DATA SHEET
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NPN Silicon Planar
Epitaxial Transistor
PZT651
SOT−223 PACKAGE HIGH CURRENT
NPN SILICON TRANSISTOR
SURFACE MOUNT
4
This NPN Silicon Epitaxial transistor is designed for use in
industrial and consumer applications. The device is housed in the
SOT−223 package which is designed for medium power surface
mount applications.
SOT−223 package ensures level mounting, resulting in improved
thermal conduction, and allows visual inspection of soldered joints.
The formed leads absorb thermal stress during soldering, eliminating
the possibility of damage to the die.
1
2
3
SOT−223
CASE 318E−04
STYLE 1
COLLECTOR 2, 4
Features
•
•
•
•
•
High Current
The SOT−223 Package can be Soldered Using Wave or Reflow
PNP Complement is PZT751T1G
S Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC−Q101 Qualified and
PPAP Capable
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
BASE
1
EMITTER 3
MARKING DIAGRAM
AYW
651 G
G
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Symbol
Value
Unit
Collector−Emitter Voltage
VCEO
60
Vdc
Collector−Base Voltage
VCBO
80
Vdc
Emitter−Base Voltage
Rating
VEBO
5.0
Vdc
Collector Current
IC
2.0
Adc
Total Power Dissipation
@ TA = 25°C (Note 1)
Derate above 25°C
PD
Storage Temperature Range
Junction Temperature
Thermal Resistance from
Junction−to−Ambient in Free Air
Maximum Temperature for Soldering
Purposes
Time in Solder Bath
A
Y
WW
G
= Assembly Location
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
W
0.8
6.4
mW/°C
Tstg
−65 to 150
°C
TJ
150
°C
Symbol
Max
Unit
RqJA
156
°C/W
TL
260
°C
10
Sec
THERMAL CHARACTERISTICS
Characteristic
1
ORDERING INFORMATION
Package
Shipping†
PZT651T1G
SOT−223
(Pb−Free)
1,000 / Tape & Reel
SPZT651T1G
SOT−223
(Pb−Free)
1,000 / Tape & Reel
Device
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. Device mounted on a FR−4 glass epoxy printed circuit board using minimum
recommended footprint.
© Semiconductor Components Industries, LLC, 2011
June, 2022 − Rev. 11
1
Publication Order Number:
PZT651T1/D
PZT651
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Characteristics
Min
Max
60
−
80
−
5.0
−
−
0.1
−
100
75
75
75
40
−
−
−
−
−
−
0.5
0.3
−
1.0
−
1.2
75
−
Unit
OFF CHARACTERISTICS
Collector−Emitter Breakdown Voltage
(IC = 10 mAdc, IB = 0)
V(BR)CEO
Collector−Emitter Breakdown Voltage
(IC = 100 mAdc, IE = 0)
V(BR)CBO
Emitter−Base Breakdown Voltage
(IE = 10 mAdc, IC = 0)
V(BR)EBO
Base−Emitter Cutoff Current
(VEB = 4.0 Vdc)
IEBO
Collector−Base Cutoff Current
(VCB = 80 Vdc, IE = 0)
ICBO
Vdc
Vdc
Vdc
mAdc
nAdc
ON CHARACTERISTICS (Note 2)
DC Current Gain
(IC = 50 mAdc, VCE = 2.0 Vdc)
(IC = 500 mAdc, VCE = 2.0 Vdc)
(IC = 1.0 Adc, VCE = 2.0 Vdc)
(IC = 2.0 Adc, VCE = 2.0 Vdc)
hFE
Collector−Emitter Saturation Voltages
(IC = 2.0 Adc, IB = 200 mAdc)
(IC = 1.0 Adc, IB = 100 mAdc)
VCE(sat)
Base−Emitter Voltages
(IC = 1.0 Adc, VCE = 2.0 Vdc)
VBE(on)
Base−Emitter Saturation Voltage
(IC = 1.0 Adc, IB = 100 mAdc)
VBE(sat)
Current−Gain — Bandwidth
(IC = 50 mAdc, VCE = 5.0 Vdc, f = 100 MHz)
fT
−
Vdc
Vdc
Vdc
MHz
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle = 2.0%
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2
PZT651
TYPICAL CHARACTERISTICS
2.0
300
270
TJ = 125°C
1.6
V, VOLTAGE (VOLTS)
hFE, DC CURRENT GAIN
240
1.8
VCE = 2.0 V
210
180
25°C
150
120
90
-55°C
1.4
1.2
1.0
VBE(on) @ VCE = 2.0 V
0.6
60
0.4
30
0.2
0
10
VBE(sat) @ IC/IB = 10
0.8
VCE(sat) @ IC/IB = 10
0
20
50
100 200
500 1.0 A 2.0 A 4.0 A
IC, COLLECTOR CURRENT (mA)
50
10
1.0
0.9
0.8
TJ = 25°C
0.7
0.6
0.5
0.4
0.3
200
500
1.0 A
IC, COLLECTOR CURRENT (mA)
IC = 10 mA IC = 100 mA
IC = 500 mA
IC = 2.0 A
0.2
0.1
0
0.05 0.1 0.2
4.0 A
50 100 200 500
10 ms, 1 ms
100 ms
1 ms
1
10 ms
100 ms
0.1
1s
0.01
0.001
0.5 1.0 2.0 5.0 10 20
IB, BASE CURRENT (mA)
2.0 A
Figure 2. On Voltages
IC, COLLECTOR CURRENT (A)
VCE , COLLECTOR-EMITTER VOLTAGE (VOLTS)
Figure 1. Typical DC Current Gain
100
Single Pulse Test @ TA = 25°C
0.01
0.1
1
10
VCE, COLLECTOR−EMITTER VOLTAGE (V)
Figure 3. Collector Saturation Region
Figure 4. Safe Operating Area
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3
100
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOT−223 (TO−261)
CASE 318E−04
ISSUE R
DATE 02 OCT 2018
SCALE 1:1
q
q
DOCUMENT NUMBER:
DESCRIPTION:
98ASB42680B
SOT−223 (TO−261)
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 2
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
SOT−223 (TO−261)
CASE 318E−04
ISSUE R
STYLE 1:
PIN 1.
2.
3.
4.
BASE
COLLECTOR
EMITTER
COLLECTOR
STYLE 2:
PIN 1.
2.
3.
4.
ANODE
CATHODE
NC
CATHODE
STYLE 6:
PIN 1.
2.
3.
4.
RETURN
INPUT
OUTPUT
INPUT
STYLE 7:
PIN 1.
2.
3.
4.
ANODE 1
CATHODE
ANODE 2
CATHODE
STYLE 11:
PIN 1. MT 1
2. MT 2
3. GATE
4. MT 2
STYLE 3:
PIN 1.
2.
3.
4.
GATE
DRAIN
SOURCE
DRAIN
STYLE 8:
STYLE 12:
PIN 1. INPUT
2. OUTPUT
3. NC
4. OUTPUT
CANCELLED
DATE 02 OCT 2018
STYLE 4:
PIN 1.
2.
3.
4.
SOURCE
DRAIN
GATE
DRAIN
STYLE 5:
PIN 1.
2.
3.
4.
STYLE 9:
PIN 1.
2.
3.
4.
INPUT
GROUND
LOGIC
GROUND
STYLE 10:
PIN 1. CATHODE
2. ANODE
3. GATE
4. ANODE
DRAIN
GATE
SOURCE
GATE
STYLE 13:
PIN 1. GATE
2. COLLECTOR
3. EMITTER
4. COLLECTOR
GENERIC
MARKING DIAGRAM*
AYW
XXXXXG
G
1
A
= Assembly Location
Y
= Year
W
= Work Week
XXXXX = Specific Device Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
DOCUMENT NUMBER:
DESCRIPTION:
98ASB42680B
SOT−223 (TO−261)
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 2 OF 2
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
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, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
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