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TAS5717PHPR

TAS5717PHPR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    HTQFP48

  • 描述:

    Amplifier IC 2-Channel (Stereo) with Stereo Headphones Class D 48-HTQFP (7x7)

  • 数据手册
  • 价格&库存
TAS5717PHPR 数据手册
TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com 10-W/15-W Digital Audio Power Amplifier with Integrated Cap-Free HP Amplifier Check for Samples: TAS5717, TAS5719 FEATURES 1 • 2 • • Audio Input/Output – TAS5717 Supports 2×10 W and TAS5719 Supports 2×15 W Output – Wide PVDD Range, From 4.5 V to 26 V – Efficient Class-D Operation Eliminates Need for Heatsinks – Requires Only 3.3 V and PVDD – One Serial Audio Input (Two Audio Channels) – I2C Address Selection via PIN (Chip Select) – Supports 8-kHz to 48-kHz Sample Rate (LJ/RJ/I2S) – External Headphone-Amplifier Shutdown Signal – Integrated CAP-Free Headphone Amplifier – Stereo Headphone (Stereo 2-V RMS Line Driver) Outputs Audio/PWM Processing – Independent Channel Volume Controls With 24-dB to Mute – Programmable Two-Band Dynamic Range Control – 14 Programmable Biquads for Speaker EQ – Programmable Coefficients for DRC Filters – DC Blocking Filters – 0.125-dB Fine Volume Support General Features – Serial Control Interface Operational Without MCLK – Factory-Trimmed Internal Oscillator for Automatic Rate Detection – Surface Mount, 48-Pin, 7-mm × 7-mm HTQFP Package – AD, BD, and Ternary PWM-Mode Support – Thermal and Short-Circuit Protection • Benefits – EQ: Speaker Equalization Improves Audio Performance – DRC: Dynamic Range Compression. Can Be Used As Power Limiter. Enables Speaker Protection, Easy Listening, Night-Mode Listening – DirectPath Technology: Eliminates Bulky DC Blocking Capacitors – Stereo Headphone/Stereo Line Drivers: Adjust Gain via External Resistors, Dedicated Active Headpone Mute Pin, High Signal-to-Noise Ratio – Two-Band DRC: Set Two Different Thresholds for Low- and High-Frequency Content DESCRIPTION The TAS5717/TAS5719 is a 10-W/15-W, efficient, digital audio-power amplifier for driving stereo bridge-tied speakers. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers. The TAS5717/9 is a slave-only device receiving all clocks from external sources. The TAS5717/TAS5719 operates with a PWM carrier between a 384-kHz switching rate and a 352-KHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. FilterPro is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. © 2010–2011, Texas Instruments Incorporated TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. SIMPLIFIED APPLICATION DIAGRAM 3.3 V 4.5 V–26 V AVDD/DVDD/ HP_VDD PVDD OUT_A LRCLK Digital Audio Source SCLK BST_A MCLK SDIN LCBTL BST_B OUT_B 2 I C Control SDA OUT_C SCL BST_C Control Inputs RESET LCBTL BST_D PDN OUT_D Loop Filter PLL_FLTP (1) PLL_FLTM HPL_OUT Headphone IN (Single-Ended) HPL_IN HPR_OUT HPL_OUT HP_SD B0264-13 (1) See the TAS5717/9 User's Guide for loop-filter values. 2 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com FUNCTIONAL VIEW OUT_A th SDIN Serial Audio Port S R C Digital Audio Processor (DAP) 4 Order Noise Shaper and PWM 2´ HB FET Out OUT_B OUT_C 2´ HB FET Out OUT_D Protection Logic MCLK SCLK LRCLK SDA SCL Click and Pop Control Sample Rate Autodetect and PLL Serial Control Microcontroller Based System Control Terminal Control HPL_IN HPL_OUT HPR_IN HPR_OUT Charge Pump Headphone Amp/Line Driver B0262-08 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 3 4 R L 1BQ 30 1BQ 26 0x77 0x76 0x73 0x72 9BQ 31–39 9BQ 27–2F Submit Documentation Feedback Product Folder Link(s): TAS5717 TAS5719 2BQ 5A, 5B 2BQ 5E, 5F 2BQ 5C, 5D 2BQ 58, 59 0x75 0x74 v2im1 0x71 0x70 2 Vol Vol Vol2 Vol1 0x46[1] 0x46[0] Vol Config Reg 0x0E AGL AGL I C Subaddress in Red 0x52[0] 0x52[1] 0x51[0] 0x51[1] 2 2 32 Level Meter clip24 clip24 2 I C:0x6B (32Bit-Left Level) 32 32 32 I C:0x6C (32 Bit-Right Level) I C:57 VDISTB 2 I C:56 VDISTA B0321-11 24 24 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com DAP PROCESS STRUCTURE © 2010–2011, Texas Instruments Incorporated TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com PIN ASSIGNMENT AND DESCRIPTIONS PGND_CD OUT_D BST_C OUT_C BST_B OUT_B OUT_A PGND_AB BST_A PVDD_AB HP_PWMR HP_PWML PHP Package (Top View) 48 47 46 45 44 43 42 41 40 39 38 37 HPL_IN 1 36 BST_D HPL_OUT 2 35 PVDD_CD HPR_OUT 3 34 GVDD_OUT HPR_IN 4 33 HP_SD HPVSS 5 32 SSTIMER CPN 6 31 VREG CPP 7 30 AGND HPVDD 8 29 GND AVSS 9 28 DVSS PLL_FLTM 10 27 DVDD PLL_FLTP 11 26 STEST VR_ANA 12 25 RESET TAS5717 (TAS5719) SCL SDA SDIN SCLK LRCLK PDN VR_DIG DVSSO MCLK OSC_RES A_SEL AVDD 13 14 15 16 17 18 19 20 21 22 23 24 P0075-11 PIN FUNCTIONS PIN NAME NO. TYPE (1) 5-V TERMINATION (2) TOLERANT DESCRIPTION AGND 30 P A_SEL 14 DIO AVDD 13 P 3.3-V analog power supply AVSS 9 P Analog 3.3-V supply ground BST_A 45 P High-side bootstrap supply for half-bridge A BST_B 41 P High-side bootstrap supply for half-bridge B BST_C 40 P High-side bootstrap supply for half-bridge C BST_D 36 P High-side bootstrap supply for half-bridge D CPN 6 IO Charge-pump flying-capacitor negative connection CPP 7 IO Charge-pump flying-capacitor positive connection DVDD 27 P 3.3-V digital power supply DVSS 28 P Digital ground DVSSO 17 P Oscillator ground GND 29 P Analog ground for power stage (1) (2) Analog ground for power stage This pin is monitored on the rising edge of RESET. A value of 0 makes the I2C dev address 0x54, and a value of 1 makes it 0x56. TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output All pullups are weak pullups and all pulldowns are weak pulldowns. The pullups and pulldowns are included to assure proper input logic levels if the pins are left unconnected (pullups → logic 1 input; pulldowns → logic 0 input). Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 5 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com PIN FUNCTIONS (continued) PIN NAME NO. TYPE (1) 5-V TERMINATION (2) TOLERANT DESCRIPTION GVDD_OUT 34 P Gate drive internal regulator output HPL_IN 1 AI Headphone left IN (single-ended, analog IN) HPL_OUT 2 AO Headphone left OUT (single-ended, analog OUT) HP_PWML 48 DO PWM left-channel headphone out HP_PWMR 47 DO PWM right-channel headphone out HPR_IN 4 AI Headphone right IN (single-ended, analog IN) HPR_OUT 3 AO Headphone right OUT (single-ended, analog OUT) HP_SD 33 AI Headphone shutdown (active-low) HPVDD 8 P Headphone supply HPVSS 5 P Headphone ground LRCLK 20 DI 5-V Pulldown Input serial audio data left/right clock (sample rate clock) MCLK 15 DI 5-V Pulldown Master clock input OSC_RES 16 AO OUT_A 44 O Output, half-bridge A OUT_B 42 O Output, half-bridge B OUT_C 39 O Output, half-bridge C OUT_D 37 O PDN 19 DI PGND_AB 43 P Power ground for half-bridges A and B PGND_CD 38 P Power ground for half-bridges C and D PLL_FLTM 10 AO PLL negative loop-filter terminal PLL_FLTP 11 AO PLL positive loop-filter terminal PVDD_AB 46 P PVDD_CD 35 P RESET 25 DI 5-V SCL 24 DI 5-V SCLK 21 DI 5-V SDA 23 DIO 5-V SDIN 22 DI 5-V SSTIMER 32 AI Controls ramp time of OUT_X to minimize pop. Leave this pin floating for BD mode. Requires capacitor of 2.2 nF to GND in AD mode. The capacitor determines the ramp time. STEST 26 DI Factory test pin. Connect directly to DVSS. VR_ANA 12 P Internally regulated 1.8-V analog supply voltage. This pin must not be used to power external devices. VR_DIG 18 P Internally regulated 1.8-V digital supply voltage. This pin must not be used to power external devices. VREG 31 P Digital regulator output. Not to be used for powering external circuitry. 6 Oscillator trim resistor. Connect an 18-kΩ 1% resistor to DVSSO. Output, half-bridge D 5-V Pullup Power down, active-low. PDN prepares the device for loss of power supplies by shutting down the noise shaper and initiating the PWM stop sequence. Power-supply input for half-bridge output A Power-supply input for half-bridge output C Pullup Reset, active-low. A system reset is generated by applying a logic low to this pin. RESET is an asynchronous control signal that restores the DAP to its default conditions, and places the PWM in the hard-mute (high-impedance) state. I2C serial control clock input Pulldown Serial audio data clock (shift clock). SCLK is the serial audio port input data bit clock. I2C serial control data interface input/output Pulldown Serial audio data input. SDIN supports three discrete (stereo) data formats. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) Supply voltage Input voltage VALUE UNIT DVDD, AVDD, HPVDD –0.3 to 3.6 V PVDD_X –0.3 to 30 V HPL_IN, HPR_IN –0.3 to 4.2 V 3.3-V digital input –0.5 to DVDD + 0.5 V (3) V –0.5 to AVDD + 2.5 (3) V OUT_x to PGND_x 22 (4) V BST_x to PGND_x 32 (4) Input clamp current, IIK ±20 mA Output clamp current, IOK ±20 mA Operating free-air temperature 0 to 85 °C Operating junction temperature range 0 to 150 °C –40 to 125 °C 5-V tolerant (2) digital input (except MCLK) 5-V tolerant MCLK input Storage temperature range, Tstg (1) (2) (3) (4) –0.5 to DVDD + 2.5 V Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions are not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability. 5-V tolerant inputs are PDN, RESET, SCLK, LRCLK, MCLK, SDIN, SDA, and SCL. Maximum pin voltage should not exceed 6 V. DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions. THERMAL INFORMATION TAS5717 THERMAL METRIC (1) PHP UNIT 48 PINS Junction-to-ambient thermal resistance (2) θJA (3) 35.2 °C/W θJB Junction-to-board thermal resistance 10.9 °C/W θJC(bottom) Junction-to-case (bottom) thermal resistance (4) 1.6 °C/W θJC(top) Junction-to-case (top) thermal resistance (5) 19.7 °C/W 3.4 °C/W 10.1 °C/W (6) ψJT Junction-to-top characterization parameter ψJB Junction-to-board characterization parameter (7) (1) (2) (3) (4) (5) (6) (7) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7). Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 7 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com RECOMMENDED OPERATING CONDITIONS MIN NOM MAX 3 3.3 3.6 UNIT Digital/analog supply voltage DVDD, AVDD Half-bridge supply voltage PVDD_X VIH High-level input voltage 5-V tolerant VIL Low-level input voltage 5-V tolerant 0.8 V TA Operating ambient temperature range 0 85 °C Operating junction temperature range 0 125 °C TJ (1) RL (BTL) LO (BTL) (1) Load impedance Output filter: L = 15 μH, C = 680 nF Output-filter inductance Minimum output inductance under short-circuit condition V 4.5 V 2 V 4 Ω 8 4.7 μH Continuous operation above the recommended junction temperature may result in reduced reliability and/or lifetime of the device. RECOMMENDED OPERATING CONDITIONS FOR HEADPHONE/LINE DRIVER Digital/analog supply voltage HPVDD MIN NOM MAX 3 3.3 3.6 R_hp_L Headphone-mode load imedance (HPL/HPR) 16 R_ln_L Line-diver-mode load impedance (HPL/HPR) 0.6 UNIT V 32 Ω 10 kΩ PWM OPERATION AT RECOMMENDED OPERATING CONDITIONS PARAMETER Output sample rate VALUE UNIT 11.025/22.05/44.1-kHz data rate ±2% TEST CONDITIONS 352.8 kHz 48/24/12/8/16/32-kHz data rate ±2% 384 PLL INPUT PARAMETERS AND EXTERNAL FILTER COMPONENTS PARAMETER fMCLKI tr / tf(MCLK) TEST CONDITIONS MIN MCLK Frequency 2.8224 MCLK duty cycle 40% TYP 50% Rise/fall time for MCLK LRCLK allowable drift before LRCLK reset Fcp 8 MAX UNIT 24.576 MHz 60% 5 ns 4 MCLKs External PLL filter capacitor C1 SMD 0603 Y5V 47 nF External PLL filter capacitor C2 SMD 0603 Y5V 4.7 nF External PLL filter resistor R SMD 0603, metal film Charge Pump Switching Frequency Submit Documentation Feedback Ω 470 500 700 KHz © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com ELECTRICAL CHARACTERISTICS DC Characteristics TA = 25°, PVCC_X = 13 V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL AD Mode, fS = 48 KHz (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX VOH High-level output voltage FAULTZ and SDA IOH = –4 mA DVDD = 3 V VOL Low-level output voltage FAULTZ and SDA IOL = 4 mA DVDD = 3 V 0.5 IIL Low-level input current VI < VIL ; DVDD = AVDD = 3.6V 75 IIH High-level input current VI > VIH ; DVDD = AVDD = 3.6V 75 IDD 3.3 V supply current 3.3 V supply voltage (DVDD, AVDD) IPVDD Half-bridge supply current No load (PVDD_X) rDS(on) (1) UNIT 2.4 V Normal mode 48 70 Reset (RESET = low, PDN = high) 21 32 Normal mode 20 34 5 13 Reset (RESET = low, PDN = high) Drain-to-source resistance, LS TJ = 25°C, includes metallization resistance 200 Drain-to-source resistance, HS TJ = 25°C, includes metallization resistance 200 3.5 V μA μA mA mA mΩ I/O Protection Vuvp Undervoltage protection limit PVDD falling Vuvp,hyst Undervoltage protection limit PVDD rising OTE (2) Overtemperature error OTEHYST (2) Extra temperature drop required to recover from error V 4.5 V 150 °C 30 °C IOC Overcurrent limit protection 4.5 A IOCT Overcurrent response time 150 ns RPD Internal pulldown resistor at the output of each half-bridge 3 kΩ (1) (2) Connected when drivers are tristated to provide bootstrap capacitor charge. This does not include bond-wire or pin resistance. Specified by design Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 9 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com AC Characteristics (BTL) PVDD_X = 12 V, BTL AD mode, fS = 48 KHz, RL = 8 Ω, audio frequency = 1 kHz, (unless otherwise noted). All performance is in accordance with recommended operating conditions, unless otherwise specified. PARAMETER PO TEST CONDITIONS Power output per channel MIN 10 PVDD = 8 V, 10% THD, 1-kHz input signal 4.1 PVDD = 18 V, 10% THD, 1-kHz input signal THD+N Total harmonic distortion + noise Vn Output integrated noise (rms) SNR (1) (2) Signal-to-noise ratio 15 0.13% PVDD = 8 V; PO = 1 W 0.2% UNIT W μV 56 PO = 0.25 W, f = 1 kHz (BD mode) –82 PO = 0.25 W, f = 1 kHz (AD mode) –69 A-weighted, f = 1 kHz, maximum power at THD < 1% (2) MAX (1) PVDD = 13 V; PO = 1 W A-weighted Crosstalk TYP PVDD = 13 V, 10% THD, 1-kHz input signal dB –105 dB 15 W is supported only in the TAS5719. SNR is calculated relative to 0-dBFS input level. AC Characteristics (Headphone/Line Driver) PVDD_X = 12 V, BTL AD mode, fS = 48 KHz, RL = 8 Ω, audio frequency = 1 kHz, (unless otherwise noted). All performance is in accordance with recommended operating conditions, unless otherwise specified. PARAMETER TEST CONDITIONS MIN Po(hp) Headphone power output per channel HP_VDD = 3.3 V (Rhp = 32 Ω; THD 1%) HP_gain Headphone gain Adjustable via Rin and Rfb SNR_hp Sgnal-to-noise ratio (headphone mode) SNR_ln Sgnal-to-noise ratio (line driver mode) 10 TYP MAX UNIT 25 mW Rhp = 32 Ω 101 dB 2-V rms output 105 dB Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com SERIAL AUDIO PORTS SLAVE MODE over recommended operating conditions (unless otherwise noted) TEST CONDITIONS PARAMETER MIN TYP MAX UNIT 12.288 MHz fSCLKIN Frequency, SCLK 32 × fS, 48 × fS, 64 × fS tsu1 Setup time, LRCLK to SCLK rising edge 10 ns th1 Hold time, LRCLK from SCLK rising edge 10 ns tsu2 Setup time, SDIN to SCLK rising edge 10 ns th2 Hold time, SDIN from SCLK rising edge 10 CL = 30 pF 1.024 LRCLK frequency ns 8 48 48 SCLK duty cycle 40% 50% 60% LRCLK duty cycle 40% 50% 60% SCLK rising edges between LRCLK rising edges t(edge) LRCLK clock edge with respect to the falling edge of SCLK tr / tf(SCLK/LRCLK) Rise/fall time for SCLK/LRCLK kHz 32 64 SCLK edges –1/4 1/4 SCLK period 8 tr ns tf SCLK (Input) t(edge) th1 tsu1 LRCLK (Input) th2 tsu2 SDIN T0026-04 Figure 1. Slave Mode Serial Data Interface Timing Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 11 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com I2C SERIAL CONTROL PORT OPERATION Timing characteristics for I2C Interface signals over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN fSCL Frequency, SCL tw(H) Pulse duration, SCL high No wait states 0.6 tw(L) Pulse duration, SCL low 1.3 tr Rise time, SCL and SDA tf Fall time, SCL and SDA tsu1 Setup time, SDA to SCL th1 Hold time, SCL to SDA t(buf) tsu2 MAX UNIT 400 kHz μs μs 300 ns 300 ns 100 ns 0 ns Bus free time between stop and start condition 1.3 μs Setup time, SCL to start condition 0.6 μs th2 Hold time, start condition to SCL 0.6 μs tsu3 Setup time, SCL to stop condition 0.6 CL Load capacitance for each bus line μs 400 tw(H) tw(L) pF tf tr SCL tsu1 th1 SDA T0027-01 Figure 2. SCL and SDA Timing SCL t(buf) th2 tsu2 tsu3 SDA Start Condition Stop Condition T0028-01 Figure 3. Start and Stop Conditions Timing 12 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com RESET TIMING (RESET) Control signal parameters over recommended operating conditions (unless otherwise noted). Please refer to Recommended Use Model section on usage of all terminals. PARAMETER tw(RESET) MIN Pulse duration, RESET active TYP 2 td(I2C_ready) MAX UNIT μs 100 Time to enable I C 12 ms RESET tw(RESET) 2 2 I C Active I C Active td(I2C_ready) System Initialization. 2 Enable via I C. T0421-01 NOTES: 1. On power up, it is recommended that the TAS5717/9 RESET be held LOW for at least 100 μs after DVDD has reached 3 V. 2. If RESET is asserted LOW while PDN is LOW, then the RESET must continue to be held LOW for at least 100 μs after PDN is deasserted (HIGH). Figure 4. Reset Timing Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 13 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8Ω SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 10 PVDD = 8V RL = 8Ω TA = 25°C PVDD = 12V RL = 8Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 2.5W PO = 5W 0.001 20 100 PO = 1W PO = 2.5W PO = 5W 1k Frequency (Hz) 10k 0.001 20k 20 SPACER SPACER SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY SPACER SPACER SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 20k 10 PVDD = 24V RL = 8Ω TA = 25°C 1 THD+N (%) 1 THD+N (%) 10k Figure 6. PVDD = 18V RL = 8Ω TA = 25°C 0.1 0.01 0.1 0.01 PO = 1W PO = 2.5W PO = 5W 20 100 PO = 1W PO = 2.5W PO = 5W 1k Frequency (Hz) 10k 20k 0.001 20 Figure 7. 14 1k Frequency (Hz) Figure 5. 10 0.001 100 100 1k Frequency (Hz) 10k 20k Figure 8. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8Ω (continued) SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 10 PVDD = 8V RL = 8Ω TA = 25°C PVDD = 12V RL = 8Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 f = 20Hz f = 1kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 20Hz f = 1kHz 0.001 0.01 40 1 Output Power (W) 10 Figure 9. Figure 10. SPACER SPACER SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER SPACER SPACER SPACER SPACER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 40 10 PVDD = 18V RL = 8Ω TA = 25°C PVDD = 24V RL = 8Ω TA = 25°C 1 THD+N (%) 1 THD+N (%) 0.1 0.1 0.01 0.1 0.01 f = 20Hz f = 1kHz f = 10kHz 0.001 0.01 0.1 1 Output Power (W) 10 40 f = 20Hz f = 1kHz 0.001 0.01 Figure 11. 0.1 1 Output Power (W) 10 40 Figure 12. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 15 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8Ω (continued) SPACER TAS5717 OUTPUT POWER vs SUPPLY VOLTAGE SPACER TAS5717 EFFICIENCY vs OUTPUT POWER 40 100 RL = 8Ω T A = 25°C 35 90 80 30 Efficiency (%) Output Power (W) 70 25 20 15 60 50 40 30 10 20 5 PVDD = 8V PVDD = 12V PVDD = 18V PVDD = 24V 10 THD+N = 1% THD+N = 10% 0 RL = 8Ω T A = 25°C 0 8 10 12 14 16 18 20 Supply Voltage (V) 22 24 26 NOTE: Dashed lines represent thermally limited region. Figure 13. 0 5 10 15 20 25 Total Output Power (W) 30 35 NOTE: Dashed lines represent thermally limited region. Figure 14. SPACER SPACER SPACER TAS5719 OUTPUT POWER vs SUPPLY VOLTAGE SPACER SPACER SPACER TAS5719 EFFICIENCY vs OUTPUT POWER 40 100 RL = 8Ω T A = 25°C 35 90 80 30 25 Efficiency (%) Output Power (W) 70 20 15 60 50 40 30 10 20 5 THD+N = 1% THD+N = 10% 0 10 RL = 8Ω T A = 25°C 0 8 10 12 14 16 18 20 Supply Voltage (V) 22 NOTE: Dashed lines represent thermally limited region. Figure 15. 16 PVDD = 8V PVDD = 12V PVDD = 18V PVDD = 24V 24 26 0 5 10 15 20 25 Total Output Power (W) 30 35 NOTE: Dashed lines represent thermally limited region. Figure 16. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8Ω (continued) SPACER SPACER CROSSTALK vs FREQUENCY SPACER SPACER CROSSTALK vs FREQUENCY 0 0 PO = 1W PVDD = 8V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right −20 Right to Left Left to Right −30 Crosstalk (dB) Crosstalk (dB) −30 −40 −50 −60 −40 −50 −60 −70 −70 −80 −80 −90 −90 −100 PO = 1W PVDD = 12V RL = 8Ω TA = 25°C −10 20 100 1k Frequency (Hz) 10k 20k −100 20 100 1k Frequency (Hz) Figure 17. Figure 18. SPACER SPACER SPACER SPACER CROSSTALK vs FREQUENCY SPACER SPACER SPACER SPACER CROSSTALK vs FREQUENCY 10k 20k 0 0 PO = 1W PVDD = 18V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right PO = 1W PVDD = 24V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right −30 −40 Crosstalk (dB) Crosstalk (dB) −30 −40 −50 −60 −50 −60 −70 −80 −70 −90 −80 −100 −90 −100 −110 20 100 1k Frequency (Hz) 10k 20k −120 20 Figure 19. 100 1k Frequency (Hz) 10k 20k Figure 20. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 17 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, HEADPHONE TESTS, SE CONFIGURATION, 32Ω SPACER ANALOG IN TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY SPACER PWM IN TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 10 HPVDD = 3.3V RL = 32Ω TA = 25°C HPVDD = 3.3V RL = 32Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 10mW 0.001 20 100 PO = 10mW 1k Frequency (Hz) 10k 20k 0.001 20 Figure 21. 18 100 1k Frequency (Hz) 10k 20k Figure 22. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com TYPICAL CHARACTERISTICS, LINE DRIVER TESTS, SE CONFIGURATION, 5kΩ SPACER ANALOG IN TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY SPACER PWM IN TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT VOLTAGE 10 10 HPVDD = 3.3V RL = 5kΩ TA = 25°C PVDD =3.3V RL = 5kΩ TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.1 0.01 0.01 VO = 1Vrms 0.001 20 100 f = 1kHz 1k Frequency (Hz) 10k 20k 0.001 10m 100m Output Voltage (V) Figure 23. 1 4 Figure 24. SPACER SPACER SPACER ANALOG IN CROSSTALK vs FREQUENCY 0 VO = 1Vrms PVDD = 3.3V RL = 5kΩ TA = 25°C −10 −20 Right to Left Left to Right Crosstalk (dB) −30 −40 −50 −60 −70 −80 −90 −100 20 100 1k Frequency (Hz) 10k 20k Figure 25. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 19 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com DETAILED DESCRIPTION POWER SUPPLY To facilitate system design, the TAS5717/9 needs only a 3.3-V supply in addition to the (typical) 13-V power-stage supply. An internal voltage regulator provides suitable voltage levels for the gate drive circuitry. Additionally, all circuitry requiring a floating voltage supply, e.g., the high-side gate drive, is accommodated by built-in bootstrap circuitry requiring only a few external capacitors. In order to provide good electrical and acoustical characteristics, the PWM signal path for the output stage is designed as identical, independent half-bridges. For this reason, each half-bridge has separate bootstrap pins (BST_X) and power-stage supply pins (PVDD_X). The gate drive voltages (GVDD_AB and GVDD_CD) are derived from the PVDD voltage. Special attention should be paid to placing all decoupling capacitors as close to their associated pins as possible. In general, inductance between the power-supply pins and decoupling capacitors must be avoided. For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin (BST_X) to the power-stage output pin (OUT_X). When the power-stage output is low, the bootstrap capacitor is charged through an internal diode connected between the gate-drive regulator output pin (GVDD_X) and the bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM switching frequencies in the range from 352 kHz to 384 kHz, it is recommended to use 33-nF ceramic capacitors, size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the remaining part of the PWM cycle. Special attention should be paid to the power-stage power supply; this includes component selection, PCB placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_X). For optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_X pin is decoupled with a 100-nF ceramic capacitor placed as close as possible to each supply pin. The TAS5717/9 is fully protected against erroneous power-stage turnon due to parasitic gate charging. I2C CHIP SELECT/HP_SHUTDOWN A_SEL/HP_SD is an input pin during power up. It can be pulled high or low. HIGH indicates an I2C subaddress of 0x56, and LOW a subaddress of 0x54. DEVICE PROTECTION SYSTEM Overcurrent (OC) Protection With Current Limiting The device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The detector outputs are closely monitored a protection system. If the high-current condition situation persists, i.e., the power stage is being overloaded, a protection system triggers a latching shutdown, resulting in the power stage being set in the high-impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short circuit on the output) is removed. Current limiting and overcurrent protection are not independent for half-bridges. That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C, and D are shut down. Overtemperature Protection The TAS5717/9 has an overtemperature-protection system. If the device junction temperature exceeds 150°C (nominal), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z) state and FAULT being asserted low. The TAS5717/9 recovers automatically once the temperature drops approximately 30°. 20 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Undervoltage Protection (UVP) and Power-On Reset (POR) The UVP and POR circuits of the TAS5717/9 fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the PVDD and AVDD supply voltages reach 4.5 V and 2.7 V, respectively. Although PVDD and AVDD are independently monitored, a supply voltage drop below the UVP threshold on AVDD or on either PVDD pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z) state and FAULT being asserted low. CLOCK, AUTO DETECTION, AND PLL The TAS5717/9 is a slave device. It accepts MCLK, SCLK, and LRCLK. The digital audio processor (DAP) supports all the sample rates and MCLK rates that are defined in the clock control register . The TAS5717/9 checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 × fS LRCLK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the internal clock (DCLK) running at 512 times the PWM switching frequency. The DAP can autodetect and set the internal clock-control logic to the appropriate settings for all supported clock rates as defined in the clock control register. TAS5717/9 has robust clock error handling that uses the bulit-in trimmed oscillator clock to quickly detect changes/errors. Once the system detects a clock change/error, it mutes the audio (through a single-step mute) and then forces PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the system autodetects the new rate and reverts to normal operation. During this process, the default volume is restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back slowly (also called soft unmute) as defined in volume register (0x0E). SERIAL DATA INTERFACE Serial data is input on SDIN. The PWM outputs are derived from SDIN. The TAS5717/9 DAP accepts serial data in 16-, 20-, or 24-bit left-justified, right-justified, or I2S serial data format. PWM Section The TAS5717/9 DAP device uses noise-shaping and sophisticated nonlinear correction algorithms to achieve high power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP and outputs two BTL PWM audio output channels. The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff frequency is less than 1 Hz. Individual-channel de-emphasis filters for 44.1- and 48-kHz are included and can be enabled and disabled. Finally, the PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%. For detailed description of using audio processing features like DRC and EQ, see the User's Guide and TAS570X GDE software development tool documentation. Also see the GDE software development tool for the device data path. I2C COMPATIBLE SERIAL CONTROL INTERFACE The TAS5717/9 DAP has an I2C serial control slave interface to receive commands from a system controller. The serial control interface supports both normal-speed (100-kHz) and high-speed (400-kHz) operations without wait states. As an added feature, this interface operates even if MCLK is absent. The serial control interface supports both single-byte and multiple-byte read and write operations for status registers and the general control registers associated with the PWM. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 21 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com SERIAL INTERFACE CONTROL AND TIMING I2S Timing I2S timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is low for the left channel and high for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. There is a delay of one bit clock from the time the LRCLK signal changes state to the first bit of data on the data lines. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused trailing data-bit positions. 2 2-Channel I S (Philips Format) Stereo Input 32 Clks LRCLK (Note Reversed Phase) 32 Clks Right Channel Left Channel SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 26. I2S 64-fS Format 22 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com 2 2-Channel I S (Philips Format) Stereo Input/Output (24-Bit Transfer Word Size) LRCLK 24 Clks 24 Clks Left Channel Right Channel SCLK SCLK MSB 24-Bit Mode 23 22 MSB LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 3 2 1 0 LSB 23 22 17 16 9 8 5 4 19 18 13 12 5 4 1 0 15 14 9 1 0 3 2 1 20-Bit Mode 19 18 16-Bit Mode 15 14 8 8 T0092-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 27. I2S 48-fS Format 2 2-Channel I S (Philips Format) Stereo Input LRCLK 16 Clks 16 Clks Left Channel Right Channel SCLK SCLK MSB 16-Bit Mode 15 14 13 12 MSB LSB 11 10 9 8 5 4 3 2 1 0 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 T0266-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 28. I2S 32-fS Format Left-Justified Left-justified (LJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data lines at the same time LRCLK toggles. The data is written MSB-first and is valid on the rising edge of the bit clock. The DAP masks unused trailing data-bit positions. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 23 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com 2-Channel Left-Justified Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 29. Left-Justified 64-fS Format 2-Channel Left-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 21 LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 1 0 MSB LSB 21 17 16 9 8 5 4 19 18 17 13 12 5 4 1 0 15 14 13 9 1 0 23 22 1 0 20-Bit Mode 19 18 17 16-Bit Mode 15 14 13 8 8 T0092-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 30. Left-Justified 48-fS Format 24 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com 2-Channel Left-Justified Stereo Input 16 Clks 16 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 16-Bit Mode 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 MSB 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 T0266-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 31. Left-Justified 32-fS Format Right-Justified Right-justified (RJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data 8 bit-clock periods (for 24-bit data) after LRCLK toggles. In RJ mode the LSB of data is always clocked by the last bit clock before LRCLK transitions. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused leading data-bit positions. 2-Channel Right-Justified (Sony Format) Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 MSB LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 20-Bit Mode 16-Bit Mode T0034-03 Figure 32. Right-Justified 64-fS Format Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 25 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com 2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 LSB MSB 23 22 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 20-Bit Mode 16-Bit Mode T0092-03 Figure 33. Right-Justified 48-fS Format Figure 34. Right-Justified 32-fS Format 26 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com I2C SERIAL CONTROL INTERFACE The TAS5717/9 DAP has a bidirectional I2C interface that is compatible with the Inter IC (I2C) bus protocol and supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-yte write and read operations. This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The control interface is used to program the registers of the device and to read device status. The DAP supports the standard-mode I2C bus operation (100 kHz maximum) and the fast I2C bus operation (400 kHz maximum). The DAP performs all I2C operations without I2C wait cycles. General I2C Operation The I2C bus employs two signals; SDA (data) and SCL (clock), to communicate between integrated circuits in a system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte (8-bit) format, with the most significant bit (MSB) transferred first. In addition, each byte transferred on the bus is acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master device driving a start condition on the bus and ends with the master device driving a stop condition on the bus. The bus uses transitions on the data pin (SDA) while the clock is high to indicate start and stop conditions. A high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data-bit transitions must occur within the low time of the clock period. These conditions are shown in Figure 35. The master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another device and then waits for an acknowledge condition. The TAS5717/9 holds SDA low during the acknowledge clock period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence. Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for the SDA and SCL signals to set the high level for the bus. SDA R/ A W 7-Bit Slave Address 7 6 5 4 3 2 1 0 8-Bit Register Address (N) 7 6 5 4 3 2 1 0 8-Bit Register Data For Address (N) A 7 6 5 4 3 2 1 8-Bit Register Data For Address (N) A 0 7 6 5 4 3 2 1 A 0 SCL Start Stop T0035-01 Figure 35. Typical I2C Sequence There is no limit on the number of bytes that can be transmitted between start and stop conditions. When the last word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is shown in Figure 35. The 7-bit address for TAS5717/9 is 0101 010 (0x54) or 0101 011 (0x56) defined by A_SEL (external pulldown for 0x54 and pullup for 0x56).Stero device with Headphone should use 0x54 as its device address. Single- and Multiple-Byte Transfers The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses 0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only multiple-byte read/write operations (in multiples of 4 bytes). During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does not contain 32 bits, the unused bits are read as logic 0. During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes that are required for each specific subaddress. For example, if a write command is received for a biquad subaddress, the DAP expects to receive five 32-bit words. If fewer than five 32-bit data words have been received when a stop command (or another start command) is received, the data received is discarded. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 27 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Supplying a subaddress for each subaddress transaction is referred to as random I2C addressing. The TAS5717/9 also supports sequential I2C addressing. For write transactions, if a subaddress is issued followed by data for that subaddress and the 15 subaddresses that follow, a sequential I2C write transaction has taken place, and the data for all 16 subaddresses is successfully received by the TAS5717/9. For I2C sequential write transactions, the subaddress then serves as the start address, and the amount of data subsequently transmitted, before a stop or start is transmitted, determines how many subaddresses are written. As was true for random addressing, sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted; only the incomplete data is discarded. Single-Byte Write As shown in Figure 36, a single-byte data-write transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. The read/write bit determines the direction of the data transfer. For a data-write transfer, the read/write bit is 0. After receiving the correct I2C device address and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the address byte or bytes corresponding to the TAS5717/9 internal memory address being accessed. After receiving the address byte, the TAS5717/9 again responds with an acknowledge bit. Next, the master device transmits the data byte to be written to the memory address being accessed. After receiving the data byte, the TAS5717/9 again responds with an acknowledge bit. Finally, the master device transmits a stop condition to complete the single-byte data-write transfer. Start Condition Acknowledge A6 A5 A4 A3 A2 A1 A0 Acknowledge R/W ACK A7 A6 A5 2 A4 A3 A2 A1 Acknowledge A0 ACK D7 D6 Subaddress I C Device Address and Read/Write Bit D5 D4 D3 D2 D1 D0 ACK Stop Condition Data Byte T0036-01 Figure 36. Single-Byte Write Transfer Multiple-Byte Write A multiple-byte data-write transfer is identical to a single-byte data write transfer except that multiple data bytes are transmitted by the master device to the DAP as shown in Figure 37. After receiving each data byte, the TAS5717/9 responds with an acknowledge bit. Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 2 I C Device Address and Read/Write Bit A6 A5 A4 A3 Subaddress A1 Acknowledge Acknowledge Acknowledge Acknowledge A0 ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-02 Figure 37. Multiple-Byte Write Transfer 28 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Single-Byte Read As shown in Figure 38, a single-byte data-read transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. For the data-read transfer, both a write followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5717/9 address and the read/write bit, TAS5717/9 responds with an acknowledge bit. In addition, after sending the internal memory address byte or bytes, the master device transmits another start condition followed by the TAS5717/9 address and the read/write bit again. This time the read/write bit becomes a 1, indicating a read transfer. After receiving the address and the read/write bit, the TAS5717/9 again responds with an acknowledge bit. Next, the TAS5717/9 transmits the data byte from the memory address being read. After receiving the data byte, the master device transmits a not-acknowledge followed by a stop condition to complete the single-byte data-read transfer. Repeat Start Condition Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 Acknowledge A6 2 A5 A4 A0 ACK A6 A5 A0 R/W ACK D7 A1 D6 2 I C Device Address and Read/Write Bit Subaddress I C Device Address and Read/Write Bit Not Acknowledge Acknowledge D1 D0 ACK Stop Condition Data Byte T0036-03 Figure 38. Single-Byte Read Transfer Multiple-Byte Read A multiple-byte data-read transfer is identical to a single-byte data-read transfer except that multiple data bytes are transmitted by the TAS5717/9 to the master device as shown in Figure 39. Except for the last data byte, the master device responds with an acknowledge bit after receiving each data byte. Repeat Start Condition Start Condition Acknowledge A6 2 A0 R/W ACK A7 I C Device Address and Read/Write Bit Acknowledge A6 A6 A0 ACK A5 Subaddress 2 Acknowledge Acknowledge Acknowledge Not Acknowledge A0 R/W ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK I C Device Address and Read/Write Bit First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-04 Figure 39. Multiple-Byte Read Transfer Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 29 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Dynamic Range Control (DRC) The DRC scheme has a single threshold, offset, and slope (all programmable). There is one ganged DRC for the high-band left/right channels and one DRC for the low-band left/right channels. The DRC input/output diagram is shown in Figure 40. See the GDE software tool for more description on the T, K, and O parameters. Output Level (dB) K 1:1 Transfer Function Implemented Transfer Function T Input Level (dB) M0091-03 Professional-quality dynamic range compression automatically adjusts volume to flatten volume level. • Each DRC has adjustable threshold levels. • Programmable energy, attack, and decay time constants • Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging, and decay times can be set slow enough to avoid pumping. Figure 40. Dynamic Range Control Energy Filter Threshold Detect Attack and Decay Filters a, w T aa, wa / ad, wd DRC1 0x3B 0x40 0x3C DRC2 0x3E 0x43 0x3F Audio Input DRC Coefficient Alpha Filter Structure S a w –1 Z B0265-04 T = 9.23 format, all other DRC coefficients are 3.23 format Figure 41. DRC Structure 30 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com PWM LEVEL METER The structure in Figure 42 shows the PWM level meter that can be used to study the power profile. Post-DAP Processing 1–a –1 Z Ch1 a ABS 32-Bit Level rms ADDR = 0x6B 2 I C Registers (PWM Level Meter) 1–a –1 Z Ch2 a ABS 32-Bit Level rms ADDR = 0x6C B0396-01 Figure 42. PWM Level Meter Structure 26-Bit 3.23 Number Format All mixer gain coefficients are 26-bit coefficients using a 3.23 number format. Numbers formatted as 3.23 numbers means that there are 3 bits to the left of the binary point and 23 bits to the right of the binary point. This is shown in Figure 43 . 2 –23 2 2 –5 –1 Bit Bit Bit 0 2 Bit 1 2 Bit Sign Bit S_xx.xxxx_xxxx_xxxx_xxxx_xxxx_xxx M0125-01 Figure 43. 3.23 Format The decimal value of a 3.23 format number can be found by following the weighting shown in Figure 43. If the most significant bit is logic 0, the number is a positive number, and the weighting shown yields the correct number. If the most significant bit is a logic 1, then the number is a negative number. In this case every bit must be inverted, a 1 added to the result, and then the weighting shown in Figure 44 applied to obtain the magnitude of the negative number. 1 0 2 Bit 2 Bit 1 2 0 –1 Bit (1 or 0) ´ 2 + (1 or 0) ´ 2 + (1 or 0) ´ 2 2 –1 –4 Bit + ....... (1 or 0) ´ 2 2 –4 –23 Bit + ....... (1 or 0) ´ 2 –23 M0126-01 Figure 44. Conversion Weighting Factors—3.23 Format to Floating Point Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 31 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Gain coefficients, entered via the I2C bus, must be entered as 32-bit binary numbers. The format of the 32-bit number (4-byte or 8-digit hexadecimal number) is shown in Figure 45 Fraction Digit 6 Sign Bit Fraction Digit 1 Integer Digit 1 Fraction Digit 2 Fraction Digit 3 Fraction Digit 4 Fraction Digit 5 u u u u u u S x x. x x x x x x x x x x x x x x x x x x x x x x x 0 Coefficient Digit 8 Coefficient Digit 7 Coefficient Digit 6 Coefficient Digit 5 Coefficient Digit 4 Coefficient Digit 3 Coefficient Digit 2 Coefficient Digit 1 u = unused or don’t care bits Digit = hexadecimal digit M0127-01 Figure 45. Alignment of 3.23 Coefficient in 32-Bit I2C Word Table 1. Sample Calculation for 3.23 Format db Linear Decimal Hex (3.23 Format) 0 1 8,388,608 80 0000 5 1.77 14,917,288 00E3 9EA8 –5 0.56 4,717,260 0047 FACC X L = 10(X/20) D = 8388608 × L H = dec2hex (D, 8) Table 2. Sample Calculation for 9.17 Format 32 db Linear Decimal 0 1 131,072 Hex (9.17 Format) 20 000 5 1.77 231,997 38 A3D –5 0.56 73,400 11 EB8 X L = 10(X/20) D = 131,072 × L H = dec2hex (D, 8) Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Table 3. Serial Control Interface Register Summary SUBADDRESS REGISTER NAME NO. OF BYTES INITIALIZATION VALUE CONTENTS A u indicates unused bits. 0x00 Clock control register 1 Description shown in subsequent section 0x6C 0x01 Device ID register 1 Description shown in subsequent section 0xC1 0x02 Error status register 1 Description shown in subsequent section 0x00 0x03 System control register 1 1 Description shown in subsequent section 0xA0 0x04 Serial data interface register 1 Description shown in subsequent section 0x05 0x05 System control register 2 1 Description shown in subsequent section 0x40 0x06 Soft mute register 1 Description shown in subsequent section 0x00 0x07 Master volume 2 Description shown in subsequent section 0x03FF (mute) 0x08 Channel 1 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 0x09 Channel 2 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 0x0A Channel 3 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 1 Reserved (1) 1 Description shown in subsequent section 0x0B–0x0D 0x0E Volume configuration register 0x0F 1 Reserved 0x10 Modulation limit register 1 Description shown in subsequent section 0x01 0x11 IC delay channel 1 1 Description shown in subsequent section 0xAC 0x12 IC delay channel 2 1 Description shown in subsequent section 0x54 0x13 IC delay channel 3 1 Description shown in subsequent section 0xAC 0x14 IC delay channel 4 1 Description shown in subsequent section 0x54 1 Reserved (1) 0x15–0x19 0x1A Start/stop period register 1 0x68 0x1B Oscillator trim register 1 0x82 0x1C BKND_ERR register 1 0x1D–0x1F 0x57 (1) 1 Reserved 0x20 Input MUX register 4 Description shown in subsequent section 0x0001 7772 0x21 Ch 4 source select register 4 Description shown in subsequent section 0x0000 4303 0x22–0x24 (1) 4 Reserved 0x25 PWM MUX register 4 Description shown in subsequent section 0x0102 1345 0x26 ch1_bq[0] 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x27 0x28 (1) 0xF0 (1) ch1_bq[1] ch1_bq[2] 20 20 Reserved registers should not be accessed. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 33 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS 0x29 0x2A 0x2B 0x2C 0x2D 0x2E 0x2F 0x30 0x31 34 REGISTER NAME ch1_bq[3] ch1_bq[4] ch1_bq[5] ch1_bq[6] ch1_bq[7] ch1_bq[8] ch1_bq[9] ch2_bq[0] ch2_bq[1] NO. OF BYTES 20 20 20 20 20 20 20 20 20 CONTENTS INITIALIZATION VALUE u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS 0x32 0x33 0x34 0x35 0x36 0x37 0x38 0x39 REGISTER NAME ch2_bq[2] ch2_bq[3] ch2_bq[4] ch2_bq[5] ch2_bq[6] ch2_bq[7] ch2_bq[8] ch2_bq[9] 0x3A 0x3B DRC1 softening filter alpha NO. OF BYTES 20 20 20 20 20 20 20 20 DRC1 attack rate u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 (2) Reserved 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 8 DRC1 release rate (2) INITIALIZATION VALUE 4 DRC1 softening filter omega 0x3C CONTENTS 0x0000 0100 0xFFFF FF00 Reserved registers should not be accessed. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 35 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS REGISTER NAME 0x3D 0x3E DRC2 softening filter alpha NO. OF BYTES 8 Reserved (3) 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0xFFF8 0000 DRC2 softening filter omega 0x3F DRC2 attack rate 8 u[31:26], at[25:0] 0x0008 0000 u[31:26], rt[25:0] 0xFFF8 0000 4 T1[31:0] (9.23 format) 0x0800 0000 4 Reserved (3) 4 T2[31:0] (9.23 format) 4 Reserved (3) 4 Description shown in subsequent section DRC2 release rate 0x40 DRC1 attack threshold 0x41–0x42 0x43 DRC2 attack threshold 0x44–0x45 0x46 DRC control 0x47–0x4E 0x0002 0000 (3) 4 Reserved PWM switching rate control 4 u[31:4], src[3:0] 0x0000 0008 0x50 EQ control 4 Description shown in subsequent section 0x0F70 8000 0x51 Ch 1 output mixer 8 Ch 1 output mix1[1] 0x0080 0000 Ch 2 output mixer 8 Ch 1 output mix1[0] 0x0000 0000 Ch 2 output mix2[1] 0x0080 0000 Ch 2 output mix2[0] 0x0000 0000 0x53 16 Reserved (3) 0x54 16 Reserved (3) 4 u[31:26], post[25:0] 0x0080 0000 0x56 Output post-scale 0x57 Output pre-scale 4 u[31:26], pre[25:0] (9.17 format) 0x0002 0000 0x58 ch1_bq[10] 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x59 0x5A 0x5B 36 0x0074 0000 0x4F 0x52 (3) INITIALIZATION VALUE CONTENTS ch1_bq[11] ch4_bq[0] ch4_bq[1] 20 20 20 Reserved registers should not be accessed. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS 0x5C 0x5D 0x5E 0x5F NO. OF BYTES REGISTER NAME ch2_bq[10] 20 ch2_bq[11] 20 ch3_bq[0] 20 ch3_bq[1] 20 0x60–0x61 0x62 4 IDF post scale u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Reserved (4) 4 0x0000 0080 Reserved (4) 0x63–0x6A 0x6B Left channel PWM level meter 4 Data[31:0] 0x0000 0000 0x6C Right channel PWM level meter 4 Data[31:0] 0x0000 0000 Reserved (4) 0x6D–0x6F 0x70 ch1 inline mixer 4 u[31:26], in_mix1[25:0] 0x0080 0000 0x71 inline_DRC_en_mixer_ch1 4 u[31:26], in_mixdrc_1[25:0] 0x0000 0000 0x72 ch1 right_channel mixer 4 u[31:26], right_mix1[25:0] 0x0000 0000 0x73 ch1 left_channel_mixer 4 u[31:26], left_mix_1[25:0] 0x0080 0000 0x74 ch2 inline mixer 4 u[31:26], in_mix2[25:0] 0x0080 0000 0x75 inline_DRC_en_mixer_ch2 4 u[31:26], in_mixdrc_2[25:0] 0x0000 0000 0x76 ch2 left_chanel mixer 4 u[31:26], left_mix1[25:0] 0x0000 0000 0x77 ch2 right_channel_mixer 4 u[31:26], right_mix_1[25:0] 0x0080 0000 Reserved (4) 0x78–0xF7 0xF8 Update dev address key 4 Dev Id Update Key[31:0] (Key = 0xF9A5A5A5) 0x0000 0000 0xF9 Update dev address reg 4 u[31:8],New Dev Id[7:0] (New Dev Id = 0x38 for TAS5717/9) 0x0000 0054 4 Reserved (4) 0xFA–0xFF (4) INITIALIZATION VALUE CONTENTS Reserved registers should not be accessed. All DAP coefficients are 3.23 format unless specified otherwise. Registers 0x3B through 0x46 should be altered only during the initialization phase. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 37 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com CLOCK CONTROL REGISTER (0x00) The clocks and data rates are automatically determined by the TAS5717/9. The clock control register contains the autodetected clock status. Bits D7–D5 reflect the sample rate. Bits D4–D2 reflect the MCLK frequency. Table 4. Clock Control Register (0x00) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 – – – – – fS = 32-kHz sample rate 0 0 1 – – – – – Reserved 0 1 0 – – – – – Reserved 0 1 1 – – – – – fS = 44.1/48-kHz sample rate (1) 1 0 0 – – – – – fS = 16-kHz sample rate 1 0 1 – – – – – fS = 22.05/24-kHz sample rate 1 1 0 – – – – – fS = 8-kHz sample rate 1 1 1 – – – – – fS = 11.025/12-kHz sample rate – – – 0 0 0 – – MCLK frequency = 64 × fS (2) – – – 0 0 1 – – MCLK frequency = 128 × fS (2) – – – 0 1 0 – – MCLK frequency = 192 × fS (3) – – – 0 1 1 – – MCLK frequency = 256 × fS – – – 1 0 0 – – MCLK frequency = 384 × fS – – – 1 0 1 – – MCLK frequency = 512 × fS – – – 1 1 0 – – Reserved – – – 1 1 1 – – Reserved – – – – – – 0 – Reserved (1) – – – – – – – 0 Reserved (1) (1) (2) (3) (4) FUNCTION (1) (4) Default values are in bold. Only available for 44.1-kHz and 48-kHz rates Rate only available for 32/44.1/48-KHz sample rates Not available at 8 kHz DEVICE ID REGISTER (0x01) The device ID register contains the ID code for the firmware revision. Table 5. General Status Register (0x01) D7 0 (1) 38 D6 0 D5 0 D4 D3 0 0 D2 0 D1 0 D0 0 FUNCTION Identification code (1) Default values are in bold. Submit Documentation Feedback © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): TAS5717 TAS5719 TAS5717 TAS5719 SLOS655A – NOVEMBER 2010 – REVISED FEBRUARY 2011 www.ti.com ERROR STATUS REGISTER (0x02) The error bits are sticky and are not cleared by the hardware. This means that the software must clear the register (write zeroes) and then read them to determine if they are persistent errors. Error definitions: • MCLK error: MCLK frequency is changing. The number of MCLKs per LRCLK is changing. • SCLK error: The number of SCLKs per LRCLK is changing. • LRCLK error: LRCLK frequency is changing. • Frame slip: LRCLK phase is drifting with respect to internal frame sync. Table 6. Error Status Register (0x02) D7 D6 D5 D4 D3 D2 D1 D0 1 - – – – – – – MCLK error – 1 – – – – – – PLL autolock error – – 1 – – – – – SCLK error – – – 1 – – – – LRCLK error – – – – 1 – – – Frame slip – – – – – 1 – – Clip indicator – – – – – – 1 – Overcurrent, overtemperature, overvoltage, or undervoltage error 0 0 0 0 0 0 0 0 Reserved 0 0 0 0 0 0 0 0 No errors (1) FUNCTION (1) Default values are in bold. SYSTEM CONTROL REGISTER 1 (0x03) System control register 1 has several functions: Bit D7: If 0, the dc-blocking filter for each channel is disabled. If 1, the dc-blocking filter (–3 dB cutoff
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