STB26N60M2
N-channel 600 V, 0.14 Ω typ., 20 A MDmesh™ M2
Power MOSFET in a D²PAK package
Datasheet - production data
Features
TAB
Order code
VDS @
TJmax
RDS(on)
max.
ID
PTOT
STB26N60M2
650 V
0.165 Ω
20
A
169
W
2
3
1
D²PAK
Figure 1: Internal schematic diagram
Extremely low gate charge
Excellent output capacitance (COSS) profile
100% avalanche tested
Zener-protected
Applications
Switching applications
Description
This device is an N-channel Power MOSFET
developed using MDmesh™ M2 technology.
Thanks to its strip layout and an improved vertical
structure, the device exhibits low on-resistance
and optimized switching characteristics,
rendering it suitable for the most demanding high
efficiency converters.
Table 1: Device summary
Order code
Marking
Package
Packing
STB26N60M2
26N60M2
D²PAK
Tape and reel
March 2017
DocID030419 Rev 1
This is information on a product in full production.
1/15
www.st.com
Contents
STB26N60M2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
5
2/15
4.1
D²PAK package information .............................................................. 9
4.2
D²PAK packing information ............................................................. 12
Revision history ............................................................................ 14
DocID030419 Rev 1
STB26N60M2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Value
Unit
Gate-source voltage
±25
V
Drain current (continuous) at Tcase = 25 °C
20
Drain current (continuous) at Tcase = 100 °C
13
IDM(1)
Drain current (pulsed)
80
A
PTOT
W
VGS
ID
Parameter
Total dissipation at Tcase = 25 °C
169
dv/dt(2)
Peak diode recovery voltage slope
15
dv/dt(3)
MOSFET dv/dt ruggedness
50
Tstg
Storage temperature range
Tj
Operating junction temperature range
-55 to 150
A
V/ns
°C
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
ISD ≤ 20 A, di/dt=400 A/μs; VDS(peak) < V(BR)DSS, VDD = 80% V(BR)DSS.
(3)
VDS ≤ 480 V.
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
0.74
Thermal resistance junction-pcb
30
Rthj-pcb
(1)
Value
Unit
°C/W
Notes:
(1)When
mounted on a 1-inch² FR-4, 2 Oz copper board.
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR(1)
Avalanche current, repetitive or not repetitive
3.8
A
EAS(2)
Single pulse avalanche energy
250
mJ
Notes:
(1)
Pulse width limited by Tjmax.
(2)
starting Tj = 25 °C, ID = IAR, VDD = 50 V.
DocID030419 Rev 1
3/15
Electrical characteristics
2
STB26N60M2
Electrical characteristics
(Tcase = 25 °C unless otherwise specified)
Table 5: Static
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
600
Unit
V
VGS = 0 V, VDS = 600 V
1
VGS = 0 V, VDS = 600 V,
Tcase = 125 °C(1)
100
Gate-body leakage
current
VDS = 0 V, VGS = ±25 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
3
4
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 10 A
0.14
0.165
Ω
Min.
Typ.
Max.
Unit
-
1360
-
-
88
-
-
2
-
IDSS
Zero gate voltage drain
current
IGSS
2
µA
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS = 0 to 480 V, VGS = 0 V
-
124
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
4
-
Ω
Qg
Total gate charge
-
34
-
Qgs
Gate-source charge
-
5.6
-
Qgd
Gate-drain charge
VDD = 480 V, ID = 20 A, VGS = 0
to 10 V (see Figure 15: "Test
circuit for gate charge
behavior")
-
16.3
-
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Notes:
(1)
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS.
4/15
DocID030419 Rev 1
pF
nC
STB26N60M2
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
VDD = 300 V, ID = 10 A RG = 4.7 Ω,
VGS = 10 V (see Figure 14: "Test
circuit for resistive load switching
times" and Figure 19: "Switching
time waveform")
Min.
Typ.
Max.
Unit
-
20.2
-
-
8
-
-
66
-
-
10
-
Min.
Typ.
Max.
Unit
ns
Table 8: Source-drain diode
Symbol
Parameter
ISD
Source-drain current
-
20
A
ISDM(1)
Source-drain current
(pulsed)
-
80
A
VSD(2)
Forward on voltage
-
1.6
V
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
Test conditions
VGS = 0 V, ISD = 20 A
ISD = 20 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16: "Test
circuit for inductive load switching
and diode recovery times")
ISD = 20 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see Figure
16: "Test circuit for inductive load
switching and diode recovery times")
-
360
ns
-
5
µC
-
27
A
-
556
ns
-
8
µC
-
29
A
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
DocID030419 Rev 1
5/15
Electrical characteristics
2.1
STB26N60M2
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
6/15
DocID030419 Rev 1
STB26N60M2
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 10: Normalized on-resistance vs temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Output capacitance stored energy
Figure 13: Source-drain diode forward
characteristics
DocID030419 Rev 1
7/15
Test circuits
3
STB26N60M2
Test circuits
Figure 15: Test circuit for gate charge
behavior
Figure 14: Test circuit for resistive load
switching times
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
8/15
DocID030419 Rev 1
Figure 19: Switching time waveform
STB26N60M2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
D²PAK package information
Figure 20: D²PAK (TO-263) type A package outline
DocID030419 Rev 1
9/15
Package information
STB26N60M2
Table 9: D²PAK (TO-263) type A package mechanical data
mm
Dim.
Min.
Max.
A
4.40
4.60
A1
0.03
0.23
b
0.70
0.93
b2
1.14
1.70
c
0.45
0.60
c2
1.23
1.36
D
8.95
9.35
D1
7.50
7.75
8.00
D2
1.10
1.30
1.50
E
10.00
E1
8.50
8.70
8.90
E2
6.85
7.05
7.25
e
10.40
2.54
e1
4.88
5.28
H
15.00
15.85
J1
2.49
2.69
L
2.29
2.79
L1
1.27
1.40
L2
1.30
1.75
R
V2
10/15
Typ.
0.40
0°
DocID030419 Rev 1
8°
STB26N60M2
Package information
Figure 21: D²PAK (TO-263) type A recommended footprint (dimensions are in mm)
DocID030419 Rev 1
11/15
Package information
4.2
STB26N60M2
D²PAK packing information
Figure 22: D2PAK type A tape outline
12/15
DocID030419 Rev 1
STB26N60M2
Package information
Figure 23: D2PAK type A reel outline
Table 10: D²PAK type A tape and reel mechanical data
Tape
Reel
mm
mm
Dim.
Dim.
Min.
Max.
A0
10.5
10.7
A
B0
15.7
15.9
B
1.5
D
1.5
1.6
C
12.8
D1
1.59
1.61
D
20.2
E
1.65
1.85
G
24.4
F
11.4
11.6
N
100
K0
4.8
5.0
T
P0
3.9
4.1
P1
11.9
12.1
Base quantity
1000
P2
1.9
2.1
Bulk quantity
1000
R
50
T
0.25
0.35
W
23.7
24.3
DocID030419 Rev 1
Min.
Max.
330
13.2
26.4
30.4
13/15
Revision history
5
STB26N60M2
Revision history
Table 11: Document revision history
14/15
Date
Revision
10-Mar-2017
1
DocID030419 Rev 1
Changes
First release.
STB26N60M2
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DocID030419 Rev 1
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