STB15810
N-channel 100 V, 3.4 mΩ typ., 110 A, STripFET™ F7
Power MOSFET in a D²PAK package
Datasheet - custom data
Features
TAB
Order code
VDS
RDS(on)max
ID
PTOT
STB15810
100 V
3.9 mΩ
110 A
250 W
2
3
1
100% avalanche tested
Ultra low on-resistance
Applications
D²PAK
Switching applications
Description
Figure 1: Internal schematic diagram
This N-channel Power MOSFET utilizes
STripFET™ F7 technology with an enhanced
trench gate structure that results in very low
on-state resistance, while also reducing internal
capacitance and gate charge for faster and more
efficient switching.
Table 1: Device summary
Order code
Marking
Package
Packaging
STB15810
15810
D²PAK
Tape and reel
March 2017
DocID030395 Rev 1
This is a document intended for a specific customer. It must not be
released without first contacting Division marketing.
1/14
www.st.com
Contents
STB15810
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
5
2/14
4.1
D²PAK (TO-263) type B package information ................................... 9
4.2
D²PAK type B packing information .................................................. 11
Revision history ............................................................................ 13
DocID030395 Rev 1
STB15810
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
100
V
VGS
Gate- source voltage
±20
V
ID
Drain current (continuous) at TC = 25 °C
110
A
ID
Drain current (continuous) at TC = 100 °C
110
A
Drain current (pulsed) TC = 25 °C
440
A
PTOT
Total dissipation at TC = 25 °C
250
W
EAS(2)
Single pulse avalanche energy
495
mJ
-55 to 175
°C
Value
Unit
IDM
(1)
TJ
Operating junction temperature range
Tstg
Storage temperature range
Notes:
(1)Pulse
width is limited by safe operating area.
(2)Starting
Tj = 25 °C, ID = 30 A, VDD = 50 V
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
0.6
°C/W
Rthj-pcb(1)
Thermal resistance junction-pcb
35
°C/W
Notes:
(1)
When mounted on 1 inch² FR-4 board, 2 oz Cu
DocID030395 Rev 1
3/14
Electrical characteristics
2
STB15810
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 4: On /off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS = 0 V, ID = 250 µA
Min.
Typ.
Max.
100
Unit
V
VGS = 0 V, VDS = 100 V
1
µA
VGS = 0 V, VDS = 100 V,
TC = 125 °C(1)
100
µA
Gate-body leakage
current
VDS = 0 V, VGS = 20 V
100
nA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
4.5
V
RDS(on)
Static drain-source
on- resistance
VGS = 10 V, ID = 55 A
3.4
3.9
mΩ
Min.
Typ.
Max.
Unit
-
8115
-
pF
-
1510
-
pF
-
67
-
pF
-
117
-
nC
-
47
-
nC
-
26
-
nC
IDSS
Zero gate voltage
drain current
IGSS
2.5
Notes:
(1)Defined
by design, not subject to production test.
Table 5: Dynamic
Symbol
4/14
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
Test conditions
VDS = 50 V, f = 1 MHz,
VGS = 0 V
VDD = 50 V, ID = 110 A,
VGS = 0 to 10 V
(see Figure 14: "Test circuit for
gate charge behavior")
DocID030395 Rev 1
STB15810
Electrical characteristics
Table 6: Switching times
Symbol
td(on)
Parameter
Turn-on delay time
tr
Rise time
td(off)
Turn-off delay time
tf
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 50 V, ID = 55 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 13: "Test circuit for
resistive load switching times"
and Figure 18: "Switching time
waveform")
-
33
-
ns
-
57
-
ns
-
72
-
ns
-
33
-
ns
Min.
Typ.
Max.
Unit
Table 7: Source drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
110
A
ISDM(1)
Source-drain current
(pulsed)
-
440
A
VSD (2)
Forward on voltage
ISD = 110 A, VGS = 0
-
1.2
V
ISD = 110 A, di/dt = 100 A/µs,
VDD = 80 V, TJ =150 °C
(see Figure 15: "Test circuit for
inductive load switching and
diode recovery times")
-
70
ns
-
165
nC
-
4.7
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)Pulse
width is limited by safe operating area.
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%.
DocID030395 Rev 1
5/14
Electrical characteristics
2.1
STB15810
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
AM18051v1
ID
(A)
100
is
ea n)
ar S(o
D
is
h
t
R
in ax
n
tio y m
b
ra
e
d
p ite
O
Lim
10
100µs
1ms
1
Tj=175°C
Tc=25°C
Single pulse
0.1
0.1
1
10ms
VDS(V)
10
Figure 4: Output characteristics
Figure 5: Transfer characteristics
AM18042v1
ID(A)
VGS=10V
400
8V
AM18043v1
ID
(A)
VDS=4V
300
350
7V
300
250
200
250
200
150
6V
150
100
100
50
50
5V
0
0
4
2
6
8
VDS(V)
Figure 6: Gate charge vs gate-source voltage
AM18044v1
VGS
(V)
VDD=50V
ID=110A
12
0
0
2
4
8
6
VGS(V)
Figure 7: Static drain-source on-resistance
RDS(on)
(mΩ)
3.430
VGS=10V
3.420
10
3.410
8
3.400
6
3.390
4
3.380
2
3.370
3.360
0
0
6/14
40
80
120
Qg(nC)
DocID030395 Rev 1
0
20
40
60
80
100 ID(A)
STB15810
Electrical characteristics
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 8: Capacitance variations
AM18047v1
VGS(th)
(norm)
ID=250µA
1.1
1
0.9
0.8
0.7
0.6
0.5
0.4
-75
Figure 10: Normalized on-resistance vs temperature
25
75
125
TJ(°C)
Figure 11: Normalized V(BR)DSS vs temperature
AM18048v1
RDS(on)
-25
AM18049v1
V(BR)DSS
(norm)
(norm)
ID=55A
2
1.04
1.8
1.03
1.6
1.02
1.4
1.01
1.2
1
1
0.99
0.8
0.98
ID=1mA
0.6
0.97
0.4
-75
0.96
-75
-25
25
75
TJ(°C)
125
-25
25
75
125
TJ(°C)
Figure 12: Source-drain diode forward characteristics
AM18055v1
VSD(V)
TJ=-55°C
1
0.9
TJ=25°C
0.8
0.7
TJ=175°C
0.6
0.5
0.4
0.3
0
20
40
60
80
DocID030395 Rev 1
100 ISD(A)
7/14
Test circuits
3
8/14
STB15810
Test circuits
Figure 13: Test circuit for resistive load
switching times
Figure 14: Test circuit for gate charge
behavior
Figure 15: Test circuit for inductive load
switching and diode recovery times
Figure 16: Unclamped inductive load test
circuit
Figure 17: Unclamped inductive waveform
Figure 18: Switching time waveform
DocID030395 Rev 1
STB15810
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
D²PAK (TO-263) type B package information
Figure 19: D²PAK (TO-263) type B package outline
0079457_23_B
DocID030395 Rev 1
9/14
Package information
STB15810
Table 8: D²PAK (TO-263) type B mechanical data
mm
Dim.
Min.
Max.
A
4.36
4.56
A1
0
0.25
b
0.70
0.90
b1
0.51
0.89
b2
1.17
1.37
b3
1.36
1.46
c
0.38
0.694
c1
0.38
0.534
c2
1.19
1.34
D
8.60
9.00
D1
6.90
7.50
E
10.15
10.55
E1
8.10
8.70
e
2.54 BSC
H
15.00
15.60
L
1.90
2.50
L1
1.65
L2
1.78
L3
L4
10/14
Typ.
0.25
4.78
DocID030395 Rev 1
5.28
STB15810
Package information
Figure 20: D²PAK (TO-263) type B recommended footprint (dimensions are in mm)
4.2
D²PAK type B packing information
Figure 21: D2PAK type B tape outline
DocID030395 Rev 1
11/14
Package information
STB15810
Figure 22: D2PAK type B reel outline
Table 9: D²PAK type B reel mechanical data
mm
Dim.
Min.
A
330
B
1.5
C
12.8
D
20.2
G
24.4
N
100
T
12/14
Max.
13.2
26.4
30.4
DocID030395 Rev 1
STB15810
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
07-Mar-2017
1
Changes
First release
DocID030395 Rev 1
13/14
STB15810
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14/14
DocID030395 Rev 1
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