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FGA40N65SMD
650 V, 40 A Field Stop IGBT
Features
General Description
• Maximum Junction Temperature : TJ =
175oC
Using novel field stop IGBT technology, Fairchild’s new series of
field stop 2nd generation IGBTs offer the optimum performance
for solar inverter, UPS, welder, induction heating, telecom, ESS
and PFC applications where low conduction and switching
losses are essential.
• Positive Temperature Co-efficient for Easy Parallel Operating
• High Current Capability
• Low Saturation Voltage: VCE(sat) = 1.9 V(Typ.) @ IC = 40 A
• Fast Switching : EOFF = 6.5 uJ/A
• Tighten Parameter Distribution
• RoHS Compliant
Applications
• Solar Inverter, UPS, Welder, PFC, Induction Heating
• Telecom, ESS
C
G
TO-3PN
E
G CE
Absolute Maximum Ratings
Symbol
VCES
VGES
IC
ICM (1)
IF
IFM (1)
PD
TJ
Description
Ratings
Unit
Collector to Emitter Voltage
650
V
Gate to Emitter Voltage
± 20
V
Transient Gate to Emitter Voltage
Collector Current
@ TC = 25oC
Collector Current
@ TC = 100oC
Pulsed Collector Current
o
± 30
V
80
A
40
A
120
A
Diode Forward Current
@ TC = 25 C
40
A
Diode Forward Current
@ TC = 100oC
20
A
120
A
Maximum Power Dissipation
@ TC = 25oC
349
W
Maximum Power Dissipation
@ TC = 100oC
Pulsed Diode Maximum Forward Current
Operating Junction Temperature
Tstg
Storage Temperature Range
TL
Maximum Lead Temp. for soldering
Purposes, 1/8” from case for 5 seconds
174
W
-55 to +175
o
C
-55 to +175
o
C
300
o
C
Notes:
1: Repetitive rating: Pulse width limited by max. junction temperature
©2011 Fairchild Semiconductor Corporation
FGA40N65SMD Rev. C5
1
www.fairchildsemi.com
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
August 2014
Symbol
Parameter
Typ.
Max.
Unit
o
RθJC(IGBT)
Thermal Resistance, Junction to Case
-
0.43
RθJC(Diode)
Thermal Resistance, Junction to Case
-
1.5
oC/W
C/W
RθJA
Thermal Resistance, Junction to Ambient
-
40
oC/W
Package Marking and Ordering Information
Part Number
Top Mark
FGA40N65SMD
FGA40N65SMD
Package Packing Method
TO-3PN
Electrical Characteristics of the IGBT
Symbol
Parameter
Reel Size
Tube
Tape Width Quantity
N/A
N/A
30
TC = 25°C unless otherwise noted
Test Conditions
Min.
Typ.
Max.
Unit
650
-
-
V
Off Characteristics
BVCES
Collector to Emitter Breakdown Voltage VGE = 0 V, IC = 250 μA
ΔBVCES
ΔTJ
Temperature Coefficient of Breakdown
Voltage
VGE = 0 V, IC = 250 μA
-
0.6
-
V/oC
ICES
Collector Cut-Off Current
VCE = VCES, VGE = 0 V
-
-
250
μA
IGES
G-E Leakage Current
VGE = VGES, VCE = 0 V
-
-
±400
nA
IC = 250 μA, VCE = VGE
3.5
4.5
6.0
V
IC = 40 A, VGE = 15 V
-
1.9
2.5
V
IC = 40 A, VGE = 15 V,
TC = 175oC
-
2.1
-
V
-
1880
-
pF
-
180
-
pF
-
50
-
pF
On Characteristics
VGE(th)
G-E Threshold Voltage
VCE(sat)
Collector to Emitter Saturation Voltage
Dynamic Characteristics
Cies
Input Capacitance
Coes
Output Capacitance
Cres
Reverse Transfer Capacitance
VCE = 30 V, VGE = 0 V,
f = 1 MHz
Switching Characteristics
td(on)
Turn-On Delay Time
-
12
16
ns
tr
Rise Time
-
20
28
ns
td(off)
Turn-Off Delay Time
-
92
120
ns
tf
Fall Time
-
13
17
ns
Eon
Turn-On Switching Loss
-
0.82
1.23
mJ
Eoff
Turn-Off Switching Loss
-
0.26
0.34
mJ
VCC = 400 V, IC = 40 A,
RG = 6 Ω, VGE = 15 V,
Inductive Load, TC = 25oC
Ets
Total Switching Loss
-
1.08
1.57
mJ
td(on)
Turn-On Delay Time
-
15
-
ns
tr
Rise Time
-
22
-
ns
td(off)
Turn-Off Delay Time
-
116
-
ns
tf
Fall Time
-
16
-
ns
Eon
Turn-On Switching Loss
-
1.08
-
mJ
Eoff
Turn-Off Switching Loss
-
0.60
-
mJ
Ets
Total Switching Loss
-
1.68
-
mJ
©2011 Fairchild Semiconductor Corporation
FGA40N65SMD Rev. C5
VCC = 400 V, IC = 40 A,
RG = 6 Ω, VGE = 15 V,
Inductive Load, TC = 175oC
2
www.fairchildsemi.com
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
Thermal Characteristics
Symbol
Parameter
Qg
Total Gate Charge
Qge
Gate to Emitter Charge
Qgc
Gate to Collector Charge
(Continued)
Test Conditions
VCE = 400 V, IC = 40 A,
VGE = 15 V
Electrical Characteristics of the Diode
Symbol
Parameter
VFM
Diode Forward Voltage
Erec
Reverse Recovery Energy
trr
Diode Reverse Recovery Time
Irr
Diode Peak Reverse Recovery Current
Qrr
Diode Reverse Recovery Charge
©2011 Fairchild Semiconductor Corporation
FGA40N65SMD Rev. C5
Min.
Typ.
Max
Unit
-
119
180
nC
-
13
20
nC
-
58
90
nC
Unit
TC = 25°C unless otherwise noted
Test Conditions
IF = 20 A
IF =20 A,
diF/dt = 200 A/μs
3
Min.
Typ.
Max
TC = 25oC
-
2.1
2.6
TC = 175oC
-
1.7
-
TC = 175oC
-
96
-
TC = 25oC
-
42
-
TC = 175oC
-
200
-
TC = 25oC
-
3.6
-
TC = 175oC
-
8.0
-
TC = 25oC
-
76
-
TC = 175oC
-
800
-
V
uJ
ns
A
nC
www.fairchildsemi.com
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
Electrical Characteristics of the IGBT
Figure 1. Typical Output Characteristics
120
o
TC = 25 C
20V
15V
120
12V
Collector Current, IC [A]
60
VGE = 8V
40
20
0
2
4
Collector-Emitter Voltage, VCE [V]
VGE = 8V
40
0
0
2
4
Collector-Emitter Voltage, VCE [V]
6
Figure 4. Saturation Voltage vs. Case
Temperature at Variant Current Level
Common Emitter
VGE = 15V
Collector-Emitter Voltage, VCE [V]
Collector Current, IC [A]
60
3.0
100
o
TC = 25 C
o
TC = 175 C
80
60
40
20
0
1
2
3
Collector-Emitter Voltage, VCE [V]
20
Common Emitter
VGE = 15V
80A
2.5
2.0
40A
1.5
IC = 20A
1.0
25
4
Figure 5. Saturation Voltage vs. VGE
50
75
100
125
150
o
Case Temperature, TC [ C]
20
Common Emitter
Common Emitter
o
TC = 25 C
16
12
8
40A
4
80A
IC = 20A
4
8
12
16
Gate-Emitter Voltage, VGE [V]
©2011 Fairchild Semiconductor Corporation
FGA40N65SMD Rev. C5
175
Figure 6. Saturation Voltage vs. VGE
Collector-Emitter Voltage, VCE [V]
Collector-Emitter Voltage, VCE [V]
80
6
120
0
10V
20
Figure 3. Typical Saturation Voltage
Characteristics
0
12V
100
10V
80
0
20V
15V
o
TC = 175 C
100
Collector Current, IC [A]
Figure 2. Typical Output Characteristics
o
12
8
4
80A
4
0
20
TC = 175 C
16
40A
IC = 20A
4
8
12
16
Gate-Emitter Voltage, VGE [V]
20
www.fairchildsemi.com
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 7. Capacitance Characteristics
Figure 8. Gate charge Characteristics
15
4000
Common Emitter
Common Emitter
VGE = 0V, f = 1MHz
Gate-Emitter Voltage, VGE [V]
o
o
TC = 25 C
Capacitance [pF]
3000
Cies
2000
1000
Coes
TC = 25 C
400V
12
VCC = 200V
300V
9
6
3
Cres
0
0.1
1
10
Collector-Emitter Voltage, VCE [V]
0
30
Figure 9. Turn-on Characteristics vs.
Gate Resistance
0
40
80
Gate Charge, Qg [nC]
Figure 10. Turn-off Characteristics vs.
Gate Resistance
100
1000
td(off)
Switching Time [ns]
Switching Time [ns]
tr
td(on)
10
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
100
tf
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
10
o
TC = 25 C
o
TC = 25 C
o
TC = 175 C
1
120
0
10
20
30
40
Gate Resistance, RG [Ω]
o
TC = 175 C
1
50
0
10
20
30
40
50
Gate Resistance, RG [Ω]
Figure 11. Switching Loss vs.
Gate Resistance
Figure 12. Turn-on Characteristics vs.
Collector Current
1000
5
Common Emitter
VGE = 15V, RG = 6Ω
o
Eon
Switching Time [ns]
Switching Loss [mJ]
TC = 25 C
1
Eoff
Common Emitter
VCC = 400V, VGE = 15V
IC = 40A
100
o
TC = 175 C
tr
10
td(on)
o
TC = 25 C
o
TC = 175 C
0.1
0
10
20
30
40
Gate Resistance, RG [Ω]
©2011 Fairchild Semiconductor Corporation
FGA40N65SMD Rev. C5
1
20
50
30
40
50
60
70
80
Collector Current, IC [A]
5
www.fairchildsemi.com
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
Typical Performance Characteristics
FGA40N65SMD — 650 V, 40 A Field Stop IGBT
Typical Performance Characteristics
Figure 13. Turn-off Characteristics vs.
Collector Current
Figure 14. Switching Loss vs.
Collector Current
1000
6
Common Emitter
VGE = 15V, RG = 6Ω
Eon
o
TC = 25 C
Switching Loss [mJ]
Switching Time [ns]
td(off)
100
tf
10
Common Emitter
VGE = 15V, RG = 6Ω
o
TC = 175 C
Eoff
1
o
TC = 25 C
o
TC = 175 C
1
20
30
40
50
60
70
0.1
20
80
30
Figure 15. Load Current vs. Frequency
50
60
70
80
Figure 16. SOA Characteristics
300
250
Square Wave
100
o
TJ