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product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without
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regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/
or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application
by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized
for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for
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NCV8411
Self-Protected Low Side
Driver with In-Rush Current
Management
The NCV8411 is a three terminal protected Low−Side Smart
Discrete FET. The protection features include Delta Thermal
Shutdown, overcurrent, overtemperature, ESD and integrated Drain to
Gate clamping for over voltage protection. The device also offers fault
indication via the gate pin. This device is suitable for harsh automotive
environments.
Features
•
•
•
•
•
•
•
•
•
•
Short Circuit Protection with In−Rush Current Management
Delta Thermal Shutdown
Thermal Shutdown with Automatic Restart
Over Voltage Protection
Integrated Clamp for Over Voltage Protection and Inductive
Switching
ESD Protection
dV/dt Robustness
Analog Drive Capability (Logic Level Input)
NCV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
These Devices are Pb−Free and are RoHS Compliant
Typical Applications
• Switch a Variety of Resistive, Inductive and Capacitive Loads
• Can Replace Electromechanical Relays and Discrete Circuits
• Automotive / Industrial
Overvoltage
Protection
Current
Limit
ID MAX
(Limited)
42 V
23 mW @ 10 V
45 A
DPAK
CASE 369C
STYLE 2
MARKING DIAGRAM
1 = Gate
2 = Drain
3 = Source
A
Y
WW
G
1
2
3
AYWW
NCV
8411G
= Assembly Location
= Year
= Work Week
= Pb−Free Package
Device
Package
Shipping†
NCV8411DTRKG
DPAK
(Pb−Free)
2500/Tape & Reel
Current
Sense
Figure 1. Block Diagram
© Semiconductor Components Industries, LLC, 2017
January, 2019 − Rev. 0
RDS(ON) TYP
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
ESD Protection
Temperature
Limit
VDSS
(Clamped)
ORDERING INFORMATION
Drain
Gate
Input
www.onsemi.com
Source
1
Publication Order Number:
NCV8411/D
NCV8411
Table 1. MAXIMUM RATINGS
Rating
Symbol
Value (min)
Unit
Drain−to−Source Voltage Internally Clamped
VDSS
42
V
Drain−to−Gate Voltage Internally Clamped
VDG
42
V
Gate−to−Source Voltage
VGS
±14
V
Drain Current − Continuous
ID
Total Power Dissipation
@ TA = 25°C (Note 1)
@ TA = 25°C (Note 2)
PD
Thermal Resistance
Junction−to−Case
Junction−to−Ambient (Note 1)
Junction−to−Ambient (Note 2)
Internally Limited
1.3
2.7
W
°C/W
RthJC
RthJA
RthJA
0.65
95
45
Single Pulse Inductive Load Switching Energy (Note 3)
(L = 120 mH, TJ(start) = 150°C)
EAS
600
Load Dump Voltage (VGS = 0 and 10 V, RG = 2 W, RL = 3 W) (Note 4)
US *
55
V
TJ
−40 to 150
°C
Tstorage
−55 to 150
°C
ESD
4
kV
Operating Junction Temperature
Storage Temperature
mJ
ESD CHARACTERISTICS (Note 3)
Electro−Static Discharge Capability
Human Body Model (HBM)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Mounted onto a 2″ square FR4 board (100 sq mm, 1 oz. Cu, steady state)
2. Mounted onto a 2″ square FR4 board (645 sq mm, 1 oz. Cu, steady state)
3. Not tested in production.
4. Load Dump Test B (with centralized load dump suppression) according to ISO16750−2 standard. Guaranteed by design. Not tested in
production. Passed Class C according to ISO16750−1.
+
ID
DRAIN
IG
+
VDS
GATE
SOURCE
VGS
−
−
Figure 2. Voltage and Current Convention
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2
NCV8411
Table 2. ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic
Test Conditions
Symbol
Min
Typ
Max
Unit
VGS = 0 V, ID = 250 mA
V(BR)DSS
42
42
46
50
V
44
50
−
1.5
5
−
5.5
−
OFF CHARACTERISTICS
Drain−to−Source Clamped
Breakdown Voltage
VGS = 0 V, ID = 250 mA,
TJ = 150°C (Note 5)
Zero Gate Voltage Drain Current
IDSS
VDS = 32 V, VGS = 0 V
VDS = 32 V, VGS = 0 V,
TJ = 150°C (Note 5)
Gate Input Current
mA
VGS = 5 V, VDS = 0 V
IGSS
−
50
100
VGS = VDS, ID = 1.2 mA
VGS(th)
1.0
1.8
2.5
V
−
5
−
mV/°C
mW
mA
ON CHARACTERISTICS
Gate Threshold Voltage
Threshold Temperature Coefficient
VGS = VDS, ID = 1.2 mA (Note 5)
Static Drain−to−Source
On Resistance
VGS = 10 V, ID = 5 A, TJ = 25°C
RDS(ON)
−
23
29
VGS = 10 V, ID = 5 A,
TJ = 150°C (Note 5)
−
43
55
VGS = 5 V, ID = 5 A, TJ = 25°C
−
28
34
VGS = 5 V, ID = 5 A,
TJ = 150°C (Note 5)
−
50
60
VSD
−
0.8
1.1
V
ms
Source Drain Forward On Voltage
IS = 5 A, VGS = 0 V
SWITCHING CHARACTERISTICS (Note 5)
VGS = 0 V to 5 V,
VDS = 12 V, ID = 1 A
Turn−On Time (10% VGS to 90% ID)
Turn−Off Time (90% VGS to 10% ID)
VGS = 0 V to 10 V,
VDS = 12 V, ID = 1 A
Turn−On Time (10% VGS to 90% ID)
tON
−
29
50
tOFF
−
53
150
tON
−
14
25
tOFF
−
80
180
VGS = 0 V to 10 V,
VDD = 12 V, RL = 4.7 W
−dVDS/dtON
−
1.52
2.5
dVDS/dtOFF
−
0.71
0.85
VGS = 5 V, VDS = 10 V
ILIM
29
33
40
VGS = 5 V, VDS = 10 V,
TJ = 150°C (Note 5)
27
31
37
VGS = 10 V, VDS = 10 V (Note 5)
23
34
46
VGS = 10 V, VDS = 10 V,
TJ = 150°C (Note 5)
23
33
46
150
170
185
Turn−Off Time (90% VGS to 10% ID)
Slew Rate On (80% VDS to 50% VDS)
Slew Rate Off (50% VDS to 80% VDS)
V/ms
SELF PROTECTION CHARACTERISTICS
Current Limit
VGS = 5 V (Note 5)
Temperature Limit (Turn−Off)
TLIM(OFF)
Thermal Hysteresis
DTLIM(ON)
−
10
−
TLIM(OFF)
150
180
200
DTLIM(ON)
−
10
−
IGON
−
50
100
200
318
500
VGS = 10 V (Note 5)
Temperature Limit (Turn−Off)
Thermal Hysteresis
A
°C
GATE INPUT CHARACTERISTICS (Note 5)
Device ON Gate Input Current −
Normal Operation
Device ON Gate Input Current −
Thermal Limit
Device ON Gate Input Current −
Current Limit
VGS = 5 V, VDS = 10 V, ID = 1 A
VGS = 10 V, VDS = 10 V, ID = 1 A
VGS = 5 V, VDS = 10 V, ID = 0 A
IGTL
VGS = 10 V, VDS = 10 V, ID = 0 A
VGS = 5 V, VDS = 10 V
VGS = 10 V, VDS = 10 V
IGCL
−
633
900
−
1470
2000
−
245
600
−
1121
1500
mA
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
5. Not tested in production.
www.onsemi.com
3
NCV8411
TYPICAL PERFORMANCE CURVES
10000
100
1000
Emax (mJ)
ILmax (A)
TJ(start) = 25°C
10
TJ(start) = 150°C
1
TJ(start) = 25°C
TJ(start) = 150°C
100
10
1
10
1
100
10
Figure 3. Single Pulse Maximum Switch-off
Current vs. Load Inductance
Figure 4. Single Pulse Maximum Switching Energy
vs. Load Inductance
10000
Emax (mJ)
100
ILmax (A)
100
L (mH)
L (mH)
TJ(start) = 25°C
10
TJ(start) = 25°C
1000
TJ(start) = 150°C
TJ(start) = 150°C
1
1
10
100
100
1
10
Time in Avalanche (ms)
Time in Avalanche (ms)
Figure 5. Single Pulse Maximum Inductive
Switch-off Current vs. Time in Avalanche
45
35
10 V
30
25
4V
20
ID (A)
25
3V
15
20
15
10
10
VGS = 2.5 V
5
0
−40°C
25°C
100°C
150°C
30
8V
35
ID (A)
Figure 6. Single Pulse Maximum Inductive
Switching Energy vs. Time in Avalanche
7V
40
100
0
1
2
3
4
5
0
5
VDS = 10 V
1
VDS (V)
1.5
2
2.5
3
3.5
4
VGS (V)
Figure 7. On-state Output Characteristics at 255C
Figure 8. Transfer Characteristics
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4
4.5
5
NCV8411
TYPICAL PERFORMANCE CURVES
70
45
ID = 3 A
60
150°C, VGS = 10 V
35
RDS(on) (mW)
50
RDS(on) (mW)
150°C, VGS = 5 V
40
150°C
40
105°C
30
105°C, VGS = 5 V
105°C, VGS = 10 V
30
25
25°C, VGS = 5 V
20
25°C, VGS = 10 V
15
−40°C, VGS = 5 V
25°C
20
−40°C
10
10
3 3.5 4 4.5 5 5.5 6 6.5 7 7.5 8 8.5 9 9.5 10
−40°C, VGS = 10 V
1
2
3
4
5
VGS (V)
10
VDS = 10 V
−40°C
40
25°C
100°C
38
VGS = 5 V
1.25
1
ILIM (A)
Normalized RDS(on)
9
42
ID = 5 A
1.5
150°C
36
34
VGS = 10 V
0.75
32
0,5
−40 −20
0
20
40
60
80
30
100 120 140
5
5.5
6
6.5
7
TJ (5C)
7.5
8
8.5
9
9.5
10
VGS (V)
Figure 11. Normalized RDS(on) vs. Temperature
Figure 12. Current Limit vs. Gate-Source Voltage
50
100
VGS = 0 V
VDS = 10 V
10
VGS = 10 V
IDSS (mA)
40
ILIM (A)
8
Figure 10. RDS(on) vs. Drain Current
2
45
7
ID (A)
Figure 9. RDS(on) vs. Gate-Source Voltage
1.75
6
35
VGS = 5 V
30
150°C
25°C
1
105°C
−40°C
0.1
25
20
−40 −20
0
20
40
60
80
0.01
100 120 140
10
15
20
25
30
35
VDS (V)
TJ (5C)
Figure 13. Current Limit vs. Junction Temperature
Figure 14. Drain-to-Source Leakage Current
www.onsemi.com
5
40
NCV8411
1.2
1
1.1
0.9
−40°C
1
0.8
25°C
VSD (V)
Normalized VGS(th)
TYPICAL PERFORMANCE CURVES
0.9
0.8
0.7
105°C
0.6
ID = 1.2 mA
VDS = VGS
0.7
0.6
−40 −20
150°C
0.5
0
20
40
60
80
0.4
100 120 140
VGS = 0 V
1
2
3
4
5
TJ (5C)
Drain-Source Voltage Slope (V/ms)
VDD = 25 V, ID = 5 A, RG = 0 W
tr
160
140
Time (ms)
9
10
2.5
180
120
100
td(off)
80
td(on)
60
40
tf
20
3
4
5
6
7
8
9
10
VDD = 25 V, ID = 5 A, RG = 0 W
1.5
dVDS/dt(off)
1
0.5
0
3
4
5
td(off), VGS = 10 V
80
td(off), VGS = 5 V
70
60
50
tf, VGS = 10 V
40
tr, VGS = 5 V
td(on), VGS = 5 V
30
20
10
tf, VGS = 5 V
0
td(on), VGS = 10 V
7
8
9
10
Figure 18. Resistive Load Switching Drain-Source
Voltage Slope vs. Gate-Source Voltage
Drain-Source Voltage Slope (V/ms)
VDD = 25 V, ID = 5 A
90
6
VGS (V)
Figure 17. Resistive Load Switching Time vs.
Gate-Source Voltage
100
−dVDS/dt(on)
2
VGS (V)
Time (ms)
8
Figure 16. Source-Drain Diode Forward
Characteristics
200
0
7
IS (A)
Figure 15. Normalized Threshold Voltage vs.
Temperature
0
6
tr, VGS = 10 V
2
1.8
−dVDS/dt(on), VGS = 5 V
1.4
1.2
1
dVDS/dt(on), VGS = 5 V
0.8
dVDS/dt(on), VGS = 10 V
0.6
0.4
VDD = 25 V, ID = 5 A
0.2
0
200 400 600 800 1000 1200 1400 1600 1800 2000
−dVDS/dt(on), VGS = 10 V
1.6
0
RG (W)
200 400 600 800 1000 1200 1400 1600 1800 2000
RG (W)
Figure 19. Resistive Load Switching Time vs.
Gate Resistance
Figure 20. Drain-Source Voltage Slope during
Turn On and Turn Off vs. Gate Resistance
www.onsemi.com
6
NCV8411
TYPICAL PERFORMANCE CURVES
90
80
RqJA (5C/W)
70
60
PCB Cu thickness, 1.0 oz
50
40
PCB Cu thickness, 2.0 oz
30
20
0
200
400
600
800
1000
1200
1400
Copper Heat Spread Area (mm2)
RqJA 645 mm2 5C/W, 2 oz. Copper
Figure 21. RqJA vs. Copper Area
100
50% Duty Cycle
10
20%
10%
5%
1
2%
1%
0.1
Single
Pulse
0.01
0.000001
0.00001
0.0001
0.001
0.01
0.1
Pulse Width (s)
Figure 22. Transient Thermal Resistance
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7
1
10
100
1000
NCV8411
APPLICATION INFORMATION
Circuit Protection Features
NCV8411 establishes a slow junction temperature rise by
sensing the difference between the hot and cold sensors.
ON/OFF output cycling is designed with hysteresis that
results in a controlled saw tooth temperature profile
(Figure 23). The die temperature slowly rises (DTSD) until
the absolute temperature shutdown (TSD) is reached around
175°C.
The NCV8411 has three main protections. Current Limit,
Thermal Shutdown and Delta Thermal Shutdown. These
protections establish robustness of the NCV8411.
Current Limit and Short Circuit Protection
The NCV8411 has current sense element. In the event that
the drain current reaches designed current limit level,
integrated Current Limit protection establishes its constant
level.
Thermal Shutdown with Automatic Restart
Internal Thermal Shutdown (TSD) circuitry is provided to
protect the NCV8411 in the event that the maximum
junction temperature is exceeded. When activated at
typically 175°C, the NCV8411 turns off. This feature is
provided to prevent failures from accidental overheating.
Delta Thermal Shutdown
Delta Thermal Shutdown (DTSD) Protection increases
higher reliability of the NCV8411. DTSD consist of two
independent temperature sensors – cold and hot sensors. The
TEST CIRCUITS AND WAVEFORMS
Overtemperature
Cycling
Thermal Transient Limitation Phase
VG
ILIM
ID
INOM
TSD
Delta TSD
Activation
TJ
Time
Figure 23. Overload Protection Behavior
www.onsemi.com
8
Nominal
Load
NCV8411
TEST CIRCUITS AND WAVEFORMS
RL
VIN
D
RG
G
VDD
DUT
+
−
S
IDS
Figure 24. Resistive Load Switching Test Circuit
90%
VIN
10%
tON
tOFF
90%
10%
IDS
Time
Figure 25. Resistive Load Switching Waveforms
www.onsemi.com
9
NCV8411
TEST CIRCUITS AND WAVEFORMS
L
VDS
VIN
D
RG
G
VDD
DUT
+
−
S
tp
IDS
Figure 26. Inductive Load Switching Test Circuit
5V
VIN
0V
tav
tp
V(BR)DSS
Ipk
VDD
VDS
VDS(on)
IDS
0
Time
Figure 27. Inductive Load Switching Waveform
www.onsemi.com
10
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE)
CASE 369C
ISSUE F
4
1 2
DATE 21 JUL 2015
3
SCALE 1:1
A
E
C
A
b3
B
c2
4
L3
Z
D
1
2
H
DETAIL A
3
L4
NOTE 7
c
SIDE VIEW
b2
e
b
0.005 (0.13)
TOP VIEW
BOTTOM VIEW
C
M
Z
H
L2
GAUGE
PLANE
C
L
SEATING
PLANE
BOTTOM VIEW
A1
L1
DETAIL A
Z
ALTERNATE
CONSTRUCTIONS
ROTATED 905 CW
STYLE 1:
PIN 1. BASE
2. COLLECTOR
3. EMITTER
4. COLLECTOR
STYLE 6:
PIN 1. MT1
2. MT2
3. GATE
4. MT2
STYLE 3:
PIN 1. ANODE
2. CATHODE
3. ANODE
4. CATHODE
STYLE 8:
PIN 1. N/C
2. CATHODE
3. ANODE
4. CATHODE
STYLE 4:
PIN 1. CATHODE
2. ANODE
3. GATE
4. ANODE
STYLE 5:
PIN 1. GATE
2. ANODE
3. CATHODE
4. ANODE
STYLE 9:
STYLE 10:
PIN 1. ANODE
PIN 1. CATHODE
2. CATHODE
2. ANODE
3. RESISTOR ADJUST
3. CATHODE
4. CATHODE
4. ANODE
SOLDERING FOOTPRINT*
6.20
0.244
DIM
A
A1
b
b2
b3
c
c2
D
E
e
H
L
L1
L2
L3
L4
Z
INCHES
MIN
MAX
0.086 0.094
0.000 0.005
0.025 0.035
0.028 0.045
0.180 0.215
0.018 0.024
0.018 0.024
0.235 0.245
0.250 0.265
0.090 BSC
0.370 0.410
0.055 0.070
0.114 REF
0.020 BSC
0.035 0.050
−−− 0.040
0.155
−−−
MILLIMETERS
MIN
MAX
2.18
2.38
0.00
0.13
0.63
0.89
0.72
1.14
4.57
5.46
0.46
0.61
0.46
0.61
5.97
6.22
6.35
6.73
2.29 BSC
9.40 10.41
1.40
1.78
2.90 REF
0.51 BSC
0.89
1.27
−−−
1.01
3.93
−−−
GENERIC
MARKING DIAGRAM*
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
STYLE 7:
PIN 1. GATE
2. COLLECTOR
3. EMITTER
4. COLLECTOR
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DIMENSIONS b3, L3 and Z.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH, PROTRUSIONS, OR BURRS. MOLD
FLASH, PROTRUSIONS, OR GATE BURRS SHALL
NOT EXCEED 0.006 INCHES PER SIDE.
5. DIMENSIONS D AND E ARE DETERMINED AT THE
OUTERMOST EXTREMES OF THE PLASTIC BODY.
6. DATUMS A AND B ARE DETERMINED AT DATUM
PLANE H.
7. OPTIONAL MOLD FEATURE.
2.58
0.102
1.60
0.063
IC
Discrete
= Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*This information is generic. Please refer
to device data sheet for actual part
marking.
6.17
0.243
SCALE 3:1
AYWW
XXX
XXXXXG
XXXXXX
A
L
Y
WW
G
3.00
0.118
5.80
0.228
XXXXXXG
ALYWW
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
STATUS:
NEW STANDARD:
98AON10527D
ON SEMICONDUCTOR STANDARD
REF TO JEDEC TO−252
http://onsemi.com
DPAK SINGLE GAUGE SURFACE
1 MOUNT
© Semiconductor Components Industries, LLC, 2002
October, DESCRIPTION:
2002 − Rev. 0
Electronic versions are uncontrolled except when
accessed directly from the Document Repository. Printed
versions are uncontrolled except when stamped
“CONTROLLED COPY” in red.
Case Outline Number:
PAGE 1 OFXXX
2
DOCUMENT NUMBER:
98AON10527D
PAGE 2 OF 2
ISSUE
REVISION
DATE
O
RELEASED FOR PRODUCTION. REQ. BY L. GAN
24 SEP 2001
A
ADDED STYLE 8. REQ. BY S. ALLEN.
06 AUG 2008
B
ADDED STYLE 9. REQ. BY D. WARNER.
16 JAN 2009
C
ADDED STYLE 10. REQ. BY S. ALLEN.
09 JUN 2009
D
RELABELED DRAWING TO JEDEC STANDARDS. ADDED SIDE VIEW DETAIL A.
CORRECTED MARKING INFORMATION. REQ. BY D. TRUHITTE.
29 JUN 2010
E
ADDED ALTERNATE CONSTRUCTION BOTTOM VIEW. MODIFIED DIMENSIONS
b2 AND L1. CORRECTED MARKING DIAGRAM FOR DISCRETE. REQ. BY I. CAMBALIZA.
06 FEB 2014
F
ADDED SECOND ALTERNATE CONSTRUCTION BOTTOM VIEW. REQ. BY K.
MUSTAFA.
21 JUL 2015
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© Semiconductor Components Industries, LLC, 2015
July, 2015 − Rev. F
Case Outline Number:
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