DLP4710
DLPS125B – NOVEMBER 2018 – REVISED MAY 2022
DLP4710 0.47 1080p DMD
1 Features
3 Description
•
The DLP4710 digital micromirror device (DMD) is
a digitally controlled micro-opto-electromechanical
system (MOEMS) spatial light modulator (SLM).
When coupled to an appropriate optical system, the
DLP4710LC DMD displays a very crisp and high
quality image or video. The device is a component
of the chipset comprising the DLP4710 DMD,
DLPC3479 controller and DLPA3000/DLPA3005
PMIC/LED drivers. The compact physical size of
the DLP4710LC coupled with the controller and the
PMIC/LED driver provides a complete system solution
that enables small form factor, low power, and high
resolution HD displays.
•
•
•
0.47-Inch (11.93-mm) diagonal micromirror array
– 1920 × 1080 array of aluminum micrometersized mirrors, in an orthogonal layout
– Micromirror pitch: 5.4 μm
– Micromirror tilt (relative to flat surface): ±17°
– Bottom illumination for optimal efficiency and
optical engine size
– Polarization independent aluminum micromirror
surface
32-Bit SubLVDS input data bus
Dedicated DLP3439 display controller
Dedicated DLPA3000 or DLPA3005 PMIC/LED
drivers for reliable operation
Visit the getting started with TI DLP®Pico™ display
technology page to learn how to get started with the
DLP4710.
2 Applications
•
•
•
•
•
•
Smart full HD projector
Mobile accessory full HD projector
Screenless display
Interactive display
Low latency gaming display
Head mounted display
The DLP4710 ecosystem includes established
resources to help the user accelerate the design
cycle, which include production ready optical
modules, optical modules manufactures, and design
houses.
Device Information
PACKAGE(1)
PART NUMBER
DLP4710
(1)
FQL (100)
BODY SIZE (NOM)
24.50-mm × 11-mm
For all available packages, see the orderable addendum at
the end of the data sheet.
DLP Pico Analog Device
VOFFSET
VBIAS
VRESET
DLP
Pico Processor
DLP
Pico Processor
600 MHz
SubLVDS
DDR
Interface
120 MHz
SDR
Interface
D_BP(0:7)
D_BP(0:7)
D_AP(0:7)
D_AN(0:7)
DLP DMD
DCLK_AP
DCLK_AN
DCLK_BP
DCLK_BN
Digital
Micromirror
Device
LS_WDATA
LS_CLK
LS_RDATA
LS_RDATA_B
600 MHz
SubLVDS
DDR
Interface
120 MHz
SDR
Interface
DMD_DEN_ARSTZ
Slave
Master
VDDI
VDD
VSS
(System signal routing omitted for clarity)
0.47 1080p Chipset
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DLP4710
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DLPS125B – NOVEMBER 2018 – REVISED MAY 2022
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 8
6.1 Absolute Maximum Ratings ....................................... 8
6.2 Storage Conditions..................................................... 8
6.3 ESD Ratings............................................................... 9
6.4 Recommended Operating Conditions.........................9
6.5 Thermal Information.................................................. 11
6.6 Electrical Characteristics...........................................11
6.7 Timing Requirements................................................ 12
6.8 Switching Characteristics .........................................17
6.9 System Mounting Interface Loads............................ 17
6.10 Physical Characteristics of the Micromirror Array... 18
6.11 Micromirror Array Optical Characteristics............... 20
6.12 Window Characteristics.......................................... 21
6.13 Chipset Component Usage Specification............... 21
6.14 Software Requirements.......................................... 22
7 Detailed Description......................................................23
7.1 Overview................................................................... 23
7.2 Functional Block Diagram......................................... 24
7.3 Feature Description...................................................25
7.4 Device Functional Modes..........................................25
7.5 Optical Interface and System Image Quality
Considerations............................................................ 25
7.6 Micromirror Array Temperature Calculation.............. 26
7.7 Micromirror Landed-On/Landed-Off Duty Cycle ...... 27
8 Application and Implementation.................................. 31
8.1 Application Information............................................. 31
8.2 Typical Application.................................................... 31
9 Power Supply Recommendations................................33
9.1 DMD Power Supply Power-Up Procedure................ 33
9.2 DMD Power Supply Power-Down Procedure........... 33
9.3 Power Supply Sequencing Requirements................ 34
10 Layout...........................................................................36
10.1 Layout Guidelines................................................... 36
10.2 Layout Example...................................................... 36
11 Device and Documentation Support..........................37
11.1 Device Support........................................................37
11.2 Related Links.......................................................... 37
11.3 Receiving Notification of Documentation Updates.. 38
11.4 Support Resources................................................. 38
11.5 Trademarks............................................................. 38
11.6 Electrostatic Discharge Caution.............................. 38
11.7 Glossary.................................................................. 38
12 Mechanical, Packaging, and Orderable
Information.................................................................... 39
4 Revision History
Changes from Revision A (November 2021) to Revision B (May 2022)
Page
• Updated Absolute Maximum Ratings disclosure to the latest TI standard......................................................... 8
• Updated Micromirror Array Optical Characteristics ......................................................................................... 20
• Added Third-Party Products Disclaimer ...........................................................................................................37
Changes from Revision * (November 2018) to Revision A (November 2021)
Page
• Updated the numbering format for tables, figures, and cross-references throughout the document..................1
• Updated |TDELTA| MAX from 30°C to 15°C..........................................................................................................9
2
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5 Pin Configuration and Functions
L
J
K
G
H
E
F
C
D
A
B
1
2
3
4
5
6
25
26
27
28
29
30
31
Figure 5-1. FQL Package. 100-Pin LGA. Bottom View.
Table 5-1. Connector Pins
PIN(1)
NAME
NO.
TYPE
SIGNAL
DATA RATE
DESCRIPTION
PACKAGE NET
LENGTH(2) (mm)
DATA INPUTS
D_AN(0)
G3
I
SubLVDS
Double
Data, Negative
5.01
D_AN(1)
F4
I
SubLVDS
Double
Data, Negative
2.03
D_AN(2)
E3
I
SubLVDS
Double
Data, Negative
2.41
D_AN(3)
E6
I
SubLVDS
Double
Data, Negative
4.71
D_AN(4)
J5
I
SubLVDS
Double
Data, Negative
3.23
D_AN(5)
L5
I
SubLVDS
Double
Data, Negative
3.87
D_AN(6)
G5
I
SubLVDS
Double
Data, Negative
6.32
D_AN(7)
L3
I
SubLVDS
Double
Data, Negative
1.84
D_AP(0)
H3
I
SubLVDS
Double
Data, Positive
5.01
D_AP(1)
G4
I
SubLVDS
Double
Data, Positive
2.03
D_AP(2)
E4
I
SubLVDS
Double
Data, Positive
2.41
D_AP(3)
E5
I
SubLVDS
Double
Data, Positive
4.71
D_AP(4)
J6
I
SubLVDS
Double
Data, Positive
3.23
D_AP(5)
L6
I
SubLVDS
Double
Data, Positive
3.87
D_AP(6)
G6
I
SubLVDS
Double
Data, Positive
6.32
D_AP(7)
L4
I
SubLVDS
Double
Data, Positive
1.84
D_BN(0)
G27
I
SubLVDS
Double
Data, Negative
2.51
D_BN(1)
E26
I
SubLVDS
Double
Data, Negative
4.43
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Table 5-1. Connector Pins (continued)
PIN(1)
NAME
NO.
TYPE
SIGNAL
DATA RATE
DESCRIPTION
PACKAGE NET
LENGTH(2) (mm)
D_BN(2)
D28
I
SubLVDS
Double
Data, Negative
2.76
D_BN(3)
D26
I
SubLVDS
Double
Data, Negative
5.47
D_BN(4)
L25
I
SubLVDS
Double
Data, Negative
4.85
D_BN(5)
K25
I
SubLVDS
Double
Data, Negative
4.10
D_BN(6)
L28
I
SubLVDS
Double
Data, Negative
2.53
D_BN(7)
K27
I
SubLVDS
Double
Data, Negative
2.76
D_BP(0)
F27
I
SubLVDS
Double
Data, Positive
2.51
D_BP(1)
E27
I
SubLVDS
Double
Data, Positive
4.43
D_BP(2)
D27
I
SubLVDS
Double
Data, Positive
2.76
D_BP(3)
D25
I
SubLVDS
Double
Data, Positive
5.47
D_BP(4)
L26
I
SubLVDS
Double
Data, Positive
4.85
D_BP(5)
J25
I
SubLVDS
Double
Data, Positive
4.10
D_BP(6)
K28
I
SubLVDS
Double
Data, Positive
2.53
D_BP(7)
J27
I
SubLVDS
Double
Data, Positive
2.76
DCLK_AN
J3
I
SubLVDS
Double
Clock, Negative
3.77
DCLK_AP
K3
I
SubLVDS
Double
Clock, Positive
3.77
DCLK_BN
H26
I
SubLVDS
Double
Clock, Negative
2.98
DCLK_BP
H27
I
SubLVDS
Double
Clock, Positive
2.98
LS_WDATA
D3
I
LPSDR (1)
Single
Write data for low speed interface.
1.20
LS_CLK
C3
I
LPSDR
Single
Clock for low-speed interface
1.20
Asynchronous reset DMD signal. A low
signal places the DMD in reset. A high
signal releases the DMD from reset
and places it in active mode.
4.19
CONTROL INPUTS
DMD_DEN_ARSTZ
B6
I
LPSDR
LS_RDATA_A
C6
O
LPSDR
Single
Read data for low-speed interface
3.93
LS_RDATA_B
C4
O
LPSDR
Single
Read data for low-speed interface
2.57
VBIAS
B27
Power
24.51
VBIAS
B4
Power
Supply voltage for positive bias level at
micromirrors
VOFFSET
B2
Power
49.56
VOFFSET
C29
Power
Supply voltage for HVCMOS core
logic. Supply voltage for stepped
high level at micromirror address
electrodes.
Supply voltage for offset level at
micromirrors.
VRESET
B28
Power
B3
Power
Supply voltage for negative reset level
at micromirrors.
24.82
VRESET
POWER
4
(3)
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24.51
49.56
24.82
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Table 5-1. Connector Pins (continued)
PIN(1)
NAME
NO.
TYPE
VDD
C2
Power
VDD
D2
Power
VDD
D29
Power
VDD
E2
Power
VDD
E29
Power
VDD
H2
Power
VDD
H28
Power
VDD
H29
Power
VDD
J2
Power
VDD
J28
Power
VDD
J29
Power
VDD
K2
Power
VDD
K29
Power
VDD
L2
Power
VDD
L29
Power
VDDI
E28
Power
VDDI
F2
Power
VDDI
F28
Power
VDDI
F29
Power
VDDI
F3
Power
VDDI
G2
Power
VDDI
G28
Power
VDDI
G29
Power
SIGNAL
DATA RATE
PACKAGE NET
LENGTH(2) (mm)
DESCRIPTION
Supply voltage for LVCMOS core logic.
Supply voltage for LPSDR inputs.
Supply voltage for normal high level at
micromirror address electrodes.
Supply voltage for SubLVDS receivers.
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Table 5-1. Connector Pins (continued)
PIN(1)
NAME
TYPE
VSS
B25
Ground
VSS
B26
Ground
VSS
B29
Ground
VSS
B5
Ground
VSS
C25
Ground
VSS
C26
Ground
VSS
C27
Ground
VSS
C28
Ground
VSS
C5
Ground
VSS
D4
Ground
VSS
D5
Ground
VSS
D6
Ground
VSS
E25
Ground
VSS
F25
Ground
VSS
F26
Ground
VSS
F5
Ground
VSS
F6
Ground
VSS
G25
Ground
VSS
G26
Ground
VSS
H25
Ground
VSS
H4
Ground
VSS
H5
Ground
VSS
H6
Ground
VSS
J26
Ground
VSS
J4
Ground
VSS
K26
Ground
VSS
K4
Ground
VSS
K5
Ground
VSS
K6
Ground
VSS
L27
Ground
(1)
(2)
(3)
6
NO.
SIGNAL
DATA RATE
DESCRIPTION
PACKAGE NET
LENGTH(2) (mm)
Common return.
Ground for all power.
Low speed interface is LPSDR and adheres to the Electrical Characteristics and AC/DC Operating Conditions table in JEDEC
Standard No. 209B, Low Power Double Data Rate (LPDDR) JESD209B.
Net trace lengths inside the package:
Relative dielectric constant for the FQL ceramic package is 9.8.
Propagation speed = 11.8 / sqrt (9.8) = 3.769 inches/ns.
Propagation delay = 0.265 ns/inch = 265 ps/inch = 10.43 ps/mm.
The following power supplies are all required to operate the DMD: VDD, VDDI, VOFFSET, VBIAS, VRESET. All VSS connections are
also required.
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Table 5-2. Test Pads
NUMBER
SYSTEM BOARD
A1
Do not connect
A5
Do not connect
A6
Do not connect
A25
Do not connect
A26
Do not connect
A27
Do not connect
A28
Do not connect
A29
Do not connect
A30
Do not connect
A31
Do not connect
B30
Do not connect
B31
Do not connect
C30
Do not connect
C31
Do not connect
D1
Do not connect
E1
Do not connect
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6 Specifications
6.1 Absolute Maximum Ratings
see (1)
Supply voltage
Input voltage
Input pins
Clock frequency
MIN
MAX
UNIT
VDD
Supply voltage for LVCMOS core logic(2)
Supply voltage for LPSDR low speed interface
–0.5
2.3
V
VDDI
Supply voltage for SubLVDS receivers(2)
–0.5
2.3
V
VOFFSET
Supply voltage for HVCMOS and micromirror
–0.5
11
V
VBIAS
Supply voltage for micromirror electrode(2)
–0.5
19
V
electrode(2)
–15
VRESET
Supply voltage for micromirror
0.5
V
| VDDI–VDD |
Supply voltage delta (absolute value)(4)
0.3
V
| VBIAS–
VOFFSET |
Supply voltage delta (absolute value)(5)
11
V
| VBIAS–
VRESET |
Supply voltage delta (absolute value)(6)
34
V
Input voltage for other inputs LPSDR(2)
–0.5
VDD + 0.5
V
Input voltage for other inputs SubLVDS(2) (7)
–0.5
VDDI +
0.5
V
| VID |
SubLVDS input differential voltage (absolute value)(7)
810
mV
IID
SubLVDS input differential current
10
mA
ƒclock
Clock frequency for low speed interface LS_CLK
130
MHz
ƒclock
Clock frequency for high speed interface DCLK
620
MHz
–20
90
°C
–40
90
°C
TARRAY and
TWINDOW
Environmental
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
electrode(2) (3)
Temperature – operational
(8)
Temperature – non-operational(8)
TDP
Dew Point Temperature - operating and non-operating (noncondensing)
81
°C
|TDELTA|
Absolute Temperature delta between any point on the window edge
and the ceramic test point TP1(9)
30
°C
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
All voltage values are with respect to the ground terminals (VSS). The following power supplies are all required to operate the DMD:
VDD, VDDI, VOFFSET, VBIAS, and VRESET. All VSS connections are also required.
VOFFSET supply transients must fall within specified voltages.
Exceeding the recommended allowable absolute voltage difference between VDDI and VDD may result in excessive current draw.
Exceeding the recommended allowable absolute voltage difference between VBIAS and VOFFSET may result in excessive current
draw.
Exceeding the recommended allowable absolute voltage difference between VBIAS and VRESET may result in excessive current
draw.
This maximum input voltage rating applies when each input of a differential pair is at the same voltage potential. Sub-LVDS differential
inputs must not exceed the specified limit or damage may result to the internal termination resistors.
The highest temperature of the active array (as calculated by the Section 7.6) or of any point along the Window Edge as defined in
Figure 7-1. The locations of thermal test points TP2, TP3, TP4, and TP5 in Figure 7-1 are intended to measure the highest window
edge temperature. If a particular application causes another point on the window edge to be at a higher temperature, that point should
be used.
Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in
Figure 7-1. The window test points TP2, TP3, TP4, and TP5 shown in Figure 7-1 are intended to result in the worst case delta. If a
particular application causes another point on the window edge to result in a larger delta temperature, that point should be used.
6.2 Storage Conditions
applicable for the DMD as a component or non-operational in a system
8
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TDMD
DMD storage temperature
MAX
UNIT
–40
85
°C
24
°C
36
°C
6
Months
(non-condensing)(1)
TDP-AVG
Average dew point temperature,
TDP-ELR
Elevated dew point temperature range, (non-condensing)(2)
CTELR
Cumulative time in elevated dew point temperature range
(1)
(2)
MIN
28
The average over time (including storage and operating) that the device is not in the elevated dew point temperature range.
Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total
cumulative time of CTELR.
6.3 ESD Ratings
V(ESD)
(1)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
VALUE
UNIT
±2000
V
JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
6.4 Recommended Operating Conditions
Over operating free-air temperature range (unless otherwise noted)(1) (2) (3)
SUPPLY VOLTAGE
MIN
NOM
MAX
UNIT
RANGE(4)
VDD
Supply voltage for LVCMOS core logic
Supply voltage for LPSDR low-speed interface
1.7
1.8
1.95
V
VDDI
Supply voltage for SubLVDS receivers
1.7
1.8
1.95
V
VOFFSET
Supply voltage for HVCMOS and micromirror
VBIAS
Supply voltage for mirror electrode
VRESET
Supply voltage for micromirror electrode
|VDDI–VDD|
Supply voltage delta (absolute value)(6)
electrode(5)
9.5
10
10.5
V
17.5
18
18.5
V
–14.5
–14
–13.5
V
0.3
V
|VBIAS–VOFFSET|
Supply voltage delta (absolute
value)(7)
10.5
V
|VBIAS–VRESET|
Supply voltage delta (absolute value)(8)
33
V
120
MHz
300
540
MHz
44%
56%
CLOCK FREQUENCY
ƒclock
Clock frequency for low speed interface LS_CLK(9)
ƒclock
DCLK(10)
Clock frequency for high speed interface
Duty cycle distortion DCLK
108
SUBLVDS INTERFACE(10)
| VID |
SubLVDS input differential voltage (absolute value) Figure 6-8,
Figure 6-9
150
250
350
mV
VCM
Common mode voltage Figure 6-8, Figure 6-9
700
900
1100
mV
VSUBLVDS
SubLVDS voltage Figure 6-8, Figure 6-9
575
1225
mV
ZLINE
Line differential impedance (PWB/trace)
90
100
110
Ω
ZIN
Internal differential termination resistance Figure 6-10
80
100
120
Ω
100-Ω differential PCB trace
6.35
152.4
0
40 to
70(13)
Array Temperature - short-term operational, 25 hr max(12) (15)
–20
-10
Array Temperature - short-term operational, 500 hr max(12) (15)
–10
0
Array Temperature – short-term operational, 500 hr max(12) (15)
70
75
mm
ENVIRONMENTAL
Array Temperature – long-term operational(11) (12) (13) (14)
TARRAY
°C
|TDELTA|
Absolute Temperature difference between any point on the window
edge and the ceramic test point TP1 (16)
15
°C
TWINDOW
Window Temperature – operational(11) (17)
90
°C
24
°C
TDP-AVG
Average dew point temperature
(non-condensing)(18)
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MIN
TDP-ELR
Elevated dew point temperature range (non-condensing)(19)
CTELR
Cumulative time in elevated dew point temperature range
ILLUV
Illumination wavelengths < 420 nm (11)
ILLVIS
Illumination wavelengths between 420 nm and 700 nm
ILLIR
Illumination wavelengths > 700 nm
ILLθ
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(12)
(13)
(14)
(15)
(16)
(17)
(18)
(19)
MAX
UNIT
36
°C
6
Months
0.68 mW/cm2
Thermally limited
10 mW/cm2
angle(20)
55
degrees
The following power supplies are all required to operate the DMD: VDD, VDDI, VOFFSET, VBIAS, and VRESET. All VSS connections
are also required.
Section 6.4 are applicable after the DMD is installed in the final product.
The functional performance of the device specified in this data sheet is achieved when operating the device within the limits defined by
the Section 6.4. No level of performance is implied when operating the device above or below the Section 6.4 limits.
All voltage values are with respect to the ground pins (VSS).
VOFFSET supply transients must fall within specified max voltages.
To prevent excess current, the supply voltage delta |VDDI – VDD| must be less than specified limit.
To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified limit.
To prevent excess current, the supply voltage delta |VBIAS – VRESET| must be less than specified limit.
LS_CLK must run as specified to ensure internal DMD timing for reset waveform commands.
Refer to the SubLVDS timing requirements in Section 6.7.
Simultaneous exposure of the DMD to the maximum Section 6.4 for temperature and UV illumination will reduce device lifetime.
The array temperature cannot be measured directly and must be computed analytically from the temperature measured at test point 1
(TP1) shown in Figure 7-1 and the Package Thermal Resistance using Section 7.6.
Per Figure 6-1, the maximum operational array temperature should be derated based on the micromirror landed duty cycle that the
DMD experiences in the end application. Refer to Section 7.7 for a definition of micromirror landed duty cycle.
Long-term is defined as the usable life of the device
Short-term is the total cumulative time over the useful life of the device.
Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge shown in Figure
7-1. The window test points TP2, TP3, TP4, and TP5 shown in Figure 7-1 are intended to result in the worst case delta temperature. If
a particular application causes another point on the window edge to result in a larger delta temperature, that point should be used.
Window temperature is the highest temperature on the window edge shown in Figure 7-1. The locations of thermal test points TP2,
TP3, TP4, and TP5 in Figure 7-1 are intended to measure the highest window edge temperature. If a particular application causes
another point on the window edge to be at a higher temperature, that point should be used.
The average over time (including storage and operating) that the device is not in the elevated dew point temperature range.
Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total
cumulative time of CTELR.
The maximum marginal ray angle of the incoming illumination light at any point in the micromirror array, including Pond of Micromirrors
(POM), should not exceed 55 degrees from the normal to the device array plane. The device window aperture has not necessarily
been designed to allow incoming light at higher maximum angles to pass to the micromirrors, and the device performance has not
been tested nor qualified at angles exceeding this. Illumination light exceeding this angle outside the micromirror array (including POM)
will contribute to thermal limitations described in this document, and may negatively affect lifetime.
Max Recommended Array Temperature –
Operational (°C)
(20)
Illumination marginal ray
NOM
28
80
70
60
50
40
30
0/100 5/95 10/90 15/85 20/80 25/75 30/70 35/65 40/60 45/55 50/50
100/0
95/5
90/10
85/15
80/20
75/25
70/30
65/35
Micromirror Landed Duty Cycle
60/40
55/45
D001
Figure 6-1. Max Recommended Array Temperature – Derating Curve
10
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6.5 Thermal Information
DLP4710LC
THERMAL
METRIC(1)
FQL (LGA)
UNIT
100 PINS
Thermal resistance
(1)
Active area to test point 1 (TP1)(1)
1.1
°C/W
The DMD is designed to conduct absorbed and dissipated heat to the back of the package. The cooling system must be capable of
maintaining the package within the temperature range specified in the Section 6.4. The total heat load on the DMD is largely driven by
the incident light absorbed by the active area; although other contributions include light energy absorbed by the window aperture and
electrical power dissipation of the array. Optical systems should be designed to minimize the light energy falling outside the window
clear aperture since any additional thermal load in this area can significantly degrade the reliability of the device.
6.6 Electrical Characteristics
Over operating free-air temperature range (unless otherwise noted)(1)
PARAMETER
TEST CONDITIONS(2)
MIN
TYP
MAX
UNIT
CURRENT
IDD
Supply current: VDD(3) (4)
IDDI
Supply current: VDDI(3) (4)
IOFFSET
Supply current: VOFFSET(5) (6)
IBIAS
Supply current: VBIAS(5) (6)
IRESET
Supply current: VRESET(6)
VDD = 1.95 V
260
VDD = 1.8 V
180
VDDI = 1.95 V
62
VDDI = = 1.8 V
40
VOFFSET = 10.5 V
7.4
VOFFSET = 10 V
6.3
VBIAS = 18.5 V
1.1
VBIAS = 18 V
0.9
VRESET = –14.5 V
5.4
VRESET = –14 V
4.4
mA
mA
mA
mA
mA
POWER(7)
PDD
(4)
Supply power dissipation: VDD(3) VDD = 1.95 V
VDD = 1.8 V
324
507
PDDI
Supply power dissipation: VDDI(3) VDDI = 1.95 V
(4)
VDD = 1.8 V
72
POFFSET
Supply power dissipation:
VOFFSET(5) (6)
VOFFSET = 10.5 V
PBIAS
Supply power dissipation:
VBIAS(5) (6)
VBIAS = 18.5 V
PRESET
Supply power dissipation:
VRESET(6)
VRESET = –14.5 V
PTOTAL
Supply power dissipation: Total
120.9
77.7
VOFFSET = 10 V
63
20.35
VBIAS = 18 V
16.2
78.3
VRESET = –14 V
61.6
536.8
804.25
mW
mW
mW
mW
mW
mW
LPSDR INPUT(8)
VIH(DC)
DC input high voltage(9)
VIL(DC)
DC input low voltage(9)
voltage(9)
VIH(AC)
AC input high
VIL(AC)
AC input low voltage(9)
∆VT
Hysteresis ( VT+ – VT– )
Figure 6-10
IIL
Low–level input current
VDD = 1.95 V; VI = 0 V
IIH
High–level input current
VDD = 1.95 V; VI = 1.95 V
LPSDR
VOH
0.7 × VDD
VDD + 0.3
V
–0.3
0.3 × VDD
V
0.8 × VDD
VDD + 0.3
V
–0.3
0.2 × VDD
V
0.1 × VDD
0.4 × VDD
–100
V
nA
100
nA
OUTPUT(10)
DC output high voltage
IOH = –2 mA
0.8 × VDD
V
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PARAMETER
VOL
TEST CONDITIONS(2)
MIN
TYP
MAX
UNIT
DC output low voltage
IOL = 2 mA
0.2 × VDD
V
Input capacitance LPSDR
ƒ = 1 MHz
10
pF
CAPACITANCE
CIN
Input capacitance SubLVDS
ƒ = 1 MHz
20
pF
COUT
Output capacitance
ƒ = 1 MHz
10
pF
CRESET
Reset group capacitance
ƒ = 1 MHz; (1080 × 240)
micromirrors
450
pF
400
(1)
(2)
(3)
(4)
(5)
(6)
(7)
Device electrical characteristics are over Recommended Operating Conditions unless otherwise noted.
All voltage values are with respect to the ground pins (VSS).
To prevent excess current, the supply voltage delta |VDDI – VDD| must be less than specified limit.
Supply power dissipation based on non–compressed commands and data.
To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified limit.
Supply power dissipation based on 3 global resets in 200 µs.
The following power supplies are all required to operate the DMD: VDD, VDDI, VOFFSET, VBIAS, VRESET. All VSS connections are
also required.
(8) LPSDR specifications are for pins LS_CLK and LS_WDATA.
(9) Low-speed interface is LPSDR and adheres to the Electrical Characteristics and AC/DC Operating Conditions table in JEDEC
Standard No. 209B, Low-Power Double Data Rate (LPDDR) JESD209B.
(10) LPSDR specification is for pin LS_RDATA.
6.7 Timing Requirements
Device electrical characteristics are over Section 6.4 unless otherwise noted.
MIN
NOM
MAX
UNIT
1
3
V/ns
(70% to 20%) × VDD, Figure 6-3
1
3
V/ns
(20% to 80%) × VDD, Figure 6-3
0.25
(80% to 20%) × VDD, Figure 6-3
0.25
LPSDR
Rise slew rate(1)
tr
rate(1)
tƒ
Fall slew
tr
Rise slew rate(2)
rate(2)
(30% to 80%) × VDD, Figure 6-3
V/ns
tƒ
Fall slew
tc
Cycle time LS_CLK,
Figure 6-2
7.7
V/ns
tW(H)
Pulse duration LS_CLK high
50% to 50% reference points, Figure
6-2
3.1
ns
tW(L)
Pulse duration LS_CLK low
50% to 50% reference points, Figure
6-2
3.1
ns
tsu
Setup time
LS_WDATA valid before LS_CLK ↑,
Figure 6-2
1.5
ns
th
Hold time
LS_WDATA valid after LS_CLK ↑,
Figure 6-2
1.5
ns
tWINDOW
Window time(1) (3)
Setup time + Hold time, Figure 6-2
3.0
ns
tDERATING
Window time derating(1) (3)
For each 0.25 V/ns reduction in slew
rate below 1 V/ns, Figure 6-5
tr
Rise slew rate
20% to 80% reference points, Figure
6-4
0.7
1
V/ns
tƒ
Fall slew rate
80% to 20% reference points, Figure
6-4
0.7
1
V/ns
tc
Cycle time DCLK,
Figure 6-6
1.79
1.85
tW(H)
Pulse duration DCLK high
50% to 50% reference points, Figure
6-6
0.79
ns
tW(L)
Pulse duration DCLK low
50% to 50% reference points, Figure
6-6
0.79
ns
tsu
Setup time
D(0:7) valid before
DCLK ↑ or DCLK ↓, Figure 6-6
8.3
0.35
ns
ns
SubLVDS
12
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MIN
th
Hold time
D(0:7) valid after
DCLK ↑ or DCLK ↓, Figure 6-6
tWINDOW
Window time
Setup time + Hold time, Figure 6-6,
Figure 6-7
tLVDS-
Power-up receiver(4)
ENABLE+REFGEN
(1)
(2)
(3)
(4)
NOM
MAX
3.0
UNIT
ns
2000
ns
Specification is for LS_CLK and LS_WDATA pins. Refer to LPSDR input rise slew rate and fall slew rate in Figure 6-3.
Specification is for DMD_DEN_ARSTZ pin. Refer to LPSDR input rise and fall slew rate in Figure 6-3 .
Window time derating example: 0.5-V/ns slew rate increases the window time by 0.7 ns, from 3 to 3.7 ns.
Specification is for SubLVDS receiver time only and does not take into account commanding and latency after commanding.
tc
tw(H)
LS_CLK
50%
tw(L)
50%
50%
th
tsu
LS_ WDATA
50%
50%
twindow
Low-speed interface is LPSDR and adheres to the Section 6.6 and AC/DC Operating Conditions table in JEDEC Standard No. 209B,
Low Power Double Data Rate (LPDDR) JESD209B.
Figure 6-2. LPSDR Switching Parameters
LS_CLK, LS_WDATA
DMD_DEN_ARSTZ
1.0 * VDD
1.0 * VDD
0.8 * VDD
0.7 * VDD
VIH(AC)
VIH(DC)
0.3 * VDD
0.2 * VDD
VIL(DC)
VIL(AC)
0.8 * VDD
0.2 * VDD
0.0 * VDD
0.0 * VDD
tr
tf
tr
tf
Figure 6-3. LPSDR Input Rise and Fall Slew Rate
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VDCLK_P , VDCLK_N
VD_P(0:7) , VD_N(0:7)
1.0 * VID
0.8 * VID
VCM
0.2 * VID
0.0 * VID
tr
tf
Figure 6-4. SubLVDS Input Rise and Fall Slew Rate
VIH MIN
LS_CLK Midpoint
VIL MAX
tSU
tH
VIH MIN
LS_WDATA Midpoint
VIL MAX
tWINDOW
VIH MIN
Midpoint
LS_CLK
VIL MAX
tDERATING
tSU
tH
VIH MIN
Midpoint
LS_WDATA
VIL MAX
tWINDOW
Figure 6-5. Window Time Derating Concept
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tc
tw(L)
DCLK _ P
DCLK _ N
tw(H)
50%
50%
50%
th
tsu
D_P (0:7)
D_N(0:7)
50%
50%
twindow
Figure 6-6. SubLVDS Switching Parameters
High Speed Training Scan Window
tc
DCLK _ P
DCLK _ N
¼ tc
¼ tc
D_P (0:7)
D_N(0:7)
Note: Refer to Section 7.3.3 for details.
Figure 6-7. High-Speed Training Scan Window
(VIP + V IN) / 2
DCLK _P , D_P(0:7)
SubLVDS
Receiver
VID
DCLK _N , D_N(0:7)
VCM
VIP
VIN
Figure 6-8. SubLVDS Voltage Parameters
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1.225V
V SubLVDS max = V CM max + | 1/2 * V ID max |
VCM
VID
VSubLVDS min = VCM min – | 1/2 * VID max |
0.575V
Figure 6-9. SubLVDS Waveform Parameters
DCLK _P , D_P(0:7)
ESD
Internal
Termination
SubLVDS
Receiver
DCLK _N , D_N(0:7)
ESD
Figure 6-10. SubLVDS Equivalent Input Circuit
Not to Scale
VIH
VT+
Δ VT
VT-
VIL
LS_CLK
LS_WDATA
Figure 6-11. LPSDR Input Hysteresis
LS_CLK
LS_WDATA
Stop Start
tPD
LS_RDATA
Acknowledge
Figure 6-12. LPSDR Read Out
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Timing specification reference point
Device pin
output under test
Tester channel
CL
See Timing for more information.
Figure 6-13. Test Load Circuit for Output Propagation Measurement
6.8 Switching Characteristics
Over operating free-air temperature range (unless otherwise noted).(1)
PARAMETER
tPD
TEST CONDITIONS
Output propagation, Clock to Q, rising
edge of LS_CLK input to LS_RDATA
output. (figure 12 xref)
MIN
CL = 45 pF
MAX
15
Slew rate, LS_RDATA
UNIT
ns
0.5
Output duty cycle distortion, LS_RDATA
(1)
TYP
V/ns
40%
60%
Device electrical characteristics are over Recommended Operating Conditions unless otherwise noted.
6.9 System Mounting Interface Loads
PARAMETER
MIN
Thermal interface area (see Figure 6-14)
Maximum system mounting interface
Clamping and electrical interface area (see
load to be applied to the:
Figure 6-14)
NOM
MAX
UNIT
62
N
110
N
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Datum 'A' area (3 places)
Datum 'E' area (1 place)
Thermal Interface Area
Clamping and Electrical Interface Area
Figure 6-14. System Interface Loads
6.10 Physical Characteristics of the Micromirror Array
PARAMETER
ε
(1)
18
VALUE
UNIT
Number of active columns See Figure 6-15
1920
micromirrors
Number of active rows
See Figure 6-15
1080
micromirrors
Micromirror (pixel) pitch
See Figure 6-16
5.4
µm
Micromirror active array
width
Micromirror pitch × number of active columns; see Figure 6-15
10.368
mm
Micromirror active array
height
Micromirror pitch × number of active rows; see Figure 6-15
5.832
mm
Micromirror active border
Pond of micromirror (POM)(1)
20
micromirrors/side
The structure and qualities of the border around the active array includes a band of partially functional micromirrors called the POM.
These micromirrors are structurally and/or electrically prevented from tilting toward the bright or ON state, but still require an electrical
bias to tilt toward OFF.
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Width .
Mirror 1079
Mirror 1078
Mirror 1077
Mirror 1076
1920 × 1080 mirrors
Height
Mirror 3
Mirror 2
Mirror 1
Mirror 1919
Mirror 1918
Illumination
Mirror 1917
Mirror 1916
Mirror 3
Mirror 2
Mirror 1
Mirror 0
Mirror 0
Figure 6-15. Micromirror Array Physical Characteristics
H°
H°
H°
H°
Figure 6-16. Mirror (Pixel) Pitch
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6.11 Micromirror Array Optical Characteristics
PARAMETER
Micromirror tilt angle
TEST CONDITIONS
DMD landed
Micromirror tilt angle tolerance(2) (3) (4) (5)
Micromirror tilt direction (6) (7)
180
270
Typical performance
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(12)
(13)
(14)
(15)
(16)
20
degree
degree
3
10
Gray 10 Screen (12)
0
Bright pixel(s) in the POM (13) Gray 10 Screen (12)
1
Dark pixel(s) in the active
area (14)
White Screen
4
Adjacent pixel(s) (15)
Any Screen
0
Unstable pixel(s) in active
area (16)
Any Screen
0
(11)
(1)
(2)
(3)
(4)
1
UNIT
degree
1.4
Landed OFF state
Typical performance
MAX
17
Landed ON state
Micromirror switching time(9)
Image
performance(10)
NOM
–1.4
Micromirror crossover time(8)
Bright pixel(s) in active area
MIN
state(1)
µs
micromirrors
Measured relative to the plane formed by the overall micromirror array.
Additional variation exists between the micromirror array and the package datums.
Represents the landed tilt angle variation relative to the nominal landed tilt angle.
Represents the variation that can occur between any two individual micromirrors, located on the same device or located on different
devices.
For some applications, it is critical to account for the micromirror tilt angle variation in the overall system optical design. With some
system optical designs, the micromirror tilt angle variation within a device may result in perceivable non-uniformities in the light field
reflected from the micromirror array. With some system optical designs, the micromirror tilt angle variation between devices may result
in colorimetry variations, system efficiency variations, or system contrast variations.
When the micromirror array is landed (not parked), the tilt direction of each individual micromirror is dictated by the binary contents of
the CMOS memory cell associated with each individual micromirror. A binary value of 1 results in a micromirror landing in the ON state
direction. A binary value of 0 results in a micromirror landing in the OFF state direction. See Figure 6-17.
Micromirror tilt direction is measured as in a typical polar coordinate system: Measuring counter-clockwise from a 0° reference which is
aligned with the +X Cartesian axis.
The time required for a micromirror to nominally transition from one landed state to the opposite landed state.
The minimum time between successive transitions of a micromirror.
Conditions of Acceptance: All DMD image quality returns will be evaluated using the following projected image test conditions:
Test set degamma shall be linear
Test set brightness and contrast shall be set to nominal
The diagonal size of the projected image shall be a minimum of 20 inches
The projections screen shall be 1X gain
The projected image shall be inspected from a 38 inch minimum viewing distance
The image shall be in focus during all image quality tests
Bright pixel definition: A single pixel or mirror that is stuck in the ON position and is visibly brighter than the surrounding pixels
Gray 10 screen definition: All areas of the screen are colored with the following settings:
Red = 10/255
Green = 10/255
Blue = 10/255
POM definition: Rectangular border of off-state mirrors surrounding the active area
Dark pixel definition: A single pixel or mirror that is stuck in the OFF position and is visibly darker than the surrounding pixels
Adjacent pixel definition: Two or more stuck pixels sharing a common border or common point, also referred to as a cluster
Unstable pixel definition: A single pixel or mirror that does not operate in sequence with parameters loaded into memory. The unstable
pixel appears to be flickering asynchronously with the image
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Off-state
light path
(1079, 1919)
Off-state
landed edge
(0, 0)
Tilted axis of
pixel rotation
On-state
landed edge
Incident
illumination
light path
Figure 6-17. Landed Pixel Orientation and Tilt
6.12 Window Characteristics
PARAMETER(1)
MIN
Window material designation
Window refractive index
Window
MAX
UNIT
Corning Eagle XG
at wavelength 546.1 nm
1.5119
aperture(2)
See (2)
Illumination overfill(3)
See (3)
Window transmittance, single-pass
through both surfaces and glass
Minimum within the wavelength range
420 to 680 nm. Applies to all angles 0°
to 30° AOI.
97%
Window Transmittance, single-pass
through both surfaces and glass
Average over the wavelength range 420
to 680 nm. Applies to all angles 30° to
45° AOI.
97%
(1)
(2)
(3)
NOM
See Optical Interface and System Image Quality Considerations for more information.
See the package mechanical characteristics for details regarding the size and location of the window aperture.
The active area of the DLP4710LC device is surrounded by an aperture on the inside of the DMD window surface that masks
structures of the DMD device assembly from normal view. The aperture is sized to anticipate several optical conditions. Overfill light
illuminating the area outside the active array can scatter and create adverse effects to the performance of an end application using
the DMD. The illumination optical system should be designed to limit light flux incident outside the active array to less than 10% of the
average flux level in the active area. Depending on the particular system's optical architecture and assembly tolerances, the amount of
overfill light on the outside of the active array may cause system performance degradation.
SPACER
6.13 Chipset Component Usage Specification
The DLP4710 is a component of one or more TI ®DLP chipsets. Reliable function and operation of the DLP4710
requires that it be used in conjunction with the other components of the applicable DLP chipset, including
those components that contain or implement TI DMD control technology. TI DMD control technology is the TI
technology and devices for operating or controlling a DLP DMD.
Note
TI assumes no responsibility for image quality artifacts or DMD failures caused by optical system
operating conditions exceeding limits described previously.
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6.14 Software Requirements
Note
The DLP4710 DMD has mandatory software requirements. Refer to Software Requirements for TI
TRP Digital Micromirror Devices application report for additional information. Failure to
use the specified software will result in failure at power up.
®DLP ™Pico
22
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7 Detailed Description
7.1 Overview
The DLP4710LC device is a 0.47 inch diagonal spatial light modulator of aluminum micromirrors. Pixel array size
is 1920 columns by 1080 rows in a square grid pixel arrangement. The electrical interface is Sub Low Voltage
Differential Signaling (SubLVDS) data.
DLP4710LC device is part of the chipset comprising the DLP4710LC DMD, DLPC3479 controller, and
DLPA3000 or DLPA3005 PMIC/LED driver. To ensure reliable operation, the DLP4710LC DMD must always
be used with either the DLPC3479 controller and the DLPA3000 or DLPA3005 PMIC/LED drivers.
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7.2 Functional Block Diagram
24
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Note
Simplified for clarity.
7.3 Feature Description
7.3.1 Power Interface
The power management IC, DLPA3000/DLPA3005, contains three regulated DC supplies for the DMD reset
circuitry: VBIAS, VRESET and VOFFSET, as well as the 2 regulated DC supplies for the DLPC3479 controller.
7.3.2 Low-Speed Interface
The Low Speed Interface handles instructions that configure the DMD and control reset operation. LS_CLK is
the low–speed clock, and LS_WDATA is the low speed data input.
7.3.3 High-Speed Interface
The purpose of the high-speed interface is to transfer pixel data rapidly and efficiently, making use of high speed
DDR transfer and compression techniques to save power and time. The high-speed interface is composed of
differential SubLVDS receivers for inputs, with a dedicated clock.
7.3.4 Timing
The data sheet provides timing test results at the device pin. For output timing analysis, the tester pin electronics
and its transmission line effects must be considered. Figure 6-13 shows an equivalent test load circuit for
the output under test. Timing reference loads are not intended as a precise representation of any particular
system environment or depiction of the actual load presented by a production test. TI recommends that system
designers use IBIS or other simulation tools to correlate the timing reference load to a system environment. The
load capacitance value stated is intended for characterization and measurement of AC timing signals only. This
load capacitance value does not indicate the maximum load the device is capable of driving.
7.4 Device Functional Modes
DMD functional modes are controlled by the DLPC3479 controller. See the DLPC3479 controller data sheet or
contact a TI applications engineer.
7.5 Optical Interface and System Image Quality Considerations
Note
TI assumes no responsibility for image quality artifacts or DMD failures caused by optical system
operating conditions exceeding limits described previously.
7.5.1 Optical Interface and System Image Quality
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment
optical performance involves making trade-offs between numerous component and system design parameters.
Optimizing system optical performance and image quality strongly relate to optical system design parameter
trades. Although it is not possible to anticipate every conceivable application, projector image quality and optical
performance is contingent on compliance to the optical system operating conditions described in the following
sections.
7.5.1.1 Numerical Aperture and Stray Light Control
The angle defined by the numerical aperture of the illumination and projection optics at the DMD optical area
is typically the same. Ensure this angle does not exceed the nominal device micromirror tilt angle unless
appropriate apertures are added in the illumination or projection pupils to block out flat-state and stray light from
the projection lens. The micromirror tilt angle defines DMD capability to separate the "ON" optical path from
any other light path, including undesirable flat–state specular reflections from the DMD window, DMD border
structures, or other system surfaces near the DMD such as prism or lens surfaces. If the numerical aperture
exceeds the micromirror tilt angle, or if the projection numerical aperture angle is more than two degrees larger
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than the illumination numerical aperture angle (and vice versa), contrast degradation and objectionable artifacts
in the display border and/or active area may occur.
7.5.1.2 Pupil Match
The optical and image quality specifications assume that the exit pupil of the illumination optics is nominally
centered within 2° of the entrance pupil of the projection optics. Misalignment of pupils can create objectionable
artifacts in the display border and/or active area. These artifacts may require additional system apertures to
control, especially if the numerical aperture of the system exceeds the pixel tilt angle.
7.5.1.3 Illumination Overfill
The active area of the device is surrounded by an aperture on the inside DMD window surface that masks
structures of the DMD chip assembly from normal view, and is sized to anticipate several optical operating
conditions. Overfill light illuminating the window aperture can create artifacts from the edge of the window
aperture opening and other surface anomalies that may be visible on the screen. Be sure to design an
illumination optical system that limits light flux incident anywhere on the window aperture from exceeding
approximately 10% of the average flux level in the active area. Depending on the particular optical architecture,
overfill light may require further reduction below the suggested 10% level in order to be acceptable.
7.6 Micromirror Array Temperature Calculation
2X 12.89
TP2
Off-state
Light
TP4
TP5
2X 5.50
TP3
Window Edge
(4 surfaces)
TP4
Illumination
Direction
TP3 (TP2)
TP5
TP1
12.70
TP1
2.00
Figure 7-1. DMD Thermal Test Points
Micromirror array temperature can be computed analytically from measurement points on the outside of the
package, the ceramic package thermal resistance, the electrical power dissipation, and the illumination heat
load. The relationship between micromirror array temperature and the reference ceramic temperature is provided
by the following equations:
26
TARRAY = TCERAMIC + (QARRAY × RARRAY–TO–CERAMIC)
(1)
QARRAY = QELECTRICAL + QILLUMINATION
(2)
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QILLUMINATION = (CL2W × SL)
(3)
where
• TARRAY = Computed DMD array temperature (°C)
• TCERAMIC = Measured ceramic temperature (°C), TP1 location in Figure 7-1
• RARRAY–TO–CERAMIC = DMD package thermal resistance from array to outside ceramic (°C/W) specified in
Section 6.5
• QARRAY = Total DMD power; electrical plus absorbed (calculated) (W)
• QELECTRICAL = Nominal DMD electrical power dissipation (W)
• CL2W = Conversion constant for screen lumens to absorbed optical power on the DMD (W/lm) specified below
• SL = Measured ANSI screen lumens (lm)
The electrical power dissipation of the DMD varies and depends on the voltages, data rates and operating
frequencies. Use a nominal electrical power dissipation of 0.25 W to calculate array temperature. Absorbed
optical power from the illumination source varies and depends on the operating state of the micromirrors and
the intensity of the light source. Equations shown above are valid for a 1-chip DMD system with total projection
efficiency through the projection lens from DMD to the screen of 87%.
The conversion constant CL2W is based on the DMD micromirror array characteristics. The conversion constant
assumes a spectral efficiency of 300 lm/W for the projected light and illumination distribution of 83.7% on the
DMD active array, and 16.3% on the DMD array border and window aperture. The conversion constant is
calculated to be 0.00266 W/lm.
The following is a sample calculation for typical projection application:
TCERAMIC = 55°C (measured)
SL = 1500 lm (measured)
QELECTRICAL = 0.25 W
CL2W = 0.00266 W/lm
QARRAY = 0.25 W + (0.00266 W/lm × 1500 lm) = 4.24 W
TARRAY = 55°C + (4.24 W × 1.1°C/W) = 59.66°C
7.7 Micromirror Landed-On/Landed-Off Duty Cycle
7.7.1 Definition of Micromirror Landed-On and Landed-Off Duty Cycle
The micromirror landed-on/landed-off duty cycle (landed duty cycle) denotes the amount of time (as a
percentage) that an individual micromirror is landed in the ON state versus the amount of time the same
micromirror is landed in the OFF state.
As an example, a landed duty cycle of 75/25 indicates that the referenced pixel is in the ON state 75% of the
time (and in the OFF state 25% of the time), whereas 25/75 indicates that the pixel is in the OFF state 75% of
the time. Likewise, 50/50 indicates that the pixel is ON 50% of the time and OFF 50% of the time.
When assessing landed duty cycle, the time spent switching from the current state to the opposite state is
considered negligible and is thus ignored.
Because a micromirror can only be landed in one state or the other (ON or OFF), the two numbers (percentages)
nominally add to 100.In practice, image processing algorithms in the DLP chipset can result a total of less that
100.
7.7.2 Landed Duty Cycle and Useful Life of the DMD
Knowing the long-term average landed duty cycle (of the end product or application) is important because
subjecting all (or a portion) of the DMD’s micromirror array (also called the active array) to an asymmetric landed
duty cycle for a prolonged period of time can reduce the DMD’s usable life.
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It is the symmetry or asymmetry of the landed duty cycle that is relevant. The symmetry of the landed duty cycle
is determined by how close the two numbers (percentages) are to being equal. For example, a landed duty cycle
of 50/50 is perfectly symmetrical whereas a landed duty cycle of 100/0 or 0/100 is perfectly asymmetrical.
7.7.3 Landed Duty Cycle and Operational DMD Temperature
Operational DMD temperature and landed duty cycle interact to affect the usable life of the DMD. This interaction
can be used to reduce the impact that an asymmetrical landed duty cycle has on the useable life of the DMD.
Figure 6-1 describes this relationship. The importance of this curve is that:
•
•
•
All points along this curve represent the same usable life.
All points above this curve represent lower usable life (and the further away from the curve, the lower the
usable life).
All points below this curve represent higher usable life (and the further away from the curve, the higher the
usable life).
In practice, this curve specifies the maximum operating DMD temperature that the DMD should be operated at
for a give long-term average landed duty cycle.
7.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
During a given period of time, the landed duty cycle of a given pixel depends on the image content being
displayed by that pixel.
In the simplest case for example, when the system displays pure-white on a given pixel for a given time period,
that pixel operates very close to a 100/0 landed duty cycle during that time period. Likewise, when the system
displays pure-black, the pixel operates very close to a 0/100 landed duty cycle.
Between the two extremes (ignoring for the moment color and any image processing that may be applied to an
incoming image), the landed duty cycle tracks one-to-one with the gray scale value, as shown in Table 7-1.
Table 7-1. Grayscale
Value and Landed Duty
Cycle
Grayscale
Value
Nominal
Landed Duty
Cycle
0%
0/100
10%
10/90
20%
20/80
30%
30/70
40%
40/60
50%
50/50
60%
60/40
70%
70/30
80%
80/20
90%
90/10
100%
100/0
To account for color rendition (and continuing to ignore image processing for this example) requires knowing
both the color intensity (from 0% to 100%) for each constituent primary color (red, green, and/or blue) for the
given pixel as well as the color cycle time for each primary color, where color cycle time describes the total
percentage of the frame time that a given primary must be displayed in order to achieve the desired white point.
During a given period of time, the nominal landed duty cycle of a given pixel can be calculated as shown in
Equation 4:
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Landed Duty Cycle = (Red_Cycle_% × Red_Scale_Value) + (Green_Cycle_% × Green_Scale_Value) + (Blue_Cycle_%
×
Blue_Scale_Value)
(4)
where
•
•
•
Red_Cycle_% represents the percentage of the frame time that red displays to achieve the desired white
point
Green_Cycle_% represents the percentage of the frame time that green displays to achieve the desired white
point
Blue_Cycle_% represents the percentage of the frame time that blue displays to achieve the desired white
point
For example, assume that the ratio of red, green and blue color cycle times are as listed in Table 7-2 (in order
to achieve the desired white point) then the resulting nominal landed duty cycle for various combinations of red,
green, blue color intensities are as shown in Table 7-3.
Table 7-2. Example Landed Duty Cycle for Full-Color
Pixels
Red Cycle
Percentage
Green Cycle
Percentage
Blue Cycle
Percentage
50%
20%
30%
Table 7-3. Color Intensity Combinations
Red Scale
Value
Green Scale
Value
Blue Scale
Value
Nominal
Landed Duty
Cycle
0%
0%
0%
0/100
100%
0%
0%
50/50
0%
100%
0%
20/80
0%
0%
100%
30/70
12%
0%
0%
6/94
0%
35%
0%
7/93
0%
0%
60%
18/82
100%
100%
0%
70/30
0%
100%
100%
50/50
100%
0%
100%
80/20
12%
35%
0%
13/87
0%
35%
60%
25/75
12%
0%
60%
24/76
100%
100%
100%
100/0
The last factor to consider when estimating the landed duty cycle is any applied image processing. In the
DLPC34xx controller family, the two functions which influence the actual landed duty cycle are Gamma and
IntelliBright™, and bitplane sequencing rules.
Gamma is a power function of the form Output_Level = A × Input_LevelGamma, where A is a scaling factor that is
typically set to 1.
In the DLPC34xx controller family, gamma is applied to the incoming image data on a pixel-by-pixel basis. A
typical gamma factor is 2.2, which transforms the incoming data as shown in Figure 7-2.
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100
90
Output Level (%)
80
Gamma = 2.2
70
60
50
40
30
20
10
0
0
10
20
30
40
50
60
Input Level (%)
70
80
90
100
D002
Figure 7-2. Example of Gamma = 2.2
As shown in Figure 7-2, when the gray scale value of a given input pixel is 40% (before gamma is applied),
then gray scale value is 13% after gamma is applied. Because gamma has a direct impact on the displayed gray
scale level of a pixel, it also has a direct impact on the landed duty cycle of a pixel.
The IntelliBright algorithms content adaptive illumination control (CAIC) and local area brightness boost (LABB)
also apply transform functions on the gray scale level of each pixel.
But while amount of gamma applied to every pixel (of every frame) is constant (the exponent, gamma, is
constant), CAIC and LABB are both adaptive functions that can apply a different amounts of either boost or
compression to every pixel of every frame.
Consideration must also be given to any image processing which occurs before the DLPC3439 or DLPC3479
controller.
30
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8 Application and Implementation
8.1 Application Information
The DMDs are spatial light modulators which reflect incoming light from an illumination source to one of two
directions, with the primary direction being into a projection or collection optic. Each application is derived
primarily from the optical architecture of the system and the format of the data coming into the dual DLPC3479
controllers. The new high tilt pixel in the bottom-illuminated DMD increases brightness performance and enables
a smaller system footprint for thickness constrained applications. Applications of interest include
DMD power-up and power-down sequencing is strictly controlled by the DLPA3000/DLPA3005. Refer to
Power Supply Recommendations for power-up and power-down specifications. To ensure reliable operation,
the DLP4710LC DMD must always be used with two DLPC3479 controllers and a DLPA3000 or DLPA3005
PMIC/LED driver.
8.2 Typical Application
A pico-projector that can be used as an accessory to a smartphone, tablet or a laptop is a common application
when using a DLP4710LC DMD and two DLPC3479 devices. The two DLPC3479 devices in the pico-projector
receive images from a multimedia front end within the product as shown in Figure 8-1.
PROJ_ON
Microcontroller
Front End
MSP430
Tiva
PROJ_ON
SPI
Flash
GPIO_8 (Normal Park)
VCC_FLSH
SPI(4)
RESETZ
INTZ
LED_SEL(2)
SPI_1
PARKZ
SPI_0
HOST_IRQ
Focus stepper motor
VLED
DLPC3479
eDRAM
I2C
Current Sense
Illuminator
1.8 V
1.1 V for DLPC3479
VSPI
1.8 V for DMD and DLPC3479
VCC_INTF
BIAS, RST, OFS
3
SYSPWR
TRIG_IN
3DR
1.8 V
VIO
1.1 V
VCORE
Monochrome
(1)
Illumination
DLPA3000
TSTPT_4
TRIG_OUT1
GPIO_7
TRIG_OUT2
Sub-LVDS DATA (18)
CTRL
GPIO5
I2C_1
Image
Sync
GPIO6
I2C
I2C_0
Illumination
Optics
DLP4710LC
sd
DMD
RESETZ
INTZ
VCC_FLSH
Oscillator
DLPC3479
eDRAM
SPI Flash
SPI_0
VCC_INTF
Included in DLP® Chip Set
Non-DLP components
1.8 V
1.1 V
VIO
VCORE
LS RDATA
Sub-LVDS DATA (18)
Figure 8-1. Typical Application Diagram
8.2.1 Design Requirements
A pico-projector is created by using a DLP chip set comprised of a DLP4710 DMD, two DLPC3439 controllers
and a DLPA3000/DLPA3005 PMIC/LED driver. The DLPC3439 controllers do the digital image processing, the
DLPA3000/DLPA3005 provides the needed analog functions for the projector, and the DLP4710 DMD is the
display device for producing the projected image.
In addition to the three DLP chips in the chip set, other chips are needed. At a minimum a Flash part is needed
to store the software and firmware to control each DLPC3439 controller.
The illumination light that is applied to the DMD is typically from red, green, and blue LEDs. These are often
contained in three separate packages, but sometimes more than one color of LED die may be in the same
package to reduce the overall size of the pico-projector.
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For connecting the DLPC3439 controllers to the multimedia front end for receiving images, a 24-bit parallel
interface is used. An I2C interface should be connected to the multimedia front end for sending commands to
one of the DLPC3439 controllers for configuring the DLPC3439 controller for different features.
8.2.2 Detailed Design Procedure
For connecting the two DLPC3439 controllers, the DLPA3000/DLPA3005, and the DLP4710 DMD, see the
reference design schematic. When a circuit board layout is created from this schematic a very small circuit board
is possible. An example small board layout is included in the reference design data base. Layout guidelines
should be followed to achieve a reliable projector.
The optical engine that has the LED packages and the DMD mounted to it is typically supplied by an optical
OEM who specializes in designing optics for DLP projectors.
8.2.3 Application Curve
As the LED currents that are driven time-sequentially through the red, green, and blue LEDs are increased,
the brightness of the projector increases. This increase is somewhat non-linear, and the curve for typical white
screen lumens changes with LED currents is as shown in Figure 8-2. For the LED currents shown, it’s assumed
that the same current amplitude is applied to the red, green, and blue LEDs.
Figure 8-2. Luminance vs Current
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9 Power Supply Recommendations
The following power supplies are all required to operate the DMD: VDD, VDDI, VOFFSET, VBIAS, and VRESET.
All VSS connections are also required. DMD power-up and power-down sequencing is strictly controlled by the
DLPA3000/DLPA3005 devices.
Note
For reliable operation of the DMD, the following power supply sequencing requirements must be
followed. Failure to adhere to the prescribed power-up and power-down procedures may affect device
reliability. VDD, VDDI, VOFFSET, VBIAS, and VRESET power supplies have to be coordinated during
power-up and power-down operations. Failure to meet any of the below requirements will result in
a significant reduction in the DMD’s reliability and lifetime. Refer to Figure 23. VSS must also be
connected.
VDD, VDDI, VOFFSET, VBIAS, and VRESET power supplies have to be coordinated during power-up
and power-down operations. Failure to meet any of the below requirements will result in a significant
reduction in the DMD’s reliability and lifetime. Refer to Figure 23. VSS must also be connected.
9.1 DMD Power Supply Power-Up Procedure
•
•
•
•
•
During the power-up sequence, VDD and VDDI must always start and settle before VOFFSET, VBIAS, and
VRESET voltages are applied to the DMD.
During the power-up sequence, it is a strict requirement that the voltage difference between VBIAS and
VOFFSET must be within the specified limit shown in Section 6.4. Refer to Table 9-1 for the power-up
sequence, delay requirements.
During the power-up sequence, there is no requirement for the relative timing of VRESET with respect to
VBIAS and VOFFSET.
Power supply slew rates during the power-up sequence are flexible, provided that the transient voltage levels
follow the requirements specified in Section 6.1, in Section 6.4, and in Section 9.3.
During the power-up sequence, LPSDR input pins must not be driven high until after VDD/VDDI have settled
at operating voltages listed in Section 6.4.
9.2 DMD Power Supply Power-Down Procedure
•
•
•
•
•
The power-down sequence is the reverse order of the previous power-up sequence. During the power-down
sequence, VDD and VDDI must be supplied until after VBIAS, VRESET, and VOFFSET are discharged to
within 4 V of ground.
During the power-down sequence, it is a strict requirement that the voltage difference between VBIAS and
VOFFSET must be within the specified limit shown in Section 6.4.
During the power-down sequence, there is no requirement for the relative timing of VRESET with respect to
VBIAS and VOFFSET.
Power supply slew rates during the power-down sequence, are flexible, provided that the transient voltage
levels follow the requirements specified in Section 6.1, inSection 6.4, and in Section 9.3.
During the power-down sequence, LPSDR input pins must be less than VDD/VDDI specified in Section 6.4.
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9.3 Power Supply Sequencing Requirements
DLP Display Controller and
PMIC control start of DMD
operation
DRAWING NOT TO SCALE.
DETAILS OMITTED FOR CLARITY.
DLP Display Controller and PMIC
disable VBIAS, VOFFSET and
VRESET
Mirror Park
Sequence
Note 4
Power Off
VDD / VDDI
VDD / VDDI
VDD / VDDI VSS
VSS
VOFFSET
VOFFSET
9'' ” 92))6(7 < 6 V
VOFFSET
VBIAS < 4 V
VSS
Note 2
Note 3
Note 1
Note 2
VSS
ûV < Specification Limit
9'' ” 9%,$6 < 6 V
ûV < Specification Limit
VBIAS
ûV < Specification Limit
VBIAS
VBIAS
VOFFSET < 4 V
VSS
VSS
VRESET < 0.5 V
VSS
VSS
VRESET > - 4 V
VRESET
VRESET
VRESET
VDD
VDD
DMD_DEN_ARSTZ VSS
INITIALIZATION
LS_CLK
LS_WDATA
VSS
VDD
VDD
VSS
VSS
VID
VID
D_P(0:7), D_N(0:7)
DCLK_P, DCLK_N
VSS
VSS
A.
B.
C.
D.
DLP controller and PMIC controls start of DMD operation
Mirror park sequence starts
Mirror park sequence ends. DLP controller and PMIC disables VBIAS, VOFFSET, and VRESET.
Power off.
E.
F.
Refer to Table 9-1 and Figure 9-2 for critical power-up sequence delay requirements.
When system power is interrupted, the ASIC driver initiates hardware the power-down sequence, that disables VBIAS, VRESET
and VOFFSET after the micromirror park sequence is complete. Software the power-down sequence, disables VBIAS, VRESET, and
VOFFSET after the micromirror park sequence through software control.
To prevent excess current, the supply voltage delta |VBIAS – VRESET| must be less than specified limit shown in Section 6.4.
Drawing is not to scale and details are omitted for clarity.
G.
H.
Figure 9-1. Power Supply Sequencing Requirements (Power Up and Power Down)
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Table 9-1. Power-Up Sequence Delay Requirement
PARAMETER
MIN
MAX
2
UNIT
tDELAY
Delay requirement from VOFFSET power up to VBIAS power up
ms
VOFFSET
Supply voltage level during power–up sequence delay (see Figure 9-2)
6
V
VBIAS
Supply voltage level during power–up sequence delay (see Figure 9-2)
6
V
12 V
VOFFSET
8V
VDD ≤ VOFFSET < 6 V
4V
VSS
tDELAY
0V
VBIAS
20 V
16 V
12 V
8V
VDD ≤ VBIAS < 6 V
4V
VSS
A.
0V
Refer to Table 9-1 for VOFFSET and VBIAS supply voltage levels during power-up sequence delay.
Figure 9-2. Power-Up Sequence Delay Requirement
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10 Layout
10.1 Layout Guidelines
There are no specific layout guidelines for the DMD as typically DMD is connected using a board to board
connector to a flex cable. Flex cable provides the interface of data and Ctrl signals between the DLPC3439
controller and the DLP4710 DMD. For detailed layout guidelines refer to the layout design files. Some layout
guideline for the flex cable interface with DMD are:
•
•
•
•
•
•
Match lengths for the LS_WDATA and LS_CLK signals.
Minimize vias, layer changes, and turns for the HS bus signals. Refer Figure 10-1.
Minimum of two 220-nF decoupling capacitor close to VBIAS. Capacitor C3 and C10 in Figure 10-1.
Minimum of two 220-nF decoupling capacitor close to VRST. Capacitor C1 and C9 in Figure 10-1.
Minimum of two 220-nF decoupling capacitor close to VOFS. Capacitor C2 and C8 in Figure 10-1.
Minimum of four 220-nF decoupling capacitor close to VDDI and VDD. Capacitor C4, C5, C6 and C7 in
Figure 10-1.
10.2 Layout Example
Figure 10-1. Power Supply Connections
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11 Device and Documentation Support
11.1 Device Support
11.1.1 Third-Party Products Disclaimer
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.
11.1.2 Device Nomenclature
DLP4710A FQL
Package Type
Device Descriptor
Figure 11-1. Part Number Description
11.1.3 Device Markings
The device marking includes the legible character string GHJJJJK DLP4710AFQL. GHJJJJK is the lot trace
code. DLP4710AFQL is the device marking.
Two-dimensional matrix code
DMD part number and lot trace code
Lot Trace Code
GHJJJJK
DLP4710AFQL
Part Marking
Figure 11-2. DMD Marking Locations
11.2 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 11-1. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
DLP4710
Click here
Click here
Click here
Click here
Click here
DLPC3439
Click here
Click here
Click here
Click here
Click here
DLPA3000
Click here
Click here
Click here
Click here
Click here
DLPA3005
Click here
Click here
Click here
Click here
Click here
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11.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
11.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.5 Trademarks
Pico™, IntelliBright™, and TI E2E™ are trademarks of Texas Instruments.
DLP® is a registered trademark of Texas Instruments.
All trademarks are the property of their respective owners.
11.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.7 Glossary
TI Glossary
38
This glossary lists and explains terms, acronyms, and definitions.
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12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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11-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
(3)
Device Marking
Samples
(4/5)
(6)
DLP4710AFQL
ACTIVE
CLGA
FQL
100
80
RoHS & Green
NI/AU
N / A for Pkg Type
0 to 70
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of