PDN_VCA = High, PDN_ADC = High 25 Complete power-down PDN_Global = High 0.6 Power dissipation in power-down mode Power-down response time Power-up response time Power supply modulation ratio, AVDD and AVDD_5V Power supply rejection ratio (3) UNIT mW/CH Time taken to enter power down 1 µs VCA power down 2 µs + 1% of PDN time µs ADC power down 1 Complete power down 2.5 ms FIN = 5 MHz, at 50 mVPP noise at 1 kHz on supply (3) –65 dBc FIN = 5 MHz, at 50 mVpp noise at 50 kHz on supply (3) –65 ƒ = 10 kHz,VCNTL = 0 V (high gain), AVDD –40 dBc ƒ = 10 kHz,VCNTL = 0 V (high gain), AVDD_5 V –55 dBc ƒ = 10 kHz,VCNTL = 1 V (low gain), AVDD –50 dBc PSMR specification is with respect to carrier signal amplitude. 7.6 Digital Demodulator Electrical Characteristics AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, DVDD_LDO = 1.4 V (internal generated), 14 bit/65 MSPS, 4× decimation factor, at ambient temperature TA = 25°C, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Additional power consumption on DVDD (1.8 V) 65 MSPS, 4× decimation factor 90 mW/CH Additional power consumption on DVDD (1.8 V) 40 MSPS, 4× decimation factor 61 mW/CH Additional power consumption on DVDD (1.8 V) 65 MSPS, 32× decimation factor, half LVDS pairs are powered down 77 mW/CH Additional power consumption on DVDD (1.8 V) 40 MSPS, 32× decimation factor, half LVDS pairs are powered down 55 mW/CH VIH Logic high input voltage, TX_SYNC pin Support 1.8-V and 3.3-V CMOS logic 1.3 3.3 VIL Logic low input voltage, TX_SYNC pin Support 1.8-V and 3.3-V CMOS logic 0 0.3 IIH Logic high input current, TX_SYNC pin VHIGH = 1.8 V IIL Logic low input current, TX_SYNC pin VLOW = 0 V VIH Logic high input voltage, LDO_EN pin VIL Logic low input voltage, LDO_EN pin IIH Logic high input current, LDO_EN pin VHIGH = 1.8 V IIL Logic low input current, LDO_EN pin VLOW = 0 V 16 Submit Documentation Feedback 11 V V µA < 0.1 µA 1.7 3.3 V 0 0.3 V 11 µA < 0.1 µA Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 7.7 Digital Characteristics Typical values are at 25°C, AVDD = 3.3 V, AVDD_5 = 5 V and AVDD_ADC = 1.8 V, DVDD = 1.8 V unless otherwise noted. Minimum and maximum values are across the full temperature range: TMIN = 0°C to TMAX = 85°C. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT (1) DIGITAL INPUTS/OUTPUTS VIH Logic high input voltage 2 3.3 VIL Logic low input voltage 0 0.3 V V Logic high input current 200 µA Logic low input current 200 µA 5 pF VOH Input capacitance Logic high output voltage SDOUT pin DVDD V VOL Logic low output voltage SDOUT pin 0 V LVDS OUTPUTS Output differential voltage With 100-Ω external differential termination Output offset voltage Common-mode voltage FCLKP and FCLKM 1× clock rate 10 65 MHz DCLKP and DCLKM 7× clock rate 70 455 MHz 6× clock rate 60 390 MHz 400 1100 (2) tsu Data setup time th Data hold time (2) mV mV 350 ps 350 ps ADC INPUT CLOCK Clock frequency 10 Clock duty cycle 45% Sine-wave, AC-coupled Clock input amplitude, differential(VCLKP_ADC – VCLKM_ADC) Common-mode voltage (2) MSPS 55% 0.5 Vpp LVPECL, AC-coupled 1.6 Vpp LVDS, AC-coupled 0.7 Vpp Biased internally Clock input amplitude VCLKP_ADC (singleCMOS clock ended) (1) 65 50% 1 1.8 V Vpp The DC specifications refer to the condition where the LVDS outputs are not switching, but are permanently at a valid logic level 0 or 1 with 100-Ω external termination. Setup and hold time specifications take into account the effect of jitter on the output data and clock. These specifications also assume that the data and clock paths are perfectly matched within the receiver. Any mismatch in these paths within the receiver would appear as reduced timing margins Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 17 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 7.8 Switching Characteristics AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V. Typical values are at 25°C, Differential clock, CLOAD = 5 pF, RLOAD = 100 Ω, 14 bit, sample rate = 65 MSPS, digital demodulator is disabled, unless otherwise noted. Minimum and maximum values are across the full temperature range TMIN = 0°C to TMAX = 85°C. (1) PARAMETER ta tj TEST CONDITIONS MIN Aperture delay The delay in time between the rising edge of the input sampling clock and the actual time at which the sampling occurs. Aperture delay matching Across channels within the same device 0.7 Aperture jitter TYP MAX 3 ns ±150 ps 450 Fs rms 11/8 Input clock cycles ADC latency Default, after reset, or / 0 x 2 [12] = 1, LOW_LATENCY = 1 tdelay Data and frame clock delay Input clock rising edge (zero cross) to frame clock rising edge (zero cross) minus 3/7 of the input clock period (T) Δtdelay Delay variation At fixed supply and 20°C T difference; device to device tRISE Data rise time Rise time measured from –100 to 100 mV 0.14 tFALL Data fall time Fall time measured from 100 to –100 mV 10 MHz < ƒCLKIN < 65 MHz 0.15 tFCLKRISE Frame clock rise time Rise time measured from –100 to 100 mV 0.14 Frame clock fall time Fall time measured from 100 to –100 mV 10 MHz < ƒCLKIN < 65 MHz 0.15 tFCLKFALL 3 5.4 –1 Frame clock duty cycle Zero crossing of the rising edge to zero crossing of the falling edge tDCLKRISE Bit clock rise time Rise time measured from –100 to 100 mV 0.13 tDCLKFALL Bit clock fall time Fall time measured from 100 to –100 mV 10 MHz < ƒCLKIN < 65 MHz 0.12 Bit clock duty cycle Zero crossing of the rising edge to zero crossing of the falling edge 10 MHz < ƒCLKIN < 65 MHz (1) 48% UNIT 50% 46% 7 ns 1 ns ns ns 52% ns 54% Timing parameters are ensured by design and characterization; not production tested. 7.9 SPI Switching Characteristics Minimum values across full temperature range TMIN = 0°C to TMAX = 85°C, AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V PARAMETER MIN TYP MAX UNIT t1 SCLK period 50 ns t2 SCLK high time 20 ns t3 SCLK low time 20 ns t4 Data setup time 5 ns t5 Data hold time 5 ns t6 SEN fall to SCLK rise 8 ns t7 Time between last SCLK rising edge to SEN rising edge 8 ns t8 SDOUT delay 18 12 Submit Documentation Feedback 20 28 ns Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 7.10 Output Interface Timing Requirements (14-bit) ƒCLKIN, Input Clock Frequency ( 1) (2) (3) (1) (2) (3) Setup Time (tsu), ns Hold Time (th), ns tPROG = (3/7) × T + tdelay, ns Data Valid to Bit Clock ZeroCrossing Bit Clock Zero-Crossing to Data Invalid Input Clock Zero-Cross (Rising Edge) to Frame Clock Zero-Cross (Rising Edge) MHz MIN TYP MIN TYP MIN TYP MAX 65 0.24 0.37 MAX 0.24 0.38 MAX 11 12 12.5 50 0.41 0.54 0.46 0.57 13 13.9 14.4 40 0.55 0.70 0.61 0.73 15 16 16.7 30 0.87 1.10 0.94 1.1 18.5 19.5 20.1 20 1.30 1.56 1.46 1.6 25.7 26.7 27.3 FCLK timing is the same as for the output data lines. It has the same relation to DCLK as the data pins. Setup and hold are the same for the data and frame clock. Data valid is logic high = 100 mV and logic low = –100 mV Timing parameters are ensured by design and characterization; not production tested. SPACER NOTE The data from Output Interface Timing Requirements (14-bit) can be applied to 12-bit or 16-bit LVDS rates as well. For example, the maximum LVDS output rate at 65 MHz and 14-bit is equal to 910 MSPS, which is approximately equivalent to the rate at 56 MHz and 16 bits. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 19 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com tPROG 12-Bit 6x Serialization Mode Input Signal Sample N Sample N+Cd+1 Sample N+Cd ta ta Cd clock cycles latency Input Clock CLKIN Freq = fCLKIN Frame Clock FCLK Freq = fCLKIN T tPROG Bit Clock DCLK Freq = 7 x fCLKIN Output Data CHnOUT Data rate = 14 x fCLKIN D0 D13 D12 D1 (D12) (D13) (D0) (D1) D11 (D2) D10 D9 (D3) (D4) D8 D7 (D5) (D6) D6 D5 (D7) (D8) D4 D3 D2 D1 D0 (D9) (D10) (D11) (D12) (D13) D13 D12 (D0) (D1) D11 D10 (D2) (D3) D9 D8 (D4) (D5) SAMPLE N-Cd D13 (D0) D7 D6 (D6) (D7) D5 D4 D3 D2 D1 D0 D13 D12 (D8) (D9) (D10) (D11) (D12) (D13) (D0) (D1) SAMPLE N-1 D11 D10 (D2) (D3) D9 D8 (D4) (D5) D7 D6 (D6) (D7) D1 D0 D11 D5 D4 D3 D2 (D8) (D9) (D10) (D11) (D12) (D13) (D0) D10 (D1) SAMPLE N Data bit in MSB First mode 14-Bit 7x Serialization Mode Data bit in LSB First mode DCLKP Bit Clock DCLKM tsu th th tsu Output Data Pair CHi out Dn Dn + 1 T0434-01 LVDS Setup and Hold Timing Figure 1. LVDS Timing Diagrams 20 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 7.11 Typical Characteristics AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 45 45 Low noise Medium power Low power 40 35 35 30 Gain (dB) 25 20 25 20 15 15 10 10 5 5 0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3 1.4 1.5 Vcntl (V) 0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Figure 3. Gain Variation vs Temperature, LNA = 18 dB and PGA = 24 dB 9000 8000 8000 7000 7000 3000 Gain (dB) Gain (dB) G004 G005 Figure 4. Gain Matching Histogram, VCNTL = 0.3 V (34951 Channels) Figure 5. Gain Matching Histogram, VCNTL = 0.6 V (34951 Channels) 8000 Number of Occurrences 7000 Number of Occurrences 6000 5000 4000 3000 2000 1000 120 110 100 90 80 70 60 50 40 30 20 10 0 −72 −68 −64 −60 −56 −52 −48 −44 −40 −36 −32 −28 −24 −20 −16 −12 −8 −4 0 4 8 12 16 20 24 28 32 36 40 44 48 52 56 60 64 68 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 −0.1 −0.2 −0.3 −0.4 −0.5 −0.6 0 −0.7 0.6 0.5 0.4 0.3 −0.7 0.5 0.4 0.3 0.2 0 0.1 −0.1 −0.2 −0.3 −0.4 −0.5 −0.6 −0.7 0 −0.8 0 −0.9 1000 0.2 2000 1000 0.1 2000 4000 0 3000 5000 −0.1 4000 −0.2 5000 6000 −0.3 6000 −0.4 Number of Occurrences 9000 −0.5 Figure 2. Gain vs VCNTL, LNA = 18 dB and PGA = 24 dB −0.6 Gain (dB) 30 Number of Occurrences −40 deg C 25 deg C 85 deg C 40 Gain (dB) ADC Output G005 Figure 6. Gain Matching Histogram, VCNTL = 0.9 V (34951 Channels) G058 Figure 7. Output Offset Histogram, VCNTL = 0 V (1247 Channels) Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 21 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 10 Open 12000 −10 Phase (Degrees) 10000 Impedance (Ω) Open 0 8000 6000 4000 −20 −30 −40 −50 −60 −70 2000 −80 500k 4.5M 8.5M 12.5M 16.5M −90 500k 20.5M 4.5M Frequency (Hz) 500 350 300 250 200 150 0 −10 −20 −30 −40 −50 −60 100 −70 50 −80 12.5M 16.5M 50 Ω 100 Ω 200 Ω 400 Ω −90 500k 20.5M Frequency (Hz) 8.5M 12.5M 16.5M 3 10MHz 15MHz 20MHz 30MHz 0 0 −3 −6 Amplitude (dB) −5 −10 −15 −9 −12 −15 −18 −20 −21 −25 −24 01 00 11 10 −27 0 10 20 30 40 50 60 −30 10 100 Frequency (MHz) Figure 12. LPF Response 22 20.5M Figure 11. Input Impedance With Active Termination (Phase) 5 Amplitude (dB) 4.5M Frequency (Hz) Figure 10. Input Impedance With Active Termination (Magnitude) −30 20.5M 10 Phase (Degrees) Impedance (Ω) 400 8.5M 16.5M Figure 9. Input Impedance Without Active Termination (Phase) 50 Ω 100 Ω 200 Ω 400 Ω 450 4.5M 12.5M Frequency (Hz) Figure 8. Input Impedance Without Active Termination (Magnitude) 0 500k 8.5M 500 Frequency (kHz) Figure 13. LNA HPF Response vs Reg59[3:2] Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 5 −146 −150 Phase Noise (dBc/Hz) −5 −10 Amplitude (dB) 16X Clock Mode 8X Clock Mode 4X Clock Mode −148 0 −15 −20 −25 −152 −154 −156 −158 −160 −162 −164 −30 −166 −35 −40 −168 10 100 −170 100 500 1000 −146 −146 PN 1 Ch PN 8 Ch −148 −150 Phase Noise (dBc/Hz) Phase Noise (dBc/Hz) 16X Clock Mode 8X Clock Mode 4X Clock Mode −148 −150 −152 −154 −156 −158 −160 −162 −164 −152 −154 −156 −158 −160 −162 −164 −166 −166 −168 −168 −170 100 1000 10000 −170 100 50000 1000 Frequency Offset (Hz) 3.5 Hz) LNA 12 dB LNA 18 dB LNA 24 dB Input reffered noise (nV Hz) 50000 Figure 17. CW Phase Noise vs Clock Modes, FIN= 2 MHz 60 Input reffered noise (nV 10000 Offset Frequency (Hz) Figure 16. CW Phase Noise, FIN = 2 MHz, 1 Channel vs 8 Channel 40 50000 Figure 15. CW Phase Noise, FIN = 2 MHz Figure 14. Full Channel HPF Response at Default Register Setting 50 10000 Offset Frequency (Hz) Frequency (kHz) 30 20 10 0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Figure 18. IRN, PGA = 24 dB and Low Noise Mode 3.0 LNA 12 dB LNA 18 dB LNA 24 dB 2.5 2.0 1.5 1.0 0.5 0.0 0.0 0.1 0.2 Vcntl (V) 0.3 0.4 Figure 19. IRN, PGA = 24 dB and Low Noise Mode Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 23 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. Hz) 60 4.0 LNA 12 dB LNA 18 dB LNA 24 dB 50 Input reffered noise (nV Input reffered noise (nV Hz) 70 40 30 20 10 0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Hz) Input reffered noise (nV Hz) Input reffered noise (nV 50 40 30 20 10 1.5 1.0 0.1 0.2 Vcntl (V) 0.3 0.4 LNA 12 dB LNA 18 dB LNA 24 dB Output reffered noise (nV 170 150 130 110 90 70 50 30 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Figure 24. ORN, PGA = 24 dB and Low Noise Mode LNA 12 dB LNA 18 dB LNA 24 dB 3.0 2.5 2.0 1.5 1.0 0.1 0.2 Vcntl (V) 0.3 0.4 Figure 23. IRN, PGA = 24 dB and Low-Power Mode Hz) 190 3.5 0.5 0.0 Figure 22. IRN, PGA = 24 dB and Low-Power Mode 220 210 Hz) 2.0 4.0 LNA 12 dB LNA 18 dB LNA 24 dB 0 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Output reffered noise (nV 2.5 Figure 21. IRN, PGA = 24 dB and Medium-Power Mode 70 24 LNA 12 dB LNA 18 dB LNA 24 dB 3.0 0.5 0.0 Figure 20. IRN, PGA = 24 dB and Medium-Power Mode 60 3.5 300 280 260 240 220 200 180 160 140 120 100 80 60 40 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Vcntl (V) LNA 12 dB LNA 18 dB LNA 24 dB 1.0 1.1 1.2 Figure 25. ORN, PGA = 24 dB and Medium-Power Mode Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Typical Characteristics (continued) Output reffered noise (nV Hz) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 340 320 300 280 260 240 220 200 180 160 140 120 100 80 60 40 LNA 12 dB LNA 18 dB LNA 24 dB 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Vcntl (V) 1 1.1 1.2 Figure 26. ORN, PGA = 24 dB and Low-Power Mode Figure 27. IRN, PGA = 24 dB and Low Noise Mode 75 180.0 120.0 70 SNR (dBFS) Hz) 140.0 Amplitude (nV 160.0 100.0 80.0 65 60 60.0 40.0 1.0 24 dB PGA gain 30 dB PGA gain 3.0 5.0 7.0 Frequency (MHz) 9.0 55 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) 11.0 12.0 Figure 28. ORN, PGA = 24 dB and Low Noise Mode Figure 29. SNR, LNA = 18 dB and Low Noise Mode 75 73 Low noise Low power 71 69 SNR (dBFS) SNR (dBFS) 70 65 60 67 65 63 61 24 dB PGA gain 30 dB PGA gain 55 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) 59 57 0 Figure 30. SNR, LNA = 18 dB and Low-Power Mode 3 6 9 12 15 18 21 24 27 30 33 36 39 42 Gain (dB) Figure 31. SNR vs Different Power Modes Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 25 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 9 10 100 ohm act term 200 ohm act term 400 ohm act term Without Termination 8 8 Noise Figure (dB) Noise Figure (dB) 7 6 5 4 3 7 6 5 4 3 2 2 1 1 0 50 100 150 200 50 ohm act term 100 ohm act term 200 ohm act term 400 ohm act term Without Termination 9 250 300 350 0 400 50 100 150 Source Impedence (Ω) 200 250 300 350 400 Source Impedence (Ω) Figure 32. Noise Figure, LNA = 12 dB and Low Noise Mode Figure 33. Noise Figure, LNA = 18 dB and Low Noise Mode 8 50 ohm act term 100 ohm act term 200 ohm act term 400 ohm act term No Termination 7 Noise Figure (dB) 6 5 4 3 2 1 0 50 100 150 200 250 300 350 400 Source Impedence (Ω) Figure 34. Noise Figure, LNA = 24 dB and Low Noise Mode Figure 35. Noise Figure vs Power Modes With 400-Ω Termination −50.0 Low noise Low power Medium power −55.0 HD2 (dB) −60.0 −65.0 −70.0 −75.0 −80.0 Figure 36. Noise Figure vs Power Modes Without Termination 26 1 2 3 4 5 6 7 Frequency (MHz) 8 9 10 Figure 37. HD2 vs Frequency, VIN = 500 mVpp and VOUT = –1 dBFS Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. −45 −40 Low noise Low power Medium power −50 −50 −55 HD2 (dBc) −55 HD3 (dBc) Low noise Low power Medium power −45 −60 −65 −60 −65 −70 −75 −80 −70 −85 −75 1 2 3 4 5 6 7 Frequency (MHz) 8 9 −90 10 18 24 30 36 Figure 39. HD2 vs Gain, LNA = 12 dB and PGA = 24 dB and VOUT = –1 dBFS −40 −40 Low noise Low power Medium power −60 −70 Low noise Low power Medium power −50 HD2 (dBc) −50 HD3 (dBc) 12 Gain (dB) Figure 38. HD3 vs Frequency, VIN = 500 mVpp and VOUT = –1 dBFS −80 −90 6 −60 −70 −80 6 12 18 24 30 −90 36 12 18 24 Gain (dB) 30 36 42 Gain (dB) Figure 40. HD3 vs Gain, LNA = 12 dB and PGA = 24 dB and VOUT = –1 dBFS Figure 41. HD2 vs Gain, LNA = 18 dB and PGA = 24 dB and VOUT = –1 dBFS −40 −40 Low noise Low power Medium power −50 Low noise Low power Medium power −45 −50 HD2 (dBc) HD3 (dBc) −55 −60 −70 −60 −65 −70 −75 −80 −80 −85 −90 12 18 24 30 36 42 −90 18 Gain (dB) 24 30 36 42 48 Gain (dB) Figure 42. HD3 vs Gain, LNA = 18 dB and PGA = 24 dB and VOUT = –1 dBFS Figure 43. HD2 vs Gain, LNA = 24 dB and PGA = 24 dB and VOUT = –1 dBFS Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 27 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. −50 −40 Fin1=2MHz, Fin2=2.01MHz Fin1=5MHz, Fin2=5.01MHz Low noise Low power Medium power −54 IMD3 (dBFS) −50 HD3 (dB) −60 −70 −62 −66 −80 −90 −58 −70 18 21 24 27 30 33 36 Gain (dB) 39 42 45 48 14 18 22 26 30 Gain (dB) 34 42 G001 Figure 45. IMD3, Fout1 = –7 dBFS and Fout2 = –21 dBFS Figure 44. HD3 vs Gain, LNA = 24 dB and PGA = 24 dB and VOUT = –1 dBFS −50 −60 Vcntl = 0 Vcntl = 0.3 Vcntl = 0.6 Vcntl = 0.9 Fin1=2MHz, Fin2=2.01MHz Fin1=5MHz, Fin2=5.01MHz PSMR (dBc) −54 IMD3 (dBFS) 38 −58 −62 −65 −70 −66 −70 14 18 22 26 30 Gain (dB) 34 38 −75 42 10 100 1000 2000 Supply Frequency (kHz) Figure 46. IMD3, Fout1 = –7 dBFS and Fout2 = –7 dBFS Figure 47. AVDD Power Supply Modulation Ratio, 100 mVpp Supply Noise With Different Frequencies −20 −55 −65 −70 −75 Vcntl = 0 Vcntl = 0.3 Vcntl = 0.6 Vcntl = 0.9 −30 PSRR wrt supply tone (dB) Vcntl = 0 Vcntl = 0.3 Vcntl = 0.6 Vcntl = 0.9 −60 PSMR (dBc) 5 G001 −40 −50 −60 −70 −80 −80 5 10 100 1000 2000 −90 5 100 1000 2000 Supply Frequency (kHz) Supply Frequency (kHz) Figure 48. AVDD_5V Power Supply Modulation Ratio, 100 mVpp Supply Noise With Different Frequencies 28 10 Figure 49. AVDD Power Supply Rejection Ratio, 100 mVpp Supply Noise With Different Frequencies Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 20000.0 Vcntl = 0 Vcntl = 0.3 Vcntl = 0.6 Vcntl = 0.9 −30 16000.0 14000.0 Output Code −40 Output Code Vcntl 18000.0 −50 −60 12000.0 10000.0 8000.0 6000.0 −70 4000.0 2000.0 −80 −90 0.0 0.0 5 10 100 0.5 1.0 1.5 Time (µs) 1000 2000 2.0 2.5 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 −0.1 3.0 Vcntl (V) PSRR With Respect to Supply Tone (dB) −20 Supply Frequency (kHz) Figure 50. AVDD_5V Power Supply Rejection Ratio, 100 mVpp Supply Noise With Different Frequencies Output Code Vcntl 16000.0 Output Code 14000.0 12000.0 10000.0 8000.0 6000.0 4000.0 2000.0 0.0 0.0 0.2 0.5 0.8 1.0 1.2 1.5 Time (µs) 1.8 2.0 2.2 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 −0.1 2.5 1.2 1.0 0.8 0.6 0.4 Input (V) 18000.0 Vcntl (V) 20000.0 Figure 51. VCNTL Response Time, LNA = 18 dB and PGA = 24 dB 0.2 0.0 −0.2 −0.4 −0.6 −0.8 −1.0 −1.2 0.0 Figure 52. VCNTL Response Time, LNA = 18 dB and PGA = 24 dB 2.0 4.0 6.0 8.0 10.0 12.0 14.0 16.0 18.0 20.0 Time (µs) Figure 53. Pulse Inversion Asymmetrical Positive Input 1.2 10000.0 1.0 8000.0 0.8 Positive overload Negative overload Average 6000.0 0.6 4000.0 Output Code Input (V) 0.4 0.2 0.0 −0.2 −0.4 2000.0 0.0 −2000.0 −4000.0 −0.6 −6000.0 −0.8 −8000.0 −1.0 −1.2 0.0 2.0 4.0 6.0 8.0 10.0 12.0 14.0 16.0 18.0 20.0 Time (µs) Figure 54. Pulse Inversion Asymmetrical Negative Input −10000.0 0.0 1.0 2.0 3.0 Time (µs) 4.0 5.0 6.0 Figure 55. Pulse Inversion, VIN = 2 Vpp, PRF = 1 kHz, Gain = 21 dB Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 29 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Typical Characteristics (continued) AVDD_5 V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, AC-coupled with 0.1-µF capacitors at INP and 15-nF capacitors at INM, No active termination, VCNTL = 0 V, FIN = 5 MHz, LNA = 18 dB, PGA = 24 dB, 14 bit, sample rate = 65 MSPS, LPF filter = 15 MHz, low-noise mode, Single-ended VCNTL mode, VCNTLM = GND, ADC is configured in internal reference mode, VOUT = –1 dBFS, 500-Ω CW feedback resistor, CMOS 16× clock, digital demodulator is disabled, at ambient temperature TA = 25°C, unless otherwise noted. 10000 2000 47nF 15nF 6000 1200 4000 800 2000 0 −2000 400 0 −400 −4000 −800 −6000 −1200 −8000 −1600 −10000 0 0.5 1 1.5 2 2.5 3 Time (µs) 3.5 4 4.5 47nF 15nF 1600 Output Code Output Code 8000 −2000 5 Figure 56. Overload Recovery Response vs INM Capacitor, VIN = 50 mVpp/100 µVpp, Max Gain 1 1.5 2 2.5 3 3.5 Time (µs) 4 4.5 5 Figure 57. Overload Recovery Response vs INM Capacitor (Zoomed), VIN = 50 mVpp/100 µVpp, Max Gain 10 5 0 Gain (dB) −5 k=2 k=3 k=4 k=5 k=6 k=7 k=8 k=9 k=10 −10 −15 −20 −25 −30 −35 −40 0 0.2 0.4 0.6 0.8 1 1.2 1.4 Frequency (MHz) 1.6 2 G000 Figure 58. Digital HPF Response 30 1.8 Figure 59. Signal Chain Low Frequency Response With INM Capacitor = 1 µF Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 8 Detailed Description 8.1 Overview The AFE5809 device is a highly-integrated AFE solution specifically designed for ultrasound systems in which high performance and small size are required. The AFE5809 device integrates a complete TGC imaging path and a CWD path. It also enables users to select one of various power/noise combinations to optimize system performance. The AFE5809 device contains eight channels; each channel includes a LNA, VCAT, PGA, LPF, 14bit ADC, digital I/Q demodulator, and CW mixer. Multiple features in the AFE5809 device are suitable for ultrasound applications, such as active termination, individual channel control, fast power-up and power-down response, programmable clamp voltage control, and fast and consistent overload recovery. Therefore, the AFE5809 device brings premium image quality to ultraportable, handheld systems all the way up to high-end ultrasound systems. In addition, the signal chain of the AFE5809 device can handle signal frequency as low as 50 kHz and as high as 30 MHz. This enables the AFE5809 device to be used in both sonar and medical applications. Figure 60 shows a simplified functional block diagram. 8.2 Functional Block Diagram SPI IN 16X CLKP 16X CLKN AFE5809 with Demodulator 1 of 8 Channels SPI Logic VCAT LNA 0 to -40 dB 16 Phases Generator 1X CLK CW Mixer PGA 24, 30dB 3rd LP Filter 10, 15, 20, 30 MHz 14 Bit ADC Digital DeMod & LP Filter Summing Amplifier/ Filter Reference Reference Logic Control CW I/Q Vout Differential TGC Vcntl EXT/INT REFM/P DeMod Control LVDS LVDS Serializer OUT Figure 60. Simplified Functional Block Diagram Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 31 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Functional Block Diagram (continued) Channels 1, 2 -SIN COS C0 I ADC 1 DC Removal 14bit 40MHz Down Conversion I Q Q Samples RAM -SIN I DC Removal ADC 2 14bit 40MHz ADC 3 Cn I Decimation Filter Q LVDS 1 COS 14bit 40MHz ... Down Conversion Q C0 ... I Q Serializer Cn I Decimation Filter 640Mbps Q Channels 3, 4 LVDS 2 ADC 4 640Mbps 14bit 40MHz ADC 5 14bit 40MHz Channels 5, 6 LVDS 3 ADC 6 640Mbps 14bit 40MHz ADC 7 14bit 40MHz Channels 7, 8 LVDS 4 ADC 8 640Mbps 14bit 40MHz COS -SIN C0 COS & -SIN Table ... Cn Coefficient Memory Freq Regsiters Control Control Figure 61. Digital Demodulator Block Diagram 8.3 Feature Description 8.3.1 LNA In many high-gain systems, a LNA is critical to achieve overall performance. Using a new proprietary architecture, the LNA in the AFE5809 device delivers exceptional low-noise performance, while operating on a low-quiescent current compared to CMOS-based architectures with similar noise performance. The LNA performs single-ended input to differential output voltage conversion. It is configurable for a programmable gain of 24, 18, or 12 dB and its input-referred noise is only 0.63, 0.7, or 0.9 nV/√Hz, respectively. Programmable gain settings result in a flexible linear input range up to 1 Vpp, realizing high-signal handling capability demanded by new transducer technologies. A larger input signal can be accepted by the LNA; however, the signal can be distorted because it exceeds the LNA’s linear operation region. Combining the low noise and high-input range, the device consequently achieves a wide-input dynamic range for supporting the high demands from various ultrasound imaging modes. 32 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Feature Description (continued) The LNA input is internally biased at approximately 2.4 V; the signal source should be AC-coupled to the LNA input by an adequately-sized capacitor, for example ≥0.1 µF. To achieve low DC offset drift, the AFE5809 device incorporates a DC offset correction circuit for each amplifier stage. To improve the overload recovery, an integrator circuit is used to extract the DC component of the LNA output and then fed back to the LNA’s complementary input for DC offset correction. This DC offset correction circuit has a high-pass response and can be treated as a HPF. The effective corner frequency is determined by the capacitor CBYPASS connected at INM. With larger capacitors, the corner frequency is lower. For stable operation at the highest HP filter cut-off frequency, a ≥15-nF capacitor can be selected. This corner frequency scales almost linearly with the value of the CBYPASS. For example, 15 nF gives a corner frequency of approximately 100 kHz, while 47 nF can give an effective corner frequency of 33 kHz. The DC offset correction circuit can also be disabled or enabled through register 52[12]. A large capacitor like 1 µF can be used for setting low corner frequency (–2 dBFS. For example, for a –2-dBFS output level, the HD3 degrades by approximately 3 dB. To maximize the output dynamic range, the maximum PGA output level can be above 2 Vpp even with the clamp circuit enabled; the ADC in the AFE5809 device has excellent overload recovery performance to detect small signals right after the overload. NOTE In the low-power and medium-power modes, PGA_CLAMP is disabled for saving power if 51[7] = 0. The AFE5809 device integrates an anti-aliasing filter in the form of a programmable LPF in the transimpedance amplifier. The LPF is designed as a differential, active, third-order filter with Butterworth characteristics and a typical 18 dB per octave roll-off. Programmable through the serial interface, the –1-dB frequency corner can be set to one of 10, 15, 20, and 30 MHz. The filter bandwidth is set for all channels simultaneously. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 35 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com A selectable DC offset correction circuit is implemented in the PGA as well. This correction circuit is similar to the one used in the LNA. It extracts the DC component of the PGA outputs and feeds back to the PGA complementary inputs for DC offset correction. This DC offset correction circuit also has a high-pass response with a cut-off frequency of 80 kHz. 8.3.4 ADC The ADC of the AFE5809 device employs a pipelined converter architecture that consists of a combination of multi-bit and single-bit internal stages. Each stage feeds its data into the digital error correction logic, ensuring excellent differential linearity and no missing codes at the 14-bit level. The 14 bits given out by each channel are serialized and sent out on a single pair of pins in LVDS format. All eight channels of the AFE5809 device operate from a common input clock (CLKP/M). The sampling clocks for each of the eight channels are generated from the input clock using a carefully matched clock buffer tree. The 14× clock required for the serializer is generated internally from the CLKP/M pins. A 7× and 1× clock are also given out in LVDS format, along with the data, to enable easy data capture. The AFE5809 device operates from internally-generated reference voltages that are trimmed to improve the gain matching across devices. The nominal values of REFP and REFM are 1.5 and 0.5 V, respectively. Alternatively, the device also supports an external reference mode that can be enabled using the serial interface. Using serialized LVDS transmission has multiple advantages, such as a reduced number of output pins (saving routing space on the board), reduced power consumption, and reduced effects of digital-noise coupling to the analog circuit inside the AFE5809 device. 8.3.5 Continuous-Wave (CW) Beamformer CWD is a key function in mid-end to high-end ultrasound systems. Compared to the TGC mode, the CW path needs to handle high dynamic range along with strict phase-noise performance. CW beamforming is often implemented in analog domain due to the strict requirements. Multiple beamforming methods are implemented in ultrasound systems, including passive delay line, active mixer, and passive mixer. Among all of them, the passive mixer approach achieves optimized power and noise. It satisfies the CW processing requirements, such as wide dynamic range, low phase noise, accurate gain and phase matching. Figure 66 and Figure 67 show a simplified CW path block diagram and an in-phase or quadrature (I/Q) channel block diagram, respectively. Each CW channel includes a LNA, a voltage-to-current converter, a switch-based mixer, a shared summing amplifier with a LPF, and clocking circuits. NOTE The local oscillator inputs of the passive mixer are cos(ωt) for I-CH and sin(ωt) for Q-CH respectively. Depending on the users' CW Doppler complex FFT processing, swapping I/Q channels in FPGA or DSP may be needed to get correct blood flow directions. All blocks include well-matched in-phase and quadrature channels to achieve good image frequency rejection as well as beamforming accuracy. As a result, the image rejection ratio from an I/Q channel is better than –46 dBc, which is desired in ultrasound systems. 36 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 I-CLK LNA1 Voltage to Current Converter I-CH Q-CH Q-CLK Sum Amp with LPF 1×fcw CLK I-CH Clock Distribution Circuits Q-CH N×fcw CLK Sum Amp with LPF I-CLK LNA8 Voltage to Current Converter I-CH Q-CH Q-CLK Figure 66. Simplified Block Diagram of CW Path ACT1 500Ω IN1 INPUT1 INM1 Mixer Clock 1 LNA1 Cext 500Ω ACT2 500Ω IN2 INPUT2 INM2 Mixer Clock 2 CW_AMPINM 10Ω 10Ω LNA2 500Ω CW _AMPINP Rint/Rext CW_OUTP I/V Sum Amp Rint/Rext CW_OUTM Cext CW I or Q CHANNEL Structure ACT8 500Ω IN8 INPUT8 INM8 Mixer Clock 8 LNA8 500Ω Note: The approximately 10- to 15-Ω resistors at CW_AMPINM/P are due to internal IC routing and can create slight attenuation. Figure 67. Complete In-Phase or Quadrature-Phase Channel The CW mixer in the AFE5809 device is passive and switch based; a passive mixer adds less noise than an active mixer. It achieves good performance at low power. Figure 68 and the equations describe the principles of mixer operation, where Vi(t), Vo(t), and LO(t) are input, output, and local oscillator (LO) signals for a mixer respectively. The LO(t) is square-wave based and includes odd harmonic components, as shown in Equation 1. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 37 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Vi(t) Vo(t) LO(t) Figure 68. Block Diagram of Mixer Operation Vi(t) = sin (w0 t + wd t + j ) + f (w0 t ) 4é 1 1 ù sin (w0 t ) + sin (3w0 t ) + sin (5w0 t )...ú ê 3 5 pë û 2 Vo(t) = éëcos (wd t + f ) - cos (2w0 t - wd t + f )...ùû p LO(t) = (1) From Equation 1, the third-order and fifth-order harmonics from the LO can interface with the third-order and fifthorder harmonic signals in the Vi(t), or the noise around the third-order and fifth-order harmonics in the Vi(t). Therefore, the mixer’s performance is degraded. To eliminate this side effect due to the square-wave demodulation, a proprietary harmonic-suppression circuit is implemented in the AFE5809 device. The third- and fifth-harmonic components from the LO can be suppressed by over 12 dB. Thus, the LNA output noise around the third-order and fifth-order harmonic bands is not down-converted to base band. Hence, the device achieves better noise figure. The conversion loss of the mixer is about –4 dB, which is derived from 20log10 2 p. The mixed current outputs of the eight channels are summed together internally. An internal low-noise operational amplifier is used to convert the summed current to a voltage output. The internal summing amplifier is designed to accomplish low-power consumption, low noise, and ease of use. CW outputs from multiple AFE5809 devices can be further combined on system board to implement a CW beamformer with more than eight channels. See Typical Application for more detailed information. Multiple clock options are supported in the AFE5809 CW path. Two CW clock inputs are required: N × ƒcw clock and 1 × ƒcw clock, where ƒcw is the CW transmitting frequency and N could be 16, 8, 4, or 1. Users have the flexibility to select the most convenient system clock solution for the AFE5809 device. In the 16 × ƒcw and 8 × ƒcw modes, the third- and fifth-harmonic suppression feature can be supported. Thus, the 16 × ƒcw and 8 × ƒcw modes achieve better performance than the 4 × ƒcw and 1 × ƒcw modes. 8.3.5.1 16 × ƒcw Mode The 16 × ƒcw mode achieves the best phase accuracy compared to other modes. It is the default mode for CW operation. In this mode, 16 × ƒcw and 1 × ƒcw clocks are required. 16 × ƒcw generates LO signals with 16 accurate phases. Multiple AFE5809 devices can be synchronized by the 1 × ƒcw , that is LO signals in multiple AFEs can have the same starting phase. The phase noise specification is critical only for 16× clock. The 1× clock is for synchronization only and does not require low phase noise. See the phase noise requirement in Typical Application. Figure 69 shows the top-level clock distribution diagram. Each mixer's clock is distributed through a 16 × 8 crosspoint switch. The inputs of the cross-point switch are 16 different phases of the 1× clock. TI recommends aligning the rising edges of the 1 × ƒcw and 16 × ƒcw clocks. The cross-point switch distributes the clocks with appropriate phase delay to each mixer. For example, Vi(t) is a 1 received signal with a delay of 16 1 T T , a delayed LO(t) should be applied to the mixer to compensate for the 16 2p delay. Thus a 22.5⁰ delayed clock, that is 16 , is selected for this channel. The mathematic calculation is expressed in the following equations: 38 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 é æ ù 1 ö Vi(t) = sin êw0 ç t + ÷ + wd t ú = sin [w0 t + 22.5° + wd t ] êë è 16 f0 ø úû LO(t) = é æ 4 1 öù 4 sin êw0 ç t + ÷ ú = sin [w0 t + 22.5°] p ëê è 16 f0 ø ûú p Vo(t) = 2 cos (wd t ) + f (wn t ) p (2) Vo(t) represents the demodulated Doppler signal of each channel. When the Doppler signals from N channels are summed, the signal-to-noise ratio improves. Fin 16X Clock INV D Q Fin 1X Clock Fin 1X Clock 16 Phase Generator 1X Clock Phase 0º 1X Clock Phase 22.5º SPI 1X Clock Phase 292.5º 1X Clock Phase 315º 1X Clock Phase 337.5º 16-to-8 Cross Point Switch Mixer 1 1X Clock Mixer 2 1X Clock Mixer 3 1X Clock Mixer 6 1X Clock Mixer 7 1X Clock Mixer 8 1X Clock Figure 69. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 39 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Figure 70. 1× and 16× CW Clock Timing 8.3.5.2 8 × ƒcw and 4 × ƒcw Modes 8 × ƒcw and 4 × ƒcw modes are alternative modes when a higher frequency clock solution (that is 16 × ƒcw clock) is not available in system. Figure 71 shows a block diagram of these two modes. Good phase accuracy and matching are also maintained. Quadrature clock generator is used to create in-phase and quadrature clocks with exactly 90° phase difference. The only difference between 8 × ƒcw and 4 × ƒcw modes is the accessibility of the third- and fifth-harmonic suppression filter. In the 8 × ƒcw mode, the suppression filter 1 can be supported. In both modes, 16 T phase delay resolution is achieved by weighting the in-phase and 1 T quadrature paths correspondingly. For example, if a delay of 16 or 22.5° is targeted, the weighting coefficients should follow Equation 3, assuming Iin and Qin are sin(ω0t) and cos(ω0t) respectively. æ 1 ö æ 2p ö æ 2p ö Idelayed (t) = Iin cos ç ÷ + Qin sin ç ÷ = Iin ç t + ÷ è 16 ø è 16 ø è 16 f0 ø æ 1 ö æ 2p ö æ 2p ö Qdelayed (t) = Qin cos ç ÷ - Iin sin ç ÷ = Qin ç t + ÷ è 16 ø è 16 ø è 16 f0 ø (3) Therefore, after I/Q mixers, phase delay in the received signals is compensated. The mixers’ outputs from all channels are aligned and added linearly to improve the signal-to-noise ratio. It is preferred to have the 4 × ƒcw or 8 × ƒcw and 1 × ƒcw clocks both aligned at the rising edge. 40 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 INV 4X/8X Clock I/Q CLK Generator D Q 1X Clock LNA2~8 In-phase CLK Summed In-Phase Quadrature CLK I/V Weight Weight LNA1 I/V Weight Summed Quadrature Weight Figure 71. 8 × ƒcw and 4 × ƒcw Block Diagram Figure 72. 8 × ƒcw and 4 × ƒcw Timing Diagram Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 41 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 8.3.5.3 1 × ƒcw Mode 1 T The 1 × ƒcw mode requires in-phase and quadrature clocks with low phase noise specifications. The 16 phase delay resolution is also achieved by weighting the in-phase and quadrature signals as described in the 8 × ƒcw and 4 × ƒcw modes. Syncronized I/Q CLOCKs LNA2~8 In-phase CLK Summed In-Phase Quadrature CLK I/V Weight Weight LNA1 I/V Weight Summed Quadrature Weight Figure 73. Block Diagram of 1 x ƒcw mode 8.3.6 Digital I/Q Demodulator The AFE5809 device also includes a digital in-phase and quadrature (I/Q) demodulator and a low-pass decimation filter. The main purpose of the demodulation block is to reduce the LVDS data rate and improve overall system power efficiency. The I/Q demodulator accepts ADC output with up to 65-MSPS sampling rate and 14-bit resolution. For example, after digital demodulation and 4× decimation filtering, the data rate for either in-phase or quadrature output is reduced to 16.25 MSPS, and the data resolution is improved to 16 bits consequently. Hence, the overall LVDS trace reduction can be a factor of 2. This demodulator can be bypassed and powered down completely if it is not needed. The digital demodulator block given in the AFE5809 device is designed to do down-conversion followed by decimation. The top-level block is divided into two exactly similar blocks: (1) subchip0 and (2) subchip1. Both subchips share four channels each, that is, subchip0 (ADC.1, ADC.2, ADC.3, and ADC.4) and subchip1 (ADC.5, ADC.6, ADC.7, and ADC.8). 42 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 ADC.1 ADC.2 ADC.3 ADC.4 ADC.5 ADC.6 ADC.7 ADC.8 LVDS.1 CH.A LVDS.2 CH.B CH.C Sub-Chip 0 LVDS.3 LVDS.4 CH.D LVDS.5 CH.A LVDS.6 CH.B Sub-Chip 1 CH.C CH.D LVDS.7 LVDS.8 Figure 74. Subchip The following four functioning blocks are given in each demodulator. Every block can be bypassed. • DC removal block • Down conversion • Decimator • Channel multiplexing Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 43 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Down Conversion (I Phase) Decimator M A.I To Channel Multiplexing Cos ωt DC Removal Block Down Sampler Decimation Filter DC Offset Channel A Down Conversion (Q Phase) Decimator -Sin ωt M A.Q To Channel Multiplexing Down Sampler Decimation Filter Figure 75. Digital Demodulator Block 1. DC removal block is used to remove DC offset. An offset value can be given to a specific register. 2. Down conversion or demodulation of signal is done by multiplying signal by cos(ω0t) and by –sin(ω0t) to give out I phase and Q phase, respectively. cos(ωt) and –sin(ωt) are 14-bit wide plus a sign bit. ω = 2πƒ, ƒ can be set with resolution Fs / 216, where Fs is the ADC sampling frequency. NOTE The digital demodulator is based on a conventional down converter, that is, –sin(ω0t) is used for Q phase. 3. The decimator block has two functions: decimation filter and down sampler. Decimation filter is a variable coefficient symmetric FIR filter and its coefficients can be given using coefficient RAM. Number of taps of FIR filter is 16× decimation factor (M). For decimation factor of M, 8M coefficients must be stored in the coefficient bank. Each coefficient is 14-bit wide. Down-sampler gives out 1 sample followed by M – 1 samples zeros. 4. In Figure 76, channel multiplexing is implemented for flexible data routing: 44 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 ADC.1 A.I ADC.1 Channel A 14bits 16bits Single Channel Demodulator Blocks A.Q 16bits LVDS.1 C H Serializer DEMOD.1 A N N ADC.2 E B.I ADC.2 Channel B 14bits LVDS.2 L 16bits Single Channel Demodulator Blocks Serializer DEMOD.2 B.Q 16bits M U ADC.3 L C.I ADC.3 Channel C 14bits 16bits Single Channel Demodulator Blocks C.Q 16bits LVDS.3 Serializer T I DEMOD.3 P L E ADC.4 X D.I ADC.4 Channel D 14bits 16bits Single Channel Demodulator Blocks I N LVDS.4 Serializer DEMOD.4 G D.Q 16bits Figure 76. Channel Multiplexing 8.3.7 Equivalent Circuits CM CM (a) INP (b) INM (c) ACT S0492-01 Figure 77. Equivalent Circuits of LNA Inputs Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 45 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com S0493-01 Figure 78. Equivalent Circuits of VCNTLP/M VCM 5 kΩ 5 kΩ CLKP CLKM (a) CW 1X and 16X Clocks (b) ADC Input Clocks S0494-01 Figure 79. Equivalent Circuits of Clock Inputs 46 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 (a) CW_OUTP/M (b) CW_AMPINP/M S0495-01 Figure 80. Equivalent Circuits of CW Summing Amplifier Inputs and Outputs + – Low +Vdiff High AFE5809 OUTP + – –Vdiff + – High Vcommon Low External 100-W Load Rout OUTM Switch impedance is nominally 50 W (±10%) Figure 81. Equivalent Circuits of LVDS Outputs 8.3.8 LVDS Output Interface Description The AFE5809 device has a LVDS output interface, which supports multiple output formats. The ADC resolutions can be configured as 12 bit or 14 bit as shown in the LVDS timing diagrams (Figure 1). The ADCs in the AFE5809 device are running at 14 bits; 2 LSBs are removed when 12-bit output is selected; and two zeros are added at LSBs when 16-bit output is selected. Appropriate ADC resolutions can be selected for optimizing system-performance cost effectiveness. When the devices run at 16-bit mode, higher-end FPGAs are required to process the higher rate of LVDS data. Corresponding register settings are listed in Table 4. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 47 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 8.4 Device Functional Modes The AFE5809 device is a highly-integrated AFE solution. The AFE5809 device has two functional modes: pulsed-wave imaging mode and continous-wave Doppler imaging mode. When the AFE5809 device operates in the pulsed-wave imaging mode, LNA, VCAT, PGA, LPF, 14-bit ADC, and digital I/Q demodulator are active. In the CWD imaging mode, only LNA and CW mixer are enabled. Either mode can be enabled or programmed by the registers described below. 8.5 Programming 8.5.1 Serial Peripheral Interface (SPI) Operation The AFE5809 device has two SPIs. The demodulator SPI interface is independent from the ADC/VCA SPI as shown in Figure 82. SPI_DIG_EN is used to select ADC/VCA SPI (SPI_DIG_EN='1') or demod SPI (SPI_DIG_EN='0'). Figure 82. SPI Interface in the AFE5809 Device 8.5.1.1 ADC/VCA Serial Register Write Description Programming of different modes can be done through the serial interface formed by pins SEN (serial interface enable), SCLK (serial interface clock), SDATA (serial interface data), and RESET. All these pins have a pulldown resistor to GND of 20 kΩ. Serial shift of bits into the device is enabled when SEN is low. Serial data, SDATA, is latched at every rising edge of SCLK when SEN is active (low). The serial data is loaded into the register at every 24th SCLK rising edge when SEN is low. If the word length exceeds a multiple of 24 bits, the excess bits are ignored. Data can be loaded in multiple of 24-bit words within a single active SEN pulse (an internal counter counts groups of 24 clocks after the falling edge of SEN). The interface can work with the SCLK frequency from 20 MHz to low speeds (of a few Hertz) and even with non-50% duty cycle SCLK. The data is divided into two main portions: a register address (8 bits) and the data itself (16 bits), to load on the addressed register. When writing to a register with unused bits, set these to 0. Figure 83 shows this process. 48 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Programming (continued) Start Sequence End Sequence SEN t6 t7 t1 t2 Data Latched On Rising Edge of SCLK SCLK t3 SDATA A7 A5 A6 A4 A3 A2 A1 A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 t4 t5 Start Sequence End Sequence RESET T0384-01 Figure 83. SPI Timing NOTE TI recommends synchronizing SCLK to ADC CLK. Typically, SCLK can be generated by dividing ADC CLK by an integer factor of N. In a system with multiple AFEs, SCLKs may not reach all AFEs simultaneously due to routing. To compensate routing differences and ensure AFEs’ outputs are aligned, SCLK can be adjusted to toggle on either the falling edge of ADCLK or the rising edge of ADC CLK (ensuring new register settings are loaded before next ADC sampling clock). 8.5.1.2 ADC/VCA Serial Register Readout Description The device includes an option where the contents of the internal registers can be read back. This may be useful as a diagnostic test to verify the serial interface communication between the external controller and the AFE. First, the bit (Reg0[1]) needs to be set to 1. Then, the user should initiate a serial interface cycle specifying the address of the register (A7 through A0) whose content must be read. The data bits are don’t care. The device outputs the contents (D15 through D0) of the selected register on the SDOUT pin. SDOUT has a typical delay, t8, of 20 ns from the falling edge of the SCLK. For lower speed SCLK, SDOUT can be latched on the rising edge of SCLK. For higher speed SCLK, for example, if the SCLK period is less than 60 ns, it is better to latch the SDOUT at the next falling edge of SCLK. Figure 84 shows this operation (the timing specifications follow the same information provided). In the readout mode, users still can access the through SDATA/SCLK/SEN. To enable serial register writes, set the bit back to 0. The AFE5809 SDOUT buffer is tri-stated and gets enabled only when 0[1] (REGISTER READOUT ENABLE) is enabled. SDOUT pins from multiple AFE5809 devices can be tied together without any pullup resistors. Level shifter SN74AUP1T04 can be used to convert 1.8-V logic to 2.5-V/3.3-V logics if needed. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 49 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Programming (continued) Start Sequence End Sequence SEN t6 t7 t1 t2 SCLK t3 A7 SDATA A6 A5 A4 A3 t4 A2 A1 A0 x x x x x x x x x x x x x x x x D6 D5 D4 D3 D2 D1 D0 t8 t5 D15 D14 D13 D12 D11 D10 D9 SDOUT D8 D7 Figure 84. Serial Interface Register Read 8.5.1.3 Digital Demodulator SPI Description Demodulator is enabled after a software or hardware reset. It can be disabled by setting the LSB of register 0x16 as 1. This is done using the ADC SPI interface, that is, SPI_DIG_EN = 1. To access the specific demodulator registers: 1. SPI_DIG_EN pin is required to be set as 0 during SPI transactions to demodulator registers. Meanwhile, ADC SEN needs to be set as 0 during demodulator SPI programming. 2. The SPI register address is 8 bits and is made of 2 subchip select bits and 6 register address bits. SPI register data is 16 bits. Table 2. Register Address Bit Description Bit7 Bit6 Bit 5:0 SCID1_SEL SCID0_SEL Register address 3. SCID0_SEL enables configuration of channels 1 through 4. SCID1_SEL enables configuration of channels 5 through 8. When performing demodulator SPI write transactions, these SCID bits can be individually or mutually used with a specific register address. 4. Register configuration is normally shared by both subchips (both SCID bits should be set as 1). An exception to this rule would be the DC OFFSET registers (0x14 through 0x17) for which specific channel access is expected. 50 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 ADC.1 ADC.2 ADC.3 ADC.4 ADC.5 ADC.6 ADC.7 ADC.8 LVDS.1 CH.A LVDS.2 CH.B CH.C Sub-Chip 0 LVDS.3 LVDS.4 CH.D LVDS.5 CH.A LVDS.6 CH.B Sub-Chip 1 CH.C CH.D A. Each of two subchips supports four channels. B. Each of two demodulators has four channels named as A, B, C, and D. LVDS.7 LVDS.8 Figure 85. Demod Subchip 0 and Subchip 1 5. Demodulator register readout follows these procedures: – Write 1 to register 0x0[1]; pin SPI_DIG_EN should be 0 while writing. This is the readout enable register for demodulator. – Write 1 to register 0x0[1]; pin SPI_DIG_EN should be 1 while writing. This is the readout enable register for ADC and VCA. – Set SPI_DIG_EN as 0 and write anything to the register whose stored data needs to be known. Device finds the address of the register and sends its stored data at the SDOUT pin serially. NOTE After enabling the register 0x0[1] REGISTER_READOUT_ENABLE, data cannot be written to the register (whose data needs to be known), but stored data would come serially at the SDOUT pin. – To disable the register readout, first write 0 to register 0x0[1] while SPI_DIG_EN is 1; then write 0 to register 0x0[1] while SPI_DIG_EN is 0. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 51 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 8.6 Register Maps 8.6.1 ADC and VCA Register Description A reset process is required at the AFE5809 device's initialization stage. Initialization can be done in one of two ways: • Through a hardware reset, by applying a positive pulse in the RESET pin. • Through a software reset, using the serial interface, by setting the SOFTWARE RESET bit to high. Setting this bit initializes the internal registers to the respective default values (all zeros), and then self-resets the SOFTWARE RESET bit to low. In this case, the RESET pin can stay low (inactive). After reset, all ADC and VCA registers are set to 0, that is default setting. During register programming, all unlisted register bits must be set as 0. Some demodulator registers are set as 1 after reset. During register programming, all unlisted register bits must be set as 0. In addition, the demodulator registers can be reset when 0x16[0] is set as 0. Thus, it is required to reconfigure the demodulator registers after toggling the 0x16[0] from 1 to 0. 8.6.1.1 ADC Register Map Address (DEC) 0[0] 0[1] Address (HEX) 0x0[0] 0x0[1] Default Value 0 0 Function Description SOFTWARE_RESET 0: Normal operation 1: Resets the device and self-clears the bit to 0. Note: Register 0 is a write only register. REGISTER_READOUT_ENABLE 0:Disables readout 1: Enables readout of register at SDOUT pin. Note: When this bit is set to 0, the device always operates in write mode and when it is set to 1, device will be in read mode. Multiple reading or writing events can be performed when this bit is set to 1 or 0 correspondingly. Register 0 is a write-only register. 1[0] 0x1[0] 0 ADC_COMPLETE_PDN 0: Normal 1: Complete power down. Note: When the complete power-down mode is enabled, the digital demodulator may lose register settings. Therefore, it is required to reconfigure the demodulator registers, filter coefficient memory, and profile memory after exiting the complete power-down mode. 1[1] 0x1[1] 0 LVDS_OUTPUT_DISABLE 0: Output enabled 1: Output disabled 1[9:2] 0x1[9:2] 0 ADC_PDN_CH 0: Normal operation 1: Power down. Power down individual ADC channels. 1[9] → CH8…1[2] → CH1 1[10] 0x1[10] 0 PARTIAL_PDN 0: Normal operation 1: Partial power down ADC 1[11] 0x1[11] 0 LOW_FREQUENCY_ NOISE_SUPPRESSION 0: No suppression 1: Suppression enabled 1[13] 0x1[13] 0 EXT_REF 0: Internal reference 1: External reference. VREF_IN is used. Both 3[15] and 1[13] should be set as 1 in the external reference mode 1[14] 0x1[14] 0 LVDS_OUTPUT_RATE_2X 0: 1× rate 1: 2× rate. Combines data from 2 channels on 1 LVDS pair. When ADC clock rate is low, this feature can be used. 1[15] 0x1[15] 0 SINGLE-ENDED_CLK_MODE 0: Differential clock input 1: Single-ended clock input 2[2:0] 0x2[2:0] 0 RESERVED Set to 0 2[10:3] 0x2[10:3] 0 POWER-DOWN_LVDS 0: Normal operation 1: PDN individual LVDS outputs. 2[10] → CH8…2[3] → CH1 2[11] 0x2[11] 0 AVERAGING_ENABLE 0: No averaging 1: Average two channels to increase SNR 2[12] 0x2[12] 0 LOW_LATENCY 0: Default latency with digital features supported 1: Low latency with digital features bypassed 52 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Register Maps (continued) Address (DEC) 2[15:13] Address (HEX) 0x2[15:13] Default Value 0 Function Description TEST_PATTERN_MODES 000: Normal operation 001: Sync 010: De-skew 011: Custom 100:All 1's 101: Toggle 110: All 0's 111: Ramp 3[7:0] 0x3[7:0] 0 INVERT_CHANNELS 0: No inverting 1: Invert channel digital output. 3[7] → CH8;3[0] → CH1. Note: Suppose that the device is giving digital output of 11001100001111. After enabling this bit, output of device becomes 00110011110000. Note: This function is not applicable for ADC test patterns and in demod mode. 3[8] 0x3[8] 0 CHANNEL_OFFSET_ SUBSTRACTION_ENABLE 0: No offset subtraction 1: Offset value subtract enabled 3[9:11] 0x3[9:11] 0 RESERVED Set to 0 3[12] 0x3[12] 0 DIGITAL_GAIN_ENABLE 0: No digital gain 1: Digital gain enabled 3[14:13] 0x3[14:13] 0 SERIALIZED_DATA_RATE Serialization factor 00: 14× 01: 16× 10: Reserved 11: 12× When 4[1] = 1, in the 16× serialization rate, two zeros are filled at two LSBs (see Table 4). Note: Make sure the settings aligning with the demod register 0x3[14:13]. Be aware that the same setting, for example, 00, in these two registers can represent different LVDS data rates respectively. 3[15] 0x3[15] 0 ENABLE_EXTERNAL_ REFERENCE_MODE 0: Internal reference mode 1: Set to external reference mode Note: Both 3[15] and 1[13] should be set as 1 when configuring the device in the external reference mode. 4[1] 0x4[1] 0 ADC_RESOLUTION_SELECT 0: 14 bit 1: 12 bit 4[3] 0x4[3] 0 ADC_OUTPUT_FORMAT 0: 2's complement 1: Offset binary Note: When the demodulation feature is enabled, only 2's complement format can be selected. 4[4] 0x4[4] 0 LSB_MSB_FIRST 0: LSB first 1: MSB first 5[13:0] 0x5[13:0] 0 CUSTOM_PATTERN Custom pattern data for LVDS output (2[15:13] = 011) 10[8] 0xA[8] 0 SYNC_PATTERN 0: Test pattern outputs of 8 channels are not synchronized. 1: Test pattern outputs of 8 channels are synchronized. 13[9:0] 0xD[9:0] 0 OFFSET_CH1 Value to be subtracted from channel 1 code 13[15:11] 0xD[15:11] 0 DIGITAL_GAIN_CH1 0 to 6 dB in 0.2-dB steps 15[9:0] 0xF[9:0] 0 OFFSET_CH2 Value to be subtracted from channel 2 code 15[15:11] 0xF[15:11] 0 DIGITAL_GAIN_CH2 0 to 6 dB in 0.2-dB steps 17[9:0] 0x11[9:0] 0 OFFSET_CH3 Value to be subtracted from channel 3 code 17[15:11] 0x11[15:11] 0 DIGITAL_GAIN_CH3 0 to 6 dB in 0.2-dB steps 19[9:0] 0x13[9:0] 0 OFFSET_CH4 Value to be subtracted from channel 4 code 19[15:11] 0x13[15:11] 0 DIGITAL_GAIN_CH4 0 to 6 dB in 0.2-dB steps 21[0] 0x15[0] 0 DIGITAL_HPF_FILTER_ENABLE _ CH1-4 0: Disable the digital HPF filter; 1: Enable for 1 to 4 channels Note: This HPF feature is only available when the demodulation block is disabled. 21[4:1] 0x15[4:1] 0 DIGITAL_HPF_FILTER_K_CH1-4 Set K for the HPF (k from 2 to 10, that is 0010B to 1010B). This group of four registers controls the characteristics of a digital high-pass transfer function applied to the output data, following the formula: y(n) = 2k/(2k + 1) [x(n) – x(n – 1) + y(n – 1)] (see Table 3) Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 53 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Register Maps (continued) Address (DEC) Address (HEX) Default Value Function Description 22[0] 0x16[0] 0 EN_DEMOD 0: Digital demodulator is enabled 1: Digital demodulator is disabled Note: The demodulator registers can be reset when 0x16[0] is set as 0. Thus, it is required to reconfigure the demodulator registers after toggling the 0x16[0]. 25[9:0] 0x19[9:0] 0 OFFSET_CH8 Value to be subtracted from channel 8 code 25[15:11] 0x19[15:11] 0 DIGITAL_GAIN_CH8 0 to 6-dB in 0.2-dB steps 27[9:0] 0x1B[9:0] 0 OFFSET_CH7 Value to be subtracted from channel 7 code 27[15:11] 0x1B[15:11] 0 DIGITAL_GAIN_CH7 0 to 6-dB in 0.2-dB steps 29[9:0] 0x1D[9:0] 0 OFFSET_CH6 Value to be subtracted from channel 6 code 29[15:11] 0x1D[15:11] 0 DIGITAL_GAIN_CH6 0 to 6-dB in 0.2-dB steps 31[9:0] 0x1F[9:0] 0 OFFSET_CH5 Value to be subtracted from channel 5 code 31[15:11] 0x1F[15:11] 0 DIGITAL_GAIN_CH5 0 to 6-dB in 0.2-dB steps 33[0] 0x21[0] 0 DIGITAL_HPF_FILTER_ENABLE _ CH5-8 0: Disable the digital HPF filter 1: Enable for 5 to 8 channels Note: This HPF feature is only available when the demodulation block is disabled. DIGITAL_HPF_FILTER_K_CH5-8 Set K for the HPF (k from 2 to 10, 0010B to 1010B) This group of four registers controls the characteristics of a digital high-pass transfer function applied to the output data, following the formula: y(n) = 2k / (2k + 1) [x(n) – x(n – 1) + y(n – 1)] (see Table 3) 33[4:1] 0x21[4:1] 0 8.6.1.2 AFE5809 ADC Register/Digital Processing Description The ADC in the AFE5809 device has extensive digital processing functionality, which can be used to enhance ultrasound system performance. The digital processing blocks are arranged as in Figure 86. ADC Output 12/14b Channel Average Default=No Digital Gain Default=0 Digital HPF Default = No 12/14b Final Digital Output Digital Offset Default=No Figure 86. ADC Digital Block Diagram NOTE These digital processing features are only available when the demodulation block is disabled. ADC output data directly enter the digital demodulator when the demod is enabled. 8.6.1.2.1 AVERAGING_ENABLE: Address: 2[11] When set to 1, two samples, corresponding to two consecutive channels, are averaged (channel 1 with 2, 3 with 4, 5 with 6, and 7 with 8). If both channels receive the same input, the net effect is an improvement in SNR. The averaging is performed as: • Channel 1 + channel 2 comes out on channel 3 • Channel 3 + channel 4 comes out on channel 4 • Channel 5 + channel 6 comes out on channel 5 • Channel 7 + channel 8 comes out on channel 6 54 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 8.6.1.2.2 ADC_OUTPUT_FORMAT: Address: 4[3] The ADC output, by default, is in 2’s-complement mode. Programming the ADC_OUTPUT_FORMAT bit to 1 inverts the MSB, and the output becomes straight-offset binary mode. NOTE When the demodulation feature is enabled, only 2's complement format can be selected. 8.6.1.2.3 ADC Reference Mode: Address 1[13] and 3[15] The following shows the register settings for the ADC internal reference mode and external reference mode. • 0x1[13] 0x3[15] = 00: ADC internal reference mode, VREF_IN floating (pin M3) • 0x1[13] 0x3[15] = 01: N/A • 0x1[13] 0x3[15] = 10: N/A • 0x1[13] 0x3[15] = 11: ADC external reference mode, VREF_IN = 1.4 V (pin M3) 8.6.1.2.4 DIGITAL_GAIN_ENABLE: Address: 3[12] Setting this bit to 1 applies to each channel i the corresponding gain given by DIGTAL_GAIN_CHi . The gain is given as 0 dB + 0.2 dB × DIGTAL_GAIN_CHi. For instance, if DIGTAL_GAIN_CH5 = 3, channel 5 is increased by 0.6-dB gain. DIGTAL_GAIN_CHi = 31 produces the same effect as DIGTAL_GAIN_CHi = 30, setting the gain of channel i to 6 dB. 8.6.1.2.5 DIGITAL_HPF_ENABLE • • CH1 to CH4: Address 21[0] CH5 to CH8: Address 33[0] 8.6.1.2.6 DIGITAL_HPF_FILTER_K_CHX • • CH1 to CH4: Address 21[4:1] CH5 to CH8: Address 33[4:1] This group of registers controls the characteristics of a digital high-pass transfer function applied to the output data, following Equation 4. y (n ) = 2k 2k + 1 éë x (n ) - x (n - 1) + y (n - 1)ùû (4) These digital HPF registers (one for the first four channels and one for the second group of four channels) describe the setting of K. The digital HPF can be used to suppress low frequency noise, which commonly exists in ultrasound echo signals. The digital filter can significantly benefit near-field recovery time due to T/R switch low-frequency response. Table 3 shows the cut-off frequency versus K. Table 3. Digital HPF –1-dB Corner Frequency versus K and Fs k 40 MSPS 50 MSPS 65 MSPS 2 2780 kHz 3480 kHz 4520 kHz 3 1490 kHz 1860 kHz 2420 kHz 4 770 kHz 960 kHz 1250 kHz 8.6.1.2.7 LOW_FREQUENCY_NOISE_SUPPRESSION: Address: 1[11] The low-frequency noise suppression mode is especially useful in applications where good noise performance is desired in the frequency band of 0 to 1 MHz (around DC). Setting this mode shifts the low-frequency noise of the AFE5809 device to approximately Fs / 2, thereby moving the noise floor around DC to a much lower value. Register bit 1[11] is used for enabling or disabling this feature. When this feature is enabled, power consumption of the device is increased slightly by approximately 1 mW/CH. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 55 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 8.6.1.2.8 LVDS_OUTPUT_RATE_2X: Address: 1[14] The output data always uses a DDR format, with valid/different bits on the positive as well as the negative edges of the LVDS bit clock, DCLK. The output rate is set by default to 1× (LVDS_OUTPUT_RATE_2X = 0), where each ADC has one LVDS stream associated with it. If the sampling rate is low enough, two ADCs can share one LVDS stream, in this way lowering the power consumption devoted to the interface. The unused outputs will output zero. To avoid consumption from those outputs, no termination should be connected to them. The distribution on the used output pairs is done in the following way: • Channel 1 and channel 2 come out on channel 3. Channel 1 comes out first. • Channel 3 and channel 4 come out on channel 4. Channel 3 comes out first. • Channel 5 and channel 6 come out on channel 5. Channel 5 comes out first. • Channel 7 and channel 8 come out on channel 6. Channel 7 comes out first. 8.6.1.2.9 CHANNEL_OFFSET_SUBSTRACTION_ENABLE: Address: 3[8] Setting this bit to 1 enables the subtraction of the value on the corresponding OFFSET_CHx (offset for channel i) from the ADC output. The number is specified in 2's complement format. For example, OFFSET_CHx = 11 1000 0000 means subtract –128. For OFFSET_CHx = 00 0111 1111 the effect is to subtract 127. In effect, both addition and subtraction can be performed. The offset is applied before the digital gain (see DIGITAL_GAIN_ENABLE). The whole data path is 2's complement throughout internally, with digital gain being the last step. Only when ADC_OUTPUT_FORMAT = 1 (straight binary output format) is the 2's complement word translated into offset binary at the end. 8.6.1.2.10 SERIALIZED_DATA_RATE: Address: 3[14:13] See Table 4 for detailed description. Table 4. Corresponding Register Settings LVDS Rate 12 bit (6× DCLK) 14 bit (7× DCLK) Register 3 [14:13] 11 00 16 bit (8× DCLK) 01 Register 4 [2:0] 010 000 000 Description 2 LSBs removed N/A 2 zeroes added at LSBs 8.6.1.2.11 TEST_PATTERN_MODES: Address: 2[15:13] The AFE5809 device can output a variety of test patterns on the LVDS outputs. These test patterns replace the normal ADC data output. The device may also be made to output 6 preset patterns: • Ramp: Setting Register 2[15:13] = 111 causes all the channels to output a repeating full-scale ramp pattern. The ramp increments from zero code to full-scale code in steps of 1 LSB every clock cycle. After hitting the full-scale code, it returns back to zero code and ramps again. • Zeros: The device can be programmed to output all 0 s by setting Register 2[15:13] = 110. • Ones: The device can be programmed to output all 1 s by setting Register 2[15:13] = 100. • Deskew Patten: When 2[15:13] = 010; this mode replaces the 14-bit ADC output with the 01010101010101 word. • Sync Pattern: When 2[15:13] = 001, the normal ADC output is replaced by a fixed 11111110000000 word. • Toggle: When 2[15:13] = 101, the normal ADC output is alternating from 1 s to 0 s. The start state of ADC word can be either 1 s or 0 s. • Custom Pattern: It can be enabled when 2[15:13] = 011. Users can write the required VALUE into register bits , which is Register 5[13:0]. Then, the device will output VALUE at its outputs, about 3 to 4 ADC clock cycles after the 24th rising edge of SCLK. So, the time taken to write one value is 24 SCLK clock cycles + 4 ADC clock cycles. To change the customer pattern value, users can repeat writing Register 5[13:0] with a new value. Due to the speed limit of SPI, the refresh rate of the custom pattern may not be high. For example, 128 points custom pattern takes approximately 128 × (24 SCLK clock cycles + 4 ADC clock cycles). 56 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 NOTE Only one of the above patterns can be active at any given instant. Test pattern from the ADC output stage can NOT be sent to the demodulator; it can only be sent to the LVDS serializer when the demodulator is off. 8.6.1.2.12 SYNC_PATTERN: Address: 10[8] By enabling this bit, all channels' test pattern outputs are synchronized. When 10[8] is set as 1, the ramp patterns of all 8 channels start simultaneously. 8.6.1.3 VCA Register Map Address (DEC) Address (HEX) Default Value Function Description 51[0] 0x33[0] 0 RESERVED 0 51[3:1] 0x33[3:1] 0 LPF_PROGRAMMABILITY 000: 15 MHz 010: 20 MHz 011: 30 MHz 100: 10 MHz Note: 0x3D[14], that is, 5 MHz LPF, should be set as 0. 51[4] 0x33[4] 0 PGA_INTEGRATOR_DISABLE (PGA_HPF_DISABLE) 0: Enable 1: Disable offset integrator for PGA. See the explanation for the PGA integrator function in the Application Information section 51[7:5] 0x33[7:5] 0 PGA_CLAMP_LEVEL Low-noise mode: 53[11:10] = 00 000: –2 dBFS 010: 0 dBFS 1XX: Clamp is disabled Low-power/medium-power mode; 53[11:10] = 01/10 100: –2 dBFS 110: 0 dBFS 0XX: clamp is disabled Note: The clamp circuit makes sure that PGA output is in linear range. For example, at 000 setting, PGA output HD3 will worsen by 3 dB at –2-dBFS ADC input. In normal operation, clamp function can be set as 000 in the low-noise mode. The maximum PGA output level can exceed 2Vpp with the clamp circuit enabled. Note: In the low-power and medium-power modes, PGA_CLAMP is disabled for saving power if 51[7] = 0. . Note: Register 61[15] should be set as 0; otherwise, PGA_CLAMP_LEVEL is affected by Register 61[15]. 51[13] 0x33[13] 0 PGA_GAIN_CONTROL 0:24 dB 1:30 dB 52[4:0] 0x34[4:0] 0 ACTIVE_TERMINATION_ INDIVIDUAL_RESISTOR_CNTL See Table 6. Register 52[5] should be set as 1 to access these bits 52[5] 0x34[5] 0 ACTIVE_TERMINATION_ INDIVIDUAL_RESISTOR_ENABLE 0: Disable 1: Enable internal active termination individual resistor control 52[7:6] 0x34[7:6] 0 PRESET_ACTIVE_ TERMINATIONS 00: 50 Ω 01: 100 Ω 10: 200 Ω 11: 400 Ω Note: The device adjusts resistor mapping (52[4:0]) automatically. 50-Ω active termination is not supported in 12-dB LNA setting. Instead, 00 represents high-impedance mode when LNA gain is 12 dB. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 57 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Address (DEC) Address (HEX) Default Value Function Description 52[8] 0x34[8] 0 ACTIVE TERMINATION ENABLE 0: Disable 1: Enable active termination 52[10:9] 0x34[10:9] 0 LNA_INPUT_CLAMP_SETTING 00: Auto setting 01: 1.5 Vpp 10: 1.15 Vpp 11: 0.6 Vpp 52[11] 0x34[11] 0 RESERVED Set to 0 52[12] 0x34[12] 0 LNA_INTEGRATOR_DISABLE (LNA_HPF_DISABLE) 0: Enable 1: Disable offset integrator for LNA. See the explanation for this function in the following section 52[14:13] 0x34[14:13] 0 LNA_GAIN 00: 18 dB 01: 24 dB 10: 12 dB 11: Reserved 52[15] 0x34[15] 0 LNA_INDIVIDUAL_CH_CNTL 0: Disable 1: Enable LNA individual channel control. See Register 57 for details 53[7:0] 0x35[7:0] 0 PDN_CH 0: Normal operation 1: Powers down corresponding channels. Bit7 → CH8, Bit6 → CH7…Bit0 → CH1. PDN_CH shuts down whichever blocks are active depending on TGC mode or CW mode. 53[8] 0x35[8] 0 RESERVED Set to 0 53[9] 0x35[9] 0 LOW_NF 0: Normal operation 1: Enable low-noise figure mode for highimpedance probes 53[11:10] 0x35[11:10] 0 POWER_MODES 00: Low noise mode 01: Set to low-power mode. At 30-dB PGA, total chain gain may slightly change. See Typical Characteristics. 10: Set to medium-power mode. At 30-dB PGA, total chain gain may slightly change. See Typical Characteristics. 11: Reserved 53[12] 0x35[12] 0 PDN_VCAT_PGA 0: Normal operation 1: Powers down VCAT and PGA 53[13] 0x35[13] 0 PDN_LNA 0: Normal operation 1: Powers down LNA only 53[14] 0x35[14] 0 VCA_PARTIAL_PDN 0: Normal operation 1: Powers down LNA, VCAT, and PGA partially (fast-wake response) 53[15] 0x35[15] 0 VCA_COMPLETE_PDN 0: Normal operation 1: Power down LNA, VCAT, and PGA completely (slow-wake response). This bit can overwrite 53[14]. 54[4:0] 0x36[4:0] 0 CW_SUM_AMP_GAIN_CNTL Select feedback resistor for the CW amplifier as per Table 6 54[5] 0x36[5] 0 CW_16X_CLK_SEL 0: Accept differential clock 1: Accept CMOS clock 54[6] 0x36[6] 0 CW_1X_CLK_SEL 0: Accept CMOS clock 1: Accept differential clock 54[7] 0x36[7] 0 RESERVED Set to 0 54[8] 0x36[8] 0 CW_TGC_SEL 0: TGC mode 1 : CW mode Note : VCAT and PGA are still working in CW mode. They should be powered down separately through 53[12]. 58 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Address (DEC) Address (HEX) Default Value Function Description 54[9] 0x36[9] 0 CW_SUM_AMP_ENABLE 0: Enable CW summing amplifier 1: Disable CW summing amplifier Note: 54[9] is only effective in CW mode. 54[11:10] 0x36[11:10] 0 CW_CLK_MODE_SEL 00: 16× mode 01: 8× mode 10: 4× mode 11: 1× mode 55[3:0] 0x37[3:0] 0 CH1_CW_MIXER_PHASE 55[7:4] 0x37[7:4] 0 CH2_CW_MIXER_PHASE 55[11:8] 0x37[11:8] 0 CH3_CW_MIXER_PHASE 55[15:12] 0x37[15:12] 0 CH4_CW_MIXER_PHASE 56[3:0] 0x38[3:0] 0 CH5_CW_MIXER_PHASE 56[7:4] 0x38[7:4] 0 CH6_CW_MIXER_PHASE 56[11:8] 0x38[11:8] 0 CH7_CW_MIXER_PHASE 56[15:12] 0x38[15:12] 0 CH8_CW_MIXER_PHASE 57[1:0] 0x39[1:0] 0 CH1_LNA_GAIN_CNTL 57[3:2] 0x39[3:2] 0 CH2_LNA_GAIN_CNTL 0000 → 1111, 16 different phase delays, see Table 10 00: 18 dB 01: 24 dB 10: 12 dB 11: Reserved REG52[15] should be set as 1. 57[5:4] 0x39[5:4] 0 CH3_LNA_GAIN_CNTL 57[7:6] 0x39[7:6] 0 CH4_LNA_GAIN_CNTL 00: 18 dB 01: 24 dB 10: 12 dB 11: Reserved REG52[15] should be set as 1. 57[9:8] 0x39[9:8] 0 CH5_LNA_GAIN_CNTL 57[11:10] 0x39[11:10] 0 CH6_LNA_GAIN_CNTL 57[13:12] 0x39[13:12] 0 CH7_LNA_GAIN_CNTL 57[15:14] 0x39[15:14] 0 CH8_LNA_GAIN_CNTL 59[3:2] 0x3B[3:2] 0 HPF_LNA 00: 100 kHz 01: 50 kHz 10: 200 kHz 11: 150 kHz with 0.015 µF on INMx 59[6:4] 0x3B[6:4] 0 DIG_TGC_ATT_GAIN 000: 0-dB attenuation 001: 6-dB attenuation N: About N × 6 dB attenuation when 59[7] = 1 59[7] 0x3B[7] 0 DIG_TGC_ATT 0: Disable digital TGC attenuator 1: Enable digital TGC attenuator 59[8] 0x3B[8] 0 CW_SUM_AMP_PDN 0: Power down 1: Normal operation Note: 59[8] is only effective in TGC test mode. 59[9] 0x3B[9] 0 PGA_TEST_MODE 0: Normal CW operation 1: PGA outputs appear at CW outputs. 61[13] 0x3D[13] 0 V2I_CLAMP 0: Clamp disabled 1: Clamp enabled at the V2I input. An additional voltage clamp at the V2I input. This limits the amount of overload signal the PGA sees. Note: This bit is supported by AFE5809 with date code later than 2014, that is, date code >41XXXX. 61[14] 0x3D[14] 0 5MHz_LPF 0: 5-MHz LPF disabled 1: 5-MHz LPF enabled. Suppress signals >5 MHz or high-order harmonics. The LPF Register 51[3:1] needs to be set as 100, that is, 10 MHz. Note: This bit is supported by AFE5809 with date code later than 2014, that is date code >41XXXX. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 59 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Address (DEC) Address (HEX) Default Value Function Description 61[15] 0x3D[15] 0 PGA_CLAMP_-6dBFS 0: Disable the –6-dBFS clamp. PGA_CLAMP is set by Reg51[7:5]. 1: Enable the –6-dBFS clamp. PGA_CLAMP Reg51[7:5] should be set as 000 in the lownoise mode or 100 in the low-power/mediumpower mode. In this setting, PGA output HD3 will be worsen by 3 dB at –6-dBFS ADC input. The actual PGA output is reduced to approximately 1.5 Vpp, about 2.5 dB below the ADC full-scale input 2 Vpp . As a result, AFE5809’s LPF is not saturated, and it can suppress harmonic signals better at PGA output. Due to PGA output reduction, the ADC output dynamic range is impacted. Note: This bit is supported by AFE5809 with date code later than 2014, that is date code >41XXXX. Note: This bit is ONLY valid when PGA=24dB. 8.6.1.4 VCA Register Description 8.6.1.4.1 LNA Input Impedances Configuration (Active Termination Programmability) Different LNA input impedances can be configured through the register 52[4:0]. By enabling and disabling the feedback resistors between LNA outputs and ACTx pins, LNA input impedance is adjustable accordingly. Table 5 describes the relationship between LNA gain and 52[4:0] settings. The input impedance settings are the same for both TGC and CW paths. The AFE5809 device also has four preset active termination impedances as described in 52[7:6]. An internal decoder is used to select appropriate resistors corresponding to different LNA gain. Table 5. Register 52[4:0] Description 52[4:0]/0x34[4:0] FUNCTION 00000 No feedback resistor enabled 00001 Enables 450-Ω feedback resistor 00010 Enables 900-Ω feedback resistor 00100 Enables 1800-Ω feedback resistor 01000 Enables 3600-Ω feedback resistor 10000 Enables 4500-Ω feedback resistor The input impedance of AFE can be programmed through Register 52[8:0]. Each bit of Register 52[4:0] controls one active termination resistor. The following tables indicate the nominal impedance values when individual active termination resistors are selected. See Active Termination for more details. Table 6 shows the corresponding impedances under different Register 52[4:0] values, while Table 7 shows the Register 52[4:0] settings under different impedances. NOTE Table 6 and Table 7 show nominal input impedance values. Due to silicon process variation, the actual values can vary. Table 6. Register 52[4:0] versus LNA Input Impedances 52[4:0]/0x34[4:0] 00000 00001 00010 00011 00100 00101 00110 00111 LNA:12dB High Z 150 Ω 300 Ω 100 Ω 600 Ω 120 Ω 200 Ω 86 Ω LNA:18dB High Z 90 Ω 180 Ω 60 Ω 360 Ω 72 Ω 120 Ω 51 Ω LNA:24dB High Z 50 Ω 100 Ω 33 Ω 200 Ω 40 Ω 66.67 Ω 29 Ω 52[4:0]/0x34[4:0] 01000 01001 01010 01011 01100 01101 01110 01111 LNA:12dB 1200 Ω 133 Ω 240 Ω 92 Ω 400 Ω 109 Ω 171 Ω 80 Ω 60 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Table 6. Register 52[4:0] versus LNA Input Impedances (continued) 52[4:0]/0x34[4:0] 00000 00001 00010 00011 00100 00101 00110 00111 LNA:18dB 720 Ω 80 Ω 144 Ω 55 Ω 240 Ω 65 Ω 103 Ω 48 Ω LNA:24dB 400 Ω 44 Ω 80 Ω 31 Ω 133 Ω 36 Ω 57 Ω 27 Ω 52[4:0]/0x34[4:0] 10000 10001 10010 10011 10100 10101 10110 10111 LNA:12dB 1500 Ω 136 Ω 250 Ω 94 Ω 429 Ω 111 Ω 176 Ω 81 Ω LNA:18dB 900 Ω 82 Ω 150 Ω 56 Ω 257 Ω 67 Ω 106 Ω 49 Ω LNA:24dB 500 Ω 45 Ω 83 Ω 31 Ω 143 Ω 37 Ω 59 Ω 27 Ω 52[4:0]/0x34[4:0] 11000 11001 11010 11011 11100 11101 11110 11111 LNA:12dB 667 Ω 122 Ω 207 Ω 87 Ω 316 Ω 102 Ω 154 Ω 76 Ω LNA:18dB 400 Ω 73 Ω 124 Ω 52 Ω 189 Ω 61 Ω 92 Ω 46 Ω LNA:24dB 222 Ω 41 Ω 69 Ω 29 Ω 105 Ω 34 Ω 51 Ω 25 Ω Table 7. LNA Input Impedances versus Register 52[4:0] Z (Ω) LNA:12dB LNA:18dB LNA:24dB Z (Ω) LNA:12dB LNA:18dB LNA:24dB 10101 Z (Ω) LNA:12dB 25 11111 67 27 10111/011 11 69 29 00111/110 11 72 00101 150 00001 31 01011/100 11 73 11001 154 11110 33 00011 76 11111 171 01110 34 11101 80 01111 176 10110 36 01101 81 10111 37 10101 82 40 00101 83 41 11001 86 00111 44 01001 87 11011 45 10001 90 11010 11111 92 01011 01111 94 10011 49 10111 100 00011 50 00001 102 11101 51 00111/111 10 103 11011 105 01011 106 56 10011 57 59 01010 11100 200 00110 207 11010 11000 240 01010 11110 250 10010 257 300 00010 316 11100 00100 400 01100 429 10100 109 01101 500 01110 111 10101 600 00100 10110 667 11000 00101 122 11001 61 11101 124 65 01101 133 01001 136 10001 00110 00110 11010 01100 01100 10100 360 11100 120 00100 222 10110 00011 10010 00010 00001 01110 60 66.7 144 189 00010 LNA:24dB 10100 180 10010 48 55 01010 10001 46 52 01001 LNA:18dB 143 11000 01000 10000 720 01000 900 10000 1200 01000 1500 10000 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 61 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 8.6.1.4.2 Programmable Gain for CW Summing Amplifier Different gain can be configured for the CW summing amplifier through the register 54[4:0]. By enabling and disabling the feedback resistors between the summing amplifier inputs and outputs, the gain is adjustable accordingly to maximize the dynamic range of CW path. Table 8 describes the relationship between the summing amplifier gain and 54[4:0] settings. Table 8. Register 54[4:0] Description 54[4:0]/0x36[4:0] FUNCTION 00000 No feedback resistor 00001 Enables 250-Ω feedback resistor 00010 Enables 250-Ω feedback resistor 00100 Enables 500-Ω feedback resistor 01000 Enables 1000-Ω feedback resistor 10000 Enables 2000-Ω feedback resistor Table 9. Register 54[4:0] vs Summing Amplifier Gain 54[4:0]/0x36[4:0] CW I/V Gain 54[4:0]/0x36[4:0] CW I/V Gain 54[4:0]/0x36[4:0] CW I/V Gain 54[4:0]/0x36[4:0] CW I/V Gain 00000 00001 00010 00011 00100 00101 00110 N/A 0.5 0.5 0.25 1 0.33 0.33 00111 0.20 01000 01001 01010 01011 01100 01101 01110 01111 2 0.4 0.4 0.22 0.67 0.29 0.29 0.18 10000 10001 10010 10011 10100 10101 10110 10111 4 0.44 0.44 0.24 0.80 0.31 0.31 0.19 11000 11001 11010 11011 11100 11101 11110 11111 1.33 0.36 0.36 0.21 0.57 0.27 0.27 0.17 8.6.1.4.3 Programmable Phase Delay for CW Mixer Accurate CW beamforming is achieved through adjusting the phase delay of each channel. In the AFE5809 device, 16 different phase delays can be applied to each LNA output. It meets the standard requirement of 1 λ typical ultrasound beamformer, that is, 16 beamformer resolution. Table 8 describes the relationship between the phase delays and the register 55 and 56 settings. Table 10. CW Mixer Phase Delay vs Register Settings CH1: 55[3:0], CH2: 55[7:4], CH3: 55[11:8], CH4: 55[15:12], CH5: 56[3:0], CH6: 56[7:4], CH7: 56[11:8], CH8: 56[15:12] Phase Delay CHX_CW_MIXER_PHASE PHASE SHIFT Register Settings 0000 0001 0010 0011 0100 0101 0110 0111 0 22.5° 45° 67.5° 90° 112.5° 135° 157.5° CHX_CW_MIXER_PHASE 1000 1001 1010 1011 1100 1101 1110 1111 PHASE SHIFT 180° 202.5° 225° 247.5° 270° 292.5° 315° 337.5° 62 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 8.6.2 Digital Demodulator Register Description Table 11. Digital Demodulator Register Map (1) (2) (3) Address (HEX) BIT [5:0] Address (DEC) BIT [5:0] 00[2] 00[2] 0 1: Generate internal TX_TRIG (self clear, write only). This is an alternative for TX_SYNC hardware pulse. REGISTER_READOUT_EN 00[1] ABLE 00[1] 0 1: Enables readout of register at SDOUT pin (write only) CHIP_ID 01[4:0] 0 Unique chip ID 0 000 = Normal operation 011 = Custom pattern (set by register 05) Note: LSB always comes out first regardless of whether 0x04[4] = 0 or 1. 111 = chipID + ramp test pattern. ChipID (5 bit) and subchip information (3 bit) are the 8 LSBs and the ramp pattern is in the rest MSBs. (0x0A[9] = 1) 11 Serialization factor (output rate) 00 = 10x 01 = 12x 10 = 14x 11 = 16x Note: This register is different from the ADC SERIALIZED_DATA_RATE. The demod and ADC serialization factors must be matched. See . 0 Output resolution of the demodulator. It refers to the ADC resolution when the demodulator is bypassed. 100 = 16 bit (demod only) 000 = 14 bit 001 = 13 bit 010 = 12 bit 0 0 = LSB first 1 = MSB first This bit does not affect the test mode: customer pattern, that is, 02[15:13] = 011B. Note: in the CUSTOM_PATTERN mode, the output is always set as LSB first regardless of this bit setting. Register Name MANUAL_TX_TRIG OUTPUT_MODE SERZ_FACTOR OUTPUT_RESOLUTION 01[4:0] 02[15:13] 03[14:13] 03[11:9] 02[15:13] 03[14:13] 03[11:9] Default Description MSB_FIRST 04[4] 04[4] CUSTOM_PATTERN 05[15:0] 05[15:0] 0000 COEFF_MEM_ADDR_WR 06[7:0] 06[7:0] 0 Write address offset to coefficient memory (auto increment) COEFF_BANK 07[111:0] 07[111:0] — Writes chunks of 112 bits to the coefficient memory. This RAM does not have default values, so it is necessary to write required values to the RAM. TI recommends to configure the RAM before other registers. PROFILE_MEM_ADDR_W R 08[4:0] 08[4:0] 0 Write address offset to profile memory (auto increment) Custom data pattern for LVDS (0x02[15:13] = 011) PROFILE_BANK 09 [63:0] 09 [63:0] — Writes chunks of 64 bits to the profile memory (effective 62 bits because two LSBs are ignored). This RAM does not have default values, so it is necessary to write required values to the RAM. TI recommends to configure the RAM before other registers. RESERVED 0A[15] 10[15] 0 Must set to 0 MODULATE_BYPASS 0A[14] 10[14] 0 Arrange the demodulator output format for I/Q data. See Table 10. DEC_SHIFT_SCALE 0A[13] 10[13] 0 0 = No additional shift applied to the decimation filter output. 1 = Shift the decimation filter output by 2 bits additionally, that is apply 12-dB additional digital gain. DHPF 0A[12] 10[12] 1 0 = Enable first-order digital HPF. –3 dB cut off frequency is at 0.0225 × Fs / 2. Its transfer function equation is h(n) = a / b, where a = [1 – 7569 / 213] and b = [1 –1]; 1 = Disable first-order digital HPF. (1) (2) (3) When programming the SPI, 8-bit address is required. This table and the following sections only list the Add_Bit5 to Add_Bit0. The Add_Bit7 = SCID1_SEL and Add_Bit6 = SCID0_SEL must be appended as 11, 10, or 01, which determines if SubChip1 or SubChip0 is being programmed. If SCID1_SEL,SCID0_SEL = 11, then both subchips get written with the same register value. See Table 2. Reserved register bits must be programmed based on their descriptions. Unlisted register bits must be programmed as zeros. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 63 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Table 11. Digital Demodulator Register Map(1)(2)(3) (continued) Address (HEX) BIT [5:0] Address (DEC) BIT [5:0] OUTPUT_CHANNEL_SEL 0A[11] 10[11] 0 Swap channel pairs. It is used in 4 LVDS bypass configuration to select which of the two possible data streams to pass on. See Table 10. SIN_COS_RESET_ON_TX _TRIG 0A[10] 10[10] 1 0 = Continuous phase 1 = Reset down conversion phase on TX_TRIG Register Name Default Description FULL_LVDS_MODE 0A[9] 10[9] 0 0 = Use 4 LVDS lines (1, 3, 5, 7) 1 = Use 8 LVDS lines (1 through 8) Note: 4 LVDS mode valid only for decimation factors ≥4. See Table 13. RESERVED 0A[8:5] 10[8:5] 0 Must set to 0 RESERVED 0A[4] 10[4] 0 Must set to 1 DEC_BYPASS 0A[3] 10[3] 0 0 = Enable decimation filter 1 = Bypass decimation filter DWN_CNV_BYPASS 0A[2] 10[2] 0 0 = Enable down conversion block 1 = Bypass down conversion block. Note: the decimation filter can still be used when the down conversion block is bypassed. RESERVED 0A[1] 10[1] 1 Must be set as 1 DC_REMOVAL_BYPASS 0A[0] 10[0] 0 0 = Enable DC removal block 1 = Bypass DC removal block SYNC_WORD 0B[15:0] 11[15:0] 0x2772 PROFILE_INDX 0E[15:11] 14[15:11] 0 Profile word selector. The Profile Index register is a special 5-bit data register. Read value still uses 16-bit convention, which means data will be available on LSB 0e[4:0]) 0 54[13:0] → DC offset for channel 1, SCID1_SEL,SCID0_SEL = 01 94[13:0] → DC offset for channel 5, SCID1_SEL,SCID0_SEL = 10 Note: Considering the CH-to-CH DC offset variation, the offset value must be set individually. Therefore, SCID1_SEL,SCID0_SEL should not be set as 11. Note: DC_REMOVAL_X_X registers are write-only. 0 55[13:0] → DC offset for channel 2, SCID1_SEL,SCID0_SEL = 01 95[13:0] → DC offset for channel 6, SCID1_SEL,SCID0_SEL = 10 Note: Considering the CH-to-CH DC offset variation, the offset value must be set individually. Therefore, SCID1_SEL,SCID0_SEL should not be set as 11. Note: DC_REMOVAL_X_X registers are write-only. 0 56[13:0] → DC offset for channel 3, SCID1_SEL,SCID0_SEL=01 96[13:0] → DC offset for channel 7, SCID1_SEL,SCID0_SEL=10 Note: Considering the CH-to-CH DC offset variation, the offset value must be set individually. Therefore, SCID1_SEL,SCID0_SEL should not be set as 11. Note: DC_REMOVAL_X_X registers are write-only. DC_REMOVAL_1_5 DC_REMOVAL_2_6 DC_REMOVAL_3_7 14[13:0] 15[13:0] 16[13:0] 20[13:0] 21[13:0] 22[13:0] LVDS sync word. When MODULATE_BYPASS = 1, there is no sync word output. DC_REMOVAL_4_8 17[13:0] 23[13:0] 0 57[13:0] → DC offset for channel 4, SCID1_SEL,SCID0_SEL = 01 97[13:0] → DC offset for channel 8, SCID1_SEL,SCID0_SEL = 10 Note: Considering the CH-to-CH DC offset variation, the offset value must be set individually. Therefore, SCID1_SEL,SCID0_SEL should not be set as 11. Note: DC_REMOVAL_X_X registers are write-only. DEC_SHIFT_FORCE_EN 1D[7] 29[7] 0 0 = Profile vector specifies the number of bit to shift for the decimation filter output. 1 = Register 1D[6:4] specifies the number of bit to shift for the decimation filter output. DEC_SHIFT_FORCE 1D[6:4] 29[6:4] 0 Specify that the decimation filter output is right-shifted by (20 – N) bit, N = 0x1D[6:4]. N = 0, minimal digital gain; N = 7 maximal digital gain; additional 12-dB digital gain can be applied by setting DEC_SHIFT_SCALE = 1, that is, 0x0A[13] = 1 TM_COEFF_EN 1D[3] 29[3] 0 1 = Set coefficient output test mode 64 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Table 11. Digital Demodulator Register Map(1)(2)(3) (continued) Address (HEX) BIT [5:0] Address (DEC) BIT [5:0] TM_SINE_EN 1D[2] 29[2] 0 1 = Set sine output mode; the sine waveform specifications can be configured through register 0x1E. RESERVED 1D[1] 29[1] 0 Must set to 0 RESERVED 1D[0] 29[0] 0 Must set to 0 TM_SINE_DC 1E[15:9] 30[15:9] 0 7-bit signed value for sine wave DC offset control. TM_SINE_AMP 1E[8:5] 30[8:5] 0 4-bit unsigned value, controlling the sine wave amplitude (powers of two), from unity to the full scale of 14 bit, including saturation. 0 = No sine (only DC) TM_SINE_STEP 1E[4:0] 30[4:0] 0 5-bit unsigned value, controlling the sine wave frequency with resolution of Fs / 26, which is 0.625 MHz for 40-MHz ADC clock. MANUAL_COEFF_START_ 1F[15] EN 31[15] 0 0 = The starting address of the coefficient RAM is set by the profile vector, that is, the starting address is set manually. 1 = The starting address of the coefficient RAM is set by the register 0x1F[14:7]. MANUAL_COEFF_START_ 1F[14:7] ADDR 31[14:7] 0 When 0x1F[15] is set, the starting address of coefficient RAM is set by these 8 bits. MANUAL_DEC_FACTOR_ EN 1F[6] 31[6] 0 0 = The decimation factor is set by profile vector. 1 = The decimation factor is set by the register 0x1F[5:0]. MANUAL_DEC_FACTOR 1F[5:0] 31[5:0] 0 When 0x1F[6] is set, the decimation factor is set by these 6 bits. Note: It is from 1 to 32. MANUAL_FREQ_EN 20[0] 32[0] 0 0 = The down convert frequency is set by profile vector. 1 = The down convert frequency is set by the register 0x21[15:0]. MANUAL_FREQ 21[15:0] 33[15:0] 0 When 0x20[0] is set, the value of manual down convert frequency is calculated as N × Fs / 216 Register Name Default Description NOTE RF mode allows for the streaming of ADC data through the demodulator to the LVDS serializer. RF mode without sync word can be set by the following: 1. Write 0x0041 to register 0xDF; that is MANUAL_DEC_FACTOR_EN = 1 and MANUAL_DEC_FACTOR = 1. 2. Write 0x121F to register 0xCA, that is, MODULATE_BYPASS = 0, FULL_LVDS_MODE = 1, DC_REMOVAL_BYPASS = 1, DWN_CNV_BYPASS = 1. DEC_BYPASS = 1, SYN_COS_RESET_ON_TX_TRIG = 0. 3. Write 0x6800 to register 0xC3, that is, SERZ_FACTOR = 16x, OUTPUT_RESOLUTION = 16x, 4. Write 0x0010 to register 0xC4, that is, MSB_FIRST = 1 5. Provide TX_TRIG pulse or set Register 0xC0[2] MANUAL_TX_TRIG Table 12. Configuring Data Output Register Name SPI Address SERZ_FACTOR 0x03[14:13] OUTPUT_RESOLUTION 0x03[11:9] MSB_FIRST 0x04[4] OUT_MODE 0x02[15:13] CUSTOM_PATTERN 0x05[15:0] OUTPUT_CHANNEL_SEL 0x0A[11] MODULATE_BYPASS 0x0A[14] FULL_LVDS_MODE 0x0A[9] Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 65 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com spacer 1. LVDS Serializer configuration: – Serialization Factor 0x03[14:13]: It can be set using demodulator register SERZ_FACTOR. Default serialization factor for the demodulator is 16×. However, the actual LVDS clock speed can be set by the serialization factor in the ADC SPI interface as well; the ADC serialization factor is adjusted to 14× by default. Therefore, it is necessary to sync these two settings when the demodulator is enabled, that is, set the ADC register 0x03[14:13] = 01. For RF mode (passing 14 bits only), demodulator serialization factor can be changed to 14× by setting demodulator register 0xC3[14:13] to 10. – Output Resolution 0x03[11:9]: In the default setting, it is 14 bits. The demodulator output resolution depends on the decimation factor. 16-bit resolution can be used when higher decimation factor is selected. 2. Channel selection: – Using register MODULATE_BYPASS 0x0A[14], channel output mode can be selected as IQ modulated or single-channel I or Q output. – Channel output is also selected using registers OUTPUT_CHANNEL_SEL 0x0A[11] and FULL_LVDS_MODE 0x0A[9] and decimation factor. – Each of the two demodulator subchips in a device has four channels named A, B, C, and D. NOTE After decimation, the LVDS FCLK rate keeps the same as the ADC sampling rate. Considering the reduced data amount, zeros are appended after I and Q data and ensure the LVDS data rate matches the LVDS clock rate. For detailed information about channel multiplexing, see Table 13. In the table, A.I refers to CHA in-phase output, and A.Q refers to CHA quadrature output. For example, M = 3, the valid data output rate is Fs / 3 for both I and Q channels, that is 2 × Fs / 3 bandwidth is occupied. The left Fs / 3 bandwidth is then filled by M-2 zeros. As a result, the demod LVDS output data are A.I, A.Q, 0, A.I A.Q 0 after SYNC_WORD, FCLK = Fs and DCLK = Fs × 8. When two ADC CHs' data are transferred by one LVDS lane, M-4 zeros are filled after A.I, A.Q, B.I, and B.Q. See more details in Table 13 and Figure 87. 66 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Table 13. Channel Selection (1) Decimation Factor (M) Modulate Bypass Output Full LVDS Decimation Channel Select Mode Factor M LVDS Output Description LVDS1: A.I, A.Q, (zeros) M1μF RVCNTL 200Ω 10μF 3.3VA AVDD_ADC 0.1μF AVSS AVDD_5V 10μF 5VA AFE5809 CLOCK INPUTS SOUT SDATA SCLK D7P SEN AFE5809 D7M AFE5809 RESET D8P PDN_VCA D8M ANALOG INPUTS ANALOG OUTPUTS REF/BIAS DECOUPLING LVDS OUTPUTS PDN_ADC DCLKP PDN_GLOBAL DCLKM FCLKP OTHER AFE5809 OUTPUT FCLKM OTHER AFE5809 OUTPUT CVCNTL 470pF VCNTLP VCNTLM CVCNTL 470pF VREF_IN DIGITAL INPUTS OTHER AFE5809 OUTPUT CW_QP_AMPINP CW_QP_OUTM CCW CW_QP_AMPINM REXT (optional) CW_QP_OUTP CCW REFM CAC R SUM CAC RSUM CAC R SUM TO SUMMING AMP CAC RSUM CAC R SUM CAC RSUM CAC R SUM REXT (optional) TO SUMMING AMP DNCs REFP AVSS DVSS OTHER AFE5809 OUTPUT CAC RSUM Figure 98. Application Circuit With Digital Demodulator 82 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Typical Application (continued) 9.2.1 Design Requirements The AFE5809 device is a highly integrated analog front-end solution. To maximize its performance, users must carefully optimize its surrounding circuits, such as T/R switch, Vcntl circuits, audio ADCs for CW path, clock distribution network, synchronized power supplies and digital processors. Typical requirements for a traditional medical ultrasound imaging system are shown in Table 26. Table 26. Design Parameters PARAMETER EXAMPLE VALUES Signal center frequency (f0) 1~20 MHz Signal Bandwidth (BW) 10~100% of f0 Overloaded signals due to T/R switch leakage ~2 Vpp Maximum input signal amplitude 100 mVpp to 1 Vpp Transducer noise level 1 nV/rtHz Dynamic range 151 dBc/Hz Time gain compensation range 40 dB Total harmonic distortion 40 dBc at 5MHz 9.2.2 Detailed Design Procedure Medical ultrasound imaging is a widely-used diagnostic technique that enables visualization of internal organs, their size, structure, and blood flow estimation. An ultrasound system uses a focal imaging technique that involves time shifting, scaling, and intelligently summing the echo energy using an array of transducers to achieve high imaging performance. The concept of focal imaging provides the ability to focus on a single point in the scan region. By subsequently focusing at different points, an image is assembled. When initiating an imaging, a pulse is generated and transmitted from each of the 64 transducer elements. The pulse, now in the form of mechanical energy, propagates through the body as sound waves, typically in the frequency range of 1MHz to 15 MHz. The sound waves are attenuated as they travel through the objects being imaged, and the attenuation coefficients ɑ are about 0.54 dB/(MHz×cm) in soft tissue and 6~10 dB/(MHz×cm) in bone as shown in many published papers. Most medical ultrasound systems use the reflection imaging mode and the total signal attenuation is calculated by 2×depth×ɑ×f0. As the signal travels, portions of the wave front energy are reflected. Signals that are reflected immediately after transmission are very strong because they are from reflections close to the surface; reflections that occur long after the transmit pulse are very weak because they are reflecting from deep in the body. As a result of the limitations on the amount of energy that can be put into the imaging object, the industry developed extremely sensitive receive electronics with wide dynamic range. Receive echoes from focal points close to the surface require little, if any, amplification. This region is referred to as the near field. However, receive echoes from focal points deep in the body are extremely weak and must be amplified by a factor of 100 or more. This region is referred to as the far field. In the high-gain (far field) mode, the limit of performance is the sum of all noise sources in the receive chain. In high-gain (far field) mode, system performance is defined by its overall noise level, which is limited by the noise level of the transducer assembly and the receive low-noise amplifier (LNA). However in the low-gain (near field) mode, system performance is defined by the maximum amplitude of the input signal that the system can handle. The ratio between noise levels in high-gain mode and the signal amplitude level in low-gain mode is defined as the dynamic range of the system. The high integration and high dynamic range of the device make it ideally suited for ultrasound imaging applications. The device includes an integrated LNA and VCAT (which use the gain that can be changed with enough time to handle both near- and far-field systems), a low-pass anti-aliasing filter to limit the noise bandwidth, an ADC with high SNR performance, and a CW mixer. Use the following steps to design medical ultrasound imaging systems: 1. Use the signal center frequency and signal bandwidth to select an appropriate ADC sampling frequency. 2. Use the time gain compensation range to select the range of the VCNTL signal. 3. Use the transducer noise level and maximum input signal amplitude to select the appropriate LNA gain. The device input-referred noise level reduces with higher LNA gain. However, higher LNA gain leads to lower Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 83 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com input signal swing support. 4. Select different passive components for different device pins. 5. Select the appropriate input termination configuration. 6. Select the clock configuration for the ADC and CW clocks 9.2.2.1 LNA Configuration 9.2.2.1.1 LNA Input Coupling and Decoupling The LNA closed-loop architecture is internally compensated for maximum stability without the need of external compensation components. The LNA inputs are biased at 2.4 V and AC coupling is required. Figure 99 shows a typical input configuration. CIN is the input AC coupling capacitor. CACT is a part of the active termination feedback path. Even if the active termination is not used, the CACT is required for the clamp functionality. The recommended values for CACT is ≥1 µF and CIN is ≥0.1 µF. A pair of clamping diodes is commonly placed between the T/R switch and the LNA input. Schottky diodes with suitable forward drop voltage (for example: the BAT754/54 series, the BAS40 series, the MMBD7000 series, or similar) can be considered depending on the transducer echo amplitude. AFE CLAMP CACT ACTx CIN INPx CBYPASS INMx Input LNAx Optional Diodes DC Offset Correction S0498-01 Figure 99. LNA Input Configurations This architecture minimizes any loading of the signal source that may lead to a frequency-dependent voltage divider. The closed-loop design yields low offsets and offset drift. CBYPASS (≥0.015 µF) is used to set the HPF cutoff frequency and decouple the complementary input. Its cut-off frequency is inversely proportional to the CBYPASS value. The HPF cut-off frequency can be adjusted through the register 59[3:2] Table 27 lists. Low-frequency signals at T/R switch output, such as signals with slow ringing, can be filtered out. In addition, the HPF can minimize system noise from DC-DC converters, pulse repetition frequency (PRF) trigger, and frame clock. Most ultrasound systems’ signal-processing unit includes digital HPFs or band-pass filters (BPFs) in FPGAs or ASICs. Further noise suppression can be achieved in these blocks. In addition, a digital HPF is available in the AFE5809 ADC. If low-frequency signal detection is desired in some applications, the LNA HPF can be disabled. Table 27. LNA HPF Settings (CBYPASS = 15 nF) 84 Reg59[3:2] (0x3B[3:2]) FREQUENCY (kHz) 00 100 01 50 10 200 11 150 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 CM_BYP and VHIGH pins, which generate internal reference voltages, must be decoupled with ≥1-µF capacitors. Bigger bypassing capacitors (>2.2 µF) may be beneficial if low-frequency noise exists in the system. 9.2.2.1.2 LNA Noise Contribution The noise specification is critical for LNA and it determines the dynamic range of the entire system. The LNA of the AFE5809 device achieves low power and an exceptionally low-noise voltage of 0.63 nV/√Hz, and a low current noise of 2.7 pA/√Hz. Typical ultrasonic transducer’s impedance, RS, varies from tens of Ω to several hundreds of Ω. Voltage noise is the dominant noise in most cases; however, the LNA current noise flowing through the source impedance (RS) generates additional voltage noise. 2 2 LNA _ Noise total = VLNAnoise + R2s ´ ILNAnoise (12) The AFE5809 device achieves low-noise figure (NF) over a wide range of source resistances as shown in Figure 32, Figure 33, and Figure 34. 9.2.2.1.3 Active Termination In ultrasound applications, signal reflection exists due to long cables between the transducer and system. The reflection results in extra ringing added to echo signals in PW mode. Because the axial resolution depends on echo signal length, such ringing effect can degrade the axial resolution. Therefore, either passive termination or active termination is preferred if good axial resolution is desired. Figure 100 shows three termination configurations. Rs LNA (a) No Termination Rf Rs LNA (b) Active Termination Rs Rt LNA (c) Passive Termination S0499-01 Figure 100. Termination Configurations Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 85 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Under the no termination configuration, the input impedance of the AFE5809 is about 6 kΩ (8 K//20 pF) at 1 MHz. Passive termination requires external termination resistor Rt, which contributes to additional thermal noise. The LNA supports active termination with programmable values, as shown in Figure 101 . 450Ω 900Ω 1800Ω ACTx 3600Ω 4500Ω INPx Input INMx LNAx AFE S0500-01 Figure 101. Active Termination Implementation The AFE5809 device has four pre-settings 50, 100, 200, and 400 Ω, which are configurable through the registers. Other termination values can be realized by setting the termination switches shown in Figure 101. Register [52] is used to enable these switches. The input impedance of the LNA under the active termination configuration approximately follows: ZIN = Rf AnLNA 1+ 2 (13) Table 5 lists the LNA RINs under different LNA gains. System designers can achieve fine tuning for different probes. The equivalent input impedance is given by Equation 14 where RIN (8 kΩ) and CIN (20 pF) are the input resistance and capacitance of the LNA. ZIN = Rf / /CIN / /RIN AnLNA 1+ 2 (14) Therefore, the ZIN is frequency dependent, and it decreases as frequency increases as shown in Figure 10. Because 2 to 10 MHz is the most commonly used frequency range in medical ultrasound, this rolling-off effect does not impact system performance greatly. Active termination can be applied to both CW and TGC modes. Because each ultrasound system includes multiple transducers with different impedances, the flexibility of impedance configuration is a great plus. Figure 32, Figure 33, and Figure 34 show the NF under different termination configurations. It indicates that no termination achieves the best noise figure; active termination adds less noise than passive termination. Thus, termination topology should be carefully selected based on each use scenario in ultrasound. 86 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 9.2.2.1.4 LNA Gain Switch Response The LNA gain is programmable through SPI. The gain switching time depends on the SPI speed as well as the LNA gain response time. During the switching, glitches might occur and they can appear as artifacts in images. In addition, the signal chain needs about 14 µs to settle after the LNA gain change. Thus, LNA gain switching may not be preferred when switching time or settling time for the signal chain is limited. 9.2.2.2 Voltage-Controlled Attenuator The attenuator in the AFE5809 device is controlled by a pair of differential control inputs, the VCNTLM,P pins. The differential control voltage spans from 0 to 1.5 V. This control voltage varies the attenuation of the attenuator based on its linear-in-dB characteristic. Its maximum attenuation (minimum channel gain) appears at VCNTLP – VCNTLM = 1.5 V and minimum attenuation (maximum channel gain) occurs at VCNTLP – VCNTLM = 0. The typical gain range is 40 dB and remains constant, independent of the PGA setting. When only single-ended VCNTL signal is available, this 1.5-Vpp signal can be applied on the VCNTLP pin with the VCNTLM pin connected to ground; As Figure 102 show, the TGC gain curve is inversely proportional to the VCNTLP – VCNTLM. 1.5V VCNTLP VCNTLM = 0V X+40dB TGC Gain XdB (a) Single-Ended Input at VCNTLP 1.5V VCNTLP 0.75V VCNTLM 0V X+40dB TGC Gain XdB (b) Differential Inputs at VCNTLP and VCNTLM W0004-01 Figure 102. VCNTLP and VCNTLM Configurations Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 87 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com As discussed in the theory of operation, the attenuator architecture uses seven attenuator segments that are equally spaced to approximate the linear-in-dB gain-control slope. This approximation results in a monotonic slope; the gain ripple is typically less than ±0.5 dB. The control voltage input (VCNTLM,P pins) represents a high-impedance input. The VCNTLM,P pins of multiple AFE5809 devices can be connected in parallel with no significant loading effects. When the voltage level (VCNTLP – VCNTLM) is above 1.5 V or below 0 V, the attenuator continues to operate at its maximum attenuation level or minimum attenuation level, respectively. TI recommends lmiting the voltage from –0.3 to 2 V. When the AFE5809 device operates in CW mode, the attenuator stage remains connected to the LNA outputs. Therefore, TI recommends powering down the VCA using the PDN_VCA register bit. In this case, VCNTLP – VCNTLM voltage does not matter. The AFE5809 gain-control input has a –3-dB bandwidth of approximately 800 kHz. This wide bandwidth, although useful in many applications (for example, fast VCNTL response), can also allow high-frequency noise to modulate the gain control input and finally affect the Doppler performance. In practice, this modulation can be avoided by additional external filtering (RVCNTL and CVCNTL) at VCNTLM,P pins as Figure 81 shows. However, the external filter's cutoff frequency cannot be kept too low as this results in low gain response time. Without external filtering, the gain control response time is typically less than 1 μs to settle within 10% of the final signal level of 1VPP (–6-dBFS) output as indicated in Figure 51 and Figure 52. Typical VCNTLM,P signals are generated by an 8- to 12-bit 10-MSPS digital-to-analog converter (DAC) and a differential operation amplifier. TI’s DACs, such as TLV5626 and DAC7821/11 (10 MSPS/12 bit), could be used to generate TGC control waveforms. Differential amplifiers with output common mode voltage control (that is, THS4130 and OPA1632) can connect the DAC to the VCNTLM/P pins. The buffer amplifier can also be configured as an active filter to suppress low-frequency noise. The VCNTLM/P circuit achieves low noise to prevent the VCNTLM/P noise being modulated to RF signals. TI recommends that VCNTLM/P noise is below 25 nV/rtHz at 1 kHz and 5 nV/rtHz at 50 kHz. In high-channel count premium systems, the VCNTLM/P noise requirement is higher. See Figure 103 10 16 Channels 32 Channels 64 Channels 128 Channels 192 Channels 9 Noise (nV/—Hz) 8 7 6 5 4 3 2 1 0 1 2 3 4 5 7 10 20 30 50 100 200 Frequency (kHz) 500 1000 5000 D063 Figure 103. Allowed Noise on the VCNTL Signal Across Frequency and Different Channels More information can be found in SLOS318 and SBAA150. See Figure 2 for the VCNTL vs Gain curves. Table 28 also shows the absolute gain vs VCNTL, which may help program DAC correspondingly. In PW Doppler and color Doppler modes, VCNTL noise should be minimized to achieve the best close-in phase noise and SNR. Digital VCNTL feature is implemented to address this need in the AFE5809. In the digital VCNTL mode, no external VCNTL is needed. 88 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Table 28. VCNTLP – VCNTLM vs Gain Under Different LNA and PGA Gain Settings (Low-Noise Mode) VCNTLP – VCNTLM (V) Gain (dB) LNA = 12 dB PGA = 24 dB Gain (dB) LNA = 18 dB PGA = 24 dB Gain (dB) LNA = 24 dB PGA = 24 dB Gain (dB) LNA = 12 dB PGA = 30 dB Gain (dB) LNA = 18 dB PGA = 30 dB Gain (dB) LNA = 24 dB PGA = 30 dB 0 36.45 42.45 48.45 42.25 48.25 54.25 0.1 33.91 39.91 45.91 39.71 45.71 51.71 0.2 30.78 36.78 42.78 36.58 42.58 48.58 0.3 27.39 33.39 39.39 33.19 39.19 45.19 0.4 23.74 29.74 35.74 29.54 35.54 41.54 0.5 20.69 26.69 32.69 26.49 32.49 38.49 0.6 17.11 23.11 29.11 22.91 28.91 34.91 0.7 13.54 19.54 25.54 19.34 25.34 31.34 0.8 10.27 16.27 22.27 16.07 22.07 28.07 0.9 6.48 12.48 18.48 12.28 18.28 24.28 1 3.16 9.16 15.16 8.96 14.96 20.96 1.1 –0.35 5.65 11.65 5.45 11.45 17.45 1.2 –2.48 3.52 9.52 3.32 9.32 15.32 1.3 –3.58 2.42 8.42 2.22 8.22 14.22 1.4 –4.01 1.99 7.99 1.79 7.79 13.79 1.5 –4 2 8 1.8 7.8 13.8 9.2.2.3 CW Operation 9.2.2.3.1 CW Summing Amplifier To simplify CW system design, a summing amplifier is implemented in the AFE5809 to sum and convert 8channel mixer current outputs to a differential voltage output. Low noise and low power are achieved in the summing amplifier while maintaining the full dynamic range required in CW operation. This summing amplifier has five internal gain adjustment resistors which can provide 32 different gain settings (register 54[4:0], Figure 101 and Table 8). System designers can easily adjust the CW path gain depending on signal strength and transducer sensitivity. For any other gain values, an external resistor option is supported. The gain of the summation amplifier is determined by the ratio between the 500-Ω resistors after LNA and the internal or external resistor network REXT/INT. Thus, the matching between these resistors plays a more important role than absolute resistor values. Better than 1% matching is achieved on chip. Due to process variation, the absolute resistor tolerance could be higher. If external resistors are used, the gain error between I/Q channels or among multiple AFEs may increase. TI recommends using internal resistors to set the gain to achieve better gain matching (across channels and multiple AFEs). With the external capacitor CEXT , this summing amplifier has first-order LPF response to remove high-frequency components from the mixers, such as 2f0±fd. Its cut-off frequency is determined by: fHP = 1 2pRINT/EXT CEXT (15) When different gain is configured through Register 54[4:0], the LPF response varies as well. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 89 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com CEXT REXT 250Ω 250Ω RINT 500Ω 1000Ω 2000Ω CW_AMPINP CW_AMPINM CW_OUTM I/V Sum Amp CW_OUTP 250Ω 250Ω 500Ω RINT 1000Ω 2000Ω REXT CEXT S0501-01 Figure 104. CW Summing Amplifier Block Diagram Multiple AFE5809 devices are usually used in parallel to expand CW beamformer channel count. The AFE5809 CW's voltage outputs can be summed and filtered externally further to achieve desired gain and filter response. AC-coupling capacitors CAC are required to block the DC component of the CW carrier signal. CAC can vary from 1 to 10 μF depending on the desired low-frequency Doppler signal from slow blood flow. Multiple AFE5809s’ I/Q outputs can be summed together with a low-noise differential amplifiers before 16, 18-bit differential audio ADCs. The TI ultralow noise differential precision amplifier OPA1632 and THS4130 are suitable devices. 90 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Figure 106 shows an alternative current summing circuit. However, this circuit only achieves good performance when a lower-noise operational amplifier is available compared to the AFE5809's internal summing differential amplifier. AFE No.4 AFE No.3 AFE No.2 ACT1 500 Ω INP1 INPUT1 INM1 AFE No.1 Mixer 1 Clock LNA1 500 Ω ACT2 500 Ω INP2 INPUT2 INM2 Ext Sum Amp Cext Mixer 2 Clock Rint/Rext CW_AMPINP CW_AMPINM LNA2 I/V Sum Amp CW_OUTM CW_OUTP Rint/Rext 500 Ω CAC RSUM Cext CW I or Q CHANNEL Structure ACT8 500 Ω INP8 INPUT8 INM8 Mixer 8 Clock LNA8 500 Ω S0502-01 Figure 105. CW Circuit With Multiple AFE5809s (Voltage Output Mode) Figure 106. CW Circuit With Multiple AFE5809s (Current Output Mode, CM_BYP=1.5 V) The CW I/Q channels are well matched internally to suppress image frequency components in the Doppler spectrum. Low-tolerance components and precise operational amplifiers should be used for achieving good matching in the external circuits as well. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 91 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com NOTE The local oscillator inputs of the passive mixer are cos(ωt) for I-CH and sin(ωt) for Q-CH, respectively. Depending on the users' CW Doppler complex FFT processing, swapping I/Q channels in FPGA or DSP may be needed to get correct blood flow directions. 9.2.2.3.2 CW Clock Selection The AFE5809 device can accept differential LVDS, LVPECL, and other differential clock inputs as well as singleended CMOS clock. An internally generated VCM of 2.5 V is applied to CW clock inputs, that is, CLKP_16X/ CLKM_16X and CLKP_1X/ CLKM_1X. Because this 2.5-V VCM is different from the one used in standard LVDS or LVPECL clocks, AC coupling is required between clock drivers and the AFE5809 CW clock inputs. When the CMOS clock is used, CLKM_1X and CLKM_16X should be tied to ground. Figure 107 shows common clock configurations. TI recommends appropriate termination to achieve good signal integrity. 3.3 V 130 Ω 83 Ω CDCM7005 CDCE7010 3.3 V 0.1 μF AFE CLOCKs 0.1 μF 130 Ω LVPECL (a) LVPECL Configuration 100 Ω CDCE72010 0.1 μF 0.1 μF AFE CLOCKs LVDS (b) LVDS Configuration 0.1μF 0.1μF CLOCK SOURCE 0.1μF AFE CLOCKs 50 Ω 0.1μF (c) Transformer Based Configuration CMOS CLK Driver AFE CMOS CLK CMOS (d) CMOS Configuration S0503-01 Figure 107. Clock Configurations 92 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 The combination of the clock noise and the CW path noise can degrade the CW performance. The internal clocking circuit is designed for achieving excellent phase noise required by CW operation. The phase noise of the AFE5809 CW path is better than 155 dBc/Hz at 1-kHz offset. Consequently, the phase noise of the mixer clock inputs needs to be better than 155 dBc/Hz. In the 16/8/4 × ƒcw operations modes, low phase noise clock is required for 16, 8, 4 × ƒcw clocks (that is, CLKP_16X/ CLKM_16X pins) to maintain good CW phase noise performance. The 1 × ƒcw clock (that is, CLKP_1X/ CLKM_1X pins) is only used to synchronize the multiple AFE5809 chips and is not used for demodulation. Thus, 1 × ƒcw clock’s phase noise is not a concern. However, in the 1 × ƒcw operation mode, lowphase noise clocks are required for both CLKP_16X/ CLKM_16X and CLKP_1X/ CLKM_1X pins because both of them are used for mixer demodulation. In general, a higher slew rate clock has lower phase noise; thus, clocks with high amplitude and fast slew rate are preferred in CW operation. In the CMOS clock mode, a 5-V CMOS clock can achieve the highest slew rate. Clock phase noise can be improved by a divider as long as the divider’s phase noise is lower than the target phase noise. The phase noise of a divided clock can be improved approximately by a factor of 20logN dB where N is the dividing factor of 16, 8, or 4. If the target phase noise of mixer LO clock 1 × ƒcw is 160 dBc/Hz at 1 kHz off carrier, the 16 × ƒcw clock phase noise should be better than 160 – 20log16 = 136 dBc/Hz. TI’s jitter cleaners LMK048X/CDCM7005/CDCE72010 exceed this requirement and can be selected for the AFE5809. In the 4×/1× modes, higher-quality input clocks are expected to achieve the same performance because N is smaller. Thus, the 16× mode is a preferred mode because it reduces the phase noise requirement for system clock design. In addition, the phase delay accuracy is specified by the internal clock divider and distribution circuit. Note in the 16× operation mode, the CW operation range is limited to 8 MHz due to the 16× CLK. The maximum clock frequency for the 16× CLK is 128 MHz. In the 8×, 4×, and 1× modes, higher CW signal frequencies up to 15 MHz can be supported with small degradation in performance, for example, the phase noise is degraded by 9 dB at 15 MHz, compared to 2 MHz. As the channel number in a system increases, clock distribution becomes more complex. It is not preferred to use one clock driver output to drive multiple AFEs because the clock buffer’s load capacitance increases by a factor of N. As a result, the falling and rising time of a clock signal is degraded. A typical clock arrangement for multiple AFE5809 devices is shown in Figure 108. Each clock buffer output drives one AFE5809 device to achieve the best signal integrity and fastest slew rate, that is, better phase noise performance. When clock phase noise is not a concern, for example, the 1 × ƒcw clock in the 16, 8, 4 × ƒcw operation modes, one clock driver output may excite more than one AFE5809 device. Nevertheless, special considerations should be applied in such a clock distribution network design. In typical ultrasound systems, it is preferred that all clocks are generated from a same clock source, such as 16 × ƒcw , 1 × ƒcw clocks, audio ADC clocks, RF ADC clock, pulse repetition frequency signal, frame clock, and so on. By doing this, interference due to clock asynchronization can be minimized. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 93 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com FPGA Clock/ Noisy Clock n×16×CW Freq LMK048X CDCE72010 CDCM7005 16X CW CLK 1X CW CLK CDCLVP1208 LMK0030X LMK01000 CDCLVP1208 LMK0030X LMK01000 AFE AFE AFE AFE 8 Synchronized 1X CW CLKs AFE AFE AFE AFE 8 Synchronized 16 X CW CLKs B0436-01 Figure 108. CW Clock Distribution 9.2.2.3.3 CW Supporting Circuits As a general practice in CW circuit design, in-phase and quadrature channels should be strictly symmetrical by using well-matched layout and high-accuracy components. In systems, additional high-pass wall filters (20 to 500 Hz) and low-pass audio filters (10 to 100 kHz) with multiple poles are usually needed. Because the CW Doppler signal ranges from 20 Hz to 20 kHz, noise under this range is critical. Consequently, low-noise audio operational amplifiers are suitable to build these active filters for CW post-processing, that is, OPA1632 or OPA2211. To find more filter design techniques, see www.ti.com. For the TI active filter design tool, see www.ti.com/filterdesigner. The filtered audio CW I/Q signals are sampled by audio ADCs and processed by DSP or PC. Although CW signal frequency is from 20 Hz to 20 kHz, higher sampling rate ADCs are still preferred for further decimation and SNR enhancement. Due to the large dynamic range of CW signals, high resolution ADCs (≥16 bit) are required, such as ADS8413 (2 MSPS, 16-bit, 92-dBFS SNR) and ADS8472 (1 MSPS, 16-bit, 95-dBFS SNR). ADCs for inphase and quadrature-phase channels must be strictly matched, not only amplitude matching but also phase matching, to achieve the best I/Q matching. In addition, the in-phase and quadrature ADC channels must be sampled simultaneously. 9.2.2.4 Low Frequency Support In addition, the signal chain of the AFE5809 can handle signal frequency lower than 100 kHz, which enables the AFE5809 to be used in both sonar and medical applications. The PGA integrator must be turned off to enable the low frequency support. Meanwhile, a large capacitor like 1 µF can be used for setting low corner frequency of the LNA DC offset correction circuit as shown in Figure 62. See Figure 59 to find AFE5809's low frequency response. 94 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 9.2.2.5 ADC Operation 9.2.2.5.1 ADC Clock Configurations To ensure that the aperture delay and jitter are the same for all channels, the AFE5809 uses a clock tree network to generate individual sampling clocks for each channel. The clock, for all the channels, are matched from the source point to the sampling circuit of each of the eight internal ADCs. The variation on this delay is described in the aperture delay parameter of the output interface timing. Its variation is given by the aperture jitter number of the same table. FPGA Clock/ Noisy Clock n × (20 to 65)MHz TI Jitter Cleaner LMK048X CDCE72010 CDCM7005 20 to 65 MHz ADC CLK CDCLVP1208 LMK0030X LMK01000 CDCE72010 has 10 outputs thus the buffer may not be needed for 64CH systems AFE AFE AFE AFE AFE AFE AFE AFE 8 Synchronized ADC CLKs B0437-01 Figure 109. ADC Clock Distribution Network The AFE5809 ADC clock input can be driven by differential clocks (sine wave, LVPECL, or LVDS) or singled clocks (LVCMOS) similar to CW clocks as shown in Figure 107. In the single-end case, TI recommends that the use of low jitter square signals (LVCMOS levels, 1.8-V amplitude). See TI document SLYT075 for further details on the theory. The jitter cleaner CDCM7005 or CDCE72010 is suitable to generate the AFE5809’s ADC clock and ensure the performance for the14-bit ADC with 77-dBFS SNR. Figure 109 shows a clock distribution network. 9.2.2.5.2 ADC Reference Circuit The ADC’s voltage reference can be generated internally or provided externally. When the internal reference mode is selected, the REFP/M become output pins and should be floated. When 3[15] = 1 and 1[13] = 1, the device is configured to operate in the external reference mode in which the VREF_IN pin should be driven with a 1.4-V reference voltage and REFP/M must be left open. Because the input impedance of the VREF_IN is high, no special drive capability is required for the 1.4-V voltage reference Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 95 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com The digital beam-forming algorithm in an ultrasound system relies on gain matching across all receiver channels. A typical system would have about 12 octal AFEs on the board. In such a case, it is critical to ensure that the gain is matched, essentially requiring the reference voltages seen by all the AFEs to be the same. Matching references within the eight channels of a chip is done by using a single internal reference voltage buffer. Trimming the reference voltages on each chip during production ensures that the reference voltages are wellmatched across different chips. When the external reference mode is used, a solid reference plane on a PCB can ensure minimal voltage variation across devices. More information on voltage reference design can be found in the document SLYT339. The dominant gain variation in the AFE5809 comes from the VCA gain variation. The gain variation contributed by the ADC reference circuit is much smaller than the VCA gain variation. Hence, in most systems, using the ADC internal reference mode is sufficient to maintain good gain matching among multiple AFE5809s. In addition, the internal reference circuit without any external components achieves satisfactory thermal noise and phase noise performance. 9.2.3 Application Curves Figure 110 show the output SNR of one AFE channel from VCNTL = 0 V and VCNTL = 1.2 V, respectively, with an input signal at 5 MHz captured at a sample rate of 65 MHz. VCNTL = 0 V represents far field while VCNTL = 1.2 V represents near field.Figure 111 shows the CW phase noise or dyanmic range of a singe AFE channel. 75 −146 16X Clock Mode 8X Clock Mode 4X Clock Mode −148 Phase Noise (dBc/Hz) −150 SNR (dBFS) 70 65 60 −152 −154 −156 −158 −160 −162 −164 −166 24 dB PGA gain 30 dB PGA gain 55 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 Vcntl (V) Figure 110. SNR vs. Vcntl at 18 dB LNA −168 −170 100 1000 10000 50000 Offset Frequency (Hz) Figure 111. CW Phase Noise at Fin = 2 MHz 9.3 System Example In a complex system design, system debug features of a device are very important. The AFE5809 includes multiple test modes to accelerate system development. 9.3.1 ADC Debug The ADC test modes are discussed in the ADC register description section. The AFE5809 device can output a variety of test patterns on the LVDS outputs. These test patterns replace the normal ADC data output. The device may also be made to output 6 preset patterns: • Ramp: Setting Register 2[15:13] = 111 causes all the channels to output a repeating full-scale ramp pattern. The ramp increments from zero code to full-scale code in steps of 1 LSB every clock cycle. After hitting the full-scale code, it returns back to zero code and ramps again. • Zeros: The device can be programmed to output all 0 s by setting Register 2[15:13] = 110. • Ones: The device can be programmed to output all 1 s by setting Register 2[15:13] = 100. • Deskew Patten: When 2[15:13] = 010; this mode replaces the 14-bit ADC output with the 01010101010101 word. • Sync Pattern: When 2[15:13] = 001, the normal ADC output is replaced by a fixed 11111110000000 word. • Toggle: When 2[15:13] = 101, the normal ADC output is alternating from 1 s to 0 s. The start state of ADC word can be either 1 s or 0 s. • Custom Pattern: It can be enabled when 2[15:13] = 011. Users can write the required VALUE into register bits 96 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 System Example (continued) , which is Register 5[13:0]. Then, the device will output VALUE at its outputs, about 3 to 4 ADC clock cycles after the 24th rising edge of SCLK. So, the time taken to write one value is 24 SCLK clock cycles + 4 ADC clock cycles. To change the customer pattern value, users can repeat writing Register 5[13:0] with a new value. Due to the speed limit of SPI, the refresh rate of the custom pattern may not be high. For example, 128 points custom pattern takes approximately 128 × (24 SCLK clock cycles + 4 ADC clock cycles). NOTE Only one of the above patterns can be active at any given instant. Test pattern from the ADC output stage can NOT be sent to the demodulator; it can only be sent to the LVDS serializer when the demodulator is off. NOTE After the demodulator is enabled, digital demodulator register 02[15:13] can be configured to send out test patterns for demod block, please seeDigital Demodulator Register Description. 9.3.2 VCA Debug The VCA has a test mode in which the CH7 and CH8 PGA outputs can be brought to the CW pins. By monitoring these PGA outputs, the functionality of VCA operation can be verified. The PGA outputs are connected to the virtual ground pins of the summing amplifier (CW_IP_AMPINM/P, CW_QP_AMPINM/P) through 5-kΩ resistors. The PGA outputs can be monitored at the summing amplifier outputs when the LPF capacitors CEXT are removed. The signals at the summing amplifier outputs are attenuated due to the 5-kΩ resistors. The attenuation coefficient is RINT/EXT / 5 kΩ. If users would like to check the PGA outputs without removing CEXT, an alternative way is to measure the PGA outputs directly at the CW_IP_AMPINM/P and CW_QP_AMPINM/P when the CW summing amplifier is powered down. Some registers are related to this test mode, PGA Test Mode Enable: Reg59[9]; Buffer Amplifier Power Down Reg59[8]; and Buffer Amplifier Gain Control Reg54[4:0]. Based on the buffer amplifier configuration, the registers can be set in different ways: • • Configuration 1 – In this configuration, the test outputs can be monitored at CW_AMPINP/M. – Reg59[9] = 1; test mode enabled – Reg59[8] = 0; buffer amplifier powered-down Configuration 2 – In this configuration, the test outputs can be monitored at CW_OUTP/M. – Reg59[9] = 1; test mode enabled – Reg59[8] = 1; buffer amplifier powered on – Reg54[4:0] = 10H; internal feedback 2-kΩ resistor enabled. Different values can be used as well. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 97 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com System Example (continued) PGA_P Cext 5K ACT 500 Ω INP INPUT INM Mixer Clock Rint/Rext CW_AMPINP CW_AMPINM LNA 500 Ω CW_OUTM I/V Sum Amp Rint/Rext CW_OUTP 5K Cext PGA_M S0504-01 Figure 112. AFE5809 PGA Test Mode 9.4 Do's and Don'ts 9.4.1 Driving the Inputs (Analog or Digital) Beyond the Power-Supply Rails For device reliability, an input must not go more than 300 mV below the ground pins or 300 mV above the supply pins as suggested in the table. Exceeding these limits, even on a transient basis, can cause faulty or erratic operation and can impair device reliability. 9.4.2 Driving the Device Signal Input With an Excessively High Level Signal The device offers consistent and fast overload recovery with a 6-dB overloaded signal. For very large overload signals (> 6 dB of the linear input signal range), TI recommends back-to-back Schottky clamping diodes at the input to limit the amplitude of the input signal. Refer to the section for more details. 9.4.3 Driving the VCNTL Signal With an Excessive Noise Source Noise on the VCNTL signal gets directly modulated with the input signal and causes higher output noise and reduction in SNR performance. Maintain a noise level for the VCNTL signal as discussed in the section. 9.4.4 Using a Clock Source With Excessive Jitter, an Excessively Long Input Clock Signal Trace, or Having Other Signals Coupled to the ADC or CW Clock Signal Trace These situations cause the sampling interval to vary, causing an excessive output noise and a reduction in SNR performance. For a system with multiple devices, the clock tree scheme must be used to apply an ADC or CW clock. Refer to the section for clock mismatch between devices, which can lead to latency mismatch and reduction in SNR performance. Clocks generated by FPGA may include excessive jitter and must be evaluated carefully before driving ADC or CW circuits. 9.4.5 LVDS Routing Length Mismatch The routing length of all LVDS lines routing to the FPGA must be matched to avoid any timing related issue. For systems with multiple devices, the LVDS serialized data clock (DCLKP, DCLKM) and the frame clock (FCLKP, FCLKM) of each individual device must be used to deserialize the corresponding LVDS serialized data (DnP,DnM). 98 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Do's and Don'ts (continued) 9.4.6 Failure to Provide Adequate Heat Removal Use the appropriate thermal parameter listed in the table and an ambient, board, or case temperature to calculate device junction temperature. A suitable heat removal technique must be used to keep the device junction temperature below the maximum limit of 105°C. 10 Power Supply Recommendations Figure 113 shows the suggested power-up sequencing and reset timing for the device. t1 AVDD AVDD_5V AVDD_ADC t2 DVDD t3 t4 t7 t5 RESET t6 Device Ready for Serial Register Write SEN Start of Clock Device Ready for Data Conversion CLKP_ADC t8 A. 10 μs < t1 < 50 ms, 10 μs < t2 < 50 ms, –10 ms < t3 < 10 ms, t4 > 10 ms, t5 > 100 ns, t6 > 100 ns, t7 > 10 ms, and t8 > 100 μs. When the demodulator power DVDD_LDO1 and DVDD_LDO2 are supplied externally, it should be powered up 1ms after DVDD. LDOs for external DVDD_LDO1 and DVDD_LDO2 can be powered down if the demodualtor is not used. B. The AVDDx and DVDD power-on sequence does not matter as long as –10 ms < t3 < 10 ms. Similar considerations apply while shutting down the device. Figure 113. Recommended Power-Up Sequencing and Reset Timing with Internally Generated 1.4V Demod Supply 10.1 Power/Performance Optimization The AFE5809 device has options to adjust power consumption and meet different noise performances. This feature would be useful for portable systems operated by batteries when low power is more desired. Refer to characteristics information listed in the Electrical Characteristics as well as the Typical Characteristics. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 99 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 10.2 Power Management Priority Power management plays a critical role to extend battery life and ensure long operation time. The AFE5809 device has fast and flexible power-down and power-up control which can maximize battery life. The AFE5809 can be powered down or up through external pins or internal registers. Table 29 indicates the affected circuit blocks and priorities when the power management is invoked. The higher priority controls can overwrite the lower priority controls. In the device, all the power-down controls are logically ORed to generate final power down for different blocks. The higher priority controls can cover the lower priority controls. Table 29. Power Management Priority Name Blocks Priority Pin PDN_GLOBAL All High Pin PDN_VCA LNA + VCAT+ PGA Medium Register VCA_PARTIAL_PDN LNA + VCAT+ PGA Low Register VCA_COMPLETE_PDN LNA + VCAT+ PGA Medium Pin PDN_ADC ADC Medium Register ADC_PARTIAL_PDN ADC Low Register ADC_COMPLETE_PDN ADC Medium Register PDN_VCAT_PGA VCAT + PGA Lowest Register PDN_LNA LNA Lowest 10.3 Partial Power-Up and Power-Down Mode The partial power-up and power-down mode is also called fast power-up and power-down mode. In this mode, most amplifiers in the signal path are powered down, while the internal reference circuits remain active as well as the LVDS clock circuit, that is, the LVDS circuit still generates its frame and bit clocks. The partial power-down function allows the AFE5809 device to wake up from a low-power state quickly. This configuration ensures that the external capacitors are discharged slowly; thus, a minimum wake-up time is needed as long as the charges on those capacitors are restored. The VCA wake-up response is typically about 2 μs or 1% of the power-down duration, whichever is larger. The longest wake-up time depends on the capacitors connected at INP and INM, because the wake-up time is the time required to recharge the capacitors to the desired operating voltages. 0.1 μF at INP and 15 nF at INM can give a wake-up time of 2.5 ms. For larger capacitors, this time will be longer. The ADC wake-up time is about 1 μs. Thus, the AFE5809 wake-up time is more dependent on the VCA wake-up time. This also assumes that the ADC clock has been running for at least 50 µs before normal operating mode resumes. The power-down time is instantaneous, less than 1 µs. This fast wake-up response is desired for portable ultrasound applications in which the power saving is critical. The pulse repetition frequency of an ultrasound system could vary from 50 kHz to 500 Hz, while the imaging depth (that is, the active period for a receive path) varies from 10 μs to hundreds of µs. The power saving can be significant when a system’s PRF is low. In some cases, only the VCA would be powered down while the ADC keeps running normally to ensure minimal impact to FPGAs. In the partial power-down mode, the AFE5809 device typically dissipates only 26 mW/ch, representing an 80% power reduction compared to the normal operating mode. This mode can be set using either pins (PDN_VCA and PDN_ADC) or register bits (VCA_PARTIAL_PDN and ADC_PARTIAL_PDN). 10.4 Complete Power-Down Mode To achieve the lowest power dissipation of 0.7 mW/CH, the AFE5809 device can be placed into a complete power-down mode. This mode is controlled through the registers ADC_COMPLETE_PDN, VCA_COMPLETE_PDN, or PDN_GLOBAL pin. In the complete power-down mode, all circuits including reference circuits within the AFE5809 device are powered down, and the capacitors connected to the AFE5809 device are discharged. The wake-up time depends on the time needed to recharge these capacitors. The wakeup time depends on the time that the AFE5809 device spends in shutdown mode. 0.1 μF at INP and 15 nF at INM can give a wake-up time close to 2.5 ms. 100 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Complete Power-Down Mode (continued) NOTE When the complete power-down mode is enabled, the digital demodulator may lose register settings. Therefore, it is required to reconfigure the demodulator registers, filter coefficient memory, and profile memory after exiting the complete power-down mode. 10.5 Power Saving in CW Mode Usually, only half the number of channels in a system are active in the CW mode. Thus, the individual channel control through ADC_PDN_CH and VCA_PDN_CH can power down unused channels and save power consumption greatly. Under the default register setting in CW mode, the voltage controlled attenuator, PGA, and ADC are still active. During the debug phase, both the PW and CW paths can run simultaneously. In real operation, these blocks must be powered down manually. 11 Layout 11.1 Layout Guidelines Proper grounding and bypassing, short lead length, and the use of ground and power-supply planes are particularly important for high-frequency designs. Achieving optimum performance with a high-performance device such as the AFE5809 requires careful attention to the PCB layout to minimize the effects of board parasitics and optimize component placement. A multilayer PCB usually ensures best results and allows convenient component placement. To maintain proper LVDS timing, all LVDS traces should follow a controlled impedance design. In addition, all LVDS trace lengths should be equal and symmetrical; TI recommends to keep trace length variations less than 150 mil (0.150 inch or 3.81 mm). NOTE To avoid noise coupling through supply pins, TI recommends keeping sensitive input net classes, such as INM, INP, ACT pins, away from AVDD 3.3 V, AVDD_5V, DVDD, AVDD_ADC, DVDD_LDO1/2 nets or planes. For example, vias connected to these pins should NOT be routed across any supply plane. That is to avoid power planes under INM, INP, and ACT pins. In addition, appropriate delay matching should be considered for the CW clock path, especially in systems with high channel count. For example, if clock delay is half of the 16× clock period, a phase error of 22.5°C could exist. Thus, the timing delay difference among channels contributes to the beamformer accuracy. Additional details on BGA PCB layout techniques can be found in the TI application report MicroStar BGA Packaging Reference Guide (SSYZ015), which can be downloaded from www.ti.com. Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 101 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 11.2 Layout Example Caps to INP, INM, ACT pins CW I/Os Vcntl Decoupling caps close to power pins Figure 114. Layout Example 102 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Layout Example (continued) No Power Plane below INP, INM, and ACT pins Power Planes for AVDD_5V and AVDD_ADC SPI pins Figure 115. Layout Example Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 103 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com Layout Example (continued) No Power Plane below INP, INM, and ACT pins Power Plane AVDD Power Plane AVDD_ADC Power Plane DVDD Figure 116. Layout Example 104 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 AFE5809 www.ti.com SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 Layout Example (continued) CW CLKs CW I/Os GND Fanout CW CLKs ADC CLK LVDS Outputs Figure 117. Layout Example Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 105 AFE5809 SLOS738E – SEPTEMBER 2012 – REVISED AUGUST 2015 www.ti.com 12 Device and Documentation Support 12.1 Device Support 12.1.1 Development Support For the Power Stage Designer see www.ti.com/filterdesigner 12.2 Documentation Support 12.2.1 Related Documentation For related documentation see the following: • MicroStar BGA Packaging Reference Guide, SSYZ015 • Clocking High-Speed Data Converters, SLYT075 12.3 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.4 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.5 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 12.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 106 Submit Documentation Feedback Copyright © 2012–2015, Texas Instruments Incorporated Product Folder Links: AFE5809 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) AFE5809ZCF ACTIVE NFBGA ZCF 135 160 RoHS & Green SNAGCU Level-3-260C-168 HR 0 to 85 AFE5809 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of