AIMW120R045M1
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Silicon Carbide MOSFET
Features
Revolutionary semiconductor material - Silicon Carbide
Very low switching losses
Threshold-free on state characteristic
IGBT-compatible driving voltage (15V for turn-on)
0V turn-off gate voltage
Benchmark gate threshold voltage, VGS(th)=4.5V
Fully controllable dv/dt
Commutation robust body diode, ready for synchronous rectification
Temperature independent turn-off switching losses
Benefits
Efficiency improvement
Enabling higher frequency
Increased power density
Cooling effort reduction
Reduction of system complexity and cost
Potential Applications
On-board Charger/PFC
Booster/DC-DC Converter
Auxilliary Inverter
Product Validation
Qualified for Automotive Applications. Product Validation according to AEC-Q100/101”
Table 1
Key Performance and Package Parameters
Type
AIMW120R045M1
ID
VDS
1200V
Datasheet
www.infineon.com/sic
RDS(on),typ
(TC=25°C, (Tvj=25°C, ID=20A,
VGS=15V)
Rth(j-c,max))
52A
45mΩ
Tvjmax
Marking
SP Number
Package
175°C
A120M1045
SP002472666
PG-TO247-3-41
Please read the Important Notice and Warnings at the end of this document
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Table of contents
Features
1
Benefits
1
Potential Applications ..................................................................................................................... 1
Product Validation .......................................................................................................................... 1
Table of contents ............................................................................................................................ 2
1
Maximum ratings ........................................................................................................... 3
2
Thermal resistances ....................................................................................................... 4
3
3.1
3.2
3.3
Electrical Characteristics ................................................................................................ 5
Static characteristics ............................................................................................................................... 5
Dynamic characteristics .......................................................................................................................... 6
Switching characteristics ........................................................................................................................ 7
4
Electrical characteristic diagrams.................................................................................... 8
5
Package drawing .......................................................................................................... 14
6
Test conditions ............................................................................................................. 15
Revision History ............................................................................................................................ 16
Datasheet
2
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Maximum ratings
1
Maximum ratings
Stress above the maximum values listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
Table 2
Maximum ratings1
Parameter
Symbol
Value
Unit
Drain-source voltage, Tvj ≥ 25°C
VDSS
1200
V
DC drain current for Rth(j-c,max), limited by Tvjmax, VGS=15V
TC = 25°C
TC = 100°C
ID
52
36
A
Pulsed drain current, tp limited by Tvjmax, VGS = 15V
ID,pulse
130
A
DC body diode forward current for Rth(j-c,max), limited by
Tvjmax, VGS=0V
TC = 25°C
TC = 100°C
ISD
Pulsed body diode current, tp limited by Tvjmax
ISD,pulse
130
Gate-source voltage
Max transient voltage, < 1% duty cycle
Recommended turn-on gate voltage
Recommended turn-off gate voltage
VGSS
VGSS,on
VGSS,off
-7… 20
15
0
Power dissipation, limited by Tvjmax
TC = 25°C
TC=100°C
Ptot
228
114
W
Virtual junction temperature
Tvj
-40…175
°C
Storage temperature
Tstg
-55…150
°C
Soldering temperature,
wavesoldering only allowed at leads,
1.6mm (0.063 in.) from case for 10 s
Tsold
260
°C
Mounting torque, M3 screw
Maximum of mounting processes: 3
M
0.6
Nm
52
28
A
A
2
V
Not subject to production test. Parameter verified by design/characterization.
Important note: The selection of positive and negative gate-source voltages impacts the long-term behavior
of the device. The design guidelines described in Application Note AN2018-09 must be considered to ensure
sound operation of the device over the planned lifetime.
1
2
Datasheet
3
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Thermal resistances
2
Thermal resistances
Table 3
Thermal resistances1
Parameter
Symbol
MOSFET/body diode
thermal resistance,
junction – case
Rth(j-c)
Thermal resistance,
junction – ambient
Rth(j-a)
1
Conditions
leaded
Value
min.
typ.
max.
-
0.51
0.66
K/W
-
-
62
K/W
Unit
Not subject to production test. Parameter verified by design/characterization.
Datasheet
4
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
3
Electrical Characteristics
3.1
Static characteristics
Table 4
Static characteristics (at Tvj=25°C, unless otherwise specified)
Parameter
Drain-source on-state
resistance2
Body Diode forward voltage
Gate-source threshold
voltage2
Zero gate voltage drain
current
Symbol
Conditions
Value
Unit
min.
typ.
max.
RDS(on)
VGS=15V, ID=20A,
Tvj = 25°C
Tvj = 100°C
Tvj = 175°C
-
45
55
75
59
-
VSD
VGS= 0V, ISD=20A
Tvj = 25°C
Tvj =100°C
Tvj =175°C
-
4.1
4.0
3.9
5.2
-
VGS(th)
(tested after 1 ms pulse at
VGS=+20 V)
ID = 10mA, VDS = VGS
Tvj = 25°C
Tvj =175°C
3.5
-
4.5
3.6
5.7
-
VGS = 0V, VDS = 1200V
Tvj=25°C
Tvj=175°C
-
2
50
200
-
µA
VGS = 20V, VDS = 0V
-
-
120
nA
VGS = -10V, VDS = 0V
-
-
-120
nA
IDSS
Gate-source leakage current IGSS
mΩ
V
V
Transconductance
gfs
VDS = 20V, ID = 20A
-
11.1
-
S
Internal gate resistance
RG,int
f = 1MHz, VAC = 25mV
-
4.5
-
Ω
Important note: The selection of positive and negative gate-source voltages impacts the long-term behavior
of the device. The design guidelines described in Application Note AN2018-09 must be considered to ensure
sound operation of the device over the planned lifetime.
2
Datasheet
5
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
3.2
Table 5
Dynamic characteristics
Dynamic characteristics (at Tvj=25°C, unless otherwise specified)
Parameter
Symbol
Input capacitance
Ciss
Output capacitance
Coss
Reverse capacitance
Crss
Coss stored energy
Eoss
Total gate charge
QG
Gate to source charge
QGS,pl
Gate to drain charge
QGD
Value
Conditions
min.
max.
Unit
2130
VDS = 800V, VGS = 0V, f=1MHz,
VAC = 25mV
-
107
11
-
44
VDD = 800V, ID = 20A,
VGS = 0/15V, turn-on pulse
VDD = 800V, Lσ = 80nH,
RG,ext = 9Ohm, Tvj = 175°C
tSC
VGS.on = 15V
3
Verified by design for single short circuit event at VGS,on = 15V.
Short-circuit withstand
time3
Datasheet
typ.
6
pF
µJ
57
-
19
-
nC
-
µs
13
-
3
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical Characteristics
3.3
Table 6
Switching characteristics
Switching characteristics, Inductive load 4
Parameter
Symbol
Conditions
Value
typ.
min.
max.
Unit
MOSFET Characteristics, Tvj=25°C
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Etot
VDD=800V, ID=20A,
VGS=0V/15V, RG,ext=2Ω,
Lσ=40nH,
diode: body diode at
VGS=0V
see Fig. E
-
9
-
ns
-
32
-
ns
-
17
-
ns
-
13
-
ns
-
450
-
µJ
-
70
-
µJ
-
520
-
µJ
-
0.15
-
µC
-
8
-
A
-
9
-
ns
-
32
-
ns
-
20
-
ns
-
14
-
ns
-
490
-
µJ
-
75
-
µJ
-
565
-
µJ
Body Diode Characteristics, Tvj=25°C
Diode reverse recovery
charge
Qrr
Diode peak reverse
recovery current
Irrm
VDD = 800V, ISD=20A,
VGS at diode=0V,
dif/dt=1000A/µs,
Qrr includes also QC ,
see Fig. C
MOSFET Characteristics, Tvj=175°C
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Etot
VDD=800V, ID=20A,
VGS=0V/15V, RG,ext=2Ω,
Lσ=40nH,
diode: body diode at
VGS=0V,
see Fig. E
Body Diode Characteristics, Tvj=175°C
Diode reverse recovery
charge
VDD = 800V, ISD=20A,
0.25
µC
VGS at diode=0V,
dif/dt=1000A/µs,
Diode peak reverse
Irrm
10
A
Qrr includes also QC ,
recovery current
see Fig. C
4
The chip technology was characterized up to 200 kV/µs. The measured dv/dt was limited by measurement test
setup and package.
Datasheet
Qrr
7
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
4
Electrical characteristic diagrams
Figure 1
Reverse bias safe operating area
Figure 2
(RBSOA) (Vgs = 0/15V, Tc = 25°C, Tj < 175°C)
Power dissipation as a function of case
temperature limited by bond wire
(Ptot=f(TC) )
Figure 3
Maximum DC drain to source current as Figure 4
a function of case temperature limited
by bond wire (IDS=f(TC) )
Maximum source to drain current as a
function of case temperature limited by
bond wire (ISD=f(TC), VGS=0V)
Datasheet
8
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Figure 5
Typical transfer characteristic
(IDS=f(VGS), VDS=20V, tP = 20 µs)
Figure 7
Typical output characteristic, VGS as
Figure 8
parameter (IDS=f(VDS), Tvj=25°C, tP = 20 µs)
Datasheet
Figure 6
9
Typical gate-source threshold voltage
as a function of junction temperature
(VGS(th)=f(Tvj), IDS=10mA, VGS=VDS)
Typical output characteristic, VGS as
parameter (IDS=f(VDS), Tvj=175°C, tP = 20
µs)
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Figure 9
Typical on-resistance as a function of
junction temperature (RDS(on)=f(Tvj),
VGS=15V)
Figure 11
Typical capacitance as a function of
drain-source voltage (C=f(VDS), VGS=0V,
f=1MHz)
Datasheet
Figure 10
Figure 12
10
Typical gate charge (VGS=f(QG),
IDS=20A,VDS=800V, turn-on pulse)
Typical body diode forward voltage as
function of junction temperature
(VSD=f(Tvj), VGS=0V, ISD=20A)
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Figure 13
Typical body diode forward current as
function of forward voltage, VGS as
parameter (ISD=f(VSD), Tvj=25°C, tP=20 µs)
Figure 15
Typical switching energy losses as a
function of junction temperature
(E=f(Tvj), VDD=800V, VGS=0V/15V, RG,ext=2Ω,
ID=20A, ind. load, test circuit in Fig. E,
diode: body diode)
Datasheet
Figure 14
Figure 16
11
Typical body diode forward current as
function of forward voltage, VGS as
parameter (ISD=f(VSD), Tvj=175°C, tP=20 µs)
Typical switching energy losses as a
function of drain-source current
(E = f(IDS), VDD = 800V, VGS = 0V/15V,
RG,ext = 2Ω, Tvj = 175°C, ind. load, test circuit
in Fig. E, diode: body diode)
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Figure 17
Typical switching energy losses as a
Figure 18
function of gate resistance (E=f(RG,ext),
VDD=800V, VGS=0V/15V, ID=20A, Tvj=175°C,
ind. load, test circuit in Fig. E, diode: body
diode)
Figure 19
Typical reverse recovery charge as a
function of diode current slope
(Qrr=f(dif/dt), VDD=800V, ID=20A, ind. load,
test circuit in Fig.E)
Datasheet
Figure 20
12
Typical switching times as a function of
gate resistor (t=f(RG,ext), VDD=800V,
VGS=0V/15V, ID=20A, Tvj=175°C, ind. load,
test circuit in Fig. E, diode: body diode)
Typical reverse recovery current as a
function of diode current slope
(Irrm=f(dif/dt), VDD=800V, ID=20A, ind. load,
test circuit in Fig.E)
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Electrical characteristic diagrams
Figure 21
Datasheet
Max. transient thermal resistance (MOSFET/diode)
(Zth(j-c,max) = f(tP), parameter D = tp/T, thermal equivalent circuit in Fig. D)
13
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Package drawing
5
Package drawing
PG-TO247-3-41
Figure 22
Datasheet
Package drawing
14
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Test conditions
6
Figure 23
Datasheet
Test conditions
Test conditions
15
V3.0
2019-09-22
AIMW120R045M1
CoolSiC™ 1200V SiC Trench MOSFET
Revision History
Revision History
Major changes since the last revision
Page or Reference
Description of change
All pages
First release of datasheet V3.0
Datasheet
16
V3.0
2019-09-22
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owners.
Published by
Infineon Technologies AG
81726 München, Germany
© Infineon Technologies AG 2019.
All Rights Reserved.
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