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NB3N551MNR4G

NB3N551MNR4G

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    VFDFN8_EP

  • 描述:

    Clock Fanout Buffer (Distribution) IC 180MHz 8-VFDFN Exposed Pad

  • 数据手册
  • 价格&库存
NB3N551MNR4G 数据手册
NB3N551 Clock / Data Fanout Buffer, 3.3 V 1:4, with CMOS Outputs Description The NB3N551 is a low skew 1−to 4 clock fanout buffer, designed for clock distribution in mind. The NB3N551 specifically guarantees low output−to−output skew. Optimal design, layout and processing minimize skew within a device and from device to device. The output enable (OE) pin three−states the outputs when low. http://onsemi.com MARKING DIAGRAMS* 8 8 1 Features 3N551 ALYW G 1 Input/Output Clock Frequency up to 180 MHz Low Skew Outputs (50 ps typical) RMS Phase Jitter (12 kHz – 20 MHz): 43 fs (Typical) Output goes to Three−State Mode via OE Operating Range: VDD = 3.0 V to 5.5 V Ideal for Networking Clocks Packaged in 8−pin SOIC Industrial Temperature Range These are Pb−Free Devices 3N551 A L Y W G DFN8 MN SUFFIX CASE 506AA 1 6K M G Q1 = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package 6K MG G • • • • • • • • • SOIC−8 D SUFFIX CASE 751 1 4 = Specific Device Code = Date Code = Pb−Free Package (Note: Microdot may be in either location) Q2 *For additional marking information, refer to Application Note AND8002/D. CLK Q3 PIN CONNECTIONS Q4 ICLK Q1 OE Q2 Figure 1. Block Diagram Q3 1 8 2 7 3 6 4 5 OE VDD GND Q4 ORDERING INFORMATION Device Package Shipping† NB3N551DG SOIC−8 (Pb−Free) 98 Units/Rail NB3N551DR2G SOIC−8 (Pb−Free) 2500/Tape & Reel NB3N551MNR4G DFN−8 (Pb−Free) 1000/Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. © Semiconductor Components Industries, LLC, 2012 July, 2012 − Rev. 4 1 Publication Order Number: NB3N551/D NB3N551 Table 1. OE, OUTPUT ENABLE FUNCTION OE Function 0 Disable 1 Enable Table 2. PIN DESCRIPTION Pin # Name Type Description 1 ICLK (LV)CMOS/(LV)TTL Input 2 Q1 (LV)CMOS/(LV)TTL Output Clock Output 1 3 Q2 (LV)CMOS/(LV)TTL Output Clock Output 2 4 Q3 (LV)CMOS/(LV)TTL Output Clock Output 3 5 Q4 (LV)CMOS/(LV)TTL Output Clock Output 4 6 GND Power Negative supply voltage; Connect to ground, 0 V 7 VDD Power Positive supply voltage (3.0 V to 5.5 V) 8 OE (LV)CMOS/(LV)TTL Input − EP Thermal Exposed Pad Clock Input. Internal pull-up resistor. Output Enable for the clock outputs. Outputs are enabled when HIGH or when left open; OE pin has internal pull−up resistor. Three−states outputs when LOW. (DFN8 only) Thermal exposed pad must be connected to a sufficient thermal conduit. Electrically connect to the most negative supply (GND) or leave unconnected, floating open. http://onsemi.com 2 NB3N551 Table 3. MAXIMUM RATINGS Symbol VDD VI/VO Parameter Positive Power Supply Input/Output Voltage Condition 1 Condition 2 Rating Units GND = 0 V − 7.0 V t ≤ 1.5 ns − GND–1.5 ≤ VI/VO ≤ VDD+1.5 V TA Operating Temperature Range, Industrial − − ≥ −40 to ≤ +85 °C Tstg Storage Temperature Range − − −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm SOIC−8 190 130 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) SOIC−8 41 to 44 °C/W qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm DFN8 DFN8 129 84 °C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) DFN8 35 to 40 °C/W Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) Table 4. ATTRIBUTES Characteristic ESD Protection Value Human Body Model Machine Model Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2) Flammability Rating Oxygen Index: 28 to 34 Transistor Count > 4 kV > 200 V Level 1 UL−94 code V−0 @ 0.125 in 531 Devices Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test 2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D. http://onsemi.com 3 NB3N551 Table 5. DC CHARACTERISTICS (VDD = 3.0 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol Characteristic IDD Power Supply Current @ 135 MHz, No Load, VDD = 3.3 V VOH Output HIGH Voltage – IOH = −25 mA, VDD = 3.3 V VOL Output LOW Voltage – IOL = 25 mA VOH Output HIGH Voltage – IOH = −12 mA (CMOS level) Min Typ Max Unit − 20 40 mA 2.4 − − V − − 0.4 V VDD − 0.4 − − V (VDD/2)+0.7 − 3.8 V VIH, ICLK Input HIGH Voltage, ICLK VIL, ICLK Input LOW Voltage, ICLK − − (VDD/2)−0.7 V VIH, OE Input HIGH Voltage, OE 2.0 − VDD V VIL, OE Input LOW Voltage, OE 0 − 0.8 V ZO Nominal Output Impedance − 20 − W RPU Input Pull−up Resistor, OE − 220 − kW CIN Input Capacitance, OE − 5.0 − pF IOS Short Circuit Current − ± 50 − mA Min Typ Max Unit − 50 95 mA 2.4 − − V − − 0.4 V VDD – 0.4 − − V (VDD/2) + 1 − 5.5 V DC CHARACTERISTICS (VDD = 4.5 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol Characteristic IDD Power Supply Current @ 135 MHz, No Load, VDD = 5.0 V VOH Output HIGH Voltage – IOH = −35 mA VOL Output LOW Voltage – IOL = 35 mA VOH Output HIGH Voltage – IOH = −12 mA (CMOS level) VIH, ICLK Input HIGH Voltage, ICLK VIL, ICLK Input LOW Voltage, ICLK − − (VDD/2) − 1 V VIH, OE Input HIGH Voltage, OE 2.0 − VDD V VIL, OE Input LOW Voltage, OE 0 − 0.8 V ZO Nominal Output Impedance − 20 − W RPU Input Pull−up Resistor, OE − 220 − kW CIN Input Capacitance, OE − 5.0 − pF IOS Short Circuit Current − ±80 − mA Min Typ Max Unit − − 180 MHz − − 43 16 − − fs Table 6. AC CHARACTERISTICS (VDD = 3.0 V to 5.5 V, GND = 0 V, TA = −40°C to +85°C) (Note 3) Symbol fin Characteristic Conditions Input Frequency tjitter (f) RMS Phase Jitter (Integrated 12 kHz − 20 MHz) (See Figures 2 and 3) tjitter (pd) Period Jitter (RMS, 1s) − 2.0 − ps tr/tf Output rise and fall times; 0.8 V to 2.0 V − 0.5 1.0 ns tpd Propagation Delay, CLK to Qn, 0 − 180 MHz, (Note 4) 1.5 3.0 6.0 ns − 50 160 ps tskew fcarrier = 25 MHz fcarrier = 50 MHz Output−to−Output Skew; (Note 5) 3. Outputs loaded with external RL = 33−W series resistor and CL = 15 pF to GND. Duty cycle out = duty in. A 0.01 mF decoupling capacitor should be connected between VDD and GND. A 33 W series terminating resistor may be used on each clock output if the trace is longer than 1 inch. 4. Measured with rail−to−rail input clock. 5. Measured on rising edges at VDD ÷ 2. http://onsemi.com 4 NB3N551 Figure 2. Phase Noise Plot at 25 MHz at an Operating Voltage of 3.3 V, Room Temperature The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz; as shown in the shaded region of the plot) is 43 fs (RMS Jitter of the input source is 203.31 fs and Output (DUT+Source) is 247.06 fs). Figure 3. Phase Noise Plot at 50 MHz at an Operating Voltage of 5 V, Room Temperature The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3N551 device measured with an input source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz; as shown in the shaded region of the plot) is 16 fs (RMS Jitter of the input source is 104.08 fs and Output (DUT + Source) is 119.77 fs). http://onsemi.com 5 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS DFN8 2x2, 0.5P CASE 506AA ISSUE F DATE 04 MAY 2016 1 SCALE 4:1 D PIN ONE REFERENCE 2X 0.10 C 2X 0.10 C A B L1 ÇÇ ÇÇ ÇÇ DETAIL A E OPTIONAL CONSTRUCTIONS ÉÉ ÇÇ ÉÉ ÇÇ EXPOSED Cu TOP VIEW A DETAIL B 0.10 C NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994 . 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.20 MM FROM TERMINAL TIP. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. L L DIM A A1 A3 b D D2 E E2 e K L L1 ÉÉ ÉÉ ÇÇ A3 MOLD CMPD A1 DETAIL B 0.08 C (A3) NOTE 4 SIDE VIEW DETAIL A ALTERNATE CONSTRUCTIONS A1 C D2 8X 4 1 SEATING PLANE RECOMMENDED SOLDERING FOOTPRINT* L 5 8 e/2 e 8X 0.90 b 0.05 C 8X 0.50 2.30 1 0.10 C A B 8X 0.30 NOTE 3 BOTTOM VIEW 0.50 PITCH DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. GENERIC MARKING DIAGRAM* 1 1.30 PACKAGE OUTLINE E2 K MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.20 REF 0.20 0.30 2.00 BSC 1.10 1.30 2.00 BSC 0.70 0.90 0.50 BSC 0.30 REF 0.25 0.35 −−− 0.10 XXMG G XX = Specific Device Code M = Date Code G = Pb−Free Device *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. DOCUMENT NUMBER: DESCRIPTION: 98AON18658D Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. DFN8, 2.0X2.0, 0.5MM PITCH PAGE 1 OF 1 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2016 www.onsemi.com MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK 8 1 SCALE 1:1 −X− DATE 16 FEB 2011 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N X 45 _ SEATING PLANE −Z− 0.10 (0.004) H M D 0.25 (0.010) M Z Y S X J S 8 8 1 1 IC 4.0 0.155 XXXXX A L Y W G IC (Pb−Free) = Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package XXXXXX AYWW 1 1 Discrete XXXXXX AYWW G Discrete (Pb−Free) XXXXXX = Specific Device Code A = Assembly Location Y = Year WW = Work Week G = Pb−Free Package *This information is generic. Please refer to device data sheet for actual part marking. Pb−Free indicator, “G” or microdot “G”, may or may not be present. Some products may not follow the Generic Marking. 1.270 0.050 SCALE 6:1 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 8 8 XXXXX ALYWX G XXXXX ALYWX 1.52 0.060 0.6 0.024 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 GENERIC MARKING DIAGRAM* SOLDERING FOOTPRINT* 7.0 0.275 DIM A B C D G H J K M N S mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. STYLES ON PAGE 2 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 1 OF 2 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com SOIC−8 NB CASE 751−07 ISSUE AK DATE 16 FEB 2011 STYLE 1: PIN 1. EMITTER 2. COLLECTOR 3. COLLECTOR 4. EMITTER 5. EMITTER 6. BASE 7. BASE 8. EMITTER STYLE 2: PIN 1. COLLECTOR, DIE, #1 2. COLLECTOR, #1 3. COLLECTOR, #2 4. COLLECTOR, #2 5. BASE, #2 6. EMITTER, #2 7. BASE, #1 8. EMITTER, #1 STYLE 3: PIN 1. DRAIN, DIE #1 2. DRAIN, #1 3. DRAIN, #2 4. DRAIN, #2 5. GATE, #2 6. SOURCE, #2 7. GATE, #1 8. SOURCE, #1 STYLE 4: PIN 1. ANODE 2. ANODE 3. ANODE 4. ANODE 5. ANODE 6. ANODE 7. ANODE 8. COMMON CATHODE STYLE 5: PIN 1. DRAIN 2. DRAIN 3. DRAIN 4. DRAIN 5. GATE 6. GATE 7. SOURCE 8. SOURCE STYLE 6: PIN 1. SOURCE 2. DRAIN 3. DRAIN 4. SOURCE 5. SOURCE 6. GATE 7. GATE 8. SOURCE STYLE 7: PIN 1. INPUT 2. EXTERNAL BYPASS 3. THIRD STAGE SOURCE 4. GROUND 5. DRAIN 6. GATE 3 7. SECOND STAGE Vd 8. FIRST STAGE Vd STYLE 8: PIN 1. COLLECTOR, DIE #1 2. BASE, #1 3. BASE, #2 4. COLLECTOR, #2 5. COLLECTOR, #2 6. EMITTER, #2 7. EMITTER, #1 8. COLLECTOR, #1 STYLE 9: PIN 1. EMITTER, COMMON 2. COLLECTOR, DIE #1 3. COLLECTOR, DIE #2 4. EMITTER, COMMON 5. EMITTER, COMMON 6. BASE, DIE #2 7. BASE, DIE #1 8. EMITTER, COMMON STYLE 10: PIN 1. GROUND 2. BIAS 1 3. OUTPUT 4. GROUND 5. GROUND 6. BIAS 2 7. INPUT 8. GROUND STYLE 11: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. DRAIN 2 7. DRAIN 1 8. DRAIN 1 STYLE 12: PIN 1. SOURCE 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 13: PIN 1. N.C. 2. SOURCE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 14: PIN 1. N−SOURCE 2. N−GATE 3. P−SOURCE 4. P−GATE 5. P−DRAIN 6. P−DRAIN 7. N−DRAIN 8. N−DRAIN STYLE 15: PIN 1. ANODE 1 2. ANODE 1 3. ANODE 1 4. ANODE 1 5. CATHODE, COMMON 6. CATHODE, COMMON 7. CATHODE, COMMON 8. CATHODE, COMMON STYLE 16: PIN 1. EMITTER, DIE #1 2. BASE, DIE #1 3. EMITTER, DIE #2 4. BASE, DIE #2 5. COLLECTOR, DIE #2 6. COLLECTOR, DIE #2 7. COLLECTOR, DIE #1 8. COLLECTOR, DIE #1 STYLE 17: PIN 1. VCC 2. V2OUT 3. V1OUT 4. TXE 5. RXE 6. VEE 7. GND 8. ACC STYLE 18: PIN 1. ANODE 2. ANODE 3. SOURCE 4. GATE 5. DRAIN 6. DRAIN 7. CATHODE 8. CATHODE STYLE 19: PIN 1. SOURCE 1 2. GATE 1 3. SOURCE 2 4. GATE 2 5. DRAIN 2 6. MIRROR 2 7. DRAIN 1 8. MIRROR 1 STYLE 20: PIN 1. SOURCE (N) 2. GATE (N) 3. SOURCE (P) 4. GATE (P) 5. DRAIN 6. DRAIN 7. DRAIN 8. DRAIN STYLE 21: PIN 1. CATHODE 1 2. CATHODE 2 3. CATHODE 3 4. CATHODE 4 5. CATHODE 5 6. COMMON ANODE 7. COMMON ANODE 8. CATHODE 6 STYLE 22: PIN 1. I/O LINE 1 2. COMMON CATHODE/VCC 3. COMMON CATHODE/VCC 4. I/O LINE 3 5. COMMON ANODE/GND 6. I/O LINE 4 7. I/O LINE 5 8. COMMON ANODE/GND STYLE 23: PIN 1. LINE 1 IN 2. COMMON ANODE/GND 3. COMMON ANODE/GND 4. LINE 2 IN 5. LINE 2 OUT 6. COMMON ANODE/GND 7. COMMON ANODE/GND 8. LINE 1 OUT STYLE 24: PIN 1. BASE 2. EMITTER 3. COLLECTOR/ANODE 4. COLLECTOR/ANODE 5. CATHODE 6. CATHODE 7. COLLECTOR/ANODE 8. COLLECTOR/ANODE STYLE 25: PIN 1. VIN 2. N/C 3. REXT 4. GND 5. IOUT 6. IOUT 7. IOUT 8. IOUT STYLE 26: PIN 1. GND 2. dv/dt 3. ENABLE 4. ILIMIT 5. SOURCE 6. SOURCE 7. SOURCE 8. VCC STYLE 29: PIN 1. BASE, DIE #1 2. EMITTER, #1 3. BASE, #2 4. EMITTER, #2 5. COLLECTOR, #2 6. COLLECTOR, #2 7. COLLECTOR, #1 8. COLLECTOR, #1 STYLE 30: PIN 1. DRAIN 1 2. DRAIN 1 3. GATE 2 4. SOURCE 2 5. SOURCE 1/DRAIN 2 6. SOURCE 1/DRAIN 2 7. SOURCE 1/DRAIN 2 8. GATE 1 DOCUMENT NUMBER: DESCRIPTION: 98ASB42564B SOIC−8 NB STYLE 27: PIN 1. ILIMIT 2. OVLO 3. UVLO 4. INPUT+ 5. SOURCE 6. SOURCE 7. SOURCE 8. DRAIN STYLE 28: PIN 1. SW_TO_GND 2. DASIC_OFF 3. DASIC_SW_DET 4. GND 5. V_MON 6. VBULK 7. VBULK 8. VIN Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. PAGE 2 OF 2 onsemi and are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others. © Semiconductor Components Industries, LLC, 2019 www.onsemi.com onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as−is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Email Requests to: orderlit@onsemi.com onsemi Website: www.onsemi.com ◊ TECHNICAL SUPPORT North American Technical Support: Voice Mail: 1 800−282−9855 Toll Free USA/Canada Phone: 011 421 33 790 2910 Europe, Middle East and Africa Technical Support: Phone: 00421 33 790 2910 For additional information, please contact your local Sales Representative
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