STN4NF20L
N-channel 200 V, 1.1 Ω, 1 A SOT-223
low gate charge STripFET™ II Power MOSFET
Features
Order code
VDSS
RDS(on)
max.
ID
STN4NF20L
200 V
< 1.5 Ω
1A
■
100% avalanche tested
■
Low gate charge
■
Exceptional dv/dt capability
2
1
2
3
SOT-223
Application
Switching applications
Description
This N-channel 200 V realized with
STMicroelectronics unique STripFET™ process
has specifically been designed to minimize input
capacitance and gate charge. It is therefore
suitable as primary switch in advanced high
efficiency isolated DC-DC converters.
Figure 1.
Internal schematic diagram
$
'
3
!-V
Table 1.
Device summary
Order code
Marking
Package
Packaging
STN4NF20L
4NF20L
SOT-223
Tape and reel
October 2010
Doc ID 17445 Rev 2
1/12
www.st.com
12
Contents
STN4NF20L
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1
Electrical characteristics (curves)
............................. 6
3
Test circuits
4
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2/12
.............................................. 8
Doc ID 17445 Rev 2
STN4NF20L
1
Electrical ratings
Electrical ratings
Table 2.
Absolute maximum ratings
Symbol
VGS
Parameter
Gate-source voltage
Value
Unit
± 20
V
ID
Drain current continuous TC = 25 °C
1
A
ID
Drain current continuous TC = 100 °C
0.63
A
4
A
IDM (1)
Drain current pulsed
PTOT(2)
Total dissipation at TC = 25 °C
3.3
W
Peak diode recovery voltage slope
20
V/ns
- 55 to 150
°C
Value
Unit
38
°C/W
62.5
°C/W
Value
Unit
1
A
90
mJ
dv/dt
(3)
Tj
Tstg
Operating junction temperature
Storage temperature
1. Pulse width limited by safe operating area.
2. This value is rated according to Rthj-amb ≤ 10 sec.
3. Isd ≤ 1 A, di/dt ≤ 200 A/µs, VDD ≤ 80% V(BR)DSS.
Table 3.
Thermal data
Symbol
Rthj-amb(1)
Rthj-amb
(2)
Parameter
Thermal resistance junction to ambient
1. When mounted on 1 inch² FR-4 board, 2 oz. Cu, (t < 10 sec).
2. When mounted on 1 inch² FR-4 board, 2 oz. Cu, (t > 10 sec).
Table 4.
Thermal data
Symbol
IAR
EAS
Parameter
(1)
Avalanche current, repetetive or not repetetive
Single pulse avalanche energy
(2)
1. Pulse width limited by TJMAX.
2. Starting Tj = 25 °C, ID = IAR, VDD = 50 V.
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Electrical characteristics
2
STN4NF20L
Electrical characteristics
(Tcase = 25 °C unless otherwise specified)
Table 5.
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source
breakdown voltage
ID = 1 mA, VGS = 0
IDSS
VDS = Max rating
Zero gate voltage
drain current (VGS = 0) VDS = Max rating, TC=125 °C
IGSS
Gate-body leakage
current (VDS = 0)
Gate threshold voltage VGS = VDS, ID = 250 µA
RDS(on)
Static drain-source on
resistance
Symbol
Min.
Typ.
Max.
200
Unit
V
1
50
µA
µA
± 100
nA
2
3
V
1.1
1.13
1.5
1.55
Ω
Ω
Min.
Typ.
Max.
Unit
VGS = ± 20 V, VDS=0
VGS(th)
Table 6.
1
VGS = 10 V, ID = 0.5 A
VGS = 5 V, ID = 0.5 A
Dynamic
Parameter
Test conditions
Input capacitance
Output capacitance
Reverse transfer
capacitance
VDS = 25 V, f = 1 MHz,
VGS = 0
-
150
30
4
-
pF
pF
pF
Rg
Instrinsic gate
resistance
f=1 MHz open drain
-
5.5
-
Ω
Qg
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain charge
VDD = 160 V, ID = 1 A,
VGS = 10 V
(see Figure 13)
-
0.9
2.6
6.9
-
nC
nC
nC
Min.
Typ.
Max
Unit
-
3.6
2
10.4
15.4
-
ns
ns
ns
ns
Ciss
Coss
Crss
Table 7.
Symbol
td(v)
tr
tf
tc(off)
4/12
On /off states
Switching times
Parameter
Voltage delay time
Voltage rise time
Current fall time
Crossing time
Test conditions
VDD = 100 V, ID = 0.5 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 12)
Doc ID 17445 Rev 2
STN4NF20L
Electrical characteristics
Table 8.
Symbol
Source drain diode
Parameter
ISDM (1)
Source-drain current
Source-drain current
(pulsed)
VSD (2)
Forward on voltage
ISD
trr
Qrr
IRRM
trr
Qrr
IRRM
Test conditions
ISD = 1 A, VGS = 0
Reverse recovery time
ISD = 1 A, di/dt = 100 A/µs
Reverse recovery charge VDD = 60 V
Reverse recovery current (see Figure 14)
Reverse recovery time
ISD = 1 A, di/dt = 100 A/µs
Reverse recovery charge VDD = 60 V, Tj = 150 °C
Reverse recovery current (see Figure 14)
Min.
Typ.
Max.
Unit
-
1
4
A
A
-
1.6
V
-
51
90
3.5
ns
nC
A
-
56
105
3.7
ns
nC
A
1. Pulse width limited by safe operating area
2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Doc ID 17445 Rev 2
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Electrical characteristics
STN4NF20L
2.1
Electrical characteristics (curves)
Figure 2.
Safe operating area
Figure 3.
Thermal impedance
Figure 5.
Transfer characteristics
AM08185v1
ID
(A)
(o
10µs
DS
Op
Lim era
ite tion
d
by in th
m is a
ax
R re
1
n)
a
is
Tj=150°C
Tc=25°C
Single pulse
100µs
0.1
1ms
10ms
0.01
0.1
Figure 4.
10
1
VDS(V)
100
Output characteristics
AM08186v1
ID
(A)
VGS=10V
AM08187v1
ID
(A)
6
VDS=15V
5
5V
5
4
4
3
4V
3
2
2
1
1
3V
0
0
Figure 6.
20
10
Normalized BVDSS vs temperature
AM08188v1
BVDSS
0
0
VDS(V)
(norm)
Figure 7.
2
3
4
5
6
7
8
9
VGS(V)
Static drain-source on resistance
AM08189v1
RDS(on)
(Ohm)
1.11
1.09
1
ID=0.5A
VGS=5V
1.08
1.07
1.06
1.05
1.03
1.04
1.01
VGS=10V
0.99
1.02
0.97
0.95
0.93
-50 -25
6/12
0
25
50
75 100
TJ(°C)
Doc ID 17445 Rev 2
1
0
0.2
0.4
0.6
0.8
1
ID(A)
STN4NF20L
Figure 8.
Electrical characteristics
Gate charge vs gate-source voltage Figure 9.
AM08190v1
VGS
(V)
VDD=160V
12
VGS
500
ID=1A
VDS
10
Capacitance variations
AM08191v1
C
(pF)
300
400
200
8
300
Ciss
6
200
4
100
100
2
Coss
0
0
1
2
4
3
5
6
7
8
0
Qg(nC)
Figure 10. Normalized gate threshold voltage
vs temperature
AM08192v1
VGS(th)
0 Crss
0
10
(norm)
20
30
40
50
60
VDS(V)
Figure 11. Normalized on resistance vs
temperature
AM08193v1
RDS(on)
(norm)
2.1
1.10
1.9
1.7
1.00
1.5
1.3
0.90
1.1
0.80
0.9
0.70
-50 -25
0.5
-50 -25
0.7
0
25
50
75 100
TJ(°C)
Doc ID 17445 Rev 2
0
25
50
75 100
TJ(°C)
7/12
Test circuits
3
STN4NF20L
Test circuits
Figure 12. Switching times test circuit for
resistive load
Figure 13. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
3.3
μF
2200
RL
μF
VGS
IG=CONST
VDD
100Ω
Vi=20V=VGMAX
VD
RG
2200
μF
D.U.T.
D.U.T.
VG
2.7kΩ
PW
47kΩ
1kΩ
PW
AM01468v1
AM01469v1
Figure 14. Test circuit for inductive load
Figure 15. Unclamped inductive load test
switching and diode recovery times
circuit
A
A
D.U.T.
FAST
DIODE
B
B
L
A
D
G
VD
L=100μH
S
3.3
μF
B
25 Ω
1000
μF
D
VDD
2200
μF
3.3
μF
VDD
ID
G
RG
S
Vi
D.U.T.
Pw
AM01470v1
Figure 16. Unclamped inductive waveform
AM01471v1
Figure 17. Switching time waveform
ton
V(BR)DSS
tdon
VD
toff
tr
tdoff
tf
90%
90%
IDM
10%
ID
VDD
10%
0
VDD
VDS
90%
VGS
AM01472v1
8/12
0
Doc ID 17445 Rev 2
10%
AM01473v1
STN4NF20L
4
Package mechanical data
Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com. ECOPACK
is an ST trademark.
Doc ID 17445 Rev 2
9/12
Package mechanical data
STN4NF20L
SOT-223 mechanical data
mm.
DIM.
min.
typ
A
max.
1.80
A1
0.02
B
0.60
0.70
0.85
0.1
B1
2.90
3.00
3.15
c
0.24
0.26
0.35
D
6.30
6.50
6.70
e
2.30
e1
4.60
E
3.30
3.50
3.70
H
6.70
7.00
7.30
10 o
V
0046067_L
10/12
Doc ID 17445 Rev 2
STN4NF20L
5
Revision history
Revision history
Table 9.
Document revision history
Date
Revision
Changes
29-Apr-2010
1
First release.
11-Oct-2010
2
Document status promoted from preliminary data to datasheet.
Doc ID 17445 Rev 2
11/12
STN4NF20L
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