NTB082N65S3F
MOSFET – N‐Channel,
SUPERFET III, FRFET
650 V, 40 A, 82 mW
Description
SUPERFET III MOSFET is ON Semiconductor’s brand-new high
voltage super-junction (SJ) MOSFET family that is utilizing charge
balance technology for outstanding low on-resistance and lower gate
charge performance. This advanced technology is tailored to minimize
conduction loss, provide superior switching performance, and
withstand extreme dv/dt rate.
Consequently, SUPERFET III MOSFET is very suitable for the
various power system for miniaturization and higher efficiency.
SUPERFET III FRFET MOSFET’s optimized reverse recovery
performance of body diode can remove additional component and
improve system reliability.
VDSS
RDS(ON) MAX
ID MAX
650 V
82 mW @ 10 V
40 A
D
G
Features
•
•
•
•
•
•
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700 V @ TJ = 150°C
Typ. RDS(on) = 70 mW
Ultra Low Gate Charge (Typ. Qg = 81 nC)
Low Effective Output Capacitance (Typ. Coss(eff.) = 722 pF)
100% Avalanche Tested
These Devices are Pb−Free and are RoHS Compliant
S
D
G
Applications
•
•
•
•
Telecom / Server Power Supplies
Industrial Power Supplies
EV Charger
UPS / Solar
S
D2PAK−3
CASE 418AJ
MARKING DIAGRAM
$Y&Z&3&K
NTB
082N65S3F
$Y
&Z
&3
&K
NTB082N65S3F
= ON Semiconductor Logo
= Assembly Plant Code
= Data Code (Year & Week)
= Lot
= Specific Device Code
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2017
August, 2019 − Rev. 4
1
Publication Order Number:
NTB082N65S3F/D
NTB082N65S3F
ABSOLUTE MAXIMUM RATINGS (TC = 25°C, Unless otherwise specified)
Symbol
Parameter
VDSS
Drain to Source Voltage
VGSS
Gate to Source Voltage
ID
Drain Current
Value
Unit
650
V
DC
±30
V
AC (f > 1 Hz)
±30
V
Continuous (TC = 25°C)
40
A
Continuous (TC = 100°C)
25.5
Pulsed (Note 1)
IDM
Drain Current
100
A
EAS
Single Pulsed Avalanche Energy (Note 2)
510
mJ
IAS
Avalanche Current (Note 2)
4.8
A
EAR
Repetitive Avalanche Energy (Note 1)
3.13
mJ
dv/dt
MOSFET dv/dt
100
V/ns
Peak Diode Recovery dv/dt (Note 3)
50
PD
TJ, TSTG
TL
Power Dissipation
(TC = 25°C)
313
W
Derate Above 25°C
2.5
W/°C
−55 to +150
°C
300
°C
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8″ from Case for 5 s
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. IAS = 4.8 A, RG = 25 W, starting TJ = 25°C.
3. ISD £ 20 A, di/dt ≤ 100 A/ms, VDD ≤ 400 V, starting TJ = 25°C.
THERMAL CHARACTERISTICS
Symbol
RqJC
RqJA
Parameter
Value
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (1
0.4
in2 Pad
of 2−oz Copper), Max.
62.5
Unit
_C/W
PACKAGE MARKING AND ORDERING INFORMATION
Part Number
NTB082N65S3F
Top Marking
Package
NTB082N65S3F
D2PAK
Packing Method
Tape and
Reel†
Reel Size
Tape Width
Quantity
330 mm
24 mm
800 Units
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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2
NTB082N65S3F
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
VGS = 0 V, ID = 1 mA, TJ = 25_C
650
−
−
V
VGS = 0 V, ID = 1 mA, TJ = 150_C
700
−
−
V
OFF CHARACTERISTICS
BVDSS
Drain to Source Breakdown Voltage
DBVDSS/DTJ
Breakdown Voltage Temperature
Coefficient
ID = 10 mA, Referenced to 25_C
−
0.7
−
V/_C
IDSS
Zero Gate Voltage Drain Current
VDS = 650 V, VGS = 0 V
−
−
10
mA
VDS = 520 V, TC = 125_C
−
124
−
IGSS
Gate to Body Leakage Current
VGS = ±30 V, VDS = 0 V
−
−
±100
nA
3.0
−
5.0
V
ON CHARACTERISTICS
VGS(th)
Gate Threshold Voltage
VGS = VDS, ID = 1.0 mA
RDS(on)
Static Drain to Source On Resistance
VGS = 10 V, ID = 20 A
−
70
82
mW
Forward Transconductance
VDS = 20 V, ID = 20 A
−
24
−
S
VDS = 400 V, VGS = 0 V, f = 1 MHz
−
3410
−
pF
−
70
−
pF
gFS
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Coss(eff.)
Effective Output Capacitance
VDS = 0 V to 400 V, VGS = 0 V
−
722
−
pF
Coss(er.)
Energy Related Output Capacitance
VDS = 0 V to 400 V, VGS = 0 V
−
126
−
pF
Total Gate Charge at 10V
VDS = 400 V, ID = 20 A, VGS = 10 V
(Note 4)
−
81
−
nC
−
24
−
nC
Qg(tot)
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
ESR
Equivalent Series Resistance
−
32
−
nC
f = 1 MHz
−
1.9
−
W
VDD = 400 V, ID = 20 A,
VGS = 10 V, Rg = 3 W
(Note 4)
−
27
−
ns
−
27
−
ns
SWITCHING CHARACTERISTICS
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
−
79
−
ns
Turn-Off Fall Time
−
5
−
ns
Maximum Continuous Source to Drain Diode Forward Current
−
−
40
A
ISM
Maximum Pulsed Source to Drain Diode Forward Current
−
−
100
A
VSD
Source to Drain Diode Forward
Voltage
VGS = 0 V, ISD = 20 A
−
−
1.3
V
trr
Reverse Recovery Time
−
108
−
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, ISD = 20 A,
dIF/dt = 100 A/ms
−
410
−
nC
tf
SOURCE-DRAIN DIODE CHARACTERISTICS
IS
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Essentially independent of operating temperature typical characteristics.
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3
NTB082N65S3F
TYPICAL PERFORMANCE CHARACTERISTICS
200
10
*Notes:
1. VDS = 20 V
2. 250 ms Pulse Test
100
ID, Drain Current [A]
ID, Drain Current [A]
200
VGS = 10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
100
1
o
150 C
10
o
25 C
o
−55 C
*Notes:
1. 250 ms Pulse Test
o
2. TC = 25 C
0.1
0.1
1
10
VDS, Drain−Source Voltage [V]
1
20
2
3
Figure 1. On-Region Characteristics
0.20
IS, Reverse Drain Current [A]
RDS(ON),
Drain−Source On−Resistance [W ]
VGS = 10 V
VGS = 20 V
0.05
0
20
40
7
8
9
60
80
100
*Notes:
1. VGS = 0 V
100
2. 250 ms Pulse Test
o
150 C
10
o
25 C
1
o
0.1
−55 C
0.01
0.001
0.0
120
0.5
1.0
1.5
2.0
ID, Drain Current [A]
VSD, Body Diode Forward Voltage [V]
Figure 3. On-Resistance Variation vs. Drain
Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current and Temperature
10
10000
VGS, Gate−Source Voltage [V]
100000
Capacitances [pF]
6
1000
o
0.15
0.00
5
Figure 2. Transfer Characteristics
*Note: T C = 25 C
0.10
4
VGS, Gate−Source Voltage [V]
Ciss
1000
Coss
100
*Note:
1. VGS = 0 V
2. f = 1 MHz
10
1
Crss
Ciss = C gs + Cgd (C ds = shorted)
Coss = C ds + Cgd
Crss = Cgd
0.1
0.1
1
10
100
VDS = 130 V
8
VDS = 400 V
6
4
2
0
1000
*Note: ID = 20 A
0
20
40
60
80
100
Qg, Total Gate Charge [nC]
VDS, Drain−Source Voltage [V]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
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4
NTB082N65S3F
TYPICAL PERFORMANCE CHARACTERISTICS (Continued)
3.0
*Notes:
1. VGS = 0 V
2. ID = 10 mA
1.1
RDS(on), [Normalized]
Drain−Source On−Resistance
BVDSS, [Normalized]
Drain−Source Breakdown Voltage
1.2
1.0
0.9
0.8
−50
0
50
100
2.0
1.5
1.0
0.5
0.0
150
−50
0
50
100
150
TJ, Junction Temperature [ o C]
TJ, Junction Temperature [ o C]
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variant vs. Temperature
50
200
100
30ms
40
100ms
ID, Drain Current [A]
ID, Drain Current [A]
2.5
*Notes:
1. VGS = 10 V
2. I D = 20 A
1ms
10
10ms
Operation in This Area
is Limited by R DS(on)
1
DC
*Notes:
o
30
20
10
1. TC = 25 C
o
0.1
2. TJ = 150 C
3. Single Pulse
1
10
100
0
25
1000
Figure 9. Maximum Safe Operation Area
EOSS [mJ]
16
12
8
4
0
130
260
390
520
75
100
125
150
Figure 10. Maximum Drain Current
vs. Case Temperature
20
0
50
TC, Case Temperature [oC]
VDS , Drain−Source Voltage [V]
650
VDS, Drain to Source Voltage [V]
Figure 11. EOSS vs. Drain to Source Voltage
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5
NTB082N65S3F
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
TYPICAL PERFORMANCE CHARACTERISTICS (Continued)
2
1
0.1
DUTY CYCLE−DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
PDM
t1
t2
0.01
0.001
−5
10
NOTES:
ZqJC(t) = r(t) x RqJC
RqJC = 0.4 oC/W
Peak TJ = PDM x ZqJC(t) + TC
Duty Cycle, D = t1 / t2
SINGLE PULSE
−4
10
−3
10
−2
−1
10
10
0
10
t, RECTANGULAR PULSE DURATION (sec)
Figure 12. Transient Thermal Response Curve
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6
1
10
2
10
NTB082N65S3F
VGS
RL
QG
VDS
VGS
QGS
QGD
DUT
IG = Const.
Charge
Figure 13. Gate Charge Test Circuit & Waveform
RL
VDS
VDS
90%
90%
90%
VDD
VGS
RG
VGS
DUT
VGS
10%
td(on)
10%
tr
tf
td(off)
ton
toff
Figure 14. Resistive Switching Test Circuit & Waveforms
L
E AS + 1 @ LI AS
2
VDS
BVDSS
ID
IAS
RG
VDD
DUT
10 V
2
ID(t)
VDD
VDS(t)
tp
tp
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms
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7
Time
NTB082N65S3F
+
DUT
VSD
−
ISD
L
Driver
RG
Same Type
as DUT
VGS
− dv/dt controlled by RG
− ISD controlled by pulse period
D+
VGS
(Driver)
VDD
Gate Pulse Width
Gate Pulse Period
10 V
IFM, Body Diode Forward Current
ISD
(DUT)
di/dt
IRM
Body Diode Reverse Current
Body Diode Recovery dv/dt
VDS
(DUT)
VDD
VSD
Body Diode
Forward Voltage Drop
Figure 16. Peak Diode Recovery dt/dt Test Circuit & Waveforms
SUPERFET and FRFET are a registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United
States and/or other countries.
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8
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
D2PAK−3 (TO−263, 3−LEAD)
CASE 418AJ
ISSUE F
SCALE 1:1
GENERIC MARKING DIAGRAMS*
XX
XXXXXXXXX
AWLYWWG
IC
DOCUMENT NUMBER:
DESCRIPTION:
XXXXXXXXG
AYWW
Standard
98AON56370E
AYWW
XXXXXXXXG
AKA
Rectifier
XXXXXX
XXYMW
SSG
DATE 11 MAR 2021
XXXXXX = Specific Device Code
A
= Assembly Location
WL
= Wafer Lot
Y
= Year
WW
= Work Week
W
= Week Code (SSG)
M
= Month Code (SSG)
G
= Pb−Free Package
AKA
= Polarity Indicator
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present. Some products
may not follow the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
D2PAK−3 (TO−263, 3−LEAD)
PAGE 1 OF 1
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