STFU10NK60Z
N-channel 600 V, 0.68 Ω typ., 10 A, SuperMESH™
Power MOSFET in a TO-220FP ultra narrow leads package
Datasheet - production data
Features
1
2
Order code
VDS
RDS(on) max.
ID
STFU10NK60Z
600 V
0.75 Ω
10 A
3
Ptot
35 W
Extremely high dv/dt capability
100% avalanche tested
Gate charge minimized
Zener-protected
Applications
TO-220FP
ultra narrow leads
Switching applications
Figure 1: Internal schematic diagram
Description
This high voltage device is a Zener-protected
N-channel Power MOSFET developed using the
SuperMESH™ technology by
STMicroelectronics, an optimization of the
well-established PowerMESH™. In addition to a
significant reduction in on-resistance, this device
is designed to ensure a high level of dv/dt
capability for the most demanding applications.
Table 1: Device summary
Order code
Marking
Package
Packaging
STFU10NK60Z
10NK60Z
TO-220FP ultra narrow leads
Tube
December 2016
DocID028779 Rev 3
This is information on a product in full production.
1/13
www.st.com
Contents
STFU10NK60Z
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 9
4
Package information ..................................................................... 10
4.1
5
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TO-220FP ultra narrow leads package information ......................... 10
Revision history ............................................................................ 12
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1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
600
V
VGS
Gate-source voltage
±30
V
ID(1)
Drain current (continuous) at TC= 25 °C
10
A
ID(1)
Drain current (continuous) at TC = 100 °C
5.7
A
IDM(2)
Drain current (pulsed)
36
A
PTOT
Total dissipation at TC = 25 °C
35
W
ESD
Gate-source, human body model (R = 1.5 kΩ, C = 100 pF)
4
kV
4.5
V/ns
2500
V
-55 to 150
°C
Value
Unit
dv/dt
(3)
Peak diode recovery voltage slope
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1s; TC= 25 °C)
VISO
Tj
Operation junction temperature range
Tstg
Storage temperature range
Notes:
(1)Limited
(2)Pulse
(3)I
SD
by package
width limited by safe operating area
< 10 A , di/dt < 200 A/μs , VDD = 80 % V(BR)DSS
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case max
3.6
°C/W
Rthj-amb
Thermal resistance junction-ambient max
62.5
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or non-repetitive
(pulse width limited by TJ max)
10
A
EAS
Single pulse avalanche energy
(starting TJ = 25 °C, ID = IAR, VDD = 50 V)
300
mJ
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Electrical characteristics
2
STFU10NK60Z
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 5: On /off states
Symbol
Parameter
V(BR)DSS
Drain-source breakdown
voltage
IDSS
Zero gate voltage drain
current
IGSS
Test conditions
Min.
VGS = 0 V, ID = 250 μA
600
Typ.
Max.
Unit
V
VGS = 0 V, VDS = 600 V
1
µA
VGS = 0 V, VDS = 600 V,
TC = 125 °C(1)
50
µA
Gate-body leakage current
VDS = 0 V, VGS = +20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
3.75
4.5
V
RDS(on)
Static drain-source
on- resistance
VGS = 10 V, ID = 4.5 A
0.68
0.75
Ω
Min.
Typ.
Max.
Unit
-
1370
-
pF
-
156
-
pF
-
37
-
pF
3
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VGS = 0 V, VDS = 25 V,
f = 1 MHz
Coss
Output capacitance
Crss
Reverse transfer capacitance
(1)
Equivalent output capacitance
VGS= 0 V, VDS= 0 to 480 V
-
93
-
pF
Qg
Total gate charge
-
48
-
nC
Qgs
Gate-source charge
-
8
-
nC
Qgd
Gate-drain charge
VDD = 480 V, ID = 8 A,
VGS = 10 V
(see Figure 13: "Test circuit
for gate charge behavior")
-
25
-
nC
Coss eq
Notes:
(1)C
oss eq
is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80%
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/13
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 300 V, ID = 4 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 12: "Test circuit
for resistive load switching
times" and Figure 17:
"Switching time waveform")
-
20
-
ns
-
20
-
ns
-
55
-
ns
-
30
-
ns
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STFU10NK60Z
Electrical characteristics
Table 8: Source drain diode
Symbol
Parameter
Test conditions
ISD(1)
Source-drain current
ISDM(2)
Source-drain current
(pulsed)
VSD(3)
Forward on voltage
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Min.
Typ.
Max.
Unit
-
10
V
-
36
A
ISD= 10 A, VGS = 0 V
-
1.6
V
ISD = 8 A, di/dt = 100 A/µs,
VDD = 40 V , TJ = 150 °C
(see Figure 14: "Test circuit for
inductive load switching and
diode recovery times")
-
570
ns
-
4.1
µC
-
15
A
Min.
Typ.
Max.
Unit
±30
-
-
V
Notes:
(1)Limited
(2)Pulse
by package
width limited by safe operating area
(3)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Test conditions
Gate-source breakdown
voltage
IGS = ±1 mA, ID = 0 A
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.
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Electrical characteristics
2.1
STFU10NK60Z
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 4: Output characteristics
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Figure 3: Thermal impedance
Figure 5: Gate charge vs gate-source voltage
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STFU10NK60Z
Electrical characteristics
Figure 6: Capacitance variations
Figure 7: Static drain-source on-resistance
Figure 8: Normalized gate threshold voltage vs
temperature
Figure 9: Normalized on-resistance vs temperature
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Electrical characteristics
STFU10NK60Z
Figure 10: Source-drain diode forward
characteristics
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Figure 11: Maximum avalanche energy
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3
Test circuits
Test circuits
Figure 12: Test circuit for resistive load
switching times
Figure 13: Test circuit for gate charge
behavior
Figure 14: Test circuit for inductive load
switching and diode recovery times
Figure 15: Unclamped inductive load test
circuit
Figure 16: Unclamped inductive waveform
Figure 17: Switching time waveform
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Package information
4
STFU10NK60Z
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
TO-220FP ultra narrow leads package information
Figure 18: TO-220FP ultra narrow leads package outline
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Package information
Table 10: TO-220FP ultra narrow leads mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.40
4.60
B
2.50
2.70
D
2.50
2.75
E
0.45
0.60
F
0.65
0.75
F1
-
0.90
G
4.95
5.20
G1
2.40
H
10.00
10.40
L2
15.10
15.90
L3
28.50
30.50
L4
10.20
11.00
L5
2.50
3.10
L6
15.60
16.40
L7
9.00
9.30
L8
L9
3.20
3.60
-
1.30
Dia.
3.00
3.20
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Revision history
5
STFU10NK60Z
Revision history
Table 11: Document revision history
Date
Revision
07-Jan-2016
1
Initial release.
12-Sep-2016
2
Document status changed from preliminary to production data.
Minor text changes.
3
Updated Features on cover page.
Updated Table 2: "Absolute maximum ratings" and added Table 4:
"Avalanche characteristics".
Updated Table 5: "On /off states", Table 6: "Dynamic", Table 8: "Source
drain diode" and Table 9: "Gate-source Zener diode".
Minor text changes
05-Dec-2016
12/13
Changes
DocID028779 Rev 3
STFU10NK60Z
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