MOSFET, N-Channel,
POWERTRENCH)
40 V, 18.6 A, 4.5 mW
FDS8840NZ
General Description
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The FDS8840NZ has been designed to minimize losses in power
conversion application. Advancements in both silicon and package
technologies have been combined to offer the lowest rDS(on) while
maintaining excellent switching performance.
D
D
D
D
Features
•
•
•
•
•
•
Max rDS(on) = 4.5 m at VGS = 10 V, ID = 18.6 A
Max rDS(on) = 6.0 m at VGS = 4.5 V, ID = 14.9 A
HBM ESD Protection Level of 6 kV Typical (Note 3)
High Performance Trench Technology for Extremely Low rDS(on)
and Fast Switching
High Power and Current Handling Capability
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Applications
• Synchronous Buck for Vcore and Server
• Notebook Battery Pack
• Load Switch
Pin 1
S
S
S
G
SOIC8
CASE 751EB
PIN ASSIGNMENT
D
G
D
S
D
S
D
S
MARKING DIAGRAM
8
$Y&Z&2&K
FDS
8840NZ
1
$Y
&Z
&2
&K
FDS8840NZ
= ON Semiconductor Logo
= Assembly Plant Code
= Numeric Date Code
= Lot Code
= Specific Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2018
October, 2019 − Rev. 0
1
Publication Order Number:
FDS8840NZ/D
FDS8840NZ
ORDERING INFORMATION
Part Number
Device Marking
Package
Shipping†
FDS8840NZ
FDS8840NZ
SOIC8
(Pb-Free / Halogen Free)
2500 Units / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specification Brochure, BRD8011/D.
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Symbol
Parameter
Value
Unit
VDS
Drain to Source Voltage
40
V
VGS
Gate to Source Voltage
±20
V
Drain Current Continuous
18.6
A
ID
Drain Current Pulsed
63
EAS
Single Pulse Avalanche Energy (Note 4)
600
mJ
PD
Power Dissipation, TA = 25°C (Note 1a)
2.5
W
Power Dissipation, TA = 25°C (Note 1b)
1.0
TJ, TSTG
Operating and Storage Junction Temperature Range
°C
−55 to 150
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
THERMAL CHARACTERISTICS
Symbol
Parameter
Value
Unit
RJC
Thermal Resistance, Junction to Case (Note 1)
25
°C/W
RJA
Thermal Resistance, Junction to Ambient (Note 1a)
50
°C/W
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Symbol
Test Conditions
Parameter
Min
Typ
Max
Unit
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
ID = 250 A, VGS = 0 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature Coefficient
ID = 250 A, referenced to 25°C
Zero Gate Voltage Drain Current
VDS = 32 V, VGS = 0 V
1
A
Gate to Source Leakage Current
VGS = ±20 V, VDS = 0 V
±10
A
3.0
V
IDSS
IGSS
40
V
31
mV/°C
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = 250 A
1.0
1.8
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage Temperature ID = 250 A, referenced to 25°C
Coefficient
−6
rDS(on)
Static Drain to Source On Resistance
VGS = 10 V, ID = 18.6 A
3.9
4.5
VGS = 4.5 V, ID = 14.9 A
4.6
6.0
VGS = 10 V, ID = 18.6 A, TJ = 125°C
5.9
7.0
VDS = 5 V, ID = 18.6 A
83
gFS
Forward Transconductance
mV/°C
mΩ
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Crss
Rg
5665
7535
pF
Output Capacitance
650
865
pF
Reverse Transfer Capacitance
445
670
pF
Gate Resistance
1.2
VDS = 20 V, VGS = 0 V, f = 1 MHz
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2
Ω
FDS8840NZ
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) (continued)
Symbol
Test Conditions
Parameter
Min
Typ
Max
Unit
18
32
ns
13
23
ns
Turn−Off Delay Time
57
103
ns
Fall Time
11
20
ns
103
144
nC
54
76
nC
Switching Characteristics
td(on)
tr
td(off)
tf
Turn−On Delay Time
VDD = 20 V, ID = 18.6 A, VGS = 10 V,
RGEN = 6 Ω
Rise Time
Qg
Total Gate Charge
VGS = 0 V to 10 V
Qg
Total Gate Charge
Qgs
Gate to Source Charge
16
nC
Qgd
Gate to Drain “Miller” Charge
19
nC
VGS = 0 V to 5 V
VDD = 20 V,
ID = 18.6 A
Drain−Source Diode Characteristics
VSD
Source to Drain Diode Forward Voltage
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 18.6 A
0.8
1.2
VGS = 0 V, IS = 2.1 A
0.7
1.2
33
53
ns
21
34
nC
IF = 18.6 A, di/dt = 100 A/s
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
NOTES:
1. RJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR−4 material. RJC is guaranteed by
design while RCA is determined by the user’s board design.
a.) 50°C/W when mounted on a
1 in2 pad of 2 oz copper
b.) 125°C/W when mounted on a
minimum pad
2. Pulse Test: Pulse Width < 300 s, Duty cycle < 2.0%.
3. The diode connected between the gate and source servers only as protection against ESD. No gate overvoltage rating is implied.
4. Starting TJ = 25°C, L = 3 mH, IAS = 20 A, VDD = 40 V, VGS = 10 V.
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3
FDS8840NZ
TYPICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
VGS = 10 V
VGS = 4 V
50
ID, DRAIN CURRENT (A)
5
VGS = 4.5 V
VGS = 3.5 V
40
30
VGS = 3 V
20
PULSE DURATION = 80μs
DUTY CYCLE = 0.5% MAX
10
0
0
0.2
0.4
0.6
PULSE DURATION = 80μs
DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON−RESISTANCE
60
4
VGS = 3 V
3
2
1
VGS = 10 V
0
0.8
0
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
rDS(on) , DRAIN TO
1.4
1.2
1.0
0.8
SOURCE ON−RESISTANCE (mΩ)
NORMALIZED
DRAIN TO SOURCE ON−RESISTANCE
40
50
60
12
ID = 18.6 A
VGS = 10 V
0.6
−75 −50 −25 0 25 50 75 100 125 150
TJ, JUNCTION TEMPERATURE oC
()
PULSE DURATION = 80μs
DUTY CYCLE = 0.5% MAX
9
ID = 18.6 A
TJ = 125 oC
6
3
TJ = 25 oC
0
2
4
6
8
10
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 3. Normalized On−Resistance vs Junction
Temperature
Figure 4. On−Resistance vs Gate to Source Voltage
100
60
PULSE DURATION = 80μs
DUTY CYCLE = 0.5% MAX
IS, REVERSE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
30
Figure 2. Normalized On−Resistance vs Drain
Current and Gate Voltage
1.8
50
20
ID, DRAIN CURRENT (A)
Figure 1. On−Region Characteristics
1.6
VGS = 4.5 V
VGS = 4 V
VGS = 3.5 V
VDS = 5 V
40
TJ = 150 oC
30
20
TJ = 25 oC
10
TJ = −55oC
VGS = 0 V
10
TJ = 25 oC
1
TJ = −55oC
0.1
0.2
0
01234
TJ = 150 oC
0.4
0.6
0.8
1.0
1.2
VSD, BODY DIODE FORWARD VOLTAGE (V)
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure 6. Source to Drain Diode Forward Voltage vs
Source Current
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4
FDS8840NZ
TYPICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
10000
ID = 18.6 A
8
Ciss
VDD = 15 V
CAPACITANCE (pF)
VGS , GATE TO SOURCE VOLTAGE (V)
10
6
VDD = 20 V
4
VDD = 25 V
1000
Coss
0
0
30
60
90
100
0.1
120
1
Qg, GATE CHARGE (nC)
−3
10
TJ =
Ig, GATE LEAKAGE CURRENT (A)
IAS, AVALANCHE CURRENT (A)
40
Figure 8. Capacitance vs Drain to Source Voltage
30
25 oC
TJ = 100 oC
10
TJ =
1
0.001
125 oC
VGS = 0 V
−4
10
−5
10
TJ = 125 oC
−6
10
TJ = 25 oC
−7
10
−8
10
−9
0.01
0.1
1
10
100
10
1000
0
5
tAV, TIME IN AVALANCHE (ms)
10
15
20
25
30
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 9. Unclamped Inductive Switching Capability
Figure 10. IGSS vs VGS
2000
1000
P(PK), PEAK TRANSIENT POWER (W)
100
1 ms
10
10 ms
1
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Gate Charge Characteristics
ID, DRAIN CURRENT (A)
Crss
f = 1 MHz
VGS = 0 V
2
100 ms
THIS AREA IS
LIMITED BY rDS(on)
0.1
0.01
0.01
SINGLE PULSE
TJ = MAX RATED
1s
RJA = 125 oC/W
10 s
TA = 25 oC
DC
0.1
1
10
100
VGS = 10 V
SINGLE PULSE
RJA = 125 oC/W
100
TA = 25 oC
10
1
0.3
−3
10
−2
10
−1
10
1
10
100
1000
t, PULSE WIDTH (sec)
VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 11. Forward Bias Safe Operating Area
Figure 12. Single Pulse Maximum Power Dissipation
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5
FDS8840NZ
TYPICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
NORMALIZED THERMAL
IMPEDANCE, ZJA
2
1
0.1
DUTY CYCLE−DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
PDM
0.01
t1
t2
SINGLE PULSE
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x Z JA x RJA + TA
o
RJA = 125 C/W
0.001
0.0003
−3
10
−2
10
−1
10
1
10
100
t, RECTANGULAR PULSE DURATION (sec)
Figure 13. Transient Thermal Response Curve
POWERTRENCH is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or
other countries.
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6
1000
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC8
CASE 751EB
ISSUE A
DOCUMENT NUMBER:
DESCRIPTION:
98AON13735G
SOIC8
DATE 24 AUG 2017
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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