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TPD2E2U06
SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
TPD2E2U06 Dual-Channel High-Speed ESD Protection Device
1 Features
3 Description
•
The TPD2E2U06 is a dual-channel low capacitance
TVS diode ESD protection device. The device offers
±25-kV contact and ±30-kV air-gap ESD protection in
accordance with the IEC 61000-4-2 standard. The
1.5-pF line capacitance of the TPD2E2U06 makes
the device suitable for a wide range of applications.
Typical application interfaces are USB 2.0, LVDS,
and I2C™.
1
•
•
•
•
•
•
•
IEC 61000-4-2 Level 4
– ±25 kV (Contact discharge)
– ±30 kV (Air-gap discharge)
IEC 61000-4-5 Surge protection
– 5.5-A Peak pulse current (8/20 µs Pulse)
IO Capacitance 1.5 pF (Typ)
DC Breakdown voltage 6.5 V (Min)
Ultra-Low leakage current 10 nA (Max)
Low ESD clamping voltage
Industrial temperature range: –40°C to +125°C
Small easy-to-route DRL and DCK package
•
PART NUMBER
PACKAGE
BODY SIZE (NOM)
TPD2E2U06DRL
SOT (5)
1.60 mm × 1.20 mm
TPD2E2U06DCK
SC70 (3)
2.0 mm × 1.25 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
2 Applications
•
Device Information(1)
End Equipment
– Set Top Box
– Notebook
– Server
– Electronic Point of Sale (EPOS)
Interfaces
– USB 2.0
– Ethernet
– MIPI Bus
– LVDS
– I2C
Simplified Schematic
Power
Supply
D+
USB 2.0
Transceiver
USB 2.0
Connector
Vbus
DGND
3
5
TPD2E2U06
4
GND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TPD2E2U06
SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
3
6.1
6.2
6.3
6.4
6.5
6.6
3
4
4
4
4
6
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Typical Characteristics ..............................................
Detailed Description .............................................. 8
7.1 Overview ................................................................... 8
7.2 Functional Block Diagram ......................................... 8
7.3 Feature Description................................................... 8
7.4 Device Functional Modes.......................................... 9
8
Application and Implementation ........................ 10
8.1 Application Information............................................ 10
8.2 Typical Application ................................................. 10
9 Power Supply Recommendations...................... 11
10 Layout................................................................... 11
10.1 Layout Guidelines ................................................. 11
10.2 Layout Example .................................................... 12
11 Device and Documentation Support ................. 12
11.1
11.2
11.3
11.4
Trademarks ...........................................................
Receiving Notification of Documentation Updates
Support Resources ...............................................
Glossary ................................................................
12
12
12
12
12 Mechanical, Packaging, and Orderable
Information ........................................................... 12
4 Revision History
Changes from Revision B (May 2015) to Revision C
Page
•
Added DCK Package to the Pin Configuration and Functions section................................................................................... 3
•
Added DCK Package to the Electrical Characteristics table ................................................................................................. 4
Changes from Revision A (June 2013) to Revision B
•
2
Page
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................ 1
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SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
5 Pin Configuration and Functions
DRL Package
5-Pin SOT
Top View
NC
NC
IO1
5
1
IO2
2
3
4
GND
DCK Package
3-Pin SC70
Top View
IO1
1
3
IO2
GND
2
Pin Functions
PIN
NAME
I/O
DESCRIPTION
DRL
DCK
IO1
3
1
I/O
IO2
5
2
I/O
NC
1, 2
—
-
This pin is not connected and is left floating, grounded, or connected to VCC.
4
3
G
The GND (ground) pin is connected to ground.
GND
The IO1 and IO2 pins are an ESD protected channel. Connect these pins to the
data line as close to the connector as possible.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
IPP
Peak pulse current (tp = 8/20 μs)
5.5 (1)
A
PPP
Peak pulse power (tp = 8/20 μs) DRL package
85 (1)
W
PPP
Peak pulse power (tp = 8/20 μs) DCK package
75 (1)
W
(1)
Operating temperature
–40
125
°C
Storage temperature
–65
155
°C
Measured at 25°C.
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TPD2E2U06
SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
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6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±4000
Charged-device model (CDM), per JEDEC specification JESD22C101 (2)
±1500
EC 61000-4-2 contact
±25000
EC 61000-4-2 air-gap
±30000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 500-V HBM is possible with the necessary precautions.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 250-V CDM is possible with the necessary precautions.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VIO
Input Pin Voltage
TA
Operating Free Air Temperature
NOM
MAX
UNIT
0
5.5
V
-40
125
°C
6.4 Thermal Information
TPD2E2U06
THERMAL METRIC (1)
DRL
DCK
5 PINS
3 PINS
RθJA
Junction-to-ambient thermal resistance
286.8
308.3
RθJC(top)
Junction-to-case (top) thermal resistance
130.7
170.7
RθJB
Junction-to-board thermal resistance
104.8
89.2
ψJT
Junction-to-top characterization parameter
25.6
34.2
ψJB
Junction-to-board characterization parameter
104.3
88.6
(1)
UNIT
°C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC package thermal metrics application
report.
6.5 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
VRWM
Reverse stand-off voltage
IIO < 10 µA
VCLAMP
IO to GND
IPP = 1 A, TLP (1)
9.7
IPP = 5 A, TLP (1)
12.4
IPP = 1 A, TLP (1)
1.9
(1)
4
VCLAMP
GND to IO
IPP = 5 A, TLP
MAX
5.5
UNIT
V
V
V
RDYN
Dynamic resistance DRL
package
IO to GND (2)
0.5
Ω
RDYN
Dynamic resistance DRL
package
GND to IO (2)
0.25
Ω
RDYN
Dynamic resistance DCK
package
IO to GND (2)
0.6
Ω
RDYN
Dynamic resistance DCK
package
GND to IO (2)
0.4
Ω
CL
Line capacitance
f = 1 MHz, VBIAS = 2.5 V (3)
1.5
1.9
pF
CCROSS
Channel-to-channel input
capacitance
Pin 4 = 0 V, f = 1 MHz, VBIAS = 2.5 V, between
channel pins (3)
0.02
0.03
pF
(1)
(2)
(3)
4
Transmission Line Pulse with 10-ns rise time, 100-ns width.
Extraction of RDYN Using least squares fit of TLP characteristics between I = 20 A and I = 30 A.
Measured at 25°C.
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Electrical Characteristics (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
∆CIO-TO-GND
Variation of channel input
capacitance
Pin 4 = 0 V, f = 1 MHz, VBIAS = 2.5 V,
channel_x pin to GND – channel_y pin to GND (3)
VBR
Break-down voltage
IIO = 1 mA
ILEAK
Leakage current
VIO = 2.5 V
MIN
TYP
MAX
0.03
0.1
6.5
1
UNIT
8.5
V
10
nA
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pF
5
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SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
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30
30
25
25
20
20
Current (A)
Current (A)
6.6 Typical Characteristics
15
15
10
10
5
5
0
0
0
5
10
15
20
25
30
35
40
45
Voltage (V)
50
0
5
10
Figure 1. TLP, Data to GND
30
35
40
45
50
C003
Figure 2. TLP, GND to Data
0
±15
90
±30
75
Voltage (V)
Voltage (V)
25
15
105
60
45
30
±45
±60
±75
±90
±105
15
±120
0
±135
±15
±150
0
25
50
75
100
125
150
175
200
Time (ns)
±10
15
40
65
90
115
140
165
Time (ns)
C004
Figure 3. IEC 61000-4-2 Clamping Voltage, +8 kV Contact
190
C005
Figure 4. IEC 61000-4-2 Clamping Voltage, –8 kV Contact
500
0.001
400
Current (pA)
0.0005
Current (A)
20
Voltage (V)
120
0
-0.0005
300
200
100
0
-0.001
±2
±1
0
1
2
3
4
5
6
Voltage (V)
7
8
9
10
0
20
40
60
80
100
Temperature (ƒC)
C006
120
C007
VIN 2.5 V
TA = 25°C
Figure 6. ILEAK vs Temperature
Figure 5. IV Curve
6
15
C002
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Typical Characteristics (continued)
2.2
6.5
100
Current
90
Power
5.2
80
1.6
3.9
60
50
2.6
40
Power (W)
70
1.8
Current (A)
Capacitance (pF)
2
30
1.4
1.3
20
1.2
10
F = 1 MHz
0.0
1
0
0
±5
0
1
2
3
4
5
10
15
5
IO Voltage (V)
20
25
30
35
40
45
50
Time ( S)
C009
C008
f = 1 MHz
Gain (dB)
Figure 7. Capacitance Across VBIAS
1
0
±1
±2
±3
±4
±5
±6
±7
±8
±9
±10
±11
±12
100k
Figure 8. Surge Curve (tp = 8/20 μs) IO to GND
1M
10M
100M
1000M
Frequency (Hz)
10000M
C010
Figure 9. Insertion Loss
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SLLSEG9C – JUNE 2013 – REVISED DECEMBER 2019
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7 Detailed Description
7.1 Overview
The TPD2E2U06 is a dual-channel low capacitance TVS diode ESD protection device. The device offers ±25-kV
contact and ±30-kV air-gap ESD protection in accordance with the IEC 61000-4-2 standard. The 1.5-pF line
capacitance of the TPD2E2U06 makes the device suitable for a wide range of applications. Typical application
interfaces are USB 2.0, LVDS, and I2C.
7.2 Functional Block Diagram
IO1
IO2
GND
7.3 Feature Description
The TPD2E2U06 is a dual-channel low capacitance TVS diode ESD protection device. The device offers ±25-kV
contact and ±30-kV air-gap ESD protection in accordance with the IEC 61000-4-2 standard. The 1.5-pF line
capacitance of the TPD2E2U06 makes the device suitable for a wide range of applications. Typical application
interfaces are USB 2.0, LVDS, and I2C.
7.3.1 IEC 61000-4-2 Level 4
The I/O pins can withstand ESD events up to ±25-kV contact and ±30-kV air. An ESD/surge clamp diverts the
current to ground.
7.3.2 IO Capacitance
The capacitance between each I/O pin to ground is 1.5 pF. These capacitances support data rates in excess of
1.5 Gbps.
7.3.3 DC Breakdown Voltage
The DC breakdown voltage of each I/O pin is a minimum of 6.5 V. This ensures that sensitive equipment is
protected from surges above the reverse standoff voltage of 5.5 V.
7.3.4 Ultra-Low Leakage Current
The I/O pins feature an ultra-low leakage current of 10 nA (Max) with a bias of 2.5 V.
7.3.5 Low ESD Clamping Voltage
The I/O pins feature an ESD clamp that is capable of clamping the voltage to 9.7 V (IPP = 1 A).
8
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Feature Description (continued)
7.3.6 Industrial Temperature Range
This device is designed to operate from –40°C to 125°C.
7.3.7 Small Easy-to-Route Package
The layout of this device makes it simple and easy to add protection to an existing layout. The packages offers
flow-through routing, requiring minimal modification to an existing layout.
7.4 Device Functional Modes
TPD2E2U06 is a passive integrated circuit that triggers when voltages are above VBR or below the lower diodes
Vf (–0.6 V). During ESD events, voltages as high as ±30 kV (air) can be directed to ground via the internal diode
network. Once the voltages on the protected line fall below the trigger levels of TPD2E2U06 (usually within 10’s
of nano-seconds) the device reverts to passive.
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8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
TPD2E2U06 is a diode type TVS which is typically used to provide a path to ground for dissipating ESD events
on hi-speed signal lines between a human interface connector and a system. As the current from ESD passes
through the TVS, only a small voltage drop is present across the diode. This is the voltage presented to the
protected IC. The low RDYN of the triggered TVS holds this voltage, VCLAMP, to a safe level for the protected IC.
8.2 Typical Application
Power
Supply
D+
USB 2.0
Transceiver
USB 2.0
Connector
Vbus
D3
GND
5
TPD2E2U06
4
GND
Figure 10. Typical USB Application Diagram
8.2.1 Design Requirements
For this design example, one TPD2E2U06 device will be used in a USB 2.0 application. This will provide
complete port protection.
Given the USB 2.0 application, the following parameters are known.
DESIGN PARAMETER
VALUE
Signal range on Pins 3 or 5
0 V to 3.3 V
Operating Frequency
240 MHz
8.2.2 Detailed Design Procedure
To begin the design process, some parameters must be decided upon; the designer needs to know the following:
• Signal range of all the protected lines
• Operating frequency
10
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8.2.2.1 Signal Range
The TPD2E2U06 has 2 identical protection channels for signal lines. The symmetry of the device provides
flexibility when selecting which of the 2 I/O channels will protect which signal lines. Any I/O will support a signal
range of 0 to 5.5 V.
8.2.2.2 Operating Frequency
The TPD2E2U06 has a capacitance of 1.5 pF (Typ), supporting USB 2.0 data rates.
8.2.3 Application Curves
1
Gain (dB)
0
±1
±2
±3
±4
100k
1M
10M
100M
1000M
Frequency (Hz)
10000M
C011
Figure 11. Insertion Loss Graph
9 Power Supply Recommendations
This device is a passive ESD protection device and there is no need to power it. Care should be taken to make
sure that the maximum voltage specifications for each line are not violated.
10 Layout
10.1 Layout Guidelines
•
•
•
The optimum placement is as close to the connector as possible.
– EMI during an ESD event can couple from the trace being struck to other nearby unprotected traces,
resulting in early system failures.
– The PCB designer needs to minimize the possibility of EMI coupling by keeping any unprotected traces
away from the protected traces which are between the TVS and the connector.
Route the protected traces as straight as possible.
Eliminate any sharp corners on the protected traces between the TVS and the connector by using rounded
corners with the largest radii possible.
– Electric fields tend to build up on corners, increasing EMI coupling.
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10.2 Layout Example
IO2
IO1
GND
= VIA to GND
Figure 12. Routing with DRL Package
11 Device and Documentation Support
11.1 Trademarks
E2E is a trademark of Texas Instruments.
I2C is a trademark of NXP Semiconductors.
All other trademarks are the property of their respective owners.
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
11.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
12
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PACKAGE OPTION ADDENDUM
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10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TPD2E2U06DCKR
ACTIVE
SC70
DCK
3
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1GH
TPD2E2U06DRLR
ACTIVE
SOT-5X3
DRL
5
4000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
DT
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of