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TPD1S414YZR

TPD1S414YZR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    UFBGA12

  • 描述:

    IC PWR SWITCH N-CHAN 1:1 12DSBGA

  • 数据手册
  • 价格&库存
TPD1S414YZR 数据手册
Sample & Buy Product Folder Support & Community Tools & Software Technical Documents TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 TPD1S414 USB Charger Overvoltage, Surge, and ESD Protection for VBUS Pin 1 Features 3 Description • The TPD1S414 device is a single-chip solution for a USB connector’s VBUS line protection. The bidirectional nFET switch ensures safe current flow in both charging and host mode while protecting the internal system circuits from any overvoltage conditions at the VBUS_CON pin. On the VBUS_CON pin, this device can handle overvoltage protection up to 30 V. After the EN pin toggles low, the TPD1S414 waits 20 ms before turning ON the nFET through a soft-start delay. ACK pin indicates the FET is completely turned ON. 1 • • • • • • • Overvoltage Protection at VBUS_CON Up to 30-V DC Low RON nFET Switch Supports Host and Charging Mode Internal 15-ms Start-Up Delay Internal 30-ms Soft-Start Delay to Minimize the USB Inrush Current Transient Protection for VBUS Line: – IEC 61000-4-2 Contact Discharge ±15 kV – IEC 61000-4-2 Air Gap Discharge ±15 kV – IEC 61000-4-5 Open-Circuit Voltage 100 V Integrated Input Enable and Status Output Signal Thermal Shutdown (TSD) Feature Space-Saving DSBGA Package: (1.4 mm × 1.89 mm) The typical application interface for the TPD1S414 is the VBUS line in USB connectors. Typical end equipment for TPD1S414 are mobiles phones, tablets, wearables, and electronic-point-of-sale (EPOS). The TPD1S414 can also be applied to any system using an interface with a 5-V power rail. Device Information(1) 2 Applications • • PART NUMBER PACKAGE TPD1S414 End Equipment – Mobile Phones – Tablets – Wearables – Electronic-Point-of-Sale (EPOS) Interfaces – USB 2.0 – USB 3.0 – USB Type C BODY SIZE (NOM) DSBGA (12) 1.40 mm × 1.89 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Typical Application Schematic VCC TPD1S414 USB Type C Connector VBUS VBUS_CON ACK GPIO EN GPIO VBUS_SYS VBUS VOUT System Load DD+ 1 µF GND 2.2 µF BAT CC1 CC2 + Battery DGND D+ CC Logic & Port Controller I2C/GPIO PMIC TPD4E110 Copyright © 2016, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com Table of Contents 1 2 3 4 5 6 7 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 6.10 6.11 4 4 4 5 5 5 6 6 6 6 8 Absolute Maximum Ratings ..................................... ESD Ratings.............................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics (EN, ACK Pins)................. Electrical Characteristics (OVP Circuit) .................... Timing Requirements ................................................ Switching Characteristics (nFET).............................. Supply Current Consumption.................................... Thermal Shutdown Feature .................................... Typical Characteristics ............................................ Detailed Description ............................................ 10 7.1 7.2 7.3 7.4 8 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 10 10 10 11 Application and Implementation ........................ 13 8.1 Application Information............................................ 13 8.2 Typical Application ................................................. 13 9 Power Supply Recommendations...................... 15 10 Layout................................................................... 15 10.1 Layout Guidelines ................................................. 15 10.2 Layout Example .................................................... 15 11 Device and Documentation Support ................. 16 11.1 11.2 11.3 11.4 11.5 Receiving Notification of Documentation Updates Community Resource............................................ Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 16 16 16 16 16 12 Mechanical, Packaging, and Orderable Information ........................................................... 16 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (October 2013) to Revision B • Page Added ESD Ratings table, Detailed Description section, Application and Implementation section, Power Supply Recommendations section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section ................................................................................................................................................................. 1 Changes from Original (October 2013) to Revision A Page • Changed text in the DESCRIPTION From: TPD1S414 waits 15 ms before turning ON the nFET To: TPD1S414 waits 20 ms before turning ON the nFET ............................................................................................................................... 1 • Deleted Continuous forward current through the FET body diode, IDIODE from the ABSOLUTE MAXIMUM RATINGS table ........................................................................................................................................................................................ 4 • Deleted Peak input current on VBUS_CON pin, IBUS from the ABSOLUTE MAXIMUM RATINGS table .................................... 4 • Added Voltage on ACK pin to the ABSOLUTE MAXIMUM RATINGS table.......................................................................... 4 • Added Continuous current on VBUS_CON and VBUS_SYS pins to the RECOMMENDED OPERATING CONDITIONS table ..... 4 • Added Continuous forward current through the FET body diode, IDIODE to the RECOMMENDED OPERATING CONDITIONS table ................................................................................................................................................................ 4 • Added values to the THERMAL INFORMATION table .......................................................................................................... 5 • Changed the IHOST_LEAK MAX value From: 160 To: 200 µA in the SUPPLY CURRENT CONSUMPTION table ................... 6 • Deleted graphs: Enabling the Load Switch, Connecting VBUS_CON, and OVP Operation from the TIMING DIAGRAMS section .................................................................................................................................................................................... 7 • Changed horizontal axis labeling on Figure 7 ........................................................................................................................ 8 • Changed Figure 10............................................................................................................................................................... 14 • Added text to the APPLICATION INFORMATION section................................................................................................... 14 2 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 TPD1S414 www.ti.com SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 5 Pin Configuration and Functions YZ Package 12-Pin DSBGA Top View - See Through GND VBUS_SYS VBUS_SYS GND ACK VBUS_SYS VBUS_CON GND EN VBUS_CON VBUS_CON GND Pin Functions PIN TYPE DESCRIPTION NAME NO. ACK B1 O Open-Drain Acknowledge pin. See Table 2. EN C1 I Enable Active-Low Input. Drive EN low to enable the switch. Drive EN high to disable the switch. B3, C2, C3 I/O Connect to USB connector VBUS pin; IEC61000-4-2 ESD protection IEC61000-4-5 Surge protection A2, A3, B2 I/O Connect to internal VBUS plane A1, A4, B4, C4 Ground Connect to PCB ground plane VBUS_CON VBUS_SYS GND Table 1. 12-YZ Pin Mapping 1 2 3 4 A GND VBUS_SYS VBUS_SYS GND B ACK VBUS_SYS VBUS_CON GND C EN VBUS_CON VBUS_CON GND Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 3 TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT Supply voltage from USB connector, VBUS_CON –0.3 30 V Internal supply DC voltage rail on the PCB, VBUS_SYS –0.5 7 V Voltage on EN pin –0.5 7 V Voltage on ACK pin –0.5 7 V Output load capacitance, CLOAD VBUS_SYS pin 0.1 50 µF Input capacitance, CON VBUS_CON pin 0.1 50 µF Operating free-air temperature, TA –40 85 °C Storage temperature, Tstg –40 150 °C (1) (2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum. 6.2 ESD Ratings VALUE Electrostatic discharge V(ESD) (1) (2) UNIT Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±1000 IEC 61000-4-2 contact discharge ±15000 V ±15000 V IEC 61000-4-2 air-gap discharge V IEC 61000-4-5 Peak Pulse Current (tp = 8/20 µs) VBUS_CON pin 21 A IEC 61000-4-5 Peak Pulse Power (tp = 8/20 µs) VBUS_CON pin 700 W IEC 61000-4-5 Open circuit voltage (tp = 1.2/50 µs) VBUS_CON pin 100 V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as ±2000 V may actually have higher performance. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±1000 V may actually have higher performance. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) PARAMETER MIN NOM MAX 5.9 UNIT VBUS_CON Supply voltage from USB connector VBUS_SYS Internal supply DC voltage rail on the PCB CLOAD Output load capacitance VBUS_SYS pin 2.2 µF CIN Input capacitance VBUS_CON pin 1 µF RPULLUP Pullup resistor ACK pin VBUS_CON and VBUS_SYS pins VBUS_SYS IVBUS Continuous current on VBUS_CON IDIODE Continuous current through the FET body diode 4 5.9 Submit Documentation Feedback 4.3 V V 100 kΩ 3.5 A 1 A Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 TPD1S414 www.ti.com SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 6.4 Thermal Information TPD1S414 THERMAL METRIC (1) YZ (DSBGA) UNIT 12 PINS RθJA Junction-to-ambient thermal resistance 89 °C/W RθJC(top) RθJB Junction-to-case(top) thermal resistance 0.6 °C/W Junction-to-board thermal resistance 16.3 °C/W ψJT Junction-to-top characterization parameter 2.7 °C/W ψJB Junction-to-board characterization parameter 16.2 °C/W RθJC(bot) Junction-to-case(bottom) thermal resistance n/A °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. 6.5 Electrical Characteristics (EN, ACK Pins) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VIH High-level input voltage, EN VIL Low-level input voltage, EN IIL Input leakage current EN VI = 3.3 V VOL Low-level output voltage, ACK IOL = 3 mA MIN TYP 1.2 MAX UNIT 6 V 0.8 V 1 µA 0.4 V UNIT 6.6 Electrical Characteristics (OVP Circuit) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX 6 6.2 6.4 VOVP_RISING Input overvoltage protection threshold, VBUS_CON VBUS_CON increasing from 5 V VHYS_OVP Hysteresis on OVP, VBUS_CON VBUS_CON decreasing from 7 V to 5V VOVP_FALLING Input overvoltage protection threshold, VBUS_CON VBUS_CON decreasing from 7 V to 5V 5.93 VUVLO Input undervoltage lockout, VBUS_CON VBUS_CON voltage rising from 0 V to 5 V 3.1 VHYS_UVLO Hysteresis on UVLO, VBUS_CON Difference between rising and falling UVLO thresholds VUVLO_FALLING Input undervoltage lockout, VBUS_CON VBUS_CON voltage rising from 5 V to 0 V 3 3.2 3.4 V VUVLO_SYS VBUS_SYS undervoltage lockout, VBUS_SYS VBUS_SYS voltage rising from 0 V to 5 V 3.1 3.6 4.3 V VHYS_UVLO_SYS VBUS_SYS UVLO Hysteresis, VBUS_SYS Difference between rising and falling UVLO thresholds on VBUS_SYS VUVLO_SYS_FALL VBUS_SYS undervoltage lockout, VBUS_SYS VBUS_SYS voltage falling from 7 V to 5 V 50 3.3 mV 6.37 V 3.5 V 100 mV 480 3 3.2 mV 3.4 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 V V 5 TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com 6.7 Timing Requirements over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT tDELAY USB charging turnon delay Measured from EN asserted LOW to nFET beginning to Turn ON (1) excluding soft-start time 20 ms tSS USB charging rise time (soft-start delay) Measure from VBUS_SYS rises above 25% (with 1-MΩ load/ NO CLOAD) until ACK goes Low (10%) 25 ms tOFF_DELAY USB charging turnoff time Measured from EN asserted High to VBUS_SYS falling to 10% with RLOAD = 10 Ω and No CLOAD on VBUS_SYS 4 µs OVERVOLTAGE PROTECTION tOVP_response OVP response time Measured from OVP Condition to FET Turn OFF (2). VBUS_CON rises at 1V / 100 ns tOVP_Recov Recovery time Measured from OVP Clear to FET Turn ON (3) (1) (2) (3) 100 20 ns ms Shown in Figure 1. Parameters provided for reference only, and do not constitute part of TI's published device specifications for purposes of TI's product warranty. Excludes soft-start time 6.8 Switching Characteristics (nFET) over operating free-air temperature range (unless otherwise noted) PARAMETER RDS(on) Switch ON-resistance TEST CONDITIONS MIN VBUS_CON = 5 V, IOUT = 1 A, TA = 25˚C TYP MAX 39 50 UNIT mΩ 6.9 Supply Current Consumption over operating free-air temperature range (unless otherwise noted) PARAMETER IVBUS_SLEEP IVBUS VBUS_CON operating current consumption TEST CONDITIONS MIN TYP MAX 30 70 µA Measured at VBUS_CON pin, VBUS_CON = 5 V, EN 0 V and no load 175 373 µA 175 373 µA 200 µA Measured at VBUS_CON pin, VBUS_CON = 5 V, EN =5V IVBUS_SYS VBUS_CON operating current consumption Measured at VBUS_SYS pin, VBUS_SYS = 5 V, EN = 0 V and VBUS_CON = Hi Z IHOST_LEAK Host mode leakage current Measured at VBUS_SYS, VBUS_CON = Hi Z, EN = 5 V, VBUS_SYS = 5 V 90 UNIT 6.10 Thermal Shutdown Feature over operating free-air temperature range (unless otherwise noted) PARAMETER TSHDN 6 TEST CONDITIONS MIN TYP MAX UNIT Thermal shutdown Junction temperature 145 °C Thermal-shutdown hysteresis Junction temperature 35 °C Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 TPD1S414 www.ti.com SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 Overtemperature Condition VOVP VBUS_CON VUVLO tDELAY EN tOFF_DELAY tSS VBUS_SYS Figure 1. Thermal Shutdown Operation Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 7 TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com 6.11 Typical Characteristics 800 700 1.8 1.6 Normalized RDS(ON) 600 Input Current (uA) 2.0 -30 TAT==t30ƒC 25 TAT==25ƒC TAT==85ƒC 85 500 400 300 200 1.4 1.2 1.0 0.8 0.6 0.4 100 0.2 0.0 0 0 5 10 15 20 25 30 Input Voltage (V) 35 ±40 ±20 0 20 40 60 80 Temperature (ƒC) C001 Figure 2. Input Supply Current vs Supply Voltage 100 C002 Figure 3. Normalized RDS(ON) vs Temperature 1.10 3.0 1.05 Normalized VOVP Normalized RDS(ON) 2.5 2.0 1.5 1.0 1.00 0.95 0.5 0.0 0.90 0.1 0.6 1.1 1.6 2.1 2.6 Output Current (A) ±40 ±20 0 20 40 60 80 Temperature (ƒC) C003 Figure 4. Normalized RDS(ON) vs Output Current 100 C004 Figure 5. Normalized VOVP 14 2.00 1.80 12 10 1.40 Voltage (V) Normalized TDELAY 1.60 1.20 1.00 0.80 0.60 8 6 4 0.40 VBUS_SYS 2 0.20 VBUS_CON 0 0.00 ±40 ±20 0 20 40 60 Temperature (ƒC) 80 100 0 C005 Figure 6. Normalized TDELAY 8 200 400 600 800 1000 Time (ns) 1200 1400 C006 Figure 7. VOVP Response Time Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 TPD1S414 www.ti.com SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 Typical Characteristics (continued) 6 50 3 2 VBUS_SYS VBUS_CON 1 I_VBUS_CON 0 Voltage (V) and Current (A) Amplitude (V) 4 Vsys (V) TPD1S414YZ 8/20 Surge Waveforms 100 V (into an open), Powered Down 45 5 40 Vcon (V) Icon (A) 35 30 25 20 15 10 5 0 ±1 ±5 ±15 ±10 ±5 0 5 10 15 20 25 30 Time (ms) 35 ±10 C007 Figure 8. Power Up With 2.2 µF on VBUS_SYS 0 10 20 30 40 50 60 70 80 Time (µs) Product Folder Links: TPD1S414 C008 Figure 9. Response to a 100-V Surge Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated 90 9 TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com 7 Detailed Description 7.1 Overview The TPD1S414 provides a single-chip ESD protection, surge protection, and overvoltage protection solution for portable USB charging and Host interfaces. It offers overvoltage protection at the VBUS_CON pin up to 30 V. The TPD1S414 also provides a ACK pin that indicates to the system if a fault condition has occurred. The TPD1S414 offers an ESD clamp and a surge clamp for VBUS_CON pin, thus eliminating the need for external TVS clamp circuits in the application. The TPD1S414 has an internal oscillator and charge pump that controls the turnon of the internal nFET switch. The internal oscillator controls the timers that enable the charge pump and resets the open-drain ACK output. If VBUS_CON is less than VOVP, the internal charge pump is enabled. After a 15-ms internal delay, the charge-pump starts up, and turns on the internal nFET switch through a soft start. Once the nFET is completely turned ON, TPD1S414 asserts ACK pin LOW. At any time, if VBUS_CON rises above VOVP, the ACK pin is in High-Z and is pulled HIGH through external resistors. The nFET switch is turned OFF. 7.2 Functional Block Diagram VBUS_CON VBUS_SYS Precision Surge Clamping Circuit Internal Bandgap Reference /ACK Control Logic and Charge Pump /EN GND Copyright © 2016, Texas Instruments Incorporated 7.3 Feature Description 7.3.1 Overvoltage Protection on VBUS_CON up to 30-V DC When the VBUS_CON voltage rises above VOVP, the internal nFET switch is turned off, removing power from the system side. VBUS_CON can tolerate up to 30-V DC. The response to overvoltage is very rapid, with the nFET switch turning off in less than 100 ns. When the VBUS_CON voltage returns back to below VOVP – VHYS_OVP, the nFET switch is turned on again after an internal delay of tOVP_RECOV (tDELAY). This time delay ensures that the VBUS_CON supply has stabilized before turning the switch back on. After tOVP_RECOV, the TPD1S414 turns on the nFET through a soft start. Once the OVP condition is cleared the nFET is turned completely on. 7.3.2 Low RON nFET Switch Supports Host and Charging Mode The nFET switch has a total ON-resistance (RON) of 39 mΩ. This equates to a voltage drop of less than 140 mV when charging at the maximum 3.5-A current level. Such low RON helps provide maximum potential to the system as provided by an external charger or by the system when in host mode. 7.3.3 ±15-kV IEC 61000-4-2 Level 4 ESD Protection The VBUS_CON pin can withstand ESD events up to ±15-kV Contact and Air-Gap. An ESD clamp diverts the current to ground. 10 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 TPD1S414 www.ti.com SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 Feature Description (continued) 7.3.4 100-V IEC 61000-4-5 µs Surge Protection The VBUS_CON pin can withstand surge events up to 100-V open-circuit voltage (VPP), and 700 W. A precision clamp diverts the current to ground and active circuitry switches OFF the nFET earlier than 100 ns before an overvoltage can get through to VBUS_SYS. 7.3.5 Start-Up and OVP Recovery Delay The TPD1S414 has a built-in start-up delay. Once the device has been enabled, a time tDELAY elapses before the charge pump is enabled which turns on the nFET. A manufactured preprogrammed soft start, tSS, is used when turning on the nFET with the charge pump. Once the device is enabled, these start delays, tDELAY + tSS, work together to meet the USB inrush current compliance. Similarly, after an OVP event has occurred, the device waits a time tOVP_RECOV before enabling the charge pump to turn on the nFET. The soft-start, tSS, is still used when turning on the nFET with the charge pump after an OVP event, making the total time for the nFET switch to turn on after the OVP event tOVP_RECOV + tSS. 7.3.6 Integrated Input Enable and Status Output Signal The TPD1S414 integrates an enable signal to control the ON and OFF state of its nFET. The device also integrates an status output signal through the ACK pin which indicates whether or not a fault is occurring on the device. See the Table 2 table to understand the functionality of these pins in all of the TPD1S414's states. 7.3.7 Thermal Shutdown The TPD1S414 family has an overtemperature protection circuit to protect against system faults or improper use. The basic function of the thermal shutdown (TSD) circuit is to sense when the junction temperature has exceeded the absolute maximum rating and shuts down the device until the junction temperature has cooled to a safe level. When in the thermal shutdown condition, the device asserts a fault by setting the ACK pin to High-Z. 7.4 Device Functional Modes 7.4.1 VBUS_CON < VUVLO When VBUS_CON is less than VUVLO, the device is in its unpowered state. The nFET is OFF and the ACK pin is High-Z. In this state, TPD1S414 still provides IEC 61000-4-2 ±15-kV Contact/±15-kV air-gap protection and IEC 61000-4-5 100-V open-circuit surge protection. 7.4.2 VUVLO < VBUS_CON < VOVP When VBUS_CON is greater than VUVLO and less than VOVP, the device is in its powered state. In this state, the nFET can be controlled ON and OFF through the enable pin. When the EN pin is Low, the nFET is ON and can be used for both charging and host or OTG mode. While the nFET switch is ON, the ACK pin is held Low. When the enable pin is high, the nFET switch is held OFF and the ACK pin is High-Z. In both the enable and disabled states, the TPD1S414 provides IEC 61000-4-2 ±15-kV contact/±15-kV air-gap protection and IEC 61000-4-5 100V open-circuit surge protection. 7.4.3 VBUS_CON > VOVP When VBUS_CON is greater than VOVP, the device is in the overvoltage protection sate. In this state, the nFET switch is forced OFF regardless of the state of the enable pin and ACK is set High-Z. VBUS_CON can handle overvoltage protection up to 30 V. 7.4.4 OVP Operation When the VBUS_CON voltage rises above VOVP, the internal nFET switch is turned off, removing power from the system. The response is rapid, with the FET switch turning off in less than 100 ns. The ACK pin is set to High-Z when an overvoltage condition is detected and the nFET is turned OFF. This pin can be pulled up through external resistors to indicate an OVP condition. When the VBUS_CON voltage returns below VOVP – VHYS-OVP, the nFET switch is turned on again after the internal delay of tOVP_Recov. This delay time ensures that the VBUS_CON supply has stabilized before turning the switch back on. After tOVP_Recov, the TPD1S414 turns on the nFET through a soft start to ensure that the USB Inrush current compliance is met. When the OVP condition is cleared and the nFET is completely turned on, the ACK is reset LOW. Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated Product Folder Links: TPD1S414 11 TPD1S414 SLLSEH9B – OCTOBER 2013 – REVISED JULY 2016 www.ti.com Device Functional Modes (continued) 7.4.5 Host/OTG Mode The TPD1S414's UVLO and OVP voltages are referenced to VBUS_CON voltage. In OTG mode, VBUS_SYS is driving the VBUS_CON. Under this situation, initially VBUS_CON is powered through the body diode of the nFET by VBUS_SYS. Once the UVLO threshold on VBUS_CON is met, the nFET turns on. If there is a short to ground on VBUS_CON the OTG supply is expected to limit the current. Table 2. Device Operation VOLTAGE CONDITION 12 CURRENT CONDITION VBUS_CON VBUS_SYS EN CURRENT FLOW COMMENT ACK PIN X VBUS_CON High VBUS_SYS to VBUS_CON Switch off, current flows through the body diode High-Z Low VBUS_CON Low VBUS_SYS to VBUS_CON Switch off, current flows through the body diode High-Z X X X No Flow/ Current through Body Diode Thermal shutdown condition High-Z
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