NB3N551
Clock / Data Fanout Buffer,
3.3 V 1:4, with CMOS
Outputs
Description
The NB3N551 is a low skew 1−to 4 clock fanout buffer, designed
for clock distribution in mind. The NB3N551 specifically guarantees
low output−to−output skew. Optimal design, layout and processing
minimize skew within a device and from device to device.
The output enable (OE) pin three−states the outputs when low.
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MARKING
DIAGRAMS*
8
8
1
Features
3N551
ALYW
G
1
Input/Output Clock Frequency up to 180 MHz
Low Skew Outputs (50 ps typical)
RMS Phase Jitter (12 kHz – 20 MHz): 43 fs (Typical)
Output goes to Three−State Mode via OE
Operating Range: VDD = 3.0 V to 5.5 V
Ideal for Networking Clocks
Packaged in 8−pin SOIC
Industrial Temperature Range
These are Pb−Free Devices
3N551
A
L
Y
W
G
DFN8
MN SUFFIX
CASE 506AA
1
6K
M
G
Q1
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
6K MG
G
•
•
•
•
•
•
•
•
•
SOIC−8
D SUFFIX
CASE 751
1
4
= Specific Device Code
= Date Code
= Pb−Free Package
(Note: Microdot may be in either location)
Q2
*For additional marking information, refer to
Application Note AND8002/D.
CLK
Q3
PIN CONNECTIONS
Q4
ICLK
Q1
OE
Q2
Figure 1. Block Diagram
Q3
1
8
2
7
3
6
4
5
OE
VDD
GND
Q4
ORDERING INFORMATION
Device
Package
Shipping†
NB3N551DG
SOIC−8
(Pb−Free)
98 Units/Rail
NB3N551DR2G
SOIC−8
(Pb−Free)
2500/Tape & Reel
NB3N551MNR4G
DFN−8
(Pb−Free)
1000/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2012
July, 2012 − Rev. 4
1
Publication Order Number:
NB3N551/D
NB3N551
Table 1. OE, OUTPUT ENABLE FUNCTION
OE
Function
0
Disable
1
Enable
Table 2. PIN DESCRIPTION
Pin #
Name
Type
Description
1
ICLK
(LV)CMOS/(LV)TTL Input
2
Q1
(LV)CMOS/(LV)TTL Output
Clock Output 1
3
Q2
(LV)CMOS/(LV)TTL Output
Clock Output 2
4
Q3
(LV)CMOS/(LV)TTL Output
Clock Output 3
5
Q4
(LV)CMOS/(LV)TTL Output
Clock Output 4
6
GND
Power
Negative supply voltage; Connect to ground, 0 V
7
VDD
Power
Positive supply voltage (3.0 V to 5.5 V)
8
OE
(LV)CMOS/(LV)TTL Input
−
EP
Thermal Exposed Pad
Clock Input. Internal pull-up resistor.
Output Enable for the clock outputs. Outputs are enabled when HIGH or when left
open; OE pin has internal pull−up resistor. Three−states outputs when LOW.
(DFN8 only) Thermal exposed pad must be connected to a sufficient thermal
conduit. Electrically connect to the most negative supply (GND) or leave unconnected, floating open.
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2
NB3N551
Table 3. MAXIMUM RATINGS
Symbol
VDD
VI/VO
Parameter
Positive Power Supply
Input/Output Voltage
Condition 1
Condition 2
Rating
Units
GND = 0 V
−
7.0
V
t ≤ 1.5 ns
−
GND–1.5 ≤ VI/VO ≤ VDD+1.5
V
TA
Operating Temperature Range, Industrial
−
−
≥ −40 to ≤ +85
°C
Tstg
Storage Temperature Range
−
−
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
SOIC−8
190
130
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
(Note 1)
SOIC−8
41 to 44
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
DFN8
DFN8
129
84
°C/W
qJC
Thermal Resistance (Junction−to−Case)
(Note 1)
DFN8
35 to 40
°C/W
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power)
Table 4. ATTRIBUTES
Characteristic
ESD Protection
Value
Human Body Model
Machine Model
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2)
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
> 4 kV
> 200 V
Level 1
UL−94 code V−0 @ 0.125 in
531 Devices
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
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3
NB3N551
Table 5. DC CHARACTERISTICS (VDD = 3.0 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C) (Note 3)
Symbol
Characteristic
IDD
Power Supply Current @ 135 MHz, No Load, VDD = 3.3 V
VOH
Output HIGH Voltage – IOH = −25 mA, VDD = 3.3 V
VOL
Output LOW Voltage – IOL = 25 mA
VOH
Output HIGH Voltage – IOH = −12 mA (CMOS level)
Min
Typ
Max
Unit
−
20
40
mA
2.4
−
−
V
−
−
0.4
V
VDD − 0.4
−
−
V
(VDD/2)+0.7
−
3.8
V
VIH, ICLK
Input HIGH Voltage, ICLK
VIL, ICLK
Input LOW Voltage, ICLK
−
−
(VDD/2)−0.7
V
VIH, OE
Input HIGH Voltage, OE
2.0
−
VDD
V
VIL, OE
Input LOW Voltage, OE
0
−
0.8
V
ZO
Nominal Output Impedance
−
20
−
W
RPU
Input Pull−up Resistor, OE
−
220
−
kW
CIN
Input Capacitance, OE
−
5.0
−
pF
IOS
Short Circuit Current
−
± 50
−
mA
Min
Typ
Max
Unit
−
50
95
mA
2.4
−
−
V
−
−
0.4
V
VDD – 0.4
−
−
V
(VDD/2) + 1
−
5.5
V
DC CHARACTERISTICS (VDD = 4.5 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3)
Symbol
Characteristic
IDD
Power Supply Current @ 135 MHz, No Load, VDD = 5.0 V
VOH
Output HIGH Voltage – IOH = −35 mA
VOL
Output LOW Voltage – IOL = 35 mA
VOH
Output HIGH Voltage – IOH = −12 mA (CMOS level)
VIH, ICLK
Input HIGH Voltage, ICLK
VIL, ICLK
Input LOW Voltage, ICLK
−
−
(VDD/2) − 1
V
VIH, OE
Input HIGH Voltage, OE
2.0
−
VDD
V
VIL, OE
Input LOW Voltage, OE
0
−
0.8
V
ZO
Nominal Output Impedance
−
20
−
W
RPU
Input Pull−up Resistor, OE
−
220
−
kW
CIN
Input Capacitance, OE
−
5.0
−
pF
IOS
Short Circuit Current
−
±80
−
mA
Min
Typ
Max
Unit
−
−
180
MHz
−
−
43
16
−
−
fs
Table 6. AC CHARACTERISTICS (VDD = 3.0 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3)
Symbol
fin
Characteristic
Conditions
Input Frequency
tjitter (f)
RMS Phase Jitter (Integrated 12 kHz − 20 MHz)
(See Figures 2 and 3)
tjitter (pd)
Period Jitter (RMS, 1s)
−
2.0
−
ps
tr/tf
Output rise and fall times; 0.8 V to 2.0 V
−
0.5
1.0
ns
tpd
Propagation Delay, CLK to Qn, 0 − 180 MHz,
(Note 4)
1.5
3.0
6.0
ns
−
50
160
ps
tskew
fcarrier = 25 MHz
fcarrier = 50 MHz
Output−to−Output Skew; (Note 5)
3. Outputs loaded with external RL = 33−W series resistor and CL = 15 pF to GND. Duty cycle out = duty in. A 0.01 mF decoupling capacitor
should be connected between VDD and GND. A 33 W series terminating resistor may be used on each clock output if the trace is longer than
1 inch.
4. Measured with rail−to−rail input clock.
5. Measured on rising edges at VDD ÷ 2.
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4
NB3N551
Figure 2. Phase Noise Plot at 25 MHz at an Operating Voltage of 3.3 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded region of the plot) is 43 fs (RMS Jitter of the input source is 203.31 fs and Output (DUT+Source) is
247.06 fs).
Figure 3. Phase Noise Plot at 50 MHz at an Operating Voltage of 5 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded region of the plot) is 16 fs (RMS Jitter of the input source is 104.08 fs and Output (DUT + Source) is
119.77 fs).
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DFN8 2x2, 0.5P
CASE 506AA
ISSUE F
DATE 04 MAY 2016
1
SCALE 4:1
D
PIN ONE
REFERENCE
2X
0.10 C
2X
0.10 C
A
B
L1
ÇÇ
ÇÇ
ÇÇ
DETAIL A
E
OPTIONAL
CONSTRUCTIONS
ÉÉ
ÇÇ
ÉÉ
ÇÇ
EXPOSED Cu
TOP VIEW
A
DETAIL B
0.10 C
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994 .
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.20 MM FROM TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
L
L
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
L1
ÉÉ
ÉÉ
ÇÇ
A3
MOLD CMPD
A1
DETAIL B
0.08 C
(A3)
NOTE 4
SIDE VIEW
DETAIL A
ALTERNATE
CONSTRUCTIONS
A1
C
D2
8X
4
1
SEATING
PLANE
RECOMMENDED
SOLDERING FOOTPRINT*
L
5
8
e/2
e
8X
0.90
b
0.05 C
8X
0.50
2.30
1
0.10 C A B
8X
0.30
NOTE 3
BOTTOM VIEW
0.50
PITCH
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
GENERIC
MARKING DIAGRAM*
1
1.30
PACKAGE
OUTLINE
E2
K
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.20 REF
0.20
0.30
2.00 BSC
1.10
1.30
2.00 BSC
0.70
0.90
0.50 BSC
0.30 REF
0.25
0.35
−−−
0.10
XXMG
G
XX = Specific Device Code
M = Date Code
G
= Pb−Free Device
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
DOCUMENT NUMBER:
DESCRIPTION:
98AON18658D
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DFN8, 2.0X2.0, 0.5MM PITCH
PAGE 1 OF 1
onsemi and
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.
© Semiconductor Components Industries, LLC, 2016
www.onsemi.com
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC−8 NB
CASE 751−07
ISSUE AK
8
1
SCALE 1:1
−X−
DATE 16 FEB 2011
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
A
8
5
S
B
0.25 (0.010)
M
Y
M
1
4
−Y−
K
G
C
N
X 45 _
SEATING
PLANE
−Z−
0.10 (0.004)
H
M
D
0.25 (0.010)
M
Z Y
S
X
J
S
8
8
1
1
IC
4.0
0.155
XXXXX
A
L
Y
W
G
IC
(Pb−Free)
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
XXXXXX
AYWW
1
1
Discrete
XXXXXX
AYWW
G
Discrete
(Pb−Free)
XXXXXX = Specific Device Code
A
= Assembly Location
Y
= Year
WW
= Work Week
G
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
1.270
0.050
SCALE 6:1
INCHES
MIN
MAX
0.189
0.197
0.150
0.157
0.053
0.069
0.013
0.020
0.050 BSC
0.004
0.010
0.007
0.010
0.016
0.050
0 _
8 _
0.010
0.020
0.228
0.244
8
8
XXXXX
ALYWX
G
XXXXX
ALYWX
1.52
0.060
0.6
0.024
MILLIMETERS
MIN
MAX
4.80
5.00
3.80
4.00
1.35
1.75
0.33
0.51
1.27 BSC
0.10
0.25
0.19
0.25
0.40
1.27
0_
8_
0.25
0.50
5.80
6.20
GENERIC
MARKING DIAGRAM*
SOLDERING FOOTPRINT*
7.0
0.275
DIM
A
B
C
D
G
H
J
K
M
N
S
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
STYLES ON PAGE 2
DOCUMENT NUMBER:
DESCRIPTION:
98ASB42564B
SOIC−8 NB
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 2
onsemi and
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
SOIC−8 NB
CASE 751−07
ISSUE AK
DATE 16 FEB 2011
STYLE 1:
PIN 1. EMITTER
2. COLLECTOR
3. COLLECTOR
4. EMITTER
5. EMITTER
6. BASE
7. BASE
8. EMITTER
STYLE 2:
PIN 1. COLLECTOR, DIE, #1
2. COLLECTOR, #1
3. COLLECTOR, #2
4. COLLECTOR, #2
5. BASE, #2
6. EMITTER, #2
7. BASE, #1
8. EMITTER, #1
STYLE 3:
PIN 1. DRAIN, DIE #1
2. DRAIN, #1
3. DRAIN, #2
4. DRAIN, #2
5. GATE, #2
6. SOURCE, #2
7. GATE, #1
8. SOURCE, #1
STYLE 4:
PIN 1. ANODE
2. ANODE
3. ANODE
4. ANODE
5. ANODE
6. ANODE
7. ANODE
8. COMMON CATHODE
STYLE 5:
PIN 1. DRAIN
2. DRAIN
3. DRAIN
4. DRAIN
5. GATE
6. GATE
7. SOURCE
8. SOURCE
STYLE 6:
PIN 1. SOURCE
2. DRAIN
3. DRAIN
4. SOURCE
5. SOURCE
6. GATE
7. GATE
8. SOURCE
STYLE 7:
PIN 1. INPUT
2. EXTERNAL BYPASS
3. THIRD STAGE SOURCE
4. GROUND
5. DRAIN
6. GATE 3
7. SECOND STAGE Vd
8. FIRST STAGE Vd
STYLE 8:
PIN 1. COLLECTOR, DIE #1
2. BASE, #1
3. BASE, #2
4. COLLECTOR, #2
5. COLLECTOR, #2
6. EMITTER, #2
7. EMITTER, #1
8. COLLECTOR, #1
STYLE 9:
PIN 1. EMITTER, COMMON
2. COLLECTOR, DIE #1
3. COLLECTOR, DIE #2
4. EMITTER, COMMON
5. EMITTER, COMMON
6. BASE, DIE #2
7. BASE, DIE #1
8. EMITTER, COMMON
STYLE 10:
PIN 1. GROUND
2. BIAS 1
3. OUTPUT
4. GROUND
5. GROUND
6. BIAS 2
7. INPUT
8. GROUND
STYLE 11:
PIN 1. SOURCE 1
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. DRAIN 2
7. DRAIN 1
8. DRAIN 1
STYLE 12:
PIN 1. SOURCE
2. SOURCE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 13:
PIN 1. N.C.
2. SOURCE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 14:
PIN 1. N−SOURCE
2. N−GATE
3. P−SOURCE
4. P−GATE
5. P−DRAIN
6. P−DRAIN
7. N−DRAIN
8. N−DRAIN
STYLE 15:
PIN 1. ANODE 1
2. ANODE 1
3. ANODE 1
4. ANODE 1
5. CATHODE, COMMON
6. CATHODE, COMMON
7. CATHODE, COMMON
8. CATHODE, COMMON
STYLE 16:
PIN 1. EMITTER, DIE #1
2. BASE, DIE #1
3. EMITTER, DIE #2
4. BASE, DIE #2
5. COLLECTOR, DIE #2
6. COLLECTOR, DIE #2
7. COLLECTOR, DIE #1
8. COLLECTOR, DIE #1
STYLE 17:
PIN 1. VCC
2. V2OUT
3. V1OUT
4. TXE
5. RXE
6. VEE
7. GND
8. ACC
STYLE 18:
PIN 1. ANODE
2. ANODE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. CATHODE
8. CATHODE
STYLE 19:
PIN 1. SOURCE 1
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. MIRROR 2
7. DRAIN 1
8. MIRROR 1
STYLE 20:
PIN 1. SOURCE (N)
2. GATE (N)
3. SOURCE (P)
4. GATE (P)
5. DRAIN
6. DRAIN
7. DRAIN
8. DRAIN
STYLE 21:
PIN 1. CATHODE 1
2. CATHODE 2
3. CATHODE 3
4. CATHODE 4
5. CATHODE 5
6. COMMON ANODE
7. COMMON ANODE
8. CATHODE 6
STYLE 22:
PIN 1. I/O LINE 1
2. COMMON CATHODE/VCC
3. COMMON CATHODE/VCC
4. I/O LINE 3
5. COMMON ANODE/GND
6. I/O LINE 4
7. I/O LINE 5
8. COMMON ANODE/GND
STYLE 23:
PIN 1. LINE 1 IN
2. COMMON ANODE/GND
3. COMMON ANODE/GND
4. LINE 2 IN
5. LINE 2 OUT
6. COMMON ANODE/GND
7. COMMON ANODE/GND
8. LINE 1 OUT
STYLE 24:
PIN 1. BASE
2. EMITTER
3. COLLECTOR/ANODE
4. COLLECTOR/ANODE
5. CATHODE
6. CATHODE
7. COLLECTOR/ANODE
8. COLLECTOR/ANODE
STYLE 25:
PIN 1. VIN
2. N/C
3. REXT
4. GND
5. IOUT
6. IOUT
7. IOUT
8. IOUT
STYLE 26:
PIN 1. GND
2. dv/dt
3. ENABLE
4. ILIMIT
5. SOURCE
6. SOURCE
7. SOURCE
8. VCC
STYLE 29:
PIN 1. BASE, DIE #1
2. EMITTER, #1
3. BASE, #2
4. EMITTER, #2
5. COLLECTOR, #2
6. COLLECTOR, #2
7. COLLECTOR, #1
8. COLLECTOR, #1
STYLE 30:
PIN 1. DRAIN 1
2. DRAIN 1
3. GATE 2
4. SOURCE 2
5. SOURCE 1/DRAIN 2
6. SOURCE 1/DRAIN 2
7. SOURCE 1/DRAIN 2
8. GATE 1
DOCUMENT NUMBER:
DESCRIPTION:
98ASB42564B
SOIC−8 NB
STYLE 27:
PIN 1. ILIMIT
2. OVLO
3. UVLO
4. INPUT+
5. SOURCE
6. SOURCE
7. SOURCE
8. DRAIN
STYLE 28:
PIN 1. SW_TO_GND
2. DASIC_OFF
3. DASIC_SW_DET
4. GND
5. V_MON
6. VBULK
7. VBULK
8. VIN
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 2 OF 2
onsemi and
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
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